Datasheet AD9257 Datasheet (ANALOG DEVICES)

Page 1
Octal, 14-Bit, 40/65 MSPS, Serial LVDS,
A
V
Data Sheet

FEATURES

Low power: 55 mW per channel at 65 MSPS with scalable
power options SNR = 75.5 dB (to Nyquist) SFDR = 91.6 dBc (to Nyquist) DNL = ±0.6 LSB (typical), INL = ±1.1 LSB (typical) Serial LVDS (ANSI-644, default)
Low power, reduced signal option (similar to IEEE 1596.3) Data and frame clock outputs 650 MHz full power analog bandwidth 2 V p-p input voltage range
1.8 V supply operation Serial port control
Full chip and individual channel power-down modes
Flexible bit orientation
Built-in and custom digital test pattern generation
Programmable clock and data alignment
Programmable output resolution
Standby mode

APPLICATIONS

Medical imaging and nondestructive ultrasound Portable ultrasound and digital beam-forming systems Quadrature radio receivers Diversity radio receivers Optical networking Test equipment
1.8 V Analog-to-Digital Converter
AD9257

FUNCTIONAL BLOCK DIAGRAM

DD
VIN+ A VIN– A
VIN+ B VIN– B
VIN+ C VIN– C
VIN+ D VIN– D
VIN+ E VIN– E
VIN+ F VIN– F
VIN+ G VIN– G
VIN+ H VIN– H
VREF
SENSE
VCM
SYNC
AD9257
REF
SELECT
RBIAS AGND CSB CLK+ CLK–SDIO/
PDWN DRVDD
14
ADC
14
ADC
14
ADC
14
ADC
14
ADC
14
ADC
14
ADC
14
ADC
1.0V
SERIAL PORT
INTERFACE
DFS
Figure 1.
SERIAL
LVD S
SERIAL
LVD S
SERIAL
LVD S
SERIAL
LVD S
SERIAL
LVD S
SERIAL
LVD S
SERIAL
LVD S
SERIAL
LVD S
SCLK/
DTP
DATA RATE
MULTIPLIER
D+ A D– A
D+ B D– B
D+ C D– C
D+ D D– D
D+ E D– E
D+ F D– F
D+ G D– G
D+ H D– H
FCO+ FCO–
DCO+ DCO–
10206-001

GENERAL DESCRIPTION

The AD9257 is an octal, 14-bit, 40 MSPS and 65 MSPS analog­to-digital converter (ADC) with an on-chip sample-and-hold circuit designed for low cost, low power, small size, and ease of use. The product operates at a conversion rate of up to 65 MSPS and is optimized for outstanding dynamic performance and low power in applications where a small package size is critical.
The ADC requires a single 1.8 V power supply and LVPECL-/ CMOS-/LVDS-compatible sample rate clock for full performance operation. No external reference or driver components are required for many applications.
The ADC automatically multiplies the sample rate clock for the appropriate LVDS serial data rate. A data clock output (DCO) for capturing data on the output and a frame clock output (FCO) for signaling a new output byte are provided. Individual channel power-down is supported and typically consumes less than 2 mW when all channels are disabled.
The ADC contains several features designed to maximize flexibility and minimize system cost, such as programmable clock and data
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
alignment and programmable digital test pattern generation. The available digital test patterns include built-in deterministic and pseudorandom patterns, along with custom user-defined test patterns entered via the serial port interface (SPI).
The AD9257 is available in an RoHS-compliant, 64-lead LFCSP. It is specified over the industrial temperature range of −40°C to +85°C. This product is protected by a U.S. patent.

PRODUCT HIGHLIGHTS

1. Small Footprint. Eight ADCs are contained in a small,
space-saving package.
2. Low Power of 55 mW/Channel at 65 MSPS with Scalable
Power Options.
3. Ease of Use. A data clock output (DCO) is provided that
operates at frequencies of up to 455 MHz and supports double data rate (DDR) operation.
4. User Flexibility. The SPI control offers a wide range of
flexible features to meet specific system requirements.
5. Pin Compatible with the AD9637 (12-Bit Octal ADC).
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2011 Analog Devices, Inc. All rights reserved.
Page 2
AD9257 Data Sheet

TABLE OF CONTENTS

Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Product Highlights ........................................................................... 1
Table of Contents .............................................................................. 2
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
DC Specifications ......................................................................... 3
AC Specifications .......................................................................... 4
Digital Specifications ................................................................... 5
Switching Specifications .............................................................. 6
Timing Specifications .................................................................. 6
Absolute Maximum Ratings ............................................................ 8
Thermal Characteristics .............................................................. 8
ESD Caution .................................................................................. 8
Pin Configuration and Function Descriptions ............................. 9
Typical Performance Characteristics ........................................... 11
AD9257-65 .................................................................................. 11
AD9257-40 .................................................................................. 14
Equivalent Circuits ......................................................................... 17
Theory of Operation ...................................................................... 18
Analog Input Considerations .................................................... 18
Voltage Reference ....................................................................... 19
Clock Input Considerations ...................................................... 20
Power Dissipation and Power-Down Mode ........................... 22
Digital Outputs and Timing ..................................................... 23
Built-In Output Test Modes .......................................................... 27
Output Test Modes ..................................................................... 27
Serial Port Interface (SPI) .............................................................. 28
Configuration Using the SPI ..................................................... 28
Hardware Interface ..................................................................... 29
Configuration Without the SPI ................................................ 29
SPI Accessible Features .............................................................. 29
Memory Map .................................................................................. 30
Reading the Memory Map Register Table ............................... 30
Memory Map Register Table ..................................................... 31
Memory Map Register Descriptions ........................................ 34
Applications Information .............................................................. 36
Design Guidelines ...................................................................... 36
Power and Ground Recommendations ................................... 36
Exposed Pad Thermal Heat Slug Recommendations ............ 36
VCM ............................................................................................. 36
Reference Decoupling ................................................................ 36
SPI Port ........................................................................................ 36
Outline Dimensions ....................................................................... 37
Ordering Guide .......................................................................... 37

REVISION HISTORY

10/11—Revision 0: Initial Version
Rev. 0 | Page 2 of 40
Page 3
Data Sheet AD9257

SPECIFICATIONS

DC SPECIFICATIONS

AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted.
Table 1.
AD9257-40 AD9257-65
Parameter1 Temp
RESOLUTION 14 14 Bits ACCURACY
No Missing Codes Full Guaranteed Guaranteed Offset Error Full −0.6 −0.3 +0.1 −0.7 −0.3 +0.1 % FSR Offset Matching Full 0 0.2 0.6 0 0.23 0.6 % FSR Gain Error Full −6.0 −2.1 2.0 −6.0 −2.9 +1.0 % FSR Gain Matching Full −1.0 +1.7 +5.0 −1.0 +1.6 +5.0 % FSR Differential Nonlinearity (DNL) Full −1.0 −0.5/+0.8 +1.7 −1.0 ±0.6 +1.6 LSB Integral Nonlinearity (INL) Full −3.1 ±1.1 +3.1 −4.0 ±1.1 +4.0 LSB
TEMPERATURE DRIFT
Offset Error Full ±2 ±2 ppm/°C
INTERNAL VOLTAGE REFERENCE
Output Voltage (1 V Mode) Full 0.98 0.99 1.01 0.98 0.99 1.01 V Load Regulation at 1.0 mA (V
= 1 V) Full 2 2 mV
REF
Input Resistance Full 7.5 7.5
INPUT-REFERRED NOISE
V
= 1.0 V 25°C 0.94 0.94 LSB rms
REF
ANALOG INPUTS
Differential Input Voltage (V
= 1 V) Full 2 2 V p-p
REF
Common-Mode Voltage Full 0.9 0.9 V Differential Input Resistance 5.2 5.2 kΩ Differential Input Capacitance Full 3.5 3.5 pF
POWER SUPPLY
AVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 V DRVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 V I
Full 147 156 198 211 mA
AVDD
I
(ANSI-644 Mode) Full 53 85 60 93 mA
DRVDD
I
(Reduced Range Mode) 25°C 38 45 mA
DRVDD
TOTAL POWER CONSUMPTION
Total Power Dissipation (Four Channels, ANSI-644
Full 360 434 464 547 mW
Mode)
Total Power Dissipation (Four Channels, Reduced
25°C 333 437 mW
Range Mode) Power-Down Dissipation 25°C 1 1 mW Standby Dissipation2 25°C 74 92 mW
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Can be controlled via the SPI.
Min Typ Max Min Typ Max Unit
Rev. 0 | Page 3 of 40
Page 4
AD9257 Data Sheet

AC SPECIFICATIONS

AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted.
Table 2.
AD9257-40 AD9257-65
Parameter1 Temp
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 9.7 MHz 25°C 75.9 75.7 dBFS fIN = 19.7 MHz Full 73.5 75.8 73.3 75.6 dBFS fIN = 30.5 MHz 25°C 75.7 75.5 dBFS fIN = 63.5 MHz 25°C 74.9 dBFS fIN = 69.5 MHz 25°C 74.7 dBFS fIN = 123.4 MHz 25°C 73.2 dBFS
SIGNAL-TO-NOISE AND DISTORTION RATIO (SINAD)
fIN = 9.7 MHz 25°C 74.8 74.7 dBFS fIN = 19.7 MHz Full 72.5 74.7 72.0 74.6 dBFS fIN = 30.5 MHz 25°C 74.6 74.4 dBFS fIN = 63.5 MHz 25°C 73.8 dBFS fIN = 69.5 MHz 25°C 73.5 dBFS fIN = 123.4 MHz 25°C 71.8 dBFS
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 9.7 MHz 25°C 12.1 12.1 Bits fIN = 19.7 MHz Full 11.7 12.1 11.7 12.1 Bits fIN = 30.5 MHz 25°C 12.1 12.1 Bits fIN = 63.5 MHz 25°C 12.0 Bits fIN = 69.5 MHz 25°C 11.9 Bits fIN = 123.4 MHz 25°C 11.6 Bits
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 9.7 MHz 25°C 97 96 dBc fIN = 19.7 MHz Full 80 95 79 96 dBc fIN = 30.5 MHz 25°C 97 91 dBc fIN = 63.5 MHz 25°C 95 dBc fIN = 69.5 MHz 25°C 87 dBc fIN = 123.4 MHz 25°C 83 dBc
WORST HARMONIC (SECOND OR THIRD)
fIN = 9.7 MHz 25°C −99 −99 dBc fIN = 19.7 MHz Full −96 −80 −98 −79 dBc fIN = 30.5 MHz 25°C −100 −91 dBc fIN = 63.5 MHz 25°C −98 dBc fIN = 69.5 MHz 25°C −87 dBc fIN = 123.4 MHz 25°C −83 dBc
WORST OTHER (EXCLUDING SECOND OR THIRD)
fIN = 9.7 MHz 25°C −99 −98 dBFS fIN = 19.7 MHz Full −99 −86 −98 −88 dBFS fIN = 30.5 MHz 25°C −99 −98 dBFS fIN = 63.5 MHz 25°C −98 dBFS fIN = 69.5 MHz 25°C −98 dBFS fIN = 123.4 MHz 25°C −94 dBFS
TWO-TONE INTERMODULATION DISTORTION (IMD)—AIN1
AND AIN2 = −7.0 dBFS f
= 8 MHz, f
IN1
f
= 30 MHz, f
IN1
= 10 MHz 25°C 95 dBc
IN2
= 32 MHz 25°C 92 dBc
IN2
Unit Min Typ Max Min Typ Max
Rev. 0 | Page 4 of 40
Page 5
Data Sheet AD9257
AD9257-40 AD9257-65
Parameter1 Temp
CROSSTALK 25°C −100 −98 dB
Crosstalk (Overrange Condition)2 25°C −92 −94 dB
ANALOG INPUT BANDWIDTH, FULL POWER 25°C 650 650 MHz
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Overrange condition is specified with 3 dB of the full-scale input range.

