Datasheet AD7839AS Datasheet (Analog Devices)

Page 1
Octal 13-Bit, Parallel Input,
a
FEATURES Eight 13-Bit DACs in One Package Voltage Outputs Offset Adjust for Each DAC Pair Reference Range of 5 V Maximum Output Voltage Range of 10 V Clear Function to User-Defined Voltage 44-Lead MQFP Package
APPLICATIONS Automatic Test Equipment Process Control General Purpose Instrumentation
V
CCVSSVDD
GENERAL DESCRIPTION
The AD7839 contains eight 13-bit DACs on one monolithic
chip. It has output voltages with a full-scale range of ±10 V from reference voltages of ±5 V.
The AD7839 accepts 13-bit parallel loaded data from the exter­nal bus into one of the input registers under the control of the WR, CS and DAC channel address pins, A0–A2.
The DAC outputs are updated on reception of new data into the DAC registers. All the outputs may be updated simulta­neously by taking the LDAC input low.
Each DAC output is buffered with a gain-of-two amplifier into which an external DAC offset voltage can be inserted via the DUTGNDx pins.
The AD7839 is available in a 44-lead MQFP package.

FUNCTIONAL BLOCK DIAGRAM

V
REF
(+)ABV
REF
(–)
AB
DUTGND
CD
Voltage-Output DAC
AD7839
DUTGND
AB
DB12
DB0
WR
CS
A0
LDAC
AD7839
13
13 13
13 13
13 13
A1
A2
DECODE
ADDRESS
13 13
13 13
13 13
13 13
INPUT
REG
A
INPUT
REG
B
INPUT
REG
C
INPUT
REG
D
INPUT
REG
E
INPUT
REG
F
INPUT
REG
G
INPUT
REG
H
13 13
DAC REG
A
DAC REG
B
DAC REG
C
DAC REG
D
DAC REG
E
DAC REG
F
DAC REG
G
DAC REG
H
DAC A
13
13
13
13
13
13
13
DAC H
DAC B
DAC C
DAC D
DAC E
DAC F
DAC G
RR
RR
R
R
R
R
R
R
R
R
R
R
R
R
A
V
OUT
B
V
OUT
C
V
OUT
D
V
OUT
E
V
OUT
F
V
OUT
G
V
OUT
H
V
OUT
V
GND
V
REF
GH
(–)
(+)
REF
GH
REV. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
V
REF
CDEF
(–)
(+)
V
REF
CDEF
CLR
DUTGND
DUTGND
EF
GH
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 1999
Page 2
(VCC = +5 V 5%; VDD = +15 V 5%; VSS = –15 V 5%; GND = DUTGND = 0 V;
AD7839–SPECIFICATIONS
RL = 5 k and CL = 50 pF to GND, T
A
1
= T
MIN
to T
, unless otherwise noted.)
MAX
Parameter A Version Units Test Conditions/Comments
ACCURACY
Resolution 13 Bits
Relative Accuracy ±2 LSB max Typically ±0.5 LSB Differential Nonlinearity ±0.9 LSB max Guaranteed Monotonic Over Temperature Zero-Scale Error ±4LSB maxV Full-Scale Error ±4LSB maxV Gain Error ±1 LSB typ V
Gain Temperature Coefficient
DC Crosstalk
REFERENCE INPUTS
2
2
2
0.5 ppm FSR/°C typ 10 ppm FSR/°C max 120 µV max See Terminology. Typically 75 µV
(+) = +5 V, V
REF
(+) = +5 V, V
REF
(+) = +5 V, V
REF
(–) = –5 V. Typically within ±1 LSB
REF
(–) = –5 V. Typically within ±1 LSB
REF
(–) = –5 V
REF
DC Input Impedance 100 M typ Input Current ±1 µA max Per Input. Typically ±0.03 µA
V
(+) Range 0/+5 V min/max
REF
(–) Range –5/0 V min/max
V
REF
[V
REF
(+) – V
(–)] +2/+10 V min/max For Specified Performance. Can Go as Low as 0 V, but
REF
Performance Not Guaranteed
DUTGND INPUTS
2
DC Input Impedance 60 k typ Max Input Current ±0.3 mA typ Per Input
Input Range –2/+2 V min/max
OUTPUT CHARACTERISTICS
Output Voltage Swing ±10 V min 2 × (V
2
(–) + [V
REF
REF
(+) – V
(–)] × D) – V
REF
DUTGND
Short Circuit Current 15 mA max
Resistive Load 5 k min To 0 V
Capacitive Load 50 pF max To 0 V
DC Output Impedance 0.5 max
DIGITAL INPUTS
V
, Input High Voltage 2.4 V min
INH
V
, Input Low Voltage 0.8 V max
INL
I
, Input Current Total for All Pins
INH
2
@ +25°C1µA max
to T
T
MIN
MAX
±10 µA max
CIN, Input Capacitance 10 pF max
POWER REQUIREMENTS
V
CC
V
DD
V
SS
Power Supply Sensitivity
␣␣ Full Scale/∆V ␣␣ Full Scale/∆V
I
CC
I
DD
I
SS
NOTES
1
Temperature range for A Version: –40°C to +85°C
2
Guaranteed by characterization. Not production tested.
