Datasheet AD9229 Datasheet (Analog Devices)

Page 1
Bit, 50/65 MSPS
Serial LVDS 3V A/D Converter
Rev. PrF 10/06/2003
Quad 12-
Preliminary Technical Data AD9229
FEATURES
Four ADCs in one package
Serial LVDS digital output data rates (ANSI-644)
Data clock output provided
On Chip Reference and SHA
SNR = 70 dB at Fin up to Nyquist
Excellent Linearity:
DNL = ±0.3 LSB (Typical)
INL = ±0.6 LSB (Typical)
500 MHz full power analog bandwidth
Per Channel Core Power Dissipation = 270mW at 65MSPS /
200mW at 50MSPS
1 Vpp – 2 Vpp input voltage range
+3.0 V supply operation
Power down mode
APPLICATIONS
Digital beam forming systems in ultrasound
Wireless and wired broadband communications
Communications test equipment
Radar and satellite imaging sub-systems
PRODUCT DESCRIPTION
FUNCTIONAL BLOCK DIAGRAM
AVDD
VIN+A
VIN-A
VIN+B
VIN-B
VIN+C
VIN-C
VIN+D
VIN-D
VREF
SENSE
REFT
REFB
Ref
Select
Figure 1. Functional Block Diagram
signal a new output byte. Power down is supported and consumes less than 3mW when enabled.
PDWN
AD9229
SHA
SHA
SHA
SHA
+
0.5 V
-
AGND
Pipeline
ADC
Pipeline
ADC
Pipeline
ADC
Pipeline
ADC
LVDSBIAS
DRVDD
12
12
12
12
Data Rate
Multiplier
Serial LVDS
Serial LVDS
Serial LVDS
Serial LVDS
CLK
DRGND
D1+A D1-A
D1+B D1-B
D1+C D1-C
D1+D D1-D
FCO+ FCO-
DCO+
DCO+ DCO-
DCO-
The AD9229 is a quad 12-bit monolithic sampling analog–to– digital converter with an on–chip track–and–hold circuit and is designed for low cost, low power, small size and ease of use. The product operates up to a 65 MSPS conversion rate and is optimized for outstanding dynamic performance where a small package size is critical.
The ADC requires a single+3.0 V power supply and a TTL/CMOS compatible sample rate clock for full performance operation. No external reference or driver components are required for many applications. A separate output power supply pin supports LVDS compatible serial digital output levels.
The ADC automatically multiplies up the sample rate clock for the appropriate LVDS serial data rate. An MSB trigger is provided to
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective companies.
Fabricated on an advanced CMOS process, the AD9229 is available in a 48-LFCSP package specified over the industrial temperature range (–40°C to +85°C).
PRODUCT HIGHLIGHTS
1. Four analog-to-digital converters are contained in one small, space saving package.
2. A Data Clock Output (DCO) is provided which operates up to 390 MHz.
3. The outputs of each ADC are serialized with a maximum data output rate of 780 Mbps (12-bits x 65 MSPS).
4. The AD9229 operates from a single +3.0 V analog power supply.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 © 2003 Analog Devices, Inc. All rights reserved.
