83.6 dBFS SNR with 30 MHz input (3.8 V p-p input, 80 MSPS)
82.6 dBFS SNR with 30 MHz input (3.2 V p-p input, 80 MSPS)
89 dBc SFDR with 30 MHz input (3.2 V p-p input, 80 MSPS)
95 dBFS 2-tone SFDR with 9.8 MHz and 10.8 MHz (100 MSPS)
60 fsec rms jitter
Excellent linearity
DNL = ±0.4 LSB typical
INL = ±3.0 LSB typical
2.0 V p-p to 4.0 V p-p differential full-scale input
Buffered analog inputs
LVDS outputs (ANSI-644 compatible) or CMOS outputs
Data format select (offset binary or twos complement)
Output clock available
The AD9446 is a 16-bit, monolithic, sampling analog-to-digital
converter (ADC) with an on-chip track-and-hold circuit. It is
optimized for performance, small size, and ease of use. The
product operates up to a 100 MSPS, providing superior SNR for
instrumentation, medical imaging, and radar receivers
employing baseband (<100 MHz) IF frequencies.
The ADC requires 3.3 V and 5.0 V power supplies and a low
v
oltage differential input clock for full performance operation.
No external reference or driver components are required for
many applications. Data outputs are CMOS or LVDS
compatible (ANSI-644 compatible) and include the means to
reduce the overall current needed for short trace distances.
AD9446
FUNCTIONAL BLOCK DIAGRAM
AGNDDRGND DRVDD
AVDD1 AVDD2
2
32
2
DFS
DCS MODE
OUTPUT MODE
OR
D15 TO D0
DCO
AD9446
VIN+
VIN–
CLK+
CLK–
BUFFER
CLOCK
AND TIMING
MANAGEMENT
T/H
PIPELINE
VREF
ADC
REF
Figure 1.
16
CMOS
OR
LVDS
OUTPUT
STAGING
REFBSENSE REFT
Optional features allow users to implement various selectable
op
erating conditions, including input range, data format select,
and output data mode.
The AD9446 is available in a Pb-free, 100-lead, surface-mount,
lastic package (100-lead TQFP/EP) specified over the
p
industrial temperature range −40°C to +85°C.
PRODUCT HIGHLIGHTS
1. True 16-bit linearity.
2. H
igh performance: outstanding SNR performance for
baseband IFs in data acquisition, instrumentation,
magnetic resonance imaging, and radar receivers.
ase of use: on-chip reference and high input impedance
3. E
track-and-hold with adjustable analog input range and an
output clock simplifies data capture.
performance over a wide range of clock pulse widths.
6. O
R (out-of-range) outputs indicate when the signal is
beyond the selected input range.
05490-001
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
AVDD1 = 3.3 V, AVDD2 = 5.0 V, DRVDD = 3.3 V, LVDS mode, specified minimum sampling rate, 3.2 V p-p differential input, internal
trimmed reference (1.6 V mode), A
Table 1.
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te mp Min Typ Max Min Typ Max Unit
RESOLUTION Full 16 16 Bits
ACCURACY
No Missing Codes Full Guaranteed Guaranteed
Offset Error Full −5 ±0.1 +5 −5 ±0.1 +5 mV
Gain Error Full −3 ±0.6 +3 −3 ±0.5 +3 % FSR
25°C −2 ±0.3 +2 −2 ±0.3 +2 % FSR
Differential Nonlinearity (DNL)
Integral Nonlinearity (INL)1 25°C −5 ±3.0 +5 −6 ±3.0 +6 LSB
VOLTAGE REFERENCE
Output Voltage
1
VREF = 1.6 V (3.2 V p-p Analog Input Range) Full 1.6 1.6 V
Load Regulation @ 1.0 mA Full ±2 ±2 mV
Reference Input Current (External 1.6 V Reference) Full µA
INPUT REFERRED NOISE 25°C 1.5 1.9 LSB rms
ANALOG INPUT
Input Span
VREF = 1.6 V Full 3.2 3.2 V p-p
VREF = 1.0 V (External) Full 2.0 2.0 V p-p
Internal Input Common-Mode Voltage Full 3.5 3.5 V
External Input Common-Mode Voltage Full 3.2 3.8 3.2 3.8 V
Input Resistance
Input Capacitance
2
2
POWER SUPPLIES
Supply Voltage
AVDD1 Full 3.14 3.3 3.46 3.14 3.3 3.46 V
AVDD2 Full 4.75 5.0 5.25 4.75 5.0 5.25 V
DRVDD—LVDS Outputs Full 3.0 3.3 3.6 3.0 3.3 3.6 V
DRVDD—CMOS Outputs Full 3.0 3.3 3.6 3.0 3.3 3.6 V
Supply Current
1
I
AVDD
1
I
AVDD2
1
I
—LVDS Outputs Full 68 75 69 75 mA
DRVDD
1
I
—CMOS Outputs Full 14 14 mA
DRVDD
PSRR
Offset Full 1 1 mV/V
Gain Full 0.2 0.2 %/V
POWER CONSUMPTION
LVDS Outputs Full 2.4 2.6 2.6 2.8 W
CMOS Outputs (DC Input) Full 2.2 2.3 W
1
Measured at the maximum clock rate, fIN = 15 MHz, full-scale sine wave, with a 100 Ω differential termination on each pair of output bits for LVDS output mode and
approximately 5 pF loading on each output bit for CMOS output mode.
2
Input capacitance or resistance refers to the effective impedance between one differential input pin and AGND. Refer to Figure 6 for the equivalent analog input structure.
= −1.0 dBFS, DCS on, unless otherwise noted.
