Datasheet AD679TJ, AD679TD, AD679SJ, AD679SD, AD679KN Datasheet (Analog Devices)

...
Page 1
14-Bit 128 kSPS
a
FEATURES AC and DC Characterized and Specified
(K, B, T Grades) 128k Conversions per Second 1 MHz Full Power Bandwidth 500 kHz Full Linear Bandwidth 80 dB S/N+D (K, B, T Grades) Twos Complement Data Format (Bipolar Mode) Straight Binary Data Format (Unipolar Mode) 10 MV Input Impedance 8-Bit Bus Interface (See AD779 for 16-Bit Interface) On-Board Reference and Clock 10 V Unipolar or Bipolar Input Range Pin Compatible with AD678 12-Bit, 200 kSPS ADC MIL-STD-883 Compliant Versions Available
GENERAL DESCRIPTION
The AD679 is a complete, multipurpose 14-bit monolithic analog-to-digital converter, consisting of a sample-hold ampli­fier (SHA), a microprocessor compatible bus interface, a voltage reference and clock generation circuitry.
The AD679 is specified for ac (or “dynamic”) parameters such as S/N+D ratio, THD and IMD which are important in signal processing applications. In addition, the AD679K, B and T grades are fully specified for dc parameters which are important in measurement applications.
The 14 data bits are accessed in two read operations (8+6), with left justification. Data format is straight binary for unipolar mode and twos complement binary for bipolar mode. The input has a full-scale range of 10 V with a full power bandwidth of 1 MHz and a full linear bandwidth of 500 kHz. High input im­pedance (10 M) allows direct connection to unbuffered sources without signal degradation. Conversions can be initiated either under microprocessor control or by an external clock asynchronous to the system clock.
This product is fabricated on Analog Devices’ BiMOS process, combining low power CMOS logic with high precision, low noise bipolar circuits; laser-trimmed thin-film resistors provide high accuracy. The converter utilizes a recursive subranging al­gorithm which includes error correction and flash converter cir­cuitry to achieve high speed and resolution.
The AD679 operates from +5 V and ±12 V supplies and dissi­pates 560 mW (typ). 28-pin plastic DIP, ceramic DIP and 44 J-leaded ceramic surface mount packages are available.
*Protected by U.S. Patent Nos. 4,804,960; 4,814,767; 4,833,345; 4,250,445;
4,808,908; RE 30,586
AD679*

FUNCTIONAL BLOCK DIAGRAM

PRODUCT HIGHLIGHTS

1. COMPLETE INTEGRATION: The AD679 minimizes external component requirements by combining a high speed sample-hold amplifier (SHA), ADC, 5 V reference, clock and digital interface on a single chip. This provides a fully specified sampling A/D function unattainable with discrete designs.
2. SPECIFICATIONS: The AD679K, B and T grades provide fully specified and tested ac and dc parameters. The AD679J, A and S grades are specified and tested for ac parameters; dc accuracy specifications are shown as typicals. DC specifica­tions (such as INL, gain and offset) are important in control and measurement applications. AC specifications (such as S/N+D ratio, THD and IMD) are of value in signal process­ing applications.
3. EASE OF USE: The pinout is designed for easy board lay­out, and the two read output provides compatibility with 8­bit buses. Factory trimming eliminates the need for calibration modes or external trimming to achieve rated performance.
4. RELIABILITY: The AD679 utilizes Analog Devices’ mono­lithic BiMOS technology. This ensures long term reliability compared to multichip and hybrid designs.
5. UPGRADE PATH: The AD679 provides the same pinout as the 12-bit, 200 kSPS AD678 ADC.
6. The AD679 is available in versions compliant with MIL­STD-883. Refer to the Analog Devices Military Products Databook or current AD679/883B data sheet for detailed specifications.
REV. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 Fax: 617/326-8703
Page 2
AD679–SPECIFICATIONS
(T
to T
, VCC = +12 V 6 5%, VEE = –12 V 6 5%, VDD = +5 V 6 10%, f
MAX
1

AC SPECIFICATIONS

MIN
unless otherwise noted)
AD679J/A/S AD679K/B/T
Parameter Min Typ Max Min Typ Max Units
SIGNAL-TO-NOISE AND DISTORTION (S/N+D) RATIO
2
–0.5 dB Input (Referred to –0 dB Input) 78 79 80 81 dB –20 dB Input (Referred to –20 dB Input) 58 59 60 61 dB –60 dB Input (Referred to –60 dB Input) 18 19 20 21 dB
TOTAL HARMONIC DISTORTION (THD)
3
@ +25°C –90 –84 –90 –84 dB
0.003 0.006 0.003 0.006 %
T
MIN
to T
MAX
–88 –82 –88 –82 dB
0.004 0.008 0.004 0.008 %
PEAK SPURIOUS OR PEAK HARMONIC COMPONENT –90 –84 –90 –84 dB
FULL POWER BANDWIDTH 1 1 MHz
FULL LINEAR BANDWIDTH 500 500 kHz
INTERMODULATION DISTORTION (IMD)
4
2nd Order Products –90 –84 –90 –84 dB 3rd Order Products –90 –84 –90 –84 dB
= 128 kSPS, fIN = 10.009 kHz
SAMPLE