Page 2
AD9229 Preliminary Technical Data
TABLE OF CONTENTS
AD9229—Specifications ........................................................................3
DIGITAL SPECIFICATIONS...........................................................4
AC SPECIFICATIONS.......................................................................4
SWITCHING SPECIFICATIONS....................................................5
EXPLANATION OF TEST LEVELS................................................5
Absolute Maximum Ratings..................................................................6
EQuivalent circuits..................................................................................7
TYPICAL PERFORMANCE CHARACTERISTICS.........................8
Theory of Operation.............................................................................11
REVISION HISTORY
Revision PrA: Initial Version
Analog Inputs....................................................................................11
Voltage Reference..............................................................................11
Digital Outputs..................................................................................11
Timing ................................................................................................11
PLL......................................................................................................11
Pin Function Descriptions ...................................................................12
Pin Configurations................................................................................13
Timing Diagram....................................................................................14
Ordering Guide.................................................................................15
Revision PrB: Added Definition and Theory of Operation sections, updated Pin Configurations
Revision PrC: Deleted demux outputs
Revision PrD: Added Pin Info, Package Info
Revision PrE: Ch. 3.3V to 3.0V for supply, Updated Sinad spec typo, Added analog typical Cin, Overange Recovery Time, Latency
Revision PrF: Added 50MSPS Grade, Removed Clk-, Updated Power, SNR,LVDS Rset, Tpd Estimates, Added Equiv Ckts, Added FFT, VREF figure, Corrected FCO, DCO polarity timing
Rev. PrF | Page 2 of 15 Oct. 6, 2003
Page 3
Preliminary Technical Data AD9229
AD9229—SPECIFICATIONS1
AVDD = 3.0V, DRVDD = 3.0V; INTERNAL REFERENCE; DIFFERENTIAL ANALOG INPUTS,MAXIMUM SAMPLE RATE,T T
, UNLESS OTHERWISE NOTED
MAX
Parameter
Temp Test
Level
AD9229BCP-50
Min Typ Max
AD9229BCP-65
Min Typ Max
MIN
TO
Unit
RESOLUTION 12 12 Bits
ACCURACY
No Missing Codes Full VI Guaran
teed Offset Error Gain Error
Offset Matching Gain Matching2 Differential Nonlinearity (DNL)
25°C 25°C 25°C 25°C 25°C
I I
± 0.5
± 0.5
I mV I % FS I
± 0.3
Guaran
teed
± 0.5 ± 0.5
± 0.3
mV %FS
LSB Full VI LSB Integral Nonlinearity (INL)
25°C
I
± 0.6
± 0.6
LSB Full VI LSB
TEMPERATURE DRIFT
REFERENCE
Offset Error Full V Gain Error2 Full V Reference Full V Internal Reference Voltage
25°C
I 0.5 0.5 V
Output Current Full V uA Input Current Full V uA Input Resistance Full V
ppm/°C ppm/°C ppm/°C
k
Differential Input Voltage Range 1 –2 1 –2 Vpp
ANALOG INPUTS
Common Mode Voltage Full V 1.5 1.5 V Input Capacitance Full V 7 7 pF Analog Bandwidth, Full Power Full V 500 500 MHz AVDD Full IV 2.7
DRVDD Full IV 2.7
3.0
3.0
3.6 2.7
3.6 2.7
3.0
3.0
3.6 V
3.6 V
Power Dissipation3 Full VI 940 1250 mW
POWER SUPPLY
Power Down Dissipation Full VI <3 <3 mW Power Supply Rejection Ratio (PSRR)
25°C
I mV/V
IAVDD3 Full VI 268 367 mA IDRVDD3 Full VI 28 30 mA
IPLLVDD3 Full VI 18 19
Table 1: DC Specifications
1
Specifications subject to change without notice
2
Gain error and gain temperature coefficients are based on the ADC only (with a fixed 0.5 V external reference and a 1 V p-p differential analog input).
3
Power dissipation measured with rated encode and a dc analog input (Outputs Static, I
Rev. PrF | Page 3 of 15 Oct. 6, 2003
VDD
= 0.). I
VCC
and I
measured with TBD MHz analog input @ 0.5dBFS.
VDD
Page 4
AD9229 Preliminary Technical Data
DIGITAL SPECIFICATIONS
AVDD = 3.0V, DRVDD = 3.0V
Parameter
VIH Full IV 2.0 2.0 V
CLOCK INPUT
PDWN INPUT
DIGITAL OUTPUTS (LVDS Mode)*
*
LVDS Rset resistor = 3.6K, LVDS Output Termination Resistor= 100 Ohms.
VIL Full IV 0.8 0.8 V Input Capacitance
Logic ‘1’ Voltage Full IV 2.0 2.0 V Logic ‘0’ Voltage Full IV 0.8 0.8 V Input Capacitance Full IV 2 2 PF Differential Output Voltage
(VOD) Output Offset Voltage (VOS) Full IV 1.125 1.375 1.125 1.375 V Output Coding Full IV Offset Binary Offset Binary
Temp Test
25°C
Full IV 247 454 247 454 mV
Table 2: Digital Specifications
AC SPECIFICATIONS1
AD9229BCP-50
Level
IV 2 2 pF
Min Typ Max
AD9229BCP-65
Min Typ Max
Unit
AVDD = 3.0 V, DRVDD = 3.0V; INTERNAL REFERENCE; DIFFERENTIAL ANALOG INPUTS,MAXIMUM SAMPLE RATE,T T
, UNLESS OTHERWISE NOTED
MAX
Parameter Temp Test
Level
SIGNAL TO NOISE RATIO (SNR) – Without Harmonics
SIGNAL TO NOISE RATIO (SINAD) – With Harmonics
EFFECTIVE NUMBER OF BITS (ENOB)
SPURIOUS FREE DYNAMIC RANGE (SFDR)
SECOND AND THIRD HARMONIC DISTORTION
INTERMOD DISTORTION (IMD)
1
SNR/harmonics based on an analog input voltage of –0.5 dBFS referenced to a 1 Vpp full-scale input range.