DIGITAL SPECIFICATIONS

AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted.
Table 3.
Parameter1 Temp Min Typ Max
CLOCK INPUTS (CLK+, CLK−)
Logic Compliance CMOS/LVDS/LVPECL Differential Input Voltage2 Full 0.2 3.6 V p-p Input Voltage Range Full AGND − 0.2 AVDD + 0.2 V Input Common-Mode Voltage Full 0.9 V Input Resistance (Differential) 25°C 15 kΩ Input Capacitance 25°C 4 pF
LOGIC INPUTS (PDWN, SYNC, SCLK)
Logic 1 Voltage Full 1.2 AVDD + 0.2 V Logic 0 Voltage Full 0 0.8 V Input Resistance 25°C 30 kΩ Input Capacitance 25°C 2 pF
LOGIC INPUT (CSB)
Logic 1 Voltage Full 1.2 AVDD + 0.2 V Logic 0 Voltage Full 0 0.8 V Input Resistance 25°C 26 kΩ Input Capacitance 25°C 2 pF
LOGIC INPUT (SDIO)
Logic 1 Voltage Full 1.2 AVDD + 0.2 V Logic 0 Voltage Full 0 0.8 V Input Resistance 25°C 26 kΩ Input Capacitance 25°C 5 pF
LOGIC OUTPUT (SDIO)3
Logic 1 Voltage (IOH = 800 μA) Full 1.79 V Logic 0 Voltage (IOL = 50 μA) Full 0.05 V
DIGITAL OUTPUTS (D± x), ANSI-644
Logic Compliance LVDS Differential Output Voltage (VOD) Full 247 350 454 mV Output Offset Voltage (VOS) Full 1.13 1.21 1.38 V Output Coding (Default) Twos complement
DIGITAL OUTPUTS (D± x), LOW POWER, REDUCED SIGNAL
OPTION Logic Compliance LVDS Differential Output Voltage (VOD) Full 150 200 250 mV Output Offset Voltage (VOS) Full 1.13 1.21 1.38 V Output Coding (Default) Twos complement
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
This is specified for LVDS and LVPECL only.
3
This is specified for 13 SDIO/DFS pins sharing the same connection.
Unit Min Typ Max Min Typ Max
Unit
Rev. 0 | Page 5 of 40
Page 6
AD9257 Data Sheet

SWITCHING SPECIFICATIONS

AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted.
Table 4.
Parameter
1, 2
Temp Min Typ Max Unit
CLOCK3
Input Clock Rate Full 10 520 MHz Conversion Rate Full 10 40/65 MSPS Clock Pulse Width High (tEH) Full 12.5/7.69 ns Clock Pulse Width Low (tEL) Full 12.5/7.69 ns
OUTPUT PARAMETERS3
Propagation Delay (tPD) Full 2.3 ns Rise Time (tR) (20% to 80%) Full 300 ps Fall Time (tF) (20% to 80%) Full 300 ps FCO Propagation Delay (t DCO Propagation Delay (t DCO to Data Delay (t
DATA
DCO to FCO Delay (t Data to Data Skew
DATA-MAX
− t
DATA-MIN
(t
) Full 1.5 2.3 3.1 ns
FCO
)4 Full t
CPD
)4 Full (t
)4 Full (t
FRAME
/28) − 300 (t
SAMPLE
/28) − 300 (t
SAMPLE
+ (t
FCO
SAMPLE
/28) (t
SAMPLE
/28) (t
SAMPLE
/28) ns
/28) + 300 ps
SAMPLE
/28) + 300 ps
SAMPLE
Full ±50 ±200 ps
) Wake-Up Time (Standby) 25°C 35 μs Wake-Up Time (Power-Down)5 25°C 375 μs Pipeline Latency Full 16
Clock cycles
APERTURE
Aperture Delay (tA) 25°C 1 ns Aperture Uncertainty (Jitter) 25°C 0.1 ps rms Out-of-Range Recovery Time 25°C 1
Clock cycles
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Measured on standard FR-4 material.
3
Can be adjusted via the SPI.
4
t
/28 is based on the number of bits divided by 2 because the delays are based on half duty cycles. t
SAMPLE
5
Wake-up time is defined as the time required to return to normal operation from power-down mode.
SAMPLE
= 1/fS.

TIMING SPECIFICATIONS

Table 5.
Parameter Description Limit
SYNC TIMING REQUIREMENTS
t
SYNC to rising edge of CLK+ setup time 0.24 ns typ
SSYNC
t
SYNC to rising edge of CLK+ hold time 0.40 ns typ
HSYNC
SPI TIMING REQUIREMENTS See Figure 61
tDS Setup time between the data and the rising edge of SCLK 2 ns min tDH Hold time between the data and the rising edge of SCLK 2 ns min t
Period of the SCLK 40 ns min
CLK
tS Setup time between CSB and SCLK 2 ns min tH Hold time between CSB and SCLK 2 ns min t
SCLK pulse width high 10 ns min
HIGH
t
SCLK pulse width low 10 ns min
LOW
t
EN_SDIO
Time required for the SDIO pin to switch from an input to an output
10 ns min
relative to the SCLK falling edge (not shown in Figure 61)
t
DIS_SDIO
Time required for the SDIO pin to switch from an output to an input
10 ns min
relative to the SCLK rising edge (not shown in Figure 61)
Rev. 0 | Page 6 of 40
Unit
Page 7
Data Sheet AD9257

Timing Diagrams

N – 1
VIN± x
CLK–
CLK+
DCO–
DCO+
FCO–
FCO+
D– x
D+ x
t
A
t
EH
t
CPD
t
FCO
t
PD
MSB
N – 17
t
FRAME
D12
N – 17
D11
D10
N – 17
N – 17D9N – 17D8N – 17D7N – 17D6N – 17D5N – 17D4N – 17D3N – 17D2N – 17
t
DATA
t
EL
N
D0
D1
N – 17
N – 17
MSB
N – 16
D12
N – 16
10206-002
Figure 2. Word-Wise DDR,1× Frame, 14-Bit Output Mode (Default)
N – 1
VIN± x
t
A
N
CLK–
CLK+
DCO–
DCO+
FCO–
FCO+
D– x
D+ x
t
EH
t
CPD
t
FCO
t
PD
t
FRAME
MSB
D10
N – 17
N – 17D9N – 17D8N – 17D7N – 17D6N – 17D5N – 17D4N – 17D3N – 17D2N – 17D1N – 17D0N – 17
t
EL
t
DATA
D10
MSB
N – 16
N – 16
10206-003
Figure 3. Word-Wise DDR, 1× Frame, 12-Bit Output Mode
CLK+
t
SSYNC
t
HSYNC
SYNC
Figure 4. SYNC Input Timing Requirements
Rev. 0 | Page 7 of 40
10206-004
Page 8
AD9257 Data Sheet

ABSOLUTE MAXIMUM RATINGS

Table 6.
Parameter Rating Electrical
AVDD to AGND −0.3 V to +2.0 V DRVDD to AGND −0.3 V to +2.0 V Digital Outputs
−0.3 V to +2.0 V (D± x, DCO+, DCO−, FCO+, FCO−) to AGND
CLK+, CLK− to AGND −0.3 V to +2.0 V VIN+ x, VIN− x to AGND −0.3 V to +2.0 V SCLK/DTP, SDIO/DFS, CSB to AGND −0.3 V to +2.0 V SYNC, PDWN to AGND −0.3 V to +2.0 V RBIAS to AGND −0.3 V to +2.0 V VREF, SENSE to AGND −0.3 V to +2.0 V
Environmental
Operating Temperature Range (Ambient) −40°C to +85°C Maximum Junction Temperature 150°C Lead Temperature (Soldering, 10 sec) 300°C Storage Temperature Range (Ambient) −65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

THERMAL CHARACTERISTICS

The exposed paddle must be soldered to the ground plane for the LFCSP package. Soldering the exposed paddle to the PCB increases the reliability of the solder joints and maximizes the thermal capability of the package.
Table 7. Thermal Resistance
Airflow Velocity
Package Type
64-Lead LFCSP 9 mm × 9 mm (CP-64-4)
1
Per JEDEC 51-7, plus JEDEC 25-5 2S2P test board.
2
Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air).
3
Per MIL-Std 883, Method 1012.1.
4
Per JEDEC JESD51-8 (still air).
(m/sec) θ
0 22.3 1.4 N/A 0.1 °C/W
1.0 19.5 N/A 11.8 0.2 °C/W
2.5 17.5 N/A N/A 0.2 °C/W
1, 2
JA
θ
JC
1, 3
θ
1, 4
JB
Ψ
1, 2
Unit
JT
Typical θJA is specified for a 4-layer PCB with a solid ground plane. As shown Tabl e 7, airflow improves heat dissipation, which reduces θ
. In addition, metal in direct contact with the
JA
package leads from metal traces, through holes, ground, and power planes reduces θ
.
JA

