Datasheet AD7401A Datasheet (ANALOG DEVICES)

Page 1
V
V
V
Isolated Sigma-Delta Modulator

FEATURES

20 MHz maximum external clock rate Second-order modulator 16 bits, no missing codes ±2 LSB INL typical at 16 bits 1 μV/°C typical offset drift On-board digital isolator On-board reference ±250 mV analog input range Low power operation: 17 mA typical at 5.5 V
−40°C to +125°C operating range 16-lead SOIC package Internal clock version: AD7400A Safety and regulatory approvals
UL recognition
3750 V rms for 1 minute per UL 1577 CSA Component Acceptance Notice #5A VDE Certificate of Conformity
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12
V
= 891 V peak
IORM

APPLICATIONS

AC motor controls Shunt current monitoring Data acquisition systems Analog-to-digital and opto-isolator replacements
AD7401A

GENERAL DESCRIPTION

The AD7401A1 is a second-order, sigma-delta (Σ-Δ) modulator that converts an analog input signal into a high speed, 1-bit data stream with on-chip digital isolation based on Analog Devices, Inc., iCoupler® technology. The AD7401A operates from a 5 V power supply and accepts a differential input signal of ±250 mV (±320 mV full scale). The analog input is continuously sampled by the analog modulator, eliminating the need for external sample-and-hold circuitry. The input information is contained in the output stream as a density of ones with a data rate up to 20 MHz. The original information can be reconstructed with an appropriate digital filter. The serial I/O can use a 5 V or a 3 V supply (V
The serial interface is digitally isolated. High speed CMOS, combined with monolithic air core transformer technology, means the on-chip isolation provides outstanding performance characteristics, superior to alternatives such as optocoupler devices. The part contains an on-chip reference. The AD7401A is offered in a 16-lead SOIC and has an operating temperature range of −40°C to +125°C.
DD2
).

FUNCTIONAL BLOCK DIAGRAM

DD1
+
IN
VIN–
1
Protected by U.S. Patents 5,952,849; 6,873,065; and 7,075,329. Other patents pending.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
REF
H
/
T
U
B
F
Σ-Δ ADC
CONTROL LOG IC
GND
UPDATE
WATC HDOG
1
Figure 1.
DD2
AD7401A
WATCHDOG
ENCODE DECODE
UPDATE
DECODE
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2008 Analog Devices, Inc. All rights reserved.
ENCODE
GND
MDAT
MCLKIN
2
07332-001
Page 2
AD7401A

TABLE OF CONTENTS

Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Timing Specifications .................................................................. 5
Insulation and Safety-Related Specifications ............................ 6
Regulatory Information ............................................................... 6
DIN V VDE V 0884-10 (VDE V 0884-10) Insulation
Characteristics .............................................................................. 7
Absolute Maximum Ratings ............................................................ 8
ESD Caution .................................................................................. 8
Pin Configuration and Function Descriptions ............................. 9
Typical Performance Characteristics ........................................... 10
Terminology .................................................................................... 13
Theory of Operation ...................................................................... 14
Circuit Information .................................................................... 14
Analog Input ............................................................................... 14
Differential Inputs ...................................................................... 15
Current Sensing Applications ................................................... 15
Voltage Sensing Applications .................................................... 15
Digital Filter ................................................................................ 16
Applications Information .............................................................. 18
Grounding and Layout .............................................................. 18
Evaluating the AD7401A Performance ................................... 18
Insulation Lifetime ..................................................................... 18
Outline Dimensions ....................................................................... 19
Ordering Guide .......................................................................... 19