fIN= 10.3 MHz fIN= 19.6 MHz fIN= 32.5 MHz fIN= 51 MHz fIN= 10.3 MHz fIN= 19.6 MHz fIN= 32.5 MHz fIN= 51 MHz fIN= 10.3 MHz fIN= 19.6 MHz fIN= 32.5 MHz fIN= 51 MHz fIN= 10.3 MHz fIN= 19.6 MHz fIN= 32.5 MHz fIN= 51 MHz fIN= 10.3 MHz fIN= 19.6 MHz fIN= 32.5 MHz fIN= 51 MHz f
= 19 MHz, f
IN1
f
= xx MHz, f
IN1
= 20 MHz
IN2
= xx MHz
IN2
25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C 25°C
V 70.5 70.5 dB V dB
I 69.7 69.7 dB V dB V 70.3 70.3 dB V dB
I 69.5 69.5 dB V dB V Bits V Bits
I Bits V Bits V dB V 85 85 dB
I dB V dB V dBc V -85 -85 dBc
I dBc V dBc V -85 -85 dBc TWO TONE V dBc
AD9229BCP-50
Min Typ Max
AD9229BCP-65
Min Typ Max
TO
MIN
Unit
Rev. PrF | Page 4 of 15 Oct. 6, 2003
Page 5
Preliminary Technical Data AD9229
Parameter Temp Test
Level
CROSSTALK Full V -80 -80 dB
Table 3: AC Specifications
SWITCHING SPECIFICATIONS
AVDD = 3.0 V, DRVDD = 3.0 V; DIFFERENTIAL ENCODE INPUT
AD9229BCP-50
Min Typ Max
AD9229BCP-65
Min Typ Max
Unit
Parameter Temp Test
Clock Rate Full VI 10 50 10 65 MSPS
CLOCK
OUTPUT PARAMETERS IN LVDS MODE
APERTURE Out of Range
Recovery Time
Clock Pulse Width High (tEH) Full IV ns Clock Pulse Width Low (tEL) Full IV ns Valid Time (tV)1 Full VI ns Propagation Delay (tPD) 1 Full VI 5 5 ns MSB Propagation Delay (t Rise Time (tR) (20% to 80%) Full V ns Fall Time (tF) (20% to 80%) Full V ns DCO Propagation Delay (t Data to DCO Skew (tPD – t Pipeline Latency Full VI 9 9 cycles Aperture Delay (tA)
Aperture Uncertainty (Jitter) Full IV 2 2 cycles
) 1 Full VI 5 5 ns
MSB
) Full VI 5 5 ns
CPD
) Full IV ns
CPD
EXPLANATION OF TEST LEVELS
TEST LEVEL
I 100% production tested.
AD9229BCP-50
Level
25°C 25°C
Table 4: Switching Specifications
V ps V <1 <1 ps rms
Min Typ Max
AD9229BCP-65
Min Typ Max
Unit
II 100% production tested at +25°C and guaranteed by design and characterization at specified temperatures.
III Sample tested only.
IV Parameter is guaranteed by design and characterization testing.
V Parameter is a typical value only.
VI 100% production tested at +25°C and guaranteed by design and characterization for industrial temperature range.
1
t
and t
are measured from the transition points of the CLK input to the 50%/50% levels of the digital outputs swing. The digital output load during test is
V
PD
not to exceed an ac load of 5 pF or a dc current of ±40 µA. Rise and fall times measured from 20% to 80%.