ESD CAUTION

Rev. 0 | Page 8 of 40
Page 9
Data Sheet AD9257

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

VIN+ F
VIN– F
AVD D
VIN– E
VIN+ E
AVD D
SYNC
VCM
VREF
SENSE
RBIAS
VIN+ D
VIN– D
AVD D
VIN– C
VIN+ C
49
AVD D
48
VIN+ B
47
VIN– B
46
AVD D
45
VIN– A
44
VIN+ A
43
AVD D
42
PDWN
41
CSB
40
SDIO/DFS
39
SCLK/DTP
38
AVD D
37
DNC
36
DRVDD
35
D+ A
34
D– A
33
PIN 1
INDICATOR
AVD D VIN+ G VIN– G
AVD D VIN– H VIN+ H
AVD D
AVD D
CLK–
CLK+ AVD D AVD D
DNC
DRVDD
D– H
D+ H
646362616059585756555453525150
1 2 3 4 5 6 7 8
9 10 11 12 13 14 15 16
AD9257
TOP VIEW
(Not to Scale)
171819202122232425262728293031
D– F
D+ F
D– E
D– G
NOTES
1. DNC = DO NOT CONNECT. DO NOT CONNECT TO THIS PIN.
2. THE EXPOSED PAD MUST BE CONNECTED TO ANALOG GROUND.
D+ E
D+ G
D– D
FCO–
FCO+
DCO–
DCO+
32
D– C
D– B
D+ D
D+ C
D+ B
10206-005
Figure 5. Pin Configuration, Top View
Table 8. Pin Function Descriptions
Pin No. Mnemonic Description
0, EP AGND, Exposed Pad
Analog Ground, Exposed Pad. The exposed thermal pad on the bottom of the package provides the analog ground for the part. This exposed pad must be connected to ground for proper operation.
1, 4, 7, 8, 11, 12, 37,
AVDD 1.8 V Analog Supply.
42, 45, 48, 51, 59, 62 13, 36 DNC Do Not Connect. 14, 35 DRVDD 1.8 V Digital Output Driver Supply. 2, 3 VIN+ G, VIN− G ADC G Analog Input True, ADC G Analog Input Complement. 5, 6 VIN− H, VIN+ H ADC H Analog Input Complement, ADC H Analog Input True. 9, 10 CLK−, CLK+ Input Clock Complement, Input Clock True. 15, 16 D− H, D+ H ADC H Digital Output Complement, ADC H Digital Output True. 17, 18 D− G, D+ G ADC G Digital Output Complement, ADC G Digital Output True. 19, 20 D− F, D+ F ADC F Digital Output Complement, ADC F Digital Output True. 21, 22 D− E, D+ E ADC E Digital Output Complement, ADC E Digital Output True. 23, 24 DCO−, DCO+ Data Clock Digital Output Complement, Data Clock Digital Output True. 25, 26 FCO−, FCO+ Frame Clock Digital Output Complement, Frame Clock Digital Output True. 27, 28 D− D, D+ D ADC D Digital Output Complement, ADC D Digital Output True. 29, 30 D− C, D+ C ADC C Digital Output Complement, ADC C Digital Output True. 31, 32 D− B, D + B ADC B Digital Output Complement, ADC B Digital Output True. 33, 34 D− A, D+ A ADC A Digital Output Complement, ADC A Digital Output True. 38 SCLK/DTP Serial Clock (SCLK)/Digital Test Pattern (DTP). 39 SDIO/DFS Serial Data Input/Output (SDIO)/Data Format Select (DFS). 40 CSB Chip Select Bar. 41 PDWN Power-Down. 43, 44 VIN+ A, VIN− A ADC A Analog Input True, ADC A Analog Input Complement. 46, 47 VIN− B, VIN+ B ADC B Analog Input Complement, ADC B Analog Input True. 49, 50 VIN+ C, VIN− C ADC C Analog Input True, ADC C Analog Input Complement. 52, 53 VIN− D, VIN+ D ADC D Analog Input Complement, ADC D Analog Input True.
Rev. 0 | Page 9 of 40
Page 10
AD9257 Data Sheet
Pin No. Mnemonic Description
54 RBIAS Sets analog current bias. Connect to 10 kΩ (1% tolerance) resistor to ground. 55 SENSE Reference Mode Selection. 56 VREF Voltage Reference Input/Output. 57 VCM Analog Output Voltage at Midsupply. Sets common mode of the analog inputs. 58 SYNC Digital Input. SYNC input to clock divider. 30 kΩ internal pull-down. 60, 61 VIN+ E, VIN− E ADC E Analog Input True, ADC E Analog Input Complement. 63, 64 VIN− F, VIN+ F ADC F Analog Input Complement, ADC F Analog Input True.
Rev. 0 | Page 10 of 40
Page 11
Data Sheet AD9257

TYPICAL PERFORMANCE CHARACTERISTICS

AD9257-65

0
–15
–30
–45
–60
–75
–90
AMPLITUDE ( d BFS)
–105
–120
–135
3
6 9 12 15 18 21 24 27 30
FREQUENCY (MHz)
65MSPS
9.7MHz AT –1d BFS SNR = 74.7dB ( 75.7dBFS) SFDR = 93.5d Bc
Figure 6. Single-Tone 16k FFT with fIN = 9.7 MHz, f
SAMPLE
10206-006
= 65 MSPS
0
65MSPS
19.7MHz AT –1dBFS
–15
SNR = 74.7dB (75. 7dBFS) SFDR = 96.7dBc
–30
–45
–60
–75
–90
AMPLITUDE (dBFS)
–105
–120
–135
6 9 12 15 18 21 24 27 30
3
FREQUENCY (MHz)
Figure 9. Single-Tone 16k FFT with fIN = 19.7 MHz, f
SAMPLE
10206-009
= 65 MSPS
0
–15
–30
–45
–60
–75
–90
AMPLITUDE ( d BFS)
–105
–120
–135
3
6 9 12 15 18 21 24 27 30
FREQUENCY (MHz)
Figure 7. Single-Tone 16k FFT with f
0
–15
–30
–45
–60
–75
–90
AMPLIT UDE ( dBFS)
F2 – F1
F1 + F2
–105
–120
–135
6 9 12 15 18 21 24 27 30
3
FREQUENCY ( MHz)
Figure 8. Two-Tone 16k FFT with f
f
= 65 MSPS
SAMPLE
65MSPS
63.5MHz AT –1d BFS SNR = 73.9dB ( 74.9dBFS) SFDR = 95.4d Bc
= 63.5 MHz, f
IN
= 30 MHz and f
IN1
SAMPLE
2F2 + F 1
2F2 – F1
2F1 + F 2
2F1–F2
= 32 MHz,
IN2
= 65 MSPS
0
65MSPS
30.5MHz AT –1dBFS
–15
SNR = 74.7dB (75. 7dBFS) SFDR = 96.7dBc
–30
–45
–60
–75
–90
AMPLITUDE (dBFS)
–105
–120
–135
10206-007
Figure 10. Single-Tone 16k FFT with f
0
–15
–30
–45
–60
–75
–90
AMPLITUDE ( d BFS)
–105
–120
–135
10206-008
Figure 11. Single-Tone 16k FFT with fIN = 123.4 MHz, f
6 9 12 15 18 21 24 27 30
3
3
FREQUENCY (MHz)
= 30.5 MHz, f
IN
65MSPS
123.4MHz AT –1dBFS SNR = 72.2dB ( 73.2dBFS) SFDR = 83.0d Bc
6 9 12 15 18 21 24 27 30
FREQUENCY (MHz)
SAMPLE
SAMPLE
= 65 MSPS
= 65 MSPS
10206-109
10206-010
Rev. 0 | Page 11 of 40
Page 12
AD9257 Data Sheet
0
105
–20
SFDR (dBc)
–40
–60
–80
SFDR/IMD3 (dBc/dBFS)
–100
–120
–90 –78 –66 –54 –42 –6–18–30
IMD3 (dBc)
SFDR (dBFS)
IMD3 (dBFS)
INPUT AMPLITUDE (dBFS)
Figure 12. Two-Tone SFDR/IMD3 vs. Input Amplitude (AIN) with
= 30 MHz and f
f
IN1
120
100
80
60
40
SNR/SFDR (dBFS/dBc)
20
0 –90 –80 –70 –60 –50 –40 –30 –20 –10
Figure 13. SNR/SFDR vs. Analog Input Level, f
= 32 MHz, f
IN2
SFDRFS
SNRFS
SFDR
SNR
INPUT AMPLITUDE (dBFS)
SAMPLE
IN
= 65 MSPS
= 9.7 MHz, f
SAMPLE
10206-011
0
10206-012
= 65 MSPS
100
SFDR (dBc)
95
90
85
SNR/SFDR (dBFS/dBc)
80
SNR (dBFS)
75
70
–40 85
Figure 15. SNR/SFDR vs. Temperature, f
110
100
90
80
70
60
50
40
SNR/SFDR (dBF S/dBc)
30
20
10
0
0 200
–15 10 35 60
Figure 16. SNR/SFDR vs. f
TEMPERATURE (°C)
IN
SFDR (dBc)
SNR (dBFS)
INPUT FREQUENCY (MHz)
100 120 1408020 40 60 180160
, f
IN
= 9.7 MHz, f
SAMPLE
= 65 MSPS
SAMPLE
= 65 MSPS
10206-014
10206-015
105
100
95
90
85
SNR/SFDR (dBFS/dBc)
80
75
70
20 30 40 50 60
Figure 14. SNR/SFDR vs. Encode, f
SFDR
SNRFS
SAMPLE FREQUENCY (MSPS)
= 19.7 MHz
IN
10206-013
Rev. 0 | Page 12 of 40
105
100
95
90
85
SNR/SFDR (dBFS/dBc)
80
75
70
20 30 40 50 60
Figure 17. SNR/SFDR vs. Encode, f
SFDR
SNRFS
SAMPLE FREQUENCY (MSPS)
= 30.5 MHz
IN
10206-016
Page 13
Data Sheet AD9257
450,000
400,000
350,000
300,000
250,000
200,000
NUMBER OF HI TS
150,000
100,000
50,000
0
N – 9
N – 8
N – 7
N – 6
N – 5
N – 4
N – 3
N – 2
N – 10
N – 1
OUTPUT CO DE
Figure 18. Input-Referred Noise Histogram, f
0.936 LSB RMS
N
N + 1
N + 2
N + 3
N + 4
N + 5
N + 6
N + 7
N + 8
N + 9
N + 10
10206-017
= 65 MSPS
SAMPLE
1.0
0.8
0.6
0.4
0.2
0
DNL (LSB)
–0.2
–0.4
–0.6
–0.8
–1.0
0
1500
3000
Figure 20. DNL, f
6000
4500
OUTPUT CODE
= 9.7 MHz, f
IN
7500
9000
10500
12000
13500
15000
16500
10206-019
= 65 MSPS
SAMPLE
2.0
1.6
1.2
0.8
0.4
INL (LSB)
–0.4
–0.8
–1.2
–1.6
–2.0
0
0
Figure 19. INL, f
1500
3000
6000
4500
OUTPUT CODE
= 9.7 MHz, f
IN
7500
9000
10500
12000
13500
15000
16500
10206-018
= 65 MSPS
SAMPLE
Rev. 0 | Page 13 of 40
Page 14
AD9257 Data Sheet