REVISION HISTORY

7/08—Revision 0: Initial Version
Rev. 0 | Page 2 of 20
Page 3
AD7401A

SPECIFICATIONS

V
= 4.5 V to 5.5 V, V
DD1
16 MHz maximum,
= 3 V to 5.5 V, VIN+ = −200 mV to +200 mV, and VIN− = 0 V (single-ended); TA = −40°C to +125°C, f
DD2
1
tested with sinc3 filter, 256 decimation rate, as defined by Verilog code, unless otherwise noted.
MCLKIN
=
Table 1.
1, 2
Y Version
Parameter
STATIC PERFORMANCE
Resolution Integral Nonlinearity (INL)
3
16 Bits Filter output truncated to 16 bits
±1.5 ±7 LSB ±2 ±13 LSB ±1.5 ±11 LSB ±2 ±46 LSB
Differential Nonlinearity (DNL)
3
Offset Error Offset Drift vs. Temperature Offset Drift vs. V Gain Error
3
DD1
3
3
±0.9 LSB Guaranteed no missed codes to 16 bits,
±.025 ±0.5 mV
1 3.5 μV/°C
120 μV/V
0.07 ±1.5 mV
3
±1 mV Gain Error Drift vs. Temperature Gain Error Drift vs. V
DD1
3
3
23 μV/°C
110 μV/V
ANALOG INPUT
Input Voltage Range
±200 ±250 mV For specified performance; full range ±320 mV
Dynamic Input Current ±13 ±18 μA ±10 ±15 μA
0.08 μA DC Leakage Current ±0.01 ±0.6 μA Input Capacitance 10 pF
DYNAMIC SPECIFICATIONS VIN+ = 5 kHz
3
Signal-to-(Noise + Distortion) Ratio (SINAD)
76 82 dB VIN+ = ±200 V, TA = −40°C to +85°C,
71 82 dB VIN+ = ±250 V, TA = −40°C to +85°C,
72 82 dB VIN+ = ±200 V, TA = −40°C to +125°C,
82 dB VIN+ = ±250 V, TA = −40°C to +125°C,
Signal-to-Noise Ratio (SNR)
3
81 83 dB VIN+ = ±250 V, TA = −40°C to +125°C,
80 82 dB VIN+ = ±200 V, TA = −40°C to +125°C,
Total Harmonic Distortion (THD)3 Peak Harmonic or Spurious Noise (SFDR) Effective Number of Bits (ENOB)3 Isolation Transient Immunity
LOGIC INPUTS
3
Input High Voltage, VIH 0.8 × V
−90 dB
3
−92 dB
13.3 12.3 Bits
25 30 kV/μs
V
DD2
Input Low Voltage, VIL 0.2 × V Input Current, IIN ±0.5 μA Floating State Leakage Current 1 μA Input Capacitance, C
4
10 pF
IN
Unit Test Conditions/Comments Min Typ Max
V
+ = ±200 V, TA = −40°C to +85°C, f
V
DD2
IN
V
+ = ±250 V, TA = −40°C to +85°C, f
IN
V
+ = ±200 V, TA = −40°C to +125°C, f
IN
V
+ = ±250 V, TA = −40°C to +125°C, f
IN
f
= 20 MHz max,1 VIN+ = −250 mV to +250 mV
MCLKIN
f
= 20 MHz max,1 VIN+ = −250 mV to +250 mV
MCLKIN
f
= 20 MHz max,1 VIN+ = −250 mV to +250 mV
MCLKIN
V
+ = 500 mV, VIN− = 0 V, f
IN
V
+ = 400 mV, VIN− = 0 V, f
IN
V
+ = 0 V, VIN− = 0 V, f
IN
f
= 5 MHz to 20 MHz
MCLKIN
f
= 5 MHz to 20 MHz
MCLKIN
f
= 5 MHz to 20 MHz
MCLKIN
f
= 5 MHz to 20 MHz
MCLKIN
f
= 5 MHz to 20 MHz
MCLKIN
f
= 5 MHz to 20 MHz
MCLKIN
f
= 20 MHz max1, VIN+ = −250 mV to +250 mV
MCLKIN
MCLKIN
1
1
1
1
1
1
MCLKIN
MCLKIN
= 20 MHz max
MCLKIN
= 20 MHz max
MCLKIN
= 20 MHz max
= 20 MHz max = 20 MHz max
= 20 MHz max
MCLKIN
= 20 MHz max
MCLKIN
1
1
1
1
1
1
1
Rev. 0 | Page 3 of 20
Page 4
AD7401A
1, 2
Y Version
Parameter
Unit Test Conditions/Comments Min Typ Max
LOGIC OUTPUTS
Output High Voltage, VOH V
− 0.1 V IO = −200 μA
DD2
Output Low Voltage, VOL 0.4 V IO = +200 μA
POWER REQUIREMENTS
V
4.5 5.5 V
DD1
V
3 5.5 V
DD2
5
I
10 12 mA V
DD1
6
I
DD2
7 9 mA V
3 4 mA V
Power Dissipation
1
For f
> 16 MHz to 20 MHz, mark space ratio is 48/52 to 52/48, V
MCLK
2
All voltages are relative to their respective ground.
3
See the section. Terminology
4
Sample tested during initial release to ensure compliance.
5
See . Figure 15
6
See . Figure 17
93.5 mW V
= V
= 5 V ± 5%, and TA = −40°C to +85°C.
DD1
DD2
= 5.5 V
DD1
= 5.5 V
DD2
= 3.3 V
DD2
= V
DD1
= 5.5 V
DD2
Rev. 0 | Page 4 of 20
Page 5
AD7401A

TIMING SPECIFICATIONS

V
= 4.5 V to 5.5 V, V
DD1
= 3 V to 5.5 V, TA = −40°C to +125°C, unless otherwise noted.
DD2
Table 2.
1
2, 3
Limit at T
20 MHz max Master clock input frequency
MIN
, T
MAX
Unit Description
Parameter
f
MCLKIN
5 MHz min Master clock input frequency
4
t
1
4
t
2
t3 0.4 × t t
4
1
Sample tested during initial release to ensure compliance.
2
Mark space ratio for clock input is 40/60 to 60/40 for f
3
V
= V
= 5 V ± 5% for f
DD1
DD2
4
Measured with the load circuit of and defined as the time required for the output to cross 0.8 V or 2.0 V. Figure 2
25 ns max Data access time after MCLKIN rising edge 15 ns min Data hold time after MCLKIN rising edge
ns min Master clock low time
MCLKIN
0.4 × t
ns min Master clock high time
MCLKIN
> 16 MHz to 20 MHz.
MCLKIN
≤ 16 MHz and 48/52 to 52/48 for 16 MHz < f
MCLKIN
MCLKIN
< 20 MHz.
200µA I
TO OUTPUT
PIN
C
L
25pF
200µA I
Figure 2. Load Circuit for Digital Output Timing Specifications
OL
1.6V
OH
07332-002
t
4
MCLKIN
MDAT
t
1
Figure 3. Data Timing
t
2
t
3
07332-003
Rev. 0 | Page 5 of 20
Page 6
AD7401A

INSULATION AND SAFETY-RELATED SPECIFICATIONS

Table 3.
Parameter Symbol Value Unit Conditions
Input-to-Output Momentary Withstand Voltage V Minimum External Air Gap (Clearance) L(I01) 7.46 min mm
Minimum External Tracking (Creepage) L(I02) 8.1 min mm
Minimum Internal Gap (Internal Clearance) 0.017 min mm Insulation distance through insulation Tracking Resistance (Comparative Tracking Index) CTI >175 V DIN IEC 112/VDE 0303 Part 1 Isolation Group IIIa Material Group (DIN VDE 0110, 1/89, Table I)

REGULATORY INFORMATION

Table 4.
1
UL
CSA VDE
Recognized Under 1577 Component Recognition Program
3750 V rms Isolation Voltage
File E214100 File 205078 File 2471900-4880-0001
1
In accordance with UL 1577, each AD7401A is proof tested by applying an insulation test voltage ≥ 4500 V rms for 1 second (current leakage detection limit = 7.5 μA).
2
In accordance with DIN V VDE V 0884-10, each AD7400A is proof tested by applying an insulation test voltage ≥1671V peak for 1 sec (partial discharge detection limit = 5 pC).
Approved under CSA Component
1
Acceptance Notice #5A Reinforced insulation per
CSA 60950-1-03 and IEC 60950-1, 630 V rms maximum working voltage
3750 min V 1-minute duration
ISO
Measured from input terminals to output terminals, shortest distance through air
Measured from input terminals to output terminals, shortest distance path along body
2
Certified according to DIN V VDE V 0884-10 (VDE V 0884-10):2006-12
2
Reinforced insulation per DIN V VDE V 0884-10 (VDE V 0884-10):2006-12, 891 V peak
Rev. 0 | Page 6 of 20
Page 7
AD7401A

DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 INSULATION CHARACTERISTICS

This isolator is suitable for reinforced electrical isolation only within the safety limit data. Maintenance of the safety data is ensured by means of protective circuits.
Table 5.
Description Symbol Characteristic Unit
INSTALLATION CLASSIFICATION PER DIN VDE 0110
For Rated Mains Voltage ≤ 300 V rms I to IV For Rated Mains Voltage ≤ 450 V rms I to II
For Rated Mains Voltage ≤ 600 V rms I to II CLIMATIC CLASSIFICATION 40/105/21 POLLUTION DEGREE (DIN VDE 0110, TABLE 1) 2 MAXIMUM WORKING INSULATION VOLTAGE V INPUT-TO-OUTPUT TEST VOLTAGE, METHOD B1
V
× 1.875 = VPR, 100% Production Test, tm = 1 sec, Partial Discharge < 5 pC VPR 1671 V peak
IORM
INPUT-TO-OUTPUT TEST VOLTAGE, METHOD A VPR
After Environmental Test Subgroup 1 1426 V peak
V
× 1.6 = VPR, tm = 60 sec, Partial Discharge < 5 pC
IORM
After Input and/or Safety Test Subgroup 2/ Safety Test Subgroup 3 1069 V peak
V
× 1.2 = VPR, tm = 60 sec, Partial Discharge < 5 pC
IORM
HIGHEST ALLOWABLE OVERVOLTAGE (TRANSIENT OVERVOLTAGE, tTR = 10 sec) VTR 6000 V peak SAFETY-LIMITING VALUES (MAXIMUM VALUE ALLOWED IN THE EVENT OF A FAILURE, SEE Figure 4)
Case Temperature TS 150 °C
Side 1 Current IS1 265 mA
Side 2 Current IS2 335 mA INSULATION RESISTANCE AT TS, VIO = 500 V RS >109 Ω
350
891 V peak
IORM
300
250
200
150
100
SAFETY-LIMITING CURRENT (mA)
50
0
0
Figure 4. Thermal Derating Curve, Dependence of Safety-Limiting Values
with Case Temperature per DIN V VDE V 0884-10
SIDE #2
SIDE #1
50 100 150 200
CASE TEMPERATURE (°C)
07332-004
Rev. 0 | Page 7 of 20
Page 8
AD7401A

ABSOLUTE MAXIMUM RATINGS

TA = 25°C, unless otherwise noted. All voltages are relative to their respective ground.
Table 6.
Parameter Rating
V
to GND
DD1
V
DD2
Analog Input Voltage to GND Digital Input Voltage to GND Output Voltage to GND Input Current to Any Pin Except
Supplies
to GND
1
1
2
1
2
2
−0.3 V to +6.5 V
−0.3 V to +6.5 V
−0.3 V to V
−0.3 V to V
−0.3 V to V
+ 0.3 V
DD1
+ 0.5 V
DD1
+ 0.3 V
DD2
±10 mA
Operating Temperature Range −40°C to +125°C Storage Temperature Range o +150°C −65°C t Junction Temperature 150°C SOIC Package
θJA Thermal Impedance
θJC Thermal Impedance Resistance (Input to Output), R Capacitance (Input to Output), C
2
89.2°C/W
2
W 55.6°C/
10
I-O
3
I-O
12
Ω
yp 1.7 pF t
Pb mperature, Soldering -Free Te
Reflow 260°C ESD 1.5 kV
1
Transient currents of up to 100 mA do not cause SCR to latch up.
2
EDEC 2S2P
3
f = 1 MHz.
standard board.
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Table 7. Maximum Continuous Working Voltage
1
Parameter Max Unit Constraint
AC Voltage,
565 V peak 50-year minimum lifetime
Bipolar Waveform AC Voltage,
Unipolar Waveform
891 V peak
Maximum CSA/VDE approved working voltage
DC Voltage 891 V
Maximum CSA/VDE approved working voltage
1
Refers to continuous voltage magnitude imposed across the isolation
barrier. See the Insulation Lifetime section for more details.

ESD CAUTION

Rev. 0 | Page 8 of 20
Page 9
AD7401A

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

V
1
DD1
VIN+
2
VIN–
3
4
NC
5
NC
NC
6
V
7
DD1
GND
8
1
NC = NO CONNECT
AD7401A
TOP VIEW
(Not to Scal e)
16
15
14
13
12
11
10
9
GND
2
NC
V
DD2
MCLKIN
NC
MDAT
NC
GND
2
07332-005
Figure 5. Pin Configuration
Table 8. Pin Function Descriptions
Pin No. Mnemonic Description
1, 7 V
Supply Voltage, 4.5 V to 5.5 V. This is the supply voltage for the isolated side of the AD7401A and is relative to GND1.
DD1
2 VIN+ Positive Analog Input. Specified range of ±250 mV. 3 VIN− 4 to 6, 10,
NC No Connect.
Negative Analog Input. Normally connected to GND1.
12, 15 8 GND 9, 16 GND
1
2
11 MDAT
Ground 1. This is the ground reference point for all circuitry on the isolated side. Ground 2. This is the ground reference point for all circuitry on the nonisolated side. Serial Data Output. The single bit modulator output is supplied to this pin as a serial data stream.
The bits are clocked out on the rising edge of the MCLKIN input and valid on the following MCLKIN rising edge. 13 MCLKIN Master Clock Logic Input. 20 MHz maximum. The bit stream from the modulator is valid on the rising edge of MCLKIN. 14 V
Supply Voltage. 3 V to 5.5 V. This is the supply voltage for the nonisolated side and is relative to GND2.
DD2
Rev. 0 | Page 9 of 20
Page 10
AD7401A

