Fast throughput rate: 1 MSPS
Specified for V
Low power at maximum throughput rate:
4 mW maximum at 1 MSPS with V
9.25 mW maximum at 1 MSPS with V
Pseudo differential analog input
Wide input bandwidth:
70 dB SINAD at 100 kHz input frequency
Flexible power/serial clock speed management
No pipeline delays
High speed serial interface:
SPI®-/QSPI™-/M
Power-down mode: 1 μA maximum
8-lead SOT-23 and MSOP packages
APPLICATIONS
Transducer interface
Battery-powered systems
Data acquisition systems
Portable instrumentation
of 2.7 V to 5.25 V
DD
= 3 V
DD
DD
ICROWIRE™-/DSP-compatible
= 5 V
10-/12-Bit ADCs in an 8-Lead SOT-23
AD7441/AD7451
FUNCTIONAL BLOCK DIAGRAM
DD
V
IN+
V
IN–
V
REF
AD7441/AD7451
T/H
GND
12-BIT
SUCCESSIVE
APPROXIMATION
ADC
CONTRO L LO GIC
Figure 1.
SCLK
SDATA
CS
03153-001
GENERAL DESCRIPTION
The AD7441/AD74511 are, respectively, 10-/12-bit high speed,
low power, single-supply, successive approximation (SAR),
analog-to-digital converters (ADCs) that feature a pseudo
differential analog input. These parts operate from a single
2.7 V to 5.25 V power supply and achieve very low power
dissipation at high throughput rates of up to 1 MSPS.
The AD7441/AD7451 contain a low noise, wide bandwidth,
dif
ferential track-and-hold (T/H) amplifier that handles input
frequencies up to 3.5 MHz. The reference voltage for these
devices is applied externally to the V
100 mV to V
, depending on the power supply and what suits
DD
the application.
The conversion process and data acquisition are controlled
CS
and the serial clock, allowing the device to interface
g
usin
with microprocessors or DSPs. The input signals are sampled
on the falling edge of
CS
when the conversion is initiated.
The SAR architecture of these parts ensures that there are no
pipeline delays.
1
Protected by U.S. Patent Number 6,681,332.
pin and can range from
REF
PRODUCT HIGHLIGHTS
1. Operation with 2.7 V to 5.25 V Power Supplies.
2. H
igh Throughput with Low Power Consumption.
With a 3 V supply, the AD7441/AD7451 offer 4 mW maximum power consumption for a 1 MSPS throughput rate.
3. P
seudo Differential Analog Input.
4. F
lexible Power/Serial Clock Speed Management.
The conversion rate is determined by the serial clock,
allowing the power to be reduced as the conversion time
is reduced through the serial clock speed increase. These
parts also feature a shutdown mode to maximize power
efficiency at lower throughput rates.
5. V
ariable Voltage Reference Input.
6. No
Pipeline Delays.
ccurate Control of Sampling Instant via
7. A
Once-Off Conversion Control.
8. EN
OB > 10 Bits Typically with 500 mV Reference.
CS
Input and
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Changes to General Description .......................................................1
Changes to Table 1 Footnotes ............................................................ 4
Changes to Table 2 Footnotes ............................................................ 6
Changes to Table 3 Footnotes ............................................................ 7
Changes to Table 5 .............................................................................. 9
Updated Figures 7, 8, and 9.............................................................. 13
Changes to Figure 23.........................................................................16
Changes to Reference Section.......................................................... 17
9/03—Revision 0: Initial Version
Rev. C | Page 2 of 24
Page 3
AD7441/AD7451
www.BDTIC.com/ADI
SPECIFICATIONS
VDD = 2.7 V to 5.25 V; f
versions: −40°C to +85°C.
Table 1. AD7451
Parameter Test Conditions/Comments A Version B Version Unit
DYNAMIC PERFORMANCE fIN = 100 kHz
Signal-to-Noise Ratio (SNR)1 VDD = 2.7 V to 5.25 V 70 70 dB min
Signal-to-(Noise + Distortion) (SINAD)1 VDD = 2.7 V to 3.6 V 69 69 dB min
V
Total Harmonic Distortion (THD)
V
Peak Harmonic or Spurious Noise
V
Intermodulation Distortion (IMD)1 fa = 90 kHz; fb = 110 kHz
Second-Order Terms −80 −80 dB typ
Third-Order Terms −80 −80 dB typ
Aperture Delay
Aperture Jitter
1
1
Full-Power Bandwidth
@ −0.1 dB 2.5 2.5 MHz typ
DC ACCURACY
Resolution 12 12 Bits
Integral Nonlinearity (INL)
Differential Nonlinearity (DNL)
Offset Error
Gain Error
1
1
ANALOG INPUT
Full-Scale Input Span V
Absolute Input Voltage
V
V
IN+
3
V
VDD = 2.7 V to 3.6 V −0.1 to +0.4 −0.1 to +0.4 V
IN–
V
DC Leakage Current ±1 ±1 μA max
Input Capacitance When in track-and-hold 30/10 30/10 pF typ
REFERENCE INPUT
V
Input Voltage
REF
DC Leakage Current ±1 ±1 μA max
V
Input Capacitance When in track-and-hold 10/30 10/30 pF typ
REF
LOGIC INPUTS
Input High Voltage, V
Input Low Voltage, V
Input Current, IIN Typically 10 nA, VIN = 0 V or VDD ±1 ±1 μA max
Input Capacitance, C
LOGIC OUTPUTS
Output High Voltage, VOH VDD = 4.75 V to 5.25 V; I
V
Output Low Voltage, VOL I
Floating-State Leakage Current ±1 ±1 μA max
Floating-State Output Capacitance
Output Coding
= 18 MHz; fS = 1 MSPS; V
SCLK
1
1
= 4.75 V to 5.25 V 70 70 dB min
DD
VDD = 2.7 V to 3.6 V; −78 dB typ −73 −73 dB max
= 4.75 V to 5.25 V; −80 dB typ −75 −75 dB max
DD
VDD = 2.7 V to 3.6 V; −80 dB typ −73 −73 dB max
= 4.75 V to 5.25 V; −82 dB typ −75 −75 dB max
DD
= 2.5 V; TA = T
REF
MIN
to T
, unless otherwise noted. Temperature ranges for A, B
MAX
5 5 ns typ
50 50 ps typ
1, 2
@ −3 dB 20 20 MHz typ
1
1
±1.5 ±1 LSB max
Guaranteed no missed codes to 12 bits ±0.95 ±0.95 LSB max
±3.5 ±3.5 LSB max
±3 ±3 LSB max
− V
V
IN+
IN–
= 4.75 V to 5.25 V −0.1 to +1.5 −0.1 to +1.5 V
DD
4
2.4 2.4 V min
INH
0.8 0.8 V max
INL
5
IN
±1% tolerance for specified performance 2.5 2.5 V
10 10 pF max
= 200 μA 2.8 2.8 V min
SOURCE
= 2.7 V to 3.6 V; I
DD
= 200 μA 0.4 0.4 V max
SINK
5
10 10 pF max
= 200 μA 2.4 2.4 V min
SOURCE
V
REF
V
REF
Straight
tural) binary
(na
V
REF
V
REF
Straight
(natural) binary
Rev. C | Page 3 of 24
Page 4
AD7441/AD7451
www.BDTIC.com/ADI
Test Conditions/Comments A Version B Version Unit Parameter
CONVERSION RATE
Conversion Time 888 ns with an 18 MHz SCLK 16 16 SCLK cycles
Track-and-Hold Acquisition Time1 Sine wave input 250 250 ns max
Full-scale step input 290 290 ns max
Throughput Rate 1 1 MSPS max
POWER REQUIREMENTS
VDD 2.7/5.25 2.7/5.25 V min/max
6, 7
I
DD
Normal Mode (Static) SCLK on or off 0.5 0.5 mA typ
Normal Mode (Operational) VDD = 4.75 V to 5.25 V 1.95 1.95 mA max
V
Full Power-Down Mode SCLK on or off 1 1 μA max
Power Dissipation
Normal Mode (Operational) VDD = 5 V; 1.55 mW typical for 100 ksps69.25 9.25 mW max
V
Full Power-Down VDD = 5 V; SCLK on or off 5 5 μW max
V
1
See Terminology section.