DIGITAL SPECIFICATIONS

(All device types T
MIN
to T
, VCC = +12 V 6 5%, VEE = –12 V 6 5%, VDD = +5 V 6 10%)
MAX
Parameter Test Conditions Min Max Units
LOGIC INPUTS
V
IH
V
IL
I
IH
I
IL
C
IN
High Level Input Voltage 2.0 V
DD
V Low Level Input Voltage 0 0.8 V High Level Input Current V Low Level Input Current V
= 5 V –10 +10 µA
IN
= 0 V –10 +10 µA
IN
Input Capacitance 10 pF
LOGIC OUTPUTS
V
OH
V
OL
I
OZ
C
OZ
NOTES
1
flN amplitude = –0.5 dB (9.44 V p-p) bipolar mode full scale unless otherwise indicated. All measurements referred to a –0 dB (9.997 V p-p) input signal unless otherwise noted.
2
See Figure 15 for higher frequencies and other input amplitudes.
3
See Figures 13 and 14 for higher frequencies and other input amplitudes.
4
fA = 9.08 kHz, fB = 9.58 kHz, with f
Specifications subject to change without notice.
High Level Output Voltage IOH = 0.1 mA 4.0 V
I
= 0.5 mA 2.4 V
OH
Low Level Output Voltage IOL = 1.6 mA 0.4 V High Z Leakage Current V
= 0 or 5 V –10 +10 µA
IN
High Z Output Capacitance 10 pF
100 kSPS. See Definition of Specifications section.
SAMPLE
REV. C–2–
Page 3
AD679
(T
to T

DC SPECIFICATIONS

MIN
Parameter Min Typ Max Min Typ Max Units
TEMPERATURE RANGE
J, K Grades 0 +70 0 +70 ° C A, B Grades –40 +85 –40 +85 °C S, T Grades –55 +125 –55 +125 °C
ACCURACY
Resolution 14 14 Bits Integral Nonlinearity (INL) ±2 ±1 62 LSB Differential Nonlinearity (DNL) 14 14 Bits Unipolar Zero Error Bipolar Zero Error Gain Error
1, 2
Temperature Drift
Unipolar Zero
1
(@ +25°C) 0.08 0.05 0.07 % FSR*
1
(@ +25°C) 0.08 0.05 0.07 % FSR
(@ +25°C) 0.12 0.09 0.11 % FSR
3
J, K Grades 0.04 0.04 0.05 % FSR A, B Grades 0.05 0.05 0.07 % FSR S, T Grades 0.09 0.09 0.10 % FSR
Bipolar Zero
3
J, K Grades 0.02 0.02 0.04 % FSR A, B Grades 0.04 0.04 0.05 % FSR S, T Grades 0.08 0.08 0.09 % FSR
3
Gain
J, K Grades 0.09 0.09 0.11 % FSR A, B Grades 0.10 0.10 0.16 % FSR S, T Grades 0.20 0.20 0.25 % FSR
4
Gain
J, K Grades 0.04 0.04 0.05 % FSR A, B Grades 0.05 0.05 0.07 % FSR S, T Grades 0.09 0.09 0.10 % FSR
ANALOG INPUT
Input Ranges
Unipolar Mode 0 +10 0 +10 V Bipolar Mode –5 +5 –5 +5 V
Input Resistance 10 10 M Input Capacitance 10 10 pF Input Settling Time 1.5 1.5 µs Aperture Delay 10 10 ns Aperture Jitter 150 150 ps
INTERNAL VOLTAGE REFERENCE
Output Voltage
5
External Load
Unipolar Mode +1.5 +1.5 mA Bipolar Mode +0.5 +0.5 mA
POWER SUPPLIES
Power Supply Rejection
= +12 V ± 5% ±6 66 LSB
V
CC
= –12 V ± 5% ±6 66 LSB
V
EE
= +5 V ± 10% ±6 66 LSB
V
DD
Operating Current
I
CC
I
EE
I
DD
Power Consumption 560 745 560 745 m
NOTES
1
Adjustable to zero. See Figures 5 and 6.
2
Includes internal voltage reference error.
3
Includes internal voltage reference drift.
4
Excludes internal voltage reference drift.
5
With maximum external load applied.
*% FSR = percent of full-scale range. Specifications shown in boldface are tested on all devices at final electrical test with worst case supply voltages at T calculate outgoing quality levels. All min and max specifications are guaranteed, although only those shown in boldface are tested.
Specifications subject to change without notice.
, VCC = +12 V 6 5%, VEE = –12 V 6 5%, VDD = +5 V 6 10% unless otherwise noted)
MAX
AD679J/A/S AD679K/B/T
4.98 5.02 4.98 5.02 V
18 20 18 20 mA 25 34 25 34 mA 8 12 8 12 mA
25°C and T
MIN,
. Results from those tests are used to
MAX
W
REV. C
–3–
Page 4
AD679

