FEATURES
Four 14-Bit DACs in One Package
Voltage Outputs
Separate Offset Adjust for Each Output
Reference Range of 5 V
Maximum Output Voltage Range of 10 V
Clear Function to User-Defined Code
44-Pin MQFP Package
APPLICATIONS
Process Control
Automatic Test Equipment
General Purpose Instrumentation
Quad 14-Bit DAC
AD7836
GENERAL DESCRIPTION
The AD7836 contains four 14-bit DACs on one monolithic
chip. It has output voltages with a full-scale range of ±10 V
from reference voltages of ±5 V.
The AD7836 accepts 14-bit parallel loaded data from the external bus into one of the input latches under the control of the
WR, CS and DAC channel address pins, A0–A2.
The DAC outputs are updated individually, on reception of new
data. In addition, the SEL input can be used to apply the user
programmed value in DAC Register E to all DACs, thus setting
all DAC output voltages to the same level. The contents of the
DAC data registers are not affected by the SEL input.
Each DAC output is buffered with a gain of two amplifier into
which an external DAC offset voltage can be inserted via the
DUTGNDx pins.
The AD7836 is available in a 44-lead MQFP package.
FUNCTIONAL BLOCK DIAGRAM
DB13
DB0
WR
(+)A
REF
X1X1
DAC A
DAC D
X1X1
(+)D V
REF
V
REF
REF
(–)A V
(–)D V
(+)B V
REF
X1
DAC B
DAC B
X1X1
(+)C V
REF
REF
REF
(–)B
V
A
X1
(–)C
CLR
R
R
R
R
R
R
R
R
OUT
DUTGND A
V
B
OUT
DUTGND B
C
V
OUT
DUTGND C
V
D
OUT
DUTGND D
MUX
MUX
MUX
MUX
SELAGNDDGND
V
V
V
CCVSSVDD
AD7836
14
INPUT
BUFFER
CS
A0
A1
A2
ADDRESS
DECODE
1414
DATA
14
DATA
DATA
DATA
DATA
REG
A
REG
B
REG
C
REG
D
REG
E
14
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
(VCC = +5 V 5%; VDD = +15 V 5%; VSS = –15 V 5%; AGND = DGND = DUTGND
AD7836–SPECIFICATIONS
= 0 V; RL = 5 k and CL = 50 pF to GND, T
ParameterAUnitsTest Conditions/Comments
ACCURACY
Resolution14Bits
Relative Accuracy±2LSB max
Differential Nonlinearity±0.9LSB maxGuaranteed Monotonic Over Temperature
Full-Scale Error±8LSB maxV
Zero-Scale Error±8LSB maxV
Gain Error±2mV typV
Gain Temperature Coefficient
DC Crosstalk
2
2
20ppm FSR/°C typ
40ppm FSR/°C max
50µV maxSee Terminology. RL = 5 kΩ
(+) = +5 V, V
REF
(+) = +5 V, V
REF
(+) = +5 V, V
REF
REFERENCE INPUTS
DC Input Resistance100MΩ typ
Input Current±1µA maxPer Input. Typically ±20 nA
(+) Range0/+5V min/max
V
REF
V
(–) Range–5/0V min/max
REF
[V
REF
(+) – V
(–)]2/10V min/maxFor Specified Performance. Can Go as Low as 0 V,
REF
but Performance Not Guaranteed
OUTPUT CHARACTERISTICS
Output Voltage Swing±10V min2 × (V
REF
(–)+[V
Short Circuit Current25mA max
Resistive Load5kΩ minTo 0 V
Capacitive Load50pF maxTo 0 V
DIGITAL INPUTS
, Input High Voltage2.4V min
V
INH
, Input Low Voltage0.8V max
V
INL
, Input Current±10µA maxTotal for All Pins
I
INH
CIN, Input Capacitance10pF max
POWER REQUIREMENTS
V
CC
V
DD
V
SS
5.0V nom±5% for Specified Performance
15.0V nom±5% for Specified Performance
–15.0V nom±5% for Specified Performance
Power Supply Sensitivity
∆Full Scale/∆V
∆Full Scale/∆V
I
CC
I
DD
I
SS
DD
SS
110dB typ
100dB typ
0.5mA maxV
8mA maxV
= VCC, V
INH
= 2.4 V min, V
INH
14mA maxOutputs Unloaded. Typically 7 mA
14mA maxOutputs Unloaded. Typically 7 mA
1
= T
to T
A
MIN
(–) = –5 V. Typically within ±1 LSB
REF
(–) = –5 V. Typically within ±1 LSB
REF
(–) = –5 V
REF
(+)-V
REF
INL
REF
= DGND. Dynamic Current
= 0.8 V max
INL
, unless otherwise noted)
MAX
(–)]•D) – V
DUTDGN
(These characteristics are included for Design Guidance and are not
AC PERFORMANCE CHARACTERISTICS
ParameterAUnitsTest Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time16µs typFull-Scale Change to ±1/2 LSB. DAC Latch Contents Alternately
Digital-to-Analog Glitch Impulse150nV-s typMeasured with V
DC Output Impedance0.3Ω maxSee Terminology
Channel-to-Channel Isolation115dB typSee Terminology
DAC-to-DAC Crosstalk10nV-s typSee Terminology
Digital Crosstalk10nV-s typFeedthrough to DAC Output Under Test Due to Change in Digital
Digital Feedthrough0.2nV-s typEffect of Input Bus Activity on DAC Output Under Test
Output Noise Spectral Density
@ 1 kHz40nV/√Hz typAll 1s Loaded to DAC. V
NOTES
1
Temperature range for A Version: –40°C to +85°C
2
Guaranteed by design.
