Datasheet AD6672 Datasheet (ANALOG DEVICES)

Page 1
A
IF Receiver

FEATURES

Performance with NSR enabled
SNR: 75.2 dBFS in a 55 MHz band to 185 MHz at 250 MSPS SNR: 72.8 dBFS in an 82 MHz band to 185 MHz at 250 MSPS
Performance with NSR disabled
SNR: 66.4 dBFS up to 185 MHz at 250 MSPS SFDR: 87 dBc up to 185 MHz at 250 MSPS
Total power consumption: 358 mW at 250 MSPS
1.8 V supply voltages LVDS (ANSI-644 levels) outputs Integer 1-to-8 input clock divider (625 MHz maximum input) Internal ADC voltage reference Flexible analog input range
1.4 V p-p to 2.0 V p-p (1.75 V p-p nominal) Differential analog inputs with 350 MHz bandwidth Serial port control Energy saving power-down modes User-configurable, built-in self test (BIST) capability

APPLICATIONS

Communications Diversity radio and smart antenna (MIMO) systems Multimode digital receivers (3G)
WCDMA, LTE, CDMA2000
WiMAX, TD-SCDMA I/Q demodulation systems General-purpose software radios
VIN+
VIN–
VCM

FUNCTIONAL BLOCK DIAGRAM

VDD
PIPELINE
ADC
REFERENCE
SERIAL PORT
SCLK SDIO CSB CLK+ CLK–
AGND DRVDD
NOISE SHAPING
REQUANTIZ ER
AD6672
Figure 1.
AD6672
1114
AND LVDS DRIVE RS
DATA MULITIPLEXER
1-TO-8
CLOCK
DIVIDER
DCO±
0/D0±
D9±/D10±
OR±
09997-001

GENERAL DESCRIPTION

The AD6672 is an 11-bit intermediate receiver with sampling speeds of up to 250 MSPS. The AD6672 is designed to support communications applications, where low cost, small size, wide bandwidth, and versatility are desired.
The ADC core features a multistage, differential pipelined architecture with integrated output error correction logic. The ADC features wide bandwidth inputs supporting a variety of user-selectable input ranges. An integrated voltage reference eases design considerations. A duty cycle stabilizer is provided to compensate for variations in the ADC clock duty cycle, allowing the converters to maintain excellent performance.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
The ADC core output is connected internally to a noise shaping requantizer (NSR) block. The device supports two output modes that are selectable via the serial port interface (SPI). With the NSR feature enabled, the outputs of the ADCs are processed such that the AD6672 supports enhanced SNR performance within a limited region of the Nyquist bandwidth while maintaining an 11-bit output resolution. The NSR block is programmed to provide a bandwidth of up to 33% of the sample clock. For example, with a sample clock rate of 250 MSPS, the AD6672 can achieve up to
73.6 dBFS SNR for an 82 MHz bandwidth at 185 MHz f
With the NSR block disabled, the ADC data is provided directly to the output with an output resolution of 11 bits. The AD6672 can achieve up to 66.6 dBFS SNR for the entire Nyquist bandwidth when operated in this mode.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2011 Analog Devices, Inc. All rights reserved.
.
IN
Page 2
AD6672

TABLE OF CONTENTS

Features.............................................................................................. 1
Applications....................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Product Highlights ........................................................................... 3
Specifications..................................................................................... 4
ADC DC Specifications ............................................................... 4
ADC AC Specifications ............................................................... 5
Digital Specifications ................................................................... 7
Switching Specifications.............................................................. 8
Timing Specifications .................................................................. 9
Absolute Maximum Ratings.......................................................... 10
Thermal Characteristics ............................................................10
ESD Caution................................................................................ 10
Pin Configurations and Function Descriptions ......................... 11
Typical Performance Characteristics ........................................... 12
Equivalent Circuits......................................................................... 15
Theory of Operation ...................................................................... 16
ADC Architecture ......................................................................16
Analog Input Considerations.................................................... 16
Voltage Reference....................................................................... 18
Clock Input Considerations...................................................... 18
Power Dissipation and Standby Mode .................................... 19
Digital Outputs........................................................................... 20
ADC Overrange (OR)................................................................ 20
Noise Shaping Requantizer ........................................................... 21
22% BW NSR Mode (55 MHz BW at 250 MSPS)..................... 21
33% BW NSR Mode (>82 MHz BW at 250 MSPS) ............... 21
Serial Port Interface (SPI).............................................................. 23
Configuration Using the SPI..................................................... 23
Hardware Interface..................................................................... 23
SPI Accessible Features.............................................................. 24
Memory Map .................................................................................. 25
Reading the Memory Map Register Table............................... 25
Memory Map Register Table..................................................... 26
Memory Map Register Description ......................................... 28
Applications Information.............................................................. 29
Design Guidelines ...................................................................... 29
Outline Dimensions....................................................................... 30
Ordering Guide .......................................................................... 30

REVISION HISTORY

7/11—Revision 0: Initial Version
Rev. 0 | Page 2 of 32
Page 3
AD6672
When the NSR block is disabled, the ADC data is provided directly to the output at a resolution of 11 bits. This allows the AD6672 to be used in telecommunication applications, such as a digital predistortion observation path, where wider bandwidths are required.
After digital signal processing, multiplexed output data is routed into one 11-bit output port such that the maximum data rate is 500 Mbps (DDR). This output is LVDS and supports ANSI-644 levels.
The AD6672 receiver digitizes a wide spectrum of IF frequencies. This IF sampling architecture greatly reduces component cost and complexity compared with traditional analog techniques or less integrated digital methods.
Flexible power-down options allow significant power savings. Programming for device setup and control is accomplished using a 3-wire, SPI-compatible serial interface with numerous modes to support board level system testing.
The AD6672 is available in a 32-lead, RoHS-compliant LFCSP and is specified over the industrial temperature range of −40°C to +85°C. This product is protected by a U.S. patent.

PRODUCT HIGHLIGHTS

1. Integrated 11-bit, 250 MSPS ADC with a noise shaping
requantizer option.
2. Operation from a single 1.8 V supply and a separate digital
output driver supply accommodating LVDS outputs.
3. On-chip 1-to-8 integer clock divider function to support a
wide range of clocking.
4. Noise shaping requantizer function allows attaining improved
SNR within a reduced frequency band. With NSR enabled, the AD6672 supports up to 82 MHz at 250 MSPS.
5. Standard serial port interface (SPI) that supports various
product features and functions, such as data formatting (offset binary, twos complement, or gray coding), enabling the clock DCS, power-down, test modes, and voltage reference mode.
Rev. 0 | Page 3 of 32
Page 4
AD6672

SPECIFICATIONS

ADC DC SPECIFICATIONS

AVDD = 1.8 V, DRVDD = 1.8 V, maximum sample rate, VIN = −1.0 dBFS differential input, 1.75 V p-p full-scale input range, DCS enabled, unless otherwise noted.
Table 1.
Parameter Temperature Min Typ Max Unit
RESOLUTION Full 11 Bits ACCURACY
No Missing Codes Full Guaranteed Offset Error Full ±11 mV Gain Error Full +3/−6.5 % FSR Differential Nonlinearity (DNL) Full ±0.2 LSB 25°C ±0.1 LSB Integral Nonlinearity (INL)1 Full ±0.3 LSB 25°C ±0.12 LSB
TEMPERATURE DRIFT
Offset Error Full ±7 ppm/°C Gain Error Full ±85 ppm/°C
INPUT-REFERRED NOISE
VREF = 1.0 V 25°C 0.65 LSB rms
ANALOG INPUT
Input Span Full 1.75 V p-p Input Capacitance2 Full 5 pF Input Resistance Full 20 kΩ Input Common-Mode Voltage Full 0.9 V
POWER SUPPLIES
Supply Voltage
AVDD Full 1.7 1.8 1.9 V DRVDD Full 1.7 1.8 1.9 V
Supply Current
1
I
Full 136 145 mA
AVDD
1
I
(NSR Disabled) Full 63 68 mA
DRVDD
1
I
(NSR Enabled, 22% Bandwidth Mode) Full 89 mA
DRVDD
1
I
(NSR Enabled, 33% Bandwidth Mode) Full 99 mA
DRVDD
POWER CONSUMPTION
Sine Wave Input (DRVDD = 1.8 V, NSR Disabled) Full 358 385 mW Sine Wave Input (DRVDD = 1.8 V, NSR Enabled,
22% Bandwidth Mode) Full 405
Sine Wave Input (DRVDD = 1.8 V, NSR Enabled,
33% Bandwidth Mode) Full 423 Standby Power3 Full 50 mW Power-Down Power Full 5 mW
1
Measured with a low input frequency, full-scale sine wave, with approximately 5 pF loading on each output bit.
2
Input capacitance refers to the effective capacitance between one differential input pin and AGND. See for the equivalent analog input structure. Figure 18
3
Standby power is measured with a dc input, the CLK pin inactive (set to AVDD or AGND).
mW
mW
Rev. 0 | Page 4 of 32
Page 5
AD6672

