Gain range = −6 dB to +24 dB
Linear-in-dB gain control
Antialiasing filter (AAF)
rd
-order Butterworth cutoff
3
Programmable from 8 MHz to 18 MHz
Analog-to-digital converter (ADC)
12 bits at 10 MSPS to 50 MSPS
SNR = 70 dB
SFDR = 80 dB
Serial LVDS (ANSI-644, IEEE 1596.3 reduced range link)
Data and frame clock outputs
Includes crosspoint switch to support
ontinuous wave (CW) Doppler
c
Low power, 150 mW per channel at 12 bits/40 MSPS (TGC)
90 mW per channel in CW Doppler
Single 1.8 V supply (3.3 V supply for CW Doppler output bias)
Flexible power-down modes
Overload recovery in <10 ns
Fast recovery from low power standby mode, <2 μs
100-lead TQFP
APPLICATIONS
Medical imaging/ultrasound
Automotive radar
GENERAL DESCRIPTION
The AD9271 is designed for low cost, low power, small size,
and ease of use. It contains eight channels of a variable gain amplifier (VGA) with low noise preamplifier (LNA); an antialiasing
filter (AAF); and a 12-bit, 10 MSPS to 50 MSPS analog-to-digital
converter (ADC).
Each channel features a variable gain range of 30 dB, a fully
ifferential signal path, an active input preamplifier termination, a
d
maximum gain of up to 40 dB, and an ADC with a conversion
rate of up to 50 MSPS. The channel is optimized for dynamic
performance and low power in applications where a small
package size is critical.
14 dB/15.6 dB/18 dB
maximum = 400 mV p-p/
IN
and Crosspoint Switch
AD9271
FUNCTIONAL BLOCK DIAGRAM
AVDD
LOSW-A
LO-A
LI-A
LG-A
LOSW-B
LO-B
LI-B
LG-B
LOSW-C
LO-C
LI-C
LG-C
LOSW-D
LO-D
LI-D
LG-D
LOSW-E
LO-E
LI-E
LG-E
LOSW-F
LO-F
LI-F
LG-F
LOSW-G
LO-G
LI-G
LG-G
LOSW-H
LO-H
LI-H
LG-H
LNA
LNA
LNA
LNA
LNA
LNA
LNA
LNA
SWITCH
ARRAY
CWVDD
VGA
VGA
VGA
VGA
VGA
VGA
VGA
VGA
GAIN–
GAIN+
CWD[5:0]+/–
The LNA has a single-ended-to-differential gain that is selectable
through the SPI. The LNA input noise is typically 1.2 nV/√Hz,
and the combined input-referred noise of the entire channel
is 1.4 nV/√Hz at maximum gain. Assuming a 15 MHz noise
bandwidth (NBW) and a 15.6 dB LNA gain, the input SNR is
roughly 86 dB. In CW Doppler mode, the LNA output drives a
transconductance amp that is switched through an 8 × 6
differential crosspoint switch. The switch is programmable
through the SPI.
PDWN
AAF
AAF
AAF
AAF
AAF
AAF
AAF
AAF
REFERENCE
VREF
REFB
SENSE
Figure 1.
STBY
REFT
AD9271
12-BIT
ADC
12-BIT
ADC
12-BIT
ADC
12-BIT
ADC
12-BIT
ADC
12-BIT
ADC
12-BIT
ADC
12-BIT
ADC
SERIAL
CSB
RBIAS
DRVDD
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
DATA
PORT
INTERFACE
SDIO
CLK+
SCLK
DOUTA+
DOUTA–
DOUTB+
DOUTB–
DOUTC+
DOUTC–
DOUTD+
DOUTD–
DOUTE+
DOUTE–
DOUTF+
DOUTF–
DOUTG+
DOUTG–
DOUTH+
DOUTH–
FCO+
FCO–
RATE
DCO+
MULTIPLIER
DCO–
CLK–
06304-001
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Change to Input Signals Section................................................... 42
Changes to Figure 73...................................................................... 42
Changes to Table 16 ....................................................................... 55
6/07—Revision 0: Initial Version
Page 3
AD9271
www.BDTIC.com/ADI
The AD9271 requires a LVPECL-/CMOS-/LVDS-compatible
sample rate clock for full performance operation. No external
reference or driver components are required for many
applications.
The ADC automatically multiplies the sample rate clock for
he appropriate LVDS serial data rate. A data clock (DCO±) for
t
capturing data on the output and a frame clock (FCO±) trigger
for signaling a new output byte are provided.
Powering down individual channels is supported to increase
ba
ttery life for portable applications. There is also a standby
mode option that allows quick power-up for power cycling. In CW
Doppler operation, the VGA, AAF, and ADC are powered down.
The power of the TGC path scales with selectable speed grades.
The ADC contains several features designed to maximize flexibility
nd minimize system cost, such as a programmable clock, data
a
alignment, and programmable digital test pattern generation. The
digital test patterns include built-in fixed patterns, built-in
pseudorandom patterns, and custom user-defined test patterns
entered via the serial port interface.
Fabricated in an advanced CMOS process, the AD9271 is
a
vailable in a 16 mm × 16 mm, RoHS compliant, 100-lead
TQFP. It is specified over the industrial temperature range of
−40°C to +85°C.
PRODUCT HIGHLIGHTS
1. Small Footprint. Eight channels are contained in a small,
space-saving package. Full TGC path, ADC, and crosspoint
switch contained within a 100-lead, 16 mm × 16 mm TQFP.
ow Power of 150 mW per Channel at 40 MSPS.
2. L
3. In
tegrated Crosspoint Switch. This switch allows numerous
multichannel configuration options to enable the CW
Doppler mode.
ase of Use. A data clock output (DCO±) operates up to
4. E
300 MHz and supports double data rate (DDR) operation.
5. U
ser Flexibility. Serial port interface (SPI) control offers a wide
range of flexible features to meet specific system requirements.
ntegrated Third-Order Antialiasing Filter. This filter is placed
6. I
between the TGC path and the ADC and is programmable
from 8 MHz to 18 MHz.
Rev. A | Page 3 of 60
Page 4
AD9271
www.BDTIC.com/ADI
SPECIFICATIONS
AC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, CWVDD = 3.3 V, 1.0 V internal ADC reference, fIN = 5 MHz, RS = 50 Ω, LNA gain = 15.6 dB (6), AAF
LPF cutoff = 1/3 × f
Conditions Min Typ Max Min Typ Max Min Typ Max Unit
Harmonic Distortion
Second Harmonic
f
= 5 MHz
IN
= 0 V −73 −71 −71 dBFS
V
GAIN
at −7 dBFS
Second Harmonic
= 5 MHz
f
IN
V
= 1 V −80 −72 −68 dBFS
GAIN
at −1 dBFS
Third Harmonic
= 5 MHz
f
IN
V
= 0 V −81 −77 −74 dBFS
GAIN
at −7 dBFS
Third Harmonic
f
= 5 MHz
IN
= 1 V −65 −63 −66 dBFS
V
GAIN
at −1 dBFS
Two-Tone IMD3
= 1 V −54.6 −63.4 −68.5 dBc
V
GAIN
(2 × F1 − F2)
Distortion
f
= 5.0 MHz
IN1
at −7 dBFS,
f
= 6.0 MHz
IN2
at −7 dBFS
Channel-to-Channel
−70 −70 −70 dB
Crosstalk
Channel-to-Channel
Crosstalk (Overrange Condition)
Overload Recovery Full TGC path,
−70 −70 −70 dB
3
5 5 5 Degrees
= 1 MHz to 10 MHz,
f
IN
gain = 0 V to 1 V
Gain Law Confor-
0 < V
< 0.1 V +0.8 +0.8 +0.8 dB
GAIN
mance Error
0.1 V < V
Linear Gain Error V
GAIN
< 0.9 V −1.2 +1.2 −1.2 +1.2 −1.2 +1.2 dB
GAIN
< 1 V −1.2 −1.2 −1.2 dB
GAIN
= 0.5 V,
−1.3 +1.3 −1.3 +1.3 −1.3 +1.3 dB
normalized for ideal
AAF loss
Channel-to-Channel
0.1 V < V
< 0.9 V 0.2 0.2 0.2 dB
GAIN
Matching
INTERFACE
Normal Operating
0 1 0 1 0 1 V
Range
Gain Ran ge 0 V to 1 V, normalized
10 to 40 10 to 40 10 to 40 dB
for ideal AAF loss
Scale Factor 31.6 31.6 31.6 dB/V
Response Time 30 dB change 350 350 350 ns
Transconductance LNA gain = 5/6/8 10/12/16 10/12/16 10/12/16 mA/V
Common Mode CW Doppler
1.5 3.6 1.5 3.6 1.5 3.6 V
output pins
Input-Referred Noise
Voltage
LNA gain = 5/6/8,
= 0 Ω, RFB = ∞
R
S
1.8 /1.7/1.5 1.7 /1.5/1.4 1.7 /1.5/1.3 nV/√Hz
Output DC Bias Per channel 2.4 2.4 2.4 mA
Maximum Output
Per channel ±2 ±2 ±2 mA p-p
Swing
Rev. A | Page 5 of 60
Page 6
AD9271
www.BDTIC.com/ADI
AD9271-25 AD9271-40 AD9271-50
Parameter
POWER SUPPLY
ADC RESOLUTION 12 12 12 Bits
ADC REFERENCE
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
SE = single ended.
3
The overrange condition is specified as being 6 dB more than the full-scale input range.
Logic Compliance CMOS/LVDS/LVPECL
Differential Input Voltage
Input Common-Mode Voltage Full 1.2 V
Input Resistance (Differential) 25°C 20 kΩ
Input Capacitance 25°C 1.5 pF
LOGIC INPUTS (PDWN, STBY, SCLK)
Logic 1 Voltage Full 1.2 3.6 V
Logic 0 Voltage Full 0.3 V
Input Resistance 25°C 30 kΩ
Input Capacitance 25°C 0.5 pF
LOGIC INPUT (CSB)
Logic 1 Voltage Full 1.2 3.6 V
Logic 0 Voltage Full 0.3 V
Input Resistance 25°C 70 kΩ
Input Capacitance 25°C 0.5 pF
LOGIC INPUT (SDIO)
Logic 1 Voltage Full 1.2 DRVDD + 0.3 V
Logic 0 Voltage Full 0 0.3 V
Input Resistance 25°C 30 kΩ
Input Capacitance 25°C 2 pF
LOGIC OUTPUT (SDIO)
Logic 1 Voltage (IOH = 800 A) Full 1.79 V
Logic 0 Voltage (IOL = 50 A) Full 0.05 V
DIGITAL OUTPUTS (D+, D−), (ANSI-644)
Logic Compliance LVDS
Differential Output Voltage (VOD) Full 247 454 mV
Output Offset Voltage (VOS) Full 1.125 1.375 V
Output Coding (Default) Offset binary
DIGITAL OUTPUTS (D+, D−),
(LOW POWER, REDUCED SIGNAL OPTION)
Logic Compliance LVDS
Differential Output Voltage (VOD) Full 150 250 mV
Output Offset Voltage (VOS) Full 1.10 1.30 V
Output Coding (Default) Offset binary
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
Specified for LVDS and LVPECL only.
3
Specified for 13 SDIO pins sharing the same connection.
Maximum Clock Rate Full 50 MSPS
Minimum Clock Rate Full 10 MSPS
Clock Pulse Width High (tEH) Full 10.0 ns
Clock Pulse Width Low (tEL) Full 10.0 ns
OUTPUT PARAMETERS
2, 3
Propagation Delay (tPD) Full 1.5 2.3 3.1 ns
Rise Time (tR) (20% to 80%) Full 300 ps
Fall Time (tF) (20% to 80%) Full 300 ps
FCO Propagation Delay (t
DCO Propagation Delay (t
DCO to Data Delay (t
DCO to FCO Delay (t
Data-to-Data Skew (t
Wake-Up Time (Standby), V
) Full 1.5 2.3 3.1 ns
FCO
4
DATA
FRAME
DATA-MAX
)
CPD
4
)
4
)
− t
GAIN
) Full ±50 ±200 ps
DATA-MIN
= 0.5 V 25°C 1 µs
Full
Full (t
Full (t
/24) − 300 (t
SAMPLE
/24) − 300 (t
SAMPLE
t
FCO
(t
+
SAMPLE
SAMPLE
SAMPLE
/24)
/24) (t
/24) (t
ns
/24) + 300 ps
SAMPLE
/24) + 300 ps
SAMPLE
Wake-Up Time (Power-Down) 25°C 1 ms
Pipeline Latency Full 8
Clock
cles
cy
APERTURE
Aperture Uncertainty (Jitter) 25°C <1 ps rms
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
Can be adjusted via the SPI interface.
3
Measurements were made using a part soldered to FR-4 material.
4
t
/24 is based on the number of bits divided by 2, because the delays are based on half duty cycles.
AVDD GND −0.3 V to +2.0 V
DRVDD GND −0.3 V to +2.0 V
CWVDD GND −0.3 V to +3.9 V
GND GND −0.3 V to +0.3 V
AVDD DRVDD −2.0 V to +2.0 V
Digital Outputs
(DOUTx+, DOUTx−,
DCO+, DCO−,
FCO+, FCO−)
CLK+, CLK− GND −0.3 V to +3.9 V
LI-x LG-x −0.3 V to +2.0 V
LO-x LG-x −0.3 V to +2.0 V
LOSW-x LG-x −0.3 V to +2.0 V
CWDx−, CWDx+ GND −0.3 V to +3.9 V
SDIO, GAIN+, GAIN− GND −0.3 V to +2.0 V
PDWN, STBY, SCLK, CSB GND −0.3 V to +3.9 V
REFT, REFB, RBIAS GND −0.3 V to +2.0 V
VREF, SENSE GND −0.3 V to +2.0 V
ENVIRONMENTAL
Operating Temperature
Range (Ambient)
Storage Temperature
Range (Ambient)
Maximum Junction
Temperature
Lead Temperature
(Soldering, 10 sec)
t To
Rating
GND −0.3 V to +2.0 V
−40°C to +85°C
−65°C to +150°C
150°C
300°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL IMPEDANCE
Table 5.
Air Flow Velocity (m/s) θ
0.0 20.3 °C/W
1.0 14.4 7.6 4.7 °C/W
2.5 12.9 °C/W
1
θ
for a 4-layer PCB with solid ground plane (simulated). Exposed pad
JA
soldered to PCB.