TYPICAL PERFORMANCE CHARACTERISTICS

TA = 25°C, using 25 kHz brick-wall filter, unless otherwise noted.
100
90
80
70
60
50
PSRR (dB)
40
30
20
200mV p-p SI NE WAVE O N V NO DECOUPLING
10
V
DD1
1MHz CUTOFF FILT ER
0
0 1000
MCLKIN = 5MHz
= V
= 5V
DD2
100 200 300 400 500 600 700 800 900
SUPPLY RIPPLE FREQUENCY (kHz)
MCLKIN = 16MHz
MCLKIN = 10MHz
DD1
Figure 6. PSRR vs. Supply Ripple Frequency Without Supply Decoupling
07332-006
90
–85
–80
–75
–70
SINAD (dB)
–65
–60
–55
–50
0.17 0.33
0.18 0.19 0.20 0.21 0.22 0.23 0.24 0.25 0.26 0.27 0. 28 0.29 0.30 0.31 0.32
± INPUT AMPLI TUDE (V)
MCLKIN = 10MHz
MCLKIN = 16MHz
Figure 9. SINAD vs. V
V
= V
DD1
IN
DD2
= 5V
07332-009
90
–85
–80
–75
MCLKIN = 10MHz
–70
SINAD (dB)
–65
–60
–55
–50
0 10k
1k 2k 3k 4k 5k 6k 7k 8k 9k
INPUT FREQ UENCY (Hz)
MCLKIN = 16MHz
MCLKIN = 5MHz
V
= V
= 5 V
DD1
DD2
V
= V
DD2
= 5V
07332-007
DD1
Figure 7. SINAD vs. Analog Input Frequency
20
0
–20
–40
–60
–80
(dB)
–100
–120
–140
–160
–180
03
5 10152025
FREQUENCY (kHz)
4096 POINT FFT
f
= 5kHz
IN
SINAD = 81.984dB THD = –96.311dB DECIMATIO N BY 256
0
07332-008
0.4
0.3
0.2
0.1
0
–0.1
–0.2
DNL ERRO R (LSB)
–0.3
–0.4
VIN+ = –200mV TO +200mV
– = 0V
V
IN
–0.5
0 60k
10k 20k 30k 40k 50k
Figure 10. Typical DNL (±200 mV Range)
0.8 VIN+ = –200mV TO +200mV
– = 0V
V
IN
0.6
0.4
0.2
INL ERROR (L SB)
0
–0.2
–0.4
06
10k 20k 30k 40k 50k
CODE
CODE
07332-010
0k
07332-011
Figure 8. Typical FFT (±200 mV Range)
Figure 11. Typical INL (±200 mV Range)
Rev. 0 | Page 10 of 20
Page 11
AD7401A
250
V
= V
200
150
100
DD1
MCLKIN = 16MHz
= 4.5V
DD2
V
= V
DD1
DD2
MCLKIN = 5MHz
V
= V
DD1
MCLKIN = 16MHz
= 4.5V
DD2
= 5V
V
= V
DD1
MCLKIN = 10MHz
= 4.5V
DD2
V
= V
DD1
DD2
MCLKIN = 5MHz
= 5V
50
0
–50
OFFSET (µV)
–100
–150
–200
–250
V
= V
DD1
MCLKIN = 16MHz
–45
–35 –25 –15 –5 5 15 25 35 45 55 65 75 85 95 105
= 5.25V
DD2
V
= V
DD1
DD2
MCLKIN = 10MHz
= 5V
V
= V
DD1
MCLKIN = 10MHz
= 5.25V
DD2
V
= V
DD1
DD2
MCLKIN = 5MHz
= 5.25V
TEMPERATURE (° C)
Figure 12. Offset Drift vs. Temperature for Various Supply Voltages
200.5 V
= V
GAIN (mV)
200.4
200.3
200.2
200.1
200.0
199.9
= V
= V
= V
= V
DD2
DD2
DD2
DD2
DD2
= 4.5V
= 4.5V
= 5V
= 5.25V
= 5V
DD1
MCLKIN = 16MHz
V
DD1
MCLKIN = 5MHz
V
DD1
MCLKIN = 16MHz
V
DD1
MCLKIN = 16MHz
V
DD1
MCLKIN = 10MHz
V
= V
DD1
= V
= V
= V
DD2
DD2
DD2
DD2
= 4.5V
= 5V
= 5.25V
= 5.25V
DD1
MCLKIN = 10MHz
V MCLKIN = 5MHz
V
DD1
MCLKIN = 10MHz
V
DD1
MCLKIN = 5MHz
199.8
199.7
199.6
199.5
–45
–35 –25 –15 –5 5 15 25 35 45 55 65 75 85 95 105
TEMPERATURE (° C)
Figure 13. Gain Error Drift vs. Temperature for Various Supply Voltages
0.0105 V
= V
DD1
0.0100
0.0095
= 5V
DD2
MCLKIN = 16MHz
T
= –40°C
A
MCLKIN = 16MHz
T
= +85°C
A
MCLKIN = 16MHz
T
= +105°C
A
0.0090
MCLKIN = 10MHz
T
(A)
DD1
I
0.0085
0.0080
= –40°C
A
MCLKIN = 10MHz
0.0075
0.0070
0.0065
0.0060
07332-012
MCLKIN = 5MHz
T
= +85°C
A
–0.33 0.33–0.28 –0.23 –0.18 –0.13 –0.08 –0.03 0.03 0.08 0.13 0.18 0.23 0.28
Figure 15. I
MCLKIN = 5MHz
VIN DC INPUT VOL TAGE (V)
vs. VIN at Various Temperatures
DD1
0.0070
0.0065
MCLKIN = 16MHz
T
A
T
A
= +85°C
= –40°C
MCLKIN = 10MHz
T
= +105°C
A
MCLKIN = 5MHz
T
= +105°C
A
V
= V
DD1
T
= 25°C
A
DD2
= 5V
07332-015
0.0060
0.0055
0.0050
(A)
0.0045
DD2
I
0.0040
0.0035
0.0030
MCLKIN = 10MHz
MCLKIN = 5MHz
0.0025
0.0020
07332-013
–0.225 –0.125 –0.025 0.075 0.175
–0.325
VIN DC INPUT VOLTAGE ( V)
Figure 16. I
vs. VIN DC Input Voltage
DD2
0.275
0.325–0.275 –0.175 –0.075 0.025 0.125 0.225
07332-016
0.0105
0.0100
MCLKIN = 16MHz
0.0095
0.0090
(A)
DD1
I
0.0085 MCLKIN = 10MHz
0.0080
0.0075
MCLKIN = 5MHz
0.0070
0.0065
–0.33 0.33–0.28 –0.23 –0.18 –0.13 –0.08 –0.03 0.03 0.08 0.13 0.18 0.23 0.28
VIN DC INPUT VOL TAGE (V)
Figure 14. I
vs. VIN DC Input Voltage
DD1
V
DD1
T
A
= V
= 25°C
DD2
= 5V
07332-014
Rev. 0 | Page 11 of 20
0.0065
0.0060
0.0055
0.0050
(A)
0.0045
DD2
I
0.0040
0.0035
0.0030
0.0025
0.0070
0.0020
V
= V
DD1
–0.325
= 5V
DD2
MCLKIN = 16MHz
T
= +105°C
= –40°C
MCLKIN = 10MHz
A
T
A
MCLKIN = 16MHz
T
= –40°C
A
MCLKIN = 10MHz
T
A
MCLKIN = 5MHz
T
= –40°C
A
MCLKIN = 5MHz
T
= +85°C
A
–0.225 –0.125 –0.025 0.075 0.175
VIN DC INPUT VOLTAGE ( V)
Figure 17. I
vs. VIN at Various Temperatures
DD2
MCLKIN = 10MHz
= +85°C
MCLKIN = 16MHz
T
A
T
= +105°C
A
MCLKIN = 5MHz
T
= +105°C
A
= +85°C
0.275
0.325–0.275 –0.175 –0.075 0.025 0.125 0.225
07332-017
Page 12
AD7401A
8
V
= V
DD1
6
4
= 4.5V TO 5.25V
DD2
MCLKIN = 16M Hz
MCLKIN = 10MHz
2
0
(µA)
IN
I
MCLKIN = 5MHz
–2
–4
–6
–8
–0.35
–0.30
–0.25
–0.20
–0.15
0
–0.10
VIN– DC INPUT (V)
0.05
–0.05
0.10
0.15
0.20
0.25
0.30
0.35
07332-018
Figure 18. IIN vs. VIN− DC Input
0
–20
–40
–60
CMRR (dB)
MCLKIN = 10MHz
–80
V
= V
DD1
V
= V
DD1
DD2
MCLKIN = 5MHz
= 5 V
DD2
= 5V
1.0 V
= V
DD2
= 5V
DD1
50kHz BRICK-WALL FILTER
0.8
0.6
0.4
NOISE (mV)
MCLKIN = 5MHz
0.2
0
0.05
MCLKIN = 16MHz
0.10
0.15
0.20
0.25
0.30
07332-020
MCLKIN = 10MHz
0
–0.30
–0.25
–0.20
–0.15
–0.10
–0.05
DC INPUT (V)
V
IN
Figure 20. RMS Noise Voltage vs. VIN DC Input
–100
–120
0.1 1000
1 10 100
RIPPLE FREQUENCY (kHz)
MCLKIN = 16MHz
07332-019
Figure 19. CMRR vs. Common-Mode Ripple Frequency
Rev. 0 | Page 12 of 20
Page 13
AD7401A