ADC AC SPECIFICATIONS

AVDD = 1.8 V, DRVDD = 1.8 V, maximum sample rate, VIN = −1.0 dBFS differential input, 1.75 V p-p full-scale input range, unless
otherwise noted.
Table 2.
Parameter1 Temperature Min Typ Max Unit
SIGNAL-TO-NOISE-RATIO (SNR)
NSR Disabled
fIN = 30 MHz 25°C 66.6 dBFS fIN = 90 MHz 25°C 66.6 dBFS fIN = 140 MHz 25°C 66.5 dBFS fIN = 185 MHz 25°C 66.4 dBFS Full 65.4 dBFS fIN = 220 MHz 25°C 66.3 dBFS
NSR Enabled
22% Bandwidth Mode
fIN = 30 MHz 25°C 75.8 dBFS fIN = 90 MHz 25°C 75.7 dBFS fIN = 140 MHz 25°C 75.6 dBFS fIN = 185 MHz 25°C 75.2 dBFS Full 72.2 dBFS fIN = 220 MHz 25°C 74.8 dBFS
33% Bandwidth Mode
fIN = 30 MHz 25°C 73.4 dBFS fIN = 90 MHz 25°C 73.3 dBFS fIN = 140 MHz 25°C 73.2 dBFS fIN = 185 MHz 25°C 72.8 dBFS Full 69.2 dBFS fIN = 220 MHz 25°C 72.4 dBFS
SIGNAL-TO-NOISE RATIO AND DISTORTION (SINAD)
fIN = 30 MHz 25°C 65.7 dBFS fIN = 90 MHz 25°C 65.7 dBFS fIN = 140 MHz 25°C 65.6 dBFS fIN = 185 MHz 25°C 65.3 dBFS Full 64.4 dBFS fIN = 220 MHz 25°C 65.2 dBFS
WORST SECOND OR THIRD HARMONIC
fIN = 30 MHz 25°C −88 dBc fIN = 90 MHz 25°C −88 dBc fIN = 140 MHz 25°C −89 dBc fIN = 185 MHz 25°C −87 dBc Full −80 dBc fIN = 220 MHz 25°C −88 dBc
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 30 MHz 25°C 88 dBc fIN = 90 MHz 25°C 88 dBc fIN = 140 MHz 25°C 89 fIN = 185 MHz 25°C 87 dBc Full 80 dBc fIN = 220 MHz 25°C 88 dBc
Rev. 0 | Page 5 of 32
Page 6
AD6672
Parameter1 Temperature Min Typ Max Unit
WORST OTHER (HARMONIC OR SPUR)
fIN = 30 MHz 25°C −96 dBc fIN = 90 MHz 25°C −97 dBc fIN = 140 MHz 25°C −97 dBc fIN = 185 MHz 25°C −98 dBc Full −81 dBc fIN = 220 MHz 25°C −97 dBc
TWO-TONE SFDR
fIN = 184.12 MHz, 187.12 MHz (−7 dBFS) 25°C 88 dBc
FULL POWER BANDWIDTH2 25°C 350 MHz NOISE BANDWIDTH3 25°C 1000 MHz
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions.
2
Full power bandwidth is the bandwidth of operation where typical ADC performance can be achieved.
3
Noise bandwidth is the −3 dB bandwidth for the ADC inputs across which noise may enter the ADC and is not attenuated internally.
Rev. 0 | Page 6 of 32
Page 7
AD6672

DIGITAL SPECIFICATIONS

AVDD = 1.8 V, DRVDD = 1.8 V, maximum sample rate, VIN = −1.0 dBFS differential input, 1.0 V internal reference,
DCS enabled, unless otherwise noted.
Table 3.
Parameter Temperature Min Typ Max Unit
DIFFERENTIAL CLOCK INPUTS (CLK+, CLK−)
Logic Compliance CMOS/LVDS/LVPECL Internal Common-Mode Bias Full 0.9 V Differential Input Voltage Full 0.3 3.6 V p-p Input Voltage Range Full AGND AVDD V Input Common-Mode Range Full 0.9 1.4 V High Level Input Current Full 10 +22 µA Low Level Input Current Full −22 −10 µA Input Capacitance Full
4
Input Resistance Full 12 15 18 kΩ
LOGIC INPUT (CSB)1
High Level Input Voltage Full 1.22 2.1 V Low Level Input Voltage Full 0 0.6 V High Level Input Current Full 50 71 µA Low Level Input Current Full −5 +5 µA Input Resistance Full 26 kΩ Input Capacitance Full 2 pF
LOGIC INPUT (SCLK)2
High Level Input Voltage Full 1.22 2.1 V Low Level Input Voltage Full 0 0.6 V High Level Input Current Full 45 70 µA Low Level Input Current Full −5 +5 µA Input Resistance Full 26 kΩ Input Capacitance Full 2 pF
LOGIC INPUTS (SDIO)1
High Level Input Voltage Full 1.22 2.1 V Low Level Input Voltage Full 0 0.6 V High Level Input Current Full 45 70 µA Low Level Input Current Full −5 +5 µA Input Resistance Full 26 kΩ Input Capacitance Full 5 pF
DIGITAL OUTPUTS (OR+, OR−)
LVDS Data and OR Outputs
Differential Output Voltage (VOD), ANSI Mode Full 250 350 450 mV Output Offset Voltage (VOS), ANSI Mode Full 1.15 1.25 1.35 V Differential Output Voltage (VOD), Reduced Swing Mode Full 150 200 280 mV
Output Offset Voltage (VOS), Reduced Swing Mode Full 1.15 1.25 1.35 V
1
Pull-up.
2
Pull-down.
pF
Rev. 0 | Page 7 of 32
Page 8
AD6672

SWITCHING SPECIFICATIONS

Table 4.
Parameter Temperature Min Typ Max Unit
CLOCK INPUT PARAMETERS
Input Clock Rate Full 625 MHz Conversion Rate1 Full 40 250 MSPS CLK Period—Divide-by-1 Mode (t CLK Pulse Width High (tCH)
Divide-by-1 Mode, DCS Enabled Full 1.8 2.0 2.2 ns Divide-by-1 Mode, DCS Disabled Full 1.9 2.0 2.1 ns
Divide-by-2 Mode Through Divide-by-8 Mode Full 0.8 ns Aperture Delay (tA) Full 1.0 ns Aperture Uncertainty (Jitter, tJ) Full 0.1 ps rms
DATA OUTPUT PARAMETERS
Data Propagation Delay (tPD) Full 4.1 4.7 5.2 ns DCO Propagation Delay (t DCO-to-Data Skew (t
DCO
) Full 0.3 0.5 0.7 ns
SKEW
Pipeline Delay (Latency)—NSR Disabled Full 10 Cycles Pipeline Delay (Latency)—NSR Enabled Full 13 Cycles Wake-Up Time (from Standby) Full 10 µs Wake-Up Time (from Power-Down) Full 100 µs Out-of-Range Recovery Time Full 3 Cycles
1
Conversion rate is the clock rate after the divider.