TIMING SPECIFICATIONS

(All device types T VDD = +5 V 6 10%)
Parameter Symbol Min Max Units
MIN
to T
, VCC = +12 V 6 5%, VEE = –12 V 6 5%,
MAX
SC Delay t Conversion Time t Conversion Rate
1
Convert Pulse Width t Aperture Delay t Status Delay t Access Time
Float Delay
2, 3
5
Output Delay t Format Setup t OE Delay t Read Pulse Width t Conversion Delay t EOCEN Delay t
NOTES
1
Includes Acquisition Time.
2
Measured from the falling edge of OE/EOCEN (0.8 V) to the time at which the data lines/EOC cross 2.0 V or 0.8 V. See Figure 4.
3
C
= 100 pF.
OUT
4
C
= 50 pF.
OUT
5
Measured from the rising edge of OE/EOCEN (2.0 V) to the time at which the output voltage changes by 0.5. See Figure 4; C
Specifications subject to change without notice.
SC C
t
CR CP AD SD
t
BA
t
FD OD FS OE RP CD EO

ORDERING GUIDE

Model2Package Range Specified Option
Temperature and Package
50 ns
6.3 µs
7.8 µs
0.097 3.0 µs 520ns 0 400 ns 10 100 ns 10 57
4
ns
10 80 ns
0ns 100 ns 20 ns 195 ns 400 ns 50 ns
= 10 pF.
OUT
1
Tested
Figure 1. Conversion Timing
Figure 2. Output Timing
3
AD679JN 28-Pin Plastic DIP 0°C to +70°C AC N-28 AD679KN 28-Pin Plastic DIP 0°C to +70°C AC + DC N-28 AD679JD 28-Pin Ceramic DIP 0°C to +70°C AC D-28 AD679KD 28-Pin Ceramic DIP 0°C to +70°C AC + DC D-28 AD679AD 28-Pin Ceramic DIP –40°C to +85°C AC D-28 AD679BD 28-Pin Ceramic DIP –40°C to +85°C AC + DC D-28 AD679SD 28-Pin Ceramic DIP –55°C to +125°C AC D-28 AD679TD 28-Pin Ceramic DIP –55°C to +125°C AC + DC D-28 AD679AJ 44-Lead Ceramic JLCC –40°C to +85°C AC J-44 AD679BJ 44-Lead Ceramic JLCC –40°C to +85°C AC + DC J-44 AD679SJ 44-Lead Ceramic JLCC –55°C to +125°C AC J-44 AD679TJ 44-Lead Ceramic JLCC –55°C to +125°C AC + DC J-44
NOTES
1
For parallel read (14-bits) interface to 16-bit buses, see AD779.
2
For details grade and package offerings screened in accordance with MIL-STD­883, refer to the Analog Devices Miliary Products Databook or current AD679/ 883B data sheet.
3
N = Plastic DIP; D = Ceramic DIP; J = J-Leaded Ceramic Chip Carrier.
Figure 3. EOC Timing
Figure 4. Load Circuit for Bus Timing Specifications
REV. C–4–
Page 5
ABSOLUTE MAXIMUM RATINGS*
With Respect
Specification To Min Max Units
AD679
With Respect
Specification To Min Max Units
V
CC
V
EE
V
(Note 1) V
CC
V
DD
AGND DGND –1 +1 V AIN, REF
IN
Digital Inputs DGND –0.5 +7 V Digital Outputs DGND –0.5 V Max Junction
Temperature 175 °C
AGND –0.3 +18 V AGND –18 +0.3 V
EE
–0.3 +26.4 V
DGND 0 +7 V
AGND V
EE
V
CC
DD
+ 0.3 V
Operating Temperature
J and K Grades 0 +70 °C A and B Grades –40 +85 °C S and T Grades –55 +125 °C
V
Storage Temperature –65 +150 °C Lead Temperature
(10 sec max) +300 °C
NOTES *Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
1
The AD679 is not designed to operate from ±15 V supplies.
CAUTION
The AD679 features input protection circuitry consisting of large “distributed” diodes and polysilicon series resistors to dissipate both high energy discharges (Human Body Model) and fast, low energy pulses (Charged Device Model). Per Method 3015.2 of MIL-STD-883C, the AD679 has been classified as a Category 1 device.
Proper ESD precautions are strongly recommended to avoid functional damage or performance degradation. Charges as high as 4000 volts readily accumulate on the human body and test equip­ment and discharge without detection. Unused devices must be stored in conductive foam or shunts, and the foam should be discharged to the destination socket before devices are removed. For further information on ESD precautions, refer to Analog Devices’ ESD Prevention Manual.
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
44-Lead J-Leaded Chip Carrier (J-44)28-Pin Ceramic DIP Package (D-28)
WARNING!
ESD SENSITIVE DEVICE
REV. C
28-Lead Plastic DIP Package (N-28)
–5–
Page 6
AD679
PIN DESCRIPTION
28-Pin 44-Lead DIP JLCC
Symbol Pin No. Pin No. Type Name and Function
AGND 7 11 P Analog Ground. This is the ground return for AIN only. AIN 6 10 AI Analog Signal Input. BIPOFF 10 15 AI Bipolar Offset. Connect to AGND for +10 V input unipolar mode and straight
binary output coding. Connect to REF
twos complement binary output coding. CS 4 6 DI Chip Select. Active LOW. DGND 12, 14 23 P Digital Ground. DB7–DB0 26–19 40, 39, 37, 36, DO Data Bits. These pins provide all 14 bits in two bytes (8+6 bits). Active HIGH.
35, 34, 33, 31
EOC 27 42 DO End-of-Convert. EOC goes LOW when a conversion starts and goes HIGH
when the conversion finishes. In asynchronous mode, EOC is an open drain
output and requires an external 3 k pull-up resistor. See
pins for information on EOC gating.
EOCEN 1 1 DI End-of-Convert Enable. Enables EOC pin. Active LOW. HBE 15 25 DI High Byte Enable. If LOW, output contains high byte. If HIGH, output
contains low byte (corresponding to the most recently read high byte).
OE 2 3 DI Output Enable. A down-going transition on OE enables DB7–DB0. Gated with
CS. Active LOW.
REF REF
IN OUT
9 14 AI Reference Input. +5 V input gives 10 V full-scale range.
8 12 AO +5 V Reference Output. Tied to REFIN for normal operation. SC 3 5 DI Start Convert. Active LOW. See SYNC pin for gating. SYNC 13 21 DI SYNC Control. If tied to V
by
CS. If tied to DGND (asynchronous mode), SC and EOCEN are indepen-
dent of
CS, and EOC is an open drain output. EOC requires an external 3 k
(synchronous mode), SC and EOCEN are gated
DD
pull-up resistor in asynchronous mode.
V
CC
V
EE
V
DD
11 17 P +12 V Analog Power.
5 8 P –12 V Analog Power.
28 43 P +5 V Digital Power. — 16 U Tie to DGND. — 17–18 2, 4, 7, 9, 13, U These pins are unused and should be connected to DGND or V
16, 18, 19, 20, 22, 24, 26, 27, 28, 29, 30, 32, 38, 41, 44
Type: AI = Analog Input. AO = Analog Output. DI = Digital Input (TTL and 5 V CMOS compatible). DO = Digital Output (TTL and 5 V CMOS compatible). All DO pins are three-state drivers. P = Power. U = Unused.
for ±5 V input bipolar mode and
OUT
EOCEN and SYNC
.
DD
DIP Package
PIN CONFIGURATION
JLCC Package
REV. C–6–
Page 7
AD679