TERMINOLOGY

Differential Nonlinearity (DNL)
DNL is the difference between the measured and the ideal 1 LSB change between any two adjacent codes in the ADC.
Integral Nonlinearity (INL)
INL is the maximum deviation from a straight line passing through the endpoints of the ADC transfer function. The endpoints of the transfer function are specified negative full scale, −250 mV (V and specified positive full scale, +250 mV (V
+ − VIN−), Code 7169 for the 16-bit level,
IN
+ − VIN−), Code
IN
58366 for the 16-bit level.
Offset Error
Offset error is the deviation of the midscale code (32768 for the 16-bit level) from the ideal V
+ − VIN− (that is, 0 V).
IN
Gain Error
The gain error includes both positive full-scale gain error and negative full-scale gain error. Positive full-scale gain error is the deviation of the specified positive full-scale code (58366 for the 16-bit level) from the ideal V
+ − VIN− (+250 mV) after the
IN
offset error is adjusted out. Negative full-scale gain error is the deviation of the specified negative full-scale code (7169 for the 16-bit level) from the ideal V
+ − VIN− (−250 mV) after the
IN
offset error is adjusted out. Gain error includes reference error.
Signal-to-(Noise and Distortion) Ratio (SINAD)
SINAD is the measured ratio of signal-to-noise and distortion at the output of the ADC. The signal is the rms amplitude of the fundamental. Noise is the sum of all nonfundamental signals up to half the sampling frequency (f
/2), excluding dc. The ratio is
S
dependent on the number of quantization levels in the digitization process; the more levels, the smaller the quantization noise. The theoretical signal-to-(noise and distortion) ratio for an ideal N-bit converter with a sine wave input is given by
Signal-to-(Noise and Distortion) = (6.02N + 1.76) dB
Therefore, for a 12-bit converter, this is 74 dB.
Effective Number of Bits (ENOB)
ENOB is defined by
ENOB = (SINAD − 1.76)/6.02 bits
Total Harmonic Distortion (THD)
THD is the ratio of the rms sum of harmonics to the fundamental. For the AD7401A, it is defined as
22222
++++
VVVVV
54
THD
log20(dB)
=
32
V
1
6
where:
V
is the rms amplitude of the fundamental.
1
V
, V3, V4, V5, and V6 are the rms amplitudes of the second
2
through the sixth harmonics.
Peak Harmonic or Spurious Noise
Peak harmonic or spurious noise is defined as the ratio of the rms value of the next largest component in the ADC output spectrum (up to f
/2, excluding dc) to the rms value of the
S
fundamental. Normally, the value of this specification is determined by the largest harmonic in the spectrum, but for ADCs where the harmonics are buried in the noise floor, it is a noise peak.
Common-Mode Rejection Ratio (CMRR)
CMRR is defined as the ratio of the power in the ADC output at ±250 mV frequency, f, to the power of a 250 mV p-p sine wave applied to the common-mode voltage of V of frequency, f
CMRR (dB) = 10 .log(Pf/Pf
, as
S
)
S
+ and VIN−
IN
where:
Pf is the power at frequency, f, in the ADC output. Pf
is the power at frequency, fS, in the ADC output.
S
Power Supply Rejection Ratio (PSRR)
Variations in power supply affect the full-scale transition but not the converter’s linearity. PSRR is the maximum change in the specified full-scale (±250 mV) transition point due to a change in power supply voltage from the nominal value (see Figure 6).
Isolation Transient Immunity
The isolation transient immunity specifies the rate of rise/fall of a transient pulse applied across the isolation boundary beyond which clock or data is corrupted. The AD7401A was tested using a transient pulse frequency of 100 kHz.
Rev. 0 | Page 13 of 20
Page 14
AD7401A
A
L
A

