FEATURES
Complete 8-Bit Signal Conditioning A/D Converter
Including Instrumentation Amp and Reference
Microprocessor Bus Interface
10 ms Conversion Speed
Flexible Input Stage: Instrumentation Amp Front End
Provides Differential Inputs and High Common-Mode
Rejection
No User Trims Required
No Missing Codes Over Temperature
Single +5 V Supply Operation
Convenient Input Ranges
20-Pin DIP or Surface-Mount Package
Low Cost Monolithic Construction
MIL-STD-883B Compliant Versions Available
GENERAL DESCRIPTION
The AD670 is a complete 8-bit signal conditioning analogto-digital converter. It consists of an instrumentation amplifier
front end along with a DAC, comparator, successive approximation register (SAR), precision voltage reference, and a threestate output buffer on a single monolithic chip. No external
components or user trims are required to interface, with full
accuracy, an analog system to an 8-bit data bus. The AD670
will operate on the +5 V system supply. The input stage provides differential inputs with excellent common-mode rejection
and allows direct interface to a variety of transducers.
The device is configured with input scaling resistors to permit
two input ranges: 0 mV to 255 mV (1 mV/LSB) and 0 to 2.55 V
(10 mV/LSB). The AD670 can be configured for both unipolar
and bipolar inputs over these ranges. The differential inputs and
common-mode rejection of this front end are useful in applications such as conversion of transducer signals superimposed on
common-mode voltages.
The AD670 incorporates advanced circuit design and proven
processing technology. The successive approximation function
is implemented with I
SiCr resistors provide the stability required to prevent missing
codes over the entire operating temperature range while laser
wafer trimming of the resistor ladder permits calibration of the
device to within ±1 LSB. Thus, no user trims for gain or offset
are required. Conversion time of the device is 10 µs.
The AD670 is available in four package types and five grades.
The J and K grades are specified over 0°C to +70°C and come
in 20-pin plastic DIP packages or 20-terminal PLCC packages.
The A and B grades (–40°C to +85°C) and the S grade (–55°C
to +125°C) come in 20-pin ceramic DIP packages.
2
L (integrated injection logic). Thin-film
Conditioning 8-Bit ADC
AD670
FUNCTIONAL BLOCK DIAGRAM
The S grade is also available with optional processing to
MIL-STD-883 in 20-pin ceramic DIP or 20-terminal LCC
packages. The Analog Devices Military Products Databook
should be consulted for detailed specifications.
PRODUCT HIGHLIGHTS
1. The AD670 is a complete 8-bit A/D including three-state
outputs and microprocessor control for direct connection to
8-bit data buses. No external components are required to
perform a conversion.
2. The flexible input stage features a differential instrumentation amp input with excellent common-mode rejection. This
allows direct interface to a variety of transducers without
preamplification.
3. No user trims are required for 8-bit accurate performance.
4. Operation from a single +5 V supply allows the AD670 to
run off of the microprocessor’s supply.
5. Four convenient input ranges (two unipolar and two bipolar)
are available through internal scaling resistors: 0 mV to
255 mV (1 mV/LSB) and 0 V to 2.55 V (10 mV/LSB).
6. Software control of the output mode is provided. The user
can easily select unipolar or bipolar inputs and binary or 2s
complement output codes.