Timing Diagram

VIN
) Full 4 ns
CLK
) Full 4.7 5.3 5.8 ns
t
N – 1
A
N
N + 3
N + 4
N + 5
CLK+
CLK–
DCO–
DCO+
ODD/EVEN
0/D0± (LSB)
D9±/D10±
(MSB)
N + 1
t
CH
t
CLK
t
DCO
t
PD
N – 10D0N – 10
D9
N – 10
t
SKEW
0
N – 9D0N – 90N – 8D0N – 80N – 7
D10
N – 10D9N – 9
0
N + 2
D10
N – 9D9N – 8
D10
N – 8D9N – 7
D0
N – 7
D10
N – 7D9N – 6
0
N – 6
09997-002
Figure 2. LVDS Data Output Timing
Rev. 0 | Page 8 of 32
Page 9
AD6672

TIMING SPECIFICATIONS

Table 5.
Parameter Test Conditions/Comments Min Typ Max Unit
SPI TIMING REQUIREMENTS See Figure 42 for the SPI timing diagram
tDS Setup time between the data and the rising edge of SCLK 2 ns tDH Hold time between the data and the rising edge of SCLK 2 ns t
Period of the SCLK 40 ns
CLK
tS Setup time between CSB and SCLK 2 ns tH Hold time between CSB and SCLK 2 ns t
Minimum period that SCLK should be in a logic high state 10 ns
HIGH
t
Minimum period that SCLK should be in a logic low state 10 ns
LOW
t
EN_SDIO
t
DIS_SDIO
Time required for the SDIO pin to switch from an input to an output relative to the SCLK falling edge (not shown in Figure 42)
Time required for the SDIO pin to switch from an output to an input relative to the SCLK rising edge (not shown in Figure 42)
10 ns
10 ns
Rev. 0 | Page 9 of 32
Page 10
AD6672

ABSOLUTE MAXIMUM RATINGS

Table 6.
Parameter Rating
Electrical
AVDD to AGND −0.3 V to +2.0 V DRVDD to AGND −0.3 V to +2.0 V VIN+, VIN− to AGND −0.3 V to AVDD + 0.2 V CLK+, CLK− to AGND −0.3 V to AVDD + 0.2 V VCM to AGND −0.3 V to AVDD + 0.2 V CSB to AGND −0.3 V to DRVDD + 0.3 V SCLK to AGND −0.3 V to DRVDD + 0.3 V SDIO to AGND −0.3 V to DRVDD + 0.3 V 0/D0−, 0/D0 + Through D9−/D10−,
−0.3 V to DRVDD + 0.3 V
D9+/D10+ to AGND OR+/OR− to AGND −0.3 V to DRVDD + 0.3 V DCO+, DCO− to AGND −0.3 V to DRVDD + 0.3 V
Environmental
Operating Temperature Range
−40°C to +85°C
(Ambient) Maximum Junction Temperature
150°C
Under Bias Storage Temperature Range
−65°C to +125°C
(Ambient)
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

THERMAL CHARACTERISTICS

The exposed paddle must be soldered to the ground plane for the LFCSP package. Soldering the exposed paddle to the customer board increases the reliability of the solder joints, maximizing the thermal capability of the package.
Table 7. Thermal Resistance
Airflow Package Typ e
32-Lead LFCSP
5 mm × 5 mm (CP-32-12)
1
Per JEDEC 51-7, plus JEDEC 25-5 2S2P test board.
2
Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air).
3
Per MIL-Std 883, Method 1012.1.
4
Per JEDEC JESD51-8 (still air).
Veloc ity
(m/sec) θ
1, 2
JA
1, 3
θ
JC
1, 4
θ
Unit
JB
0 37.1 3.1 20.7 °C/W
1.0 32.4 °C/W
2.0 29.1 °C/W
Typical θJA is specified for a 4-layer PCB with a solid ground plane. As shown in Ta b le 7 , airflow increases heat dissipation, which reduces θ
. In addition, metal in direct contact with the
JA
package leads from metal traces—through holes, ground, and power planes—reduces the θ
.
JA

ESD CAUTION

Rev. 0 | Page 10 of 32
Page 11
AD6672
2

PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS

AVD D
AVD D
VIN+
VIN–
AVD D
AVD D
VCM
D5–/D6–
D5+/D6+
D7–/D8–
DNC
25
24 CSB 23 22 21 20 19 18 17 DRVDD
D7+/D8+
SCLK SDIO DCO+ DCO– D9+/D10+ (MSB) D9–/D10– (MSB)
09997-003
32313029282726
CLK+
1 2
CLK–
AVD D
OR–
OR+ 0/D0– (LSB) 0/D0+ (LS B)
DRVDD
NOTES
1. THE EXPO SED THERMAL PADDLE ON THE BOTTOM OF THE
PACKAGE PROVIDES THE ANALOG GROUND FO R THE PART. THIS EXPOSED PADDLE MUST BE CO NNECTED TO GROUND FOR PRO PER OPERATION.
. DNC = NO NOT CO NNECT. DO NOT CONNECT TO THI S PIN.
3
INTERLEAVED
4 5 6 7 8
9
D1–/D2–
AD6672
LVD S
TOP VIEW
(Not to Scale)
10111213141516
D3–/D4–
D1+/D2+
D3+/D4+
Figure 3. LFCSP Pin Configuration (Top View)
Table 8. Pin Function Descriptions
Pin No. Mnemonic Type Description
ADC Power Supplies
8, 17 DRVDD Supply Digital Output Driver Supply (1.8 V Nominal). 3, 27, 28, 31, 32 AVDD Supply Analog Power Supply (1.8 V Nominal). 0 AGND,
25 DNC Do Not Connect. Do not connect to this pin.
ADC Analog
30 VIN+ Input Differential Analog Input Pin (+). 29 VIN− Input Differential Analog Input Pin (−). 26 VCM Output Common-Mode Level Bias Output for Analog Inputs. This pin should be decoupled to
1 CLK+ Input ADC Clock Input—True. 2 CLK− Input ADC Clock Input—Complement.
Digital Outputs
5 OR+ Output Overrange indicator—True. 4 OR− Output Overrange indicator—Complement. 7 0/D0+ (LSB) Output DDR LVDS Output Data 0—True. The output bit on the rising edge of the data clock output
6 0/D0− (LSB) Output DDR LVDS Output Data 0—Complement. The output bit on the rising edge of the data clock
10 D1+/D2+ Output DDR LVDS Output Data 1/2—True. 9 D1−/D2− Output DDR LVDS Output Data 1/2—Complement. 12 D3+/D4+ Output DDR LVDS Output Data 3/4—True. 11 D3−/D4− Output DDR LVDS Output Data 3/4—Complement. 14 D5+/D6+ Output DDR LVDS Output Data 5/6—True. 13 D5−/D6− Output DDR LVDS Output Data 5/6—Complement. 16 D7+/D8+ Output DDR LVDS Output Data 7/8—True. 15 D7−/D8− Output DDR LVDS Output Data 7/8—Complement. 19 D9+/D10+ (MSB) Output DDR LVDS Output Data 9/10—True. 18 D9−/D10− (MSB) Output DDR LVDS Output Data 9/10—Complement. 21 DCO+ Output LVDS Data Clock Output—True. 20 DCO− Output LVDS Data Clock Output—Complement.
SPI Control
23 SCLK Input SPI Serial Clock. 22 SDIO Input/output SPI Serial Data I/O. 24 CSB Input SPI Chip Select (Active Low).
Ground Analog Ground. The exposed thermal paddle on the bottom of the package provides the
Exposed Paddle
analog ground for the part. This exposed paddle must be connected to ground for proper operation.
ground using a 0.1 F capacitor.
(DCO) from this output is always a Logic 0 (see Figure 2).
output (DCO) from this output is always a Logic 0 (see Figure 2).
Rev. 0 | Page 11 of 32
Page 12
AD6672