Specifications subject to change without notice.
subject to production testing.)
Loaded with All 0s and All 1s
REF
Alternately Loaded with 1FFF Hex and 2000 Hex. Not Dependent
on Load Conditions
Input Code to Another Converter
–2–
(+) = +5 V, V
(+) = V
REF
(–) = –5 V. DAC Latch
REF
(–) = 0 V
REF
REV. A
Page 3
TIMING SPECIFICATIONS
1
(VCC = +5 V 5%; VDD = +15 V 5%; VSS = –15 V 5%; AGND = DGND = 0 V)
AD7836
ParameterLimit at T
t
1
t
2
t
3
t
4
t
5
t
6
t
7
t
8
t
9
t
10
NOTES
1
All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2
Rise and fall times should be no longer than 50 ns.
Specifications subject to change without notice.
15ns minA0, A1, A2 to WR Setup Time
0ns minA0, A1, A2 to WR Hold Time
0ns minCS to WR Setup Time
0ns minWR to CS Hold Time
44ns minWR Pulsewidth
15ns minData Setup Time
4.5ns minData Hold Time
44ns minWR Pulse Interval
16µs typSettling Time
300ns maxCLR Pulse Activation Time
A0, A1, A2
CS
WR
DATA
MIN, TMAX
t
3
t
1
t
5
t
6
UnitsDescription
t
2
t
4
t
8
t
7
t
9
V
OUT
t
CLR
V
OUT
10
Figure 1. Timing Diagram
REV. A
–3–
Page 4
AD7836
ABSOLUTE MAXIMUM RATINGS
(TA = +25°C unless otherwise noted)
VCC to DGND . . . . . . . . . . . . . . .–0.3 V, +7 V or V
Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.
Linearity
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7836 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
–4–
REV. A
Page 5
Pin MnemonicDescription
AD7836
PIN DESCRIPTION
V
CC
V
SS
V
DD
Logic Power Supply; +5 V ± 5%.
Negative Analog Power Supply; –15 V ± 5%.
Positive Analog Power Supply; +15 V ± 5%.
DGNDDigital Ground.
AGNDAnalog Ground.
V
V
V
V
V
REF
REF
REF
REF
OUT
(+)A, V
(+)B, V
(+)C, V
(+)D, V
A...V
(–)AReference Inputs for DAC A. These reference voltages are referred to AGND.
REF
(–)BReference Inputs for DAC B. These reference voltages are referred to AGND.
REF
(–)CReference Inputs for DAC C. These reference voltages are referred to AGND.
REF
(–)DReference Inputs for DAC D. These reference voltages are referred to AGND.
REF
DDAC Outputs.
OUT
CSLevel-Triggered Chip Select Input (active low). The device is selected when this input is low.
DB0 . . . DB13Parallel Data Inputs. The AD7836 can accept a straight 14-bit parallel word on DB0 to DB13 where
DB13 is the MSB and DB0 is the LSB.
A0, A1, A2Address inputs. A0, A1 and A2 are decoded to select one of the five input latches for a data transfer.
CLRAsynchronous Clear Input (level sensitive, active low). When this input is low, all analog outputs are
switched to the externally set potential on the DUTGND pin. The contents of data registers A to E are
not affected when the CLR pin is taken low. When CLR is brought back high, the DAC outputs revert
back to their original outputs as determined by the data in their data registers.