AD9257-40

0
–15
–30
–45
–60
–75
–90
AMPLITUDE ( d BFS)
–105
–120
–135
2
4 6 8 10 12 14 16 18
FREQUENCY (MHz)
40MSPS
9.7MHz AT –1d BFS SNR = 74.8dB ( 75.8dBFS) SFDR = 96.9d Bc
Figure 21. Single-Tone 16k FFT with fIN = 9.7 MHz, f
SAMPLE
10206-020
= 40 MSPS
0
–15
–30
–45
–60
–75
–90
AMPLITUDE ( d BFS)
–105
–120
–135
2 4 6 8 10 12 14 16 18
FREQUENCY (MHz)
40MSPS
19.7MHz AT –1dB FS SNR = 74.9dB (75.9dBFS) SFDR = 94.6dBc
Figure 24. Single-Tone 16k FFT with fIN = 19.7 MHz, f
SAMPLE
10206-023
= 40 MSPS
0
–15
–30
–45
–60
–75
–90
AMPLITUDE ( d BFS)
–105
–120
–135
2 4 6 8 10 12 14 16 18
FREQUENCY (MHz)
40MSPS
30.5MHz AT –1d BFS SNR = 74.6dB ( 75.6dBFS) SFDR = 98.8d Bc
Figure 22. Single-Tone 16k FFT with fIN = 30.5 MHz, f
0
–15
–30
–45
–60
–75
–90
AMPLIT UDE ( dBFS)
–105
–120
–135
F2 – F1 2F2 – F1
2 4 6 8 10 12 14 16 18
Figure 23. Two-Tone 16k FFT with f
+
FREQUENCY ( MHz)
IN1
= 40 MSPS
f
SAMPLE
2F1 + F2
2F1 – F2
= 8 MHz and f
SAMPLE
2F2 + F1
= 40 MSPS
F1 + F2
= 10 MHz,
IN2
0
–15
–30
–45
–60
–75
–90
AMPLITUDE ( d BFS)
–105
–120
–135
10206-021
2 4 6 8 10 12 14 16 18
FREQUENCY (MHz)
Figure 25. Single-Tone 16k FFT with fIN = 69.5 MHz, f
0
–20
SFDR (dBc)
–40
–60
–80
SFDR/IMD3 (dBc/dBFS)
–100
–120
–90 –78 –66 –54 –42 –6–18–30
10206-022
IMD3 (dBc)
SFDR (dBFS)
IMD3 (dBF S )
INPUT AMPLITUDE (dBFS)
40MSPS
69.5MHz AT –1d BFS SNR = 73.7dB ( 74.7dBFS) SFDR = 87.9d Bc
= 40 MSPS
SAMPLE
10206-024
10206-025
Figure 26. Two-Tone SFDR/IMD3 vs. Input Amplitude (AIN) with
f
= 30 MHz and f
IN1
= 32 MHz, f
IN2
SAMPLE
= 40 MSPS
Rev. 0 | Page 14 of 40
Page 15
Data Sheet AD9257
120
100
80
60
40
SNR/SFDR (dBFS/dBc)
20
0 –90 –80 –70 –60 –50 –40 –30 –20 –10
SFDRFS
SNRFS
SFDR
SNR
INPUT AMPLITUDE (dBFS)
Figure 27. SNR/SFDR vs. Analog Input Level, f
= 9.7 MHz, f
IN
SAMPLE
0
10206-026
= 40 MSPS
110
100
90
80
70
60
50
40
SNR/SFDR (dBFS/dBc)
30
20
10
0
0 200
SFDR (dBc)
SNR (dBFS)
100 120 1408020 40 60 180160
INPUT FREQUENCY (MHz)
Figure 30. SNR/SFDR vs. f
IN
, f
SAMPLE
= 40 MSPS
10206-029
105
100
95
90
85
SNR/SFDR (dBFS/dBc)
80
75
70
20 30 40
Figure 28. SNR/SFDR vs. Encode, f
105
100
SNR/SFDR (dBFS/dBc)
SFDR (dBc)
95
90
85
80
SNR (dBFS)
75
70
–40 85
15103560
Figure 29. SNR/SFDR vs. Temperature, f
SFDR
SNRFS
25 35
SAMPLE FREQUENCY (MSPS)
= 19.7 MHz
IN
TEMPERATURE (°C)
= 9.7 MHz, f
IN
SAMPLE
= 40 MSPS
105
100
95
90
85
SNR/SFDR (dBFS/dBc)
80
75
70
20
10206-027
Figure 31. SNR/SFDR vs. Encode, f
500,000
450,000
400,000
350,000
300,000
250,000
200,000
NUMBER OF HIT S
150,000
100,000
50,000
0
N – 9
10206-028
N – 8
N – 10
Figure 32. Input-Referred Noise Histogram, f
SFDR
SNRFS
SAMPLE FREQUENCY (MSPS)
N – 7
N – 6
N – 5
30 4025 35
N – 4
N – 3
N – 2
OUTPUT CO DE
N
N – 1
N + 1
= 30.5 MHz
IN
0.846 LSB RMS
N + 2
N + 3
N + 4
N + 5
SAMPLE
N + 6
N + 7
N + 8
= 40 MSPS
10206-030
N + 9
N + 10
10206-031
Rev. 0 | Page 15 of 40
Page 16
AD9257 Data Sheet
2.0
1.6
1.2
0.8
0.4
0
INL (LSB)
–0.4
–0.8
–1.2
–1.6
–2.0
0
1500
3000
Figure 33. INL, f
6000
4500
OUTPUT CODE
= 9.7 MHz, f
IN
7500
9000
10500
12000
13500
15000
16500
10206-032
SAMPLE
= 40 MSPS
1.0
0.8
0.6
0.4
0.2
0
DNL (LSB)
–0.2
–0.4
–0.6
–0.8
–1.0
0
1500
3000
Figure 34. DNL, f
6000
4500
OUTPUT CODE
= 9.7 MHz, f
IN
7500
9000
10500
12000
13500
15000
16500
10206-033
SAMPLE
= 40 MSPS
Rev. 0 | Page 16 of 40
Page 17
Data Sheet AD9257
A
VDDV
A
V
A
V
A
V
A
A
V
A
V
A
V

EQUIVALENT CIRCUITS

DD
IN± x
Figure 35. Equivalent Analog Input Circuit
DD
CLK+
AVD D
CLK–
5
15k
0.9V
15k
5
Figure 36. Equivalent Clock Input Circuit
DD
30k
SDIO/DFS
350
30k
SCLK/DTP, SYNC,
AND PDWN
10206-034
350
30k
10206-038
Figure 39. Equivalent SCLK/DTP, SYNC, and PDWN Input Circuit
DD
RBIAS
ND VCM
10206-035
375
10206-039
Figure 40. Equivalent RBIAS, VCM Circuit
DD
30k
CSB
350
Figure 37. Equivalent SDIO/DFS Input Circuit
DRVDD
V
D– x D+ x
V
DRGND
V
V
10206-037
Figure 38. Equivalent Digital Output Circuit
10206-036
Figure 41. Equivalent CSB Input Circuit
DD
VREF
7.5k
375
Figure 42. Equivalent VREF Circuit
10206-040
10206-041
Rev. 0 | Page 17 of 40
Page 18
AD9257 Data Sheet
V
V

THEORY OF OPERATION

The AD9257 is a multistage, pipelined ADC. Each stage provides sufficient overlap to correct for flash errors in the preceding stage. The quantized outputs from each stage are combined into a final 14-bit result in the digital correction logic. The serializer transmits this converted data in a 14-bit output. The pipelined architecture permits the first stage to operate with a new input sample while the remaining stages operate with preceding samples. Sampling occurs on the rising edge of the clock.
Each stage of the pipeline, excluding the last, consists of a low resolution flash ADC connected to a switched-capacitor DAC and an interstage residue amplifier (for example, a multiplying digital-to-analog converter (MDAC)). The residue amplifier magnifies the difference between the reconstructed DAC output and the flash input for the next stage in the pipeline. One bit of redundancy is used in each stage to facilitate digital correction of flash errors. The last stage simply consists of a flash ADC.
The output staging block aligns the data, corrects errors, and passes the data to the output buffers. The data is then serialized and aligned to the frame and data clocks.

ANALOG INPUT CONSIDERATIONS

The analog input to the AD9257 is a differential switched­capacitor circuit designed for processing differential input signals. This circuit can support a wide common-mode range while maintaining excellent performance. By using an input common-mode voltage of midsupply, users can minimize signal-dependent errors and achieve optimum performance.
H
C
PAR
IN+ x
IN– x
C
PAR
Figure 43. Switched-Capacitor Input Circuit
C
SAMPLE
SS SS
C
SAMPLE
H
The clock signal alternately switches the input circuit between sample mode and hold mode (see Figure 43). When the input circuit is switched to sample mode, the signal source must be capable of charging the sample capacitors and settling within one-half of a clock cycle. A small resistor in series with each input can help reduce the peak transient current injected from
H
H
10206-042
the output stage of the driving source. In addition, low Q inductors or ferrite beads can be placed on each leg of the input to reduce high differential capacitance at the analog inputs and, therefore, achieve the maximum bandwidth of the ADC. Such use of low Q inductors or ferrite beads is required when driving the converter front end at high IF frequencies. Either a differential capacitor or two single-ended capacitors can be placed on the inputs to provide a matching passive network. This ultimately creates a low-pass filter at the input to limit unwanted broadband noise. See the
AN-742 Application Note, the AN-827 Application Note, and the
Analog Dialogue article “Transformer-Coupled Front-End for
Wideband A/D Converters” (Volume 39, April 2005) for more
information. In general, the precise values depend on the application.

Input Common Mode

The analog inputs of the AD9257 are not internally dc-biased. Therefore, in ac-coupled applications, the user must provide this bias externally. Setting the device so that V
= AVDD/2 is
CM
recommended for optimum performance, but the device can function over a wider range with reasonable performance, as shown in Figure 44.
An on-board, common-mode voltage reference is included in the design and is available from the VCM pin. The VCM pin must be decoupled to ground by a 0.1 μF capacitor, as described in the Applications Information section.
Maximum SNR performance is achieved by setting the ADC to the largest span in a differential configuration. In the case of the AD9257, the largest input span available is 2 V p-p.
100
90
80
70
60
50
SNR/SFDR (dBFS/dBc)
40
30
20
0.5
Figure 44. SNR/SFDR vs. Common-Mode Voltage,
SFDR
SNRFS
0.7 0.9 1.1 1.3
= 9.7 MHz, f
f
IN
VCM (V)
SAMPLE
= 65 MSPS
10206-043
Rev. 0 | Page 18 of 40
Page 19
Data Sheet AD9257
A

Differential Input Configurations

There are several ways to drive the AD9257 either actively or passively. However, optimum performance is achieved by driving the analog input differentially. Using a differential double balun configuration to drive the AD9257 provides excellent performance and a flexible interface to the ADC (see Figure 46) for baseband applications.
For applications where SNR is a key parameter, differential trans­former coupling is the recommended input configuration (see Figure 47), because the noise performance of most amplifiers is not adequate to achieve the true performance of the AD9257.
Regardless of the configuration, the value of the shunt capacitor, C, is dependent on the input frequency and may need to be reduced or removed.
It is not recommended to drive the AD9257 input single-ended.

VOLTAGE REFERENCE

A stable and accurate 1.0 V voltage reference is built into the
AD9257. VREF can be configured using either the internal 1.0 V
reference or an externally applied 1.0 V reference voltage. The various reference modes are summarized in the sections that follow. The VREF pin should be externally decoupled to ground with a low ESR, 1.0 F capacitor in parallel with a low ESR,
0.1 F ceramic capacitor.

Internal Reference Connection

A comparator within the AD9257 detects the potential at the SENSE pin and configures the reference into two possible modes, which are summarized in Tabl e 9. If SENSE is grounded, the reference amplifier switch is connected to the internal resistor divider (see Figure 45), setting VREF to 1.0 V.
Table 9. Reference Configuration Summary
Resulting
CORE
0.5V
Differential Span (V p-p)
2.0
ADC
Selected Mode
Fixed Internal
Reference
Fixed External
Reference
SENSE Voltage (V)
Resulting VREF (V)
AGND to 0.2 1.0 internal 2.0
AVDD 1.0 applied
to external VREF pin
VIN+ x
VIN– x
VREF
0.1µF1.0µF
SENSE
SELECT
LOGIC
ADC
10206-044
Figure 45. Internal Reference Configuration
*C1
R0.1µ F
33
33
C
33
0.1µF 0.1µF
5pF
R
33
*C1
R
200
*C1 IS OPTIONAL
VIN+ x
VIN– x
ADC
VCM
C
10206-045
2V p-p
0.1µF
ET1-1-I3
C
0.1µF
C
Figure 46. Differential Double Balun Input Configuration for Baseband Applications
DT1-1WT
1:1 Z RATIO
2V p-p
49.9
0.1F
Figure 47. Differential Transformer-Coupled Configuration
for Baseband Applications
*C1
R
33
C
5pF
R
33
*C1
*C1 IS OPTIONAL
200
VIN+ x
VIN– x
ADC
VCM
0.1µF
10206-046
Rev. 0 | Page 19 of 40
Page 20
AD9257 Data Sheet
If the internal reference of the AD9257 is used to drive multiple converters to improve gain matching, the loading of the reference by the other converters must be considered. Figure 48 shows how the internal reference voltage is affected by loading.
0
–0.5
–1.0
–1.5
–2.0
–2.5
ERROR (%)
–3.0
REF
V
–3.5
–4.0
–4.5
–5.0
02.52.01. 51.00.5
Figure 48. V
LOAD CURRENT (mA)
Error vs. Load Current
REF
INTERNAL V
REF
= 1V
3.0
10206-047

External Reference Operation

The use of an external reference may be necessary to enhance the gain accuracy of the ADC or improve thermal drift charac­teristics. Figure 49 shows the typical drift characteristics of the internal reference in 1.0 V mode.
4
2
0
–2
ERROR (mV)
REF
–4
V
–6
–8
–40 85
–15 10 35 60
TEMPERATURE (° C)
Figure 49. Typical V
REF
Drift
10206-048
When the SENSE pin is tied to AVDD, the internal reference is disabled, allowing the use of an external reference. An internal reference buffer loads the external reference with an equivalent
7.5 kΩ load (see Figure 42). The internal buffer generates the positive and negative full-scale references for the ADC core. Therefore, the external reference must be limited to a maximum of 1.0 V. It is not recommended to leave the SENSE pin floating.