TYPICAL PERFORMANCE CHARACTERISTICS

AVDD = 1.8 V, DRVDD = 1.8 V, sample rate = 250 MSPS, DCS enabled, 1.75 V p-p differential input, VIN = −1.0 dBFS, 32k sample, TA = 25°C, unless otherwise noted.
–20
–40
0
250MSPS
30.1MHz @ –1.0d BFS SNR = 65.6dB (66.6dBFS) SFDR = 88dBc
0
250 MSPS
185.1MHz @ –1.0d BFS
–20
SNR = 65.4dB (66. 4dBFS) SFDR = 87dBc
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 102030405060708090 110100 120
Figure 4. Single-Tone FFT with f
0
250MSPS
90.1MHz @ –1.0d BFS
–20
SNR = 65.6dB (66. 6dBFS) SFDR = 88dBc
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 102030405060708090 110100 120
THIRD
HARMONIC
Figure 5. Single-Tone FFT with f
SECOND
HARMONIC
FREQUENCY (M Hz)
SECOND
HARMONIC
FREQUENCY (M Hz)
= 30.1 MHz
IN
= 90.1 MHz
IN
THIRD
HARMONIC
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 102030405060708090 110100 120
09997-004
Figure 7. Single-Tone FFT with f
0
–20
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 102030405060708090 110100 120
09997-005
Figure 8. Single-Tone FFT with f
THIRD
HARMONIC
FREQUENCY (M Hz)
SECOND
HARMONIC
FREQUENCY (M Hz)
SECOND
HARMONIC
= 185.1 MHz
IN
250 MSPS
220.1MHz @ –1.0d BFS SNR = 65.3dB (66. 3dBFS) SFDR = 88dBc
THIRD
HARMONIC
= 220.1 MHz
IN
09997-007
09997-008
0
250MSPS
140.1MHz @ –1.0d BFS
–20
SNR = 65.5dB (66. 5dBFS) SFDR = 89dBc
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 102030405060708090 110100 120
SECOND
HARMONIC
FREQUENCY (M Hz)
HARMONIC
Figure 6. Single-Tone FFT with f
THIRD
= 140.1 MHz
IN
09997-006
Rev. 0 | Page 12 of 32
0
–20
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 102030405060708090 110100 120
FREQUENCY (M Hz)
Figure 9. Single-Tone FFT with f
250 MSPS
305.1MHz @ –1.0d BFS SNR = 64.8dB (65. 8dBFS) SFDR = 82dBc
THIRD
HARMONIC
= 305.1 MHz
IN
SECOND
HARMONIC
09997-009
Page 13
AD6672
120
100
80
60
40
20
0
–100 –90 –80 –70 –60 –50 –40 –30 –20 –10 0
SNR/SFDR (dBc and dBF S )
INPUT AMPLITUDE (dBFS)
SNR (dBFS)
SFDR (dBc)
SNR (dBc)
SFDR (dBF S )
09997-010
100
95
90
85
80
75
70
65
60
607590
105
120
135
150
165
180
195
210
225
240
255
270
285
300
315
330
345
SNR/SFDR (dBc and dBFS)
FREQUENCY (MHz)
09997-011
SFDR (dBF S )
SNR (dBc)
0
–20
–40
–60
–80
–100
–120
–90 –80 –70 –60 –50 –40 –30 –20 –10
SFDR/IM D3 ( dBc and dBF S )
INPUT AMPLITUDE (dBFS)
09997-012
SFDR (dBF S )
SFDR (dBc)
IMD3 (dBF S )
IMD3 (dBc)
0
–20
–40
–60
–80
–100
–120
–90.0 –78.5 –67.0 –55.5 –44.0 –32.5 –21.0 –9.5
SFDR/IM D3 ( dBc and dBFS)
INPUT AMPLITUDE (dBFS)
09997-013
SFDR (dBF S )
SFDR (dBc)
IMD3 (dBF S )
IMD3 (dBc)
0
–20
–40
–60
–80
–100
–120
–140
0 10 20 30 40 50 60 70 80 90 110100 120
AMPLITUDE (dBFS)
FREQUENCY (Hz)
250MSPS
89.12MHz @ –7.0dBFS
92.12MHz @ –7.0dBFS SFDR = 87dBc (94d BFS)
09997-014
0
–20
–40
–60
–80
–100
–120
–140
0 10 20 30 40 50 60 70 80 90 110100 120
AMPLITUDE (dBFS)
FREQUENCY (Hz)
250MSPS
184.12MHz @ –7.0dBFS
187.12MHz @ –7.0dBFS SFDR = 86dBc (93d BFS)
09997-015
Figure 10. Single-Tone SNR/SFDR vs. Input Amplitude (A
with f
= 90.1 MHz, fS = 250 MSPS
IN
)
IN
Figure 11. Single-Tone SNR/SFDR vs. Input Frequency (fIN), fS = 250 MSPS
Figure 13. Two-Tone SFDR/IMD3 vs. Input Amplitude (A
with f
= 184.12 MHz, f
IN1
= 187.12 MHz, fS = 250 MSPS
IN2
)
IN
Figure 14. Two-Tone FFT with f
= 89.12 MHz, f
IN1
= 92.12 MHz
IN2
Figure 12. Two-Tone SFDR/IMD3 vs. Input Amplitude (AIN)
with f
= 89.12 MHz, f
IN1
= 92.12 MHz, fS = 250 MSPS
IN2
Figure 15. Two-Tone FFT with f
= 184.12 MHz, f
IN1
= 187.12 MHz
IN2
Rev. 0 | Page 13 of 32
Page 14
AD6672
100
95
90
85
80
75
70
SNR/SFDR (d Bc and dBFS)
65
60
40 60 80 100 120 140 160 180 200 220 240
SFDR (dBc)
SNR (dBFS)
SAMPLE RATE (MSPS)
Figure 16. Single-Tone SNR/SFDR vs. Sample Rate (f
) with fIN = 90 MHz
S
09997-016
1000
0.65LSB RMS 16384 TOTAL HITS
9000
8000
7000
6000
5000
4000
NUMBER OF HITS
3000
2000
1000
0
OUTPUT CODE
Figure 17. Grounded Input Histogram, f
N – 1N
= 250 MSPS
S
09997-017
Rev. 0 | Page 14 of 32
Page 15
AD6672
VINA
V
A
V
R
V
A
A
V

EQUIVALENT CIRCUITS

DD
DRVDD
Figure 18. Equivalent Analog Input Circuit
DD
AVD D AV DD
CLK+
0.9V
15k 15k
Figure 19. Equivalent Clock Input Circuit
D
DD
V+
D
TAOUT–
V–
09997-018
V–
DATAOUT+
V+
CLK–
26k
350
09997-021
SDIO
Figure 21. Equivalent SDIO Circuit
SCLK
09997-019
26k
350
09997-022
Figure 22. Equivalent SCLK Input Circuit
DD
26k
CSB
350
09997-020
Figure 20. Equivalent LVDS Output Circuit
Figure 23. Equivalent CSB Input Circuit
09997-023
Rev. 0 | Page 15 of 32
Page 16
AD6672

THEORY OF OPERATION

The AD6672 can sample any fS/2 frequency segment from dc to 250 MHz using appropriate low-pass or band-pass filtering at the ADC inputs with little loss in ADC performance.
Programming and control of the AD6672 are accomplished using a 3-pin, SPI-compatible serial interface.

ADC ARCHITECTURE

The AD6672 architecture consists of a front-end sample-and­hold circuit, followed by a pipelined switched-capacitor ADC. The quantized outputs from each stage are combined into a final 11-bit result in the digital correction logic. The pipelined architecture permits the first stage to operate on a new input sample and the remaining stages to operate on the preceding samples. Sampling occurs on the rising edge of the clock.
Each stage of the pipeline, excluding the last, consists of a low resolution flash ADC connected to a switched-capacitor digital­to-analog converter (DAC) and an interstage residue amplifier (MDAC). The MDAC magnifies the difference between the reconstructed DAC output and the flash input for the next stage in the pipeline. One bit of redundancy is used in each stage to facilitate digital correction of flash errors. The last stage simply consists of a flash ADC.
The input stage of the AD6672 contains a differential sampling circuit that can be ac- or dc-coupled in differential or single­ended modes. The output staging block aligns the data, corrects errors, and passes the data to the output buffers. The output buffers are powered from a separate supply, allowing digital output noise to be separated from the analog core. During power-down, the output buffers go into a high impedance state.
The AD6672 features a noise shaping requantizer (NSR) to allow higher than 11-bit SNR to be maintained in a subset of the Nyquist band.