2
Analog inputs with slew rates exceeding 27 V/μs (full-scale input sine wave > 3.5 MHz) within the acquisition time can cause the converter to return an incorrect result.
3
A small dc input is applied to V
4
The AD7451 is functional with a reference input in the range of 100 mV to VDD.
5
Guaranteed by characterization.
6
See the Power vs. Throughput Rate section.
7
Measured with a full-scale dc input.
to provide a pseudo ground for V
IN–
= 2.7 V to 3.6 V 1.45 1.45 mA max
DD
= 3 V; 0.6 mW typical for 100 ksps
DD
= 3 V; SCLK on or off 3 3 μW max
DD
.
IN+
6
4 4 mW max
Rev. C | Page 4 of 24
Page 5
AD7441/AD7451
www.BDTIC.com/ADI
VDD = 2.7 V to 5.25 V; f
B version: −40°C to +85°C.
Table 2. AD7441
Parameter Test Conditions/Comments B Version Unit
DYNAMIC PERFORMANCE fIN = 100 kHz
Signal-to-(Noise + Distortion) (SINAD)1 61 dB min
Total Harmonic Distortion (THD)
4.75 V to 5.25 V; −79 dB typical −73 dB max
Peak Harmonic or Spurious Noise
4.75 V to 5.25 V; −82 dB typical −74 dB max
Intermodulation Distortion (IMD)1 fa = 90 kHz, fb = 110 kHz
Second-Order Terms −80 dB typ
Third-Order Terms −80 dB typ
Aperture Delay
1
Aperture Jitter1 50 ps typ
Full-Power Bandwidth1, 2 @ −3 dB 20 MHz typ
@ −0.1 dB 2.5 MHz typ
DC ACCURACY
Resolution 10 Bits
Integral Nonlinearity (INL)1 ±0.5 LSB max
Differential Nonlinearity (DNL)
Offset Error
Gain Error
1
1
ANALOG INPUT
Full-Scale Input Span V
Absolute Input Voltage
V
V
IN+
3
V
VDD = 2.7 V to 3.6 V −0.1 to +0.4 V
IN–
V
DC Leakage Current ±1 μA max
Input Capacitance When in track-and-hold 30/10 pF typ
REFERENCE INPUT
V
Input Voltage
REF
DC Leakage Current ±1 μA max
V
Input Capacitance When in track-and-hold 10/30 pF typ
REF
LOGIC INPUTS
Input High Voltage, V
Input Low Voltage, V
Input Current, IIN Typically 10 nA, VIN = 0 V or VDD ±1 μA max
Input Capacitance, C
LOGIC OUTPUTS
Output High Voltage, VOH VDD = 4.75 V to 5.25 V; I
V
Output Low Voltage, VOL I
Floating-State Leakage Current ±1 μA max
Floating-State Output Capacitance
Output Coding Straight (natural) binary
= 18 MHz; fS = 1 MSPS; V
SCLK
1
1
2.7 V to 3.6 V; −77 dB typical −72 dB max
2.7 V to 3.6 V; −80 dB typical −72 dB max
= 2.5 V; TA = T
REF
MIN
to T
, unless otherwise noted. Temperature range for
MAX
5 ns typ
1
Guaranteed no missed codes to 10 bits ±0.5 LSB max
±1 LSB max
±1 LSB max
− V
V
IN+
IN–
= 4.75 V to 5.25 V −0.1 to +1.5 V
DD
4
2.4 V min
INH
0.8 V max
INL
5
10 pF max
IN
±1% tolerance for specified performance 2.5 V
= 200 μA 2.8 V min
SOURCE
= 2.7 V to 3.6 V; I
DD
= 200 μA 0.4 V max
SINK
5
10 pF max
= 200 μA 2.4 V min
SOURCE
V
REF
V
REF
Rev. C | Page 5 of 24
Page 6
AD7441/AD7451
www.BDTIC.com/ADI
Test Conditions/Comments B Version Unit Parameter
CONVERSION RATE
Conversion Time 888 ns with an 18 MHz SCLK 16 SCLK cycles
Track-and-Hold Acquisition Time
Step input 290 ns max
Throughput Rate 1 MSPS max
POWER REQUIREMENTS
VDD 2.7/5.25 V min/max
6, 7
I
DD
Normal Mode (Static) SCLK on or off 0.5 mA typ
Normal Mode (Operational) VDD = 4.75 V to 5.25 V 1.95 mA max
V
Full Power-Down Mode SCLK on or off 1 μA max
Power Dissipation
Normal Mode (Operational) VDD = 5 V; 1.55 mW typ for 100 ksps
V
Full Power-Down VDD = 5 V; SCLK on or off 5 μW max
V
1
See the Terminology section.
2
Analog inputs with slew rates exceeding 27 V/μs (full-scale input sine wave > 3.5 MHz) within the acquisition time can cause the converter to return an incorrect result.
3
A small dc input is applied to V
4
The AD7441 is functional with a reference input in the range 100 mV to VDD.
5
Guaranteed by characterization.
6
See the Power vs. Throughput Rate section.
7
Measured with a full-scale dc input.
IN–
1
Sine wave input 250 ns max
= 2.7 V to 3.6 V 1.25 mA max
DD
= 3 V; 0.6 mW typ for 100 ksps
DD
= 3 V; SCLK on or off 3 μW max
DD
to provide a pseudo ground for V
6
6
.
IN+
9.25 mW max
4 mW max
Rev. C | Page 6 of 24
Page 7
AD7441/AD7451
www.BDTIC.com/ADI
TIMING SPECIFICATIONS
VDD = 2.7 V to 5.25 V; f
Table 3.
Parameter Limit at T
f
SCLK
CONVER T
t
QUIET
t1
t2
3
t
3
2
10 kHz min
18 MHz max
16 × t
888 ns max
60 ns min
10 ns min
10 ns min
20 ns max
t4 40 ns max Data access time after SCLK falling edge
t5 0.4 t
t6 0.4 t
t7 10 ns min SCLK edge to data valid hold time
4
t
8
t
POWER-UP
1
Guaranteed by characterization. All input signals are specified with t
and the Serial Interface section.
2
Mark/space ratio for the SCLK input is 40/60 to 60/40.
3
Measured with the load circuit of Figure 4 and defined as the time required for the output to cross 0.8 V or 2.4 V with VDD = 5 V and the time required for an output to
cross 0.4 V or 2.0 V for VDD = 3 V.
4
t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 4. The measured number is then extrapolated
10 ns min SCLK falling edge to SDATA, three-state enabled
35 ns max SCLK falling edge to SDATA, three-state enabled
5
1 μs max Power-up time from full power-down
back to remove the effects of charging or discharging the 25 pF capacitor. This means that the time (t8) quoted in the timing characteristics is the true bus relinquish
time of the part and is independent of the bus loading.
5
See the Power-Up Time section.
SCLK
MIN
SCLK
ns min SCLK high pulse width
SCLK
ns min SCLK low pulse width
SCLK
1
= 18 MHz; fS = 1 MSPS; V
, T
Unit Description
MAX
t
Minimum quiet time between end of a serial read and next falling edge of CS
Minimum CS
CS
Delay from CS
= 2.5 V; TA = T
REF
= 1/f
SCLK
SCLK
t
MIN
to T
, unless otherwise noted.