1
θ
θ
JA
JB
Unit
JC
ESD CAUTION
Rev. A | Page 10 of 60
Page 11
AD9271
G
www.BDTIC.com/ADI
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
LOSW-DLO-D
CWD0–
CWD0+
CWD1–
CWD1+
CWD2–
CWD2+
CWVDD
GAIN–
GAIN+
RBIAS
SENSE
VREF
REFB
REFT
AVDD
CWD3–
CWD3+
CWD4–
CWD4+
CWD5–
CWD5+
LO-E
LOSW-E
9998979695949392919089888786858483828180797877
100
76
LI-E
LG-E
AVDD
AVDD
LO-F
LOSW-F
LI-F
LG-F
AVDD
AVDD
LO-G
LOSW-
LI-G
LG-G
AVDD
AVDD
LO-H
LOSW-H
LI-H
LG-H
AVDD
AVDD
CLK–
CLK+
AVDD
PIN 1
1
INDICATOR
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
EXPOSED PADDLE, PIN 0
(BOTTOM O F PACKAGE)
AD9271
TOP VIEW
(Not to Scale)
2627282930313233343536373839404142434445464748
FCO–
DRVDD
DOUTH–
DOUTH+
DOUTG–
DOUTF+
DOUTG+
DOUTF–
DCO–
DOUTE–
DOUTE+
FCO+
DCO+
DOUTD–
DOUTD+
DOUTB–
DOUTC–
DOUTC+
49
STBY
PDWN
DRVDD
DOUTA–
DOUTA+
DOUTB+
LI-D
75
LG-D
74
AVDD
73
AVDD
72
LO-C
71
LOSW-C
70
69
LI-C
LG-C
68
AVDD
67
AVDD
66
LO-B
65
64
LOSW-B
LI-B
63
LG-B
62
AVDD
61
AVDD
60
59
LO-A
58
LOSW-A
LI-A
57
LG-A
56
AVDD
55
54
AVDD
53
CSB
52
SDIO
SCLK
51
50
AVDD
06304-005
Figure 4. 100-Lead TQFP Pin Configuration
Table 6. Pin Function Descriptions
Pin No. Name Description
0 GND Ground (exposed paddle should be tied to a quiet analog ground)
3, 4, 9, 10, 15,
AVDD 1.8 V Analog Supply
16, 21, 22, 25,
50, 54, 55, 60,
61, 66, 67, 72,
73, 92
26, 47 DRVDD 1.8 V Digital Output Driver Supply
84 CWVDD 3.3 V Analog Supply
1 LI-E LNA Analog Input for Channel E
2 LG-E LNA Ground for Channel E
5 LO-F LNA Analog Output for Channel F
6 LOSW-F LNA Analog Output Complement for Channel F
7 LI-F LNA Analog Input for Channel F
8 LG-F LNA Ground for Channel F
11 LO-G LNA Analog Output for Channel G
12 LOSW-G LNA Analog Output Complement for Channel G
13 LI-G LNA Analog Input for Channel G
14 LG-G LNA Ground for Channel G
17 LO-H LNA Analog Output for Channel H
Rev. A | Page 11 of 60
Page 12
AD9271
www.BDTIC.com/ADI
Pin No. Name Description
18 LOSW-H LNA Analog Output Complement for Channel H
19 LI-H LNA Analog Input for Channel H
20 LG-H LNA Ground for Channel H
23 CLK− Clock Input Complement
24 CLK+ Clock Input True
27 DOUTH− ADC H Digital Output Complement
28 DOUTH+ ADC H Digital Output True
29 DOUTG− ADC G Digital Output Complement
30 DOUTG+ ADC G Digital Output True
31 DOUTF− ADC F Digital Output Complement
32 DOUTF+ ADC F Digital Output True
33 DOUTE− ADC E Digital Output Complement
34 DOUTE+ ADC E Digital Output True
35 DCO− Data Clock Digital Output Complement
36 DCO+ Data Clock Digital Output True
37 FCO− Frame Clock Digital Output Complement
38 FCO+ Frame Clock Digital Output True
39 DOUTD− ADC D Digital Output Complement
40 DOUTD+ ADC D Digital Output True
41 DOUTC− ADC C Digital Output Complement
42 DOUTC+ ADC C Digital Output True
43 DOUTB− ADC B Digital Output Complement
44 DOUTB+ ADC B Digital Output True
45 DOUTA− ADC A Digital Output Complement
46 DOUTA+ ADC A Digital Output True
48 STBY Standby Power-Down
49 PDWN Full Power-Down
51 SCLK Serial Clock
52 SDIO Serial Data Input/Output
53 CSB Chip Select Bar
56 LG-A LNA Ground for Channel A
57 LI-A LNA Analog Input for Channel A
58 LOSW-A LNA Analog Output Complement for Channel A
59 LO-A LNA Analog Output for Channel A
62 LG-B LNA Ground for Channel B
63 LI-B LNA Analog Input for Channel B
64 LOSW-B LNA Analog Output Complement for Channel B
65 LO-B LNA Analog Output for Channel B
68 LG-C LNA Ground for Channel C
69 LI-C LNA Analog Input for Channel C
70 LOSW-C LNA Analog Output Complement for Channel C
71 LO-C LNA Analog Output for Channel C
74 LG-D LNA Ground for Channel D
75 LI-D LNA Analog Input for Channel D
76 LOSW-D LNA Analog Output Complement for Channel D
77 LO-D LNA Analog Output for Channel D
78 CWD0− CW Doppler Output Complement for Channel 0
79 CWD0+ CW Doppler Output True for Channel 0
80 CWD1− CW Doppler Output Complement for Channel 1
81 CWD1+ CW Doppler Output True for Channel 1
82 CWD2− CW Doppler Output Complement for Channel 2
83 CWD2+ CW Doppler Output True for Channel 2
85 GAIN− Gain Control Voltage Input Complement
Rev. A | Page 12 of 60
Page 13
AD9271
www.BDTIC.com/ADI
Pin No. Name Description
86 GAIN+ Gain Control Voltage Input True
87 RBIAS External Resistor to Set the Internal ADC Core Bias Current
88 SENSE Reference Mode Selection
89 VREF Voltage Reference Input/Output
90 REFB Differential Reference (Negative)
91 REFT Differential Reference (Positive)
93 CWD3− CW Doppler Output Complement for Channel 3
94 CWD3+ CW Doppler Output True for Channel 3
95 CWD4− CW Doppler Output Complement for Channel 4
96 CWD4+ CW Doppler Output True for Channel 4
97 CWD5− CW Doppler Output Complement for Channel 5
98 CWD5+ CW Doppler Output True for Channel 5
99 LO-E LNA Analog Output for Channel E
100 LOSW-E LNA Analog Output Complement for Channel E
Figure 27. Short-Circuit, Output-Referred Noise vs. V
64.0
63.5
63.0
62.5
62.0
61.5
SNR/SINAD
61.0
60.5
60.0
06304-023
59.5
SNR (dBFS)
SINAD (dBFS)
00.10.20.3 0. 40.5 0. 60.70.8 0. 91.0
Figure 28. SNR/SINAD vs. V
V
GAIN
GAIN
LNA GAIN = 8×
LNA GAIN = 5×
(V)
(V)
, AIN = −6.5 dBFS
06304-021
GAIN
06304-020
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
INPUT-REFERRED NOISE (n V/ Hz)
0.5
0
0510152025
Figure 26. Short-Circuit, Input-R
LNA GAIN = 5×
LNA GAIN = 8×
FREQUENCY (MHz)
LNA GAIN = 6×
06304-025
eferred Noise vs. Frequency
Rev. A | Page 17 of 60
1.70
1.65
1.60
1.55
1.50
INPUT-REFERRED NOISE (nV/ Hz)
1.45
1.40
–40–20020406080
TEMPERATURE (° C)
Figure 29. Short-Circuit, Input-Referred Noise vs. Temperature
06304-024
Page 18
AD9271
–
–
–
–
www.BDTIC.com/ADI
0
–5
–3dB LINE
–10
–15
–20
–25
FUNDAMENTAL (dBFS)
–30
–35
–40
02.55.07.5 10.0 12.5 15.0 17.5 20.0 22.5 25.0
FREQUENCY (MHz )
(1/3) × 40MSPS
(1/3) × 25MSPS
(1/3) × 50MSPS
Figure 30. Antialiasing Filter (AAF) Pass-Band Response, No HPF Applied
300
250
200
150
100
GROUP DELAY (ns)
50
0
0.1110100
V
= 0.5V
GAIN
V
= 1.0V
GAIN
V
= 0V
GAIN
ANALOG INPUT FREQUENCY (MHz)
Figure 31. Antialiasing Filter (AAF) Group Delay Response
50
–55
= 1V
V
GAIN
–60
–65
–70
–75
THIRD HARMONIC (d BFS)
–80
06304-030
–85
V
GAIN
2 4 6 8 1012141
Figure 33. Third-Order Harmonic Distortion vs. Frequency, AIN = −0.5 dBFS
40
–50
–60
–70
–80
–90
SECOND HARMONIC (dBFS)
–100
06304-033
–110
–400–5–10–15–20–25–30–35
V
= 0.5V
GAIN
= 0.2V
f
(MHz)
IN
V
GAIN
ADC OUTPUT LEVEL (dBFS)
= 0V
V
GAIN
V
GAIN
= 1V
= 0.5V
06304-029
6
06304-114
Figure 34. Second-Order Harmonic Distortion vs. ADC Output Level
50
–55
–60
V
= 0.2V
GAIN
–65
V
= 1V
GAIN
–70
–75
SECOND HARMONIC (d BFS)
–80
–85
Figure 32. Second-Order Harmonic Distortion vs. Frequency, AIN = −0.5 dBFS
= 0.5V
V
GAIN
2 4 6 8 10121416
f
(MHz)
IN
06304-028
Rev. A | Page 18 of 60
40
–50
THIRD HARMONIC (dBFS)
–60
–70
–80
–90
–100
–110
–400–5–10–15–20–25–30–35
V
GAIN
ADC OUTPUT LEVEL (dBFS)
V
= 0V
GAIN
V
GAIN
= 1V
= 0.5V
Figure 35. Third-Order Harmonic Distortion vs. ADC Output Level
06304-115
Page 19
AD9271
www.BDTIC.com/ADI
0
–20
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
02015105
FREQUENCY (MHz)
Figure 38. Typical IMD3 and IMD2 Performance
AIN1 = AIN2 = –7d BFS
f1 = 5MHz
f2 = 6MHz
IMD2 = –70.59dBc
IMD3 = –64.45dBc
V
=1V
GAIN
06304-108
25
IMD3 (dBFS)
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
0
0.21.00.90.80.70.60. 50.40.3
AIN1 = AIN2 = –7dBFS
5MHz AND 6MHz
Figure 36. IMD3 vs. V
8MHz AND 10.3MHz
V
(V)
GAIN
GAIN
2.3MHz AND 3.5MHz
06304-106
IMD3 (dBFS )
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
0
f1 = 5MHz
f2 = 6MHz
–60–20 –15 –10 –5–25–30–35–40–45–50–55
V
V
GAIN
GAIN
= 1V
INPUT AMPLITUDE (dBF S)
= 0.5V
V
GAIN
= 0V
06304-107
Figure 37. IMD3 vs. Amplitude
Rev. A | Page 19 of 60
Page 20
AD9271
www.BDTIC.com/ADI
THEORY OF OPERATION
ULTRASOUND
The primary application for the AD9271 is medical ultrasound.
Figure 39 shows a simplified block diagram of an ultrasound
ystem. A critical function of an ultrasound system is the time
s
gain control (TGC) compensation for physiological signal
attenuation. Because the attenuation of ultrasound signals is
exponential with respect to distance (time), a linear-in-dB VGA
is the optimal solution.
Key requirements in an ultrasound signal chain are very low
n
oise, active input termination, fast overload recovery, low
power, and differential drive to an ADC. Because ultrasound
machines use beam-forming techniques requiring large binaryweighted numbers (for example, 32 to 512) of channels, the
lowest power at the lowest possible noise is of key importance.
Most modern machines use digital beam forming. In this
te
chnique, the signal is converted to digital format immediately
Tx HVAMPs
following the TGC amplifier, and then beam forming is
accomplished digitally.
The ADC resolution of 12 bits with up to 50 MSPS sampling
sa
tisfies the requirements of both general-purpose and high-
end systems.
Power consumption and low cost are of primary importance in
w-end and portable ultrasound machines, and the AD9271 is
lo
designed for these criteria.
For additional information regarding ultrasound systems, refer
How Ultrasound System Considerations Influence Front-End
“
to
C
omponent Choice,” A
nalog Dialogue, Volume 36, Number 3,
May–July 2002, and “The AD9271—A Revolutionary Solution
for Portable Ultrasound,” Analog Dialogue, Volume 41, Number 7,
July 2007.
BEAM FORMER
CENTRAL CONT ROL
MULTICHANNELS
Rx BEAM FORMER
(B AND F MODES)
IMAGE AND
MOTION
PROCESSING
(B MODE)
DISPLAY
COLOR
DOPPLER (PW )
PROCESSING
(F MODE)
06304-077
TRANSDUCER
ARRAY
128, 256, ETC.,
ELEMENTS
HV
MUX/
DEMUX
BIDIRECTIO NAL
CABLE
Tx BEAM FO RMER
T/R
SWITCHES
Figure 39. Simplified Ultrasound System Block Diagram
VGALNA
CW
CW (ANALOG)
BEAM FORMER
AUDIO
OUTPUT
AAF
AD9271
PROCESSING
ADC
SPECTRAL
DOPPLER
MODE
Rev. A | Page 20 of 60
Page 21
AD9271
R
www.BDTIC.com/ADI
RFB1
T/R
SWITCH
CS
CFB
CSH
RFB2
CLG
LO-x
LOSW-x
LI-x
LG-x
LNA
g
m
ATTENUATOR
–30dB TO 0dB
TO
SWITCH
ARRAY
+24dB
AAF
12-BIT
PIPELINE
ADC
SERIAL
LVDS
CDWx+
CDWx–
DOUTx–
DOUTx+
TRANSDUCE
Figure 40. Simplified Block Diagram of a Single Channel
INTERPOL ATOR
CHANNEL OVERVIEW
Each channel contains both a TGC signal path and a CW Doppler
signal path. Common to both signal paths, the LNA provides useradjustable input impedance termination. The CW Doppler path
includes a transconductance amplifier and a crosspoint switch. The
TGC path includes a differential X-AMP® VGA, an antialiasing
filter, and an ADC.
wi
th external components.
The signal path is fully differential throughout to maximize
sig
nal swing and reduce even-order distortion; however, the
LNA is designed to be driven from a single-ended signal source.
Low Noise Amplifier (LNA)
Good noise performance relies on a proprietary ultralow noise
LNA at the beginning of the signal chain, which minimizes the
noise contribution in the following VGA. Active impedance
control optimizes noise performance for applications that benefit
from input impedance matching.
A simplified schematic of the LNA is shown in Figure 41. LI-x is
pacitively coupled to the source. An on-chip bias generator
ca
establishes dc input bias voltages of around 1.4 V and centers
the output common-mode levels at 0.9 V (VDD/2). A capacitor,
C
, of the same value as the input coupling capacitor, CS, is
LG
connected from the LG-x pin to ground.
T/R
SWITCH
TRANSDUCER
Figure 40 shows a simplified block diagram
VO+
VCM
CS
LI-x
CSH
Figure 41. Simplified LN
CFB
AVDD2
A Schematic
RFB1
RFB2
VCM
VO–
LOSW-x
LO-x
LG-x
CLG
GAIN
GAIN+
GAIN–
AD9271
06304-071
The LNA supports differential output voltages as high as 2 V p-p
with positive and negative excursions of ±0.5 V from a commonmode voltage of 0.9 V. The LNA differential gain sets the maximum
input signal before saturation. One of three gains is set through
the SPI. The corresponding input full scale for the gain settings
of 5, 6, or 8 is 400 mV p-p, 333 mV p-p, and 250 mV p-p,
respectively. Overload protection ensures quick recovery time
from large input voltages. Because the inputs are capacitively
coupled to a bias voltage near midsupply, very large inputs can
be handled without interacting with the ESD protection.