IN
1
Full −0.75 ±0.4 +0.75 −0.85 ±0.4 +0.85 LSB
Full 1 1 kΩ
Full 6 6 pF
Full 335 365 368 401 mA
Full 204 234 223 255 mA
Rev. 0 | Page 3 of 36
Page 4
AD9446
www.BDTIC.com/ADI
AC SPECIFICATIONS
AVDD1 = 3.3 V, AVDD2 = 5.0 V, DRVDD = 3.3 V, LVDS mode, specified minimum sample rate, 3.2 V p-p differential input, internal
trimmed reference (1.6 V mode), A
Table 2.
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te m p Min Typ Max Min Typ Max Unit
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 10 MHz 25°C 79.6 81.8 78.4 79.7 dB
fIN = 30 MHz 25°C 80.5 81.6 78.3 79.5 dB
Full 79.2 77.9 dB
fIN = 70 MHz 25°C 79.0 80.6 77.7 79.0 dB
Full 78.2 77.6 dB
fIN = 92 MHz 25°C 80.1 78.9 dB
fIN = 125 MHz 25°C 78.8 78.2 dB
fIN = 170 MHz 25°C 77.1 77.0 dB
fIN = 10 MHz (2 V p-p Input) 25°C 78.3 76.6 dB
fIN = 30 MHz (2 V p-p Input) 25°C 78.3 76.6 dB
fIN = 70 MHz (2 V p-p Input) 25°C 77.6 76.2 dB
fIN = 92 MHz (2 V p-p Input) 25°C 77.5 76 dB
fIN = 125 MHz (2 V p-p Input) 25°C 76.7 75.6 dB
fIN = 170 MHz (2 V p-p Input) 25°C 75.5 75.1 dB
SIGNAL-TO-NOISE AND DISTORTION (SINAD)
fIN = 10 MHz 25°C 77.1 80.5 76.9 78.9 dB
fIN = 30 MHz 25°C 75.9 80.4 75.5 78.6 dB
Full 74.9 71.7 dB
fIN = 70 MHz 25°C 75.5 78.6 73.8 77.7 dB
Full 74.4 69.1 dB
fIN = 92 MHz 25°C 79.2 77.1 dB
fIN = 125 MHz 25°C 74.9 76.9 dB
fIN = 170 MHz 25°C 66.0 70.5 dB
fIN = 10 MHz (2 V p-p Input) 25°C 77.9 76.2 dB
fIN = 30 MHz (2 V p-p Input) 25°C 77.8 76.1 dB
fIN = 70 MHz (2 V p-p Input) 25°C 77.1 75.9 dB
fIN = 92 MHz (2 V p-p Input) 25°C 77.1 75.7 dB
fIN = 125 MHz (2 V p-p Input) 25°C 75.7 75.3 dB
fIN = 170 MHz (2 V p-p Input) 25°C 72.5 73.6 dB
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 10 MHz 25°C 13.2 13.0 Bits
fIN = 30 MHz 25°C 13.2 12.9 Bits
fIN = 70 MHz 25°C 12.9 12.8 Bits
fIN = 92 MHz 25°C 13.0 12.7 Bits
fIN = 125 MHz 25°C 12.3 12.6 Bits
fIN = 170 MHz 25°C 10.8 11.6 Bits
= −1 dBFS, DCS on, unless otherwise noted.
IN
Rev. 0 | Page 4 of 36
Page 5
AD9446
www.BDTIC.com/ADI
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te m p Min Typ Max Min Typ Max Unit
SPURIOUS-FREE DYNAMIC RANGE
(SFDR, Second or Third Harmonic)
fIN = 10 MHz 25°C 82 90 82 92 dBc
fIN = 30 MHz 25°C 82 89 82 89 dBc
Full 80 79 dBc
fIN = 70 MHz 25°C 80 87 81 89 dBc
Full 79 77 dBc
fIN = 92 MHz 25°C 84 84 dBc
fIN = 125 MHz 25°C 80 83 dBc
fIN = 170 MHz 25°C 66 74 dBc
fIN = 10 MHz (2 V p-p Input) 25°C 92 94 dBc
fIN = 30 MHz (2 V p-p Input) 25°C 93 92 dBc
fIN = 70 MHz (2 V p-p Input) 25°C 92 92 dBc
fIN = 92 MHz (2 V p-p Input) 25°C 90 89 dBc
fIN = 125 MHz (2 V p-p Input) 25°C 85 87 dBc
fIN = 170 MHz (2 V p-p Input) 25°C 77 82 dBc
WORST SPUR EXCLUDING SECOND OR
THIRD HARMONICS
fIN = 10 MHz 25°C −98 −89 −96 −91 dBc
fIN = 30 MHz 25°C −97 −89 −97 −89 dBc
Full −89 −87 dBc
fIN = 70 MHz 25°C −98 −90 −96 −90 dBc
Full −89 −88 dBc
fIN = 92 MHz 25°C −98 −95 dBc
fIN = 125 MHz 25°C −96 −96 dBc
fIN = 170 MHz 25°C −95 −92 dBc
fIN = 10 MHz (2 V p-p Input) 25°C −97 −93 dBc
fIN = 30 MHz (2 V p-p Input) 25°C −97 −96 dBc
fIN = 70 MHz (2 V p-p Input) 25°C −94 −94 dBc
fIN = 92 MHz (2 V p-p Input) 25°C −97 −99 dBc
fIN = 125 MHz (2 V p-p Input) 25°C −97 −95 dBc
fIN = 170 MHz (2 V p-p Input) 25°C −93 −95 dBc
TWO-TONE SFDR
fIN = 10.8 MHz @ −7 dBFS,
9.8 MHz @ −7 dBFS
fIN = 70.3 MHz @ −7 dBFS,
69.3 MHz @ −7 dBFS
ANALOG BANDWIDTH Full 325 540 MHz
25°C 96 95 dBFS
25°C 92 92 dBFS
Rev. 0 | Page 5 of 36
Page 6
AD9446
www.BDTIC.com/ADI
DIGITAL SPECIFICATIONS
AVDD1 = 3.3 V, AVDD2 = 5.0 V, DRVDD = 3.3 V, R
Table 3.