THEORY OF OPERATION

CIRCUIT INFORMATION

The AD7401A isolated Σ-Δ modulator converts an analog input signal into a high speed (20 MHz maximum), single-bit data stream; the time average single-bit data from the modulators is directly proportional to the input signal. Figure 23 shows a typical application circuit where the AD7401A is used to provide isolation between the analog input, a current sensing resistor, and the digital output, which is then processed by a digital filter to provide an N-bit word.

ANALOG INPUT

The differential analog input of the AD7401A is implemented with a switched capacitor circuit. This circuit implements a second-order modulator stage that digitizes the input signal into a 1-bit output stream. The sample clock (MCLKIN) provides the clock signal for the conversion process as well as the output data-framing clock. This clock source is external on the AD7401A. The analog input signal is continuously sampled by the modulator and compared to an internal voltage reference. A digital stream that accurately represents the analog input over time appears at the output of the converter (see Figure 21).
MODULATOR OUTPUT
+FS ANALOG INPUT
A differential input of 320 mV results in a stream of, ideally, all 1s. This is the absolute full-scale range of the AD7401A, and 200 mV is the specified full-scale range, as shown in Tab le 9 .
Table 9. Analog Input Range
Analog Input Voltage Input
Full-Scale Range +640 mV Positive Full Scale +320 mV Positive Typical Input Range +250 mV Positive Specified Input Range +200 mV Zero 0 mV Negative Specified Input Range −200 mV Negative Typical Input Range −250 mV Negative Full Scale −320 mV
To reconstruct the original information, this output needs to be digitally filtered and decimated. A sinc3 filter is recommended because this is one order higher than that of the AD7401A modu­lator. If a 256 decimation rate is used, the resulting 16-bit word rate is 62.5 kHz, assuming a 16 MHz external clock frequency. Figure 22 shows the transfer function of the AD7401A relative to the 16-bit output.
65535
–FS ANALOG INPUT
ANALOG INPUT
Figure 21. Analog Input vs. Modulator Output
A differential signal of 0 V results (ideally) in a stream of alter­nating 1s and 0s at the MDAT output pin. This output is high 50% of the time and low 50% of the time. A differential input of 200 mV produces a stream of 1s and 0s that are high 81.25% of the time (for a +250 mV input, the output stream is high 89.06% of the time). A differential input of −200 mV produces a stream of 1s and 0s that are high 18.75% of the time (for a −250 mV input, the output stream is high 10.94% of the time).
ISO
TED
5V
AD7401A
V
DD1
Σ-Δ
IN
1
MOD/
ENCODER
DECODER
DECODER
ENCODER
INPUT
CURRENT
R
SHUNT
+
VIN+
V
GND
53248
07332-021
ADC CODE
SPECIFIE D RANGE
12288
0
–320mV –200mV +200mV +320mV
ANALOG INPUT
07332-022
Figure 22. Filtered and Decimated 16-Bit Transfer Characteristic
NONISOL
V
DD2
MDAT MDAT
MCLKIN
GND
2
5V/3V
TED
V
DD
SINC3 FILTER*
MCLK
GND
CS
SCLK
SDAT
*THIS FILTER IS IMPLEMENTED WITHAN FPGA OR DSP.
07332-023
Figure 23. Typical Application Circuit
Rev. 0 | Page 14 of 20
Page 15
AD7401A
V
V

DIFFERENTIAL INPUTS

The analog input to the modulator is a switched capacitor design. The analog signal is converted into charge by highly linear sampling capacitors. A simplified equivalent circuit diagram of the analog input is shown in Figure 24. A signal source driving the analog input must be able to provide the charge onto the sampling capacitors every half MCLKIN cycle and settle to the required accuracy within the next half cycle.
φA
1k
1k
MCLKIN
R
R
φB
φA
φB
φB φB
φA φA
C
AD7401A
2pF
2pF
7332-024
07332-025
+
IN
IN
Figure 24. Analog Input Equivalent Circuit
Because the AD7401A samples the differential voltage across its analog inputs, low noise performance is attained with an input circuit that provides low common-mode noise at each input. The amplifiers used to drive the analog inputs play a critical role in attaining the high performance available from the AD7401A.
When a capacitive load is switched onto the output of an op amp, the amplitude momentarily drops. The op amp tries to correct the situation and, in the process, hits its slew rate limit. This nonlinear response, which can cause excessive ringing, can lead to distortion. To remedy the situation, a low-pass RC filter can be connected between the amplifier and the input to the AD7401A. The external capacitor at each input aids in supplying the current spikes created during the sampling process, and the resistor isolates the op amp from the transient nature of the load.
The recommended circuit configuration for driving the differential inputs to achieve best performance is shown in Figure 25. A capacitor between the two input pins sources or sinks charge to allow most of the charge that is needed by one input to be effectively supplied by the other input. The series resistor again isolates any op amp from the current spikes created during the sampling process. Recommended values for the resistors and capacitor are 22 Ω and 47 pF, respectively.
+
V
IN
V
IN
Figure 25. Differential Input RC Network