3
The AD7839 is functional with power supplies of ±12 V ± 10% with reduced output range. At 12 V it is recommended to restrict reference range to ±4 V due to output amplifier headroom limitations
Specifications subject to change without notice.
DD
SS
3
+4.75/+5.25 V min/max For Specified Performance +14.25/+15.75 V min/max For Specified Performance
2
–14.25/–15.75 V min/max For Specified Performance
90 dB typ 90 dB typ
0.5 mA max V
= VCC, V
INH
= GND. Dynamic Current
INL
10 mA max Outputs Unloaded. Typically 8 mA 10 mA max Outputs Unloaded. Typically 8 mA
–2–
REV. 0
Page 3
AD7839
(These characteristics are included for Design Guidance and are not subject
AC PERFORMANCE CHARACTERISTICS
Parameter A Units Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time 30 µs typ Full-Scale Change to ±1/2 LSB. DAC Latch Contents Alternately
40 µs max Loaded with All 0s and All 1s
Slew Rate 0.7 V/µs typ
Digital-to-Analog Glitch Impulse 230 nV-s typ Measured with V
Channel-to-Channel Isolation 99 dB typ See Terminology DAC-to-DAC Crosstalk 40 nV-s typ See Terminology Digital Crosstalk 0.2 nV-s typ Feedthrough to DAC Output Under Test Due to Change in Digital
Digital Feedthrough 0.1 nV-s typ Effect of Input Bus Activity on DAC Output Under Test Output Noise Spectral Density
␣ ␣ @ 1 kHz 200 nV/Hz
Specifications subject to change without notice.
1, 2
TIMING SPECIFICATIONS
(VCC = +5 V 5%; VDD = +15 V 5%; VSS = –15 V 5%; GND = DUTGND = 0 V)
to production testing.)
(+) = +5 V, V
REF
Alternately Loaded with 0FFF Hex and 1000 Hex. Not Dependent on Load Conditions
Input Code to Another Converter
typ All 1s Loaded to DAC. V
(+) = V
REF
(–) = –5 V. DAC Latch
REF
(–) = 0 V
REF
Parameter Limit at T
t
1
t
2
t
3
t
4
t
5
t
6
t
7
t
8
t
9
t
10
t
11
NOTES
1
All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2
Rise and fall times should be no longer than 50 ns.
Specifications subject to change without notice.
15 ns min Address to WR Setup Time 0 ns min Address to WR Hold Time 50 ns min CS Pulsewidth Low 50 ns min WR Pulsewidth Low 0 ns min CS to WR Setup Time 0 ns min WR to CS Hold Time 20 ns min Data Setup Time 0 ns min Data Hold Time 30 µs typ Settling Time 300 ns max CLR Pulse Activation Time 50 ns min LDAC Pulsewidth Low
A0, A1, A2
CS
WR
DATA
V
OUT
CLR
MIN, TMAX
t
1
t
5
t
2
t
6
t
3
t
4
t
8
t
7
t
9
t
10
Units Description
V
OUT
LDAC
Figure 1. Timing Diagram
–3–REV. 0
t
11
Page 4
AD7839

ABSOLUTE MAXIMUM RATINGS

(T
= +25°C unless otherwise noted)
A
VCC to GND3 . . . . . . . . . . . . . . .–0.3 V, +7 V or V
1, 2
+ 0.3 V
DD
(Whichever Is Lower)
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +17 V
V
DD
V
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V, –17 V
SS
Digital Inputs to GND . . . . . . . . . . . . . . –0.3 V, V
(+) to V
V
REF
V
(+) to GND . . . . . . . . . . . . . . . VSS – 0.3 V, VDD + 0.3 V
REF
V
(–) to GND . . . . . . . . . . . . . . . VSS – 0.3 V, VDD + 0.3 V
REF
DUTGND to GND . . . . . . . . . . . . . V
V
(A–H) to GND . . . . . . . . . . . . VSS – 0.3 V, VDD + 0.3 V
OUT
(–) . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +18 V
REF
– 0.3 V, VDD + 0.3 V
SS
+ 0.3 V
CC
Operating Temperature Range
Industrial (A Version) . . . . . . . . . . . . . . . . –40°C to +85°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature (T
max) . . . . . . . . . . . . . . . . . .+150°C
J
MQFP Package
Power Dissipation . . . . . . . . . . . . . . . . . . (T
max – T
J
)
A
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 95°C/W

ORDERING GUIDE

Temperature Error DNL Package
Model Range (LSBs) (LSBs) Option*
AD7839AS –40°C to +85°C ±2 ±1 S-44
*S = Plastic Quad Flatpack (MQFP).
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . .+220°C
ESD Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >4000 V
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.
3
VCC must not exceed VDD by more than 0.3 V. If it is possible for this to happen
during power supply sequencing, the following diode protection scheme will ensure protection.