Low value feedback resistors and the current-driving capability
o
f the output stage allow the LNA to achieve a low input-referred
noise voltage of 1.2 nV/√Hz. This is achieved with a current
consumption of only 16 mA per channel (30 mW). On-chip
resistor matching results in precise single-ended gains, which
are critical for accurate impedance control. The use of a fully
differential topology and negative feedback minimizes distortion.
Low HD2 is particularly important in second-harmonic ultrasound
imaging applications. Differential signaling enables smaller swings
at each output, further reducing third-order distortion.
Active Impedance Matching
The LNA consists of a single-ended voltage gain amplifier with
differential outputs and the negative output externally available.
For example, with a fixed gain of 6× (15.6 dB), an active input
termination is synthesized by connecting a feedback resistor
between the negative output pin, LO-x, and the positive input
pin, LI-x. This technique is well known and results in the input
resistance shown in Equation 1:
R
FB
=
R
IN
1(
where A/2 is t
6304-101
inputs to the LO-x outputs.
(1)
A
)
+
2
he single-ended gain or the gain from the LI-x
Rev. A | Page 21 of 60
Page 22
AD9271
www.BDTIC.com/ADI
Because the amplifier has a gain of 6× from its input to its
differential output, it is important to note that the gain A/2 is
the gain from Pin LI-x to Pin LO-x, and it is 6 dB less than the
gain of the amplifier, or 9.6 dB (3×). The input resistance is
reduced by an internal bias resistor of 15 kΩ in parallel with the
source resistance connected to Pin LI-x, with Pin LG-x ac
grounded. Equation 2 can be used to calculate the needed R
for a desired R
R
IN
For example, to set R
, even for higher values of RIN.
IN
R
FB
=k15||
+
)31(
(2)
Ω
to 200 Ω, the value of RFB is 845 Ω. If the
IN
simplified equation (Equation 2) is used to calculate R
IN
, the
FB
value is 190 Ω, resulting in a gain error less than 0.5 dB. Some
factors, such as the presence of a dynamic source resistance,
might influence the absolute gain accuracy more significantly.
At higher frequencies, the input capacitance of the LNA needs
to be considered. The user must determine the level of
matching accuracy and adjust R
accordingly.
FB
The bandwidth (BW) of the LNA is about 70 MHz. Ultimately
he BW of the LNA limits the accuracy of the synthesized R
t
For R
= RS up to about 200 Ω, the best match is between
IN
.
IN
100 kHz and 10 MHz, where the lower frequency limit is
determined by the size of the ac-coupling capacitors, and the
upper limit is determined by the LNA BW. Furthermore, the
input capacitance and R
Figure 42 shows R
1k
RS = 500Ω, RFB = 2kΩ
RS = 200Ω, RFB = 800Ω
RS = 100Ω, RFB = 400Ω, CSH = 20pF
100
RS = 50Ω, RFB = 200Ω, CSH = 70pF
INPUT IMPEDANCE (Ω)
10
100k1M10M50M
Figure 42. R
(Effects of R
limit the BW at higher frequencies.
S
vs. frequency for various values of RFB.
IN
FREQUENCY (Hz)
vs. Frequency for Various Values of RFB
IN
and CSH Are Also Shown)
SH
06304-105
Note that at the lowest value, 50 Ω, in Figure 42, RIN peaks at
frequencies greater than 10 MHz. This is due to the BW roll-off
of the LNA, as mentioned previously.
However, as can be seen for larger R
values, parasitic capacitance
IN
starts rolling off the signal BW before the LNA can produce
peaking. C
not be used for values of R
lists the recommended values for R
is needed in series with RFB because the dc levels at Pin LO-x
C
FB
further degrades the match; therefore, CSH should
SH
that are greater than 100 Ω. Table 7
IN
and CSH in terms of RIN.
FB
and Pin LI-x are unequal.
Table 7. Active Termination External Component Values
The short-circuit noise voltage (input-referred noise) is an
important limit on system performance. The short-circuit noise
voltage for the LNA is 1.2 nV/√Hz or 1.4 nV/√Hz (at 15.6 dB
LNA gain), including the VGA noise. These measurements,
which were taken without a feedback resistor, provide the basis
for calculating the input noise and noise figure (NF) performance
of the configurations shown in
re simulations of noise figure vs. R
a
Figure 43. Figure 44 and Figure 45
results using these config-
S
urations and an input-referred noise voltage of 4 nV/√Hz for
the VGA. Unterminated (R
= ∞) operation exhibits the lowest
FB
equivalent input noise and noise figure. Figure 45 shows the
n
oise figure vs. source resistance rising at low R
—where the
S
LNA voltage noise is large compared with the source noise—and
at high R
NF is achieved when R
due to the noise contribution from RFB. The lowest
S
matches RIN.
S
UNTERMINATED
R
IN
R
S
+
V
IN
–
RESISTIVE TERMINATION
R
R
S
+
V
IN
–
ACTIVE IM PEDANCE MATCH
R
R
S
+
V
IN
–
RIN=
IN
IN
R
FB
1 + A/2
R
S
R
V
OUT
V
OUT
FB
V
OUT
06304-104
Figure 43. Input Configurations
Rev. A | Page 22 of 60
Page 23
AD9271
V
www.BDTIC.com/ADI
16
14
12
10
8
6
NOISE FI GURE (dB)
4
2
0
101001000
Figure 44. Noise Figure vs. R
Matched, and Unterminated Inputs, V
16
14
12
10
8
6
NOISE FI GURE (dB)
4
2
0
101001000
Figure 45. Noise Figure vs. R
Active Termination Matched Inputs, V
for Resistive Termination, Active Termination
S
UNTERMINATED
RESISTIVE TERMINAT ION
ACTIVE TE RMINATIO N
RS(Ω)
= 1 V, 15.6 dB LNA Gain
Gain
RIN = 50Ω
= 75Ω
R
IN
RIN = 100Ω
RIN = 200Ω
UNTERMINATED
RS(Ω)
for Various Fixed Values of RIN,
S
= 1 V, 15.6 dB LNA Gain
Gain
06304-103
06304-102
The primary purpose of input impedance matching is to improve
the transient response of the system. With resistive termination, the
input noise increases due to the thermal noise of the matching
resistor and the increased contribution of the LNA’s input
voltage noise generator. With active impedance matching,
however, the contributions of both are smaller (by a factor of
1/(1 + LNA Gain)) than they would be for resistive termination.
Figure 44 shows the relative noise figure performance. In this
raph, the input impedance was swept with R
g
to preserve the
S
match at each point. The noise figures for a source impedance of
50 are 7.1 dB, 4.1 dB, and 2.5 dB for the resistive termination,
active termination, and unterminated configurations, respectively.
The noise figures for 200 are 4.6 dB, 2.0 dB, and 1.0 dB,
respectively.
Figure 45 shows the noise figure as it relates to R
, which is helpful for design purposes.
of R
IN
for various values
S
INPUT OVERDRIVE
Excellent overload behavior is of primary importance in ultrasound. Both the LNA and VGA have built-in overdrive
protection and quickly recover after an overload event.
Input Overload Protection
As with any amplifier, voltage clamping prior to the inputs is
highly recommended if the application is subject to high
transient voltages.
A block diagram of a simplified ultrasound transducer interface
wn in Figure 46. A common transducer element serves the
is sho
d
ual functions of transmitting and receiving ultrasound energy.
During the transmitting phase, high voltage pulses are applied
to the ceramic elements. A typical transmit/receive (T/R) switch
can consist of four high voltage diodes in a bridge configuration.
Although the diodes ideally block transmit pulses from the
sensitive receiver input, diode characteristics are not ideal, and
resulting leakage transients imposed on the LI-x inputs can be
problematic.
Because ultrasound is a pulse system and time-of-flight is used
determine depth, quick recovery from input overloads is
to
essential. Overload can occur in the preamp and the VGA.
Immediately following a transmit pulse, the typical VGA gains
are low, and the LNA is subject to overload from T/R switch
leakage. With increasing gain, the VGA can become overloaded
due to strong echoes that occur near field echoes and
acoustically dense materials, such as bone.
Figure 46 illustrates an external overload protection scheme. A
p
air of back-to-back Schottky diodes is installed prior to installing
the ac-coupling capacitors. Although the BAS40 diodes are shown,
any diode is prone to exhibiting some amount of shot noise. Many
types of diodes are available for achieving the desired noise performance. The configuration shown in Figure 46 tends to add
2 nV
/√Hz of input-referred noise. Decreasing the 5 kΩ resistor
and increasing the 2 kΩ resistor may improve noise contribution,
depending on the application. With the diodes shown in Figure 46,
c
lamping levels of ±0.5 V or less significantly enhance the
overload performance of the system.
+5
Tx
DRIVER
TRANSDUCER
5kΩ
HV
5kΩ
–5V
Figure 46. Input Overload Protection
BAS40-04
2kΩ
10nF
10nF
AD9271
LNA
6304-100
Rev. A | Page 23 of 60
Page 24
AD9271
www.BDTIC.com/ADI
CW DOPPLER OPERATION
Modern ultrasound machines used for medical applications
employ a 2
typical array sizes of 16 or 32 receiver channels phase-shifted
and summed together to extract coherent information. When
used in multiples, the desired signals from each channel can be
summed to yield a larger signal (increased by a factor N, where
N is the number of channels), and the noise is increased by the
square root of the number of channels. This technique enhances
the signal-to-noise performance of the machine. The critical
elements in a beam-former design are the means to align the
incoming signals in the time domain and the means to sum the
individual signals into a composite whole.
Beam forming, as applied to medical ultrasound, is defined as the
phas
from a common source but received at different times by a
multielement ultrasound transducer. Beam forming has two
functions: it imparts directivity to the transducer, enhancing its
N
binary array of receivers for beam forming, with
e alignment and summation of signals that are generated
AD9271
LNA
g
m
gain, and it defines a focal point within the body from which the
location of the returning echo is derived.
The AD9271 includes the front-end components needed to
plement analog beam forming for CW Doppler operation.
im
These components allow CW channels with similar phases to be
coherently combined before phase alignment and down mixing,
thus reducing the number of delay lines or adjustable phase shifters/
down mixers (
a
re used, the phase alignment is performed and then the channels
AD8333 or AD8339) required. Next, if delay lines
are coherently summed and down converted by a dynamic range
I/Q demodulator. Alternatively, if phase shifters/down mixers,
such as the AD8333 and AD8339, are used, phase alignment
a
nd downconversion are done before coherently summing all
channels into I/Q signals. In either case, the resultant I and Q
signals are filtered and sampled by two high resolution ADCs,
and the sampled signals are processed to extract the relevant
Doppler information.
LNA
8 × CHANNEL
LNA
LNA
LNA
LNA
8 × CHANNEL
LNA
LNA
g
m
g
m
g
m
AD9271
g
m
g
m
g
m
g
m
SWITCH
ARRAY
SWITCH
ARRAY
2.5V
2.5V
2.5V
2.5V
600nH
600nH
600nH
600nH
600nH
600nH
600nH
600nH
700Ω
700Ω
700Ω
700Ω
AD8333
AD8333
I
Q
16-BIT
ADC
16-BIT
ADC
06304-096
Figure 47. Typical CW Doppler Sy
stem Using the AD9271 and AD8333 or AD8339
Rev. A | Page 24 of 60
Page 25
AD9271
V
−+=
www.BDTIC.com/ADI
Crosspoint Switch
Each LNA is followed by a transconductance amp for V/I conversion. Currents can be routed to one of six pairs of differential
outputs or to 12 single-ended outputs for summing. Each CWD
output pin sinks 2.4 mA dc current, and the signal has a full-scale
current of ±2 mA for each channel selected by the crosspoint
switch. For example, if four channels were to be summed on
one CWD output, the output would sink 9.6 mA dc and have a
full-scale current output of ±8 mA. The maximum number of
channels combined must be considered when setting the load
impedance for I/V conversion to ensure that the full-scale swing
and common-mode voltage are within the operating limits of
the AD9271. When interfacing to the
ode voltage of 2.5 V and a full-scale swing of 2.8 V p-p are
m
AD8339, a common-
desired. This can be accomplished by connecting an inductor
between each CWD output and a 2.5 V supply, and then
connecting either a single-ended or differential load resistance
to the CWD± outputs. The value of resistance should be
calculated based on the maximum number of channels that can
be combined.
CWD± outputs are required under full-scale swing to be greater
tha
n 1.5 V and less than CWVDD (3.3 V supply).
TGC OPERATION
The TGC signal path is fully differential throughout to maximize
signal swing and reduce even-order distortion; however, the LNAs
are designed to be driven from a single-ended signal source. Gain
values are referenced from the single-ended LNA input to the
differential ADC input. A simple exercise in understanding the
maximum and minimum gain requirements is shown in Figure 48.
MINIMUM GAIN
LNA FS
(0.333V p-p SE)
87dB
LNA
LNA INPUT-REF ERRED
(5.4µV r ms) @ AAF BW = 1 5MHz
LNA + VGA NOISE = 1.4nV/ Hz
NOISE FLOOR
Figure 48. Gain Requirements of TGC for a 12-Bit, 40 MSPS ADC
ADC FS (2
~5dB M ARGIN
70dB
>8dB MARGIN
ADC NOISE FL OOR
(224µV rms)
MAXIMUM GAIN
VGA GAIN RANGE > 30d B
MAX CHANNEL GAIN > 40dB
In summary, the maximum gain required is determined by
(ADC Nois
e Floor/VGA Input Noise Floor) + Margin =
20 log(224/5.4) + 8 dB = 40.3 dB
The minimum gain required is determined by
(ADC Input
FS/VGA Input FS) + Margin =
20 log(2/0.333) – 5 dB = 10.6 dB
Therefore, a 12-bit, 40 MSPS ADC with 15 MHz of bandwidth
hould suffice in achieving the dynamic range required for most
s
of today’s ultrasound systems.
p-p)
ADC
06304-097
The system gain is distributed as listed in Table 8.
The linear-in-dB gain (law conformance) range of the TGC path
is 30 dB, extending from 10 dB to 40 dB. The slope of the gain
control interface is 31.6 dB/V, and the gain control range is 0 V
to 1 V as specified in Equation 3. Equation 4 is the expression
for channel gain.
(3)
GAIN
where ICP
GAINGAINVV
dB
6.31)(
+=
GAIN
V
T is the intercept point of the TGC gain.
5.0)()()(+−
(4)
ICPTVdBGain
In its default condition, the LNA has a gain of 15.6 dB (6×) and
he VGA gain is −6 dB if the voltage on the GAIN± pins is 0 V.
t
This gives rise to a total gain (or ICPT) of 10 dB through the
TGC path if the LNA input is unmatched, or of 4 dB if the LNA
is matched to 50 Ω (R
= 200 Ω). If the voltage on the GAIN±
FB
pins is 1 V, however, the VGA gain is 24 dB. This gives rise to a
total gain of 40 dB through the TGC path if the LNA input is
unmatched, or of 34 dB if the LNA input is matched.