WRLevel-Triggered Write Input (active low), when active and used in conjunction with CS to write data to
the AD7836 input buffer. Data is latched into the selected data register on the rising edge of WR.
DUTGND ADevice Sense Ground for DAC A. Vout A is referenced to the voltage applied to this pin.
DUTGND BDevice Sense Ground for DAC B. Vout B is referenced to the voltage applied to this pin.
DUTGND CDevice Sense Ground for DAC C. Vout C is referenced to the voltage applied to this pin.
DUTGND DDevice Sense Ground for DAC D. Vout D is referenced to the voltage applied to this pin.
SELSelect pin, active high level triggered input. When the SEL input is high, the user programmed value in
DATAREG E will be loaded into all DAC registers and the DAC outputs updated accordingly. The con-
tents of the other DATA REGs (A–D) will not be affected by the SEL pin.
34
C
V
OUT
35
(–)C
V
REF
36
(+)C
V
REF
37
AGND
38
NC
39
V
DD
40
NC
41
V
SS
42
V
(+)A
REF
43
(–)A
V
REF
44
A
V
OUT
NC = NO CONNECT
PIN CONFIGURATION
D
(+)D
(–)D
OUT
REF
REF
V
V
DUTGND C
PIN 1
IDENTIFIER
234567891011
1
(–)B
(+)B
REF
REF
V
V
DUTGND A
DB13
V
DUTGND D
AD7836
TOP VIEW
(Not to Scale)
B
A2A1A0
OUT
V
DUTGND B
DB12
DB11
DB10
SEL
DB9
CS
DB8
2324252627282930313233
22
DB7
21
DB6
20
DB5
19
DB4
18
DB3
17
DB2
16
DB1
15
DB0
14
DGND
13
V
CC
CLR
12
WR
REV. A
–5–
Page 6
AD7836
TERMINOLOGY
Relative Accuracy
Relative accuracy or endpoint linearity is a measure of the maximum deviation from a straight line passing through the endpoints
of the DAC transfer function. It is measured after adjusting for
zero error and full-scale error and is normally expressed in Least
Significant Bits or as a percentage of full-scale reading.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB maximum
ensures monotonicity.
DC Crosstalk
Although the common input reference voltage signals are internally buffered, small IR drops in the individual DAC reference
inputs across the die can mean that an update to one channel
can produce a dc output change in one or other of the channel
outputs.
The four DAC outputs are buffered by op amps that share common V
and VSS power supplies. If the dc load current changes
DD
in one channel (due to an update), this can result in a further dc
change in one or other channel outputs. This effect is most obvious at high load currents and reduces as the load currents are
reduced. With high impedance loads the effect is virtually
unmeasurable.
Output Voltage Settling Time
This is the amount of time it takes for the output to settle to a
specified level for a full-scale input change.
Digital-to-Analog Glitch Impulse
This is the amount of charge injected into the analog output when
the inputs change state. It is specified as the area of the glitch in
nV-secs. It is measured with V
(+) = +5 V and V
REF
(–) = –5 V
REF
and the digital inputs toggled between 1FFFHEX and 8000H.
Channel-to-Channel Isolation
Channel-to-channel isolation refers to the proportion of input
signal from one DACs reference input that appears at the output
of the other DAC. It is expressed in dBs.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is defined as the glitch impulse that appears at the output of one converter due to both the digital
change and subsequent analog O/P change at another converter.
It is specified in nV-s.
Digital Crosstalk
The glitch impulse transferred to the output of one converter
due to a change in digital input code to the other converter is
defined as the digital crosstalk and is specified in nV-s.
Digital Feedthrough
When the device is not selected, high frequency logic activity on
the device’s digital inputs can be capacitively coupled both
across and through the device to show up as noise on the V
OUT
pins. This noise is digital feedthrough.
DC Output Impedance
This is the effective output source resistance. It is dominated by
package lead resistance.
Full-Scale Error
This is the error in DAC output voltage when all 1s are loaded
into the DAC latch. Ideally the output voltage, with all 1s
loaded into the DAC latch, should be 2 V
(+) – 1 LSB. Full-
REF
scale error does not include zero-scale error.
Zero-Scale Error
Zero-scale error is the error in the DAC output voltage when all
0s are loaded into the DAC latch. Ideally the output voltage,
with all 0s in the DAC latch should be equal to 2 V
(–). Zero-
REF
scale error is mainly due to offsets in the output amplifier.
Gain Error
Gain Error is defined as (Full-Scale Error) – (Zero-Scale Error).