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700Fax: 617/326-8703
Page 2
AD670–SPECIFICATIONS
(@ VCC = +5 V and
+258C,
unless otherwise noted)
ModelAD670JAD670K
MinTypMaxMinTypMaxUnits
OPERATING TEMPERATURE RANGE0+700+70°C
RESOLUTION88Bit
CONVERSION TIME1010µs
RELATIVE ACCURACY61/261/4LSB
T
to T
MIN
MAX
DIFFERENTIAL LINEARITY ERROR
T
to T
MIN
MAX
1
GUARANTEED NO MISSING CODES ALL GRADES
6l/261/2LSB
GAIN ACCURACY
@ +25°C61.560.75LSB
T
MIN
to T
MAX
62.061.0LSB
UNIPOLAR ZERO ERROR
@ +25°C61.560.75LSB
T
MIN
to T
MAX
62.061.0LSB
BIPOLAR ZERO ERROR
@ +25°C61.560.75LSB
T
MIN
to T
MAX
62.061.0LSB
ANALOG INPUT RANGES
DIFFERENTIAL (–VIN to +VIN)
Low Range0 to +2550 to +255mV
–128 to +127–128 to +127mV
High Range0 to +2.550 to +2.55V
–1.28 to +1.27–1.28 to +1.27V
ABSOLUTE (Inputs to Power GND)
Low Range T
High Range T
MIN
MIN
to T
to T
MAX
MAX
–0.150V
–1.50V
– 3.4–0.150V
CC
CC
–1.50V
– 3.4V
CC
CC
V
BIAS CURRENT (255 mV RANGE)
T
MIN
to T
MAX
200500200500nA
OFFSET CURRENT (255 mV RANGE)
T
MIN
to T
MAX
4020040200nA
2.55 V RANGE INPUT RESISTANCE8.012.08.012.0kΩ
2.55 V RANGE FULL-SCALE MATCH
+ AND – INPUT±1/2±1/2LSB
COMMON-MODE REJECTION
RATIO (255 mV RANGE)11LSB
COMMON-MODE REJECTION
RATIO (2.55 V RANGE)11LSB
POWER SUPPLY
Operating Range4.55.54.55.5V
Current I
CC
Rejection Ratio T
MIN
to T
MAX
30453045mA
0.0150.015% of FS/%
DIGITAL OUTPUTS
SINK CURRENT (V
T
to T
MIN
MAX
SOURCE CURRENT (V
T
to T
MIN
MAX
= 0.4 V)
OUT
= 2.4 V)
OUT
1.61.6mA
0.50.5mA
THREE-STATE LEAKAGE CURRENT640640µA
OUTPUT CAPACITANCE55pF
DIGITAL INPUT VOLTAGE
V
INL
V
INH
2.02.0V
0.80.8V
DIGITAL INPUT CURRENT
(0 ≤ VIN ≤ +5 V)
I
I
INL
INH
–100–100µA
+100+100µA
INPUT CAPACITANCE1010pF
NOTES
1
Tested at VCC = 4 5 V, 5.0 V and 5.5 V.
Specifications shown in boldface are tested on all production units at final electrical test. Results from those tests are used to calculate outgoing quality levels. All min and max specifications
are guaranteed although only those shown in boldface are tested on all production units.
Specifications subject to change without notice.
–2–
REV. A
Page 3
AD670
ModelAD670AAD670BAD670S
MinTypMaxMinTypMaxMinTypMaxUnits
OPERATING TEMPERATURE RANGE–40+85–40+85–55+125°C
RESOLUTION888Bit
CONVERSION TIME101010µs
RELATIVE ACCURACY61/261/461/2LSB
T
to T
MIN
MAX
DIFFERENTIAL LINEARITY ERROR
T
to T
MIN
MAX
1
GAIN ACCURACY
@ +25°C61.560.7561.5LSB
T
to T
MIN
MAX
UNIPOLAR ZERO ERROR
@ +25°C61.060.561.0LSB
T
to T
MIN
MAX
BIPOLAR ZERO ERROR
@ +25°C61.060.561.0LSB
T
to T
MIN
MAX
ANALOG INPUT RANGES
DIFFERENTIAL ( –VIN to +VIN)
Low Range0 to +2550 to +2550 to +255mV
–128 to +127–128 to +127–128 to +127mV
High Range0 to +2.550 to +2.550 to +2.55V
–1.28 to +1.27–1.28 to +1.27–1.28 to +1.27V
ABSOLUTE (Inputs to Power GND)
Low Range T
High Range T
MIN
MIN
to T
to T
MAX
MAX
–0.150VCC – 3.5 –0.150V
–1.50V
BIAS CURRENT (255 mV RANGE)
T
MIN
to T
MAX
200500200500200750nA
OFFSET CURRENT (255 mV RANGE)
T
MIN
to T
MAX
402004020040200nA
2.55 V RANGE INPUT RESISTANCE8.012.08.012.08.012.0kΩ
2.55 V RANGE FULL-SCALE MATCH
+ AND – INPUT±1/2±1/2±1/2LSB
COMMON-MODE REJECTION
RATIO (255 mV RANGE)111LSB
COMMON-MODE REJECTION
RATIO (2.55 V RANGE)111LSB
POWER SUPPLY
Operating Range4.55.54.55.54.755.5V
Current I
CC
Rejection Ratio T
MIN
to T
MAX
304530453045mA
DIGITAL OUTPUTS
SINK CURRENT (V
T
to T
MIN
MAX
SOURCE CURRENT (V
T
to T
MIN
MAX
= 0.4 V)
OUT
= 2.4 V)
OUT
1.61.61.6mA
0.50.50.5mA
THREE-STATE LEAKAGE CURRENT640640640µA
OUTPUT CAPACITANCE555pF
DIGITAL INPUT VOLTAGE
V
INL
V
INH
2.02.02.0V
DIGITAL INPUT CURRENT
(0 ≤ VIN ≤ +5 V)
I
I
INL
INH
–100–100–100µA
INPUT CAPACITANCE101010pF
NOTES
1
Tested at VCC = 4.5 V, 5.0 V and 5.5 V for A, B grades; 4.75 V, 5.0 V and 5.5 V for S grade.