ANALOG INPUT CONSIDERATIONS

The analog input to the AD6672 is a differential switched­capacitor circuit that has been designed to attain optimum performance when processing a differential input signal.
The clock signal alternatively switches the input between sample mode and hold mode (see the configuration shown in Figure 24). When the input is switched into sample mode, the signal source must be capable of charging the sampling capacitors and settling within 1/2 clock cycle.
A small resistor in series with each input can help reduce the peak transient current required from the output stage of the driving source. A shunt capacitor can be placed across the inputs to provide dynamic charging currents. This passive network creates a low-pass filter at the ADC input; therefore, the precise values are dependent on the application.
In intermediate frequency (IF) undersampling applications, the shunt capacitors should be reduced. In combination with the driving source impedance, the shunt capacitors limit the input bandwidth. Refer to the AN-742 Application Note, Frequency Domain Response of Switched-Capacitor ADCs; the AN-827
Application Note, A Resonant Approach to Interfacing Amplifiers
to Switched-Capacitor ADCs; and the Analog Dialogue article, “Transformer-Coupled Front-End for Wideband A/D Converters,” for more information on this subject.
BIAS
VIN+
VIN–
S
C
S
C
PAR1
C
PAR1
C
PAR2
H
C
S
C
PAR2
S
Figure 24. Switched-Capacitor Input
BIAS
S
C
FB
S
C
S
FB
S
09997-024
For best dynamic performance, match the source impedances driving VIN+ and VIN− and differentially balance the inputs.

Input Common Mode

The analog inputs of the AD6672 are not internally dc biased. In ac-coupled applications, the user must provide this bias externally. Setting the device so that V
= 0.5 × AVDD (or
CM
0.9 V) is recommended for optimum performance. An on­board common-mode voltage reference is included in the design and is available from the VCM pin. Using the VCM output to set the input common mode is recommended. Optimum performance is achieved when the common-mode voltage of the analog input is set by the VCM pin voltage (typically 0.5 × AVDD). The VCM pin must be decoupled to ground by a 0.1 µF capacitor, as described in the Applications Information section. Place this decoupling capacitor close to the pin to minimize the series resistance and inductance between the part and this capacitor.
Rev. 0 | Page 16 of 32
Page 17
AD6672
V

Differential Input Configurations

Optimum performance can be achieved when driving the AD6672 in a differential input configuration. For baseband applications, the
AD8138, ADA4937-1, and ADA4930-1 differential drivers provide
excellent performance and a flexible interface to the ADC.
The output common-mode voltage of the ADA4930-1 is easily set with the VCM pin of the AD6672 (see Figure 25), and the driver can be configured in a Sallen-Key filter topology to provide band-limiting of the input signal.
15pF
200
76.8
IN
0.1µF
90
ADA4930-1
120
200
33
33
5pF
15pF
15
15
VIN–
VIN+
AVD D
ADC
VCM
0.1µF
Figure 25. Differential Input Configuration Using the ADA4930-1
For baseband applications where SNR is a key parameter, differential transformer coupling is the recommended input configuration. An example is shown in Figure 26. To bias the analog input, connect the VCM voltage to the center tap of the secondary winding of the transformer.
C2
R3
R2
VIN+
ADC
R2
VIN–
VCM
2V p-p
49.9
R1
C1
R1
09997-025
the true SNR performance of the AD6672. For applications where SNR is a key parameter, differential double balun coupling is the recommended input configuration (see Figure 28). In this configuration, the input is ac-coupled and the VCM voltage is provided to the input through a 33 Ω resistor. This resistor compensates for losses in the input baluns to provide a 50 Ω impedance to the driver.
In the double balun and transformer configurations, the value of the input capacitors and resistors is dependent on the input frequency and source impedance. Based on these parameters, the value of the input resistors and capacitors may need to be adjusted or some components may need to be removed. Tabl e 9 displays recommended values to set the RC network for different input frequency ranges. However, these values are dependent on the input signal and bandwidth and should be used only as a starting guide. Note that the values given in Tab le 9 are for each R1, R2, C2, and R3 component shown in Figure 26 and Figure 28.
Table 9. Example RC Network
Frequency Range (MHz)
R1 Series (Ω)
C1 Differential (pF)
R2 Series (Ω)
C2 Shunt (pF)
R3 Shunt (Ω)
0 to 100 33 8.2 0 15 49.9 100 to 300 15 3.9 0 8.2 49.9
An alternative to using a transformer-coupled input at frequencies in the second Nyquist zone is to use an amplifier with variable gain. The AD8375 digital variable gain amplifier (DVGA) provides good performance for driving the AD6672. Figure 27 shows an example of the AD8375 driving the AD6672 through a band-pass antialiasing filter.
220nH
180nH1000pF
0.1µF 0.1µF
R3
C2
Figure 26. Differential Transformer-Coupled Configuration
The signal characteristics must be considered when selecting a transformer. Most RF transformers saturate at frequencies below a few megahertz. Excessive signal power can also cause core saturation, which leads to distortion.
At input frequencies in the second Nyquist zone and above, the noise performance of most amplifiers is not adequate to achieve
2V p-p
0.1µF
SP
A
S
Figure 28. Differential Double Balun Input Configuration
0.1µF
P
0.1µF
Rev. 0 | Page 17 of 32
1µH
1µH
VPOS
1nF
1000pF
301
180nH
09997-026
AD8375
NOTES
1. ALL INDUCTORS ARE COILCRAFT WITH THE EXCEPTION OF THE 1µH CHOKE INDUCTORS (0603LS).
2. FILTER VALUES SHOWN ARE FOR A 20MHz BANDWIDTH FILTER CENTEREDAT 140MHz.
165
5.1pF 3.9pF
165
220nH
®
0603CS COMPONENTS
15pF
VCM
1nF
68nH
AD6672
2.5kΩ║2pF
09997-027
Figure 27. Differential Input Configuration Using the AD8375
C2
R3
33
33
0.1µF
R1
C1
R1R2R2
C2
VIN+
ADC
0.1µF
VCM
09997-028
VIN–
R3
Page 18
AD6672
A
V

VOLTAGE REFERENCE

A stable and accurate voltage reference is built into the AD6672. The full-scale input range can be adjusted by varying the reference voltage via SPI. The input span of the ADC tracks reference voltage changes linearly.

CLOCK INPUT CONSIDERATIONS

For optimum performance, the AD6672 sample clock inputs, CLK+ and CLK−, should be clocked with a differential signal. The signal is typically ac-coupled into the CLK+ and CLK− pins via a transformer or via capacitors. These pins are biased internally (see Figure 29) and require no external bias. If the inputs are floated, the CLK− pin is pulled low to prevent spurious clocking.
DD
CLOCK
390pF 390pF
INPUT
1nF
Figure 31. Balun-Coupled Differential Clock (Up to 625 MHz)
If a low jitter clock source is not available, another option is to ac-couple a differential PECL signal to the sample clock input pins as shown in Figure 32. The AD9510, AD9511, AD9512,
AD9513, AD9514, AD9515, AD9516, AD9517, AD9518, AD9520, AD9522, AD9523, AD9524, and ADCLK905/ADCLK907/ ADCLK925 clock drivers offer excellent jitter performance.
25
25
390pF
SCHOTTKY
DIODES:
HSMS2822
CLK+
CLK–
ADC
09997-044
0.9V
CLK+
CLK–
4pF4pF
09997-029
Figure 29. Simplified Equivalent Clock Input Circuit