Rev. PrF | Page 5 of 15 Oct. 6, 2003
Page 6
AD9229 Preliminary Technical Data
ABSOLUTE MAXIMUM RATINGS
Parameter Rating
AVDD Voltage 3.9V DRVDD Voltage 3.9V Analog Input Voltage
Electrical
Environmental
Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Analog Input Current Digital Input Voltage Digital Output Current VREF Input Voltage Operating Temperature Range (Ambient)
Maximum Junction Temperature Lead Temperature (Soldering, 10 sec) Maximum Case Temperature Storage Temperature Range (Ambient)
Table 5: Absolute Maximum Ratings
-40°C to +85°C 150°C
Rev. PrF | Page 6 of 15 Oct. 6, 2003
Page 7
Preliminary Technical Data AD9229
EQUIVALENT CIRCUITS
AVDD
ANALOG IN
V-
DATAOUT-, DCO-,FCO-
V+
DRVDD
3.5MA
V+
DATAOUT+, DCO+,FCO+
V-
Figure 2 Analog Inputs
3.5MA
AVDDAVDD
Figure 4 LVDS Outputs
AVDDAVDD
CLK
Figure 3 Clock Input
PDWN
Figure 5 PDWN Input
Rev. PrF | Page 7 of 15 Oct. 6, 2003
Page 8
TYPICAL PERFORMANCE CHARACTERISTICS
0
-20
-40
-60
dB
-80
-100
-120 0 5 10 15 20 25 30
SNR = 68.7 dB SINAD = 68.5 dB SFDR = 88.6 dB
MHz
Measured FFT Performance 32MHz Ain at 65MSPS
Page 9
Preliminary Technical Data AD9229
02.6
Definitions
ANALOG BANDWIDTH
The analog input frequency at which the spectral power of the fundamental frequency (as determined by the FFT analysis) is reduced by 3 dB.
APERTURE DELAY
The delay between the 50% point of the rising edge of the ENCODE command and the instant at which the analog input is sampled.
APERTURE UNCERTAINTY (JITTER)
The sample-to-sample variation in aperture delay.
CROSSTALK
Coupling onto one channel being driven by a low level (-40 dBFS) signal when the adjacent interfering channel is driven by a full­scale signal.
DIFFERENTIAL ANALOG INPUT RESISTANCE, DIFFERENTIAL ANALOG INPUT CAPACITANCE, AND DIFFERENTIAL ANALOG INPUT IMPEDANCE
ENCODE PULSE WIDTH/DUTY CYCLE
Pulse width high is the minimum amount of time that the ENCODE pulse should be left in logic “1” state to achieve rated performance; pulse width low is the minimum time ENCODE pulse should be left in low state. See timing implications of changing tENCH in text. At a give clock rate, these specs define an acceptable Encode duty cycle.
FULL SCALE INPUT POWER
Expressed in dBm. Computed using the following equation:
2
V
Fullscale
 
Power
Fullscale
=
log10
Z
001.
 
GAIN ERROR
Gain error is the difference between the measured and ideal full scale input voltage range of the worst ADC.
Input
rms
    
The real and complex impedances measured at each analog input port. The resistance is measured statically and the capacitance and differential input impedances are measured with a network analyzer.
DIFFERENTIAL ANALOG INPUT VOLTAGE RANGE
The peak to peak differential voltage that must be applied to the converter to generate a full scale response. Peak differential voltage is computed by observing the voltage on a single pin and subtracting the voltage from the other pin, which is 180 degrees out of phase. Peak to peak differential is computed by rotating the inputs phase 180 degrees and taking the peak measurement again. Then the difference is computed between both peak measurements.
DIFFERENTIAL NONLINEARITY
The deviation of any code width from an ideal 1 LSB step.
EFFECTIVE NUMBER OF BITS
The effective number of bits (ENOB) is calculated from the measured SNR based on the equation:
ENOB
=
MEASURED
76.1 dBSNR
GAIN MATCHING
Expressed in %FSR. Computed using the following equation:
minmax
=
ngGainMatchi
 
where FSR FSR
min
HARMONIC DISTORTION, SECOND
The ratio of the rms signal amplitude to the rms value of the second harmonic component, reported in dBc.
HARMONIC DISTORTION, THIRD
The ratio of the rms signal amplitude to the rms value of the third harmonic component, reported in dBc.
INTEGRAL NONLINEARITY
The deviation of the transfer function from a reference line measured in fractions of 1 LSB using a “best straight line” determined by a least square curve fit.
is the most positive gain error of the ADCs and
max
is the most negative gain error of the ADCs.
FSRFSR
+
2
minmax
FSRFSR
 
%100*
Rev. PrF | Page 9 of 15 Oct. 6, 2003
Page 10
AD9229 Preliminary Technical Data
=
MINIMUM CONVERSION RATE
The encode rate at which the SNR of the lowest analog signal frequency drops by no more than 3 dB below the guaranteed limit.
the rms value of the sum of all other spectral components, including harmonics but excluding dc.
SIGNAL-TO-NOISE RATIO (WITHOUT HARMONICS)
MAXIMUM CONVERSION RATE
The encode rate at which parametric testing is performed.