NYQUIST FREQUENCY

An implication of the Nyquist sampling theorem, the “Nyquist Frequency” of a converter is that input frequency which is one­half the sampling frequency of the converter.

SIGNAL-TO-NOISE AND DISTORTION (S/N+D) RATIO

S/N+D is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc.

TOTAL HARMONIC DISTORTION (THD)

THD is the ratio of the rms sum of the first six harmonic com­ponents to the rms value of a full-scale input signal and is ex­pressed as a percentage or in decibels. For input signals or harmonics that are above the Nyquist frequency, the aliased component is used.

PEAK SPURIOUS OR PEAK HARMONIC COMPONENT

The peak spurious or peak harmonic component is the largest spectral component excluding the input signal and dc. This value is expressed in decibels relative to the rms value of a full­scale input signal.

INTERMODULATION DISTORTION (IMD)

With inputs consisting of sine waves at two frequencies, fa and fb, any device with nonlinearities will create distortion products, of order (m + n), at sum and difference frequencies of mfa ±
nfb, where m, n = 0, 1, 2, 3. . . . Intermodulation terms are
those for which m or n is not equal to zero. For example, the second order terms are (fa + fb) and (fa – fb) and the third or­der terms are (2 fa + fb), (2 fa – fb), (fa + 2 fb) and (fa – 2 fb). The IMD products are expressed as the decibel ratio of the rms sum of the measured input signals to the rms sum of the distor­tion terms. The two signals applied to the converter are of equal amplitude and the peak value of their sum is –0.5 dB from full­scale (9.44 V p-p). The IMD products are normalized to a 0-dB input signal.

BANDWIDTH

The full-power bandwidth is that input frequency at which the amplitude of the reconstructed fundamental is reduced by 3 dB for a full-scale input.
The full-linear bandwidth is the input frequency at which the slew rate limit of the sample-hold-amplifier (SHA) is reached. At this point, the amplitude of the reconstructed fundamental has degraded by less than –0.1 dB. Beyond this frequency, dis­tortion of the sampled input signal increases significantly.
The AD679 has been designed to optimize input bandwidth, al­lowing it to undersample input signals with frequencies signifi­cantly above the converter’s Nyquist frequency.

APERTURE JITTER

Aperture jitter is the variation in aperture delay for successive samples and is manifested as noise on the input to the A/D.