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te mp Min Typ Max Min Typ Max Unit
CMOS LOGIC INPUTS (DFS, DCS MODE, OUTPUT MODE)
High Level Input Voltage Full 2.0 2.0 V
Low Level Input Voltage Full 0.8 0.8 V
High Level Input Current Full 200 200 µA
Low Level Input Current Full −10
Input Capacitance Full
DIGITAL OUTPUT BITS—CMOS MODE (D0 to D15, OTR)
DRVDD = 3.3 V
High Level Output Voltage Full 3.25
Low Level Output Voltage Full
DIGITAL OUTPUT BITS—LVDS MODE (D0 to D15, OTR)
VOD Differential Output Voltage
2
VOS Output Offset Voltage Full 1.125
CLOCK INPUTS (CLK+, CLK−)
Differential Input Voltage Full 0.2
Common-Mode Voltage Full 1.31.51.61.3 1.5 1.6 V
Input Resistance Full 1.1 1.41.71.1 1.4 1.7 kΩ
Input Capacitance Full
1
Output voltage levels measured with 5 pF load on each output.
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te mp Min Typ Max Min Typ Max Unit
CLOCK INPUT PARAMETERS
Maximum Conversion Rate Full 80 100 MSPS
Minimum Conversion Rate Full 1 1 MSPS
CLK Period Full 12.5 10 ns
CLK Pulse Width High1 (t
CLK Pulse Width Low1 (t
DATA OUTPUT PARAMETERS
Output Propagation Delay—CMOS (tPD)2 (Dx, DCO+) Full 3.35 3.35 ns
Output Propagation Delay—LVDS (tPD)3 (Dx+), (t
Pipeline Delay (Latency) Full 13 13 Cycles
Aperture Delay (tA) Full ns
Aperture Uncertainty (Jitter, tJ) Full 60 60
1
With duty cycle stabilizer (DCS) enabled.
2
Output propagation delay is measured from clock 50% transition to data 50% transition with 5 pF load.
3
LVDS R
= 100 Ω. Measured from the 50% point of the rising edge of CLK+ to the 50% point of the data transition.
TERM
) Full 5.0 4.0 ns
CLKH
) Full 5.0 4.0 ns
CLKL
)3 (DCO+) Full 2.1 3.6 4.8 2.3 3.6 4.8 ns
CPD
fsec
s
rm
Rev. 0 | Page 6 of 36
Page 7
AD9446
www.BDTIC.com/ADI
TIMING DIAGRAMS
A
CLK+
CLK–
N–1
IN
t
CLKH
t
CLKL
N
N + 1
1/
f
S
t
PD
DATA OUT
DCO+
DCO–
VIN
CLK–
CLK+
DX
DCO+
DCO–
N–1
t
CLKH
N + 1
05490-002
t
CPD
N – 13
13 CLOCK CYCLES
N–12
N
Figure 2. LVDS Mode Timing Diagram
N
N + 1
t
CLKL
t
PD
N – 13N – 12N – 1N
N + 2
13 CLOCK CYCLES
05490-003
Figure 3. CMOS T
iming Diagram
Rev. 0 | Page 7 of 36
Page 8
AD9446
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
Table 5.
With
t
Respec
Parameter
ELECTRICAL
AVDD1 AGND −0.3 V to +4 V
AVDD2 AGND −0.3 V to +6 V
DRVDD DGND −0.3 V to +4 V
AGND DGND −0.3 V to +0.3 V
AVDD1 DRVDD −4 V to +4 V
AVDD2 DRVDD −4 V to +6 V
AVDD2 AVDD1 −4 V to +6 V
D0± to D15± DGND –0.3 V to DRVDD + 0.3 V
CLK+/CLK− AGND –0.3 V to AVDD1 + 0.3 V
OUTPUT MODE,
DCS MODE, DFS
VIN+, VIN− AGND –0.3 V to AVDD2 + 0.3 V
VREF AGND –0.3 V to AVDD1 + 0.3 V
SENSE AGND –0.3 V to AVDD1 + 0.3 V
REFT, REFB AGND –0.3 V to AVDD1 + 0.3 V
ENVIRONMENTAL
Storage Temperature
Range
Operating Temperature
Range
Lead Temperature
(Soldering 10 sec)
Junction Temperature 150°C
to
AGND –0.3 V to AVDD1 + 0.3 V
–65°C to +125°C
–40°C to +85°C
300°C
Rating
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
The heat sink of the AD9446 package must be soldered to
ground.
Table 6.
Package Type θ
100-lead TQFP/EP 19.8 8.3 2 °C/W
JA
Typical θJA = 19.8°C/W (heat sink soldered) for multilayer
board in still air.
Typical θ
= 8.3°C/W (heat sink soldered) for multilayer board
JB
in still air.
Typical θ
= 2°C/W (junction to exposed heat sink) represents
JC
the thermal resistance through heat sink path.