CLOCK INPUT CONSIDERATIONS

For optimum performance, clock the AD9257 sample clock inputs, CLK+ and CLK−, with a differential signal. The signal is typically ac-coupled into the CLK+ and CLK− pins via a transformer or capacitors. These pins are biased internally (see Figure 36) and require no external bias.

Clock Input Options

The AD9257 has a very flexible clock input structure. The clock input can be a CMOS, LVDS, LVPECL, or sine wave signal. Regardless of the type of signal being used, clock source jitter is of the utmost concern, as described in the Jitter Considerations section.
Figure 50 and Figure 51 show two preferred methods for clock­ing the AD9257 (at clock rates of up to 520 MHz prior to the internal CLK divider). A low jitter clock source is converted from a single-ended signal to a differential signal using either an RF transformer or an RF balun.
The RF balun configuration is recommended for clock frequencies between 65 MHz and 520 MHz, and the RF transformer is recom­mended for clock frequencies from 10 MHz to 200 MHz. The back-to-back Schottky diodes across the transformer/balun secondary winding limit clock excursions into the AD9257 to approximately 0.8 V p-p differential.
This limit helps prevent the large voltage swings of the clock from feeding through to other portions of the AD9257 while preserving the fast rise and fall times of the signal that are critical to a low jitter performance. However, the diode capacitance comes into play at frequencies above 500 MHz. Care must be taken in choosing the appropriate signal limiting diode.
XFMR
0.1µF
®
0.1µF0.1µF
0.1µF
0.1µF0.1µF
0.1µF
SCHOTTKY
DIODES:
HSMS2822
SCHOTTKY
DIODES:
HSMS2822
CLK+
CLK–
CLK+
CLK–
ADC
ADC
10206-050
Mini-Circuits
ADT1-1WT, 1:1 Z
CLOCK
INPUT
50
100
Figure 50. Transformer-Coupled Differential Clock (Up to 200 MHz)
CLOCK
INPUT
50
0.1µF
Figure 51. Balun-Coupled Differential Clock (65 MHz to 520 MHz)
10206-049
Rev. 0 | Page 20 of 40
Page 21
Data Sheet AD9257
C
If a low jitter clock source is not available, another option is to ac couple a differential PECL signal to the sample clock input pins, as shown in Figure 52. The AD9510/AD9511/AD9512/
AD9513/AD9514/AD9515/AD9516/AD9517 clock drivers offer
excellent jitter performance.
A third option is to ac couple a differential LVDS signal to the sample clock input pins, as shown in Figure 53. The AD9510/
AD9511/AD9512/AD9513/AD9514/AD9515/AD9516/AD9517
clock drivers offer excellent jitter performance.
In some applications, it may be acceptable to drive the sample clock inputs with a single-ended 1.8 V CMOS signal. In such applications, drive the CLK+ pin directly from a CMOS gate, and bypass the CLK− pin to ground with a 0.1 F capacitor (see Figure 54).

Input Clock Divider

The AD9257 contains an input clock divider with the ability to divide the input clock by integer values between 1 and 8.
The AD9257 clock divider can be synchronized using the external SYNC input. Bit 0 and Bit 1 of Register 0x109 allow the clock divider to be resynchronized on every SYNC signal or only on the first SYNC signal after the register is written. A valid SYNC causes the clock divider to reset to its initial state.
This synchronization feature allows multiple parts to have their clock dividers aligned to guarantee simultaneous input sampling.

Clock Duty Cycle

Typical high speed ADCs use both clock edges to generate a vari­ety of internal timing signals and, as a result, may be sensitive to clock duty cycle. Commonly, a ±5% tolerance is required on the clock duty cycle to maintain dynamic performance characteristics.
The AD9257 contains a duty cycle stabilizer (DCS) that retimes the nonsampling (falling) edge, providing an internal clock signal with a nominal 50% duty cycle. This allows the user to provide a wide range of clock input duty cycles without affecting the per­formance of the AD9257. Noise and distortion performance are nearly flat for a wide range of duty cycles with the DCS on.
Jitter in the rising edge of the input is still of concern and is not easily reduced by the internal stabilization circuit. The duty cycle control loop does not function for clock rates less than 20 MHz, nominally. The loop has a time constant associated with it that must be considered in applications in which the clock rate can change dynamically. A wait time of 1.5 µs to 5 µs is required after a dynamic clock frequency increase or decrease before the DCS loop is relocked to the input signal.
CLOCK
INPUT
CLOCK
INPUT
0.1µF
0.1µF
50k 50k
AD951x
PECL DRIVER
0.1µF CLK+
100
0.1µF
240240
CLK–
ADC
10206-051
Figure 52. Differential PECL Sample Clock (Up to 520 MHz)
CLOCK
INPUT
CLOCK
INPUT
0.1µF
0.1µF
50k 50k
AD951x
LVDS DRIVE R
0.1µF
100
0.1µF
CLK+
CLK–
ADC
10206-052
Figure 53. Differential LVDS Sample Clock (Up to 520 MHz)
V
CC
0.1µF
1k
1k
AD951x
CMOS DRIVER
LOCK
INPUT
1
50
1
50 RESISTOR IS OPTIONAL.
Figure 54. Single-Ended 1.8 V CMOS Input Clock (Up to 200 MHz)
OPTIONAL
100
0.1µF
0.1µF CLK+
CLK–
ADC
10206-053
Rev. 0 | Page 21 of 40
Page 22
AD9257 Data Sheet

Jitter Considerations

High speed, high resolution ADCs are sensitive to the quality of the clock input. The degradation in SNR at a given input frequency (f
) due only to aperture jitter (tJ) can be calculated by
A
SNR Degradation = 20 log
⎛ ⎜
10
π
2
1
⎟ ⎟
××
tf
J
A
In this equation, the rms aperture jitter represents the root mean square of all jitter sources, including the clock input, analog input signal, and ADC aperture jitter specifications. IF undersampling applications are particularly sensitive to jitter (see Figure 55).
The clock input should be treated as an analog signal in cases where aperture jitter may affect the dynamic range of the AD9257. Power supplies for clock drivers should be separated from the ADC output driver supplies to avoid modulating the clock signal with digital noise. Low jitter, crystal-controlled oscillators make the best clock sources. If the clock is generated from another type of source (by gating, dividing, or other methods), it should be retimed by the original clock at the last step.
Refer to the AN-501 Application Note and the AN-756 Application Note for more in-depth information about jitter performance as it relates to ADCs.
130
RMS CLOCK JITTER REQUIREMENT
120
110
100
90
80
SNR (dB)
70
10 BITS
60
8 BITS
50
40
30
1 10 100 1000
Figure 55. Ideal SNR vs. Input Frequency and Jitter
ANALOG INPU T FREQU ENCY (M Hz)
0.125ps
0.25ps
0.5ps
1.0ps
2.0ps
16 BITS
14 BITS
12 BITS
10206-054

POWER DISSIPATION AND POWER-DOWN MODE

As shown in Figure 56, the power dissipated by the AD9257 is proportional to its sample rate. The digital power dissipation does not vary significantly because it is determined primarily by the DRVDD supply and bias current of the LVDS output drivers.
400
350
65MSPS
80MSPS
10206-055
300
250
ANALOG CO RE POW ER (mW)
200
20MSPS
150
15 20 25 30 35 40 45 50 55 60 65
10
Figure 56. Analog Core Power vs. f
SAMPLE RATE (MSPS)
40MSPS
50MSPS
for fIN = 9.7 MHz
SAMPLE
The AD9257 is placed in power-down mode either by the SPI port or by asserting the PDWN pin high. In this state, the ADC typically dissipates 1 mW. During power-down, the output drivers are placed in a high impedance state. Asserting the PDWN pin low returns the AD9257 to its normal operating mode. Note that PDWN is referenced to the digital output driver supply (DRVDD) and should not exceed that supply voltage.
Low power dissipation in power-down mode is achieved by shutting down the reference, reference buffer, biasing networks, and clock. Internal capacitors are discharged when entering power­down mode and then must be recharged when returning to normal operation. As a result, wake-up time is related to the time spent in power-down mode, and shorter power-down cycles result in proportionally shorter wake-up times. When using the SPI port interface, the user can place the ADC in power-down mode or standby mode. Standby mode allows the user to keep the internal reference circuitry powered when faster wake-up times are required. See the Memory Map section for more details on using these features.
Rev. 0 | Page 22 of 40
Page 23
Data Sheet AD9257