Each LNA output is dc-coupled to a VGA input. The VGA consists
f an attenuator with a range of 30 dB followed by an amplifier
o
with 24 dB of gain for a net gain range of −6 dB to +24 dB. The
X-AMP gain-interpolation technique results in low gain error
and uniform bandwidth, and differential signal paths minimize
distortion.
At low gains, the VGA should limit the system noise perfor-
nce (SNR); at high gains, the noise is defined by the source and
ma
LNA. The maximum voltage swing is bound by the full-scale
peak-to-peak ADC input voltage (2 V p-p).
Both the LNA and VGA have limitations within each section of
e TGC path, depending on the voltage applied to the GAIN+ and
th
GAIN− pins. The LNA has three limitations, or full-scale settings,
depending on the gain selection applied through the SPI interface.
When a voltage of 0.2 V or less is applied to the GAIN± pins, the
LNA operates near the full-scale input range to maximize the
dynamic range of the ADC without clipping the signal. When
more than 0.2 V is applied to the GAIN± pins, the input signal to
the LNA must be lowered to keep it within the full-scale range
of the ADC (see
Figure 49).
Rev. A | Page 25 of 60
Page 26
AD9271
Ω
www.BDTIC.com/ADI
0.450
LNA GAIN = 5x
0.400
0.350
LNA
0.300
GAIN = 6x
0.250
0.200
LNA GAIN = 8x
0.150
INPUT FULL-SCALE (V p-p)
0.100
0.050
0
00.10.20.3 0. 4 0. 5 0. 60.70.8 0. 9 1. 0
Figure 49. LNA/VGA Full-Scale Limitations
V
GAIN
(V)
06304-110
Variable Gain Amplifier
The differential X-AMP VGA provides precise input attenuation
and interpolation. It has a low input-referred noise of 4 nV/√Hz
and excellent gain linearity. A simplified block diagram is shown
in Figure 50.
GAIN
VIP
VIN
g
m
3dB
GAIN INTERPOLATOR
Figure 50. Simplified VGA S
chematic
POSTAMP
+
–
POSTAMP
06304-078
The input of the VGA is a 12-stage differential resistor ladder with
3.01 dB per tap. The resulting total gain range is 30 dB, which
allows for range loss at the endpoints. The effective input resistance
per side is 180 Ω nominally for a total differential resistance of
360 Ω. The ladder is driven by a fully differential input signal from
the LNA. LNA outputs are dc-coupled to avoid external decoupling
capacitors. The common-mode voltage of the attenuator and the
VGA is controlled by an amplifier that uses the same midsupply
voltage derived in the LNA, permitting dc coupling of the LNA
to the VGA without introducing large offsets due to commonmode differences. However, any offset from the LNA will be
amplified as the gain is increased, producing an exponentially
increasing VGA output offset.
The input stages of the X-AMP are distributed along the ladder,
a
nd a biasing interpolator, controlled by the gain interface,
determines the input tap point. With overlapping bias currents,
signals from successive taps merge to provide a smooth
attenuation range from 0 dB to −30 dB. This circuit technique
results in linear-in-dB gain law conformance and low distortion
levels—only deviating ±0.5 dB or less from the ideal. The gain
slope is monotonic with respect to the control voltage and is
stable with variations in process, temperature, and supply.
The X-AMP inputs are part of a 24 dB gain feedback amplifier
tha
t completes the VGA. Its bandwidth is about 70 MHz. The
input stage is designed to reduce feedthrough to the output and
to ensure excellent frequency response uniformity across the
gain setting.
Gain Control
The gain control interface, GAIN±, is a differential input. The
VGA gain, V
, is shown in Equation 3. V
GAIN
varies the gain
GAIN
of all VGAs through the interpolator by selecting the appropriate
input stages connected to the input attenuator. The nominal
V
range for 30 dB/V is 0 V to 1 V, with the best gain linearity
GAIN
from about 0.1 V to 0.9 V, where the error is typically less than
±0.5 dB. For V
the error increases. The value of V
voltages greater than 0.9 V and less than 0.1 V,
GAIN
can exceed the supply
GAIN
voltage by 1 V without gain foldover.
Gain control response time is less than 750 ns to settle within 10%
f the final value for a change from minimum to maximum gain.
o
There are two ways in which the GAIN+ and GAIN− pins can
e interfaced. Using a single-ended method, a Kelvin type of
b
connection to ground can be used as shown in Figure 51. For
dr
iving multiple devices, it is preferable to use a differential
method, as shown in Figure 52. In either method, the GAIN+
and GAIN− pins should be dc-coupled and driven to accommodate a 1 V full-scale input.
AD9271
AD9271
GAIN+
GAIN–
GAIN+
0.01µF
GAIN–
Figure 51. Single-Ended GAIN± Pins Configuration
Figure 52. Differential GAIN± Pins Configuration
100Ω
0.01µF
100Ω
0.01µF
0.01µF
±0.25DC AT
0.5V CM
±0.25DC AT
0.5V CM
100Ω
KELVIN
CONNECTION
499
AD8138
499Ω
499Ω
0.5V CM
523Ω
50Ω
AVDD
26kΩ
10kΩ
0 TO 1V DC
±0.5V DC
50Ω
06304-109
VGA Noise
In a typical application, a VGA compresses a wide dynamic
range input signal to within the input span of an ADC. The
input-referred noise of the LNA limits the minimum resolvable
input signal, whereas the output-referred noise, which depends
primarily on the VGA, limits the maximum instantaneous
dynamic range that can be processed at any one particular gain
control voltage. This latter limit is set in accordance with the
total noise floor of the ADC.
Output-referred noise as a function of V
is shown in Figure 24
GAIN
and Figure 25 for the short-circuit input conditions. The input
6304-098
Rev. A | Page 26 of 60
Page 27
AD9271
www.BDTIC.com/ADI
noise voltage is simply equal to the output noise divided by the
measured gain at each point in the control range.
The output-referred noise is a flat 63 nV/√Hz over most of the
in range, because it is dominated by the fixed output-referred
ga
noise of the VGA. At the high end of the gain control range, the
noise of the LNA and source prevail. The input-referred noise
reaches its minimum value near the maximum gain control
voltage, where the input-referred contribution of the VGA is
miniscule.
At lower gains, the input-referred noise and, therefore, the noise
igure increases as the gain decreases. The instantaneous dynamic
f
range of the system is not lost, however, because the input capacity
increases as the input-referred noise increases. The contribution
of the ADC noise floor has the same dependence. The important
relationship is the magnitude of the VGA output noise floor
relative to that of the ADC.
Gain control noise is a concern in very low noise applications.
mal noise in the gain control interface can modulate the
Ther
channel gain. The resultant noise is proportional to the output
signal level and is usually evident only when a large signal is
present. The gain interface includes an on-chip noise filter, which
significantly reduces this effect at frequencies above 5 MHz. Care
should be taken to minimize noise impinging at the GAIN±
input. An external RC filter can be used to remove V
GAIN
source
noise. The filter bandwidth should be sufficient to accommodate
the desired control bandwidth.
Antialiasing Filter
The filter that the signal reaches prior to the ADC is used to
reject dc signals and to band limit the signal for antialiasing.
Figure 53 shows the architecture of the filter.
4kΩ
1C*
56pF/112p F
56pF/112p F
*C = 0.5pF T O 3.1pF
2kΩ2kΩ2kΩ
6.5C*7.5C*
2kΩ2kΩ2kΩ
1C*
4kΩ
Figure 53. Simplified Filter Schematic
06304-099
The filter can be configured for dc coupling or to have a single
pole for high-pass filtering at either 700 kHz or 350 kHz
(programmed through the SPI). The high-pass pole, however, is
not tuned and can vary by ±30%.
A third-order Butterworth low-pass filter is used to reduce
oise bandwidth and provide antialiasing for the ADC. The
n
filter uses on-chip tuning to trim the capacitors and in turn set
the desired cutoff frequency and reduce variations. The default
−3 dB cutoff is 1/3 the ADC sample clock rate. The cutoff can
be scaled to 0.7, 0.8, 0.9, 1, 1.1, 1.2, or 1.3 times this frequency
through the SPI. The cutoff can be set from 8 MHz to 18 MHz.
Tuning is normally off to avoid changing the capacitor settings
uring critical times. The tuning circuit is enabled and disabled
d
through the SPI. Initializing the tuning of the filter must be
done after initial power-up and after reprogramming the filter
cutoff scaling or ADC sample rate. Occasional retuning during
an idle time is recommended to compensate for temperature drift.
ADC
The AD9271 architecture consists of a pipelined ADC divided
into three sections: a 4-bit first stage followed by eight 1.5-bit
stages and a 3-bit flash. Each stage provides sufficient overlap to
correct for flash errors in the preceding stages. The quantized
outputs from each stage are combined into a 12-bit result in the
digital correction logic. The pipelined architecture permits the
first stage to operate on a new input sample and the remaining
stages to operate on preceding samples. Sampling occurs on the
rising edge of the clock.
Each stage of the pipeline except for the last consists of a low
r
esolution flash ADC connected to a switched-capacitor DAC
and interstage residue amplifier (for example, a multiplying
digital-to-analog converter (MDAC)). The residue amplifier
magnifies the difference between the reconstructed DAC output
and the flash input for the next stage in the pipeline. One bit of
redundancy is used in each stage to facilitate digital correction
of flash errors. The last stage consists of a flash ADC.
The output staging block aligns the data, carries out error corr
ection, and passes the data to the output buffers. The data is
then serialized and aligned to the frame and output clock.
Rev. A | Page 27 of 60
Page 28
AD9271
V
V
www.BDTIC.com/ADI
CLOCK INPUT CONSIDERATIONS
For optimum performance, the AD9271 sample clock inputs
(CLK+ and CLK−) should be clocked with a differential signal.
This signal is typically ac-coupled into the CLK+ and CLK− pins
via a transformer or capacitors. These pins are biased internally
and require no additional bias.
Figure 54 shows the preferred method for clocking the AD9271.
A lo
w jitter clock source, such as the Valpey Fisher oscillator
VFAC3-BHL-50MHz, is converted from single-ended to
differential using an RF transformer. The back-to-back Schottky
diodes across the secondary transformer limit clock excursions
into the AD9271 to approximately 0.8 V p-p differential. This
helps prevent the large voltage swings of the clock from feeding
through to other portions of the AD9271, and it preserves the
fast rise and fall times of the signal, which are critical to low
jitter performance.
3.3V
OUT
EN
VFAC3
Figure 54. Transformer-Coupled Differential Clock
If a low jitter clock is available, another option is to ac-couple a
differential PECL signal to the sample clock input pins as shown
in Figure 55. The AD951x family of clock drivers offers excellent
ji
tter performance.
3.3V
50Ω
VFAC3
OUT
EN
*
50Ω RESISTOR IS OPTIONAL.
3.3V
*
50Ω
VFAC3
OUT
EN
*
50Ω RESISTOR IS OPTIONAL.
MINI-CIRCUITS
0.1µF
50Ω
*
ADT1-1W T, 1:1Z
100Ω
0.1µF
CLK
0.1µF
CLK
PECL DRIVER
0.1µF
XFMR
0.1µF
0.1µF
AD951x FAMILY
SCHOTTKY
DIODES:
HSM2812
240Ω240Ω
Figure 55. Differential PECL Sample Clock
AD951x FAMILY
0.1µF
0.1µF
CLK
LVDS DRIVER
CLK
0.1µF
100Ω
0.1µF
Figure 56. Differential LVDS Sample Clock
0.1µF
100Ω
0.1µF
CLK+
ADC
AD9271
CLK–
CLK+
ADC
AD9271
CLK–
CLK+
ADC
AD9271
CLK–
06304-050
06304-051
06304-052
In some applications, it is acceptable to drive the sample clock
inputs with a single-ended CMOS signal. In such applications,
CLK+ should be driven directly from a CMOS gate, and the
CLK− pin should be bypassed to ground with a 0.1 F capacitor
in parallel with a 39 kΩ resistor (see Figure 57). Although the
CLK+ i
nput circuit supply is AVDD (1.8 V), this input is
designed to withstand input voltages of up to 3.3 V, making the
selection of the drive logic voltage very flexible.
3.3
AD951x FAMILY
CLK
CMOS DRIVER
CLK
0.1µF
OPTIONAL
100Ω
39kΩ
0.1µF
CLK+
ADC
AD9271
CLK–
50Ω
0.1µF
0.1µF
*
VFAC3
OUT
EN
*
50Ω RESISTOR IS OPTIONAL.
Figure 57. Single-Ended 1.8 V CMOS Sample Clock
3.3
AD951x FAMILY
CLK
CMOS DRIVER
CLK
OPTION AL
100Ω
0.1µF
0.1µF
CLK+
ADC
AD9271
CLK–
0.1µF
50Ω
0.1µF
*
OUT
EN
VFAC3
*
50Ω RESISTOR IS OPTIONAL.
Figure 58. Single-Ended 3.3 V CMOS Sample Clock
Clock Duty Cycle Considerations
Typical high speed ADCs use both clock edges to generate a
variety of internal timing signals. As a result, these ADCs may
be sensitive to the clock duty cycle. Commonly, a 5% tolerance is
required on the clock duty cycle to maintain dynamic performance
characteristics. The AD9271 contains a duty cycle stabilizer (DCS)
that retimes the nonsampling edge, providing an internal clock
signal with a nominal 50% duty cycle. This allows a wide range
of clock input duty cycles without affecting the performance of
the AD9271. When the DCS is on, noise and distortion performance are nearly flat for a wide range of duty cycles. However,
some applications may require the DCS function to be off. If so,
keep in mind that the dynamic range performance can be affected
when operated in this mode. See the
m
ore details on using this feature.
Memory Map section for
The duty cycle stabilizer uses a delay-locked loop (DLL) to
eate the nonsampling edge. As a result, any changes to the
cr
sampling frequency require approximately eight clock cycles
to allow the DLL to acquire and lock to the new rate.
Clock Jitter Considerations
High speed, high resolution ADCs are sensitive to the quality of the
clock input. The degradation in SNR at a given input frequency (f
due only to aperture jitter (t
SNR Degradation = 20 × log 10[1/2 × π ×
) can be calculated by
J
f
A
× tJ]
A
06304-054
)
06304-053
Rev. A | Page 28 of 60
Page 29
AD9271
www.BDTIC.com/ADI
In this equation, the rms aperture jitter represents the root mean
square of all jitter sources, including the clock input, analog input
signal, and ADC aperture jitter. IF undersampling applications
are particularly sensitive to jitter (see Figure 59).
The clock input should be treated as a
n analog signal in cases
where aperture jitter may affect the dynamic range of the AD9271.
Power supplies for clock drivers should be separated from the
ADC output driver supplies to avoid modulating the clock signal
with digital noise. Low jitter, crystal-controlled oscillators make
the best clock sources, such as the Valpey Fisher VFAC3 series.
If the clock is generated from another type of source (by gating,
dividing, or other methods), it should be retimed by the
original clock during the last step.
Refer to the AN-501 Application Note
and the AN-756
Application Note for more in-depth information about how
jitter performance relates to ADCs (visit www.analog.com).