Airflow increases heat dissipation, effectively reducing θ
more metal directly in contact with the package leads from
metal traces through holes, ground, and power planes reduces
the θ
. It is required that the exposed heat sink be soldered to
JA
the ground plane.
θ
JB
θ
JC
Unit
. Also,
JA
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. 0 | Page 8 of 36
Page 9
AD9446
www.BDTIC.com/ADI
TERMINOLOGY
Analog Bandwidth (Full Power Bandwidth)
The analog input frequency at which the spectral power of the
undamental frequency (as determined by the FFT analysis) is
f
reduced by 3 dB.
Minimum Conversion Rate
The clock rate at which the SNR of the lowest analog signal
frequency drops by no more than 3 dB below the guaranteed
limit.
Aperture Delay (t
The delay between the 50% point of the rising edge of the clock
nd the instant at which the analog input is sampled.
a
Aperture Uncertainty (Jitter, t
The sample-to-sample variation in aperture delay.
Clock Pulse Width and Duty Cycle
Pulse width high is the minimum amount of time that the
lock pulse should be left in the Logic 1 state to achieve rated
c
performance. Pulse width low is the minimum time the clock
pulse should be left in the low state. At a given clock rate, these
specifications define an acceptable clock duty cycle.
Differential Nonlinearity (DNL, No Missing Codes)
An ideal ADC exhibits code transitions that are exactly 1 LSB
part. DNL is the deviation from this ideal value. Guaranteed
a
no missing codes to 16-bit resolution indicates that all 65,536
codes must be present over all operating ranges.
Effective Number of Bits (ENOB)
The effective number of bits for a sine wave input at a given
put frequency can be calculated directly from its measured
in
SINAD using the following formula:
ENOB
Gain Error
The first code transition should occur at an analog value of
½ LSB above negative full scale. The last transition should occur
at an analog value of 1½ LSB below the positive full scale. Gain
error is the deviation of the actual difference between first and
last code transitions and the ideal difference between first and
last code transitions.
Integral Nonlinearity (INL)
The deviation of each individual code from a line drawn from
negative full scale through positive full scale. The point used as
negative full scale occurs ½ LSB before the first code transition.
Positive full scale is defined as a level 1½ LSB beyond the last
code transition. The deviation is measured from the middle of
each particular code to the true straight line.
Maximum Conversion Rate
The clock rate at which parametric testing is performed.
)
A
)
J
()
SINAD
=
1.76−
6.02
Offset Error
The major carry transition should occur for an analog value of
½ LSB below VIN+ = VIN−. Offset error is defined as the
deviation of the actual transition from that point.
Out-of-Range Recovery Time
The time it takes for the ADC to reacquire the analog input
after a transition from 10% above positive full scale to 10%
above negative full scale, or from 10% below negative full scale
to 10% below positive full scale.
Output Propagation Delay (tPD)
The delay between the clock rising edge and the time when all
bits are within valid logic levels.
Power-Supply Rejection Ratio
The change in full scale from the value with the supply at the
minimum limit to the value with the supply at the maximum
limit.
Signal-to-Noise and Distortion (SINAD)
The ratio of the rms input signal amplitude to the rms value of
the sum of all other spectral components below the Nyquist
frequency, including harmonics but excluding dc.
Signal-to-Noise Ratio (SNR)
The ratio of the rms input signal amplitude to the rms value of
the sum of all other spectral components below the Nyquist
frequency, excluding the first six harmonics and dc.
Spurious-Free Dynamic Range (SFDR)
The ratio of the rms signal amplitude to the rms value of the
peak spurious spectral component. The peak spurious component
may be a harmonic. SFDR can be reported in dBc (that is, degrades
as signal level is lowered) or dBFS (always related back to converter
full scale).
Tem p er at u re Dr i ft
The temperature drift for offset error and gain error specifies
the maximum change from the initial (25°C) value to the value
at T
or T
MIN
Total Harmonic Distortion (THD)
The ratio of the rms input signal amplitude to the rms value of
the sum of the first six harmonic components.
Two -Tone SFDR
The ratio of the rms value of either input tone to the rms value
of the peak spurious component. The peak spurious component
may or may not be an IMD product.
Figure 44. AD9446-80 Two-Tone SFDR vs. Analog Input Level 80 MSPS/
69.
3 MHz, 70.3 MHz
0
–0.1
–0.2
–0.3
–0.4
–0.5
GAIN ERROR (%FSR)
–0.6
–0.7
–0.8
–40
–20020406080
TEMPERATURE (°C)
Figure 46. AD9446-100 Gain vs. Temperature
400
350
(mA)
SUPPLY
I
300
250
200
150
100
AVDD1
AVDD2
DRVDD
50
0
20406080100120
0
SAMPLE RATE (MSPS)
Figure 47. AD9446-80 Power Supply Current vs. Sample Rate
10.