Specifications shown in boldface are tested on all production units at final electrical test. Results from those tests are used to calculate outgoing quality levels. All min and max specifications
are guaranteed, although only those shown in boldface are tested on all production units.
Specifications subject to change without notice.
61/261/261LSB
GUARANTEED NO MISSING CODES ALL GRADES
62.561.562.5LSB
62.061.062.0LSB
62.061.062.0LSB
CC
–1.50V
– 3.5 –0.150V
CC
CC
–1.50V
– 3.5 V
CC
CC
V
0.0150.0150.015% of FS/%
0.80.80.7V
+100+100+ 100µA
REV. A
–3–
Page 4
AD670
Figure 1. AD670 Block Diagram and Terminal
Configuration (AII Packages)
ABSOLUTE MAXIMUM RATINGS*
VCC to Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V to +7.5 V
Digital Inputs (Pins 11–15) . . . . . . . . . . . –0.5 V to V
Digital Outputs (Pins 1–9) . Momentary Short to V
Analog Inputs (Pins 16–19) . . . . . . . . . . . . . . . –30 V to +30 V
Storage Temperature Range . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . . +300°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at them or any other conditions above those indicated in
the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
AD670JN0°C to +70°C±1/2 LSB±1.5 LSBPlastic DIP (N-20)
AD670JP0°C to +70°C±1/2 LSB±1.5 LSBPLCC (P-20A)
AD670KN0°C to +70°C±1/4 LSB±0.75 LSBPlastic DIP (N-20)
AD670KP0°C to +70°C±1/4 LSB±0.75 LSBPLCC (P-20A)
AD670AD–40°C to +85°C±1/2 LSB±1.5 LSBCeramic DIP (D-20)
AD670BD–40°C to +85°C±1/4 LSB±0.75 LSBCeramic DIP (D-20)
AD670SD–55°C to +125°C±1/2 LSB±1.5 LSBCeramic DIP (D-20)
NOTES
1
For details on grade and package offerings screened in accordance with MIL-STD-883 refer to the Analog Devices
Military Products Databook.
2
D = Ceramic DIP; N = Plastic DIP; P = Plastic Leaded Chip Carrier.
CIRCUIT OPERATION/FUNCTIONAL DESCRIPTION
The AD670 is a functionally complete 8-bit signal conditioning
A/D converter with microprocessor compatibility. The input
section uses an instrumentation amplifier to accomplish the
voltage to current conversion. This front end provides a high
impedance, low bias current differential amplifier. The common-mode range allows the user to directly interface the device
to a variety of transducers.
The AID conversions are controlled by R/
R/
W line directs the converter to read or start a conversion. A
minimum write/start pulse of 300 ns is required on either
W, CS, and CE. The
CE or
CS. The STATUS line goes high, indicating that a conversion is
in process. The conversion thus begun, the internal 8-bit DAC
is sequenced from MSB to LSB using a novel successive approximation technique. In conventional designs, the DAC is
stepped through the bits by a clock. This can be thought of as a
static design since the speed at which the DAC is sequenced is
determined solely by the clock. No clock is used in the AD670.