GENERAL DESCRIPTION
DAC Architecture—General
Each channel consists of a segmented 14-bit R-2R voltage-mode
DAC. The full-scale output voltage range is equal to twice the
reference span of V
straight binary; all 0s produces an output of 2 V
produces an output of 2 V
REF
(+) – V
REF
(–). The DAC coding is
REF
REF
(+) – 1 LSB.
(–); all 1s
The analog output voltage of each DAC channel reflects the
contents of its own DAC latch. Data is transferred from the external bus to the input register of each DAC latch on a per
channel basis. The AD7836 has a feature whereby using the A2
pin, data can be transferred from the input data bus to all four
input registers simultaneously.
Bringing the CLR line low switches all the signal outputs,
V
OUT
A to V
D, to the voltage level on the DUTGND pin.
OUT
When CLR signal is brought back high the output voltages from
the DACs will reflect the data stored in the relevant DAC
registers.
Data Loading to the AD7836
Data is loaded into the AD7836 in straight parallel 14-bit wide
words.
The DAC output voltages, V
OUT
A–V
D are updated to
OUT
reflect new data in the DAC input registers.
The actual DAC input register that is being written to is determined by the logic levels present on the devices address lines, as
shown in Table I.
Table I. Address Line Truth Table
A2A1A0DAC Selected
000DATA REG A (DAC A)
001DATA REG B (DAC B)
010DATA REG C (DAC C)
011DATA REG D (DAC D)
100DATA REG E
111DATA REG A–D
–6–
REV. A
Page 7
Typical Performance Characteristics–AD7836
1.0
0.8
0.6
0.4
0.2
0.0
–0.2
–0.4
INL ERROR – LSBs
–0.6
–0.8
–1.0
024681012
INPUT CODE/1000
14 16
Figure 2. Typical INL Plot
1.0
0.5
0
DNL ERROR – LSB
–0.5
–1.0
–4090–20020406080
TEMPERATURE – °C
VDD = 15V
V
= –15V
SS
V
(+) = +5V
REF
V
(–) = –5V
REF
Figure 5. Typical DNL Error vs.
Temperature
0.9
0.6
0.4
0.2
0.0
–0.2
–0.4
DNL ERROR – LSBs
–0.6
–0.9
02
4681012
INPUT CODE/1000
1416
Figure 3. Typical DNL Plot
2
VDD = 15V
V
= –15V
SS
V
(+) = +5V
REF
1
V
(–) = –5V
REF
FULL-SCALE ERROR
0
ERROR – LSB
–1
–2
–4090–20020406080
OFFSET ERROR
TEMPERATURE – °C
Figure 6. Offset and Full-Scale Error
vs. Temperature
2
1
0
INL ERROR – LSB
–1
–2
–20020406080
–4090
TEMPERATURE – °C
VDD = 15V
V
= –15V
SS
V
(+) = +5V
REF
V
(–) = –5V
REF
Figure 4. Typical INL Error vs.
Temperature
6
DIGITAL INPUTS @ THRESHOLDS
5
4
VCC = 5V
V
= 15V
DD
3
V
= –15V
SS
– mA
2
CC
I
1
DIGITAL INPUTS @ SUPPLIES
0
–1
–4090–20 0 20406080
TEMPERATURE – °C
Figure 7. ICC vs. Temperature
0.7
VERT = 100mV/DIV
0.6
HORIZ = 1s/DIV
0.5
0.4
0.3
0.2
0.1
0
–0.1
–0.2
Figure 8. Typical Digital/Analog
Glitch Impulse
10.2
10.0
9.8
– V
OUT
V
9.6
9.4
9.2
1114
1213
SETTLING TIME – s
Figure 9. Settling Time (+)
8
7
VDD = 15V
V
= –15V
SS
– mA
6
V
SS
/I
DD
I
Figure 10. IDD/I
(+) = +5V
REF
V
(–) = –5V
REF
5
4
–4090–20020406080
TEMPERATURE – °C
vs. Temperature
SS
REV. A
–7–
Page 8
AD7836
Unipolar Configuration
Figure 11 shows the AD7836 in the unipolar binary circuit configuration. The V
AD586, a +5 V reference. V
(+) input of the DAC is driven by the
REF
(–) is tied to ground. Table II
REF
gives the code table for unipolar operation of the AD7836.
Other suitable references include the REF02, a precision 5 V
reference, and the REF195, a low dropout, micropower precision +5 V reference.