DIGITAL OUTPUTS AND TIMING

The AD9257 differential outputs conform to the ANSI-644 LVDS standard on default power-up. This can be changed to a low power, reduced signal option (similar to the IEEE 1596.3 standard) via the SPI. The LVDS driver current is derived on chip and sets the output current at each output equal to a nominal 3.5 mA. A 100 Ω differential termination resistor placed at the LVDS receiver inputs results in a nominal 350 mV swing (or 700 mV p-p differential) at the receiver.
When operating in reduced range mode, the output current is reduced to 2 mA. This results in a 200 mV swing (or 400 mV p-p differential) across a 100 Ω termination at the receiver.
The AD9257 LVDS outputs facilitate interfacing with LVDS receivers in custom ASICs and FPGAs for superior switching performance in noisy environments. Single point-to-point net topologies are recommended with a 100 Ω termination resistor placed as close to the receiver as possible. If there is no far-end receiver termination or there is poor differential trace routing, timing errors may result. To avoid such timing errors, it is recom­mended that the trace length be less than 24 inches and the differential output traces be close together and at equal lengths. An example of the FCO and data stream with proper trace length and position is shown in Figure 57. An example of LVDS output timing in reduced range mode is shown in Figure 58.
FCO 500mV/DI V DCO 500mV/DIV DATA 500mV/DIV
Figure 57. LVDS Output Timing Example in ANSI-644 Mode (Default)
5ns/DIV
10206-056
FCO 500mV/DI V DCO 500mV/DIV DATA 500mV/DIV
Figure 58. LVDS Output Timing Example in Reduced Range Mode
5ns/DIV
10206-057
Rev. 0 | Page 23 of 40
Page 24
AD9257 Data Sheet
Figure 59 shows an example of the LVDS output using the ANSI-644 standard (default) data eye and a time interval error (TIE) jitter histogram with trace lengths of less than 24 inches on standard FR-4 material.
400
EYE: ALL BITS
300
200
100
0
–100
–200
EYE DIAG RAM VOL TAGE (mV)
–300
–400
–0.8ns
–1.0ns
2.5k
–0.6ns
–0.4ns
–0.2ns
0ns
ULS: 7000:400354
0.4ns
0.2ns
0.8ns
0.6ns
1.0ns
to drive longer trace lengths, which can be achieved by program­ming Register 0x15. Even though this option produces sharper rise and fall times on the data edges and is less prone to bit errors, it also increases the power dissipation of the DRVDD supply.
300
EYE: ALL BITS
200
100
0
–100
–200
EYE DIAG RAM VOLT AGE (mV )
–300
–0.8ns
–1.0ns
2.5k
–0.6ns
–0.4ns
–0.2ns
0ns
ULS: 7000/18200
0.4ns
0.2ns
0.8ns
0.6ns
1.0ns
2.0k
1.5k
1.0k
TIE JITTER HISTOGRAM (Hits)
0.5k
0
0ps
20ps
–60ps
–40ps
–20ps
40ps
s
60ps
80p
10206-058
Figure 59. Data Eye for LVDS Outputs in ANSI-644 Mode with Trace Lengths
Less Than 24 Inches on Standard FR-4, External 100 Ω Far Termination Only
Figure 60 shows an example of trace lengths exceeding 24 inches on standard FR-4 material. Note that the TIE jitter histogram reflects the decrease of the data eye opening as the edge deviates from the ideal position.
It is the responsibility of the user to determine if the waveforms meet the timing budget of the design when the trace lengths exceed 24 inches. Additional SPI options allow the user to further increase the internal termination (increasing the current) of all eight outputs
2.0k
1.5k
1.0k
TIE JITTER HISTOGRAM (Hits)
0.5k
0
–60ps
–80ps
–40ps
0ps
–20ps
s
20ps
40p
Figure 60. Data Eye for LVDS Outputs in ANSI-644 Mode with Trace Lengths
Greater Than 24 Inches on Standard FR-4, External 100 Ω Far Termination Only
The default format of the output data is twos complement. Tab l e 1 0 shows an example of the output coding format. To change the output data format to offset binary, see the Memory Map section.
Data from each ADC is serialized and provided on a separate channel in DDR mode. The data rate for each serial stream is equal to 14 bits times the sample clock rate, quantity divided by 2, with a maximum of 455 Mbps (14 bits × 65 MSPS)/2 = 455 Mbps. The lowest typical conversion rate is 10 MSPS. See the Memory Map section for details on enabling this feature.
Table 10. Digital Output Coding
Input (V) Condition (V) Offset Binary Output Mode Twos Complement Mode
VIN+ − VIN− < −VREF − 0.5 LSB 00 0000 0000 0000 10 0000 0000 0000 VIN+ − VIN− = −VREF 00 0000 0000 0000 10 0000 0000 0000 VIN+ − VIN− = 0 10 0000 0000 0000 00 0000 0000 0000 VIN+ − VIN− = +VREF − 1.0 LSB 11 1111 1111 1111 01 1111 1111 1111 VIN+ − VIN− > +VREF − 0.5 LSB 11 1111 1111 1111 01 1111 1111 1111
60ps
80ps
10206-059
Rev. 0 | Page 24 of 40
Page 25
Data Sheet AD9257
Two output clocks are provided to assist in capturing data from the AD9257. The DCO is used to clock the output data and is equal to 7× the sample clock (CLK) rate for the default mode of operation. Data is clocked out of the AD9257 and must be captured on the rising and falling edges of the DCO that supports double data rate (DDR) capturing. The FCO is used to signal the start of a new output byte and is equal to the sample clock rate (see the Timing Diagrams section).
When the SPI is used, the DCO phase can be adjusted in 60° increments relative to the data edge. This enables the user to refine system timing margins if required. The default DCO+ and DCO− timing, as shown in Figure 2, is 90° relative to the output data edge.
A 12-bit serial stream can also be initiated from the SPI. This allows the user to implement and test compatibility to lower
Table 11. Flexible Output Test Modes
Output Test Mode Bit Sequence
0000 Off (default) N/A N/A N/A 0001 Midscale short
0010 +Full-scale short
0011 −Full-scale short
0100 Checkerboard
0101 PN sequence long1 N/A N/A Yes PN23
0110 PN sequence short1 N/A N/A Yes PN9
0111
1000 User input Register 0x19 to Register 0x1A Register 0x1B to Register 0x1C No 1001 1-/0-bit toggle
1010 1× sync
1011 One bit high
1100 Mixed frequency
1
All test mode options except PN sequence short and PN sequence long can support 12-bit to 14-bit word lengths to verify data capture to the receiver.
Pattern Name Digital Output Word 1 Digital Output Word 2
1000 0000 0000 (12-bit) 10 0000 0000 0000 (14-bit)
1111 1111 1111 (12-bit) 11 1111 1111 1111 (14-bit)
0000 0000 0000 (12-bit) 00 0000 0000 0000 (14-bit)
1010 1010 1010 (12-bit) 10 1010 1010 1010 (14-bit)
One-/zero-word toggle
1111 1111 1111 (12-bit) 11 1111 1111 1111 (14-bit)
1010 1010 1010 (12-bit) 10 1010 1010 1010 (14-bit)
0000 0011 1111 (12-bit) 00 0000 0111 1111 (14-bit)
1000 0000 0000 (12-bit) 10 0000 0000 0000 (14-bit)
1010 0011 0011 (12-bit) 10 1000 0110 0111 (14-bit)
resolution systems. When changing the resolution to a 12-bit serial stream, the data stream is shortened. See Figure 3 for the 12-bit example.
In default mode, as shown in Figure 2, the MSB is first in the data output serial stream. This can be inverted so that the LSB is first in the data output serial stream by using the SPI.
There are 12 digital output test pattern options available that can be initiated through the SPI. This is a useful feature when validating receiver capture and timing (see Tabl e 11 for the output bit sequencing options that are available). Some test patterns have two serial sequential words and can be alternated in various ways, depending on the test pattern chosen. Note that some patterns do not adhere to the data format select option. In addition, custom user-defined test patterns can be assigned in Register 0x19, Register 0x1A, Register 0x1B, and Register 0x1C.
Subjec t to Data Format Select
N/A Yes Offset binary code shown
N/A Yes Offset binary code shown
N/A Yes Offset binary code shown
0101 0101 0101 (12-bit) 01 0101 0101 0101 (14-bit)
0000 0000 0000 (12-bit) 00 0000 0000 0000 (14-bit)
N/A No
N/A No
N/A No
N/A No
No
No
Notes
ITU 0.150
23
+ X18 + 1
X
ITU O.150
9
+ X5 + 1
X
Pattern associated with the external pin
Rev. 0 | Page 25 of 40
Page 26
AD9257 Data Sheet
The PN sequence short pattern produces a pseudorandom bit sequence that repeats itself every 2
9
− 1 or 511 bits. A description of the PN sequence and how it is generated can be found in Section 5.1 of the ITU-T 0.150 (05/96) standard. The seed value is all 1s (see Tabl e 12 for the initial values). The output is a parallel representation of the serial PN9 sequence in MSB-first format. The first output word is the first 14 bits of the PN9 sequence in MSB alig
ned form.
Table 12. PN Sequence
Initial
Sequence
PN Sequence Short 0x1FE0 0x1DF1, 0x3CC8, 0x294E PN Sequence Long 0x1FFF 0x1FE0, 0x2001, 0x1C00
Value
First Three Output Samples (MSB First) Twos Complement
The PN sequence long pattern produces a pseudorandom bit sequence that repeats itself every 2
23
− 1 or 8,388,607 bits. A description of the PN sequence and how it is generated can be found in Section 5.6 of the ITU-T 0.150 (05/96) standard. The seed value is all 1s (see Tab le 1 2 for the initial values) and the
AD9257 inverts the bit stream with relation to the ITU standard.
The output is a parallel representation of the serial PN23 sequence in MSB-first format. The first output word is the first 14 bits of the PN23 sequence in MSB aligned format.
Consult the Memory Map section for information on how to change these additional digital output timing features through the SPI.

SDIO/DFS Pin

For applications that do not require SPI mode operation, the CSB pin is tied to AVDD, and the SDIO/DFS pin controls the output data format select according to Tab le 1 3.

SCLK/DTP Pin

The SCLK/DTP pin is for use in applications that do not require SPI mode operation. This pin can enable a single digital test pattern if it and the CSB pin are both held high during device power-up. When SCLK/DTP is tied to AVDD, the ADC channel outputs shift out the following pattern: 10 0000 0000 0000. The FCO and DCO function normally while all channels shift out the repeatable test pattern. This pattern allows the user to perform timing
alignment adjustments among the FCO, DCO, and output data. This pin has an internal 30 kΩ resistor to GND. It can be left unconnected for normal operation.
Table 14. Digital Test Pattern Pin Settings
Selected DTP DTP Voltage Resulting D± x
Normal Operation No connect Normal operation DTP AVDD 10 0000 0000 0000
Additional and custom test patterns can also be observed when commanded from the SPI port. Consult the Memory Map section for information about the options available.

CSB Pin

The CSB pin should be tied to AVDD for applications that do not require SPI mode operation. Tying CSB high causes all SCLK and SDIO information to be ignored.

RBIAS Pin

To set the internal core bias current of the ADC, place a
10.0 kΩ, 1% tolerance resistor to ground at the RBIAS pin.
Table 13. Output Data Format Select Pin Settings
DFS Pin Voltage Output Mode
AVDD Twos complement GND (Default) Offset binary
Rev. 0 | Page 26 of 40
Page 27
Data Sheet AD9257

BUILT-IN OUTPUT TEST MODES

The AD9257 includes a built-in test feature designed to enable verification of the integrity of each data output channel, as well as to facilitate board level debugging. Various output test options are provided to place predictable values on the outputs of the
AD9257.

OUTPUT TEST MODES

The output test options are described in Ta ble 1 7 at Address 0x0D. When an output test mode is enabled, the analog section of the
ADC is disconnected from the digital back-end blocks and the test pattern is run through the output formatting block. Some of the test patterns are subject to output formatting, and some are not. The PN generators from the PN sequence tests can be reset by setting Bit 4 or Bit 5 of Register 0x0D. These tests can be performed with or without an analog signal (if present, the analog signal is ignored), but they do require an encode clock. For more information, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
Rev. 0 | Page 27 of 40
Page 28
AD9257 Data Sheet

SERIAL PORT INTERFACE (SPI)

The AD9257 serial port interface (SPI) allows the user to configure the converter for specific functions or operations through a structured register space provided inside the ADC. The SPI gives the user added flexibility and customization, depending on the application. Addresses are accessed via the serial port and can be written to or read from via the port. Memory is organized into bytes that can be further divided into fields, which are docu­mented in the Memory Map section. For detailed operational information, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.