MAX
pulse width
falling edge to SCLK falling edge setup time
falling edge until SDATA three-state disabled
= t
= 5 ns (10% to 90% of VDD) and timed from a voltage level of 1.6 V. See Figure 2, Figure 3,
RISE
FALL
TIMING DIAGRAMS
CS
SCLK
SDATA
CS
t
SCLK
t
SDATA
t
t
2
1234513141516
t
3
0000DB11DB10DB2DB1DB0
4 LEADING ZE ROSTHREE-STATE
t
4
CONVERT
t
5
t
7
B
Figure 2. AD7451 Serial Interface Timing Diagram
t
CONVERT
2
1234513141516
3
0000DB9DB8DB000
4 LEADING Z EROS2 TRAILING ZEROS THREE-STAT E
t
4
t
5
t
7
B
Figure 3. AD7441 Serial Interface Timing Diagram
t
1
t
6
t
6
t
8
t
QUIET
03153-002
t
1
t
8
t
QUIET
03153-003
Rev. C | Page 7 of 24
Page 8
AD7441/AD7451
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 4.
Parameter Rating
VDD to GND −0.3 V to +7 V
V
to GND −0.3 V to VDD + 0.3 V
IN+
V
to GND −0.3 V to VDD + 0.3 V
IN–
Digital Input Voltage to GND −0.3 V to +7 V
Digital Output Voltage to GND −0.3 V to VDD + 0.3 V
V
to GND −0.3 V to VDD + 0.3 V
REF
Input Current to any Pin Except Supplies1±10 mA
Operating Temperature Range
Commercial (A, B Version)
Storage Temperature Range −65°C to +150°C
Junction Temperature 150°C
θJA Thermal Impedance 205.9°C/W (MSOP)
θJC Thermal Impedance 43.74°C/W (MSOP)
Lead Temperature, Soldering
Vapor Phase (60 sec) 215°C
Infrared (15 sec) 220°C
ESD 1 kV
1
Transient currents of up to 100 mA do not cause SCR latch-up.
−40°C to +85°C
211.5°C/W (SOT-23)
91.99°C/W (SOT-23)
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
1.6mAI
TO OUTPUT
PIN
C
L
25pF
200µAI
Figure 4. Load Circuit for Digital Out
OL
1.6V
OH
put Timing Specifications
03153-004
ESD CAUTION
Rev. C | Page 8 of 24
Page 9
AD7441/AD7451
V
www.BDTIC.com/ADI
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
1
REF
AD7441/
2
V
IN+
AD7451
3
V
IN–
TOP VIEW
(Not to Scale)
GND
4
Figure 5. 8-Lead MSOP Pin Configuration
Table 5. Pin Function Descriptions
Pin. No.
MSOP SOT-23
1 8 V
2 7 V
3 6 V
Mnemonic Description
REF
Noninverting Analog Input.
IN+
IN–
4 5 GND
5 4
CS
6 3 SDATA
7 2 SCLK
8 1 V
DD
8
7
6
5
V
DD
SCLK
SDATA
CS
3153-006
V
SCLK 2
SDATA
DD
CS 4
1
AD7441/
AD7451
3
TOP VIEW
(Not to Scale)
V
8
REF
V
7
IN+
6
V
IN–
GND
5
3153-005
Figure 6. 8-Lead SOT-23 Pin Configuration
Reference Input for the AD7441/AD7451. An external reference in the range of 100 mV to V
must be
DD
applied to this input. The specified reference input is 2.5 V. This pin is decoupled to GND with a capacitor
of at least 0.1 μF.
Inverting Input. This pin sets the ground reference point for the V
input. Connect to ground or to a dc
IN+
offset to provide a pseudo ground.
Analog Ground. Ground reference point for all circuitr
y on the AD7441/AD7451. All analog input signals
and any external reference signal are referred to this GND voltage.
Chip Select. Active low logic input. This input provides the dual function of initiating a conversion on
the AD7441/AD7451 and framing the serial data transfer.
Serial Data, Logic Output. The conversion result from the AD7441/AD7451 is provided on this output as
ial data stream. The bits are clocked out on the falling edge of the SCLK input. The data stream of
a ser
the AD7451 consists of four leading zeros followed by the 12 bits of conversion data that are provided
MSB first; the data stream of the AD7441 consists of four leading zeros, followed by the 10 bits of conversion data, followed by two trailing zeros. In both cases, the output coding is straight (natural) binary.
Serial Clock, Logic Input. SCLK provides the serial clock f
or accessing data from the part. This clock input
is also used as the clock source for the conversion process.
Power Supply Input. VDD is 2.7 V to 5.25 V. This supply is decoupled to GND with a 0.1 μF capacitor and a
10 μF tantalum capacitor.
Rev. C | Page 9 of 24
Page 10
AD7441/AD7451
www.BDTIC.com/ADI
TYPICAL PERFORMANCE CHARACTERISTICS
TA = 25°C, fS = 1 MSPS, f
= 18 MHz, VDD = 2.7 V to 5.25 V, V
SCLK
= 2.5 V, unless otherwise noted.
REF
75
VDD = 5.25V
V
70
65
SINAD (dB)
60
55
101001000
= 4.75V
DD
V
DD
FREQUENCY (kHz)
V
= 3.6V
DD
= 2.7V
Figure 7. SINAD vs. Analog Input Frequency for the AD7451 for
Va
rious Supply Voltages
0
100mV p-p SINE WAVE ON V
NO DECOUPLI NG ON V
–20
–40
–60
PSRR (dB)
–80
–100
–120
0100 200 300 400 500 600 700 800 900 1000
SUPPLY RIPPLE FREQUENCY (kHz)
DD
VDD = 3V
DD
V
DD
Figure 8. PSRR vs. Supply Ripple Frequency
= 5V
Without Supply Decoupling
1.0
0.8
0.6
0.4
0.2
0
–0.2
DNL ERROR (LSB)
–0.4
–0.6
–0.8
–1.0
03153-007
0102420483072
CODE
Figure 10. Typical DNL for the AD7451 for V
1.0
0.8
0.6
0.4
0.2
0
–0.2
INL ERROR (LSB)
–0.4
–0.6
–0.8
–1.0
0102420483072
03153-008
Figure 11. Typical INL for the AD7451 for V
CODE
DD
= 5 V
DD
= 5 V
4096
4096
03153-010
03153-011
0
–20
–40
–60
–80
SNR (dB)
–100
–120
–140
0100200
FREQUENCY (kHz)
Figure 9. AD7451 Dynamic Performance for V
8192 POINT FFT
f
SAMPLE
f
= 100kSPS
IN
SINAD = 71dB
THD = –82dB
SFDR = –83dB
300400
= 1MSPS
= 5 V
DD
500
03153-009
10000
9000
8000
7000
6000
5000
COUNTS
4000
3000
2000
1000
0
204620472048204920502051
27 CODES24 CODES
Figure 12. Histogram of 10,000 Conversions of a DC Input for the AD7451
Rev. C | Page 10 of 24
9949
CODES
CODES
03153-012
Page 11
AD7441/AD7451
www.BDTIC.com/ADI
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
CHANGE IN DNL (LSB)
0
–0.5
–1.0
01234
V
REF
Figure 13. Change in DNL vs. V
(V)
POSITIVE DNL
NEGATIVE DNL
for V
REF
DD
= 5 V
5
03153-013
0
–20
–40
–60
–80
SNR (dB)
–100
–120
–140
0100200300400500
V
(V)
REF
8192 POINT FFT
f
SAMPLE
f
= 100kSPS
IN
SINAD = 61.7dB
THD = –81.7dB
SFDR = –82dB
Figure 16. AD7441 Dynamic Performance
= 1MSPS
03153-016
5
4
3
2
1
CHANGE IN INL ( LSB)
0
–1
–2
01234
V
REF
Figure 14. Change in INL vs. V
12
11
10
9
8
EFFECTI VE NUMBER OF BI TS
7
6
012345
VDD = 3V
= 5V
V
DD
Figure 15. ENOB vs. V
V
REF
for V
REF
(V)
(V)
DD
POSITIVE DNL
NEGATIVE DNL
for V
= 5 V
REF
DD
= 5 V and 3 V
5
0.5
0.4
0.3
0.2
0.1
0
–0.1
DNL ERROR (LSB)
–0.2
–0.3
–0.4
–0.5
02565 127681024
03153-014
Figure 17. Typical DNL for the AD7441
0.5
0.4
0.3
0.2
0.1
0
–0.1
INL ERROR (L SB)
–0.2
–0.3
–0.4
–0.5
02565 127681024
03153-015
Figure 18. Typical INL for the AD7441
CODE
CODE
3153-017
3153-018
Rev. C | Page 11 of 24
Page 12
AD7441/AD7451
www.BDTIC.com/ADI
TERMINOLOGY
Signal-to-(Noise + Distortion) Ratio (SINAD)
This is the measured ratio of SINAD at the output of the ADC.
nal is the rms amplitude of the fundamental. Noise is
The sig
the sum of all nonfundamental signals up to half the sampling
frequency (f
number of quantization levels in the digitization process: the more
levels, the smaller the quantization noise. The theoretical SINAD
ratio for an ideal N-bit converter with a sine wave input is given by
Signal-to-(Noise + Distortion) = (6.02
Therefore, for 12-bit converters, the SINAD is 74 dB; for 10-bit
co
nverters, the SINAD is 62 dB.