+15V+5V
C1
1nF
2
8
6
AD586
5
4
SIGNAL
GND
*ADDITIONAL PINS OMITTED FOR CLARITY
R1
10k
V
REF
V
REF
V
DD
(+)
AD7836*
(–)
V
–15V
V
CC
V
DUTGND
AGND
DGND
SS
OUT
V
(0 TO +10V)
SIGNAL
GND
OUT
Figure 11. Unipolar +5 V Operation
Offset and gain may be adjusted in Figure 2 as follows: To adjust offset, disconnect the V
with all 0s and adjust the V
(–) input from 0 V, load the DAC
REF
(–) voltage until V
REF
= 0 V. For
OUT
gain adjustment, the AD7836 should be loaded with all 1s and
R1 adjusted until V
= 10 V(16383/16384) = 9.999389.
OUT
Many circuits will not require these offset and gain adjustments. In
these circuits R1 can be omitted. Pin 5 of the AD586 may be left
open circuit and Pin 2 (V
(–)) of the AD7836 tied to 0 V.
REF
Table II. Code Table for Unipolar Operation
Binary Number in DAC LatchAnalog Output
MSB LSB(V
111111111111112 V
100000000000002 V
011111111111112 V
000000000000012 V
Figure 12 shows the AD7836 set up for ±10 V operation. The
AD588 provides precision ±5 V tracking outputs that are fed to
the V
(+) and V
REF
(–) inputs of the AD7836. The code table
REF
for bipolar operation of the AD7836 is shown in Table III.
In Figure 12, full-scale and bipolar zero adjustments are provided by varying the gain and balance on the AD588. R2 varies
the gain on the AD588 while R3 adjusts the offset of both the
+5 V and –5 V outputs together with respect to ground.
For bipolar-zero adjustment, the DAC is loaded with
1000 . . . 0000 and R3 is adjusted until V
= 0 V. Full scale
OUT
is adjusted by loading the DAC with all 1s and adjusting R2 until V
= 10(8191/8192) V = 9.998779 V.
OUT
When bipolar-zero and full-scale adjustment are not needed,
R2 and R3 can be omitted. Pin 12 on the AD588 should be
connected to Pin 11 and Pin 5 should be left floating.
A block diagram of the output stage of the AD7836 is shown in
Figure 13. It is capable of driving a load of 5 kΩ in parallel
with 50 pF. G
control the power on voltage present at V
to G6 are transmission gates that are used to
1
. On power up G
OUT
1
and G2 are also used in conjunction with the CLR input to set
V
to the user defined voltage present at the DUTGND pin.
OUT
When CLR is taken back high the DAC outputs reflect the data
in the DAC registers.
G
DAC
1
G
G
G
R
4
G
DUTGND
R = 13.5k
2
G
6
3
5
6k
V
OUT
Figure 13. Block Diagram of AD7836 Output Stage
–8–
REV. A
Page 9
AD7836
Power-On with CLR Low
The output stage of the AD7836 has been designed to allow
output stability during power-on. If CLR is kept low during
power-on, then just after power is applied to the AD7836, the
situation is as depicted in Figure 14. G
while G
, G3 and G5 are closed.
2
G
DAC
1
G
G
2
4
R
DUTGND
G
G
, G4 and G6 are open
1
G
6
3
R
5
6k
V
OUT
Figure 14. Output Stage with VDD < 10 V
V
is kept within a few hundred millivolts of DUTGND via
OUT
and a 6kΩ resistor. This thin-film resistor is connected in
G
5
parallel with the gain resistors of the output amplifier. The output amplifier is connected as a unity gain buffer via G
DUTGND voltage is applied to the buffer input via G
, and the
3
. The
2
amplifier’s output is thus at the same voltage as the DUTGND
pin. The output stage remains configured as in Figure 14 until
the voltage at V
and VSS reaches approximately ±10 V. By
DD
now the output amplifier has enough headroom to handle signals at its input and has also had time to settle. The internal
power-on circuitry opens G
and G5 and closes G4 and G6. This
3
situation is shown in Figure 15. Now the output amplifier is
configured in its noise gain configuration via G
and G6. The
4
DUTGND voltage is still connected to the noninverting input
via G2 and this voltage appears at V
G
DAC
1
G
R
G
4
G
DUTGND
R
G
2
Figure 15. Output Stage with VDD > 10 V and
V
has been disconnected from the DUTGND pin by the
OUT
opening of G
but will track the voltage present at DUTGND
5
.
OUT
G
6
3
5
6k
V
OUT
CLR
Low
via the configuration shown in Figure 15.