Instead, a “dynamic SAR” is created consisting of a string of inverters with taps along the delay line. Sections of the delay line
between taps act as one shots. The pulses are used to set and reset the DAC’s bits and strobe the comparator. When strobed,
the comparator then determines whether the addition of each
successively weighted bit current causes the DAC current sum
to be greater or less than the input current. If the sum is less,
the bit is turned off. After all bits are tested, the SAR holds an
8-bit code representing the input signal to within 1/2 LSB
2
accuracy. Ease of implementation and reduced dependence on
process related variables make this an attractive approach to a
successive approximation design.
The SAR provides an end-of-conversion signal to the control
logic which then brings the STATUS line low. Data outputs remain in a high impedance state until R/
W is brought high with
CE and CS low and allows the converter to be read. Bringing
CE or CS high during the valid data period ends the read cycle.
The output buffers cannot be enabled during a conversion. Any
convert start commands will be ignored until the conversion
cycle is completed; once a conversion cycle has been started it
cannot be stopped or restarted.
The AD670 provides the user with a great deal of flexibility by
offering two input spans and formats and a choice of output
codes. Input format and input range can each be selected. The
BPO/
UPO pin controls a switch which injects a bipolar offset
current of a value equal to the MSB less 1/2 LSB into the summing node of the comparator to offset the DAC output. Two
precision 10 to 1 attenuators are included on board to provide
input range selection of 0 V to 2.55 V or 0 mV to 255 mV. Additional ranges of –1.28 V to 1.27 V and –128 mV to 127 mV
are possible if the BPO/
UPO switch is high when the conversion
is started. Finally, output coding can be chosen using the FORMAT pin when the conversion is started. In the bipolar mode
and with a Logic 1 on FORMAT, the output is in two’s complement; with a Logic 0, the output is offset binary.
–4–
REV. A
Page 5
CONNECTING THE AD670
The AD670 has been designed for ease of use. All active components required to perform a complete A/D conversion are on
board and are connected internally. In addition, all calibration
trims are performed at the factory, assuring specified accuracy
without user trims. There are, however, a number of options
and connections that should be considered to obtain maximum
flexibility from the part.
INPUT CONNECTIONS
Standard connections are shown in the figures that follow. An
input range of 0 V to 2.55 V may be configured as shown in Figure 2a. This will provide a one LSB change for each 10 mV of
input change. The input range of 0 mV to 255 mV is configured
as shown in Figure 2b. In this case, each LSB represents 1 mV
of input change. When unipolar input signals are used, Pin 11,
BPO/
UPO, should be grounded. Pin 11 selects the input format
for either unipolar or bipolar signals. Figures 3a and 3b show
the input connections for bipolar signals. Pin 11 should be tied
to +V
for bipolar inputs.
CC
Although the instrumentation amplifier has a differential input,
there must be a return path to ground for the bias currents. If it
is not provided, these currents will charge stray capacitances
and cause internal circuit nodes to drift uncontrollably causing
the digital output to change. Such a return path is provided in
Figures 2a and 3a (larger input ranges) since the 1k resistor leg
is tied to ground. This is not the case for Figures 2b and 3b (the
lower input ranges). When connecting the AD670 inputs to
floating sources, such as transformers and ac-coupled sources,
there must still be a dc path from each input to common. This
can be accomplished by connecting a 10 kΩ resistor from each
input to ground.
2a. 0 V to 2.55 V (10 mV/LSB)
2b. 0 mV to 255 mV (1 mV/LSB)
NOTE: PIN 11, BPO/UPO SHOULD BE LOW WHEN
CONVERSION IS STARTED.
AD670
3a.±1.28 V Range
3b.±128 mV Range
NOTE: PIN 11, BPO/UPO SHOULD BE HIGH WHEN
CONVERSION IS STARTED.
Figure 3. Bipolar Input Connections
Bipolar Operation
Through special design of the instrumentation amplifier, the
AD670 accommodates input signal excursions below ground,
even though it operates from a single 5 V supply. To the user,
this means that true bipolar input signals can be used without
the need for any additional external components. Bipolar signals
can be applied differentially across both inputs, or one of the inputs can be grounded and a bipolar signal applied to the other.