INPUT SETTLING TIME

Settling time is a function of the SHA’s ability to track fast slew­ing signals. This is specified as the maximum time required in track mode after a full-scale step input to guarantee rated con­version accuracy.

DIFFERENTIAL NONLINEARITY (DNL)

In an ideal ADC, code transitions are 1 LSB apart. Differential linearity is the deviation from this ideal value. It is often speci­fied in terms of resolution for which no missing codes (NMC) are guaranteed.

INTEGRAL NONLINEARITY (INL)

The ideal transfer function for a linear ADC is a straight line drawn between “zero” and “full scale.” The point used as “zero” occurs 1/2 LSB before the first code transition. “Full scale” is defined as a level 1 1/2 LSB beyond the last code tran­sition. Integral linearity error is the worst case deviation of a code from the straight line. The deviation of each code is mea­sured from the middle of that code.
Note that the linearity error is not user adjustable.

POWER SUPPLY REJECTION

Variations in power supply will affect the full-scale transition, but not the converter’s linearity. Power Supply Rejection is the maximum change in the full-scale transition point due to a change in power supply voltage from the nominal value.

TEMPERATURE DRIFT

This is the maximum change in the parameter from the initial value (@ +25°C) to the value at T

UNIPOLAR ZERO ERROR

MIN
or T
MAX
.
In unipolar mode, the first transition should occur at a level 1/2 LSB above analog ground. Unipolar zero error is the devia­tion of the actual transition from that point. This error can be adjusted as discussed in the Input Connections and Calibration section.

BIPOLAR ZERO ERROR

In the bipolar mode, the major carry transition (11 1111 1111 1111 to 00 0000 0000 0000 ) should occur at an analog value 1/2 LSB below analog ground. Bipolar zero error is the devia­tion of the actual transition from that point. This error can be adjusted as discussed in the Input Connections and Calibration section.

APERTURE DELAY

Aperture delay is a measure of the SHA’s performance and is measured from the falling edge of Start Convert (
SC) to when the input signal is held for conversion. In synchronous mode, Chip Select (
CS) should be LOW before SC to minimize aper-
ture delay.
REV. C

GAIN ERROR

The last transition should occur at an analog value 1 1/2 LSB below the nominal full scale (9.9991 volts for a 0 V–10 V range,
4.9991 volts for a ±5 V range). The gain error is the deviation of the actual level at the last transition from the ideal level with the zero error trimmed out. This error can be adjusted as shown in the Input Connections and Calibration section.
–7–
Page 8
AD679

CONVERSION CONTROL

In synchronous mode (SYNC = HIGH), both Chip Select (CS) and Start Convert ( version.
CS should be LOW tSC before SC is brought LOW. In
SC) must be brought LOW to start a con-
asynchronous mode (SYNC = LOW), a conversion is started by bringing
SC low, regardless of the state of CS.
Before a conversion is started, End-of-Convert (EOC) is HIGH and the sample-hold is in track mode. After a conversion is started, the sample-hold goes into hold mode and EOC goes LOW, signifying that a conversion is in progress. During the conversion, the sample-hold will go back into track mode and start acquiring the next sample.
In track mode, the sample-hold will settle to ±0.003% (14 bits) in 1.5 µs maximum. The acquisition time does not affect the throughput rate as the AD679 goes back into track mode more than 2 µs before the next conversion. In multichannel systems, the input channel can be switched as soon as EOC goes LOW.
Bringing
OE LOW tOE after CS goes LOW makes the output register contents available on the output data bits (DB7–DB0). A period of time t
is required after OE is brought HIGH be-
CD
fore the next SC instruction is issued.
SC is held LOW, conversion accuracy may deteriorate. For
If this reason,
SC should not be held low in an attempt to operate
in a continuously converting mode.

START CONVERSION TRUTH TABLE

INPUTS
SYNC CS SC STATUS
1 1 X No Conversion
Synchronous 1 0 f Start Conversion
Mode
1 f 0 Start Conversion
(Not Recommended)
1 0 0 Continuous Conversion
(Not Recommended)
0 X 1 No Conversion
Asynchronous 0 X f Start Conversion
Mode 0 X 0 Continuous Conversion
(Not Recommended)
NOTES 1 = HIGH voltage level. 0 = LOW voltage level. X = Don’t care.
= HIGH to LOW transition. Must stay low for t = tCP.

14-BIT MODE CODING FORMAT (1 LSB = 0.61 mV)

END-OF-CONVERT

In asynchronous mode, End-of-Convert (EOC) is an open drain output (requiring a minimum 3 k pull-up resistor) enabled by End-of-Convert Enable ( is a three-state output which is enabled by Conversion Status Truth Table. Access (t
EOCEN). In synchronous mode, EOC
EOCEN and CS. See
) and float (tFD)
BA
timing specifications do not apply in asynchronous mode where they are a function of the time constant formed by the external load capacitance and the pull-up resistor.

