FEATURES
Monolithic Construction
Fast Conversion: 5.3 ms
High Throughput: 166 kSPS
Low Power: 250 mW
APPLICATIONS
Automatic Test Equipment
Medical Instrumentation
Industrial Control
Data Acquisition Systems
Robotics
GENERAL DESCRIPTION
The AD7884/AD7885 is a 16-bit monolithic analog-to-digital
converter with internal sample-and-hold and a conversion time
of 5.3 µs. The maximum throughput rate is 166 kSPS. It uses a
two pass flash architecture to achieve this speed. Two input
ranges are available: ±5 V and ±3 V. Conversion is initiated by
the
CONVST signal. The result can be read into a microproces-
sor using the
CS and RD inputs on the device. The AD7884 has
a 16-bit parallel reading structure while the AD7885 has a byte
reading structure. The conversion result is in 2s complement
code.
The AD7884/AD7885 has its own internal oscillator which controls conversion. It runs from ± 5 V supplies and needs a V
REF+
of +3 V.
The AD7884 is available in a 40-pin plastic DIP package and in
a 44-pin PLCC package.
The AD7885 is available in a 28-pin plastic DIP package and
the AD7885A is available in a 44-pin PLCC package.
AD7884/AD7885
FUNCTIONAL BLOCK DIAGRAMS
REV. C
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700Fax: 617/326-8703
Page 2
AD7884/AD7885/AD7885A–SPECIFICATIONS
= +3 V; AGND = DGND = GND = 0 V; f
ParameterVersion
= 166 kHz. All specifications T
SAMPLE
AB
1, 2, 3
Versions
to T
MIN
1, 2, 3
UnitsTest Conditions/Comments
, unless otherwise noted.)
MAX
(VDD = +5 V 6 5%, VSS = –5 V 6 5%, V
REF
+S
DC ACCURACY
Resolution1616Bits
Minimum Resolution for Which
No Missing Codes Are Guaranteed1616Bits
Integral Nonlinearity±0.0075% FSR maxTypically 0.003% FSR
Positive Gain Error±0.03±0.03% FSR typAD7885AN/BN: 0.1% typ
Positive Gain Error±0.05% FSR maxAD7885BN: 0.2% max
Gain TC
4
±2±2ppm FSR/°C typ
Bipolar Zero Error±0.05±0.05% FSR typ
Bipolar Zero Error±0.15% FSR max
Bipolar Zero TC
4
±8±8ppm FSR/°C typ
Negative Gain Error±0.03±0.03% FSR typAD7885AN/BN: 0.1% typ
Negative Gain Error±0.05% FSR maxAD7885BN: 0.2% max
Offset TC
4
±2±2ppm FSR/°C typ
Noise120120µV rms typ78 µV rms typical in ±3 V Input Range
DYNAMIC PERFORMANCE
Signal to (Noise + Distortion) Ratio8484dB minInput Signal: ±5 V, 1 kHz Sine Wave, Typically 86 dB
8282dB typInput Signal: ±5 V, 12 kHz Sine Wave
Total Harmonic Distortion–88–88dB maxInput Signal: ±5 V, 1 kHz Sine Wave
–84–84dB typInput Signal: ±5 V, 12 kHz Sine Wave
Peak Harmonic or Spurious Noise–88–88dB maxInput Signal: ±5 V, 1 kHz Sine Wave
Intermodulation Distortion (IMD)
2nd Order Terms–84–84dB typf
= 11.5 kHz, fB = 12 kHz, f
A
3rd Order Terms–84–84dB typfA = 11.5 kHz, fB = 12 kHz, f
SAMPLE
SAMPLE
= 166 kHz
= 166 kHz
CONVERSION TIME
Conversion Time5.35.3µs max
Acquisition Time2.52.5µs max
Throughput Rate166166kSPS maxThere is an overlap between conversion and acquisition.
ANALOG INPUT
Voltage Range±5±5Volts
±3±3Volts
Input Current±4±4mA max
REFERENCE INPUT
Reference Input Current±5±5mA maxV
+ S = +3 V
REF
LOGIC INPUTS
Input High Voltage, V
Input Low Voltage, V
Input Current, I
Input Capacitance, C
IN
IN
INH
INL
4
2.42.4V minVDD = 5 V ± 5%
0.80.8V maxVDD = 5 V ± 5%
±10±10µA maxInput Level = 0 V to V
1010pF max
LOGIC OUTPUTS
Output High Voltage, V
Output Low Voltage, V
OL
OH
4.04.0V minI
0.40.4V maxI
SOURCE
= 1.6 mA
SINK
= 40 µA
DB15–DB0
Floating-State Leakage Current1010µA max
Floating-State Output Capacitance41515pF max
POWER REQUIREMENTS
V
DD
V
SS
I
DD
I
SS
+5+5V nom±5% for Specified Performance
–5–5V nom±5% for Specified Performance
3535mA maxTypically 25 mA
3030mA maxTypically 25 mA
Power Supply Rejection Ratio
∆Gain/∆V
∆Gain/∆V
DD
SS
8686dB typ
8686dB typ
Power Dissipation325325mW maxTypically 250 mW
NOTES
1
Temperature ranges are as follows: A, B Versions: –40 °C to +85°C.