Common-Mode Performance
The AD670 is designed to reject dc and ac common-mode voltages. In some applications it is useful to apply a differential input signal V
V
. The user must observe the absolute input signal limits
CM
listed in the specifications, which represent the maximum voltage V
IN
ing proper operation. Exceeding these limits (within the range of
absolute maximum ratings), however, will not cause permanent
damage.
The excellent common-mode rejection of the AD670 is due to
the instrumentation amplifier front end, which maintains the
differential signal until it reaches the output of the comparator.
In contrast to a standard operational amplifier, the instrumentation amplifier front end provides significantly improved CMRR
over a wide frequency range (Figure 4a).
in the presence of a dc common-mode voltage
IN
+ VCM that can be applied to either input without affect-
REV. A
Figure 2. Unipolar Input Connections
–5–
Page 6
AD670
Table I. AD670 Input Selection/Output Format Truth Table
Good common-mode performance is useful in a number of situations. In bridge-type transducer applications, such performance
facilitates the recovery of differential analog signals in the presence of a dc common-mode or a noisy electrical environment.
High frequency CMRR also becomes important when the analog signal is referred to a noisy, remote digital ground. In each
case, the CMRR specification of the AD670 allows the integrity
of the input signal to be preserved.
The AD670’s common-mode voltage tolerance allows great
flexibility in circuit layout. Most other A/D converters require
the establishment of one point as the analog reference point.
This is necessary in order to minimize the effects of parasitic
voltages. The AD670, however, eliminates the need to make the
analog ground reference point and A/D analog ground one and
the same. Instead, a system such as that shown in Figure 4b is
possible as a result of the AD670’s common-mode performance.
The resistors and inductors in the ground return represent unavoidable system parasitic impedances.
Input/Output Options
Data output coding (2s complement vs. straight binary) is
selected using Pin 12, the FORMAT pin. The selection of
input format (bipolar vs. unipolar) is controlled using Pin 11,
BPO/
UPO. Prior to a write/convert, the state of FORMAT and
BPO/
UPO should be available to the converter. These lines may
be tied to the data bus and may be changed with each conversion if desired. The configurations are shown in Table I. Output
coding for representative signals in each of these configurations
is shown in Figure 5.
An output signal, STATUS, indicates the status of the conversion. STATUS goes high at the beginning of the conversion and
returns low when the conversion cycle has been completed.
Because of its precise factory calibration, the AD670 is intended
to be operated without user trims for gun and offset; therefore,
no provisions have been made for such user trims. Figures 6a,
6b, and 6c show the transfer curves at zero and full scale for the
unipolar and bipolar modes. The code transitions are positioned
so that the desired value is centered at that code. The first LSB
transition for the unipolar mode occurs for an input of +1/2 LSB
(5 mV or 0.5 mV). Similarly, the MSB transition for the bipolar
mode is set at –1/2 LSB (–5 mV or –0.5 mV). The full scale
transition is located at the full scale value –1 1/2 LSB. These
values are 2.545 V and 254.5 mV.
6a. Unipolar Transfer Curve
–6–
REV. A
Page 7
6b. Bipolar
6c. Full Scale (Unipolar)
Figure 6. Transfer Curves
CONTROL AND TIMING OF THE AD670
Control Logic
The AD670 contains on-chip logic to provide conversion and
data read operations from signals commonly available in microprocessor systems. Figure 7 shows the internal logic circuitry of
the AD670. The control signals,
CE, CS, and R/W control the
operation of the converter. The read or write function is determined by R/
W when both CS and CE are low as shown in
Table II. If all three control inputs are held low longer than the
conversion time, the device will continuously convert until one
input,
CE, CS, or R/W is brought high. The relative timing of
these signals is discussed later in this section.
AD670
Figure 7. Control Logic Block Diagram
Table II. AD670 Control Signal Truth Table
R/WCSCEOPERATION
000WRITE/CONVERT
100READ
XX1NONE
X1XNONE
Timing
The AD670 is easily interfaced to a variety of microprocessors
and other digital systems. The following discussion of the timing
requirements of the AD670 control signals will provide the designer with useful insight into the operation of the device.