130
RMS CLOCK JITT ER REQUIREMENT
120
110
100
90
80
SNR (dB)
70
10 BITS
60
8 BITS
50
40
30
1101001000
ANALOG INPUT FREQUENCY (M Hz)
0.125ps
0.25ps
0.5ps
1.0ps
2.0ps
16 BITS
14 BITS
12 BITS
06304-038
Figure 59. Ideal SNR vs. Input Frequency and Jitter
Power Dissipation and Power-Down Mode
As shown in Figure 61, the power dissipated by the AD9271 is
proportional to its sample rate. The digital power dissipation
does not vary much because it is determined primarily by the
DRVDD supply and bias current of the LVDS output drivers
(Figure 60).
800
I
, 50MSPS SPEED GRADE
AVDD
700
I
, 40MSPS SPEED GRADE
AVDD
600
500
400
300
CURRENT (mA)
200
100
0
0
Figure 60. Supply Current vs. f
I
, 25MSPS SPEED GRADE
AVDD
I
DRVDD
1020304050
SAMPLING FREQUENCY (M SPS)
for fIN = 7.5 MHz
SAMPLE
06304-032
190
180
170
160
150
140
130
POWER/CHANNEL (mW)
120
110
100
0
25MSPS SPEED GRADE
1020304050
SAMPLING FREQUENCY (M SPS)
Figure 61. Power per Channel vs. f
50MSPS SPEED GRADE
40MSPS SPEED GRADE
for fIN = 7.5 MHz
SAMPLE
06304-031
By asserting the PDWN pin high, the AD9271 is placed into
power-down mode. In this state, the device typically dissipates
2 mW. During power-down, the LVDS output drivers are placed
into a high impedance state. The AD9271 returns to normal
operating mode when the PDWN pin is pulled low. This pin is
both 1.8 V and 3.3 V tolerant.
By asserting the STBY pin high, the AD9271 is placed into a
andby mode. In this state, the device typically dissipates
st
65 mW. During standby, the entire part is powered down except
the internal references. The LVDS output drivers are placed into
a high impedance state. This mode is well suited for applications
that require power savings because it allows the device to be
powered down when not in use and then quickly powered up.
The time to power the device back up is also greatly reduced. The
AD9271 returns to normal operating mode when the STBY pin
is pulled low. This pin is both 1.8 V and 3.3 V tolerant.
In power-down mode, low power dissipation is achieved by
utting down the reference, reference buffer, PLL, and biasing
sh
networks. The decoupling capacitors on REFT and REFB are
discharged when entering power-down mode and must be
recharged when returning to normal operation. As a result, the
wake-up time is related to the time spent in the power-down
mode: shorter cycles result in proportionally shorter wake-up
times. To restore the device to full operation, approximately
1 ms is required when using the recommended 0.1 µF and 4.7 µF
decoupling capacitors on the REFT and REFB pins and the
0.01 µF decoupling capacitors on the GAIN± pins. Most of this
time is dependent on the gain decoupling; higher value decoupling
capacitors on the GAIN± pins result in longer wake-up times.
There are a number of other power-down options available
when usin
g the SPI port interface. The user can individually
power down each channel or put the entire device into standby
mode. This allows the user to keep the internal PLL powered up
when fast wake-up times are required. The wake-up time is
slightly dependent on gain. To achieve a 1 µs wake-up time
when the device is in standby mode, 0.5 V must be applied to
the GAIN± pins. See the
n using these features.
o
Memory Map section for more details
Rev. A | Page 29 of 60
Page 30
AD9271
www.BDTIC.com/ADI
Digital Outputs and Timing
The AD9271 differential outputs conform to the ANSI-644 LVDS
standard on default power-up. This can be changed to a low power,
reduced signal option similar to the IEEE 1596.3 standard by using
the SDIO pin or via the SPI. This LVDS standard can further
reduce the overall power dissipation of the device by approximately
36 mW. See the SDIO Pin section or Tab le 1 5 for more
info
rmation.
The LVDS driver current is derived on chip and sets the output
urrent at each output equal to a nominal 3.5 mA. A 100 Ω differ-
c
ential termination resistor placed at the LVDS receiver inputs
results in a nominal 350 mV swing at the receiver.
The AD9271 LVDS outputs facilitate interfacing with LVDS
eceivers in custom ASICs and FPGAs that have LVDS capability
r
for superior switching performance in noisy environments.
Single point-to-point net topologies are recommended with a
100 Ω termination resistor placed as close to the receiver as
possible. No far-end receiver termination and poor differential
trace routing may result in timing errors. It is recommended
that the trace length be no longer than 24 inches and that the
differential output traces be kept close together and at equal
lengths. An example of the FCO, DCO, and data stream with
proper trace length and position can be found in
Figure 62.
Additional SPI options allow the user to further increase the
in
ternal termination (and therefore increase the current) of all
eight outputs in order to drive longer trace lengths (see
ven though this produces sharper rise and fall times on the
E
Figure 65).
data edges, is less prone to bit errors, and improves frequency
distribution (see Figure 65), the power dissipation of the DRVDD
s
upply increases when this option is used.
In cases that require increased driver strength to the DCO± and
FCO± o
utputs because of load mismatch, Register 0x15 allows
the user to double the drive strength. To do this, first set the
appropriate bit in Register 0x05. Note that this feature cannot
be used with Bit 4 and Bit 5 in Register 0x15 because these bits
take precedence over this feature. See the
or more details.
f
600
EYE: ALL BI TS
400
200
100
0
–100
–200
EYE DIAGRAM V OLTAGE (V)
–400
Memory Map section
ULS: 2398/2398
CH1 500mV/DIV Ω
CH2 500mV/DIV Ω
CH3 500mV/DIV Ω
Figure 62. LVDS Output Timing Example in ANSI-644 Mode (Default)
5.0ns/DI V
06304-034
An example of the LVDS output using the ANSI-644 standard
(default) data eye and a time interval error (TIE) jitter histogram
with trace lengths of less than 24 inches on regular FR-4 material
is shown in Figure 63. Figure 64 shows an example of the trace
len
gths exceeding 24 inches on regular FR-4 material. Notice
that the TIE jitter histogram reflects the decrease of the data eye
opening as the edge deviates from the ideal position; therefore,
the user must determine if the waveforms meet the timing budget
of the design when the trace lengths exceed 24 inches.
–600
–1.5ns–0.5ns–1.0ns0ns0.5ns1.0ns1.5ns
25
20
15
10
TIE JITTER HISTOGRAM (Hits)
5
0
–200ps–100ps0p s100p s200ps
Figure 63. Data Eye for LVDS Outputs in ANSI-644 Mod
of Less Than 24 Inches on Standard FR-4
06304-035
e with Trace Lengths
Rev. A | Page 30 of 60
Page 31
AD9271
www.BDTIC.com/ADI
400
EYE: ALL BI TS
300
200
100
0
–100
–200
EYE DIAGRAM VO LTAGE (V)
–300
–400
–1.5ns–0.5ns–1.0ns0ns0.5 ns1.0ns1.5n s
25
20
15
10
ULS: 2399/2399
600
EYE: ALL BI TS
400
200
0
–200
EYE DIAGRAM VOLTAGE (V)
–400
–600
–1.5ns–0.5ns–1.0ns0ns0.5ns1.0ns1.5ns
25
20
15
10
ULS: 2396/2396
TIE JITTER HISTOGRAM (Hits)
5
0
–200ps–100ps0p s100p s200ps
Figure 64. Data Eye for LVDS Outputs in ANSI-644 Mod
of Greater Than 24 Inches on Standard FR-4
06304-036
e with Trace Lengths
TIE JIT TER HIST OGRAM (Hi ts)
5
0
–200ps–100ps0p s100p s200ps
Figure 65. Data Eye for LVDS Outputs in ANSI-644 Mode with 100 Ω
Terminat
ion On and Trace Lengths of Greater Than 24 Inches on Standard FR-4
06304-037
Rev. A | Page 31 of 60
Page 32
AD9271
www.BDTIC.com/ADI
The format of the output data is offset binary by default. An
example of the output coding format can be found in Tab le 9 .
T
o change the output data format to twos complement, see the
1000 User input Register 0x19 and Register 0x1A Register 0x1B and Register 0x1C No
1001 1-/0-bit toggle 1010 1010 (8 bits)
1010 1× sync 0000 1111 (8 bits)
1011 One bit high 1000 0000 (8 bits)
1100 Mixed bit frequency 1010 0011 (8 bits)
1
All test mode options except PN sequence short and PN sequence long can support 8- to 14-bit word lengths in order to verify data capture to the receiver.
times the sample clock rate, with a maximum of 600 Mbps
(12 bits × 50 MSPS = 600 Mbps). The lowest typical conversion
rate is 10 MSPS, but the PLL can be set up for encode rates as
low as 5 MSPS via the SPI if lower sample rates are required for
a specific application. See the
o
n enabling this feature.
Memory Map section for details
Two output clocks are provided to assist in capturing data from
e AD9271. DCO± is used to clock the output data and is equal
th
to six times the sampling clock rate. Data is clocked out of the
AD9271 and must be captured on the rising and falling edges of
the DCO± that supports double data rate (DDR) capturing. The
frame clock output (FCO±) is used to signal the start of a new
output byte and is equal to the sampling clock rate. See the
timing diagram shown in Figure 2 for more information.
When using the serial port interface (SPI), the DCO± phase can
be adjusted in 60° increments relative to the data edge. This
enables the user to refine system timing margins if required.
The default DCO± timing, as shown in Figure 2, is 90° relative
to
the output data edge.
An 8-, 10-, and 14-bit serial stream can also be initiated from
he SPI. This allows the user to implement different serial streams
t
to test the device’s compatibility with lower and higher resolution
systems. When changing the resolution to an 8- or 10-bit serial
stream, the data stream is shortened. When using the 14-bit
option, the data stream stuffs two 0s at the end of the normal
14-bit serial data.
When using the SPI, all of the data o
from their nominal state. This is not to be confused with inverting
the serial stream to an LSB-first mode. In default mode, as shown
in
Figure 2, the MSB is represented first in the data output serial
tream. However, this can be inverted so that the LSB is repre-
s
sented first in the data output serial stream (see Figure 3).
There are 12 digital output test pattern options available that
n be initiated through the SPI. This feature is useful when
ca
validating receiver capture and timing. Refer to Tab le 1 0 for the
output
bit sequencing options available. Some test patterns have
two serial sequential words and can be alternated in various
ways, depending on the test pattern chosen. It should be noted
that some patterns may not adhere to the data format select
option. In addition, customer user patterns can be assigned in
the 0x19, 0x1A, 0x1B, and 0x1C register addresses. All test mode
options except PN sequence short and PN sequence long can
support 8- to 14-bit word lengths in order to verify data capture
to the receiver.
The PN sequence short pattern produces a pseudorandom
sequence that repeats itself every 2
bit
description of the PN sequence and how it is generated can be
found in Section 5.1 of the ITU-T 0.150 (05/96) standard. The
only difference is that the starting value is a specific value instead
of all 1s (see Table 11 for the initial values).
The PN sequence long pattern produces a pseudorandom bit
s
equence that repeats itself every 2
A description of the PN sequence and how it is generated can
be found in Section 5.6 of the ITU-T 0.150 (05/96) standard.
The only differences are that the starting value is a specific value
instead of all 1s and the AD9271 inverts the bit stream with
relation to the ITU standard (see Table 1 1 for the initial values).
Table 11. PN Sequence
Initial
Sequence
PN Sequence Short 0x0df 0xdf9, 0x353, 0x301
PN Sequence Long 0x29b80a 0x591, 0xfd7, 0xa3
Consult the Memory Map section for information on how to
change these additional digital output timing features through the
SPI.
Va
lue
utputs can also be inverted
9
− 1 bits, or 511 bits. A
23
− 1 bits, or 8,388,607 bits.
First Three Output Samples
(MSB First)
Rev. A | Page 33 of 60
SDIO Pin
This pin is required to operate the SPI. It has an internal 30 kΩ
pull-down resistor that pulls this pin low and is only 1.8 V
tolerant. If applications require that this pin be driven from a
3.3 V logic level, insert a 1 kΩ resistor in series with this pin to
limit the current.
SCLK Pin
This pin is required to operate the SPI port interface. It has an
internal 30 kΩ pull-down resistor that pulls this pin low and is
both 1.8 V and 3.3 V tolerant.
CSB Pin
This pin is required to operate the SPI port interface. It has an
internal 70 kΩ pull-down resistor that pulls this pin low and is
both 1.8 V and 3.3 V tolerant.
RBIAS Pin
To set the internal core bias current of the ADC, place a resistor
that is nominally equal to 10.0 kΩ between the RBIAS pin and
ground. Using a resistor of another value degrades the performance
of the device. Therefore, it is imperative that at least a 1% tolerance
on this resistor be used to achieve consistent performance.
Voltage Reference
A stable and accurate 0.5 V voltage reference is built into the
AD9271. This is gained up internally by a factor of 2, setting
VREF to 1.0 V, which results in a full-scale differential input
span of 2.0 V p-p for the ADC. VREF is set internally by default,
but the VREF pin can be driven externally with a 1.0 V reference to
achieve more accuracy. However, full-scale ranges below 2.0 V p-p
are not supported by this device.
When applying the decoupling capacitors to the VREF, REFT,
and
REFB pins, use ceramic low ESR capacitors. These capacitors
should be close to reference pins and on the same layer of the
PCB as the AD9271. The recommended capacitor values and
configurations for the AD9271 reference pin can be found in
Figure 66.
Table 12. Reference Settings
Resulting
Selected
Mode
External
Reference
Internal,
2 V p-p FSR
SENSE
Voltage
AVDD N/A
AGND to 0.2 V 1.0 2.0
Resulting
VREF (V)
D
Span (V p-p)
2 × external
reference
ifferential
Page 34
AD9271
www.BDTIC.com/ADI
Internal Reference Operation
A comparator within the AD9271 detects the potential at the
ENSE pin and configures the reference. If SENSE is grounded,
S
the reference amplifier switch is connected to the internal
resistor divider (see Figure 66), setting VREF to 1 V.
The REFT and REFB pins establish their input span of the ADC
c
ore from the reference configuration. The analog input fullscale range of the ADC equals twice the voltage at the reference
pin for either an internal or an external reference configuration.
VIN+
VREF
1µF0.1µF
SENSE
VIN–
SELECT
LOGIC
ADC
CORE
0.5V
REFT
0.1µF
0.1µF4.7µF
REFB
0.1µF
+
External Reference Operation
The use of an external reference may be necessary to enhance
the gain accuracy of the ADC or to improve thermal drift characteristics. Figure 69 shows the typical drift characteristics of the
i
nternal reference in 1 V mode.
When the SENSE pin is tied to AVDD, the internal reference is
abled, allowing the use of an external reference. The external
dis
reference is loaded with an equivalent 6 kΩ load. An internal
reference buffer generates the positive and negative full-scale
references, REFT and REFB, for the ADC core. Therefore, the
external reference must be limited to a nominal voltage of 1.0 V.
5
0
–5
–10
VREF ERROR (%)
–15
–20
EXTERNAL
REFERENCE
VREF
1µF*0.1µF*
SENSE
*OPTIONAL.