JA
IN4148
V
DD
HP5082-2811
V
DD
AD7839
V
CC
V
CC
Linearity
DUTGND_AB
V
OUT
V
(–)AB
REF
V
(+)AB
REF
V
V
LDAC
CS
PIN CONFIGURATION
C
OUT
V
DUTGND_CD
CC
V
GND
D
(–)CDEF
OUT
REF
V
V
40 39 3841424344 36 35 3437
AD7839
TOP VIEW
(Not to Scale)
DB1
DB0
B
OUT
V
1
PIN 1 IDENTIFIER
2
A
3
4 5
DD
6
SS
7
8
A2
9
A1 A0
10
11
12 13 14 15 16 17 18 19 20 21 22
WR
(+)CDEF
DD
REF
V
V
DB3
DB2
E
OUT
V
DUTGND_EF
DB5
DB4
F
OUT
V
DB6
G
OUT
V
DB7
33
DUTGND_GH
32
V
OUT
31
V
REF
30
V
REF
29
V
SS
28
CLR
27
DB12
26
DB11
25
DB10
24
DB9
23
DB8
H (–)GH (+)GH
–4–
REV. 0
Page 5
PIN FUNCTION DESCRIPTIONS
Pin No. Mnemonic Description
AD7839
1 DUTGND_AB Device Sense Ground for DACs A and B. V
OUT
A and V
B are referenced to the voltage
OUT
applied to this pin.
2, 44, 43, V
OUT
A..V
H DAC Outputs.
OUT
41, 37, 35, 34, 32
4, 3 V 5V 6V
(+)AB, V
REF
DD
SS
(–)AB Reference Inputs for DACs A and B. These reference voltages are referred to GND.
REF
Positive Analog Power Supply; +15 V ± 5%. Negative Analog Power Supply; –15 V ± 5%.
7 LDAC Load DAC Logic Input (active low). When this logic input is taken low the contents of the
input registers are transferred to their respective DAC registers. LDAC can be tied perma­nently low enabling the outputs to be updated on the rising edge of WR.
10, 9, 8 A0, A1, A2 Address inputs. A0, A1 and A2 are decoded to select one of the eight input registers for a
data transfer.
11 CS Level-Triggered Chip Select Input (active low). The device is selected when this input is low. 12 WR Level-Triggered Write Input (active low), used in conjunction with CS to write data to the
AD7839 input registers. Data is latched into the selected input register on the rising edge of WR.
13 V
CC
Logic Power Supply; +5 V ± 5%.
14 GND Ground. 15–27 DB0␣ .␣ .␣ DB12 Parallel Data Inputs. The AD7839 can accept a straight 13-bit parallel word on DB0 to DB12
where DB12 is the MSB and DB0 is the LSB.
28 CLR Asynchronous Clear Input (level sensitive, active low). When this input is low, all analog
outputs are switched to the externally set potential on the relevant DUTGND pin. The con­tents of input registers and DAC registers A to H are not affected when the CLR pin is taken low. When CLR is brought back high, the DAC outputs revert to their original outputs as
determined by the data in their DAC registers. 30, 31 V 33 DUTGND_GH Device Sense Ground for DACs G and H. V
(+)GH, V
REF
(–)GH Reference Inputs for DACs G and H. These reference voltages are referred to GND.
REF
OUT
G and V
H are referenced to the voltage
OUT
applied to this pin. 36 DUTGND_EF Device Sense Ground for DACs E and F. V
OUT
E and V
F are referenced to the voltage
OUT
applied to this pin. 39 V 40 V 42 DUTGND_CD Device Sense Ground for DACs C and D. V
(+)CDEF Reference Inputs for DACs C, D, E and F. These reference voltages are referred to GND.
REF
(–)CDEF
REF
C and V
OUT
D are referenced to the voltage
OUT
applied to this pin.
–5–REV. 0
Page 6
AD7839
TERMINOLOGY Relative Accuracy
Relative accuracy or endpoint linearity is a measure of the max­imum deviation from a straight line passing through the end­points of the DAC transfer function. It is measured after adjust­ing for zero error and full-scale error and is normally expressed in Least Significant Bits.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of 1 LSB maximum ensures monotonicity.
DC Crosstalk
Although the common input reference voltage signals are inter­nally buffered, small IR drops in the individual DAC reference inputs across the die can mean that an update to one channel can produce a dc output change in one or another of the chan­nel outputs.
The eight DAC outputs are buffered by op amps that share common V
and VSS power supplies. If the dc load current
DD
changes in one channel (due to an update), this can result in a further dc change in one or another of the channel outputs. This effect is most obvious at high load currents and reduces as the load currents are reduced. With high impedance loads the effect is virtually unmeasurable.
Output Voltage Settling Time
This is the amount of time it takes for the output to settle to a specified level for a full-scale input change.
Digital-to-Analog Glitch Impulse
This is the amount of charge injected into the analog output when the inputs change state. It is specified as the area of the glitch in nV-secs. It is measured with V V
(–) = –5 V and the digital inputs toggled between 0FFFH and
REF
(+) = +5 V and
REF
1000H.
Channel-to-Channel Isolation
Channel-to-channel isolation refers to the proportion of input signal from one DAC’s reference input that appears at the out­put of another DAC. It is expressed in dBs.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is defined as the glitch impulse that appears at the output of one converter due to both the digital change and subsequent analog O/P change at another converter. It is specified in nV-secs.
Digital Crosstalk
The glitch impulse transferred to the output of one converter due to a change in digital input code to the other converter is defined as the digital crosstalk and is specified in nV-secs.
Digital Feedthrough
When the device is not selected, high frequency logic activity on the device’s digital inputs can be capacitively coupled both across and through the device to show up as noise on the V
OUT
pins. This noise is digital feedthrough.