Write/Convert Start Cycle
Figure 8 shows a complete timing diagram for the write/convert
start cycle.
and are interchangeable signals. Both
for the converter to read or start a conversion. The minimum
pulse width, t
conversion.
CS (chip select) and CE (chip enable) are active low
CS and CE must be low
, on either CS or CE is 300 ns to start a
W
REV. A
Table III. AD670 TIMING SPECIFICATIONS
@ +258C
SymbolParameterMinTypMaxUnits
WRITE/CONVERT START MODE
t
W
t
DS
t
DH
t
RWC
t
DC
t
C
READ MODE
t
R
t
SD
t
TD
t
DH
t
DT
t
RT
Boldface indicates parameters tested 100% unless otherwise noted. See Specifications page for explanation.
Write/Start Pulse Width300ns
Input Data Setup Time200ns
Input Data Hold10ns
Read/Write Setup Before Control0ns
Delay to Convert Start700ns
Conversion Time10µs
Read Time250ns
Delay from Status Low to Data Read250ns
Bus Access Time200250ns
Data Hold Time25ns
Output Float Delay150ns
R/W before CE or CS low0ns
–7–
Page 8
AD670
Figure 8. Write/Convert Start Timing
The R/W line is used to direct the converter to start a conversion (R/
ing of the three control signals (R/
However, when all three signals remain low for at least 300 ns
(t
place.
Once a conversion is started and the STATUS line goes high,
convert start commands will be ignored until the conversion
cycle is complete. The output data buffer cannot be enabled
during a conversion.
Read Cycle
Figure 9 shows the timing for the data read operation. The data
outputs are in a high impedance state until a read cycle is initiated. To begin the read cycle, R/
read cycle, the minimum pulse length for
tion of the length of time required for the output data to be
valid. The data becomes valid and is available to the data bus in
a maximum of 250 ns. This delay between the high impedance
state and valid data is the maximum bus access time or t
Bringing
The outputs remain valid for a minimum of 25 ns (t
turn to the high impedance state after a delay, t
maximum.
W low) or read data (R/W high). The relative sequenc-
W, CE, CS) is unimportant.
), STATUS will go high to signal that a conversion is taking
W
W is brought high. During a
CE and CS is a func-
.
TD
CE or CS high during valid data ends the read cycle.
) and re-
DH
, of 150 ns
DT
STAND-ALONE OPERATION
The AD670 can be used in a “stand-alone” mode, which is useful in systems with dedicated input ports available. Two typical
conditions are described and illustrated by the timing diagrams
which follow.
Single Conversion, Single Read
When the AD670 is used in a stand-alone mode, CS and CE
should be tied together. Conversion will be initiated by bringing
R/
W low. Within 700 ns, a conversion will begin. The R/W
pulse should be brought high again once the conversion has
started so that the data will be valid upon completion of the
conversion. Data will remain valid until
high to indicate the end of the read cycle or R/
CE and CS are brought
W goes low. The
timing diagram is shown in Figure 10.
Figure 10. Stand-Alone Mode Single Conversion/
Single Read
Continuous Conversion, Single Read
A variety of applications may call for the A/D to be read after
several conversions. In process control systems, this is often the
case since a reading from a sensor may only need to be updated
every few conversions. Figure 11 shows the timing relationships.
Once again,
will begin when the R/
CE and CS should be tied together. Conversion
W signal is brought low. The device will
convert repeatedly as indicated by the status line. A final conversion will take place once the R/
The rising edge of R/
W must occur while STATUS is high. R/W
W line has been brought high.
should not return high while STATUS is low since the circuit is
in a reset state prior to the next conversion. Since the rising
edge of R/
must be a minimum of 10.25 µs (t
W must occur while STATUS is high, R/W’s length
+ tTD). Data becomes valid
C
upon completion of the conversion and will remain so until the
CE and CS lines are brought high indicating the end of the read
cycle or R/
W goes low initiating a new series of conversions.