Total Harmonic Distortion (THD)
THD is the ratio of the rms sum of harmonics to the
f
undamental. In the AD7441/AD7451, THD is
where:
V
is the rms amplitude of the fundamental.
1
, V3, V4, V5, and V6 are the rms amplitudes of the second to
V
2
the sixth harmonics.
Peak Harmonic or Spurious Noise
Peak harmonic (spurious noise) is defined as the ratio of the
ms value of the next largest component in the ADC output
r
spectrum (up to f
fundamental. Normally, the value of this specification is
determined by the largest harmonic in the spectrum, but for
ADCs where the harmonics are buried in the noise floor, it is
a noise peak.
Intermodulation Distortion
With inputs consisting of sine waves at two frequencies, fa and
b, an active device with nonlinearities creates distortion products
f
at sum and difference frequencies of mfa ± nfb where m, n = 0,
1, 2, 3, and so on. Intermodulation distortion terms are those in
which neither m nor n are equal to zero. For example, the secondorder terms include (fa + fb) and (fa − fb), while the third-order
terms include (2fa + fb), (2fa − fb), (fa + 2fb), and (fa − 2fb).
The AD7441/AD7451 are tested using the CCIF standard where
o input frequencies near the top end of the input bandwidth
tw
are used. In this case, the second-order terms are usually distanced in frequency from the original sine waves while the
third-order terms are usually at a frequency close to the input
frequencies. As a result, the second- and third-order terms
are specified separately. The calculation of the intermodulation
distortion is as per the THD specification where it is the ratio of
the rms sum of the individual distortion products to the rms
amplitude of the sum of the fundamentals expressed in decibels.
/2), excluding dc. The ratio is dependent on the
S
N + 1.76) dB
THD
()
log20dB
=
/2, excluding dc) to the rms value of the
S
V
1
22222
++++
VVVVV
65432
Aperture Delay
This is the amount of time from the leading edge of the
ampling clock until the ADC actually takes the sample.
s
Aperture Jitter
This is the sample-to-sample variation in the effective point in
ime at which the actual sample is taken.
t
Full Power Bandwidth
The full power bandwidth of an ADC is that input frequency
a
t which the amplitude of the reconstructed fundamental is
reduced by 0.1 dB or 3 dB for a full-scale input.
Integral Nonlinearity (INL)
This is the maximum deviation from a straight line passing
rough the endpoints of the ADC transfer function.
th
Differential Nonlinearity (DNL)
This is the difference between the measured and the ideal 1 LSB
ch
ange between any two adjacent codes in the ADC.
Offset Error
This is the deviation of the first code transition (000…000 to
000…001) f
Gain Error
This is the deviation of the last code transition (111…110 to
111…111) f
error has been adjusted out.
Track-and-Hold Acquisition Time
The track-and-hold acquisition time is the minimum time
equired for the track-and-hold amplifier to remain in track
r
mode for its output to reach and settle to within 0.5 LSB of the
applied input signal.
Power Supply Rejection Ratio (PSRR)
The power supply rejection ratio is defined as the ratio of the
wer in the ADC output at full-scale frequency (f) to the
po
power of a 100 mV p-p sine wave applied to the ADC V
supply of Frequency f
1 kHz to 1 MHz.
where:
Pf is th
Pfs is the power at Frequency fs in the ADC output.
rom the ideal (that is, AGND + 1 LSB).
rom the ideal (that is, V
. The frequency of this input varies from
S
PSRR (dB) = 10log(Pf/Pfs)
e power at Frequency f in the ADC output.
− 1 LSB) after the offset
REF
DD
Rev. C | Page 12 of 24
Page 13
AD7441/AD7451
V
V
/
www.BDTIC.com/ADI
THEORY OF OPERATION
CIRCUIT INFORMATION
The AD7441/AD7451 are 10-/12-bit, high speed, low power,
single-supply, successive approximation, analog-to-digital converters (ADCs) with a pseudo differential analog input. These
parts operate with a single 2.7 V to 5.25 V power supply and are
capable of throughput rates up to 1 MSPS when supplied with
an 18 MHz SCLK. The AD7441/AD7451 require an external
reference to be applied to the V
REF
pin.
The AD7441/AD7451 have a SAR ADC, an on-chip differential
rack-and-hold amplifier, and a serial interface housed in either
t
an 8-lead SOT-23 or an MSOP package. The serial clock input
accesses data from the part and provides the clock source for
the SAR ADC. The AD7441/AD7451 feature a power-down
option for reduced power consumption between conversions.
The power-down feature is implemented across the standard
serial interface, as described in the
Modes of Operation section.
CONVERTER OPERATION
The AD7441/AD7451 are SAR ADCs based around two
capacitive DACs. Figure 19 and Figure 20 show simplified
chematics of the ADC in the acquisition and conversion phase,
s
respectively. The ADC is comprised of control logic, an SAR,
and two capacitive DACs. In
is clos
ed, SW1 and SW2 are in Position A, the comparator is
held in a balanced condition, and the sampling capacitor arrays
acquire the differential signal on the input.
IN+
IN–
B
A
A
B
V
C
S
SW1
SW2
C
S
V
REF
Figure 19. ADC Acquisition Phase
Figure 19 (acquisition phase), SW3
CAPACITIVE
DAC
SW3
COMPARATOR
CONTROL
LOGIC
CAPACITIVE
DAC
03153-019
When the ADC starts a conversion (see Figure 20), SW3 opens
and SW1 and SW2 move to Position B, causing the comparator
to become unbalanced. Both inputs are disconnected once the
conversion begins. The control logic and the charge redistribution DACs are used to add and subtract fixed amounts of charge
from the sampling capacitor arrays to bring the comparator
back into a balanced condition. When the comparator is rebalanced, the conversion is complete. The control logic generates
the ADC output code. The output impedances of the sources
driving the V
IN+
and V
pins must be matched; otherwise the
IN–
two inputs have different settling times, resulting in errors.
CAPACITIVE
DAC
IN+
IN–
B
A
A
B
V
V
C
S
SW1
SW2
C
S
V
REF
SW3
COMPARATOR
CONTRO L
LOGIC
CAPACITIVE
DAC
Figure 20. ADC Conversion Phase
ADC TRANSFER FUNCTION
The output coding for the AD7441/AD7451 is straight (natural)
binary. The designed code transitions occur at successive LSB
values (1 LSB, 2 LSB, and so on). The LSB size of the AD7451
is V
/4096, and the LSB size of the AD7441 is V
REF
ideal transfer characteristic of the AD7441/AD7451 is shown in
Figure 21.
1LSB =
111...111
111...110
111...000
011...111
ADC CODE
000...010
000...001
000...000
1LSB = V
0V
Figure 21. AD7441/AD7451 Ideal Transfer Characteristic
4096 (AD7451)
REF
/1024 (AD7441)
REF
ANALOG INPUT
– 1LSB1LSB
V
REF
/1024. The
REF
03153-021
03153-020
Rev. C | Page 13 of 24
Page 14
AD7441/AD7451
V
V
V
www.BDTIC.com/ADI
TYPICAL CONNECTION DIAGRAM
Figure 22 shows a typical connection diagram for the device.