2
VIN = ±5 V.
3
The AD7885AAP has the same specs as the AD7884AP. The AD7885ABP has the same specs as the AD7884BP.
4
Sample tested to ensure compliance.
Specifications subject to change without notice.
–2–
DD
REV. C
Page 3
TIMING CHARACTERISTICS
AD7884/AD7885
1, 2
(VDD = +5 V 6 5%, VSS = –5 V 6 5%, AGND = DGND = GND = 0 V. See Figures 2, 3, 4 and 5.)
Limit at +258CLimit at T
MIN
, T
MAX
Parameter(All Versions)(A, B Versions)UnitsConditions/Comments
t
1
t
2
t
3
t
4
t
5
2
t
6
3
t
7
5050ns minCONVST Pulse Width
100100ns maxCONVST to BUSY Low Delay
00ns minCS to RD Setup Time
6060ns minRD Pulse Width
00ns minCS to RD Hold Time
5757ns maxData Access Time after RD
55ns minBus Relinquish Time after RD
5050ns max
t
8
t
9
t
10
t
11
t
12
t
13
t
14
NOTES
1
Timing specifications in bold print are 100% production tested. All other times are sample tested at +5°C to ensure compliance. All input signals are specified
with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2
t6 is measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.
3
t7 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then extrapolated back to remove the effects of charging or discharging the 100 pF capacitor. This means that the time, t
bus relinquish time of the part and as such is independent of external bus loading capacitances.
Specifications subject to change without notice.
4040ns minNew Data Valid before Rising Edge of BUSY
1080ns minHBEN to RD Setup Time
2525ns minHBEN to RD Hold Time
6060ns minHBEN Low Pulse Duration
6060ns minHBEN High Pulse Duration
5570ns maxPropagation Delay from HBEN Falling to Data Valid
5570ns maxPropagation Delay from HBEN Rising to Data Valid
, quoted in the Timing Characteristics is the true
AD7884AN –40°C to +85°C84N-40A
AD7884BN –40°C to +85°C ±0.007584N-40A
AD7884AP–40°C to +85°C84P-44A
AD7884BP–40°C to +85°C ±0.007584P-44A
AD7885AN –40°C to +85°C84N-28A
AD7885BN –40°C to +85°C ±0.007584N-28A
AD7885AAP –40°C to +85°C84P-44A
AD7885ABP –40°C to +85°C ± 0.007584P-44A
NOTES
1
Analog Devices reserves the right to ship cerdip (Q) packages in lieu of plastic
DIP (N) packages.
2
N = Plastic DIP; P = Plastic Leaded Chip Carrier (PLCC).
TO OUTPUT PIN
C
L
100pF
1.6mA
200µA
I
OL
+2.1V
I
OH
Figure 1. Load Circuit for Access Time and Bus Relinquish
Time
REV. C
–3–
Page 4
AD7884/AD7885
DATA
OLD DATA VALIDNEW DATA VALID
BUSY
CONVST
t
1
t
2
t
8
t
CONVERT
t
CS
RD
1
t
2
CONVST
HBEN
BUSY
DATA
RD
t
3
t
CONVERT
Hi-Z
t
1
CS
t
2
t
CONVERT
Hi-ZHi-Z
CONVST
BUSY
DATA
Figure 2. AD7884 Timing Diagram, Using
CS
t
6
t
4
DATA
VALID
and
RD
t
5
t
7
Hi-Z
Figure 3. AD7884 Timing Diagram, with CS and
RD
Permanently Low
t
9
t
3
t
6
t
4
DATA
VALID
DB0–DB7DB8–DB15
t
10
t
5
t
7
DATA
VALID
Hi-Z
Figure 4. AD7885 Timing Diagram, Using CS and
t
CONVST
HBEN
BUSY
DATA
1
t
2
OLD DATA VALID
(DB8 – DB15)
Figure 5. AD7885 Timing Diagram, with CS and RD Permanently Low
RD
t
11
t
CONVERT
t
8
NEW DATA VALID
(DB8 – DB15)
–4–
t
13
NEW DATA VALID
(DB0 – DB7)
t
t
14
NEW DATA VALID
12
(DB8 – DB15)
NEW DATA VALID
(DB0 – DB7)
REV. C
Page 5
AD7884/AD7885
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
AV
to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
DD
V
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –7 V
SS
AV
to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to –7 V
SS
AGND Pins to DGND . . . . . . . . . . . . –0.3 V to V
AV
DD
AV
to V
SS
to V
2
. . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those listed in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
2
If the AD7884/AD7885 is being powered from separate analog and digital supplies,
AVSS should always come up before VSS. See Figure 12 for a recommended
protection circuit using Schottky diodes.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although these devices feature proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
PIN CONFIGURATIONS
DIP
F
S
S
IN
IN
IN
±5V
±3V
V
INV
V
REF–
±3V S
IN
±3V F
IN
±5V S
IN
±5V F
IN
AGNDS
AGNDF
AV
AV
GND
GND