OFFSET ERROR
Offset error is the difference between the measured and ideal voltage at the analog input that produces the midscale code at the outputs. Offset error is given for the worst ADC.
OFFSET MATCHING
Expressed in mV. Computed using the following equation:
minmax OFFOFFhingOffsetMatc
where OFF most negative offset error.
is the most positive offset error and OFF
max
min
is the
OUTPUT PROPAGATION DELAY
The delay between a differential crossing of CLK+ and CLK- and the time when all output data bits are within valid logic levels.
NOISE (FOR ANY RANGE WITHIN THE ADC)
The ratio of the rms signal amplitude (set at 1 dB below full scale) to the rms value of the sum of all other spectral components, excluding the first five harmonics and dc.
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
The ratio of the rms signal amplitude to the rms value of the peak spurious spectral component. The peak spurious component may or may not be a harmonic. It also may be reported in dBc (i.e., degrades as signal level is lowered) or dBFS (i.e., always related back to converter full scale).
TWO-TONE INTERMODULATION DISTORTION REJECTION
The ratio of the rms value of either input tone to the rms value of the worst third order intermodulation product; reported in dBc.
TWO-TONE SFDR
The ratio of the rms value of either input tone to the rms value of the peak spurious component. The peak spurious component may or may not be an IMD product. It also may be reported in dBc (i.e., degrades as signal level is lowered) or in dBFS (i.e., always relates back to converter full scale).
 
=
noise
Where Z is the input impedance, FS is the full scale of the device for the frequency in question, SNR is the value for the particular input level and Signal is the signal level within the ADC reported in dB below full scale. This value includes both thermal and quantization noise.
ZV
10*001.*
SignalSNRFS
10
dBFSdBcdBm
 
POWER SUPPLY REJECTION RATIO
The ratio of a change in input offset voltage to a change in power supply voltage.
SIGNAL-TO-NOISE-AND-DISTORTION (SINAD)
The ratio of the rms signal amplitude (set 1 dB below full scale) to
WORST OTHER SPUR
The ratio of the rms signal amplitude to the rms value of the worst spurious component (excluding the second and third harmonic) reported in dBc.
TRANSIENT RESPONSE TIME
Transient response time is defined as the time it takes for the ADC to reacquire the analog input after a transient from 10% above negative full scale to 10% below positive full scale.
OUT-OF-RANGE RECOVERY TIME
Out of range recovery time is the time it takes for the ADC to reacquire the analog input after a transient from 10% above positive full scale to 10% above negative full scale, or from 10% below negative full scale to 10% below positive full scale.
Rev. PrF | Page 10 of 15 Oct. 6, 2003
Page 11
Preliminary Technical Data AD9229
AD9229
10 uF
uF 10
uF
THEORY OF OPERATION
Analog Inputs
recommended to keep the trace length no longer than 1–2 inches and to keep differential output trace lengths as equal as possible.
For best dynamic performance, the source impedances driving VIN+ and VIN– should be matched such that common-mode settling errors are symmetrical. These errors will be reduced by the common-mode rejection of the A/D.
Voltage Reference
The AD9229 has a stable and accurate reference voltage on chip, which sets the full-scale voltage at the analog input channels. Internal reference mode is established by grounding the SENSE pin. (Recommended decoupling capacitors shown below) The internal reference can be bypassed by setting SENSE to AVDD and driving VREF with an external 1V reference.
VINA
0.1 u F
SENSE
VINB
VREF
SELECT
LOGIC
CORE
ADC
REFT
0.1 uF
0.1
REFB
0.1 uF
0.5V
The format of the output data is offset binary.
Timing
Data from each A/D is serialized and provided on a separate channel.
Two output clocks are provided to assist in capturing data from the AD9229. The data clock out (DCO) is used to clock the output data and is equal to 6 times the sample clock frequency. ( 390MHz for 65MHz input clock) Data is clocked out of the AD9229 on the rising and falling edges of DCO. The FCO clock signals the start of a new serial word, the rising edge of FCO occurs at the start of an MSB.
PLL
The AD9229 contains an internal PLL that is used to generate internal clocking signals, if the PLL is unlocked, the data outputs are static.