DC Output Impedance
This is the effective output source resistance. It is dominated by package lead resistance.
Full-Scale Error
This is the error in DAC output voltage when all 1s are loaded into the DAC latch. Ideally the output voltage, with all 1s loaded into the DAC latch, should be 2 V
Zero-Scale Error
(+) – 1 LSB.
REF
Zero-scale error is the error in the DAC output voltage when all 0s are loaded into the DAC latch. Ideally the output voltage, with all 0s in the DAC latch should be equal to 2 V
(–). Zero-
REF
scale error is mainly due to offsets in the output amplifier.
Gain Error
Gain Error is defined as (Full-Scale Error) – (Zero-Scale Error).
GENERAL DESCRIPTION DAC Architecture—General
Each channel consists of a straight 13-bit R-2R voltage-mode DAC. The full-scale output voltage range is equal to twice the reference span of V
REF
(+) – V binary; all 0s produces an output of 2 V an output of 2 V
(+) – 1 LSB.
REF
(–). The DAC coding is straight
REF
(–); all 1s produces
REF
The analog output voltage of each DAC channel reflects the contents of its own DAC register. Data is transferred from the external bus to the input register of each DAC on a per channel basis.
Bringing the CLR line low switches all the signal outputs, V to V
H, to the voltage level on the DUTGND pin. When the
OUT
OUT
A
CLR signal is brought back high, the output voltages from the DACs will reflect the data stored in the relevant DAC registers.
Data Loading to the AD7839
Data is loaded into the AD7839 in straight parallel 13-bit wide words.
The DAC output voltages, V
OUT
A – V
H are updated to
OUT
reflect new data in the DAC registers.
The actual input register being written to is determined by the logic levels present on the device’s address lines, as shown in Table I.
Table I. Address Line Truth Table
A2 A1 A0 DAC Selected
0 0 0 INPUT REG A (DAC A) 0 0 1 INPUT REG B (DAC B) 0 1 0 INPUT REG C (DAC C) 0 1 1 INPUT REG D (DAC D) 1 0 0 INPUT REG E (DAC E) 1 0 1 INPUT REG F (DAC F) 1 1 0 INPUT REG G (DAC G) 1 1 1 INPUT REG H (DAC H)
–6–
REV. 0
Page 7
Typical Performance Characteristics–
m
AD7839
1.0 VDD = +15V
V
0.0
0
SS
V
REF(+)
V
REF(–)
T
= +258C
A
= –15V
= +5V
= –5V
2048
4096 6144 8191
CODE
0.75
0.50
0.25
–0.25
INL ERROR – LSBs
–0.50
–0.75
–1.0
Figure 2. Typical INL Plot
1.0
VDD = +15V V
0.75
0.50
0.25
–0.25
DNL ERROR – LSBs
–0.50
–0.75
–1.0
= –15V
SS
= +5V
V
REF(+)
V
= –5V
REF(–)
0
–40 100–20 0 20 40 60 80
TEMPERATURE – 8C
MAX DNL
MIN DNL
Figure 5. Typical DNL Error vs. Temperature
0.50
0.25
0.0
VDD = +15V
DNL ERROR – LSBs
V
–0.25
–0.50
= –15V
SS
= +5V
V
REF(+)
V
= –5V
REF(–)
T
= +258C
A
0 2048 4096 6144 8192
CODE
Figure 3. Typical DNL Plot
2.0 VDD = +15V
= –15V
V
SS
1.5
1.0
0.5
–0.5
ERROR – LSBs
–1.0
–1.5
–2.0
= +5V
V
REF(+)
= –5V
V
REF(–)
0
–40 –20 100
FULL-SCALE ERROR
ZERO-SCALE ERROR
020406080 TEMPERATURE – 8C
Figure 6. Zero-Scale and Full-Scale Error vs. Temperature
2.0 VDD = +15V
= –15V
V
SS
1.5
1.0
0.5
0.0
–0.5
INL ERROR – LSBs
–1.0
–1.5
–2.0
= +5V
V
REF(+)
= –5V
V
REF(–)
–40 –20 1000 20406080
TEMPERATURE – 8C
MAX INL
MIN INL
Figure 4. Typical INL Error vs. Temperature
6
5
4
DIGITAL INPUTS @ THRESHOLDS
3
– mA
2
CC
I
1
DIGITAL INPUTS @ SUPPLIES
0
–1
–40 100200 20406080
TEMPERATURE – 8C
VCC = +5V V
DD
V
SS
Figure 7. ICC vs. Temperature
= +15V
= –15V
0.6
0.5
0.4
0.3
0.2
VOLTS
0.1
0
20.1
20.2
0 50 150 200 300250 400 500350 450 550
Figure 8. Typical Digital-to-Analog Glitch Impulse
10.19
10.18
– Volts
OUT
10.17
V
10.16
27 3328 29 30 31 32
SETTLING TIME –
Figure 9. Settling Time (+)
–7–REV. 0
10
VDD = +15V
= –15V
V
SS
= +5V
V
CC
I
8
– mA
SS
/I
DD
I
6
4
s
–40 –20 0 20 40 60
DD
I
SS
TEMPERATURE – °C
80
100
Figure 10. IDD, ISS vs. Temperature
Page 8
AD7839
Unipolar Configuration
Figure 11 shows the AD7839 in the unipolar binary circuit configuration. The V AD586, a +5 V reference. V
(+) input of the DAC is driven by the
REF
(–) is tied to ground. Table II
REF
gives the code table for unipolar operation of the AD7839. Other suitable references include the REF02, a precision +5 V reference, and the REF195, a low dropout, micropower preci­sion +5 V reference.