V
V
V
CONVST
CS
RD
V
BUSY
DD
SS
SS
SS
DD
SS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
AD7884
TOP VIEW
(Not to Scale)
V
40
V S
REF+
V F
39
REF+
38
DB15
37
DB14
DB13
36
DB12
35
34
DB11
DB10
33
32
DB9
DB8
31
DGND
30
V
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
CONVST
DD
29
28
27
26
25
24
23
22
21
REF–
±3V
±5V S
IN
±5V F
IN
AGNDS
AGNDF
AV
AV
GND
V
V
CS
RD
DD
SS
SS
DD
IN
1
2
3
4
5
6
7
8
9
10
11
12
13
14
AD7885
TOP VIEW
(Not to Scale)
V
28
INV
27
V S
REF+
26
V F
REF+
DB7
25
24
DB6
DB5
23
DB4
22
DGND
21
20
DB3
DB2
19
DB1
18
DB0
17
16
BUSY
HBEN
15
±5VINF
AGNDS
AGNDF
AV
AV
GND
GND
±5VINF
AGNDS
AGNDF
AV
AV
GND
GND
7
8
9
10
DD
11
SS
12
NC
13
14
V
15
SS
V
16
SS
V
17
DD
7
8
9
10
DD
SS
11
NC
12
13
14
V
15
SS
V
16
SS
V
17
DD
±3V
18 19 20 21 22 23 24 25 26 27 28
CONVST
S
±5V
18 19 20 21 22 23 24
CS
F
IN
±3V
CS
CONVST
SS
RD
V
S
IN
IN
±3V
RD
HBEN
PLCC
INVVREF
NC
V
2144345642 41 4043
AD7884
TOP VIEW
(Not to Scale)
NC
BUSY
INVVREF
NC
V
2144345642 41 4043
AD7885A
TOP VIEW
(Not to Scale)
NC
BUSY
S
F
REF+
REF+
V
V
DB1
DB0
NC = NO CONNECT
S
F
REF+
REF+
V
V
25 26 27 28
NCNCNC
NC = NO CONNECT
DB15
DB2
DB14
DB3
NC
DB13
DB4
NCNCNC
DB0
DB12
39
DB11
38
37
DB10
36
DB9
35
DB8
NC
34
DGND
33
V
DD
32
DB7
31
DB6
30
DB5
29
DB7
39
DB6
38
NC
37
36
DB5
35
DB4
34
NC
33
DGND
V
32
DD
DB3
31
DB2
30
DB1
29
REV. C
–5–
Page 6
AD7884/AD7885
PIN FUNCTION DESCRIPTION
AD7884AD7885AD7885ADescription
V
INV
V
INV
V
INV
This pin is connected to the inverting terminal of an op amp, as in Figure 6, and allows
the inversion of the supplied +3 V reference.
V
REF–
V
REF–
V
REF–
This is the negative reference input, and it can be obtained by using an external amplifier
to invert the positive reference input. In this case, the amplifier output is connected to
V
See Figure 6.
REF–.
S_ ±3 VINSThis is the analog input sense pin for the ±3 volt analog input range on the AD7884 and
±3 V
IN
AD7885A.
±3 V
F_±3 VINFThis is the analog input force pin for the ±3 volt analog input range on the AD7884 and
IN
AD7885A. When using this input range, the ± 5 V
F and ±5 VINS pins should be tied to
IN
AGND.
–±3 V
±5 V
S±5 VINS± 5 VINSThis is the analog input sense pin for the ±5 volt analog input range on both the AD7884,
IN
IN
–This is the analog input pin for the ±3 volt analog input range on the AD7885. When us-
ing this input range, the ±5 V
F and ±5 VINS pins should be tied to AGND.
IN
AD7885 and AD7885A.
±5 V
F±5 VINF±5 VINFThis is the analog input force pin for the ±5 volt analog input range on both the AD7884,
IN
AD7885 and AD7885A. When using this input range, the ±3 V
F and ±3 VINS pins
IN
should be tied to AGND.
AGNDSAGNDSAGNDSThis is the ground return sense pin for the 9-bit ADC and the on-chip residue amplifier.
AGNDFAGNDFAGNDFThis is the ground return force pin for the 9-bit ADC and the on-chip residue amplifier.
AV
AV
DD
SS
AV
AV
DD
SS
AV
AV
DD
SS
Positive analog power rail for the sample-and-hold amplifier and the residue amplifier.
Negative analog power rail for the sample-and-hold amplifier and the residue amplifier.
GNDGNDGNDThis is the ground return for sample-and-hold section.
V
SS
V
DD
V
SS
V
DD
V
SS
V
DD
Negative supply for the 9-bit ADC.
Positive supply for the 9-bit ADC and all device logic.
CONVSTCONVSTCONVSTThis asynchronous control input starts conversion.
CSCSCSChip Select control input.
RDRDRDRead control input. This is used in conjunction with CS to read the conversion result
from the device output latch.
–HBENHBENHigh Byte Enable. Active high control input for the AD7885. It selects either the high or
the low byte of the conversion for reading.
BUSYBUSYBUSYBusy output. The Busy output goes low when conversion begins and stays low until it is
completed, at which time it goes high.
DB0–DB15––Sixteen-bit parallel data word output on the AD7884.
–DB0–DB7DB0–DB7Eight-bit parallel data byte output on the AD7885.
DGNDDGNDDGNDGround return for all device logic.
V
FV
REF+
V
SV
REF+
FV
REF+
SV
REF+
FReference force input.