3 MHz @ −1 dBFS
140
05490-048
05490-049
Rev. 0 | Page 21 of 36
Page 22
AD9446
www.BDTIC.com/ADI
95
82
93
10.3MHz SFDR dBc
70.3MHz SFDR dBc
(dB)
91
89
87
85
83
81
79
1.8
30.3MHz SFDR dBc
ANALOG INPUT RANGE (V p-p)
Figure 48. AD9446-100/SFDR vs. Analog Input Range,
0 MSPS
10
1.625
1.620
1.615
VREF
1.610
1.605
–40
–20020406080
TEMPERATURE (°C)
Figure 49. AD9446-100 VREF vs. Temperature
4.22.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 4.0
05490-050
05490-051
81
80
70.3MHz SFDR dBc
(dB)
79
78
77
76
1.8
10.3MHz SFDR dBc
30.3MHz SFDR dBc
ANALOG INPUT RANGE (V p-p)
Figure 51. AD9446-100 SNR vs. Analog Input Range,
0 MSPS
10
95
(dB)
93
91
89
87
85
83
81
79
1.8
30.3MHz SFDR dBc
ANALOG INPUT RANGE (V p-p)
10.3MHz SFDR dBc
70.3MHz SFDR dBc
Figure 52. AD9446-80 SFDR vs. Analog Input Range,
10
0 MSPS
05490-064
4.22.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 4.0
05490-065
4.22.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 4.0
450
400
350
AVDD1
AVDD2
DRVDD
50
0
0
20406080100120
SAMPLE RATE (MSPS)
140
05490-063
(mA)
SUPPLY
I
300
250
200
150
100
Figure 50. AD9446-100 Power Supply Current vs. Sample Rate
3 MHz @ −1 dBFS
10.
Rev. 0 | Page 22 of 36
84
10.3MHz SNR dB
70.3MHz SNR dB
(dB)
83
82
81
80
79
78
77
1.8
2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6 3.8 4.0
ANALOG INPUT RANGE (V p-p)
Figure 53. AD9446-80/SNR vs. Analog Input Range,
80 MSPS
30.3MHz SNR dB
4.2
05490-066
Page 23
AD9446
www.BDTIC.com/ADI
100
0
100M SFDR dBc
80M SFDR dBc
80M SNR dB
100M SNR dB
201030 4050 607080 90 100 110
SAMPLE RATE (MSPS)
95
90
(dB)
85
80
75
Figure 54. AD9446 Single-Tone SNR/SFDR vs. Sample Rate 2.3 MHz
05490-036
Rev. 0 | Page 23 of 36
Page 24
AD9446
www.BDTIC.com/ADI
THEORY OF OPERATION
The AD9446 architecture is optimized for high speed and ease
of use. The analog inputs drive an integrated, high bandwidth
track-and-hold circuit that samples the signal prior to quantization
by the 16-bit pipeline ADC core. The device includes an on-board
reference and input logic that accepts TTL, CMOS, or LVPECL
levels. The digital output logic levels are user selectable as standard
3 V CMOS or LVDS (ANSI-644 compatible) via the OUTPUT
MODE pin.
ANALOG INPUT AND REFERENCE OVERVIEW
A stable and accurate 0.5 V band gap voltage reference is built
into the AD9446. The input range can be adjusted by varying
the reference voltage applied to the AD9446, using either the
internal reference or an externally applied reference voltage.
The input span of the ADC tracks reference voltage changes
linearly.
Internal Reference Connection
A comparator within the AD9446 detects the potential at the
SENSE pin and configures the reference into three possible states,
which are summarized in Ta bl e 9. If SENSE is grounded, the
reference amplifier switch is connected to the internal resistor
divider (see Figure 55), setting VREF to ~1.6 V. If a resistor
er is connected as shown in Figure 56, the switch again sets
divid
o the SENSE pin. This puts the reference amplifier in a
t
noninverting mode with the VREF output defined as
R2
⎛
VVREF15.0
⎜
⎝
In all reference configurations, REFT and REFB drive the
nalog-to-digital conversion core and establish its input span.
a
The input range of the ADC always equals twice the voltage at
the reference pin for either an internal or an external reference.
Internal Reference Trim
The internal reference voltage is trimmed during the production
test; therefore, there is little advantage to the user supplying an
external voltage reference to the AD9446. The gain trim is performed with the AD9446 input range set to 3.2 V p-p nominal
(SENSE connected to AGND). Because of this trim and the
maximum ac performance provided by the 3.2 V p-p analog
input range, there is little benefit to using analog input ranges
⎞
+×=
⎟
R1
⎠
<2 V p-p. However, reducing the range can improve SFDR
performance in some applications. Likewise, increasing the
range up to 3.8 V p-p can improve SNR. Users are cautioned
that the differential nonlinearity of the ADC varies with the
reference voltage. Configurations that use <2.0 V p-p may
exhibit missing codes and therefore degraded noise and
distortion performance.
VIN+
10μF+0.1μF
10μF+0.1μF
VIN–
ADC
CORE
VREF
SELECT
LOGIC
SENSE
0.5V
AD9446
Figure 55. Internal Reference Configuration
VIN+
VIN–
VREF
R2
SENSE
R1
Figure 56. Programmable Reference Configuration
SELECT
LOGIC
0.5V
AD9446
ADC
CORE
REFT
0.1μF
0.1μF10μF
REFB
0.1μF
REFT
0.1μF
0.1μF10μF
REFB
0.1μF
+
05490-052
+
05490-053
Rev. 0 | Page 24 of 36
Page 25
AD9446
www.BDTIC.com/ADI
Table 9. Reference Configuration Summary
Selected Mode SENSE Voltage Resulting VREF (V) Resulting Differential Span (V p-p)
External Reference AVDD N/A 2 × external reference
Programmable Reference 0.2 V to VREF
Programmable Reference
(Set for 2 V p-p)
Programmable Reference
(Set for 2 V p-p)
Internal Fixed Reference AGND to 0.2 V 1.6 3.2
0.2 V to VREF
0.2 V to VREF
R2
⎛
⎜
⎝
⎛
⎜
⎝
⎛
⎜
⎝
⎞
(See Figure 56)
+×
10.5
⎟
R1
⎠
R2
⎞
, R1 = R2 = 1 kΩ
+×
10.5
⎟
R1
⎠
R2
⎞
, R1 = 1 kΩ , R2 = 2.8 kΩ
+×
10.5
⎟
R1
⎠
External Reference Operation
When the SENSE pin is tied to AVDD, the internal reference is
disabled, allowing the use of an external reference. An internal
reference buffer loads the external reference with an equivalent
VIN+
7 kΩ load. The internal buffer still generates the positive and
negative full-scale references, REFT and REFB, for the ADC
1.6V p-p
core. The input span is always twice the value of the reference
voltage; therefore, the external reference must be limited to a
VIN–
maximum of 2.0 V. See Figure 46 for gain variation vs.
temperature.