+5V+15V
1mF
2
8
C1
6
AD586
5
R1
4
SIGNAL
GND
*ADDITIONAL PINS OMITTED FOR CLARITY
10kV
V
V
REF
AD7839*
V
REF
DDVCC
(+)
DUTGND
(–)
V
SS
–15V
V
OUT
GND
V
OUT
(0 TO +10V)
SIGNAL
GND
Figure 11. Unipolar +10 V Operation
Offset and gain may be adjusted in Figure 11 as follows: To adjust offset, disconnect the V DAC with all 0s and adjust the V
(–) input from 0 V, load the
REF
(–) voltage until V
REF
OUT
= 0 V. For gain adjustment, the AD7839 should be loaded with all 1s and R1 adjusted until V
OUT
= 2 V
(+) – 1 LSB = 10 V(8191/
REF
8192) = 9.99878 V.
Many circuits will not require these offset and gain adjustments. In these circuits R1 can be omitted. Pin 5 of the AD586 may be left open circuit and Pin 2 (V
(–)) of the AD7839 tied to 0 V.
REF
Table II. Code Table for Unipolar Operation
Binary Number in DAC Register Analog Output MSB␣␣␣␣␣␣␣␣ LSB (V
1 1111 1111 1111 2 V 1 0000 0000 0000 2 V 0 1111 1111 1111 2 V 0 0000 0000 0001 2 V
)
OUT
(8191/8192) V
REF
(4096/8192) V
REF
(4095/8192) V
REF
(1/8192) V
REF
0 0000 0000 0000 0 V
NOTES V
= V
(+); V
REF
REF
For V
(+) = +5 V, 1 LSB = +10 V/213 = +10 V/8192 = 1.22 mV.
REF
(–) = 0 V for unipolar operation.
REF
Bipolar Configuration
Figure 12 shows the AD7839 set up for ±10 V operation. The AD588 provides precision ±5 V tracking outputs that are fed to
the V
(+) and V
REF
(–) inputs of the AD7839. The code table
REF
for bipolar operation of the AD7839 is shown in Table III.
In Figure 12, full-scale and bipolar zero adjustments are pro­vided by varying the gain and balance on the AD588. R2 varies the gain on the AD588 while R3 adjusts the offset of both the +5 V and –5 V outputs together with respect to ground.
For bipolar-zero adjustment, the DAC is loaded with 1000␣ .␣ .␣ .␣ 0000 and R3 is adjusted until V
= 0 V. Full
OUT
scale is adjusted by loading the DAC with all 1s and adjusting R2 until V
= 10(4095/4096) V = 9.997559 V.
OUT
When bipolar-zero and full-scale adjustment are not needed, R2 and R3 can be omitted. Pin 12 on the AD588 should be con­nected to Pin 11 and Pin 5 should be left floating.
V
DDVCC
(+)
AD7839*
DUTGND
(–)
V
SS
–15V
+5V+15V
V
OUT
GND
V
OUT
(–10V TO +10V)
SIGNAL
GND
100kV
R1
39kV
46
7
C1
9
1mF
R2
100kV
5 10 11
12 8 13
R3
*ADDITIONAL PINS OMITTED FOR CLARITY
AD588
2 3
V
REF
1 14 15
V
REF
16
Figure 12. Bipolar ±10 V Operation
Table III. Code Table for Bipolar Operation
Binary Number in DAC Register Analog Output MSB LSB (V
1 1111 1111 1111 2[V 1 0000 0000 0001 2[V 1 0000 0000 0000 2[V 0 1111 1111 1111 2[V 0 0000 0000 0001 2[V 0 0000 0000 0000 2[V
NOTES V
= (V
REF
For V 20 V/8192 = 2.44 mV.
(+) – V
REF
(+) = +5 V, and V
REF
REF
(–)).
REF
(–) = –5 V, V
)
OUT
(–) + V
REF
REF
REF
REF
REF
REF
REF
REF
(–) + V
REF
(–) + V
REF
(–) + V
REF
(–) + V
REF
(–)] V
= 10 V, 1 LSB = 2 V
(8191/8192)] V (4097/8192)] V (4096/8192)] V (4095/8192)] V (1/8192)] V
V/213 =
REF
CONTROLLED POWER-ON OF THE OUTPUT STAGE
A block diagram of the output stage of the AD7839 is shown in
Figure 13. It is capable of driving a load of 5 k in parallel with
50 pF. G power on voltage present at V also used in conjunction with the CLR input to set V
to G6 are transmission gates used to control the
1
. On power up G1 and G2 are
OUT
OUT
to the
user defined voltage present at the DUTGND pin. When CLR is taken back high, the DAC outputs reflect the data in the DAC registers.
G
DAC
1
G
G
2
R
DUTGND
G
4
R = 60kV
G
G
6
3
5
14kV
V
OUT
Figure 13. Block Diagram of AD7839 Output Stage
–8–
REV. 0
Page 9
Power-On with CLR Low
The output stage of the AD7839 has been designed to allow output stability during power-on. If CLR is kept low during power-on, then just after power is applied to the AD7839, the situation is as depicted in Figure 14. G while G
, G3 and G5 are closed.