REF+
SReference sense input. The device operates from a +3 V reference.
REF+
–6–
REV. C
Page 7
AD7884/AD7885
±3VIN F
±5V
IN
F
–5V
+5V
AD817
AD711
AD817
AGNDS
AGNDF
AD7884
AD7885
A1
A3
A4
AD845, AD817 OR
EQUIVALENT
NOTE: POWER SUPPLY DECOUPLING NOT SHOWN
A2
GND
DGND
VDD = +5V
DATA
OUTPUTS
CONTROL
INPUTS
V
INV
V
REF+
S
V
REF+
F
V
REF–
±3VIN S
±5V
IN
S
AV
SS
V
DD
AV
DD
V
SS
V
IN
AD845, AD817 OR
EQUIVALENT
AD780
2
6
8
4
10µF
TERMINOLOGY
Integral Nonlinearity
This is the maximum deviation from a straight line passing
through the endpoints of the ADC transfer function.
Differential Nonlinearity
This is the difference between the measured and the ideal 1 LSB
change between any two adjacent codes in the ADC.
Bipolar Zero Error
This is the deviation of the midscale transition (all 0s to all 1s)
from the ideal (AGND).
Positive Gain Error
This is the deviation of the last code transition (01 . . . 110 to
01 . . . 111) from the ideal (+V
S – 1 LSB), after Bipolar
REF+
Zero Error has been adjusted out.
Negative Gain Error
This is the deviation of the first code transition (10 . . . 000 to
10 . . . 001) from the ideal (–V
S + 1 LSB), after Bipolar
REF+
Zero Error has been adjusted out.
Signal to (Noise + Distortion) Ratio
This is the measured ratio of signal to (noise + distortion) at the
output of the A/D converter. The signal is the rms amplitude of
the fundamental. Noise is the rms sum of all nonfundamental
signals up to half the sampling frequency (f
/2), excluding dc.
S
The ratio is dependent upon the number of quantization levels
in the digitization process; the more levels, the smaller the quantization noise. The theoretical signal to (noise + distortion) ratio
for an ideal N-bit converter with a sine wave input is given by:
Signal to (Noise + Distortion) = (6.02N + 1.76) dB
Thus for an ideal 16-bit converter, this is 98 dB.
Total Harmonic Distortion
Total harmonic distortion (THD) is the ratio of the rms sum of
harmonics to the fundamental. For the AD7884/AD7885, it is
defined as:
2
2
2
2
+V
+V
V
THD(dB)=20 log
2
where V1 is the rms amplitude of the fundamental and V2, V3,
V
, V5 and V6 are the rms amplitudes of the second through the
4
+V
3
4
V
1
2
+V
5
6
sixth harmonics.
Peak Harmonic or Spurious Noise
Peak harmonic or spurious noise is defined as the ratio of the
rms value of the next largest component in the ADC output
spectrum (up to f
fundamental. Normally, the value of this specification is determined by the largest harmonic in the spectrum, but for parts
/2 and excluding dc) to the rms value of the
S
where the harmonics are buried in the noise floor, it will be a
noise peak.
Intermodulation Distortion
With inputs consisting of sine waves at two frequencies, fa and
fb, any active device with nonlinearities will create distortion
products at sum and difference frequencies of mfa ± nfb where
m, n = 0, 1, 2, 3, etc. Intermodulation terms are those for which
neither m or n are equal to zero. For example, the second order
terms include (fa + fb) and (fa – fb), while the third order terms
include (2fa + fb), (2fa – fb), (fa + 2fb) and (fa – 2fb).
REV. C
The AD7884/AD7885 is tested using the CCIFF standard
where two input frequencies near the top end of the input bandwidth are used. In this case, the second and third order terms
are of different significance. The second order terms are usually
distanced in frequency from the original sine waves while the
third order terms are usually at a frequency close to the input
frequencies. As a result, the second and third order terms are
specified separately. The calculation of the intermodulation distortion is as per the THD specification where it is the ratio of
the rms sum of the individual distortion products to the rms amplitude of the fundamental expressed in dBs.
Power Supply Rejection Ratio
This is the ratio, in dBs, of the change in positive gain error to
the change in V
or VSS. It is a dc measurement.
DD
OPERATIONAL DIAGRAM
An operational diagram for the AD7884/AD7885 is shown in
Figure 6. It is set up for an analog input range of ±5 V. If a
±3 V input range is required, A1 should drive ±3 V
±3 V
F with ±5 VINS, ±5 VINF being tied to system AGND.
IN
S and
IN
Figure 6. AD7884/AD7885 Operational Diagram
The chosen input buffer amplifier (A1) should have low noise
and distortion and fast settling time for high bandwidth applications. Both the AD711 and the AD845 are suitable amplifiers.
A2 is the force, sense amplifier for AGND. The AGNDS pin
should be at zero potential. Therefore, the amplifier must have a
low input offset voltage and good noise performance. It must
also have the ability to deal with fast current transients on the
AGNDS pin. The AD817 has the required performance and is
the recommended amplifier.
If AGNDS and AGNDF are simply tied together to Star
Ground instead of buffering, the SNR and THD are not significantly degraded. However, dc specifications like INL, Bipolar
Zero and Gain Error will be degraded.