In this setup, the GND pin is connected to the analog ground
plane of the system. The V
pin is connected to the AD780,
REF
a 2.5 V decoupled reference source. The signal source is connected
to the V
connected to the V
V
IN+
analog input via a unity gain buffer. A dc voltage is
IN+
pin to provide a pseudo ground for the
IN–
input. The VDD pin is decoupled to AGND with a 10 μF
tantalum capacitor in parallel with a 0.1 μF ceramic capacitor.
The reference pin is decoupled to AGND with a capacitor of at
least 0.1 μF. The conversion result is output in a 16-bit word
with four leading zeros followed by the MSB of the 12-bit or
10-bit result. The 10-bit result of the AD7441 is followed by two
trailing zeros.
2.7V TO 5.25
SCLK
CS
GND
SUPPLY
SERIAL
INTERFACE
µC/µP
0.1µF
V
0.1µF
DD
V
IN+
V
IN–
V
REF
V
REF
p-p
DC INPUT
VOLTAGE
AD7441/
AD7451
2.5V
AD780
10µF
SDATA
Figure 22. Typical Connection Diagram
ANALOG INPUT
The AD7441/AD7451 have a pseudo differential analog input.
The V
amplitude of V
the part. A dc input is applied to the V
this input provides an offset from ground or a pseudo ground
for the V
input signal ground from the ADC ground, allowing dc commonmode voltages to be cancelled.
Because the ADC operates from a single supply, it is necessary
to
input requirements. An op amp (for example, the AD8021) can
b
signal so that it is compatible with the input range of the AD7441/
AD7451 (see
When a conversion takes place, the pseudo ground corresponds
t
o 0, and the maximum analog input corresponds to 4096 for
the AD7451 and 1024 for the AD7441.
input is coupled to the signal source and must have an
IN+
p-p to make use of the full dynamic range of
REF
. The voltage applied to
IN–
input. Pseudo differential inputs separate the analog
IN+
level shift ground-based bipolar signals to comply with the
e configured to rescale and level shift a ground-based (bipolar)
Figure 23).
2.5
1.25V
0V
V
IN+
AD7441/
AD7451
V
IN–
V
REF
3153-023
+1.25V
–1.25V
R
R
0V
V
IN+
3R
R
0.1µF
EXTERNAL
V
(2.5V)
REF
Figure 23. Op Amp Configuration to Level Shift a Bipolar Input Signal
ANALOG INPUT STRUCTURE
Figure 24 shows the equivalent circuit of the analog input
structure of the AD7441/AD7451. The four diodes provide
ESD protection for the analog inputs. Care must be taken to
ensure that the analog input signals never exceed the supply
rails by more than 300 mV. This causes these diodes to become
forward-biased and start conducting into the substrate. These
diodes can conduct up to 10 mA without causing irreversible
damage to the part. The C1 capacitors (see
ty
pically 4 pF and can be attributed primarily to pin capacitance. The resistors are lumped components made up of
the on resistance of the switches. The value of these resistors
is typically about 100 Ω. The C2 capacitors are the ADC
sampling capacitors and have a capacitance of 16 pF typically.
03153-022
For ac applications, removing high frequency components from
th
e analog input signal through the use of an RC low-pass filter
on the relevant analog input pins is recommended. In applications where harmonic distortion and the signal-to-noise ratio
are critical, it is recommended that the analog input be driven
from a low impedance source. Large source impedances
significantly affect the ac performance of the ADC, which can
necessitate the use of an input buffer amplifier. The choice of
the amplifier is a function of the particular application.
DD
D
V
IN+
D
C1
V
DD
V
IN–
D
D
C1
Figure 24) are
C2
R1
C2
R1
Figure 24. Equivalent Analog Input Circuit;
Conv
ersion Phase—Switches Open;
Track Phase—Switches Closed
Rev. C | Page 14 of 24
03153-024
Page 15
AD7441/AD7451
–
V
www.BDTIC.com/ADI
When no amplifier is used to drive the analog input, it is
recommended that the source impedance be limited to low
values. The maximum source impedance depends on the
amount of total harmonic distortion that can be tolerated.
The THD increases as the source impedance increases and
performance degrades.
Figure 25 shows a graph of THD vs. analog input signal
equency for different source impedances.
fr
0
T
= 25°C
A
V
= 5V
DD
–10
–20
–30
–40
–50
THD (dB)
–60
–70
–80
–90
–100
10k100k1M
INPUT FREQ UENCY (Hz)
100Ω
62Ω
200Ω
10Ω
03153-025
Figure 25. THD vs. Analog Input Frequency for Various Source Impedances
Figure 26 shows a graph of THD vs. analog input frequency for
various supply voltages while sampling at 1 MSPS with an SCLK
of 18 MHz. In this case, the source impedance is 10 Ω.
50
TA = 25°C
–55
–60
DIGITAL INPUTS
The digital inputs applied to the AD7441/AD7451 are not limited
by the maximum ratings that limit the analog inputs. Instead,
the digital inputs applied, that is,
and are not restricted by the V
CS
and SCLK, can go to 7 V
+ 0.3 V limits as on the analog
DD
input. The main advantage of the inputs not being restricted to
the V
+ 0.3 V limit is that power supply sequencing issues are
DD
CS
avoided. If
or SCLK are applied before VDD, there is no risk
of latch-up as there would be on the analog inputs if a signal
greater than 0.3 V were applied prior to V
DD
.
REFERENCE
An external source is required to supply the reference to the
AD7441/AD7451. This reference input can range from 100 mV
to V
. The specified reference is 2.5 V for the power supply
DD
range 2.7 V to 5.25 V. The reference input chosen for an application must never be greater than the power supply. Errors in
the reference source result in gain errors in the AD7441/AD7451
transfer function and add to the specified full-scale errors of the
part. A capacitor of at least 0.1 μF must be placed on the V
pin. Suitable reference sources for the AD7441/AD7451 include
the
AD780 and the ADR421. Figure 27 shows a typical connec-
n diagram for the V
tio
DD
0.1µF
10nF0. 1µF
pin.
REF
1
NC
2
V
3
TEMP
4
GND
NC = NO CONNECT
AD780
IN
OPSEL
V
OUT
TRIM
AD7441/
AD7451*
8
NC
7
NC
2.5V
6
5
NC
0.1µF
REF
V
DD
V
REF
–65
= 2.7V
V
–70
THD (dB)
–75
–80
–85
–90
101001000
DD
= 3.6V
V
DD
= 4.75V
V
DD
INPUT FREQUENCY (kHz)
V
= 5.25V
DD
Figure 26. THD vs. Analog Input Frequency for Various Supply Voltages
*ADDITIONAL PINS OM ITTED F OR CLARIT Y.
03153-026
Rev. C | Page 15 of 24
Figure 27. Typical V
Connection Diagram for VDD = 5 V
REF
3153-027
Page 16
AD7441/AD7451
www.BDTIC.com/ADI
SERIAL INTERFACE
Figure 2 and Figure 3 show detailed timing diagrams for the
serial interface of the AD7451 and the AD7441, respectively.
The serial clock provides the conversion clock and also controls
the transfer of data from the device during conversion.
CS
initiates the conversion process and frames the data transfer.
The falling edge of
and takes the bus out of three-state. The analog input is sampled
and the conversion initiated at this point. The conversion requires
16 SCLK cycles to complete.
Once 13 SCLK falling edges have occurred, the track-and-hold
goes back into track mode on the next SCLK rising edge, as
shown at Point B in Figure 2 and Figure 3. On the 16th SCLK
falling edge, the SDATA line goes back into three-state.
If the rising edge of
the conversion is terminated and the SDATA line goes back into
three-state.