2
G
DAC
1
G
2
R
DUTGND
G
4
, G4 and G6 are open
1
G
6
G
3
R
G
5
14kV
V
OUT
Figure 14. Output Stage with VDD < 7 V or VSS > –3 V;
CLR
Low
V
is kept within a few hundred millivolts of DUTGND via
OUT
G
and a 14 k resistor. This thin-film resistor is connected in
5
parallel with the gain resistors of the output amplifier. The output amplifier is connected as a unity gain buffer via G the DUTGND voltage is applied to the buffer input via G
, and
3
. The
2
amplifier’s output is thus at the same voltage as the DUTGND pin. The output stage remains configured as in Figure 14 until the voltage at V
exceeds 7 V and VSS is more negative than
DD
–3 V. By now the output amplifier has enough headroom to handle signals at its input and has also had time to settle. The internal power-on circuitry opens G
. This situation is shown in Figure 15. Now the output ampli-
G
6
fier is configured in its noise gain configuration via G
and G5 and closes G4 and
3
and G6.
4
The DUTGND voltage is still connected to the noninverting input via G
DAC
and this voltage appears at V
2
G
1
G
3
G
2
G
4
R
R
G
5
14kV
G
OUT
6
.
V
OUT
AD7839
G
DAC
1
G
G
2
R
DUTGND
G
4
G
Figure 16. Output Stage After
Power-On with CLR High
If CLR is high on the application of power to the device, the output stages of the AD7839 are configured as in Figure 17 while V G
1
is less than 7 V and VSS is more positive than –3 V.
DD
is closed and G2 is open, thereby connecting the output of the DAC to the input of its output amplifier. G while G a unity gain buffer. V
through a 14 k resistor until V
and G6 are open, thus connecting the output amplifier as
4
is connected to DUTGND via G
OUT
DD
negative than –3 V.
G
1
DAC
G
G
2
R
DUTGND
G
4
G
Figure 17. Output Stage Powering Up with While V
< 7 V or VSS > –3 V
DD
When the difference between the supply voltages reaches +10 V, the internal power-on circuitry opens G and G6 configuring the output stage as shown in Figure 18.
G
DAC
1
G
G
6
3
R
5
14kV
CLR
Is Taken High
and G5 are closed
3
V
OUT
5
exceeds 7 V and VSS is more
G
6
3
R
5
14kV
and G5 and closes G
3
G
6
3
CLR
V
OUT
High
V
OUT
4
DUTGND
Figure 15.␣ Output Stage with VDD > 7 V and VSS < –3 V;
CLR
Low
V
has been disconnected from the DUTGND pin by the
OUT
opening of G
, but will track the voltage present at DUTGND
5
via the configuration shown in Figure 15. When CLR is taken back high, the output stage is configured as
shown in Figure 16. The internal control logic closes G opens G
. The output amplifier is connected in a noninverting
2
gain-of-two configuration. The voltage that appears on the V
and
1
OUT
pins is determined by the data present in the DAC registers.
–9–REV. 0
G
2
R
DUTGND
G
4
R
G
5
14kV
Figure 18.␣ Output Stage Powering Up with
> 7 V and VSS < –3 V
V
DD
CLR
High;
Page 10
AD7839
DUTGND Voltage Range
During power-on, the V to the relevant DUTGND pins via G
pins of the AD7839 are connected
OUT
and the 14 k thin-film
5
resistor. The DUTGND potential must obey the max ratings at all times. Thus, the voltage at DUTGND must always be within the range V
– 0.3 V, V
SS
voltages at the V
OUT
+ 0.3 V. However, in order that the
DD
pins of the AD7839 stay within ±2 V of the
relevant DUTGND potential during power-on, the voltage applied to DUTGND should also be kept within the range GND – 2␣ V, GND + 2 V.
Once the AD7839 has powered on and the on-chip amplifiers have settled, any voltage that is now applied to the DUTGND pin is subtracted from the DAC output, which has been gained up by a factor of two. Thus, for specified operation, the maxi­mum voltage that can be applied to the DUTGND pin in­creases to the maximum allowable 2 V
(+) voltage, and the
REF
minimum voltage that can be applied to DUTGND is the minimum 2 V
(–) voltage. After the AD7839 has fully
REF
powered on, the outputs can track any DUTGND voltage within this minimum/maximum range.
Power Supply Sequencing
When operating the AD7839, it is important that ground be connected at all times to avoid high current states. The recom­mended power-up sequence is V
followed by VCC. If V
DD/VSS
CC
can exceed VDD on power-up, the diode scheme shown in the absolute max ratings will ensure protection. The reference in­puts and digital inputs should be powered up last. Should the references exceed V
on power-up, current limiting resis-
DD/VSS
tors should be inserted in series with the reference inputs to limit the current to 20 mA. Logic inputs should not be applied before V logic inputs, should be inserted if these inputs come up before V
. Current limiting resistors (470 ), in series with the
CC
CC
.