–7–
Page 8
AD7884/AD7885
The required +3 V reference is derived from the AD780 and
buffered by the high-speed amplifier A3 (AD845, AD817 or
equivalent). A4 is a unity gain inverter which provides the –3 V
negative reference. The gain setting resistors are on-chip and
are factory trimmed to ensure precise tracking of V
REF+
. Figure
6 shows A3 and A4 as AD845s or AD817s. These have the ability
to respond to the rapidly changing reference input impedance.
CIRCUIT DESCRIPTION
Analog Input Section
The analog input section of the AD7884/AD7885 is shown in
Figure 7. It contains both the input signal conditioning and
sample-and-hold amplifier. Note that the analog input is truly
benign. When SW1a goes open circuit to put the SHA into the
hold mode, SW1b is closed. This means that the input resistors, R1 and R2 are always connected to either virtual ground
or true ground.
R3 3kΩ
±3V F
IN
±3V S
IN
±5V F
IN
±5V S
IN
R1 3kΩ
SW1a
R2 5kΩ
SW1b
C1
A1
TO RESIDUE
AMPLIFIER A2
R4 4kΩ
R6 2kΩ
V
REF–
R5 4kΩ
TO
9-BIT
ADC
Figure 7. AD7884/AD7885 Analog Input Section
When the ±3 VINS and ±3 VINF inputs are tied to 0 V, the input section has a gain of –0.6 and transforms an input signal
of ±5 volts to the required ±3 volts. When the ±5 V
±5 V
F inputs are grounded, the input section has a gain of
IN
S and
IN
–1 and so the analog input range is now ± 3 volts. Resistors R4
and R5, at the amplifier output, further condition the ± 3 volts
signal to be 0 to –3 volts. This is the required input for the 9-bit
A/D converter section.
With SW1a closed, the output of A1 follows the input (the
sample-and-hold is in the track mode). On the rising edge of
the
CONVST pulse, SW1a goes open circuit, and capacitor C1
holds the voltage on the output of A1. The sample-andhold is now in the hold mode. The aperture delay time for the
sample-and-hold is nominally 50 ns.
A/D Converter Section
The AD7884/AD7885 uses a two-pass flash technique in order
to achieve the required speed and resolution. When the
CONVST
control input goes from low to high, the sample-and-hold amplifier goes into the hold mode and a 0 V to –3 V signal is presented to the input of the 9-bit ADC. The first phase of
conversion generates the 9 MSBs of the 16-bit result and transfers these to the latch and ALU combination. They are also fed
back to the 9 MSBs of the 16-bit DAC. The 7 LSBs of the
DAC are permanently loaded with 0s. The DAC output is subtracted from the analog input with the result being amplified
and offset in the Residue Amplifier Section. The signal at the
output of A2 is proportional to the error between the first phase
result and the actual analog input signal and is digitized in the
second conversion phase. This second phase begins when the
16-bit DAC and the Residue Error Amplifier have both settled.
First, SW2 is turned off and SW3 is turned on. Then, the SHA
section of the Residue Amplifier goes into hold mode. Next
SW2 is turned off and SW3 is turned on. The 9-bit result is
transferred to the output latch and ALU. An error correction algorithm now compensates for the offset inserted in the Residue
Amplifier Section and errors introduced in the first pass conversion and combines both results to give the 16-bit answer.
±3V SIGNAL
FROM INPUT
SHA
R6
2kΩ
R4
RESIDUE AMP
V F
REF+
4kΩ
R5
4kΩ
A2
+
SHA
ACCURATE
+3V–3V
V S
REF+
0 TO –3V
V
REF–
16-BIT
DAC
R7
2kΩ
9-BIT
ADC
SW2
SW3
9
R8
2kΩ
V
V
REF–
INV
9
9
LATCH
+
ALU
16
Figure 8. A/D Converter Section
–8–
REV. C
Page 9
Timing and Control Section
A1
V
INV
±3V S
IN
IN
±3V F
±5V S
IN
IN
±5V F
±3V S
IN
IN
±3V F
±5V S
IN
IN
±5V F
A1
V
INV
Figure 9 shows the timing and control sequence for the
AD7884/AD7885. When the part receives a
CONVST pulse,
the conversion begins. The input sample-and-hold goes into the
hold mode 50 ns after the rising edge of
CONVST and BUSY
goes low. This is the first phase of conversion and takes 3.35 µs
to complete. The second phase of conversion begins when SW2
is turned off and SW3 turned on. The Residue Amplifier and
SHA section (A2 in Figure 8) goes into hold mode at this point
and allows the input sample-and-hold to go back into sample
mode. Thus, while the second phase of conversion is ongoing,
the input sample-and-hold is also acquiring the input signal for
the next conversion. This overlap between conversion and acquisition allows throughput rates of 166 kSPS to be achieved.