Clock Input Options

The AD6672 has a very flexible clock input structure. Clock input can be a CMOS, LVDS, LVPECL, or sine wave signal. Regardless of the type of signal being used, clock source jitter is of the most concern, as described in the Jitter Considerations section.
Figure 30 and Figure 31 show two preferable methods for clocking the AD6672 (at clock rates of up to 625 MHz). A low jitter clock source is converted from a single-ended signal to a differential signal using an RF balun or RF transformer.
The RF balun configuration is recommended for clock frequencies between 125 MHz and 625 MHz, and the RF transformer is recom­mended for clock frequencies from 10 MHz to 250 MHz. The back-to-back Schottky diodes across the secondary winding of the transformer limit clock excursions into the AD6672 to approximately 0.8 V p-p differential. This limit helps prevent the large voltage swings of the clock from feeding through to other portions of the AD6672 while preserving the fast rise and fall times of the signal, which are critical for low jitter performance.
CLOCK
INPUT
CLOCK
INPUT
0.1µF
0.1µF
50k 50k
AD95xx, ADCLK9xx
PECL DRIVER
0.1µF
100
0.1µF
240240
ADC
CLK+
CLK–
Figure 32. Differential PECL Sample Clock (Up to 625 MHz)
A third option is to ac-couple a differential LVDS signal to the sample clock input pins, as shown in Figure 33. The AD9510,
AD9511, AD9512, AD9513, AD9514, AD9515, AD9516, AD9517, AD9518, AD9520, AD9522, AD9523, and AD9524
clock drivers offer excellent jitter performance.
CLOCK
INPUT
CLOCK
INPUT
50k 50k
0.1µF
0.1µF
AD95xx
LVDS DRIVER
Figure 33. Differential LVDS Sample Clock (Up to 625 MHz)
0.1µF
100
0.1µF
ADC
CLK+
CLK–

Input Clock Divider

The AD6672 contains an input clock divider with the ability to divide the input clock by integer values between 1 and 8. For divide ratios other than 1, the duty cycle stabilizer (DCS) is enabled by default on power-up.
9997-032
9997-033
CLOCK
INPUT
50
Mini-Circuits
ADT1-1WT, 1:1Z
100
XFMR
®
390pF390pF
390pF
SCHOTTKY
DIODES:
HSMS2822
CLK+
CLK–
ADC
09997-043
Figure 30. Transformer-Coupled Differential Clock (Up to 250 MHz)
Rev. 0 | Page 18 of 32
Page 19
AD6672

Clock Duty Cycle

Typical high speed ADCs use both clock edges to generate a variety of internal timing signals and, as a result, may be sensitive to clock duty cycle. Commonly, a ±5% tolerance is required on the clock duty cycle to maintain dynamic performance characteristics.
The AD6672 contains a DCS that retimes the nonsampling (falling) edge, providing an internal clock signal with a nominal 50% duty cycle. This allows the user to provide a wide range of clock input duty cycles without affecting the performance of the
AD6672.
Jitter on the rising edge of the input clock is still of paramount concern and is not reduced by the duty cycle stabilizer. The duty cycle control loop does not function for clock rates less than 40 MHz nominally. The loop has a time constant associated with it that must be considered when the clock rate may change dynamically. A wait time of 1.5 µs to 5 µs is required after a dynamic clock frequency increase or decrease before the DCS loop is relocked to the input signal. During the time that the loop is not locked, the DCS loop is bypassed, and internal device timing is dependent on the duty cycle of the input clock signal. In such applications, it may be appropriate to disable the duty cycle stabilizer. In all other applications, enabling the DCS circuit is recommended to maximize ac performance.

Jitter Considerations

High speed, high resolution ADCs are sensitive to the quality of the clock input. The degradation in SNR at a given input frequency (f
SNR
) due to jitter (tJ) can be calculated by
IN
= −10 log[(2π × fIN × t
HF
)2 + 10 ]
JRMS
)10/(LFSNR
In the equation, the rms aperture jitter represents the root-mean­square of all jitter sources, which include the clock input, the analog input signal, and the ADC aperture jitter specification. IF undersampling applications are particularly sensitive to jitter, as shown in Figure 34.
80
75
70
65
SNR (dBFS)
60
55
50
110100
INPUT FREQ UENCY (MHz)
Figure 34. SNR vs. Input Frequency and Jitter
0.05ps
0.2ps
0.5ps 1ps
1.5ps MEASURED
1k
09997-034
In cases where aperture jitter may affect the dynamic range of the
AD6672, treat the clock input as an analog signal. In addition,
use separate power supplies for the clock drivers and the ADC output driver to avoid modulating the clock signal with digital noise. Low jitter, crystal controlled oscillators provide the best clock sources. If the clock is generated from another type of source (by gating, dividing, or another method), it should be retimed by the original clock during the last step.
Refer to the AN-501 Application Note, Aperture Uncertainty and
ADC System Performance, and the AN-756 Application Note, Sampled Systems and the Effects of Clock Phase Noise and Jitter, for
more information about jitter performance as it relates to ADCs.

POWER DISSIPATION AND STANDBY MODE

As shown in Figure 35, the power dissipated by the AD6672 is proportional to its sample rate. The data in Figure 35 was taken using the same operating conditions as those used for the Typical Performance Characteristics section.
0.40
0.30
TOTAL POWER
0.20
TOTAL POWER (W)
0.10
0
40 25055 70 85 100 115 130 145 160 175 190 205 220 235
Figure 35. AD6672-250 Power and Current vs. Sample Rate
IAVDD
IDRVDD
ENCODE FREQ UENCY (MSP S)
By setting the internal power-down mode bits (Bits[1:0]) in the power modes register (Address 0x08) to 01, the AD6672 is placed in power-down mode. In this state, the ADC typically dissipates 2.5 mW. During power-down, the output drivers are placed in a high impedance state.
Low power dissipation in power-down mode is achieved by shutting down the reference, reference buffer, biasing networks, and clock. Internal capacitors are discharged when entering power-down mode and then must be recharged when returning to normal operation. As a result, the wake-up time is related to the time spent in power-down mode, and shorter power-down cycles result in proportionally shorter wake-up times.
When using the SPI port interface, the user can place the ADC in power-down mode or standby mode. Standby mode allows the user to keep the internal reference circuitry powered when faster wake-up times are required. To put the part into standby mode, set the internal power-down mode bits (Bits[1:0]) in the power modes register (Address 0x08) to 10. See the Memory Map section and the AN-877 Application Note, Interfacing to High Speed ADCs via SPI, for additional details.
0.25
0.20
0.15
0.10
SUPPLY CURRENT (A)
0.05
0
09997-035
Rev. 0 | Page 19 of 32
Page 20
AD6672

DIGITAL OUTPUTS

The AD6672 output drivers can be configured for either ANSI LVDS or reduced swing LVDS using a 1.8 V DRVDD supply.
As detailed in the AN-877 Application Note, Interfacing to High Speed ADCs via SPI, the data format can be selected for offset binary, twos complement, or gray code when using the SPI control.

Digital Output Enable Function (OEB)

The AD6672 has a flexible three-state ability for the digital output pins. The three-state mode is enabled using the SPI interface. The data outputs can be three-stated by using the output enable bar bit (Bit 4) in Register 0x14. This OEB function is not intended for rapid access to the data bus.

Timing

The AD6672 provides latched data with a pipeline delay of 10 input sample clock cycles when NSR is disabled and provides 13 input sample clock cycles when NSR is enabled. Data outputs
Table 10. Output Data Format
VIN+ − VIN−,
Input (V)
VIN+ − VIN− <−0.875 000 0000 0000 100 0000 0000 1 VIN+ − VIN− −0.875 000 0000 0000 100 0000 0000 0 VIN+ − VIN− 0 100 0000 0000 000 0000 0000 0 VIN+ − VIN− +0.875 111 1111 1111 011 1111 1111 0 VIN+ − VIN− >+0.875 111 1111 1111 011 1111 1111 1
Input Span = 1.75 V p-p (V) Offset Binary Output Mode Twos Complement Mode (Default) OR
are available one propagation delay (t the clock signal.
Minimize the length of the output data lines as well as the loads placed on these lines to reduce transients within the AD6672. These transients may degrade converter dynamic performance.
The lowest typical conversion rate of the AD6672 is 40 MSPS. At clock rates below 40 MSPS, dynamic performance may degrade.

Data Clock Output (DCO)

The AD6672 also provides the data clock output (DCO) intended for capturing the data in an external register. Figure 2 shows a timing diagram of the AD6672 output modes.