OUTPUT ENABLE OPERATION

The data bits (DB7–DB0) are three-state outputs that are en­abled by Chip Select ( be LOW t
before OE is brought LOW.
OE
CS) and Output Enable (OE). CS should
When EOC goes HIGH, the conversion is completed and the output data may be read. The output is read in two steps as a 16-bit word, with the high byte read first, followed by the low byte. High Byte Enable (
HBE) controls the output sequence.
The 14-bit result is left justified within the 16-bit field. In unipolar mode (BIPOFF tied to AGND), the output coding
is straight binary. In bipolar mode (BIPOFF tied to REF
OUT
),
output coding is twos-complement binary.

POWER-UP

The AD679 typically requires 10 µs after power-up to reset in- ternal logic.

CONVERSION STATUS TRUTH TABLE

INPUTS OUTPUT
SYNC CS EOCEN EOC STATUS
1 0 0 0 Converting 1 0 0 1 Not Converting
Synchronous 1 1 X High Z Either
Mode 1 X 1 High Z Either
0 X 0 0 Converting
Asynchronous
0 X 0 High Z Not Converting
Mode* 0 X 1 High Z Either
NOTES 1 = HIGH voltage level. 0 = LOW voltage level. X = Don’t care. *EOC requires a pull-up resistor in asynchronous mode.

OUTPUT ENABLE TRUTH TABLE

INPUTS OUTPUTS
HBE (CS U OE) DB7 . . . DB0
Unipolar Coding Bipolar Coding (Straight Binary) (Twos Complement)
VIN* Output Code VIN* Output Code
0.00000 V 000 . . . 0 –5.00000 V 100 . . . 0
5.00000 V 100 . . . 0 –0.00061 V 111 . . . 1
9.99939 V 111 . . . 1 0.00000 V 000 . . . 0
+2.50000 V 010 . . . 0 +4.99939 V 011 . . . 1
*Code center.
X1 High Z
Unipolar or 0 0 a b c d e f g h Bipolar 1 0 i j k l m n 0 0
NOTES 1 = HIGH voltage level. a = MSB. 0 = LOW voltage level. n = LSB. X = Don’t care. U = Logical OR. Data coding is binary for Unipolar Mode and 2s Complement Binary for Bipolar Mode.
REV. C–8–
Page 9
AD679

INPUT CONNECTIONS AND CALIBRATION

The high (10 M) input impedance of the AD679 eases the task of interfacing to high source impedances or multiplexer channel-to-channel mismatches of up to 300 . The 10 V p-p full-scale input range accepts the majority of signal voltages without the need for voltage divider networks which could dete­riorate the accuracy of the ADC.
The AD679 is factory trimmed to minimize offset, gain and lin­earity errors. In unipolar mode, the only external component that is required is a 50 ±1% resistor. Two resistors are re­quired in bipolar mode. If offset and gain are not critical (as in some ac applications), even these components can be eliminated.
In some applications, offset and gain errors need to be trimmed out completely. The following sections describe the correct pro­cedure for these various situations.

BIPOLAR RANGE INPUTS

The connections for the bipolar mode are shown in Figure 5. In this mode, data output coding will be twos complement binary. This circuit will allow approximately ± 25 mV of offset trim range (±40 LSB) and ±0.5% of gain trim range (±80 LSB).
Either or both of the trim pots can be replaced with 50 ±1% fixed resistors if the AD679 accuracy limits are sufficient for ap­plication. If the pins are shorted together, the additional offset and gain errors will be approximately 80 LSB.
To trim bipolar zero to its nominal value, apply a signal 1/2 LSB below midrange (–0.305 mV for a ± 5 V range) and adjust R1 until the major carry transition is located (11 1111 1111 1111 to 00 0000 0000 0000). To trim the gain, apply a signal 1 1/2 LSB below full scale (+4.9991 V for a ±5 V range) and adjust R2 to give the last positive transition (01 1111 1111 1110 to 01 1111 1111 1111). These trims are interactive so several iterations may be necessary for convergence.
A single pass calibration can be done by substituting a bipolar offset trim (error at minus full scale) for the bipolar zero trim (error at midscale), using the same circuit. First, apply a signal 1/2 LSB above minus full scale (–4.9997 V for a ± 5 V range) and adjust R1 until the minus full-scale transition is located (10 0000 0000 0000 to 10 000 000 0001). Then perform the gain error trim as outlined above.

UNIPOLAR RANGE INPUTS

Offset and gain errors can be trimmed out by using the configu­ration shown in Figure 6. This circuit allows approximately ±25 mV of offset trim range (±40 LSB) and ±0.5% of gain trim range (±80 LSB).
The nominal offset is 1/2 LSB so that the analog range that cor­responds to each code will be centered in the middle of that code (halfway between the transitions to the codes above and below it). Thus the first transition (from 00 0000 0000 0000 to 00 0000 0000 0001) should nominally occur for an input level of +1/2 LSB (0.305 mV above ground for a 10 V range). To trim unipolar zero to this nominal value, apply a 0.305 mV sig­nal to AIN and adjust R1 until the first transition is located.
The gain trim is done by adjusting R2. If the nominal value is required, apply a signal 1 1/2 LSB below full scale (9.9997 V for a 10 V range) and adjust R2 until the last transition is located (11 1111 1111 1110 to 11 1111 1111 1111).
If offset adjustment is not required, BIPOFF should be con­nected directly to AGND. If gain adjustment is not required, R2 should be replaced with a fixed 50 ±1% metal film resistor. If REF
is connected directly to REFIN, the additional gain
OUT
error will be approximately 1%.
Figure 6. Unipolar Input Connections with Gain and Offset Trims