AD7884/AD7885
Figure 10. ±5 V Input Range Connection
CONVST
BUSY
HOLDINPUT
SHA
SAMPLE
FIRST PHASE OF CONVERSION
1ST 9-BIT CONVERSION
DAC SETTLING TIME
RESIDUE AMPLIFIER
SETTLING TIME
FIRST PHASE
3.5µs
SECOND PHASE OF CONVERSION
2ND 9-BIT CONVERSION
ERROR CORRECTION
OUTPUT LATCH UPDATE
SECOND
PHASE
1.8µs
TACQ
2.5µs
Figure 9. Timing and Control Sequence
USING THE AD7884/AD7885 ANALOG INPUT RANGES
The AD7884/AD7885 can be set up to have either a ± 3 volts
analog input range or a ±5 volts analog input range. Figures 10
and 11 show the necessary corrections for each of these. The
output code is 2s complement and the ideal code table for both
input ranges is shown in Table I.
Reference Considerations
The AD7884/AD7885 operates from a ± 3 volt reference. This
can be derived simply using the AD780 as shown in Figure 6.
Table I. Ideal Output Code Table for the AD7884/AD7885
In Terms of FSR263 V Range
Analog Input
3
65 V Range
Figure 11. ±3 V Input Range Connections
The critical performance specification for a reference in a 16-bit
application is noise. The reference pk-pk noise should be insignificant in comparison to the ADC noise. The AD7884/
AD7885 has a typical rms noise of 120 µV. For example a rea-
sonable target would be to keep the total rms noise less than
125 µV. To do this the reference noise needs to be less than
35 µV rms. In the 100 kHz band, the AD780 noise is less than
30 µV rms, making it a very suitable reference.
The buffer amplifier used to drive the device V
should have
REF+
low enough noise performance so as not to affect the overall
system noise requirement. The AD845 and AD817 achieve
this.
FSR (Full-Scale Range) is 6 volts for the ±3 V input range and 10 volts for the ±5 V input range.
3
REV. C
1 LSB on the ±3 V range is FSR/216 and is equal to 91.5 µV.
4
1 LSB on the ±5 V range is FSR/216 and is equal to 152.6 µV.
S = +3 V.
REF+
–9–
Page 10
AD7884/AD7885
3000
0
2000
1000
CODE FREQUENCY
(X – 2) (X – 1)(X)(X + 1) (X + 2) (X + 3)
CODE
Decoupling and Grounding
The AD7884 and AD7885A have one AVDD pin and two V
DD
pins. They also have one AVSS pin and three VSS pins. The
AD7885 has one AV
V
pin. Figure 6 shows how a common +5 V supply should be
SS
pin, one VDD pin, one AVSS pin and one
DD
used for the positive supply pins and a common –5 V supply for
the negative supply pins.
For decoupling purposes, the critical pins on both devices are
the AV
and AVSS pins. Each of these should be decoupled to
DD
system AGND with 10 µF tantalum and 0.1 µF ceramic capaci-
tors right at the pins. With the V
and VSS pins, it is sufficient
DD
to decouple each of these with ceramic 1 µF capacitors.
AGNDS, AGNDF are the ground return points for the on-chip
9-bit ADC. They should be driven by a buffer amplifier as
shown in Figure 6. If they are tied directly together and then
to ground, there will he a marginal degradation in linearity
performance.
The GND pin is the analog ground return for the on-chip linear
circuitry. It should he connected to system analog ground.
The DGND pin is the ground return for the on-chip digital
circuitry. It should be connected to the ground terminal of the
V
and VSS supplies. If a common analog supply is used for
DD
AV
and VDD then DGND should be connected to the com-
DD
mon ground point.
Power Supply Sequencing
AVDD and VDD are connected to a common substrate and there
is typically 17 Ω resistance between them. If they are powered
by separate +5 V supplies, then these should come up simultaneously. Otherwise, the one that comes up first will have to
drive +5 V into a 17 Ω load for a short period of time. However,
the standard short-circuit protection on regulators like the 7800
series will ensure that there is no possibility of damage to the
driving device.
AV
should always come up either before or at the same time
SS
as V
. If this cannot be guaranteed, Schottky diodes should be
SS
used to ensure that V
never exceeds AVSS by more than 0.3 V.
SS
Arranging the power supplies as in Figure 6 and using the recommended decoupling ensures that there are no power supply
sequencing issues as well as giving the specified noise performance.
+5V+5V–5V–5V
AVDDV
AV
DD
SSVSS
HP5082-2810
OR
EQUIVALENT
AD7884/AD7885 PERFORMANCE
Linearity
The linearity of the AD7884/AD7885 is determined by the
on-chip 16-bit D/A converter. This is a segmented DAC which
is laser trimmed for 16-bit DNL performance to ensure that
there are no missing codes in the ADC transfer function. Figure
13 shows a typical INL plot for the AD7884/AD7885.
In an A/D converter, noise exhibits itself as code uncertainty in
dc applications and as the noise floor (in an FFT, for example)
in ac applications.
In a sampling A/D converter like the AD7884/AD7885, all information about the analog input appears in the baseband from
dc to 1/2 the sampling frequency. An antialiasing filter will remove unwanted signals above f
/2 in the input signal but the
S
converter wideband noise will alias into the baseband. In the
AD7884/AD7885, this noise is made up of sample-and-hold
noise and A/D converter noise. The sample-and-hold section
contributes 51 µV rms and the ADC section contributes 59 µV
rms. These add up to a total rms noise of 78 µV. This is the in-
put referred noise in the ±3 V analog input range. When operating in the ±5 V input range, the input gain is reduced to –0.6.
This means that the input referred noise is now increased by a
factor of 1.66 to 120 µV rms.