When CLR is taken back high, the output stage is configured as
shown in Figure 16. The internal control logic closes G
opens G
. The output amplifier is connected in a noninverting
2
and
1
gain of two configuration. The voltage that appears on the Vout
pins is determined by the data present in the DAC registers. To
set all output voltages to the same known state, a write to
DATA REG E with the SEL pin high allows all DAC registers
to be updated with the same data.
G
DAC
1
G
G
G
R
4
G
DUTGND
R
2
Figure 16. Output Stage After
G
6
3
5
6k
CLR
Is Taken High
V
OUT
Power-On with CLR High
If CLR is high on the application of power to the device, the
output stages of the AD7836 are configured as in Figure 17
while V
are less than ±10 V. G1 is closed and G2 is open
DD/VSS
thereby connecting the output of the DAC to the input of its
output amplifier. G
and G5 are closed while G4 and G6 are
3
open thus connecting the output amplifier as a unity gain
buffer. V
resistor until V
Figure 17. Output Stage Powering Up with
While V
is connected to DUTGND via G5 through a 6 kΩ
OUT
DAC
DD/VSS
and VSS reach approximately ±10 V.
DD
G
1
G
G
G
R
4
G
DUTGND
R
2
G
6
3
5
6k
CLR
< ±10 V
V
High
OUT
When the supplies reach ±10 V, the internal power on circuitry
opens G
and G5 and closes G4 and G6 configuring the output
3
stage as shown in Figure 18.
G
DAC
1
G
G
G
R
4
G
DUTGND
R
2
Figure 18. Output Stage Powering Up with
When V
DD/VSS
> ±10 V
G
6
3
5
6k
CLR
V
OUT
High
REV. A
–9–
Page 10
AD7836
DUTGND Voltage Range
During power-on, the V
to the relevant DUTGND pins via G
pins of the AD7836 are connected
OUT
and the 6 kΩ thin-film
6
resistor. The DUTGND potential must obey the max ratings at
all times. Thus, the voltage at DUTGND must always be
within the range V
that the voltages at the V
– 0.3 V, VDD + 0.3 V. However, in order
SS
pins of the AD7836 stay within
OUT
±2 V of the relevant DUTGND potential during power-on, the
voltage applied to DUTGND should also be kept within the
range AGND – 2 V, AGND + 2 V.
Once the AD7836 has powered on and the on-chip amplifiers
have settled, any voltage that is now applied to the DUTGND
pin is subtracted from the DAC output which has been gained
up by a factor of two. Thus, for specified operation, the maximum voltage that can be applied to the DUTGND pin increases
to the maximum allowable 2 × V
(+) voltage, and the mini-
REF
mum voltage that can be applied to DUTGND is the minimum
2 × V
(–) voltage. After the AD7836 has fully powered on,
REF
the outputs can track any DUTGND voltage within this
minimum/maximum range.
MICROPROCESSOR INTERFACING
Interfacing the AD7836—16-Bit Interface
The AD7836 can be interfaced to a variety of 16-bit microcontrollers or DSP processors. Figure 19 shows the AD7836
interfaced to a generic 16-bit microcontroller/DSP processor.
The lower address lines from the processor are connected to
A0, A1 and A2 on the AD7836 as shown. The upper address
lines are decoded to provide a chip select signal for the
AD7836. They are also decoded (in conjunction with the lower
address lines if need be) to provide a SEL signal. The fast interface timing of the AD7836 allows direct interface to a wide variety of microcontrollers and DSPs as shown in Figure 19.
CONTROLLER/
DSP
PROCESSOR*
DATA
BUS
UPPER BITS OF
ADDRESS BUS
*ADDITIONAL PINS OMITTED FOR CLARITY
D13
D0
A2
A1
A0
R/W
AD7836
•
•
•
ADDRESS
DECODE
D13
D0
CS
A2
A1
A0
WR
•
•
•
*
Figure 19. AD7836 Parallel Interface
APPLICATIONS
Power Supply Bypassing and Grounding
In any circuit where accuracy is important, careful consideration of the power supply and ground return layout helps to
ensure the rated performance. The printed circuit board on
which the AD7836 is mounted should be designed such that
the analog and digital sections are separated and confined to
certain areas of the board. This facilitates the use of ground
planes that can be separated easily. A minimum etch technique is generally best for ground planes as it gives the best
shielding. Digital and analog ground planes should only be
joined at one place. If the AD7836 is the only device requiring
an AGND to DGND connection, then the ground planes
should be connected at the AGND and DGND pins of the
AD7836. If the AD7836 is in a system where multiple devices
require an AGND to DGND connection, the connection
should still be made at one point only, a star ground point
which should be established as close as possible to the
AD7836.