Figure 9. Read Cycle Timing
Figure 11. Stand-Alone Mode Continuous Conversion/
Single Read
–8–
REV. A
Page 9
APPLYING THE AD670
The AD670 has been designed for ease of use, system compatibility, and minimization of external components. Transducer
interfaces generally require signal conditioning and preamplification before the signal can be converted. The AD670 will
reduce and even eliminate this excess circuitry in many cases.
To illustrate the flexibility and superior solution that the AD670
can bring to a transducer interface problem, the following discussions are offered.
Temperature Measurements
Temperature transducers are one of the most common sources
of analog signals in data acquisition systems. These sensors require circuitry for excitation and preamplification/buffering. The
instrumentation amplifier input of the AD670 eliminates the
need for this signal conditioning. The output signals from temperature transducers are generally sufficiency slow that a
sample/hold amplifier is not required. Figure 12 shows tile
AD590 IC temperature transducer interfaced to the AD670.
The AD580 voltage reference is used to offset the input for 0°C
calibration. The current output of the AD590 is converted into
a voltage by R1. The high impedance unbuffered voltage is applied directly to the AD670 configured in the –128 mV to
127 mV bipolar range. The digital output will have a resolution
of 1°C.
AD670
˜
Figure 13. Low Cost RTD Interface
Differential temperature measurements can be made using an
AD590 connected to each of the inputs as shown in Figure 14.
This configuration will allow the user to measure the relative
temperature difference between two points with a 1°C resolution. Although the internal 1k and 9k resistors on the inputs
have ±20% tolerance, trimming the AD590 is unnecessary as
most differential temperature applications are concerned with
the relative differences between the two. However, the user may
see up to a 20% scale factor error in the differential temperature
to digital output transfer curve.
This scale factor error can be eliminated through a software correction. Offset corrections can be made by adjusting for any difference that results when both sensors are held at the same
temperature. A span adjustment can then be made by immersing one AD590 in an ice bath and one in boiling water and
eliminating any deviation from 100°C. For a low cost version of
this setup, the plastic AD592 can be substituted for the AD590.
Figure 12. AD670 Temperature Transducer lnterface
Platinum RTDs are also a popular, temperature transducer.
Typical RTDs have a resistance of 100 Ω at 0°C and change resistance 0.4 Ω per °C. If a consent excitation current is caused
to flow in the RTD, the change in voltage drop will be a measure of the change in temperature. Figure 13 shows such a
method and the required connections to the AD670. The
AD580 2.5 V reference provides the accurate voltage for the excitation current and range offsetting for the RTD. The op amp
is configured to force a constant 2.5 mA current through the
RTD. The differential inputs of the AD670 measure the difference between a fixed offset voltage and the temperature dependent output of the op amp which varies with the resistance of
the RTD. The RTD change of approximately 0.4 Ω/°C results
in a 1 mV/°C voltage change. With the AD670 in the 1 mV/LSB
range, temperatures from 0°C to 255°C can be measured.
REV. A
–9–
Figure 14. Differential Temperature Measurement
Using the AD590
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AD670
STRAIN GAGE MEASUREMENTS
Many semiconductor-type strain gages, pressure transducers,
and load cells may also be connected directly to the AD670.
These types of transducers typically produce 30 mV full-scale
per volt of excitation. In the circuit shown in Figure 15, the
AD670 is connected directly to a Data Instruments model JP-20
load cell. The AD584 programmable voltage reference is used
along with an AD741 op amp to provide the ± 2.5 V excitation
for the load cell. The output of the transducer will be ± 150 mV
for a force of ±20 pounds. The AD670 is configured for the
±128 millivolt range. The resolution is then approximately 2.1
ounces per LSB over a range of ±17 pounds. Scaling to exactly
2 ounces per LSB can be accomplished by trimming the reference voltage which excites the load cell.
Figure 15. AD670 Load Cell Interface
MULTIPLEXED INPUTS
Most data acquisition systems require the measurement of several analog signals. Multiple A/D converters are often used to
digitize these inputs, requiring additional preamplification and
buffer stages per channel. Since these signals vary slowly, a differential MUX can multiplex inputs from several transducers
into a single AD670. And since the AD670’s signal-conditioning
capability is preserved, the cost of several ADCs, differential
amplifiers, and other support components can be reduced to
that of a single AD670, a MUX, and a few digital logic gates.