The conversion result from the AD7441/AD7451 is provided on
the SDATA output as a serial data stream. The bits are clocked
out on the falling edge of the SCLK input. The data stream of
the AD7451 consists of four leading zeros followed by 12 bits
of conversion data, provided MSB first. The data stream of the
AD7441 consists of four leading zeros, followed by the 10 bits
of conversion data, followed by two trailing zeros, which is also
provided MSB first. In both cases, the output coding is straight
(natural) binary.
CS
puts the track-and-hold into hold mode
CS
occurs before 16 SCLKs have elapsed,
Sixteen serial clock cycles are required to perform a conversion
and to access data from the AD7441/AD7451.
provides the first leading zero to be read in by the DSP or the
microcontroller. The remaining data is then clocked out on the
subsequent SCLK falling edges, beginning with the second leading
zero. Thus, the first falling clock edge on the serial clock provides the second leading zero. The final bit in the data transfer
is valid on the 16th falling edge, having been clocked out on the
previous (15th) falling edge. Once the conversion is complete
and the data has been accessed after the 16 clock cycles, it is
important to ensure that, before the next conversion is initiated,
enough time is left to meet the acquisition and quiet-time specifications (see the Timing Example 1 and Timing Example 2
sections). To achieve 1 MSPS with an 18 MHz clock, an 18-clock
burst performs the conversion and leaves enough time before the
next conversion for the acquisition and quiet time.
In applications with slower SCLKs, it is possible to read in data
on each SCLK rising edge; that is, the first rising edge of SCLK
after the
15th SCLK edge has DB0 provided.
CS
falling edge has the leading zero provided, and the
CS
going low
Rev. C | Page 16 of 24
Page 17
AD7441/AD7451
www.BDTIC.com/ADI
Timing Example 1
Having f
= 18 MHz and a throughput rate of 1 MSPS gives a
SCLK
cycle time of
1/Thro
ughput = 1/1,000,000 = 1 μs
Timing Example 2
Having f
= 5 MHz and a throughput rate of 315 kSPS gives a
SCLK
cycle time of
1/Thro
ughput = 1/315,000 = 3.174 μs
A cycle consists of
t
+ 12.5 (1/f
2
Therefore, if t
10 ns + 12.5 (1/18 MHz) + t
t
ACQUISITION
) + t
SCLK
ACQUISITION
= 10 ns, then
2
= 296 ns
= 1 μs
ACQUISITION
= 1 μs
This 296 ns satisfies the requirement of 290 ns for t
From Figure 28, t
2.5 (1/f
where t
) + t8 = t
SCLK
= 35 ns. This allows a value of 122 ns for t
8
ACQUISITION
comprises
QUIET
satisfying the minimum requirement of 60 ns.
CS
10ns
t
2
SCLK
1234513141516
A cycle consists of
t
+ 12.5 (1/f
2
Therefore, if t
10 ns + 12.5 (1/5 MHz) + t
t
ACQUISITION
ACQUISITION
.
This 664 ns satisfies the requirement of 290 ns for t
From Figure 28, t
2.5 (1/f
QUIET
,
where t
= 35 ns. This allows a value of 129 ns for t
8
satisfying the minimum requirement of 60 ns.
As in this example and with other slower clock values, the signal
n already be acquired before the conversion is complete, but it
ca
is still necessary to leave 60 ns minimum t
sions. In Example 2, the signal is fully acquired at approximately
Point C in
t
CONVERT
t
5
12.5(1/
f
)
SCLK
Figure 28. Serial Interface Timing Example
1/THROUGHPUT
BC
SCLK
is 10 ns, then
2
= 664 ns
ACQUISITION
) + t8 = t
SCLK
Figure 28.
t
6
) + t
ACQUISITION
QUIET
t
8
t
ACQUISITION
= 3.174 μs
ACQUISITION
comprises
t
QUIET
= 3.174 μs
between conver-
QUIET
03153-028
ACQUISITION
,
QUIET
.
Rev. C | Page 17 of 24
Page 18
AD7441/AD7451
S
www.BDTIC.com/ADI
MODES OF OPERATION
The operating mode of the AD7441/AD7451 is selected by
CS
controlling the logic state of the
signal during a conversion.
There are two operating modes: normal mode and power-down
mode. The point at which
CS
is pulled high after the conversion
is initiated determines whether the part enters power-down mode.
Similarly, if already in power-down,
CS
controls whether the
device returns to normal operation or remains in power-down.
These modes provide flexible power management options that
can optimize the power dissipation/throughput rate ratio for
differing application requirements.
NORMAL MODE
This mode is intended for fastest throughput rate performance.
The user does not have to worry about any power-up times with
the AD7441/AD7451 remaining fully powered up all the time.
Figure 29 shows the general diagram of the operation of the
AD7441/AD74
on the falling edge of
ensure that the part remains fully powered up,
low until at least 10 SCLK falling edges elapse after the falling
edge of
CS
is brought high any time after the 10th SCLK falling edge,
If
but before the 16th SCLK falling edge, the part remains powered up, however the conversion is terminated and SDATA goes
back into three-state. Sixteen serial clock cycles are required to
complete the conversion and access the complete conversion
CS
result.
low until sometime prior to the next conversion. Once a data
transfer is complete—that is, when SDATA has returned to
three-state—another conversion can be initiated after the
quiet time, t
SCLK
DATA
51 in this mode. The conversion is initiated
CS
(see the Serial Interface section). To
CS
must remain
CS
.
can idle high until the next conversion or can idle
, elapses again bringing CS low.
QUIET
CS
110
4 LEADING ZE ROS + CONVERS ION RESUL T
Figure 29. Normal Mode Operation
16
3153-029
POWER-DOWN MODE
This mode is intended for use in applications where slower
throughput rates are required; either the ADC is powered
down between each conversion or a series of conversions can
be performed at a high throughput rate and the ADC is then
powered down for a relatively long duration between these
bursts of conversions. When the AD7441/AD7451 are in
power-down mode, all analog circuitry is powered down.
For the AD7441/AD7451 to enter power-down mode, the
CS
to SDATA
CS
high
3153-030
conversion process must be interrupted by bringing
anywhere after the second falling edge of SCLK and before
the 10th falling edge of SCLK, as shown in Figure 30.
CS
Once
has been brought high in this window of SCLKs, the
part enters power-down, the conversion that was initiated by
the falling edge of
CS
is terminated, and SDATA goes back into
three-state. The time from the rising edge of
three-state enabled is never greater than t
Specifications section). If
CS
is brought high before the second
(see the Timing
8
SCLK falling edge, the part remains in normal mode and does
not power down. This avoids accidental power-down due to
glitches on the
CS
line.
To exit power-down mode and power up the AD7441/AD7451
ain, a dummy conversion is performed. On the falling edge
ag
CS
of
, the device begins to power up and continues to do so
CS
as long as
is held low until after the falling edge of the 10th
SCLK. The device is fully powered up after 1 μs has elapsed and,
as shown in
nversion.
co
SCLK
SDATA
Figure 31, valid data results from the next
CS
2
1
Figure 30. Entering Power-Down Mode
10
THREE-ST ATE
Rev. C | Page 18 of 24
Page 19
AD7441/AD7451
www.BDTIC.com/ADI
t
POWER- UP
101611016
THIS PART IS FULLY POWERED
UP WITH V
FULLY ACQUIRED
IN
CS
SCLK
PART BEGINS
TO POW ER UP
A
1
SDATA
INVALID DATAVALID DA TA
Figure 31. Exiting Power-Down Mode
If CS is brought high before the 10th falling edge of SCLK, the
AD7441/AD7451 again go back into power-down. This avoids
CS
accidental power-up due to glitches on the
vertent burst of eight SCLK cycles while
the device may begin to power up on the falling edge of
again powers down on the rising edge of
line or an inad-
CS
is low. So although
CS
as long as it occurs
CS
, it
before the 10th SCLK falling edge.