ADC OVERRANGE (OR)

The ADC overrange indicator is asserted when an overrange is detected on the input of the ADC. The overrange condition is determined at the output of the ADC pipeline and, therefore, is subject to a latency of 10 ADC clock cycles. An overrange at the input is indicated by this bit 10 clock cycles after it occurs.
) after the rising edge of
PD
Rev. 0 | Page 20 of 32
Page 21
AD6672

NOISE SHAPING REQUANTIZER

The AD6672 features a noise shaping requantizer (NSR) to allow more than an 11-bit SNR to be maintained in a subset of the Nyquist band. The harmonic performance of the receiver is unaffected by the NSR feature. When enabled, the NSR contributes an additional 0.6 dB of loss to the input signal, such that a 0 dBFS input is reduced to −0.6 dBFS at the output pins.
Two bandwidth (BW) modes are provided; the mode can be selected from the SPI port. In each mode, the center frequency of the band can be tuned such that IFs can be placed anywhere in the Nyquist band.

22% BW NSR MODE (55 MHz BW AT 250 MSPS)

The first bandwidth mode offers excellent noise performance over 22% of the ADC sample rate (44% of the Nyquist band) and can be centered by setting the NSR mode bits (Bits[3:1]) in the NSR control register (Address 0x3C) to 000. In this mode, the useful frequency range can be set using the 6-bit tuning word (Bits[5:0]) in the NSR tuning register (Address 0x3E). There are 57 possible tuning words (TW); each step is 0.5% of the ADC sample rate. The following equations describe the left band edge (f edge (f
f
f
f
Figure 36 to Figure 38 show the typical spectrum that can be expected from the AD6672 in the 22% bandwidth mode for three tuning words.
AMPLITUDE (dBFS)
), the channel center (f
0
), respectively:
1
= f
× 0.005 × TW
0
ADC
= f0 + 0.11 × f
CENTER
= f0 + 0.22 × f
1
0
250MSPS
180.1MHz @ –1.6BF S
–20
SNR = 73.4dB (75.0d BFS) SFDR = 92dBc (IN BAND)
–40
–60
–80
–100
–120
ADC
), and the right band
CENTER
ADC
0
250MSPS
180.1MHz @ –1.6BF S
–20
SNR = 73.4dB (75.0d BFS) SFDR = 93dBc (IN BAND)
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 25 50 75 100 125
FREQUENCY (MHz )
09997-037
Figure 37. 22% Bandwidth Mode, Tuning Word = 28
0
250MSPS
180.1MHz @ –1.6BF S
–20
SNR = 73.3dB (74.9d BFS) SFDR = 92dBc (IN BAND)
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 25 50 75 100 125
FREQUENCY (MHz )
09997-038
Figure 38. 22% Bandwidth Mode, Tuning Word = 41

33% BW NSR MODE (>82 MHZ BW AT 250 MSPS)

The 33% bandwidth NSR mode offers excellent noise performance over 33% of the ADC sample rate (66% of the Nyquist band). The fundamental can be tuned using a low-pass, band-pass, or high-pass filter by setting the NSR tuning word bits (Bits[5:0]) in Register 0x3E.
Figure 39 to Figure 41 show the typical spectrum that can be expected from the AD6672 with the 33% bandwidth NSR mode enabled for three filter settings.
–140
0 25 50 75 100 125
FREQUENCY (MHz )
Figure 36. 22% Bandwidth Mode, Tuning Word = 13
09997-036
Rev. 0 | Page 21 of 32
Page 22
AD6672
0
250MSPS
180.1MHz @ –1.6BF S
–20
SNR = 71.1dB (72.7d BFS) SFDR = 92dBc (IN BAND)
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 25 50 75 100 125
FREQUENCY (MHz )
Figure 39. 33% Bandwidth Mode, Tuning Word = 5
0
250MSPS
180.1MHz @ –1.6BF S
–20
SNR = 71.2dB (72.8d BFS) SFDR = 92dBc (IN BAND)
–40
–60
–80
AMPLITUDE (dBFS)
–100
0
250MSPS
180.1MHz @ –1.6BF S
–20
SNR = 70.9dB (72.5d BFS) SFDR = 92dBc (IN BAND)
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
–140
0 25 50 75 100 125
09997-039
FREQUENCY (MHz )
09997-041
Figure 41. 33% Bandwidth Mode, Tuning Word = 27
–120
–140
0 25 50 75 100 125
FREQUENCY (MHz )
09997-040
Figure 40. 33% Bandwidth Mode, Tuning Word = 17
Rev. 0 | Page 22 of 32
Page 23
AD6672

SERIAL PORT INTERFACE (SPI)

The AD6672 serial port interface (SPI) allows the user to configure the converter for specific functions or operations through a structured register space provided inside the ADC. The SPI offers added flexibility and customization, depending on the application. Addresses are accessed via the serial port and can be written to or read from via the port. Memory is organized into bytes that can be further divided into fields. These fields are documented in the Memory Map section. For detailed operational information, see the AN-877 Application
Note, Interfacing to High Speed ADCs via SPI.

CONFIGURATION USING THE SPI

Three pins define the SPI of this ADC: the SCLK pin, the SDIO pin, and the CSB pin (see Tabl e 1 1 ). The SCLK (serial clock) pin is used to synchronize the read and write data presented from and to the ADC. The SDIO (serial data input/output) pin is a dual-purpose pin that allows data to be sent and read from the internal ADC memory map registers. The CSB (chip select bar) pin is an active low control that enables or disables the read and write cycles.
Table 11. Serial Port Interface Pins
Pin Function
SCLK
Serial clock. The serial shift clock input, which is used to synchronize serial interface reads and writes.
SDIO
Serial data input/output. A dual-purpose pin that typically serves as an input or an output, depending on the instruction being sent and the relative position in the timing frame.
CSB
Chip select bar. An active low control that gates the read and write cycles.
The falling edge of CSB, in conjunction with the rising edge of SCLK, determines the start of the framing. An example of the serial timing and its definitions can be found in Figure 42 and Tabl e 5 .
Other modes involving the CSB are available. The CSB can be held low indefinitely, which permanently enables the device; this is called streaming. The CSB can stall high between bytes to allow for additional external timing. When CSB is tied high, SPI functions are placed in a high impedance mode. This mode turns on any SPI pin secondary functions.
During an instruction phase, a 16-bit instruction is transmitted. Data follows the instruction phase, and its length is determined by the W0 and W1 bits.
All data is composed of 8-bit words. The first bit of each individual byte of serial data indicates whether a read or write command is issued. This allows the serial data input/output (SDIO) pin to change direction from an input to an output.
In addition to word length, the instruction phase determines whether the serial frame is a read or write operation, allowing the serial port to be used both to program the chip and to read the contents of the on-chip memory. If the instruction is a readback operation, performing a readback causes the serial data input/output (SDIO) pin to change direction from an input to an output at the appropriate point in the serial frame.
Data can be sent in MSB first mode or in LSB first mode. MSB first mode is the default on power-up and can be changed via the SPI port configuration register. For more information about this and other features, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.