Figure 66. Internal Reference Configuration
VIN+
VIN–
ADC
CORE
0.5V
AVD D
SELECT
LOGIC
Figure 67. External Reference Operation
REFT
0.1µF
0.1µF4.7µF
REFB
0.1µF
06304-064
–25
033.02.52.01.51.00.5
CURRENT LOAD (mA)
06304-017
.5
Figure 68. VREF Accuracy vs. Load, AD9271-50
0.02
0
–0.02
VREF ERROR (%)
–0.04
–0.06
–0.08
–0.10
–0.12
–0.14
–0.16
–0.18
–0.20
–40806040200–20
TEMPERATURE (° C)
Figure 69. Typical VREF Drift, AD9271-50
06304-015
+
6304-065
Rev. A | Page 34 of 60
Page 35
AD9271
www.BDTIC.com/ADI
SERIAL PORT INTERFACE (SPI)
The AD9271 serial port interface allows the user to configure
the signal chain for specific functions or operations through a
structured register space provided inside the chip. This offers
the user added flexibility and customization depending on the
application. Addresses are accessed via the serial port and can
be written to or read from via the port. Memory is organized
into bytes that can be further divided into fields, as documented
in the
Memory Map section. Detailed operational information
n be found in the Analog Devices, Inc., AN-877 Application
ca
Note, Interfacing to High Speed ADCs via SPI.
Three pins define the serial port interface, or SPI: the SCLK,
DIO, and CSB pins. The SCLK (serial clock) is used to
S
synchronize the read and write data presented to the device.
The SDIO (serial data input/output) is a dual-purpose pin that
allows data to be sent to and read from the device’s internal
memory map registers. The CSB (chip select bar) is an active
low control that enables or disables the read and write cycles
(see Table 13).
Table 13. Serial Port Pins
Pin Function
SCLK
SDIO
CSB
Serial Clock. The serial shift clock input. SCLK is u
synchronize serial interface reads and writes.
Serial Data Input/Output. A dual-purpose pin. The typical
ole for this pin is as an input or output, depending on
r
the instruction sent and the relative position in the
timing frame.
Chip Select Bar (Active Low). This control gates the read
ite cycles.
and wr
sed to
The falling edge of the CSB in conjunction with the rising edge of
the SCLK determines the start of the framing sequence. During an
instruction phase, a 16-bit instruction is transmitted, followed by
one or more data bytes, which is determined by Bit Field W0 and
Bit Field W1. An example of the serial timing and its definitions
can be found in Figure 71 and Tab le 1 4.
In normal operation, CSB is used to si
gnal to the device that SPI
commands are to be received and processed. When CSB is brought
low, the device processes SCLK and SDIO to process instructions.
Normally, CSB remains low until the communication cycle is
complete. However, if connected to a slow device, CSB can be
brought high between bytes, allowing older microcontrollers
enough time to transfer data into shift registers. CSB can be stalled
when transferring one, two, or three bytes of data. When W0 and
W1 are set to 11, the device enters streaming mode and continues
to process data, either reading or writing, until the CSB is taken
high to end the communication cycle. This allows complete
memory transfers without having to provide additional instructtions. Regardless of the mode, if CSB is taken high in the middle
of any byte transfer, the SPI state machine is reset and the device
waits for a new instruction.
In addition to the operation modes, the S
to operate in different manners. For example, CSB can be tied
low to enable 2-wire mode. When CSB is tied low, SCLK and
SDIO are the only pins required for communication. Although
the device is synchronized during power-up, caution must be
exercised when using this mode to ensure that the serial port
remains synchronized with the CSB line. When operating in
2-wire mode, it is recommended that a 1-, 2-, or 3-byte transfer
be used exclusively. Without an active CSB line, streaming mode
can be entered but not exited.
In addition to word length, the instruction phase determines if
ial frame is a read or write operation, allowing the serial
the ser
port to be used to both program the chip and read the contents
of the on-chip memory. If the instruction is a readback operation,
performing a readback causes the serial data input/output (SDIO)
pin to change direction from an input to an output at the
appropriate point in the serial frame.
Data can be sent in MSB- or LSB-first mo
is the default at power-up and can be changed by adjusting the
configuration register. For more information about this and
other features, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
HARDWARE INTERFACE
The pins described in Tabl e 13 constitute the physical interface
between the user’s programming device and the serial port of
the AD9271. The SCLK and CSB pins function as inputs when
using the SPI interface. The SDIO pin is bidirectional, functioning
as an input during write phases and as an output during readback.
In cases where multiple SDIO pins share a common connection,
re should be taken to ensure that proper V
ca
Figure 70 shows the number of SDIO pins that can be connected
t
ogether, assuming the same load as the AD9271 and the
resulting V
(V)
OH
V
level.
OH
1.800
1.795
1.790
1.785
1.780
1.775
1.770
1.765
1.760
1.755
1.750
1.745
1.740
1.735
1.730
1.725
1.720
1.715
0302010405060708090100
NUMBER OF SDIO PINS CONNECTED TOGETHER
Figure 70. SDIO Pin Loading
PI port can be configured
de. MSB-first mode
levels are met.
OH
06304-113
Rev. A | Page 35 of 60
Page 36
AD9271
www.BDTIC.com/ADI
This interface is flexible enough to be controlled by either serial
P
ROMs or PIC mirocontrollers. This provides the user an
alternative method, other than a full SPI controller, to program
the device (see the AN-812 Application Note).
t
HI
t
CLK
t
LO
Figure 71. Serial Tim
CSB
SCLK
SDIO
DON’T CARE
t
DS
t
S
R/WW1W0A12A11A10A9A8A7
t
DH
Table 14. Serial Timing Definitions
Parameter Minimum Timing (ns) Description
t
DS
t
DH
t
CLK
t
S
t
H
t
HI
t
LO
t
EN_SDIO
5 Setup time between the data and the rising edge of SCLK
2 Hold time between the data and the rising edge of SCLK
40 Period of the clock
5 Setup time between CSB and SCLK
2 Hold time between CSB and SCLK
16 Minimum period that SCLK should be in a logic high state
16 Minimum period that SCLK should be in a logic low state
10
Minimum time for the SDIO pin to switch from an input t
falling edge (not shown in Figure 71)
t
DIS_SDIO
10
Minimum time for the SDIO pin to switch from an output t
rising edge (not shown in Figure 71)
ing Details
D5D4D3D2D1D0
o an output relative to the SCLK
o an input relative to the SCLK
t
H
DON’T CARE
DON’T CAREDON’T CARE
06304-068
Rev. A | Page 36 of 60
Page 37
AD9271
www.BDTIC.com/ADI
MEMORY MAP
READING THE MEMORY MAP TABLE
Each row in the memory map table has eight address locations.
The memory map is roughly divided into three sections: the
chip configuration register map (Address 0x00 to Address 0x02),
the device index and transfer register map (Address 0x04,
Address 0x05, and Address 0xFF), and the ADC functions
register map (Address 0x08 to Address 0x2D).
The leftmost column of the memory map indicates the register
address
number; the default value is shown in the second
rightmost column. The Bit 7 (MSB) column is the start of the
default hexadecimal value given. For example, Address 0x09, the
clock register, has a default value of 0x01, meaning that Bit 7 =
0, Bit 6 = 0, Bit 5 = 0, Bit 4 = 0, Bit 3 = 0, Bit 2 = 0, Bit 1 = 0, and
Bit 0 = 1, or 0000 0001 in binary. This setting is the default for the
duty cycle stabilizer in the on condition. By writing 0 to Bit 0 of
this address followed by writing 0x01 in Register 0xFF (transfer
bit), the duty cycle stabilizer turns off. It is important to follow
each writing sequence with a transfer bit to update the SPI
registers. All registers, except Register 0x00, Register 0x02,
Register 0x04, Register 0x05, and Register 0xFF, are buffered with
a master-slave latch and require writing to the transfer bit. For
more information on this and other functions, consult the AN877 Application Note, Interfacing to High Speed ADCs via SPI.
RESERVED LOCATIONS
Undefined memory locations should not be written to except
when writing the default values suggested in this data sheet.
Addresses that have values marked as 0 should be considered
reserved and have 0 written into their registers during power-up.
DEFAULT VALUES
After a reset, critical registers are automatically loaded with
default values. These values are indicated in Tabl e 15, where an
X r
efers to an undefined feature.
LOGIC LEVELS
An explanation of various registers follows: “Bit is set” is
synonymous with “bit is set to Logic 1” or “writing Logic 1 for
the bit.” Similarly, “clear a bit” is synonymous with “bit is set to
Logic 0” or “writing Logic 0 for the bit.”
shoul
mirrored so
that LSB- or
MSB-first mode
is set correctly
regardless of
shift mode.
Default is
unique chip ID,
different for
each device.
This is a readonly register.
to diff
erentiate
graded devices.
ne
determi
which on-chip
device receives
the next write
command.
ne
determi
which on-chip
device receives
the next write
command.
ers data
transf
from the
master shift
register to
the slave.
various gen
modes of chip
operation.
internal dut
cycle stabilizer
on and off.
eric
y
Table 15. Memory Map Register
Addr.
(Hex)
Chip Configuration Registers
00 chip_port_config 0 LSB first
01 chip_id Chip ID Bits [7:0]
02 chip_grade X X Child ID [5:4]
Device Index and Transfer Registers
04 device_index_2 X X X X Data
05 device_index_1 X X Clock
FF device_update X X X X X X X SW
ADC Functions Registers
08 modes X X X X LNA
09 clock X X X X X X X Duty cycle
Register Name
Rev. A | Page 38 of 60
Page 39
AD9271
www.BDTIC.com/ADI
Addr.
(Hex)
0D test_io User test mode
0F flex_channel_input Filter cutoff frequency control
10 flex_offset X X 6-bit LNA offset adjustment
11 flex_gain X X X X X X LNA gain
14 output_mode X 0 = LVDS
15 output_adjust X X Output driver
16 output_phase X X X X 0011 = output clock phase adjust
Register Name
Bit 7
(MSB)
00 = off (default)
01 = on, single alternate
10 = on, single once
11 = on, alternate once
0000 = 1.3 × 1/3 × f
0001 = 1.2 × 1/3 × f
0010 = 1.1 × 1/3 × f
0011 = 1.0 × 1/3 × f
0100 = 0.9 × 1/3 × f
0101 = 0.8 × 1/3 × f
0110 = 0.7 × 1/3 × f
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
SAMPLE
SAMPLE
SAMPLE
SAMPLE
SAMPLE
SAMPLE
SAMPLE
ANSI-644
(default)
1 = LVDS
low power,
(IEEE
1596.3
similar)
on
Reset PN
t
shor
gen
1 = on
0 = off
(default)
Output test mode—see
0000 = off (default)
0001 = midscale short
0010 = +FS short
0011 = −FS short
0100 = checkerboard output
0101 = PN sequence long
0110 = PN sequence short
0111 = one-/zero-word toggle
1000 = user input
1001 = 1-/0-bit toggle
1010 = 1× sync
1011 = one bit high
1100 = mixed bit frequency (format
determined by output_mode)
X X X X 0x30 Antialiasing
invert
on
1 =
0 = off
(default)
X X X DCO±
(0000 through 1010)
(Default: 180° relative to data edge)
0000 = 0° relative to data edge
0001 = 60° relative to data edge
0010 = 120° relative to data edge
0011 = 180° relative to data edge
0100 = 240° relative to data edge
0101 = 300° relative to data edge
0110 = 360° relative to data edge
0111 = 420° relative to data edge
1000 = 480° relative to data edge
1001 = 540° relative to data edge
1010 = 600° relative to data edge
1011 to 1111 = 660° relative to data edge
contr
causes MSB first
and the native
bit stream
(global).
own individ
d
ual sections of
a converter
(local).
al).
(glob
on/
terminati
input
impedance
(global).
ch
swit
enable (local).
Rev. A | Page 40 of 60
Page 41
AD9271
www.BDTIC.com/ADI
APPLICATIONS INFORMATION
DESIGN GUIDELINES
Before starting design and layout of the AD9271 as a system, it
is recommended that the designer become familiar with these
guidelines, which discuss the special circuit connections and
layout requirements needed for certain pins.
Power and Ground Recommendations
When connecting power to the AD9271, it is recommended
that two separate 1.8 V supplies be used: one for analog (AVDD)
and one for digital (DRVDD). The AD9271 also requires a
3.3 V supply (CWVDD) for the crosspoint section. If only one
1.8 V supply is available, it should be routed to the AVDD first
and then tapped off and isolated with a ferrite bead or a filter
choke preceded by decoupling capacitors for the DRVDD. The
user should employ several decoupling capacitors on all supplies
to cover both high and low frequencies. These capacitors should
be located close to the point of entry at the PC board level and
close to the parts with minimal trace lengths.
A single PC board ground plane should be sufficient when
usin
g the AD9271. With proper decoupling and smart partitioning of the PC board’s analog, digital, and clock sections,
optimum performance can be easily achieved.
Exposed Paddle Thermal Heat Slug Recommendations
It is required that the exposed paddle on the underside of the
device be connected to the analog ground (AGND) to achieve
the best electrical and thermal performance of the AD9271. An
exposed continuous copper plane on the PCB should mate to
the AD9271 exposed paddle, Pin 0. The copper plane should
have several vias to achieve the lowest possible resistive thermal
path for heat dissipation to flow through the bottom of the PCB.
These vias should be filled or plugged with nonconductive epoxy.
To maximize the coverage and adhesion between the device and
, partition the continuous copper pad by overlaying a silk-
PCB
screen or solder mask to divide it into several uniform sections.
This ensures several tie points between the two during the reflow
process. Using one continuous plane with no partitions guarantees
only one tie point between the AD9271 and PCB. See
or a PCB layout example. For more detailed information on
f
packaging and for more PCB layout examples, see the AN-772
Application Note.
SILKSCREEN PARTITION
PIN 1 INDICATOR
Figure 72
06304-069
Figure 72. Typical PCB Layout
Rev. A | Page 41 of 60
Page 42
AD9271
www.BDTIC.com/ADI
EVALUATION BOARD
The AD9271 evaluation board provides all the support circuitry
required to operate the AD9271 in its various modes and configurations. The LNA is driven differentially through a transformer.
Figure 73 shows the typical bench characterization setup used
t
o evaluate the ac performance of the AD9271. It is critical that
the signal sources used for the analog input and clock have very low
phase noise (<1 ps rms jitter) to realize the optimum performance
of the signal chain. Proper filtering of the analog input signal to
remove harmonics and lower the integrated or broadband noise at
the input is also necessary to achieve the specified noise performance.
See the Quick Start Procedure section to get started and Figure 75
to
Figure 86 for the complete schematics and layout diagrams
th
at demonstrate the routing and grounding techniques that
should be applied at the system level.
POWER SUPPLIES
This evaluation board comes with a wall-mountable switching
power supply that provides a 6 V, 2 A maximum output.
Connect the supply to the rated 100 V ac to 240 V ac wall outlet
at 47 Hz to 63 Hz. The other end is a 2.1 mm inner diameter
jack that connects to the PCB at P701. Once on the PC board,
the 6 V supply is fused and conditioned before connecting to
three low dropout linear regulators that supply the proper bias
to each of the various sections on the board.