MICROPROCESSOR INTERFACING Interfacing the AD7839—16-Bit Interface
The AD7839 can be interfaced to a variety of 16-bit micro­controllers or DSP processors. Figure 19 shows the AD7839 interfaced to a generic 16-bit microcontroller/DSP processor. The lower address lines from the processor are connected to A0, A1 and A2 on the AD7839 as shown. The upper address lines are decoded to provide a chip select signal or an LDAC signal for the AD7839. The fast interface timing of the AD7839 allows direct interface to a wide variety of microcontrollers and DSPs as shown in Figure 19.
mCONTROLLER/
DSP PROCESSOR*
DATA
BUS
UPPER BITS OF
ADDRESS BUS
D12
D0
ADDRESS
DECODE
AD7839
D12
D0
CS
LDAC
APPLICATIONS Power Supply Bypassing and Grounding
In any circuit where accuracy is important, careful consideration of the power supply and ground return layout helps to ensure the rated performance. The printed circuit board on which the AD7839 is mounted should be designed such that the analog and digital sections are separated and confined to certain areas of the board. This facilitates the use of ground planes that can be easily separated. A minimum etch technique is generally best for ground planes as it gives the best shielding. Digital and ana­log ground planes should be joined at only one place. The GND pin of the AD7839 should be connected to the AGND of the system. If the AD7839 is in a system where multiple devices require an AGND-to-DGND connection, the connection should be made at one point only, a star ground point that should be established as close as possible to the AD7839.
Digital lines running under the device should be avoided as these will couple noise onto the die. The analog ground plane should be allowed to run under the AD7839 to avoid noise coupling. The power supply lines of the AD7839 should use as large a trace as possible to provide low impedance paths and reduce the effects of glitches on the power supply line. Fast switching signals like clocks should be shielded with digital ground to avoid radiating noise to other parts of the board and should never be run near the analog inputs.
Avoid crossover of digital and analog signals. Traces on opposite sides of the board should run at right angles to each other. This reduces the effects of feedthrough through the board. A micro­strip technique is by far the best but not always possible with a double sided board. In this technique, the component side of the board is dedicated to ground plane while signal traces are placed on the solder side.
The AD7839 should have ample supply bypassing located as close to the package as possible, ideally right up against the device. Figure 20 shows the recommended capacitor values of
10 µF in parallel with 0.1 µF on each of the supplies. The 10 µF capacitors are the tantalum bead type. The 0.1 µF capacitor
should have low Effective Series Resistance (ESR) and Effective Series Inductance (ESI), such as the common ceramic types, which provide a low impedance path to ground at high frequen­cies to handle transient currents due to internal logic switching.
CC
AD7839
V
DD
V
SS
10mF
0.1mF
10mF0.1mF10mF 0.1mF
V
Figure 20. Recommended Decoupling Scheme for AD7839
A2 A1 A0
R/W
*ADDITIONAL PINS OMITTED FOR CLARITY
A2 A1 A0
WR
Figure 19. AD7839 Parallel Interface
–10–
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Page 11
AD7839
Automated Test Equipment
The AD7839 is particularly suited for use in an automated test environment. Figure 21 shows the AD7839 providing the neces­sary voltages for the pin driver and the window comparator in a typical ATE pin electronics configuration. AD588s are used to provide reference voltages for the AD7839. In the configuration shown, the AD588s are configured so that the voltage at Pin 1 is 5 V greater than the voltage at Pin 9 and the voltage at Pin 15 is 5 V less than the voltage at Pin 9.
+15V –15V
4 6
8 13 10
11 12
1mF
+15V –15V
4
6
8 13 10
11 12
1mF
2
AD588
2
AD588
V
OFFSET
16
3
1 15 14
9
7
16
3
1 15 14
9
7
*ADDITIONAL PINS OMITTED FOR CLARITY
0.1mF
DEVICE GND
V
(+)AB
REF
(–)AB
V
REF
DUTGND AB
AD7839*
DUTGND GH
V
(+)GH
REF
V
(–)GH
REF
GND
V
OUT
V
OUT
V
OUT
V
OUT
COMPARATOR
A
B
G
H
WINDOW
+15V
PIN
DRIVER
–15V
DEVICE GND
TO TESTER
V
DEVICE GND
OUT
Figure 21. ATE Application
One of the AD588s is used as a reference for DACs A and B. These DACs are used to provide high and low levels for the pin driver. The pin driver may have an associated offset. This can be nulled by applying an offset voltage to Pin 9 of the AD588. First, the code 1000␣ .␣ .␣ .␣ 0000 is loaded into the DACA latch and the pin driver output is set to the DACA output. The V driver output and DUT GND. This causes both V V V
voltage is adjusted until 0 V appears between the pin
OFFSET
(–) to be offset with respect to GND by an amount equal to
REF
. However, the output of the pin driver will vary from
OFFSET
REF
(+) and
–10 V to +10 V with respect to DUTGND as the DAC input code varies from 000␣ .␣ .␣ .␣ 000 to 111␣ .␣ .␣ .␣ 111. The V
OFFSET
voltage is also applied to the DUTGND pins. When a clear is performed on the AD7839, the output of the pin driver will be 0 V with respect to DUTGND.