REFERENCE DECOUPLING

It is recommended that a 10 µF tantalum capacitor be con- nected between REF
(Pin 9) and ground. This has the effect
IN
of improving the S/N+D ratio through filtering possible broad­band noise contributions from the voltage reference.
Figure 5. Bipolar Input Connections with Gain and Offset Trims
REV. C

BOARD LAYOUT

Designing with high resolution data converters requires careful attention to board layout. Trace impedance is a significant issue. A 1.22 mA current through a 0.5 trace will develop a voltage drop of 0.6 mV, which is 1 LSB at the 14 bit level for a 10 V full-scale span. In addition to ground drops, inductive and ca­pacitive coupling need to be considered, especially when high accuracy analog signals share the same board with digital sig­nals. Finally, power supplies need to be decoupled in order to filter out ac noise.
Analog and digital signals should not share a common path. Each signal should have an appropriate analog or digital return routed close to it. Using this approach, signal loops enclose a small area, minimizing the inductive coupling of noise. Wide PC tracks, large gauge wire, and ground planes are highly recom­mended to provide low impedance signal paths. Separate analog
–9–
Page 10
AD679
and digital ground planes are also desirable, with a single inter­connection point to minimize ground loops. Analog signals should be routed as far as possible from digital signals and should cross them at right angles.
The AD679 incorporates several features to help the user’s lay­out. Analog pins (V V
) are adjacent to help isolate analog from digital signals. In
CC
, AIN, AGND, REF
EE
, REFIN, BIPOFF,
OUT
addition, the 10 Minput impedance of AIN minimizes input trace impedance errors. Finally, ground currents have been minimized by careful circuit architecture. Current through AGND is 200 µA, with no code dependent variation. The cur- rent through DGND is dominated by the return current for DB7–DB0 and EOC.

SUPPLY DECOUPLING

The AD679 power supplies should be well filtered, well regu­lated, and free from high frequency noise. Switching power sup­plies are not recommended due to their tendency to generate spikes which can induce noise in the analog system.
Decoupling capacitors should be used in very close layout prox­imity between all power supply pins and analog ground. A 10 µF tantalum capacitor in parallel with a 0.1 µF ceramic capacitor provides adequate decoupling.
An effort should be made to minimize the trace length between the capacitor leads and the respective converter power supply and common pins. The circuit layout should attempt to locate the AD679, associated analog input circuitry and interconnec­tions as far as possible from logic circuitry. A solid analog ground plane around the AD679 will isolate large switching ground currents. For these reasons, the use of wire wrap circuit construction is not recommended; careful printed circuit con­struction is preferred.

GROUNDING

If a single AD679 is used with separate analog and digital ground planes, connect the analog ground plane to AGND and the digital ground plane to DGND keeping lead lengths as short as possible. Then connect AGND and DGND together at the AD679. If multiple AD679s are used or the AD679 shares ana­log supplies with other components, connect the analog and digital returns together once at the power supplies rather than at each chip. This prevents large ground loops which inductively couple noise and allow digital currents to flow through the ana­log system.
tial value at 25°C. REF
(Pin 9) scales its input by a factor of
IN
two; thus, this change becomes effectively 4.5 mV. When ap­plied to the AD679, this results in a total gain drift of 0.09% FSR, which is an improvement over the on-chip reference per­formance of 0.11% FSR. A noise-reduction capacitor, C
, has
N
been shown. This capacitor reduces the broadband noise of the AD586 out-
put, thereby optimizing the overall ac and dc performance of the AD679.
Figure 7. Bipolar Input with Gain and Offset Trims
Figure 8 shows the AD679 in unipolar input mode with the AD588 reference. The AD588 output is accurate to 0.65 mV from its value at 25°C over the 0°C to 70°C range. This results in a 0.06% FSR total gain drift for the AD679, which is a sub­stantial improvement over the on-chip reference performance of
0.11% FSR. A noise-reduction network on Pins 4, 6 and 7 has been shown. The 1 µF capacitors form low pass filters with the internal resistance of the AD588 Zener and amplifier cells and external resistance. This reduces the high frequency (to 1 MHz) noise of the AD588, providing optimum ac and dc performance of the AD679.