An AD7502 dual 4-channel MUX appears in Figure 16 multiplexing four differential signals to the AD670. The AD7502’s
decoded address is gated with the microprocessor’s write signal
to provide a latching strobe at the flip-flops. A write cycle to the
AD7502’s address then latches the two LSBs of the data word
thereby selecting the input channel for subsequent conversions.
Figure 16. Multiplexed Analog Inputs to AD670
SAMPLED INPUTS
For those applications where the input signal is capable of slewing more than 1/2 LSB during the AD670’s 10 µs conversion
cycle, the input should be held constant for the cycle’s duration.
The circuit shown in Figure 17 uses a CMOS switch and two
capacitors to sample/hold the input. The AD670’s STATUS
output, once inverted, supplies the sample/hold (S/
A convert command applied on the
initiate the conversion. The AD670’s STATUS output, once inverted, supplies the sample/hold signal to the CD4066. The
CD4066 CMOS switch shown in Figure 17 was chosen for its
fast transition times, low on-resistance and low cost. The control input’s propagation delay for switch-closed to switch-open
should remain less than 150 ns to ensure that the sample-tohold transition occurs before the first bit decision in the AD670.
CE, CS or R/W lines will
H) signal.
–10–
REV. A
Page 11
Figure 17. Low Cost Sample-and-Hold Circuit for AD670
Since settling to 1/2 LSB at 8-bits of resolution requires 6.2 RC
time constants, the 500 pF hold capacitors and CD4066’s 300 Ω
on-resistance yield an acquisition time of under 1 µs, assuming a
low impedance source.
This sample/hold approach makes use of the differential capabilities of the AD670. Because 500 pF hold capacitors are used
on both V
the offset current of the AD670, typically 20 nA. With the
matched 500 pF capacitors, the droop rate is 40 µV/µs. The in-
put will then droop only 0.4 mV (0.4 LSB) during the AD670’s
10 µs conversion time. The differential approach also minimizes
pedestal error since only the difference in charge injection between the two switches results in errors at the A/D.
The fast conversion time and differential and common-mode capabilities of the AD670 permit this simple sample-hold design
to perform well with low sample-to-hold offset, droop rate of
about 40 µV/µs and acquisition time under 1 µs. The effective
aperture time of the AD670 is reduced by about 2 orders of
magnitude with this circuit, allowing frequencies to be converted up to several kilohertz.
While no input anti-aliasing filter is shown, filtering will be necessary to prevent output errors if higher frequencies are present
in the input signal. Many practical variations are possible with
this circuit, including input MUX control, for digitizing a number of ac channels.
IBM PC INTERFACE
The AD670 appears in Figure 18 interfaced to the IBM PC.
Since the device resides in I/O space, its address is decoded
from only the lower ten address lines and must be gated with
AEN (active low) to mask out internal (DMA) cycles which use
the same I/O address space. This active low signal is applied to
CS. AO, meanwhile, is reserved for the R/W input. This places
the AD670 in two adjacent addresses; one for starting the conversion and the other for reading the result. The
signals are then gated and applied to
data lines are applied to FORMAT and BPO/
provide software programmable input formats and output
coding.
+ and VIN– inputs, the droop rate depends only on
IN
IOR and IOW
CE, while the lower two
UPO inputs to
AD670
In BASIC, a simple OUT ADDR, WORD command initiates a
conversion. While the upper six bits of the data WORD are
meaningless, the lower two bits define the analog input format
and digital output coding according to Table IV. The data is
available ten microseconds later (which is negligible in BASIC)
and can be read using INP (ADDR + 1). The 3-line subroutine
in Figure 19, used in conjunction with the interface of Figure
18, converts an analog input within a bipolar range to an offset
binary coded digital word.
Figure 18. IBM PC lnterface to AD670
NOTE: Due to the large number of options that may be installed in the PC, the I/O bus loading should be limited to one
Schottky TTL load. Therefore, a buffer/driver should be used
when interfacing more than two AD670s to the I/O bus.