The other AD588 is used to provide a reference voltage for DACs G and H. These provide the reference voltages for the window comparator shown in the diagram. Note that Pin 9 of this AD588 is connected to Device GND. This causes V and V
(–)GH to be referenced to Device GND. As DAC G
REF
REF
(+)GH
and DAC H input codes vary from 000␣ .␣ .␣ .␣ 000 to 111␣ .␣ .␣ .␣ 111, V
G and V
OUT
H vary from –10 V to +10 V with respect to
OUT
Device GND. Device GND is also connected to DUTGND. When the AD7839 is cleared, V
OUT
G and V
H are cleared to
OUT
0 V with respect to Device GND.
Programmable Reference Generation for the AD7839 in an ATE Application
The AD7839 is particularly suited for use in an automated test environment. The reference input for the AD7839 octal 13-bit DAC requires three differential references for the eight DACs. Programmable references may be a requirement in some ATE applications as the offset and gain errors at the output of a DAC can be adjusted by varying the voltages on the reference pins of the DAC. To trim offset errors, the DAC is loaded with the digital code 000␣ .␣ .␣ .␣ 000 and the voltage on the V
(–) pin is
REF
adjusted until the desired negative output voltage is obtained. To trim out gain errors, first the offset error is trimmed. Then the DAC is loaded with the code 111␣ .␣ .␣ .␣ 111 and the voltage on the V
(+) pin is adjusted until the desired full-scale voltage
REF
minus one LSB is obtained.
It is not uncommon in ATE design, to have other circuitry at the output of the AD7839 that can have offset and gain errors of
up to say ±300 mV. These offset and gain errors can be easily
removed by adjusting the reference voltages of the AD7839.
The AD7839 uses nominal reference values of ±5 V to achieve an output span of ±10 V. Since the AD7839 has a gain of two
from the reference inputs to the DAC output, adjusting the
reference voltages by ±150 mV will adjust the DAC offset and gain by ±300 mV.
There are a number of suitable 8- and 10-bit DACs available that would be suitable to drive the reference inputs of the AD7839, such as the AD7804, a quad 10-bit digital-to-analog converter with serial load capabilities. The voltage output from this DAC is in the form of V
BIAS
±
V
and rail-to-rail opera-
SWING
tion is achievable. The voltage reference for this DAC can be internally generated or provided externally. This DAC also contains an 8-bit SUB DAC which can be used to shift the complete transfer function of each DAC around the V
BIAS
point. This can be used as a fine trim on the output voltage. In this application two AD7804s are required to provide programmable reference capability for all eight DACs. One AD7804 is used to drive the V V
(–) pins.
REF
Another suitable DAC for providing programmable reference capability is the AD8803. This is an octal 8-bit trimDAC
(+) pins and the second package used to drive the
REF
®
and provides independent control of both the top and bottom ends of the trimDAC. This is helpful in maximizing the resolution of devices with a limited allowable voltage control range.
The AD8803 has an output voltage range of GND to V to +5 V). To trim the V on the AD8803 DAC can be set using the V
(+) input, the appropriate trim range
REF
REFL
and V
DD
REFH
(0 V
pins allowing 8 bits of resolution between the two points. This will allow the V
To trim the V
(+) pin to be adjusted to remove gain errors.
REF
(–) voltage, some method of providing a trim
REF
voltage in the required negative voltage range is required. Nei­ther the AD7804 or the AD8803 can provide this range in nor­mal operation as their output range is 0 V to +5 V. There are two methods of producing this negative voltage. One method is to provide a positive output voltage and then to level shift that analog voltage to the required negative range. Alternatively
TrimDAC is a registered trademark of Analog Devices, Inc.
–11–REV. 0
Page 12
AD7839
these DACs can be operated with supplies of 0 V and –5 V, with the V
pin connected to 0 V and the GND pin connected to
DD
–5 V. Now these can be used to provide the negative reference voltages for the V
(–) inputs on the AD7839. However, the
REF
ADDR BUS
ADDR
SDATA
SCLK
CONTROLLER
DATA BUS
DECODER
LOGIC LEVEL
SHIFT
FSIN/CS
FSIN/CS
*ADDITIONAL PINS OMITTED FOR CLARITY
8/10-BIT
D IN
SCLK
D IN
SCLK
DAC
DAC
+5V
V
GND
V
GND
5V
DD
DD8/10-BIT
digital signals driving the DACs need to be level-shifted from the 0 V to +5 V range to the –5 V to 0 V range. Figure 22 shows a typical application circuit to provide programmable reference capabilities for the AD7839.
0V TO +5V
0V TO ⴚ5V
A0, A1, A2
V
(+)AB
REF
AD7839*
()AB
V
REF
DATA BUS
GND
V
A
A
V
OUT
B
V
OUT
OUT
V
B
OUT
C3168–2–4/99
Figure 22. Programmable Reference Generation for the AD7839
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
44-Lead MQFP (S-44)
0.548 (13.925)
34
44
33
1
0.033 (0.84)
0.029 (0.74)
0.546 (13.875)
0.398 (10.11)
0.390 (9.91)
TOP VIEW
(PINS DOWN)
0.016 (0.41)
0.012 (0.30)
23
22
12
11
0.037 (0.94)
0.025 (0.64)
SEATING
PLANE
0.040 (1.02)
0.032 (0.81)
0.096 (2.44) MAX
0.083 (2.11)
0.077 (1.96)
0.8°
0.040 (1.02)
0.032 (0.81)
PRINTED IN U.S.A.
–12–
REV. 0
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