Figure 14 shows a histogram plot for 5000 conversions of a dc
input using the AD7884/AD7885 in the ± 5 V input range. The
analog input was set as close as possible to the center of a code
transition. All codes other than the center code are due to the
ADC noise. In this case, the spread is six codes.
Incorrect Power Supply Sequencing
Figure 12. Schottky Diodes Used to Protect Against
AD7884/AD7885
Figure 14. Histogram of 5000 Conversions of a DC Input
–10–
REV. C
Page 11
AD7884/AD7885
MC68000
AD7884
ADDRESS
DECODE LOGIC
CONVST
CS
RD
DB15 – DB0
R/W
DATA BUS
ADDRESS BUS
A23 – A1
D15 – D0
DTACK
AS
CSA
CSB
If the noise in the converter is too high for an application, it can
be reduced by oversampling and digital filtering. This involves
sampling the input at higher than the required word rate and
then averaging to arrive at the final result. The very fast conversion time of the AD7884/AD7885 makes it very suitable for
oversampling. For example, if the required input bandwidth is
40 kHz, the AD7884/AD7885 could be oversampled by a factor
of 2. This yields a 3 dB improvement in the effective SNR performance. The noise performance in the ± 5 volt input range is
now effectively 85 µV rms and the resultant spread of codes for
2500 conversions will be four. This is shown in Figure 15.
1500
1000
500
CODE FREQUENCY
0
(X – 1)(X)(X + 1) (X + 2)
CODE
Figure 15. Histogram of 2500 Conversions of a DC Input
Using a
×
2 Oversampling Ratio
Dynamic Performance
With a combined conversion and acquisition time of 6 µs, the
AD7884/AD7885 is ideal for wide bandwidth signal processing
applications. Signal to (Noise + Distortion), Total Harmonic
Distortion, Peak Harmonic or Spurious Noise and Intermodulation Distortion are all specified. Figure 16 shows a typical
FFT plot of a 1.8 kHz, ± 5 V input after being digitized by the
AD7884/AD7885.
0
f = 1.8kHz, ± 5V SINE WAVE
IN
f = 163kHz
SAMPLE
–30
SNR = 87dB
THD = –95dB
16
15
14
13
12
EFFECTIVE NUMBER OF BITS
11
10
0
20
FREQUENCY – kHz
6040
80
Figure 17. Effective Number of Bits vs. Frequency
The effective number of bits for a device can be calculated from
its measured SNR. Figure 17 shows a typical plot of effective
number of bits versus frequency for the AD7884. The sampling
frequency is 166 kHz.
MICROPROCESSOR INTERFACING
The AD7884/AD7885 is designed on a high speed process
which results in very fast interfacing timing (Data Access Time
of 57 ns max). The AD7884 has a full 16-bit parallel bus, and
the AD7885 has an 8-bit wide bus. The AD7884, with its parallel interface, is suited to 16-bit parallel machines whereas the
AD7885, with its byte interface, is suited to 8-bit machines.
Some examples of typical interface configurations follow.
AD7884 to MC68000 Interface
Figure 18 shows a general interface diagram for the MC68000,
16-bit microprocessor to the AD7884. In Figure 18, conversion
is initiated by bringing
CSA low (i.e., writing to the appropriate
address). This allows the processor to maintain control over the
complete conversion process. In some cases it may be more
desirable to control conversion independent from the processor.
This can be done by using an external sampling timer.
–60
dB
–90
–120
–150
Figure 16. AD7884/AD7885 FFT Plot
Effective Number of Bits
The formula for SNR (see Terminology section) is related to
the resolution or number of bits in the converter. Rewriting the
formula, below, gives a measure of performance expressed in
effective number of bits (N).
2048 POINT FFT
N = (SNR – 1.76)/6.02
REV. C
Figure 18. AD7884 to MC68000 Interface
Once conversion has been started, the processor must wait until
it is completed before reading the result. There are two ways of
ensuring this. The first way is to simply use a software delay to
wait for 6.5 µs before bringing
CS and RD low to read the data.
–11–
Page 12
AD7884/AD7885
The second way is to use the BUSY output of the AD7884 to
generate an interrupt in the MC68000. Because of the nature of
its interrupts, the MC68000 requires additional logic (not
shown in Figure 18) to allow it to be interrupted correctly. For
full information on this, consult the MC68000 User’s Manual.
AD7884 to 80286 Interface
The 80286 is an advanced high performance processor with special capabilities aimed at multiuser and multitasking systems.
MRDC
82288 BUS
CONTROLLER
CLK
82284 CLOCK
GENERATOR
CLK
CLK
A – A
80286
CPU
D – D
150
230
Figure 19 shows an interface configuration for the AD7884 to
such a system. Note that only signals relevant to the AD7884
are shown. For the full 80286 configuration refer to the iAPX
286 data sheet (Basic System Configuration).
In Figure 19 conversion is started by writing to a selected address and causing it
plete,
BUSY goes high and initiates an interrupt. The processor
CS2 to go low. When conversion is com-
can then read the conversion result.