CURRENT SENSING APPLICATIONS

The AD7401A is ideally suited for current sensing applications where the voltage across a shunt resistor is monitored. The load current flowing through an external shunt resistor produces a voltage at the input terminals of the AD7401A. The AD7401A provides isolation between the analog input from the current sensing resistor and the digital outputs. By selecting the appro­priate shunt resistor value, a variety of current ranges can be monitored.
Choosing R
SHUNT
The shunt resistor values used in conjunction with the AD7401A are determined by the specific application requirements in terms of voltage, current, and power. Small resistors minimize power dissipation, while low inductance resistors prevent any induced voltage spikes, and good tolerance devices reduce current variations. The final values chosen are a compromise between low power dissipation and good accuracy. Low value resistors have less power dissipated in them, but higher value resistors may be required to utilize the full input range of the ADC, thus achieving maximum SNR performance.
When the peak sense current is known, the voltage range of the AD7401A (±200 mV) is divided by the maximum sense current to yield a suitable shunt value. If the power dissipation in the shunt resistor is too large, the shunt resistor can be reduced and less of the ADC input range is used. Using less of the ADC input range results in performance that is more susceptible to noise and offset errors because offset errors are fixed and are thus more significant when smaller input ranges are used.
R
must be able to dissipate the I2R power losses. If the
SHUNT
power dissipation rating of the resistor is exceeded, its value may drift or the resistor may be damaged, resulting in an open circuit. This can result in a differential voltage across the ter­minals of the AD401A in excess of the absolute maximum ratings. If I
has a large high frequency component, take
SENSE
care to choose a resistor with low inductance.

VOLTAGE SENSING APPLICATIONS

The AD7401A can also be used for isolated voltage monitoring. For example, in motor control applications, it can be used to sense bus voltage. In applications where the voltage being moni­tored exceeds the specified analog input range of the AD7401A, a voltage divider network can be used to reduce the voltage to be monitored to the required range.
Rev. 0 | Page 15 of 20
Page 16
AD7401A
(
)

DIGITAL FILTER

The overall system resolution and throughput rate is determined by the filter selected and the decimation rate used. The higher the decimation rate, the greater the system accuracy, as illus­trated in Figure 26. However, there is a tradeoff between accuracy and throughput rate and, therefore, higher decimation rates result in lower throughput solutions. Note that for a given bandwidth requirement, a higher MCLKIN frequency can allow for higher decimation rates to be used, resulting in higher SNR performance.
90
80
70
60
50
40
SNR (dB)
30
20
10
0
Figure 26. SNR vs. Decimation Rate for Different Filter Types
10 100 1k1
DECIMATI ON RATE
A sinc3 filter is recommended for use with the AD7401A. This filter can be implemented on an FPGA or a DSP.
3
DR
1
)(
zH
=
()
1
Z
− ⎟
1
Z
where DR is the decimation rate.
The following Verilog code provides an example of a sinc3 filter implementation on a Xilinx® Spartan-II 2.5 V FPGA. This code can possibly be compiled for another FPGA, such as an Altera® device. Note that the data is read on the negative clock edge in this case, although it can be read on the positive edge, if preferred.
SINC3
SINC2
SINC1
07332-026
/*`Data is read on negative clk edge*/ module DEC256SINC24B(mdata1, mclk1, reset, DATA);
input mclk1; /*used to clk filter*/ input reset; /*used to reset filter*/ input mdata1; /*ip data to be filtered*/
output [15:0] DATA; /*filtered op*/ integer location;
integer info_file; reg [23:0] ip_data1; reg [23:0] acc1; reg [23:0] acc2; reg [23:0] acc3; reg [23:0] acc3_d1; reg [23:0] acc3_d2; reg [23:0] diff1; reg [23:0] diff2; reg [23:0] diff3; reg [23:0] diff1_d; reg [23:0] diff2_d; reg [15:0] DATA; reg [7:0] word_count; reg word_clk;
reg init;
/*Perform the Sinc ACTION*/ always @ (mdata1)
if(mdata1==0) ip_data1 <= 0; /* change from a 0 to a -1 for 2's comp */ else ip_data1 <= 1;
/*ACCUMULATOR (INTEGRATOR) Perform the accumulation (IIR) at the speed of the modulator.
MCLKIN
IP_DATA1
ACC1+ ACC2+
Z
+
Figure 27. Accumulator
Z
+
+
ACC3+
Z
07332-027
Rev. 0 | Page 16 of 20
Page 17
AD7401A
W
Z = one sample delay MCLKOUT = modulators conversion bit rate */
always @ (posedge mclk1 or posedge reset) if (reset) begin /*initialize acc registers on reset*/ acc1 <= 0; acc2 <= 0; acc3 <= 0; end else begin /*perform accumulation process*/ acc1 <= acc1 + ip_data1; acc2 <= acc2 + acc1; acc3 <= acc3 + acc2; end
/*DECIMATION STAGE (MCLKOUT/ WORD_CLK) */
always @ (negedge mclk1 or posedge reset) if (reset) word_count <= 0; else word_count <= word_count + 1;
word_clk <= word_count[7]; /*DIFFERENTIATOR ( including decimation
stage) Perform the differentiation stage (FIR) at a lower speed.
ACC3
ORD_CLK
DIFF1
+
–1
Z
Figure 28. Differentiator
DIFF2
+
–1
Z
DIFF3
+
–1
Z
Z = one sample delay WORD_CLK = output word rate */
always @ (posedge word_clk or posedge reset) if(reset) begin acc3_d2 <= 0; diff1_d <= 0; diff2_d <= 0; diff1 <= 0; diff2 <= 0; diff3 <= 0; end
else begin diff1 <= acc3 - acc3_d2; diff2 <= diff1 - diff1_d; diff3 <= diff2 - diff2_d; acc3_d2 <= acc3; diff1_d <= diff1; diff2_d <= diff2; end
/* Clock the Sinc output into an output register always @ (word_count)
WORD_CLK
DATADIFF3
07332-029
Figure 29. Clocking Sinc Output into an Output Register
WORD_CLK = output word rate */
always @ (posedge word_clk)
07332-028
begin DATA[15] <= diff3[23];
DATA[14] <= diff3[22]; DATA[13] <= diff3[21]; DATA[12] <= diff3[20]; DATA[11] <= diff3[19]; DATA[10] <= diff3[18]; DATA[9] <= diff3[17]; DATA[8] <= diff3[16]; DATA[7] <= diff3[15]; DATA[6] <= diff3[14]; DATA[5] <= diff3[13]; DATA[4] <= diff3[12]; DATA[3] <= diff3[11]; DATA[2] <= diff3[10]; DATA[1] <= diff3[9]; DATA[0] <= diff3[8];
end
endmodule
Rev. 0 | Page 17 of 20
Page 18
AD7401A