When operating the evaluation board in a nondefault condition,
L702 t
o L704 can be removed to disconnect the switching
power supply. This enables the user to bias each section of the
board individually. Use P501 to connect a different supply for
each section. At least one 1.8 V supply is needed with a 1 A current
capability for AVDD_DUT and DRVDD_DUT; however, it is
recommended that separate supplies be used for both analog
and digital domains. To operate the evaluation board using the
WALL OU TL ET
100V TO 240V AC
47Hz TO 63Hz
6V DC
SWITCHING
ANALOG INPUT
ROHDE & SCHWARZ,
SMA,
2V p-p SIGNAL
SYNTHESIZER
ROHDE & SCHWARZ,
FS5A20
SPECTRUM
ANALYZER
POWER
SUPPLY
2A MAX
BAND-PASS
FILTER
CW OUTPUT
VFAC3
OSCILLATOR
1.8V
GND
CLK
Figure 73. Evaluation Board Connection
1.8V
–+–+
AVD D_DU T
AD9271
EVALUATION BOARD
GND
SPI and alternate clock options, a separate 3.3 V analog supply
is needed in addition to the other supplies. The 3.3 V supply, or
AVDD_3.3 V, should have a 1 A current capability.
To bias the crosspoint switch circuitry or CW section, separate
nd −5 V supplies are required at P511. These should each
+5 V a
have 1 A current capability. This section cannot be biased from
a 6 V, 2 A wall supply. Separate supplies are required at P511.
INPUT SIGNALS
When connecting the clock and analog source, use clean signal
generators with low phase noise, such as Rohde & Schwarz SMA
or HP8644B signal generators or the equivalent. Use a 1 m, shielded,
RG-58, 50 Ω coaxial cable for making connections to the evaluation board. Enter the desired frequency and amplitude from the
specifications tables. The evaluation board is set up to be clocked
from the crystal oscillator, OSC401. If a different or external clock
source is desired, follow the instructions for CLOCK outlined in
the
Default Operation and Jumper Selection Settings section.
ypically, most Analog Devices evaluation boards can accept
T
~2.8 V p-p or 13 dBm sine wave input for the clock. When
connecting the analog input source, it is recommended to use a
multipole, narrow-band, band-pass filter with 50 Ω terminations.
Analog Devices uses TTE and K&L Microwave, Inc., band-pass
filters. The filter should be connected directly to the evaluation board.
OUTPUT SIGNALS
The default setup uses the FIFO5 high speed, dual-channel
FIFO data capture board (HSC-ADC-EVALCZ). Two of the
eight channels can then be evaluated at the same time. For more
information on channel settings on these boards and their optional
settings, visit www.analog.com/FIFO.
3.3V
–+
GND
DRVDD_DUT
CH A TO CH H
AVDD_3.3V
12-BIT
SERIAL
LVDS
SPI
–+
HSC-ADC-EVALCZ
FPGA
SPI
PS
GND
VREG
FIFO DAT A
CAPTURE
BOARD
USB
CONNECTOR
(DATA/SPI)
PC
RUNNING
ADC
ANALYZER
OR
VISUAL
ANALOG
USER
SOFTWARE
06304-070
Rev. A | Page 42 of 60
Page 43
AD9271
www.BDTIC.com/ADI
DEFAULT OPERATION AND
JUMPER SELECTION SETTINGS
The following is a list of the default and optional settings or
modes allowed on the AD9271 Rev. B evaluation board.
• Power: Connect the switching power supply that is
supplied in the evaluation kit between a rated 100 V ac
to 240 V ac wall outlet at 47 Hz to 63 Hz and P701.
• AIN: The evaluation board is set up for a transformer-
coupled analog input with an optimum 50 Ω impedance
match of 18 MHz of bandwidth. For a different bandwidth
response, use the antialiasing filter settings.
• VREF: VREF is set to 1.0 V by tying the SENSE pin to
ground, R317. This causes the ADC to operate in 2.0 V p-p
full-scale range. A separate external reference option using
the ADR510 or ADR520 is also included on the evaluation
board. Populate R311 and R315 with 0 Ω resistors and
remove C307. Proper use of the VREF options is noted in
the
Voltage Reference section. Note that ADC full-scale
nges less than 2.0 V p-p are not supported by this device.
ra
• RBIAS: RBIAS has a default setting of 10 kΩ (R301) to
ground and is used to set the ADC core bias current.
However, note that using other than a 10 kΩ resistor for
RBIAS may degrade the performance of the device,
depending on the resistor chosen.
• Clock: The default clock input circuitry is derived from a
simple transformer-coupled circuit using a high bandwidth
1:1 impedance ratio transformer (T401) that adds a very
low amount of jitter to the clock path. The clock input is
50 Ω terminated and ac-coupled to handle single-ended
sine wave types of inputs. The transformer converts the
single-ended input to a differential signal that is clipped
before entering the ADC clock inputs.
The evaluation board is already set up to be clocked from the
cr
ystal oscillator, OSC401. This oscillator is a low phase noise
oscillator from Valpey Fisher (VFAC3-BHL-50MHz). If a
different clock source is desired, remove R403, set Jumper
J401 to disable the oscillator from running, and connect the
external clock source to the SMA connector, P401.
A differential LVPECL clock driver can also be used to
lock the ADC input using the
c
nd R407 with 0 Ω resistors and remove R415 and
R406 a
R416 to disconnect the default clock path inputs. In addition,
populate C405 and C406 with a 0.1 F capacitor and remove
C409 and C410 to disconnect the default clock path outputs.
The AD9515 has many pin-strappable options that are set
t
o a default mode of operation. Consult the AD9515 data
sheet for more information about these and other options.
AD9515 (U401). Populate
• PDWN: To enable the power-down feature, short P303 to
the on position (AVDD) on the PDWN pin.
• STBY: To enable the standby feature, short P302 to the on
position (AVDD) on the STBY pin.
• GAIN+, GAIN−: To change the VGA attenuation, drive the
GAIN+ pin from 0 V to 1 V on J301. This changes the
VGA gain from 0 dB to 30 dB. This feature can also be
driven from the R335 and R336 on-board resistive divider
by installing a 0 Ω resistor in R337.
• Non-SPI Mode: For users who wish to operate the DUT
without using the SPI, remove the jumpers on J501. This
disconnects the CSB, SCLK, and SDIO pins from the control
bus, allowing the DUT to operate in its simplest mode. Each
of these pins has internal termination and will float to its
respective level. Note that the device will only work in its
default condition.
• CWD+, CWD−: To view the CWD2+/CWD2− and CWD3+/
CWD3− outputs, jumper together the appropriate outputs
on P403. All outputs are summed together on IOP and
ION buses, fed to a 1:4 impedance ratio transformer, and
buffered so that the user can view the output on a spectrum
analyzer. This can be configured to be viewed in singleended mode (default) or in differential mode. To set the
voltage for the appropriate number of channels to be
summed, change the value of R447 and R448 on the
primary transformer (T402).
Upon shipment, the CWD0+/CWD0−, CWD1+/CWD1−,
CWD4+
properly biased and ready to use with the AD8339 quad
I/Q dem
evaluation board simply snaps into place on the AD8339
evaluation board (AD8339-EVALZ). Remove the jumpers
connected to P3A and P4A on the AD8339 evaluation
board, and snap the standoffs labeled MH502, MH504, and
MH505 that are provided with the AD9271 into the AD8339
evaluation board standoff holes in the center of the board.
The standoffs automatically lock into place and create a
direct connection between the AD9271 CWDx± outputs
and the AD8339 inputs.
• DOUTx+, DOUTx−: If an alternative data capture method
to the setup described in Figure 80 is used, optional receiver
t
high speed backplane connector.
/CWD4−, and CWD5+/CWD5− outputs are
odulator and phase shifter. The AD9271
erminations, R601 to R610, can be installed next to the
Rev. A | Page 43 of 60
Page 44
AD9271
www.BDTIC.com/ADI
In SPI Controller, select Controller Dialog from the
QUICK START PROCEDURE
The following is a list of the default and optional settings when
using the AD9271 either on the evaluation board or at the
system level design.
If an evaluation board is not being used, follow only the SPI
ntroller steps.
co
When using the AD9271 evaluation board,
1.
Open ADC Analyzer on a PC, click Configuration, and
select the appropriate product configuration file.
If the correct product configuration file is not available,
hoose a similar product configuration file or click
c
and create a new one. See the ADC Analyzer User Manual
located at www.analog.com/FIFO.
From the Config menu, choose Channel Select. To evaluate
2.
Channel A on the ADC evaluation board, ensure that only
the Channel B checkbox in ADC Analyzer is selected.
Channel A through Channel D cor
respond to Channel B in
ADC Analyzer.
Channel E through Channel H correspond to Channel A in
C Analyzer.
AD
Click SPI in ADC Analyzer to open the SPI controller
3.
software. If prompted for a configuration file, select the
appropriate one. If not, look at the title bar of the window
to see which configuration is loaded. If necessary, choose
Cfg Open from the File menu and select the appropriate one.
Note that the
CHIP ID(1) field may be filled in regardless of
whether the correct SPI controller configuration file is loaded.
When using the AD9271 evaluation board or system level design,
1.
Click New DUT () in the SPI Controller software.
2.
In the Global tab of SPI Controller, find the CHIP
GRADE(2)
box and use the drop-down menu to select
the correct speed grade.
Cancel
4.
Config menu. In the PROGRAM CONTROL box, ensure
that
Enable Auto Channel Update is selected and click OK.
In the Global tab of SPI Controller, find the DEVICE
5.
INDEX(4/5)
box. In the ADC column, click S so that the
adjustment in the next step applies to all channels.
In the ADC A tab of SPI Controller, find the OFFSET(10)
6.
box and use the drop-down menu labeled
Offset Adj to select
the correct LNA offset correction: 25 decimal for the 50 MSPS
speed grade, 26 decimal for the 40 MSPS speed grade, or
31 decimal for the 25 MSPS speed grade.
Click FFT () in Visual Analog.
7.
0
–10
–20
–30
–40
–50
–60
–70
–80
AMPLITUDE (dBFS)
–90
–100
–110
–120
–130
02
5101520
FREQUENCY (M Hz)
Figure 74. Typical FFT, AD9271-50
f
= 3.5MHz @ –1dBFS
IN
LNA = 6×
V
= 1V
GAIN
FILTER TUNED
HPF = 700kHz
8. Adjust the amplitude of the input signal so that the
fundamental is at the desired level. (Examine the
reading in the left panel of the
ADC Analyzer FFT
Fund:
window.) If the GAIN± pins voltage is low (near 0 V), it
may not be possible to reach full scale without distortion.
Use a higher gain setting or a lower input level to avoid
distortion.
06304-119
5
In the ADCGlobal 0 tab of SPI Controller, find the
3.
9.
Right-click the FFT plot and select Comments. Use this
HIGHPASS(2B) box and select the Manual Tune box to
calibrate the antialiasing filter.
Rev. A | Page 44 of 60
box to record information such as the serial number of the
board, the channel, the input and clock frequencies, the
GAIN± pins voltage, and the date. Press the
SCREEN
key and save the FFT screenshot if desired.