DIGITAL OUT = ALL 1sDIGITAL OUT = ALL 0s
2 × VREF
2.0
3.8
3.5V
Analog Inputs
As with most new high speed, high dynamic range ADCs, the
analog input to the AD9446 is differential. Differential inputs
improve on-chip performance because signals are processed
through attenuation and gain stages. Most of the improvement
is a result of differential analog stages having high rejection of
even-order harmonics. There are also benefits at the PCB level.
First, differential inputs have high common-mode rejection of
stray signals, such as ground and power noise. Second, they
provide good rejection of common-mode signals, such as local
oscillator feedthrough. The specified noise and distortion of the
AD9446 cannot be realized with a single-ended analog input, so
such configurations are discouraged. Contact sales for
recommendations of other 16-bit ADCs that support singleended analog input configurations.
With the 1.6 V reference, which is the nominal value (see the
Internal Reference Trim section), the differential input range of
e AD9446 analog input is nominally 3.2 V p-p or 1.6 V p-p on
th
each input (VIN+ or VIN−).
Figure 57. Differential Analog Input Range for VREF = 1.6 V
The AD9446 analog input voltage range is offset from ground
by 3.5 V. Each analog input connects through a 1 kΩ resistor to
the 3.5 V bias voltage and to the input of a differential buffer. The
internal bias network on the input properly biases the buffer for
maximum linearity and range (see the
s
ection). Therefore, the analog source driving the AD9446
Equivalent Circuits
should be ac-coupled to the input pins. The recommended
method for driving the analog input of the AD9446 is to use an
RF transformer to convert single-ended signals to differential
Figure 58). Series resistors between the output of the
(see
nsformer and the AD9446 analog inputs help isolate the
tra
analog input source from switching transients caused by the
internal sample-and-hold circuit. The series resistors, along
with the 1 kΩ resisters connected to the internal 3.5 V bias,
must be considered in impedance matching the transformer
input. For example, if R
is set to 51 Ω, RS is set to 33 Ω and
T
there is a 1:1 impedance ratio transformer, the input will match a
50 Ω source with a full-scale drive of 16.0 dBm. The 50 Ω
impedance matching can also be incorporated on the secondary
side of the transformer, as shown in the evaluation board
schematic (see Figure 61).
05490-054
Rev. 0 | Page 25 of 36
Page 26
AD9446
www.BDTIC.com/ADI
0.1
R
S
VIN+
AD9446
R
S
μF
VIN–
05490-055
R
ADT1–1WT
T
ANALOG
INPUT
SIGNAL
Figure 58. Transformer-Coupled Analog Input Circuit
CLOCK INPUT CONSIDERATIONS
Any high speed ADC is extremely sensitive to the quality of the
sampling clock provided by the user. A track-and-hold circuit is
essentially a mixer, and any noise, distortion, or timing jitter on
the clock is combined with the desired signal at the analog-todigital output. For that reason, considerable care was taken in
the design of the clock inputs of the AD9446, and the user is
advised to give careful thought to the clock source.
Typical high speed ADCs use both clock edges to generate a
riety of internal timing signals and, as a result, may be sensitive
va
to the clock duty cycle. Commonly a 5% tolerance is required on
the clock duty cycle to maintain dynamic performance characteristics. The AD9446 contains a clock duty cycle stabilizer (DCS)
that retimes the nonsampling edge, providing an internal clock
signal with a nominal ~50% duty cycle. Noise and distortion performance are nearly flat for a 30% to 70% duty cycle with the DCS
enabled. The DCS circuit locks to the rising edge of CLK+ and
optimizes timing internally. This allows for a wide range of input
duty cycles at the input without degrading performance. Jitter in
the rising edge of the input is still of paramount concern and is
not reduced by the internal stabilization circuit. The duty cycle
control loop does not function for clock rates of less than 30 MHz
nominally. The loop is associated with a time constant that
should be considered in applications where the clock rate can
change dynamically, requiring a wait time of 1.5 μs to 5 μs after a
dynamic clock frequency increase or decrease before the DCS
loop is relocked to the input signal. During the time that the
loop is not locked, the DCS loop is bypassed, and the internal
device timing is dependent on the duty cycle of the input clock
signal. In such an application, it may be appropriate to disable the
duty cycle stabilizer. In all other applications, enabling the DCS
circuit is recommended to maximize ac performance.
The DCS circuit is controlled by the DCS MODE pin; a CMOS
gic low (AGND) on DCS MODE enables the duty cycle stabilizer,
lo
and logic high (AVDD1 = 3.3 V) disables the controller.
The AD9446 input sample clock signal must be a high quality,
remely low phase noise source to prevent degradation of per-
ext
formance. Maintaining 16-bit accuracy places a premium on the
encode clock phase noise. SNR performance can easily degrade
by 3 dB to 4 dB with 70 MHz analog input signals when using a
high jitter clock source. (See the AN-501 Application Note,
Aperture Uncertainty and ADC System Performance.”) For
“
optimum performance, the AD9446 must be clocked differentially.