CONFIGURATION USING THE SPI

Three pins define the SPI of this ADC: the SCLK/DTP pin, the SDIO/DFS pin, and the CSB pin (see Table 15). The SCLK (a serial clock) is used to synchronize the read and write data presented from and to the ADC. The SDIO (serial data input/ output) is a dual-purpose pin that allows data to be sent to and read from the internal ADC memory map registers. The CSB (chip select bar) is an active low control that enables or disables the read and write cycles.
Table 15. Serial Port Interface Pins
Pin Function
SCLK
Serial clock. The serial shift clock input, which is used to synchronize serial interface reads and writes.
SDIO
Serial data input/output. A dual-purpose pin that typically serves as an input or an output, depending on the instruction being sent and the relative position in the timing frame.
CSB
Chip select bar. An active low control that gates the read and write cycles.
The falling edge of the CSB, in conjunction with the rising edge of the SCLK, determines the start of the framing. An example of the serial timing and its definitions can be found in Figure 61 and Table 5.
Other modes involving the CSB are available. The CSB can be held low indefinitely, which permanently enables the device; this is called streaming. The CSB can stall high between bytes to allow for additional external timing. When CSB is tied high, SPI functions are placed in high impedance mode. This mode turns on any SPI pin secondary functions.
During an instruction phase, a 16-bit instruction is transmitted. Data follows the instruction phase, and its length is determined by the W0 and W1 bits.
In addition to word length, the instruction phase determines whether the serial frame is a read or write operation, allowing the serial port to be used both to program the chip and to read the contents of the on-chip memory. The first bit of the first byte in a multibyte serial data transfer frame indicates whether a read command or a write command is issued. If the instruction is a readback operation, performing a readback causes the serial data input/output (SDIO) pin to change direction from an input to an output at the appropriate point in the serial frame.
All data is composed of 8-bit words. Data can be sent in MSB­first mode or in LSB-first mode. MSB first is the default on power-up and can be changed via the SPI port configuration register. For more information about this and other features, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
CSB
SCLK
SDIO
DON’T CARE
t
t
DS
t
S
R/W W1 W0 A12 A11 A10 A9 A8 A7
HIGH
t
LOW
t
DH
Figure 61. Serial Port Interface Timing Diagram
t
CLK
Rev. 0 | Page 28 of 40
D5 D4 D3 D2 D1 D0
t
H
DON’T CARE
DON’T CAREDON’T CARE
10206-060
Page 29
Data Sheet AD9257

HARDWARE INTERFACE

The pins described in Ta b l e 15 comprise the physical interface between the user programming device and the serial port of the
AD9257. The SCLK pin and the CSB pin function as inputs
when using the SPI interface. The SDIO pin is bidirectional, functioning as an input during write phases and as an output during readback.
The SPI interface is flexible enough to be controlled by either FPGAs or microcontrollers. One method for SPI configuration is described in detail in the AN-812 Application Note, Micro- controller-Based Serial Port Interface (SPI) Boot Circuit.
The SPI port should not be active during periods when the full dynamic performance of the converter is required. Because the SCLK signal, the CSB signal, and the SDIO signal are typically asynchronous to the ADC clock, noise from these signals can degrade converter performance. If the on-board SPI bus is used for other devices, it may be necessary to provide buffers between this bus and the AD9257 to prevent these signals from transi­tioning at the converter inputs during critical sampling periods.
Some pins serve a dual function when the SPI interface is not being used. When the pins are strapped to DRVDD or ground during device power-on, they are associated with a specific function. Tab l e 1 6 describes the strappable functions supported on the AD9257.

CONFIGURATION WITHOUT THE SPI

In applications that do not interface to the SPI control registers, the SDIO/DFS pin, the SCLK/DTP pin, and the PDWN pin serve as standalone CMOS-compatible control pins. When the device is powered up, it is assumed that the user intends to use the
pins as static control lines for the output data format, output digital test pattern, and power-down feature control. In this mode, CSB should be connected to AVDD, which disables the serial port interface.
When the device is in SPI mode, the PDWN pin (if enabled) remains active. For SPI control of power-down, the PDWN pin should be set to its default state.

SPI ACCESSIBLE FEATURES

Tabl e 16 provides a brief description of the general features that are accessible via the SPI. These features are described in detail in the AN-877 Application Note, Interfacing to High Speed ADCs via SPI. The AD9257 part-specific features are described in detail in the Memory Map Register Descriptions section following Tabl e 17 , the external memory map register table.
Table 16. Features Accessible Using the SPI
Feature Name Description
Mode
Clock
Offset
Tes t I /O
Output Mode Allows the user to set the output mode Output Phase Allows the user to set the output clock polarity ADC Resolution
and Speed Grade
Allows the user to set either power-down mode or standby mode
Allows the user to access the DCS, set the clock divider, set the clock divider phase, and enable the sync
Allows the user to digitally adjust the converter offset
Allows the user to set test modes to have known data on output bits
Scalable power consumption options based on resolution and speed grade selection
Rev. 0 | Page 29 of 40
Page 30
AD9257 Data Sheet

MEMORY MAP

READING THE MEMORY MAP REGISTER TABLE

Each row in the memory map register table has eight bit locations. The memory map is roughly divided into three sections: the chip configuration registers (Address 0x00 to Address 0x02); the device index and transfer registers (Address 0x05 and Address 0xFF); and the global ADC functions registers, including setup, control, and test (Address 0x08 to Address 0x109).
The memory map register table (see Tab l e 1 7 ) lists the default hexadecimal value for each hexadecimal address shown. The column with the heading Bit 7 (MSB) is the start of the default hexadecimal value given. For example, Address 0x05, the device index register, has a hexadecimal default value of 0x3F. This means that in Address 0x05, Bits[7:6] = 0, and the remaining Bits[5:0] = 1. This setting is the default channel index setting. The default value results in both ADC channels receiving the next write command. For more information on this function and others, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI. This application note details the functions controlled by Register 0x00 to Register 0xFF. The remaining registers are documented in the Memory Map Register Descriptions section.

Open Locations

All address and bit locations that are not included in Tab l e 1 7 are not currently supported for this device. Unused bits of a valid address location should be written with 0s. Writing to these locations is required only when part of an address location is open (for example, Address 0x05). If the entire address location is open or not listed in Tabl e 17 (for example, Address 0x13) this address location should not be written.

Default Values

After the AD9257 is reset, critical registers are loaded with default values. The default values for the registers are given in Tabl e 17 , the memory map register table.

Logic Levels

An explanation of logic level terminology follows:
“Bit is set” is synonymous with “bit is set to Logic 1” or
“writing Logic 1 for the bit.”
“Clear a bit” is synonymous with “bit is set to Logic 0” or
“writing Logic 0 for the bit.”

Channel-Specific Registers

Some channel setup functions, such as the signal monitor thresholds, can be programmed differently for each channel. In these cases, channel address locations are internally duplicated for each channel. These registers and bits are designated in Tabl e 17 as local. These local registers and bits can be accessed by setting the appropriate data channel bits (A, B, C, or D) and the clock channel DCO/FCO bits (Bits[5:4]) in Register 0x05. If all the bits are set, the subsequent write affects the registers of all channels and the DCO/FCO clock channels. In a read cycle, only one of the channels, A, B, C, or D, should be set to read one of the four registers. If all the bits are set during a SPI read cycle, the part returns the value for Channel A. Registers and bits designated as global in Tabl e 17 affect the entire part or the channel features for which independent settings are not allowed between channels. The settings in Register 0x05 do not affect the global registers and bits.
Rev. 0 | Page 30 of 40
Page 31
Data Sheet AD9257

MEMORY MAP REGISTER TABLE

The AD9257 uses a 3-wire interface and 16-bit addressing and, therefore, Bit 0 and Bit 7 in Register 0x00 are set to 0, and Bit 3 and Bit 4 are set to 1. When Register 0x00, Bit 5 is set high, the
Table 17. Memory Map Register Table
Reg. Addr. (Hex)
Chip Configuration Registers 0x00
0x01 Chip ID (global) 8-bit chip ID, Bits[7:0]
0x02
Device Index and Transfer Registers 0x04 Device Index 2 Open Open Open Open
0x05 Device Index 1 Open Open
0xFF Transfer Open Open Open Open Open Open Open
Global ADC Functions 0x08
0x09 Clock (global) Open Open Open Open Open Open Open
Register Name
SPI port configuration
Chip grade (global)
Power modes (global)
Bit 7 (MSB)
0 = SDO active
Open Speed grade ID, Bits[6:4]
Open Open
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 (LSB)
LSB first Soft reset
AD9257 0x92 = octal 14-bit, 40 MSPS/65 MSPS serial LVDS
001 = 40 MSPS 011 = 65 MSPS
Clock Channel DCO
External power­down pin function
0 = full power­down
1 = standby
1 = 16-bit address
Clock Channe l FCO
Open Open Open
SPI enters a soft reset, where all of the user registers revert to their default values and Bit 2 is automatically cleared.
Default
1 = 16-bit address
Open Open Open Open
Data Channel H
Data Channel D
Soft reset LSB first
Data Channel G
Data Channel C
Data Channel F
Data Channel B
Internal power-down
00 = chip run
01 = full power-down
10 = standby 11 = reset
0 = SDO active
Data Channel E
Data Channel A
Initiate override
mode
Duty cycle stabilize
0 = off 1 = on
Value (Hex)
0x18
Read only
0x92
Read only
0xF
0x3F
0x00
0x00
0x01
Comments
The nibbles are mirrored so that LSB or MSB first mode registers correctly. The default for the ADCs is 16-bit mode.
Unique chip ID that is used to differentiate devices; read only.
Unique speed grade ID used to differentiate graded devices. Read only.
Bits are set to determine which device on chip receives the next write command. The default is all devices on chip.
Bits are set to determine which device on chip receives the next write command. The default is all devices on chip.
Set resolution/ sample rate override.
Determines various generic modes of chip operation.
Turns duty cycle stabilizer on or off.
Rev. 0 | Page 31 of 40
Page 32
AD9257 Data Sheet
Reg. Addr. (Hex)
0x0B Clock divide
0x0C
0x0D
0x10 Offset adjust (local)
0x14 Output mode Open
0x15 Output adjust Open Open
0x16 Output phase Open Input clock phase adjust, Bits[6:4]
0x18 V
Register Name
(global)
Enhancement control
Test mode (local except for PN sequence resets)
Open Open Open Open Open Internal V
REF
Bit 7 (MSB)
Open Open Open Open Open
Open Open Open Open Open
User input test mode
(affects user input test
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 (LSB)
Reset PN
00 = single
01 = alternate
10 = single once
11 = alternate once
mode only,
Bits[3:0] = 1000)
Offset adjust in LSBs from +127 to −128 (twos complement format)
LVDS-ANSI/ LVDS-IEEE option 0 = LVDS­ANSI
1 = LVDS­IEEE reduced range link (global); (see Table 18)
(value is number of input clock cycles
long gen
Open Open Open
of phase delay)
(see Table 19)
8-bit device offset adjustment, Bits[7:0] (local)
Output driver
Reset PN short gen
termination,
Bits[1:0]
00 = none 01 = 200 Ω 10 = 100 Ω 11 = 100 Ω
Clock divide ratio, Bits[2:0]
000 = divide by 1 001 = divide by 2 010 = divide by 3 011 = divide by 4 100 = divide by 5 101 = divide by 6 110 = divide by 7 111 = divide by 8
Chop mode 0 = off
1 = on
Output test mode, Bits[3:0] (local)
0000 = off (default)
0001 = midscale short 0010 = positive FS 0011 = negative FS
0100 = alternating checkerboard
0101 = PN 23 sequence 0110 = PN 9 sequence
0111 = one/zero word toggle
1000 = user input
1001 = 1-/0-bit toggle 1010 = 1× sync 1011 = one bit high
1100 = mixed bit frequency
Output invert
(local)
Open Open Open
Output clock phase adjust, Bits[3:0]
(Setting = 0000 through 1011)
Open Open 0x00
Open
(see Table 20)
adjustment
REF
digital scheme, Bits[2:0]
000 = 1.0 V p-p
001 = 1.14 V p-p
010 = 1.33 V p-p 011 = 1.6 V p-p 100 = 2.0 V p-p
Output format 0 = offset binary
1 = twos comple­ment (global)
Output drive 0 = 1× drive 1 = 2× drive
Default Value (Hex)
0x00
0x00
0x00
0x01
0x00
0x03
0x04
Comments
The divide ratio is the value plus 1.
Enables/ disables chop mode.
When set, the test data is placed on the output pins in place of normal data.
Device offset trim.
Configures the outputs and the format of the data.
Determines LVDS or other output properties.
On devices that use global clock divide, determines which phase of the divider output is used to supply the output clock. Internal latching is unaffected.
Selects and/or adjusts the V
.
REF
Rev. 0 | Page 32 of 40
Page 33
Data Sheet AD9257
Reg. Addr. (Hex)
0x19
0x1A
0x1B
0x1C
0x21
0x22
0x100
0x101 User I/O Control 2 Open Open Open Open Open Open Open
0x102 User I/O Control 3 Open Open Open Open
0x109 Sync Open Open Open Open Open Open
Register Name
USER_PATT1_LSB (global)
USER_PATT1_MSB (global)
USER_PATT2_LSB (global)
USER_PATT2_MSB (global)
Serial control (global)
Serial channel status (local)
Resolution/ sample rate override
Bit 7 (MSB)
B7 B6 B5 B4 B3 B2 B1 B0 0x00
B15 B14 B13 B12 B11 B10 B9 B8 0x00
B7 B6 B5 B4 B3 B2 B1 B0 0x00
B15 B14 B13 B12 B11 B10 B9 B8 0x00
LVDS output LSB first
Open Open Open Open Open Open
Open
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 (LSB)
Word-wise DDR, 1-lane, Bits[6:4]
100 = DDR 1-lane
Resolution/ sample-rate override enable
Resolution 01 = 14 bits 10 = 12 bits
Open Open
Open Sample rate
VCM power­down
Open Open Open 0x00 VCM control.
Serial output number
Channel output reset
000 = 20 MSPS 001 = 40 MSPS 010 = 50 MSPS 011 = 65 MSPS
Sync next only
of bits
01 = 14 bits 10 = 12 bits
Channel power­down
SDIO pull­down
Enable sync 0x00
Default Value (Hex)
0x41
0x00
0x00
0x00
Comments
User Defined Pattern 1 LSB.
User Defined Pattern 1 MSB.
User Defined Pattern 2 LSB.
User Defined Pattern 2 MSB.
Serial stream control. Default causes MSB first and the native bit stream.
Used to power down individual sections of a converter.
Resolution/ sample rate override (requires transfer bit, 0xFF).
Disables SDIO pull-down.
Rev. 0 | Page 33 of 40
Page 34
AD9257 Data Sheet