Digital lines running under the device should be avoided as
these will couple noise onto the die. The analog ground plane
should be allowed to run under the AD7836 to avoid noise
coupling. The power supply lines of the AD7836 should use
as large a trace as possible to provide low impedance paths and
reduce the effects of glitches on the power supply line. Fast
switching signals like clocks should be shielded with digital
ground to avoid radiating noise to other parts of the board and
should never be run near the analog inputs.
Avoid crossover of digital and analog signals. Traces on opposite sides of the board should run at right angles to each other.
This reduces the effects of feedthrough through the board. A
microstrip technique is by far the best but not always possible
with a double sided board. In this technique, the component
side of the board is dedicated to ground plane while signal
traces are placed on the solder side.
The AD7836 should have ample supply bypassing located as
close to the package as possible, ideally right up against the
device. Figure 20 shows the recommended capacitor values of
10 µF in parallel with 0.1 µF on each of the supplies. The 10 µF
capacitors are the tantalum bead type. The 0.1 µF capacitor
should have low Effective Series Resistance (ESR) and Effective Series Inductance (ESI), such as the common ceramic
types, which provide a low impedance path to ground at high
frequencies to handle transient currents due to internal logic
switching.
V
V
CC
DD
10F0.1F10F0.1F
AD7836
V
SS
10F0.1F
Figure 20. Recommended Decoupling Scheme
for AD7836
–10–
REV. A
Page 11
AD7836
Automated Test Equipment
The AD7836 is particularly suited for use in an automated test
environment. Figure 21 shows the AD7836 providing the necessary voltages for the pin driver and the window comparator in
a typical ATE pin electronics configuration. AD588s are used
to provide reference voltages for the AD7836. In the configuration shown, the AD588s are configured so that the voltage at
Pin 1 is 5 V greater than the voltage at Pin 9 and the voltage at
Pin 15 is 5 V less than the voltage at Pin 9.
V
OFFSET
162
3
1
15
14
9
0.1F
V
(+)A/B
REF
V
(–)A/B
REF
DUTGND A/B
V
OUT
V
OUT
AD7836*
DUTGND C/D
162
3
1
15
14
8
DEVICE
GND
*
ADDITIONAL PINS OMITTED FOR CLARITY
V
(+)C/D
REF
V
(–)C/D
REF
AGND
V
OUT
V
OUT
WINDOW
COMPARATOR
+15V
A
PIN
DRIVER
B
–15V
V
DEVICE
GND
C
D
TO TESTER
OUT
DEVICE
GND
1F
+15V –15V
4
6
8
13
7
+15V –15V
4
6
8
13
10
11
12
1F
AD588
10 11 12
AD588
7
Figure 21. ATE Application
One of the AD588s is used as a reference for DACs 1 and 2.
These DACs are used to provide high and low levels for the pin
driver. The pin driver may have an associated offset. This can
be nulled by applying an offset voltage to Pin 9 of the AD588.
First, the code 1000 . . . 0000 is loaded into the DACA latch
and the pin driver output is set to the DACA output. The
V
driver output and DUT GND. This causes both V
V
to V
voltage is adjusted until 0 V appears between the pin
OFFSET
(–) to be offset with respect to AGND by an amount equal
REF
. However, the output of the pin driver will vary
OFFSET
(+) and
REF
from –10 V to +10 V with respect to DUT GND as the DAC
input code varies from 000 . . . 000 to 111 . . . 111. The
V
voltage is also applied to the DUTGND pins. When a
OFFSET
clear is performed on the AD7836, the output of the pin driver
will be 0 V with respect to Device GND.
The other AD588 is used to provide a reference voltage for
DACs C and D. These provide the reference voltages for the
window comparator shown in the diagram. Note that Pin 9 of
this AD588 is connected to Device GND. This causes
V
(+)C & D and V
REF
(–)C & D to be referenced to Device
REF
GND. As DAC 3 and DAC 4 input codes vary from
000 . . . 000 to 111 . . . 111, V
OUT
3 and V
4 vary from –10 V
OUT
to +10 V with respect to Device GND. Device GND is also
connected to DUTGND. When the AD7836 is cleared,
V
OUT
C and V
D are cleared to 0 V with respect to DEVICE
OUT
GND.
TrimDAC is a registered trademark of Analog Devices, Inc.
Programmable Reference Generation for the AD7836 in an
ATE Application
The AD7836 is particularly suited for use in an automated test
environment. The reference input for the AD7836 quad 14-bit
DAC requires two references for each DAC. Programmable
references may be a requirement in some ATE applications as
the offset and gain errors at the output of each DAC can be adjusted by varying the voltages on the reference pins of the DAC.