MEMORY READ
CS1
CS2
DECODE
CIRCUITRY
AD7884
RD
CS
8282 OR
8283
LATCH
8259A
INTERRUPT
CONTROLLER
IR – IR
07
CONVST
DB15
DB0
BUSY
8286 OR 8287
TRANSCEIVER
Figure 19. AD7884 Interfacing to Basic iAPX 286 System
–12–
REV. C
Page 13
AD7884/AD7885
TIMER
AD7884
CONVST
CS
RD
DB15 – DB8
BUSY
HBEN
A0
74HC574
74HC574
CLK
CLK
DB7 – DB0
AD7885 to 8088 Interface
The AD7885, with its byte (8 + 8) data format, is ideal for use
with the 8088 microprocessor. Figure 20 is the interface diagram. Conversion is started by enabling
CSA. At the end of
conversion, data is read into the processor. The read instructions are:
MOV AX, C001 Read 8 MSBs of data
MOV AX, C000 Read 8 LSBs of data
STB
8282
+5 V
ADDRESS BUS
ADDRESS
DECODE LOGIC
CSB
DATA BUS
CSA
A0
HBEN
CONVST
CS
RD
AD7885
DB7 – DB0
MN/MX
A15 – A8
IO/M
8088
RD
ALE
AD7 – AD0
Figure 20. AD7885 to 8088 Interface
AD7884 to ADSP-2101 Interface
Figure 21 shows an intcrface between the AD7884 and the
ADSP-2101. Conversion is initiated using a timer which allows
very accurate control of the sampling instant. The AD7884
BUSY line provides an interrupt to the ADSP-2101 when conversion is completed. The
RD pulse width of the processor can
be programmed using the Data Memory Wait State Control
Register. The result can then be read from the ADC using the
following instruction:
MR0 = DM (ADC)
where MR0 is the ADSP-2101 MR0 register, and
where ADC is the AD7884 address.
Stand-Alone Operation
If CS and RD are tied permanently low on the AD7884, then,
when a conversion is completed, output data will be valid on the
rising edge of
BUSY. This makes the device very suitable for
stand-alone operation. All that is required to run the device is an
external
CONVST pulse which can be supplied by a sample
timer. Figure 22 shows the AD7884 set up in this mode with the
BUSY signal providing the clock for the 74HC574 3-state
latches.
Figure 22. Stand-Alone Operation
Digital Feedthrough from an Active Bus
It is very important when using the AD7884/AD7885 in a
microprocessor-based system to isolate the ADC data bus from
the active processor bus while a conversion is being executed.
This will yield the best noise performance from the ADC.
Latches like the 74HC574 can be used to do this. If the device
is connected directly to an active bus then the converter noise
will typically increase by a factor of 30%.
REV. C
TIMER
DMA13 – DMA0
ADSP-2101
DMS
IRQn
RD
DMD15 – DMD0
Figure 21. AD7884 to ADSP-2101 Interface
ADDRESS BUS
ADDRESS
DECODE LOGIC
EN
DATA BUS
CONVST
CS
BUSY
RD
DB15 – DB0
AD7884
–13–
Page 14
AD7884/AD7885
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
28-Pin Plastic DIP (N-28A)
1.450 (36.83)
1.440 (35.576)
28
1
0.200
(5.080)
MAX
SEATING
PLANE
0.020 (0.508)
0.015 (0.381)
LEADS ARE SOLDER DIPPED OR TIN-PLATED ALLOY 42 OR COPPER.
0.06 (1.52)
0.05 (1.27)
0.105 (2.67)
0.095 (2.41)
15
0.550 (13.97)
0.530 (13.462)
14
0.175 (4.45)
0.120 (3.05)
40-Pin Plastic DIP (N-40A)
0.606 (15.39)
0.594 (15.09)
15°
0°
0.160 (4.06)
0.140 (3.56)
0.012 (0.305)
0.008 (0.203)
0.005 (0.13) MIN
PIN 1
0.200
(5.08)
MAX
0.175 (4.45)
0.120 (3.05)
0.025 (0.64)
0.015 (0.38)
2.08 (52.83) MAX
0.100 (2.54)
BSC
0.060 (1.52)
0.040 (1.02)
0.110 (2.79) MAX
2140
0.55 (13.97)
0.53 (13.46)
201
0.060 (1.52)
0.015 (0.38)
SEATING
PLANE
0.140
(3.56)
MIN
0˚-15
0.620 (15.75)
0.580 (14.73)
˚
0.015 (0.38)
0.008 (0.20)
–14–
REV. C
Page 15
44-Pin PLCC (P-44A)
AD7884/AD7885
0.045
(1.143)
TYP
0.045 (1.143) TYP
TOP VIEW
0.656 (16.662)
0.650 (16.510)
0.695 (17.65)
0.685 (17.40)
PIN 1
IDENTIFIER
SQ
SQ
R.020 (0.508) MAX
3 PLCS
0.045
(1.143)
TYP
0.180 (4.57)
0.165 (4.20)
0.045 (1.143) TYP
0.050 ± 0.005
(1.27 ± 0.13)
0.021 (0.533)
0.013 (0.331)
0.032 (0.812)
0.026 (0.661)
0.020 (0.508) MIN
0.120 (3.04)
0.090 (2.29)
0.630 (16.00)
0.590 (14.99)
REV. C
–15–
Page 16
C1620b–5–3/95
–16–
PRINTED IN U.S.A.
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