The sample clock inputs are internally biased to ~1.5 V, and the
input signal is usually ac-coupled into the CLK+ and CLK− pins
via a transformer or capacitors.
m
ethod for clocking the AD9446. The clock source (low jitter)
Figure 59 shows one preferred
is converted from single-ended to differential using an RF transformer. The back-to-back Schottky diodes across the secondary
of the transformer limit clock excursions into the AD9446 to
approximately 0.8 V p-p differential. This helps prevent the large
voltage swings of the clock from feeding through to other portions
of the AD9446 and limits the noise presented to the sample
clock inputs.
If a low jitter clock is available, it may help to band-pass filter
he clock reference before driving the ADC clock inputs. Another
t
option is to ac couple a differential ECL/PECL signal to the encode
input pins, as shown in Figure 60.
High speed, high resolution ADCs are sensitive to the quality
of the clock input. The degradation in SNR at a given input
f
frequency (
t
) can be calculated using the following equation:
(
J
SNR = 20 log[2πf
) and rms amplitude due only to aperture jitter
INPUT
× tJ]
INPUT
In the equation, the rms aperture jitter represents the root-mean-
uare of all jitter sources, which includes the clock input, analog
sq
input signal, and ADC aperture jitter specification. IF undersampling applications are particularly sensitive to jitter
The clock input should be treated as an analog signal in cases
w
here aperture jitter may affect the dynamic range of the AD9446.
Power supplies for clock drivers should be separated from the
ADC output driver supplies to avoid modulating the clock signal
with digital noise. Low jitter crystal-controlled oscillators make
the best clock sources. If the clock is generated from another type
of source (by gating, dividing, or another method), it should be
synchronized by the original clock during the last step.
Rev. 0 | Page 26 of 36
Page 27
AD9446
www.BDTIC.com/ADI
POWER CONSIDERATIONS
Care should be taken when selecting a power source. The use of
linear dc supplies is highly recommended. Switching supplies
tend to have radiated components that may be received by the
AD9446. Each of the power supply pins should be decoupled as
closely to the package as possible using 0.1 μF chip capacitors.
The AD9446 has separate digital and analog power supply pins.
The a
nalog supplies are denoted AVDD1 (3.3 V) and AVDD2
(5 V), and the digital supply pins are denoted DRVDD. Although
the AVDD1 and DRVDD supplies can be tied together, best performance is achieved when the supplies are separate. This is
because the fast digital output swings can couple switching
current back into the analog supplies. Note that both AVDD1
and AVDD2 must be held within 5% of the specified voltage.
The DRVDD supply of the AD9446 is a dedicated supply for the
igital outputs in either LVDS or CMOS output mode. When in
d
LVDS mode, the DRVDD should be set to 3.3 V. In CMOS mode,
the DRVDD supply can be connected from 2.5 V to 3.6 V for
compatibility with the receiving logic.
DIGITAL OUTPUTS
LVDS Mode
The off-chip drivers on the chip can be configured to provide
LVDS-compatible output levels via Pin 3 (OUTPUT MODE).
LVDS outputs are available when OUTPUT MODE is CMOS
logic high (or AVDD1 for convenience) and a 3.74 kΩ R
resistor is placed at Pin 5 (LVDS_BIAS) to ground. Dynamic
performance, including both SFDR and SNR, is maximized
when the AD9446 is used in LVDS mode; designers are
encouraged to take advantage of this mode. The AD9446
outputs include complimentary LVDS outputs for each data bit
(Dx+/Dx−), the overrange output (OR+/OR−), and the output
SET
data clock output (DCO+/DCO−). The R
multiplied on-chip, setting the output current at each output
equal to a nominal 3.5 mA (11 × I
termination resistor placed at the LVDS receiver inputs results
in a nominal 350 mV swing at the receiver. LVDS mode
facilitates interfacing with LVDS receivers in custom ASICs and
FPGAs that have LVDS capability for superior switching
performance in noisy environments. Single point-to-point net
topologies are recommended, with a 100 Ω termination resistor
located as close to the receiver as possible. It is recommended to
keep the trace length less than 2 inches and to keep differential
output trace lengths as equal as possible.
R
SET
CMOS Mode
In applications that can tolerate a slight degradation in dynamic
performance, the AD9446 output drivers can be configured to
interface with 2.5 V or 3.3 V logic families by matching
DRVDD to the digital supply of the interfaced logic. CMOS
outputs are available when OUTPUT MODE is CMOS logic
low (or AGND for convenience). In this mode, the output data
bits, Dx, are single-ended CMOS, as is the overrange output,
OR+. The output clock is provided as a differential CMOS
signal, DCO+/DCO−. Lower supply voltages are recommended
to avoid coupling switching transients back to the sensitive
analog sections of the ADC. The capacitive load to the CMOS
outputs should be minimized, and each output should be
connected to a single gate through a series resistor (220 Ω) to
minimize switching transients caused by the capacitive loading.
TIMING
The AD9446 provides latched data outputs with a pipeline delay
of 13 clock cycles. Data outputs are available one propagation
delay (t
Figure 3 for detailed timing diagrams.
) after the rising edge of CLK+. Refer to Figure 2 and
PD
resistor current is
SET
). A 100 Ω differential
Rev. 0 | Page 27 of 36
Page 28
AD9446
www.BDTIC.com/ADI
OPERATIONAL MODE SELECTION
Data Format Select
The data format select (DFS) pin of the AD9446 determines
the coding format of the output data. This pin is 3.3 V CMOS
compatible, with logic high (or AVDD1, 3.3 V) selecting twos
complement and DFS logic low (AGND) selecting offset binary
format. Tabl e 10 summarizes the output coding.