To trim offset errors, the DAC is loaded with the digital code
000 . . . 000 and the voltage on the V
(–) pin is adjusted until
REF
the desired negative output voltage is obtained. To trim out
gain errors, first the offset error is trimmed. Then the DAC is
loaded with the code 111 . . . 111 and the voltage on the
V
(+) pin is adjusted until the desired full scale voltage
REF
minus one LSB is obtained.
It is not uncommon in ATE design, to have other circuitry at
the output of the AD7836 that can have offset and gain errors
of up to say ±300 mV. These offset and gain errors can be easily removed by adjusting the reference voltages of the AD7836.
The AD7836 uses nominal reference values of ±5 V to achieve
an output span of ±10 V. Since the AD7836 has a gain of two
from the reference inputs to the DAC output, adjusting the reference voltages by ±150 mV will adjust the DAC offset and
gain by ±300 mV.
There are a number of suitable 8- and 10-bit DACs available
that would be suitable to drive the reference inputs of the
AD7836, such as the AD7804 which is a quad 10-bit digital-toanalog converter with serial load capabilities. The voltage output from this DAC is in the form of V
BIAS
± V
SWING
and rail to
rail operation is achievable. The voltage reference for this DAC
can be internally generated or provided externally. This DAC
also contains an 8-bit SUB DAC which can be used to shift the
complete transfer function of each DAC around the V
BIAS
point. This can be used as a fine trim on the output voltage. In
this Application two AD7804s are required to provide programmable reference capability for all four DACs. One AD7804 is
used to drive the V
drive the V
(–) pins.
REF
Another suitable DAC for providing programmable reference
capability is the AD8803. This is an octal 8-bit trimDAC
(+) pins and the second package used to
REF
®
and
provides independent control of both the top and bottom ends
of the trimDAC. This is helpful in maximizing the resolution of
devices with a limited allowable voltage control range.
The AD8803 has an output voltage range of GND to V
+5 V). To trim the V
on the AD8803 DAC can be set using the V
(+) input, the appropriate trim range
REF
REFL
DD
and V
(0 V to
REFH
pins allowing 8 bits of resolution between the two points. This
will allow the V
To trim the V
(+) pin to be adjusted to remove gain errors.
REF
(–) voltage, some method of providing a trim
REF
voltage in the required negative voltage range is required. Neither the AD7804 or the AD8803 can provide this range in normal operation as their output range is 0 V to +5 V. There are
two methods of producing this negative voltage. One method is
to provide a positive output voltage and then to level shift that
analog voltage to the required negative range. Alternatively
REV. A
–11–
Page 12
AD7836
these DACs can be operated with supplies of 0 V and a –5 V,
with the V
pin connected to 0 V and the GND pin connected
DD
to –5 V. Now these can be used to provide the negative reference voltages for the V
(–) inputs on the AD7836. However,
REF
ADDR BUS
ADDR
DECODER
FSIN/CS
SDATA
SCLK
CONTROLLER
DATA BUS
LOGIC LEVEL
SHIFT
*
DIN
SCLK
FSIN/CS
DIN
SCLK
ADDITIONAL PINS OMITTED FOR CLARITY
8/10-BIT
DAC
8/10-BIT
DAC
the digital signals driving the DACs need to be level shifted
from the 0 V to +5 V range to the –5 V to 0 V range. Figure 22
shows a typical application circuit to provide programmable reference capabilities for the AD7836.
+5V
V
DD
A0,A1,A2
V
(+)A
REF
AD7836
(–) A
V
REF
DATA BUS
AGND
V
OUT
V
A
OUT
*
GND
V
GND
–5V
0V to 5V
DD
0V to -5V
C2163a–0–9/99
Figure 22. Programmable Reference Generation for the AD7836
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
44-Lead MQFP (S-44)
0.548 (13.925)
0.037 (0.94)
0.025 (0.64)
SEATING
PLANE
0.040 (1.02)
0.032 (0.81)
0.096 (2.44)
MAX
0.083 (2.11)
0.077 (1.96)
8
0.8
0.040 (1.02)
0.032 (0.81)
34
44
33
1
0.033 (0.84)
0.029 (0.74)
0.546 (13.875)
0.398 (10.11)
0.390 (9.91)
TOP VIEW
(PINS DOWN)
0.016 (0.41)
0.012 (0.30)
23
22
12
11
PRINTED IN U.S.A.
–12–
REV. A
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