Internal Reference Mode Connection
Digital Outputs
The AD9229’s differential outputs conform to the ANSI-644 LVDS standard. To set the LVDS bias current, place a resistor (RSET is nominally equal to 3.6 k) to ground at the LVDSBIAS pin. The RSET resistor current (~ 1.2/RSET) is ratioed on-chip setting the output current at each output equal to a nominal 3.5 mA. A 100 differential termination resistor placed at the LVDS receiver inputs results in a nominal 350 mV swing at the receiver.
The AD9229’s LVDS outputs facilitate interfacing with LVDS receivers in custom ASICs and FPGAs that have LVDS capability for superior switching performance in noisy environments. Single point-to-point net topologies are recommended with a 100 termination resistor as close to the receiver as possible. It is
Rev. PrF | Page 11 of 15 Oct. 6, 2003
Page 12
AD9229 Preliminary Technical Data
PIN FUNCTION DESCRIPTIONS
Pin No. Name Description Pin No. Name Description
8,16,21,
29
9,12,15,
22,25,28,
31
2,35 DRVDD 1,36 DRGND Digital Ground 41 D-B ADC B Complement Digital Output
32 PLLVDD 33 PLLGND PLL Ground 39 D-C ADC C Complement Digital Output
30 CLK Input Clock 38 D+D ADC D True Digital Output 18 VREF Voltage Reference Input/Output 37 D1-D ADC D Complement Digital Output 17 SENSE Reference Mode Selection 48 DCO+ Data Clock Output – True 20 REFT Differential Reference (Positive) 47 DCO- Data Clock Output – Complement 19 REFB Differential Reference (Negative) 46 FCO+ Frame Clock Indicator – True Output 10 VIN+A ADC A Analog Input – True 45 FCO- Frame Clock Indicator – Complement Output 11 VIN-A ADC A Analog Input – Complement 34 LVDSBIAS LVDS Output Current Set Resistor Pin 14 VIN+B ADC B Analog Input – True 7 PDWN Power Down Selection ( Logic ‘1’ = Power Down ) 13 VIN-B ADC B Analog Input – Complement 3,4,5,6 DNC Do Not Connect 23 VIN+C ADC C Analog Input – True 24 VIN-C ADC C Analog Input – Complement 27 VIN+D ADC D Analog Input – True 26 VIN-D ADC D Analog Input – Complement
AVDD
AGND Analog Ground 43 D-A ADC A Complement Digital Output
3.0 V Analog Supply
3.0 V Digital Output Supply
PLL 3.0V Supply
Table 6: Pin Function Descriptions
44 D+A ADC A True Digital Output
42 D+B ADC B True Digital Output
40 D+C ADC C True Digital Output
Rev. PrF | Page 12 of 15 Oct. 6, 2003
Page 13
Preliminary Technical Data AD9229
PIN CONFIGURATIONS
DCO+
DCO-
FCO+
FCO-
D+A
D-A
D+B
D-B
D+C
D-C
D+D
D-D
DRGND DRVDD
DNC DNC DNC DNC
PDWN
AVDD AGND VIN+A
VIN-A AGND
1
12
13
3748
36
AD9229
25
DRGND DRVDD
LVDSBIAS
PLLGND PLLVDD
AGND
CLK AVDD AGND VIN+D
VIN-D AGND
24
VIN-B
AGND
VIN+B
VREF
AVDD
SENSE
REFT
REFB
AVDD
VIN-C
AGND
VIN+C
Rev. PrF | Page 13 of 15 Oct. 6, 2003
Page 14
AD9229 Preliminary Technical Data
TIMING DIAGRAM
N-1
AIN
CLK
Data
Out
DCO+
DCO-
FCO-
FCO+
t
A
t
EH
t
PD
MSB
LSB D10 D9 D8 D7 D6 D5 D4 D3 D2 D1
t
CPD
t
FPD
t
EL
LSB
N
MSB
Figure 6: Serial LVDS Outputs
NOTE : Latency = 9 cycles
Rev. PrF | Page 14 of 15 Oct. 6, 2003
Page 15
Preliminary Technical Data AD9229
OUTLINE DIMENSIONS
Figure 7
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Ordering Guide
Model Temperature Range Description
AD9229BCP-50 AD9229BCP-65 AD9229/PCB 25°C (Ambient) Evaluation Board ( Supplied with –65 Grade )
© 2002 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective companies. Printed in the U.S.A. C02959-0-11/02(0)
-40°C to +85°C (Ambient)
-40°C to +85°C (Ambient)
48-LFCSP 48-LFCSP
Table 7: Ordering Guide
Rev. PrF | Page 15 of 15 Oct. 6, 2003
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