Output Mode Select
The OUPUT MODE pin controls the logic compatibility,
as well as the pinout of the digital outputs. This pin is a CMOS-
compatible input. With OUTPUT MODE = 0 (AGND), the
AD9446 outputs are CMOS compatible, and the pin assignment
for the device is as defined in Tabl e 8. With OUTPUT MODE = 1
VDD1, 3.3 V), the AD9446 outputs are LVDS compatible, and
(A
the pin assignment for the device is as defined in
Duty Cycle Stabilizer
The DCS circuit is controlled by the DCS MODE pin; a CMOS
logic low (AGND) on DCS MODE enables the DCS, and logic
high (AVDD1, 3.3 V) disables the controller.
Digital Output
Offset Binary (D15••••••D0)
Digital Output
Twos Complement (D15••••••D0)
Tabl e 7 .
Rev. 0 | Page 28 of 36
Page 29
AD9446
www.BDTIC.com/ADI
EVALUATION BOARD
Evaluation boards are offered to configure the AD9446 in either
CMOS or LVDS mode only. This design represents a recommended configuration for using the device over a wide range of
sampling rates and analog input frequencies. These evaluation
boards provide all the support circuitry required to operate
the ADC in its various modes and configurations. Complete
schematics are shown in
iles are available from engineering applications demonstrating
f
the proper routing and grounding techniques that should be
applied at the system level.
Figure 61 through Figure 64. Gerber
The LVDS mode evaluation boards include an LVDS-to-CMOS
ranslator, making them compatible with the high speed ADC
t
FIFO evaluation kit (HSC-ADC-EVALA-SC). The kit includes a
high speed data capture board that provides a hardware solution
for capturing up to 32 kB samples of high speed ADC output
data in a FIFO memory chip (user upgradeable to 256 kB
samples). Software is provided to enable the user to download
the captured data to a PC via the USB port. This software also
includes a behavioral model of the AD9446 and many other
high speed ADCs.
It is critical that signal sources with very low phase noise
(
<60 fsec rms jitter) be used to realize the ultimate performance
of the converter. Proper filtering of the input signal to remove
harmonics and lower the integrated noise at the input is also
necessary to achieve the specified noise performance.
The evaluation boards are shipped with a 115 V ac to 6 V dc
p
ower supply. The evaluation boards include low dropout
regulators to generate the various dc supplies required by the
AD9446 and its support circuitry. Separate power supplies are
provided to isolate the DUT from the support circuitry. Each
input configuration can be selected by proper connection of
various jumpers (see Figure 61).
Behavioral modeling of the AD9446 is also available at
www.analog.com/ADIsimADC. The ADIsimADC™ software
supp
orts virtual ADC evaluation using ADI proprietary behavioral
modeling technology. This allows rapid comparison between the
AD9446 and other high speed ADCs with or without hardware
evaluation boards.
The user can choose to remove the translator and terminations
Designator Description Package Value Manufacturer Mfg. Part No.
1
1
1
1
1
1
1
1
1
Header EHOLE Mouser Electronics 517-6111TG
SMA SMA Digi-Key Corporation ARFX1231-ND
Header C40MS Samtec, Inc.
TSW-120-08-L-D-
RA
BRES402 402 XX
BRES402 402 XX
ECLOSC DIP4(14)
MTHOLE6 MTHOLE6
Balun transformer SM-22 M/A-COM ETC1-1-13
Term strip PTMICRO4 Newark Electronics
Rev. 0 | Page 35 of 36
Page 36
AD9446
www.BDTIC.com/ADI
OUTLINE DIMENSIONS
0.75
0.60
0.45
1.20
MAX
16.00 BSC SQ
1
PIN 1
14.00 BSC SQ
76100
76100
75
75
1
1.05
1.00
0.95
0.15
SEATING
0.05
PLANE
VIEW A
ROTATED 90° CCW
TOP VIEW
(PINS DOWN)
0° MIN
0.20
0.09
7°
3.5°
0°
0.08 MAX
COPLANARITY
NOTES
1. CENTER FIGURES ARE TY P ICAL UNLESS O THERWISE NOTED.
2. THE PACKAGE HAS A CONDUCTIVE HEAT SLUG TO HELP DISSIPATE HEAT AND ENSURE RELIABLE OPER ATIO N OF
THE DEVICE OVER THE FULL INDUSTRIAL TEMPERATURE RANGE. THE SLUG IS EX P OSED ON THE BO TTOM OF
THE PACKAGE AND ELECTRICALLY CONNECTED TO CHIP GROUND. IT IS RECO M M E NDED THAT NO PCB SIGNAL
TRACES OR VI AS BE LOCATED UNDER THE PACKAGE THAT COULD COME IN CONTACT WITH THE CONDUCTIVE
SLUG. ATTACHING THE SLUG TO A GROUND PLANE WILL REDUCE THE JUNCTION TEMPERATURE OF THE
DEVICE WHI CH MAY BE BENEFICIAL IN HIGH TEMPE RATURE ENVIRONM E NTS.
25
2649
VIEW A
COMPLIANT TO JEDEC STANDARDS MS-026-AED-HD
50
51
EXPOSED
BOTTO M V IEW
0.50 BSC
LEAD PITCH
PAD
(PINS UP)
0.27
0.22
0.17
9.50 SQ
25
2650
Figure 65. 100-Lead Thin Quad Flat Packag
e, Exposed Pad [TQFP_EP]
(SV-100-3)
Dimensions shown in millimeters
ORDERING GUIDE
Model Temperature Range Package Description Package Option