Power-Up Time
The power-up time of the AD7441/AD7451 is typically 1 μs,
which means that with any frequency of SCLK up to 18 MHz,
one dummy cycle is always sufficient to allow the device to
power up. Once the dummy cycle is complete, the ADC is fully
powered up and the input signal is acquired properly. The quiet
time, t
, must still be allowed—from the point at which the
QUIET
bus goes back into three-state after the dummy conversion to
the next falling edge of
CS
.
When running at the maximum throughput rate of 1 MSPS,
e AD7441/AD7451 power up and acquire a signal within
th
±0.5 LSB in one dummy cycle, that is, 1 μs. When powering up
from the power-down mode with a dummy cycle, as in Figure 31,
t
he track-and-hold, which was in hold mode while the part was
powered down, returns to track mode after the first SCLK edge
the part receives after the falling edge of
CS
. This is shown as
Point A in Figure 31.
Although at any SCLK frequency one dummy cycle is sufficient
power up the device and acquire V
to
, it does not necessarily
IN
mean that a full dummy cycle of 16 SCLKs must always elapse
to power up the device and acquire V
fully; 1 μs is sufficient to
IN
power up the device and acquire the input signal.
03153-031
For example, when a 5 MHz SCLK frequency is applied to the
C, the cycle time is 3.2 μs (that is, 1/(5 MHz) × 16). In one
AD
dummy cycle, 3.2 μs, the part is powered up, and V
is acquired
IN
fully. However, after 1 μs with a five MHz SCLK, only five SCLK
cycles elapse. At this stage, the ADC is fully powered up and the
signal acquired. Therefore, in this case, the
CS
can be brought
high after the 10th SCLK falling edge and brought low again
after a time, t
, to initiate the conversion.
QUIET
When power supplies are first applied to the AD7441/AD7451,
t
he ADC can power up either in power-down mode or normal
mode. For this reason, it is best to allow a dummy cycle to elapse
to ensure that the part is fully powered up before attempting a
valid conversion. Likewise, if the user wants the part to power
up in power-down mode, then the dummy cycle can be used to
ensure the device is in power-down mode by executing a cycle
such as that shown in
e AD7441/AD7451, the power-up time is the same as that
th
Figure 30. Once supplies are applied to
when powering up from power-down mode. It takes approximately 1 μs to power up fully in normal mode. It is not necessary
to wait 1 μs before executing a dummy cycle to ensure the
desired mode of operation. Instead, the dummy cycle can
occur directly after power is supplied to the ADC. If the first
valid conversion is then performed directly after the dummy
conversion, care must be taken to ensure that adequate
acquisition time has been allowed.
As mentioned earlier, when powering up from the power-down
m
ode, the part returns to track mode upon the first SCLK edge
applied after the falling edge of
CS
. However, when the ADC
powers up initially after supplies are applied, the track-andhold is already in track mode. This means (assuming one has
the facility to monitor the ADC supply current) that if the ADC
powers up in the desired mode of operation, a dummy cycle is
not required to change mode. Thus, a dummy cycle is also not
required to place the track-and-hold into track.
Rev. C | Page 19 of 24
Page 20
AD7441/AD7451
www.BDTIC.com/ADI
POWER VS. THROUGHPUT RATE
By using the power-down mode on the device when not converting, the average power consumption of the ADC decreases
at lower throughput rates. Figure 32 shows how, as the throughp
ut rate is reduced, the device remains in its power-down state
longer and the average power consumption reduces accordingly.
For example, if the AD7441/AD7451 are operated in continuous
sampling mode with a throughput rate of 100 kSPS and an SCLK
of 18 MHz, and the device is placed in the power-down mode
between conversions, then the power consumption during
normal operation equals 9.25 mW maximum (for V
If the power-up time is one dummy cycle (1 μs) and the remain-
g conversion time is another cycle (1 μs), then the AD7441/
in
AD7451 can be said to dissipate 9.25 mW for 2 μs during each
conversion cycle. (This power consumption figure assumes a
very short time to enter power-down mode. This power figure
increases as the burst of clocks used to enter power-down mode
is increased). The AD7441/AD7451 consume just 5 μW for the
remaining 8 μs.
= 5 V).
DD
For optimum power performance in throughput rates above
320 kSPS, it is recommended that the serial clock frequency be
reduced.
MICROPROCESSOR AND DSP INTERFACING
The serial interface on the AD7441/AD7451 allows the part to
be connected directly to a range of different microprocessors.
This section explains how to interface the AD7441/AD7451
with some of the more common microcontroller and DSP serial
interface protocols.
AD7441/AD7451 to ADSP-21xx
The ADSP-21xx family of DSPs is interfaced directly to the
AD7441/AD7451 without any glue logic required. The SPORT
control register is set up as follows:
TFSW = RFSW = 1 Alternate framing
INVRFS = INVTFS = 1 Active low frame signal
DTYPE = 00 Right justify data
Calculate the power numbers in Figure 32 as follows:
If the throughput rate = 100 kSPS, then the cycle time = 10 μs,
nd the average power dissipated during each cycle is
a
(2/10) × 9.25 mW = 1.85 mW
For the same scenario, if V
= 3 V, the power dissipation
DD
during normal operation is 4 mW maximum.
The AD7441/AD7451 can now be said to dissipate 4 mW for
2 μs d
uring each conversion cycle.
The average power dissipated during each cycle with a
thr
oughput rate of 100 kSPS is, therefore,
(2/10) × 4 mW = 0.8 mW
100
10
1
POWER (mW)
0.1
0.01
0350
50100150200250300
Figure 32. Power vs. Throughput Rat
VDD = 5V
V
DD
THROUGHPUT ( kSPS)
e for Power-Down Mode
= 3V
03153-032
SLEN = 1111 16-bit data-words
ISCLK = 1 Internal serial clock
TFSR = RFSR = 1 Frame every word
IRFS = 0
ITFS = 1
To implement power-down mode, SLEN is set to 1001 to issue
n 8-bit SCLK burst.
a
The connection diagram is shown in Figure 33. ADSP-21xx has
e TFS and RFS of the SPORT tied together, with TFS set as an
th
output and RFS set as an input. The DSP operates in alternate
framing mode, and the SPORT control register is set up as
described. The frame synchronization signal generated on the
TFS is tied to
CS
, and, as with all signal processing applications,
equidistant sampling is necessary. However, in this example,
the timer interrupt is used to control the sampling rate of the
ADC, and, under certain conditions, equidistant sampling
cannot be achieved.
AD7441/
AD7451*
SCLK
SDATA
CS
*ADDITIONAL PINS REMO VED FOR CLARITY.
Figure 33. Interfacing to the ADSP-21xx
ADSP-21xx*
SCLK
DR
RFS
TFS
3153-033
Rev. C | Page 20 of 24
Page 21
AD7441/AD7451
www.BDTIC.com/ADI
The timer registers, for example, are loaded with a value that
provides an interrupt at the required sample interval. When an
interrupt is received, a value is transmitted with TFS/DT (ADC
control word). The TFS is used to control the RFS and, therefore, the reading of data. The frequency of the serial clock is set
in the SCLKDIV register. When the instruction to transmit with
TFS is given, that is, AX0 = TX0, the state of the SCLK is checked.
The DSP waits until the SCLK has gone high, low, and high
before starting transmission. If the timer and SCLK values are
chosen such that the instruction to transmit occurs on or near
the rising edge of SCLK, then the data can either be transmitted
or wait until the next clock edge.
For example, the ADSP-2111 has a master clock frequency of
16 MH
z. If the SCLKDIV register is loaded with the value of 3,
an SCLK of 2 MHz is obtained and eight master clock periods
elapse for every one SCLK period. If the timer registers are
loaded with the value 803, 100.5 SCLKs occur between interrupts and subsequently between transmit instructions. This
situation results in nonequidistant sampling, because the
transmit instruction occurs on an SCLK edge. If the number
of SCLKs between interrupts is a whole integer figure of N,
equidistant sampling is implemented by the DSP.