APPLICATIONS INFORMATION

GROUNDING AND LAYOUT

Supply decoupling with a value of 100 nF is recommended on both V
DD1
and V
. In applications involving high common-
DD2
mode transients, care should be taken to ensure that board coupling across the isolation barrier is minimized. Further­more, the board layout should be designed so that any coupling that occurs equally affects all pins on a given component side. Failure to ensure this may cause voltage differentials between pins to exceed the absolute maximum ratings of the device, thereby leading to latch-up or permanent damage. Any decoupling used should be placed as close to the supply pins as possible.
Series resistance in the analog inputs should be minimized to avoid any distortion effects, especially at high temperatures. If possible, equalize the source impedance on each analog input to minimize offset. Beware of mismatch and thermocouple effects on the analog input PCB tracks to reduce offset drift.

EVALUATING THE AD7401A PERFORMANCE

An AD7401A evaluation board is available with split ground planes and a board split beneath the AD7401A package to ensure isolation. This board allows access to each pin on the device for evaluation purposes.
The evaluation board package includes a fully assembled and tested evaluation board, documentation, and software for controlling the board from the PC via the EVAL-CED1Z. The software also includes a sinc3 filter implemented on an FPGA. The evaluation board is used in conjunction with the EVAL­CED1Z board and can also be used as a standalone board. The software allows the user to perform ac (fast Fourier transform) and dc (histogram of codes) tests on the AD7401A. The soft­ware and documentation are on a CD that is shipped with the evaluation board.
These tests subjected devices to continuous cross-isolation voltages. To accelerate the occurrence of failures, the selected test voltages were values exceeding those of normal use. The time-to-failure values of these units were recorded and used to calculate acceleration factors. These factors were then used to calculate the time-to-failure under normal operating conditions. The values shown in Tab le 7 are the lesser of the following two values:
The value that ensures at least a 50-year lifetime of
continuous use.
The maximum CSA/VDE approved working voltage.
It should also be noted that the lifetime of the AD7401A varies according to the waveform type imposed across the isolation barrier. The iCoupler insulation structure is stressed differently depending on whether the waveform is bipolar ac, unipolar ac, or dc. Figure 30, Figure 31, and Figure 32 illustrate the different isolation voltage waveforms.
RATED PEAK VOLTAGE
0V
Figure 30. Bipolar AC Waveform
7332-030
RATED PEAK VOLTAGE
0V
Figure 31. Unipolar AC Waveform
07332-031
RATED PEAK VOLTAGE

INSULATION LIFETIME

All insulation structures, subjected to sufficient time and/or voltage, are vulnerable to breakdown. In addition to the testing performed by the regulatory agencies, Analog Devices has carried out an extensive set of evaluations to determine the lifetime of the insulation structure within the AD7401A.
Rev. 0 | Page 18 of 20
0V
Figure 32. DC Waveform
07332-032
Page 19
AD7401A
C

OUTLINE DIMENSIONS

10.50 (0.4134)
10.10 (0.3976)
9
7.60 (0.2992)
7.40 (0.2913)
8
10.65 (0.4193)
10.00 (0.3937)
2.65 (0.1043)
2.35 (0.0925)
SEATING PLANE
8° 0°
0.33 (0.0130)
0.20 (0.0079)
0 0
.
7
.
2
5
(
0
5
(
0
.
0
2
9
5
)
0
0
9
8
)
.
1.27 (0.0500)
0.40 (0.0157)
45°
032707-B
0.30 (0.0 118)
0.10 (0.0039)
OPLANARITY
0.10
16
1
1.27 (0.0500) BSC
0.51 (0.0201)
0.31 (0.0122)
CONTROLL ING DIMENS IONS ARE IN MILLIM ETERS; INCH DI MENSIONS (IN PARENTHESES) ARE ROUNDED-O FF MIL LIMETE R EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRI ATE FOR USE IN DESIGN.
COMPLIANT TO JEDEC STANDARDS MS-013- AA
Figure 33. 16-Lead Standard Small Outline Package [SOIC_W]
Wide Body
(RW-16)
Dimensions shown in millimeters and (inches)

ORDERING GUIDE

Model Temperature Range Package Description Package Option
AD7401AYRWZ AD7401AYRWZ-RL EVAL-AD7401AEDZ EVAL-CED1Z
1
Z = RoHS Compliant Part.
1
−40°C to +125°C 16-Lead Standard Small Outline Package (SOIC_W) RW-16
1
−40°C to +125°C 16-Lead Standard Small Outline Package (SOIC_W) RW-16
1
Evaluation Board
1
Development Board
Rev. 0 | Page 19 of 20
Page 20
AD7401A
NOTES
©2008 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D07332-0-7/08(0)
Rev. 0 | Page 20 of 20
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