PRINT
Page 45
AD9271
www.BDTIC.com/ADI
SCHEMATICS AND ARTWORK
LO- C
LOSW C
LIC
LGC
LO- D
LID
LOSW D
06304-086
R125
200
R126
1K-DN P
C111
0.1UF
C123
0.1UF
0
R163
R160
0
R120
CTC
R156
41
ADT1-1WT +
CTC
0
R103
R119
J103
0.1UF-DNP22PF
C109
0.1UF
49.9
R152
0-DNP
6
T103
AVDD
3
52
GND C
49.9-DNP
R139
0-DNP
C112
0
R124R127
C110
0
10K-DN P
R145
R146
10K-DN P
C119
0.1UF-DNP
R121
0
0
0-DNP
R113R150
R134
R135
1K-DN P
C115
AIN CHD
200
0.1UF
C124
R164
R123
C113
0.1UF
0
49.9
R161
0
CTD
R157
0-DNP
25
ADT1-1WT +
14
CTD
0
R129
R128
49.9-DNP
J104
0-DNP
R136R133
C116
0
C114
22PF0.1UF-DNP
0.1UF
0
R153
6
10K-DN P
R148
R147
10K-DN P
T10 4
AVDD
3
GNDD
R140
0
C120
0.1UF-DNP
0
R131
R122
0-DNP
LIA
LOSW A
LO- A
200
R108
R107
1K-DN P
C103
0.1UF
C121
R132
R105
ADT1-1WT +
R102
J101
AIN CHAAIN CHC
LGA
0.1UF-DNP
22PF
C101
0.1UF
0
0
14
0
0.1UF
49.9
R158
CTA
R154
0
R130
0-DNP
6
25
T101
AVDD
3
CTA
GND A
R101
49.9-DNP
R149
0
LO- B
LOSW B
LIB
0-DNP
R109R106
C102C1 04
0
10K-DN P
R142
R141
10K-DN P
C117
0.1UF-DNP
0
R137
0-DNP
R116
200
R117
1K-DN P
C107
0.1UF
C122
R162
R114
ADT1-1WT +
R111
J102
AIN CHB
LGBLGD
C105
0.1UF
0
R159
49.9
0
CTB
R155
0-DNP
41
6
T102
3
52
CTB
0
GNDB
49.9-DNP
R110
C108
0-DNP
C106
22PF0.1UF-DNP
0.1UF
R151
AVDD
R138
0
R115R1 18
0
10K-DN P
R143
R144
10K-DN P
C118
0.1UF-DNP
R112
0
0
R104
0-DNP
Figure 75. Evaluation Board Schematic, DUT Analog Input Circuits
Rev. A | Page 45 of 60
Page 46
AD9271
www.BDTIC.com/ADI
LO- G
LOSW G
LIG
R225
200
R226
1K-DN P
C211
0.1UF
C223
R263
R220
6
T20 3
3
R213
J20 3
AIN CHG
C209
0.1UF
0
R260
49.9
0
CTG
R256
0-DN P
25
CTG
0
49.9-DNP
R219
LGG
0.1UF-DN P
22PF
0.1UF
R251
AVDD
ADT1-1WT +
0-DN P
C212
0
R224R227
C210
0
10K-DN P
R245
14
GNDG
R237
0
0
R239
R231
0-DN P
LIH
LOSW H
LO- H
200
R235
R234
1K-DN P
C215
0.1UF
C22 4
0.1UF
0
R264
R261
0
R223
CTH
R257
R246
10K-DN P
C219
0.1UF-DN P
6
T204
3
0
R229
J204
AIN CHH
52
CTH
0.1UF-DN P22PF
C21 3
0.1UF
49.9
R252
0-DN P
41
AVDD
ADT1-1WT +
GNDH
R240
49.9-DNP
0-DN P
R236R23 3
C216
0
C214
0
R247
10K-DN P
0
R253
0
0-DN P
R241
06304-087
10K-DN P
R248
C220
0.1UF-DN P
LIE
LOSW E
LO- E
R207
200
R208
1K-DN P
C203
0.1UF
C221
R232
R205
6
T201
3
R202
J201
AIN CHE
LGE
22P F0.1U F-DN P
C201
0.1UF
0
0
R254
0.1UF
49.9
R258
CTE
R249
0-DN P
41
AVDD
ADT1-1WT +
52
CTE
0
GND E
R201
R203
49.9-DNP
LO- F
LOSW F
LIF
0-DN P
R209R20 6
C20 4
0
C202
0
10K-DN P
R243
R242
10K-DN P
R216
200
R217
1K-DN P
C207
0.1UF
C222
R262
R214
6
T20 2
3
C217
0
0.1UF-DN P
0
R221
R212
0-DN P
R211
J202
AIN CHF
C205
0.1UF
0
R259
49.9
0
CTF
R255
0-DN P
25
CTF
0
49.9-DNP
R210R228
LGFLGH
0.1UF-DN P
R215R2 18
22PF
C206C208
0.1UF
R250
0
10K-DN P
R204
AVDD
ADT1-1WT +
14
GNDF
R230
0
R238
R222
0-DN P
0
R244
10K-DN P
C218
0.1UF-DN P
0
0-DN P
Figure 76. Evaluation Board Schematic, DUT Analog Input Circuits (Continued)
Rev. A | Page 46 of 60
Page 47
AD9271
0
www.BDTIC.com/ADI
AVDD
VSENSE_DUT
SCLK_DUT
51
SCLK
2
1
AVDD
DRVDD_DUT
CHA
CHA
CHB
CHB
CHC
CHC
CHD
CHD
FCO
FCO
DCO
DCO
CHE
CHE
CHF
CHF
CHG
CHG
CHH
CHH
DRVDD_DUT
P303
1
2
P302
AVDD
50
PDWN
49
STDBY
48
DRVDD
47
DOUTA+
46
DOU TA-
45
DOUTB+
44
DOUTB-
43
42
DOUTC-
41
DOUTD+
40
DOUTD-
39
FCO+
38
FCO-
37
DCO+
36
DCO-
35
DOUTE+
34
DOUTE-
33
DOU TF+
32
DOU TF-
31
DOUTG+
30
DOUTG-
29
DOUTH+
28
DOUTH-
27
DRVDD
26
GAIN DRIVE INPUT
Reference Circuitry
1K
R309
U302
13
ADR510ARTZ
470K
R308
8.06K
R335
AVDD
J301
R303
0.1UF
R336
10K
R337
0-DNP
IN
GGND
49.9
R302
100
C308
0.1UF
C309
0.1UF
10K
R301
0.1UF
C301
4.7UF
C302
C 3 03C 3 04
V+TRIM/NC
V-
2
CW
R331
00
R304
LOSWD
LO-D
CWD0-
CWD0+
CWD1-
CWD1+
CWD2-
CWD2+
AVDD_3.3V
VSENSE_DUT
VREF_DUT
AVDD
CWD3-
CWD3+
CWD4-
CWD4+
CWD5-
CWD5+
LO-E
0.1UF
LOSWE
C305
0.1UF
LGD
LID
742
751
LIDLIE
LGDLGE
LOSWD
76
LO-D
77
CWD0-
78
CWD0+
79
CWD1-
80
CWD1+
81
CWD2-
82
CWD2+
83
CWVDDDOUTC+
84
GAIN-
85
GAIN+
86
RBIAS
87
SENSE
88
VREF
89
REFB
90
REFT
91
RAVDD
92
CWD3-
93
CWD3+
94
CWD4-
95
CWD4+
96
CWD5-
97
CWD5+
98
LO-E
99
LOSWE
100
PAD
101
R311
0-DNP
R310
10K
CW
C306
0.1UF
1UF
C307
LO-B
LGC
LO-C
LIC
LOSWC
AVDD
72
733
70
68
69
71
LIC
LGC
LO-C
AVDD
LOSWC
LOSWB
AVDD
66
67
64
63
65
LO-B
AVDD
AVDD
LOSWB
AD9271BSVZ-50
VREF_DUT
R312
DNP
R313
DNP
LIB
LGB
62
LIB
LGB
Vref Selec t
R315
AVDD
0-DNP
R316
0-DNP
R317
0
Remove C307 when
using external Vref
LO-A
AVDD
60
61
58
59
LO-A
AVDD
AVDD
Vref=0.5V(1+R313/R312)
AVDD
LGA
LIA
LOSWA
55
56
57
LIA
LGA
LOSWA
Vref = External
Vref=1V
CSB_DUT
R338
10K
AVDD
54
AVDD
AVDDAVDD
SDIO_DUT
1K
R319
52
SDIO
6304-088
1K
R326
AVDD
1K
R325
LO-F
LOSWF
AVDD
AVDDAVDD
LIF
4
5
6
U301
LIE
LGE
AVDD
7
LIF
LO-F
LOSWF
LO-G
LOSWG
AVDD
LGF
9
8
LGF
AVDD
LIG
AVDD
11
12
10
13
LIG
LO-G
LOSWG
Figure 77. Evaluation Board Schematic, DUT, VREF, and Gain Circuitry
Rev. A | Page 47 of 60
LGH
20
LGH
AVDD
21242353
22
AVDD
CLK-CSB
AVDD
25
CLK
CLK
AVDD
LO-H
LOSWH
AVDD
LGG
15
14
LGG
AVDD
LIH
AVDD
17
18
16
19
LIH
LO-H
LOSWH
CLK+
Page 48
AD9271
www.BDTIC.com/ADI
0
R439
R441
00R443
R445
0-DNP
R437
R436
0
R438
0-DNP
0-DNP
R440
S8
S7
S6
AD9515Pin-strapsettings
AVDD_3.3 V
AVDD_3.3 V
R425
R427
OPTIONAL CONNECTIO N
TO AD8339 EVAL BOARD
753
1
P405
246
8
CWD1-
CWD1+
CWD0-
CWD0+
560UH
L402
2
1
750
AVDD_2.5 V
AOUT
J403
J402
AOUT
R467
L401
560UH
2
1
L404
560UH
2
1
750
AVDD_2.5 V
R461
0-DNP
49.9
R458
R455
49.9
0-DNP
R459
R468
560UH
L403
2
1
CWD2
R463
00
R464
0.1UF
0.1UF
R462
R460
CWD1
R454
+5V
7
8
V+
OUT2
U402
-
-IN1
OUT1
C419C420
750
R453
00
R451
T402
AVDD_3.3V
CW DOPPLER CIRCUITRY
135
7
P406
864
2
CWD5-
CWD5+
CWD4-
CWD4+
750
1
750
R469
1
0.1UF
C422
750
-IN2
+IN2
+
AD822ART Z
+
V-
+IN 1
35261
4
-5V
0
R452
0
25
1
E402
0
R446
CWD2-
CWD2+
8
753
ION
CWD3-
CWD3+
ADTT4-1T +
61
127
R448
43
127
R447
246
1
P403
IOP
L408
560UH
2
1
R470
560UH
L407
2
1
560UH
L406
2
L405
560UH
2
C421
0.1UF
CWD2CWD1
R450
0
R465
0-DNP
AVDD_3.3 V
0
R424
0-DNP0
0-DNP
R426
S0
AVDD_3.3V
AVDD_3.3V
AVDD_2.5 V
C405
AVDD_2.5 V
OPTIONAL CLOCK DRIVE CIRCUI T
AVDD_3.3V
0
R466
R449
0-DNP
10K
R401
C401
0.1UF
Figure 78. Evaluation Board Schematic, Clock
AVDD_3.3 V
R429
00R4310R433
R428
0-DNP
R430
0-DNP
S3
S2
S1
AVDD_3.3V
AVDD_3.3V
CLK
CLK
LVPECLOUTPUT
C406
0.1UF-D NP
0.1UF-D NP
100
R422
232219
OUT0
33
GND_PAD
GND
31
VS
1
AVDD_3.3V
R414
4.12K
3
RSET
32
CLK
U401
2
10K
R410
R411
DNP
DNP
R408R409
0-DNP
R406
OPT_CLK
J401
ENABLE
DISABLE
1
2
1
TRI-
STAT E
OSC401
VC C
4
AVDD_3.3V
and CW Doppler Circuitry
0
R442
0-DNP
0-DNP
R444
S10
S9
AVDD_3.3 V
AVDD_3.3 V
R435
0
R434
0-DNP
0-DNP
R432
S4
S5
AVDD_3.3V
AVDD_3.3V
LVDSOUTPUT
C408
C407
240
R421R420
240
18
S0
25
OUT1
OUT0B
OUT1B
S1
16
S2
15
S3
14
S4
13
S5
12
S6
11
S7
10
SIGNAL=DNC;27,28
S8
9
S9
SIGNA L=AVDD_3.3V ;4,17,20,21,24,26,29,3 0
8
S10
AD9515BCPZ
7
VREF
6
CLKB
SYNCB
5
3
49.9-DN P
R413
10K
DNP
R412
R407
0-DNP
OPT_CLK
R402
10K
2
GN DOU T
3
VFAC3H -L-50MHZ
0.1UF-DNP
0.1UF-DNP
100
R423
AVDD_3.3 V
S0
S1
CLK
S2
S3
S4
S5
0.1UF
S6
C410
S7
S8
S9
S10
1
E401
R418
6
T401
3
R415
OPT_CLK
0.1UF
C402
0
R403
P401
ENC
CLIPSINE OUT(DEFAULT)
CR401
HSMS-281 2
2
3
1
0
25
0
49.9
R404
CLK
0.1UF
C409
0
R417
ADT1-1W+
14
0
R416
0.1UF
C403
P402
ENC
06304-089
0.1UF
C417C418
C416C415
0.1UF0.1UF
C414
0.1UF0.1UF
0.1UF0.1UF
C412C413
0.1UF
C411
OPT_CLK
R405
0
Rev. A | Page 48 of 60
Page 49
AD9271
www.BDTIC.com/ADI
SDO_CHA
SDI_CHA
SCLK_CH A
CSB1_CH A
1
E704
PWR_OUT
MH501
MH502
MH503
MH504
21
D705
S2A-TP
BOARD MOUNTING HOLE S
PopulateMH501-504for standardboard evaluation
S2A-TP
D704
12
21
D703
S2A-TP
PWR_IN
CR702
S2A-TP
D702
12
245
CG
CB
CG
BNX016-0 1
L701
BIAS
1
21
F701
NANOSMDC110 F
1
P701
6V, 2A ma x
Power Supply Input
AVDD_3.3V
SPI CIRCUITRY FROM FIFO
8
6
4
2
PopulateMH503-505fordockingwith AD8339EvalBoard
+3.3v
240
R716
GREEN
6
CG
PSG
3
2A
D701
C704
10UF
2
3
7.5VPOWER
2.5MMJACK
1K
R710
SDIO_DUT
SPI BUS DISCONNECT OPTION
7
5
3
1
J501
R712
AVDD
1K
NC7WZ07P 6X_N L
OPTIONALPOWERINPUT
R713
L703
P501
L501
P511
6543
Y1
A1
1
AVDD_3.3V
C710
0.1UF
10UF
C709
2
10UH
1
DUT_AVDD
3.3V_AVD D
12345
+5V
0.1UF
C502
C501
10UF
2
10UH
1
123
CW +/- 5V
POWER INPUT
1K
Y2A2
VCC
GND
2
10K
R711
+1.8v
AVDD
2
10UH
L702
1
DUT_DRVDD
6
Z5.531.3625. 0
-5V
2
L502
10UH
1
Z5.531.3325. 0
0.1UF
C702
6
Y1
NC7WZ16P 6X_N L
U702
A1
1234
MH505
+1.8v
DRVDD_DUT
C712
0.1UF
C708
C707
10UF
C504
0.1UF
10UF
C503
CSB_DUT
AVDD
SCLK_DUT
5
Y2A2
VCC
GND
0.1UF
10UF
C711
2
L704
10UH
1
C721
100PF
U706
C703
0.1UF
U703
10K
R715
10K
R714
1
E703
1
E702
1
E701
GND Test Points
C735
0.1UF0.1UF
C734
C733C732
0.1UF
C731
0.1UF0.1U F
0.1UF
C730
AVDD
AVDD_2.5 V
2
18
3
OUT
OUT
OUT
5
NR
ADP3335
IN
IN
7
ADP3335ACPZ -2. 5
AVDD_3.3 V
1
E708
1
E707
1
E706
1
E705
C748
0.1UF0.1UF
0.1UF0.1UF
C746C747
C745C74 4
0.1UF
AVDD
1UF
SDGND
64
1UF
C722C723
DUT_AVDD
2
L705
10UH
1UF
C715C714
1
4
OUTPUT4
GND
1
ADP3339AKCZ -1.8-R L
U707
INPUTOUTPUT1
32
AVDD_3.3 VDRVD D_DUT
3.3V_AVD D
2
L707
10UH
C720
1
4
23
OUTPUT4
ADP3339AKCZ -3.3-R L
U705
INPUTOUTPUT1
PWR_IN
C719
DUT_DRVDD
2
10UH
L706
C717
1
4
OUTPUT4
ADP3339AKCZ -1.8-R L
U704
INPUTOUTPUT1
32
06304-090
C743
0.1UF
C742
0.1UF
0.1UF
C751
0.1UF
C740
GND
1
1UF1UF
1UF
GND
1
Figure 79. Evaluation Board Schematic, Pow
er Supply and SPI Interface Circuitry
Rev. A | Page 49 of 60
PWR_OUT
1UF
PWR_OUT
1UF
C716
Page 50
AD9271
A
www.BDTIC.com/ADI
Digital Outputs
FIFO5: DATA BUS 1 CONNECTORFIFO5: HS - SERIAL/SPI/AUX CONNECTOR
THE PACKAGE HAS A CONDUCTIVE HE AT SLUG TO HELP DISSIPATE HEAT AND ENSURE RELIABL E OPER ATION OF
THE DEVICE O VER THE FULL INDUSTRIAL TEMPERATURE RANGE. THE SL UG IS EX POSED ON T HE BOTTOM OF
THE PACKAGE AND ELECTRICAL LY CONNECTED TO CHIP GRO UND. IT I S RECOMMENDED THAT NO PCB SIGNAL
TRACES OR VI AS BE LOCATED UNDER THE PACKAGE TH AT COULD COME IN CONTACT WITH THE CONDUCTIVE
SLUG. ATTACHING THE SLUG TO A GROUND PLANE WI LL REDUCE THE JUNCTIO N TEMPER ATURE OF THE
DEVICE WHI CH MAY BE BENEFICIAL IN HIG H TEMPERATURE ENVIRONMENTS.
0°
0.08 MAX
COPLANARIT Y
25
2650
VIEW A
COMPLIANT TO JEDEC STANDARDS MS-026-AED-HD
51
51
EXPOSED
BOTTOM VIEW
0.50 BSC
LEAD PITCH
PAD
(PINS UP)
0.27
0.22
0.17
9.50 SQ
25
2650
080706-A
Figure 87. 100-Lead Thin Quad Flat Packag
e, Exposed Pad [TQFP_EP]
(SV-100-3)
Dimensions shown in millimeters
Temperature
R
ange Package Descri
ption
Package
Op
tion
−40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP_EP] SV-100-3
−40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP_EP] Tape and Reel SV-100-3
−40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP_EP] SV-100-3
−40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP_EP] Tape and Reel SV-100-3
−40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP_EP] SV-100-3
−40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP_EP] Tape and Reel SV-100-3
Evaluation Board