AD7441/AD7451 to TMS320C5x/C54x
The serial interface on the TMS320C5x/C54x uses a continuous
serial clock and frame synchronization signals to synchronize
the data transfer operations with peripheral devices such as the
AD7441/AD7451. The
CS
input allows easy interfacing between
the TMS320C5x/C54x and the AD7441/AD7451 without any
glue logic required. The serial port of the TMS320C5x/C54x is
set up to operate in burst mode with internal CLKx (Tx serial
clock) and FSx (Tx frame sync). The serial port control register
(SPC) must have the following setup: FO = 0, FSM = 1, MCM = 1,
and TXM = 1. The format bit, FO, can be set to 1 to set the word
length to eight bits in order to implement the power-down
mode on the AD7441/AD7451. The connection diagram is
shown in
th
Figure 34. Note that for signal processing applications,
e frame synchronization signal from the TMS320C5x/ C54x
must provide equidistant sampling.
AD7441/AD7451 to DSP56xxx
The connection diagram in Figure 35 shows how the AD7441/
AD7451 can be connected to the SSI (synchronous serial interface)
of the DSP56xxx family of DSPs from Motorola. The SSI is
operated in synchronous mode (SYN bit in CRB = 1) with
internally generated 1-bit clock period frame sync for both Tx
and Rx (Bit FSL1 = 1 and Bit FSL0 = 0 in CRB). Set the word
length to 16 by setting Bit WL1 = 1 and Bit WL0 = 0 in CRA. To
implement the power-down mode on the AD7441/AD7451, the
word length can be changed to eight bits by setting B it WL1 = 0
and Bit WL0 = 0 in CRA. Note that for signal processing applications, the frame synchronization signal from the DSP56xxx must
provide equidistant sampling.
AD7441/
AD7451*
SCLK
SDATA
CS
*ADDITIONAL PINS REMOV ED FOR CLARI TY.
Figure 35. Interfacing to the DSP56xxx
DSP56xxx*
SCLK
SRD
SR2
03153-035
AD7441/
AD7451*
SCLK
SDATA
CS
*ADDITIONAL PINS REMOV ED FOR CLARI TY.
Figure 34. Interfacing to the TMS320C5x/C54x
TMS320C5x/
C54x*
CLKx
CLKR
DR
FSx
FSR
03153-034
Rev. C | Page 21 of 24
Page 22
AD7441/AD7451
www.BDTIC.com/ADI
GROUNDING AND LAYOUT HINTS
The printed circuit board that houses the AD7441/AD7451
must be designed so that the analog and digital sections are
separated and confined to certain areas of the board. This
facilitates the use of ground planes that can be easily separated.
A minimum etch technique is generally best for ground planes,
as it gives the best shielding. Digital and analog ground planes
must be joined in only one place: a star ground point established as close to the GND pin on the AD7441/AD7451 as
possible.
Avoid running digital lines under the device, as this couples
oise onto the die. The analog ground plane must be allowed to
n
run under the AD7441/AD7451 to avoid noise coupling. The
power supply lines to the AD7441/AD7451 must use as large
a trace as possible to provide low impedance paths and reduce
the effects of glitches on the power supply line.
Fast switching signals like clocks must be shielded with digital
g
rounds to avoid radiating noise to other sections of the board,
and clock signals must never run near the analog inputs. Avoid
crossover of digital and analog signals. Traces on opposite sides
of the board must run at right angles to each other. This reduces
the effects of feedthrough on the board. A microstrip technique is
by far the best but is not always possible with a double-sided board.
In this technique, the component side of the board is dedicated
t
o ground planes while signals are placed on the solder side.
Good decoupling is also important. All analog supplies must
be decoupled with 10 μF tantalum capacitors in parallel with
0.1 μF capacitors to GND. To achieve the best from these
decoupling components, they must be placed as close as
possible to the device.
EVALUATING PERFORMANCE
The evaluation board package includes a fully assembled and
tested evaluation board, documentation, and software for controlling the board from a PC via the evaluation board controller.
The evaluation board controller can be used in conjunction with
the AD7441 and the AD7451 evaluation boards, as well as with
many other Analog Devices, Inc. evaluation boards ending with
the CB designator, to demonstrate and evaluate the ac and dc
performance of the AD7441 and the AD7451.
The software allows the user to perform ac (fast Fourier transform)
a
nd dc (histogram of codes) tests on the AD7441/AD7451. See
the AD7441/AD7451 application note that accompanies the
evaluation kit for more information.
Rev. C | Page 22 of 24
Page 23
AD7441/AD7451
www.BDTIC.com/ADI
OUTLINE DIMENSIONS
2.90 BSC
2
1.95
BSC
56
0.65 BSC
2.80 BSC
1.45 MAX
SEATING
PLANE
0.22
0.08
8°
4°
0°
0.60
0.45
0.30
1.60 BSC
PIN 1
INDICATOR
1.30
1.15
0.90
0.15 MAX
847
13
0.38
0.22
COMPLIANT TO JEDEC STANDARDS MO-178-BA
Figure 36. 8-Lead Small Outline Transistor Package [SOT-23]
(RJ-8)
ensions shown in millimeters
Dim
3.20
3.00
2.80
8
5
4
SEATING
PLANE
5.15
4.90
4.65
1.10 MAX
0.23
0.08
8°
0°
0.80
0.60
0.40
3.20
3.00
2.80
PIN 1
0.95
0.85
0.75
0.15
0.00
COPLANARITY
1
0.65 BSC
0.38
0.22
0.10
COMPLIANT TO JEDEC STANDARDS MO-187-AA
Figure 37. 8-Lead Mini Small Outline Package [MSOP]
(RM-8)
Dim
ensions shown in millimeters
Rev. C | Page 23 of 24
Page 24
AD7441/AD7451
www.BDTIC.com/ADI
ORDERING GUIDE
Model Temperature Range Linearity Error (LSB)1Package Description Package Option Branding
AD7451ART-R2 −40°C to +85°C ± 1.5 8-Lead SOT-23 RJ-8 CSA
AD7451ART-REEL7 −40°C to +85°C ± 1.5 8-Lead SOT-23 RJ-8 CSA
AD7451ARTZ-REEL7
AD7451ARM −40°C to +85°C ± 1.5 8-Lead MSOP RM-8
AD7451ARM-REEL7 −40°C to +85°C ± 1.5 8-Lead MSOP RM-8
AD7451ARMZ
AD7451BRT-R2 −40°C to +85°C ± 1 8-Lead SOT-23 RJ-8
AD7451BRT-REEL7 −40°C to +85°C ± 1 8-Lead SOT-23 RJ-8
AD7451BRTZ-REEL7
AD7451BRM −40°C to +85°C ± 1 8-Lead MSOP RM-8
AD7451BRM-REEL7 −40°C to +85°C ± 1 8-Lead MSOP RM-8
AD7451BRMZ
AD7441BRT-R2 −40°C to +85°C ± 0.5 8-Lead SOT-23 RJ-8 C0F
AD7441BRT-REEL7 −40°C to +85°C ± 0.5 8-Lead SOT-23 RJ-8 C0F
AD7441BRTZ-R2
AD7441BRTZ-REEL7
AD7441BRM −40°C to +85°C ± 0.5 8-Lead MSOP RM-8
AD7441BRM-REEL7 −40°C to +85°C ± 0.5 8-Lead MSOP RM-8
AD7441BRMZ
EVAL-AD7451CB
EVAL-AD7441CB
EVAL-CONTROL BRD2
1
Linearity error here refers to integral nonlinearity error.
2
Z = RoHS Compliant Part.
3
This can be used as a standalone evaluation board or in conjunction with the evaluation board controller for evaluation/demonstration purposes.
4
The evaluation board controller is a complete unit allowing a PC to control and communicate with all Analog Devices evaluation boards ending in the CB designators.
To order a complete evaluation kit, you must order the ADC evaluation board (EVAL-AD7451CB or EVAL-AD7441CB), the EVAL-CONTROL BRD2, and a 12 V ac
transformer. See the AD7451/AD7441 application note that accompanies the evaluation kit for more information.