MEMORY MAP REGISTER DESCRIPTIONS

For additional information about functions controlled in Register 0x00 to Register 0xFF, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.

Device Index (Register 0x04 and Register 0x05)

There are certain features in the map that can be set independently for each channel, whereas other features apply globally to all channels (depending on context), regardless of which are selected. The first four bits in Register 0x04 and Register 0x05 can be used to select which individual data channels are affected. The output clock channels can be selected in Register 0x05, as well. A smaller subset of the independent feature list can be applied to those devices.

Transfer (Register 0xFF)

All registers except Register 0x100 are updated the moment they are written. Setting Bit 0 of this transfer register high initializes the settings in the ADC sample rate override register (Address 0x100).

Power Modes (Register 0x08)

Bits[7:6]—Open
Bit 5—External Power-Down Pin Function
If set, the external PDWN pin initiates standby mode. If cleared, the external PDWN pin initiates power-down mode.
Bits[4:2]—Open
Bits[1:0]—Internal Power-Down Mode
In normal operation (Bits[1:0] = 00), all ADC channels are active.
In power-down mode (Bits[1:0] = 01), the digital data path clocks are disabled while the digital data path is reset. Outputs are disabled.
In standby mode (Bits[1:0] = 10), the digital data path clocks and the outputs are disabled.
During a digital reset (Bits[1:0] = 11), all the digital data path clocks and the outputs (where applicable) on the chip are reset, except the SPI port. Note that the SPI is always left under control of the user, that is, it is never automatically disabled or in reset (except by power-on reset).

Enhancement Control (Register 0x0C)

Bits[7:3]—Open
Bit 2—Chop Mode
For applications that are sensitive to offset voltages and other low frequency noise, such as homodyne or direct conversion receivers, chopping in the first stage of the AD9257 is a feature that can be enabled by setting Bit 2. In the frequency domain, chopping translates offsets and other low frequency noise to f
/2, where they can be filtered.
CLK
Bits[1:0]—Open
Rev. 0 | Page 34 of 40

Output Mode (Register 0x14)

Bit 7—Open
Bit 6—LVDS-ANSI/LVDS-IEEE Option
Setting this bit chooses the LVDS-IEEE (reduced range) option. The default setting is LVDS-ANSI. As described in Ta b le 1 8, when LVDS-ANSI or LVDS-IEEE reduced range link is selected, the user can select the driver termination. The driver current is automatically selected to give the proper output swing.
Table 18. LVDS-ANSI/LVDS-IEEE Options
Output Mode, Bit[6] Output Mode
0 LVDS-ANSI
1
LVDS-IEEE reduced range link
Output Driver Termination
User selectable
User selectable
Output Driver Current
Automatically selected to give proper swing
Automatically selected to give proper swing
Bits[5:3]—Open
Bit 2—Output Invert
Setting this bit inverts the output bit stream.
Bit 1—Open
Bit 0—Output Format
By default, this bit is set to send the data output in twos complement format. Resetting this bit changes the output mode to offset binary.

Output Adjust (Register 0x15)

Bits[7:6]—Open
Bits[5:4]—Output Termination
These bits allow the user to select the internal termination resistor.
Bits[3:1]—Open
Bit 0—Output Drive
Bit 0 of the output adjust register controls the drive strength on the LVDS driver of the FCO and DCO outputs only. The default values set the drive to 1×. The drive can be increased to 2× by setting the appropriate channel bit in Register 0x05 and then setting Bit 0. These features cannot be used with the output driver termination select. The termination selection takes precedence over the 2× driver strength on FCO and DCO when both the output driver termination and output drive are selected.
Page 35
Data Sheet AD9257

Output Phase (Register 0x16)

Bit 7—Open
Bits[6:4]—Input Clock Phase Adjust
Table 19. Input Clock Phase Adjust Options
Input Clock Phase Adjust, Bits[6:4]
000 (Default) 0 001 1 010 2 011 3 100 4 101 5 110 6 111 7
Number of Input Clock Cycles of Phase Delay
Bits[3:0]—Output Clock Phase Adjust
Table 20. Output Clock Phase Adjust Options
Output Clock (DCO), Phase Adjust, Bits[3:0]
0000 0 0001 60 0010 120 0011 (Default) 180 0100 240 0101 300 0110 360 0111 420 1000 480 1001 540 1010 600 1011 660
DCO Phase Adjustment (Degrees Relative to D± x Edge)

Resolution/Sample Rate Override (Register 0x100)

This register is designed to allow the user to downgrade the device. Any attempt to upgrade the default speed grade results in a chip power-down. Settings in this register are not initialized until Bit 0 of the transfer register (Register 0xFF) is written high.

User I/O Control 2 (Register 0x101)

Bits[7:1]—Open
Bit 0—SDIO Pull-Down
Bit 0 can be set to disable the internal 30 k pull-down on the SDIO pin, which can be used to limit loading when many devices are connected to the SPI bus.

User I/O Control 3 (Register 0x102)

Bits[7:4]—Open
Bit 3—VCM Power-Down
Bit 3 can be set high to power down the internal VCM generator. This feature is used when applying an external reference.
Bits[2:0]—Open
Rev. 0 | Page 35 of 40
Page 36
AD9257 Data Sheet

APPLICATIONS INFORMATION

DESIGN GUIDELINES

Before starting design and layout of the AD9257 as a system, it is recommended that the designer become familiar with these guidelines, which describes the special circuit connections and layout requirements that are needed for certain pins.

POWER AND GROUND RECOMMENDATIONS

When connecting power to the AD9257, it is recommended that two separate 1.8 V supplies be used. Use one supply for analog (AVDD); use a separate supply for the digital outputs (DRVDD). For both AVDD and DRVDD, several different decoupling capacitors should be used to cover both high and low frequencies. Place these capacitors close to the point of entry at the PCB level and close to the pins of the part, with minimal trace length.
A single PCB ground plane should be sufficient when using the
AD9257. With proper decoupling and smart partitioning of the
PCB analog, digital, and clock sections, optimum performance is easily achieved.

EXPOSED PAD THERMAL HEAT SLUG RECOMMENDATIONS

It is required that the exposed pad on the underside of the ADC be connected to analog ground (AGND) to achieve the best electrical and thermal performance of the AD9257. An exposed continuous copper plane on the PCB should mate to the AD9257 exposed pad, Pin 0. The copper plane should have several vias to achieve the lowest possible resistive thermal path for heat dissipation to
flow through the bottom of the PCB. These vias should be solder-filled or plugged.
To maximize the coverage and adhesion between the ADC and PCB, partition the continuous copper plane by overlaying a silk­screen on the PCB into several uniform sections. This provides several tie points between the ADC and PCB during the reflow process, whereas using one continuous plane with no partitions guarantees only one tie point. For detailed information on packaging and the PCB layout of chip scale packages, see the
AN-772 Application Note, A Design and Manufacturing Guide for
the Lead Frame Chip Scale Package (LFCSP), at www.analog.com.
VCM
The VCM pin should be decoupled to ground with a 0.1 F capacitor.

REFERENCE DECOUPLING

The VREF pin should be externally decoupled to ground with a low ESR, 1.0 F capacitor in parallel with a low ESR, 0.1 F ceramic capacitor.

SPI PORT

The SPI port should not be active during periods when the full dynamic performance of the converter is required. Because the SCLK, CSB, and SDIO signals are typically asynchronous to the ADC clock, noise from these signals can degrade converter performance. If the on-board SPI bus is used for other devices, it may be necessary to provide buffers between this bus and the
AD9257 to keep these signals from transitioning at the con-
verter inputs during critical sampling periods.
Rev. 0 | Page 36 of 40
Page 37
Data Sheet AD9257

OUTLINE DIMENSIONS

49
48
0.60 MAX
EXPOSED PAD
(BOTTOM VIEW)
PIN 1
64
INDICATOR
1
6.35
6.20 SQ
6.05
PIN 1
INDICATOR
9.00
BSC SQ
TOP VIEW
8.75
BSC SQ
0.60
MAX
0.50
BSC
1.00
0.85
0.80
SEATING
PLANE
12° MAX
0.50
0.40
0.30
0.80 MAX
0.65 TYP
0.30
0.23
0.18
COMPLIANT TO JEDEC STANDARDS MO-220-VMMD-4
0.05 MAX
0.02 NOM
0.20 REF
33
32
7.50 REF
16
17
FOR PROPER CONNECTION O F THE EXPOSED PAD, REFER TO THE PIN CONF IGURATIO N AND FUNCTION DESCRIPTIO NS SECTION O F THIS DAT A SHEET.
0.25 MIN
091707-C
Figure 62. 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
9 mm × 9 mm Body, Very Thin Quad
(CP-64-4)
Dimensions shown in millimeters

ORDERING GUIDE

Model1 Temperature Range Package Description Package Option
AD9257BCPZ-40 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-4 AD9257BCPZRL7-40 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-4 AD9257BCPZ-65 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-4 AD9257BCPZRL7-65 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-4 AD9257-65EBZ Evaluation Board
1
Z = RoHS Compliant Part.
Rev. 0 | Page 37 of 40
Page 38
AD9257 Data Sheet
NOTES
Rev. 0 | Page 38 of 40
Page 39
Data Sheet AD9257
NOTES
Rev. 0 | Page 39 of 40
Page 40
AD9257 Data Sheet
NOTES
©2011 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D10206-0-10/11(0)
Rev. 0 | Page 40 of 40
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