USE OF EXTERNAL VOLTAGE REFERENCE

The AD679 features an on-chip voltage reference. For improved gain accuracy over temperature, a high performance external voltage reference may be used in place of the on-chip reference.
The AD586 and AD588 are popular references appropriate for use with high resolution converters. The AD586 is a low cost reference which utilizes a buried Zener architecture to provide low noise and drift. The AD588 is a higher performance refer­ence which uses a proprietary implanted buried Zener diode in conjunction with laser-trimmed thin-film resistors for low offset and low drift.
Figure 7 shows the use of the AD586 with the AD679 in a bipo­lar input mode. Over the 0°C to +70°C range, the AD586 L-grade exhibits less than a 2.25 mV output change from its ini-
Figure 8. Unipolar Input with Gain and Offset Trims

INTERFACING THE AD679 TO MICROPROCESSORS

The I/O capabilities of the AD679 allow direct interfacing to general purpose and DSP microprocessor buses. The asynchro­nous conversion control feature allows complete flexibility and control with minimal external hardware.
REV. C–10–
Page 11
AD679
The following examples illustrate typical AD679 interface configurations.
AD679 to TMS320C25
In Figure 9 the AD679 is mapped into the TMS320C25 I/O space. AD679 conversions are initiated by issuing an OUT in­struction to Port 1. EOC status and the conversion result are read in with an IN instruction to Port 1. A single wait state is in­serted by generating the processor READY input from 1 and
MSC. Address line A0 provides HBE decoding to select between the high and low bytes of data. This configuration sup­ports processor clock speeds of 20 MHz and is capable of sup­porting processor clock speeds of 40 MHz if a NOP instruction follows each AD679 read instruction.
Figure 9. AD679 to TMS320C25 Interface
AD679 to 80186
Figure 10 shows the AD679 interfaced to the 80186 micropro­cessor. This interface allows the 80186’s built-in DMA control­ler to transfer the AD679 output into a RAM based FIFO buffer of any length, with no microprocessor intervention.
In this application the AD679 is configured in the asynchronous mode, which allows conversions to be initiated by an external trigger source independent of the microprocessor clock. After each conversion, the AD679 EOC signal generates a DMA re­quest to Channel 1 (DRQ1). The subsequent DMA READ se­quences the high and low byte AD679 data and resets the interrupt latch. The system designer must assign a sufficient pri­ority to the DMA channel to ensure that the DMA request will be serviced before the completion of the next conversion. This configuration can be used with 6 MHz and 8 MHz 80186 processors.
IS, Port
one 80 ns cycle, the digital signal processor supports the AD679 interface with one wait state.
The converter is configured to run asynchronously using a sam­pling clock. The EOC output of the AD679 gets asserted at the end of each conversion and causes an interrupt. Upon interrupt, the ADSP-2101 immediately asserts its FO pin LOW. In the following cycle, the processor starts a data memory read by pro­viding an address on the DMA bus. The decoded address gener-
OE for the converter, and the high byte of the conversion
ates result is read over the data bus. The read operation is extended with one wait state and thus started and completed within two processor cycles (160 ns). Next, the ADSP-2101 asserts its FO HIGH. This allows the processor to start reading the lower byte of data. This read operation executes in a similar manner to the first and is completed during the next 160 ns.
Figure 11. AD679 to ADSP-2101 Interface
AD679 to Analog Devices ADSP-2100A
Figure 12 demonstrates the AD679 interfaced to an ADSP-2100A. With a clock frequency of 12.5 MHz, and instruction execution in one 80 ns cycle, the digital signal processor will support the AD679 data memory interface with three hardware wait states.
The converter is configured to run asynchronously using a sam­pling clock. The EOC output of the AD679 gets asserted at the end of each conversion and causes an interrupt. Upon interrupt, the ADSP-2100A immediately executes a data memory write in­struction which asserts sor starts a data memory read (high byte read) by providing an address on the DMA bus. The decoded address generates for the converter. force the ADSP-2100A into a one cycle wait state by generating DMACK. The read operation is thus started and completed within two processor cycles (160 ns). “high byte read.” This allows the processor to read the lower byte of data as soon as “high byte read” is complete. The low byte read operation executes in a similar manner to the first and is completed during the next 160 ns.
HBE. In the following cycle, the proces-
OE
OE, together with logic and latch, is used to
HBE is released during
Figure 10. AD679 to 80186 DMA Interface
AD679 to Analog Devices ADSP-2101
Figure 11 demonstrates the AD679 interfaced to an ADSP-2101. With a clock frequency of 12.5 MHz, and instruction execution in
REV. C
–11–
Figure 12. AD679 to ADSP-2100A Interface
Page 12
AD679
C1419a–5–3/92
Figure 13. Harmonic Distortion vs. Input Frequency (–0.5 dB Input)
Figure 14. Total Harmonic Distortion vs. Input Frequency and Amplitude
Figure 16. 5-Plot Averaged 2048 Point FFT at 128 kSPS, f
= 10.009 kHz
IN
Figure 17. Nonaveraged IMD Plot for fIN = 9.08 kHz (fa), 9.58 kHz (fb) at 128 kSPS
Figure 15. S/(N+D) vs. Input Frequency and Amplitude
Figure 18. Power Supply Rejection (fIN = 10 kHz, f
SAMPLE
= 128 kSPS, V
= 0.1 V p-p)
RIPPLE
PRINTED IN U.S.A.
REV. C–12–
Loading...