HARDWARE INTERFACE

The pins described in Ta b l e 11 comprise the physical interface between the user programming device and the serial port of the
AD6672. The SCLK pin and the CSB pin function as inputs
when using the SPI interface. The SDIO pin is bidirectional, functioning as an input during write phases and as an output during readback.
The SPI interface is flexible enough to be controlled by either FPGAs or microcontrollers. One method for SPI configuration is described in detail in the AN-812 Application Note, Micro- controller-Based Serial Port Interface (SPI) Boot Circuit.
The SPI port should not be active during periods when the full dynamic performance of the converter is required. Because the SCLK signal, the CSB signal, and the SDIO signal are typically asynchronous to the ADC clock, noise from these signals can degrade converter performance. If the on-board SPI bus is used for other devices, it may be necessary to provide buffers between this bus and the AD6672 to prevent these signals from transitioning at the converter inputs during critical sampling periods.
Rev. 0 | Page 23 of 32
Page 24
AD6672

SPI ACCESSIBLE FEATURES

Tabl e 1 2 provides a brief description of the general features that are accessible via the SPI. These features are described in detail in the AN-877 Application Note, Interfacing to High Speed ADCs via SPI. The AD6672 part-specific features are described in the Memory Map Register Description section.
Table 12. Features Accessible Using the SPI
Feature Name Description
Mode Allows the user to set either power-down mode or standby mode Clock Allows the user to access the DCS via the SPI Offset Allows the user to digitally adjust the converter offset Test I/O Allows the user to set test modes to have known data on output bits Output Mode Allows the user to set up outputs Output Phase Allows the user to set the output clock polarity Output Delay Allows the user to vary the DCO delay VREF Allows the user to set the reference voltage Digital Processing Allows the user to enable the synchronization features
t
HIGH
t
LOW
t
CLK
CSB
t
DS
t
S
t
DH
t
H
SCLK
SDIO
DON’T CA RE
R/W W1 W0 A12 A11 A10 A9 A8 A7
Figure 42. Serial Port Interface Timing Diagram
D5 D4 D3 D2 D1 D0
DON’T CA RE
DON’T CA REDON’T CA RE
9997-042
Rev. 0 | Page 24 of 32
Page 25
AD6672

MEMORY MAP

READING THE MEMORY MAP REGISTER TABLE

Each row in the memory map register table has eight bit locations. The memory map is roughly divided into four sections: the chip configuration registers (Address 0x00 to Address 0x02); the transfer register (Address 0xFF); the ADC functions registers, including setup, control, and test (Address 0x08 to Address 0x25); and the digital feature control registers (Address 0x3C and Address 0x3E).
The memory map register table (Ta bl e 13 ) documents the default hexadecimal value for each hexadecimal address shown. The Bit 7 (MSB) column is the start of the default hexadecimal value given. For example, Address 0x14, the output mode register, has a hexadecimal default value of 0x01. This means that Bit 0 = 1 and the remaining bits are 0s. This setting is the default output format value, which is twos complement. For more information on this function and others, see the AN-877
Application Note, Interfacing to High Speed ADCs via SPI. This
document details the functions controlled by Register 0x00 to Register 0x25. The remaining registers, Register 0x3C and Register 0x3E, are documented in the Memory Map Register Description section.

Open Locations

All address and bit locations that are not included in Tab l e 1 3 are not currently supported for this device. Write 0s to unused bits of a valid address location. Writing to these locations is required only when part of an address location is open (for
example, Address 0x18). If the entire address location is open (for example, Address 0x13), this address location should not be written.

Default Values

After the AD6672 is reset, critical registers are loaded with default values. The default values for the registers are given in the memory map register table (Tabl e 13 ).

Logic Levels

An explanation of logic level terminology follows:
“Bit is set” is synonymous with “bit is set to Logic 1” or
“writing Logic 1 for the bit.”
“Clear a bit” is synonymous with “bit is set to Logic 0” or
“writing Logic 0 for the bit.”

Transfer Register Map

Address 0x08 to Address 0x20, as well as Address 0x3C and Address 0x3E, are shadowed. Writes to these addresses do not affect part operation until a transfer command is issued by writing 0x01 to Address 0xFF, setting the transfer bit. This allows these registers to be updated internally and simultaneously when the transfer bit is set. The internal update takes place when the transfer bit is set, and then the bit autoclears.
Rev. 0 | Page 25 of 32
Page 26
AD6672

MEMORY MAP REGISTER TABLE

All address and bit locations that are not included in Tab l e 1 3 are not currently supported for this device.
Table 13. Memory Map Registers
Addr
Register
(Hex)
Name
Chip Configuration Registers 0x00
SPI port configuration
0x01 Chip ID
0x02 Chip grade Open Open Speed grade ID
Transfer Register 0xFF Transfer Open Open Open Open Open Open Open Transfer 0x00
ADC Functions Registers 0x08 Power modes Open Open Open Open Open Open
0x09 Global clock Open Open Open Open Open Open Open
0x0B Clock divide Open Open Input clock divider phase adjust
0x0D Test mode
0x0E BIST enable Open Open Open Open Open
Bit 7 (MSB)
0 LSB first Soft reset 1 1 Soft reset LSB first 0 0x18
User test mode control
0 = con­tinuous/ repeat pattern 1 = single pattern, then 0s
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
8-bit chip ID[7:0] (AD6672 = 0xA4)
(default)
Open Open Open Open
Internal power-down mode
00 = normal operation 01 = full power-down 10 = standby 11 = reserved
Clock divide ratio 000 = divide by 1
001 = divide by 2 010 = divide by 3 011 = divide by 4 100 = divide by 5 101 = divide by 6 110 = divide by 7 111 = divide by 8
Output test mode 0000 = off (default) 0001 = midscale short
0010 = positive FS 0011 = negative FS 0100 = alternating checkerboard 0101 = PN long sequence 0110 = PN short sequence 0111 = one/zero word toggle 1000 = user test mode 1001 to 1110 = unused 1111 = ramp output
Reset BIST sequence
Open
Open
00 = 250 MSPS
000 = no delay 001 = 1 input clock cycle 010 = 2 input clock cycles 011 = 3 input clock cycles 100 = 4 input clock cycles 101 = 5 input clock cycles 110 = 6 input clock cycles 111 = 7 input clock cycles
Reset PN long ge n
Reset PN short gen
Bit 0 (LSB)
Duty cycle stabilizer (default)
BIST enable
Default Value (Hex)
0xA4 Read only.
0x00
0x01
0x00
0x00
0x00
Default Notes/ Comments
Nibbles are mirrored so that LSB first mode or MSB first mode is set correctly, regardless of shift mode.
Speed grade ID used to dif­ferentiate devices; read only.
Synchro­nously transfers data from the master shift register to the slave.
Determines various generic modes of chip operation.
Clock divide values other than 000 auto­matically cause the duty cycle stabilizer to become active.
When this register is set, the test data is placed on the output pins in place of normal data.
Rev. 0 | Page 26 of 32
Page 27
AD6672
Default
Addr
Register
(Hex)
Name
0x10 Offset adjust Open Open
0x14 Output mode Open Open Open
0x15 Output adjust Open Open Open Open LVDS output drive current adjust
0x16
Clock phase control
0x17
DCO output delay
0x18
Input span select
0x19
User Test Pattern 1 LSB
0x1A
User Test Pattern 1 MSB
0x1B
User Test Pattern 2 LSB
0x1C
User Test Pattern 2 MSB
0x1D
User Test Pattern 3 LSB
0x1E
User Test Pattern 3 MSB
0x1F
User Test Pattern 4 LSB
0x20
User Test Pattern 4 MSB
0x24
BIST signature LSB
0x25
BIST signature
MSB Digital Feature Control Registers 0x3C NSR control Open Open Open Open NSR mode
0x3E
NSR tuning
word
Bit 7 (MSB)
Invert DCO clock
Enable DCO clock delay
Open Open Open Full-scale input voltage selection
Open Open NSR tuning word
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
Offset adjust in LSBs from +31 to −32
(twos complement format)
Output enable bar
0 = on 1 = off
Open Open Open Open Open Open Open 0x00
Open Open DCO clock delay
User Test Pattern 1[7:0] 0x00
User Test Pattern 1[15:8] 0x00
User Test Pattern 2[7:0] 0x00
User Test Pattern 2[15:8] 0x00
User Test Pattern 3[7:0] 0x00
User Test Pattern 3[15:8] 0x00
User Test Pattern 4[7:0] 0x00
User Test Pattern 4[15:8] 0x00
BIST signature[7:0] 0x00 Read only.
BIST signature[15:8] 0x00 Read only.
equations for the tuning word are dependent on the NSR mode)
Open
0000 = 3.72 mA output drive current 0001 = 3.5 mA output drive current (default) 0010 = 3.30 mA output drive current 0011 = 2.96 mA output drive current 0100 = 2.82 mA output drive current 0101 = 2.57 mA output drive current 0110 = 2.27 mA output drive current 0111 = 2.0 mA output drive current (reduced range) 1000 to 1111 = reserved
[delay = (3100 ps × register value/31 +100)]
000 = 22% bandwidth mode 001 = 33% bandwidth mode
(see the Noise Shaping Requantizer section;
Output invert
0 = normal (default) 1 = inverted
00000 = 100 ps 00001 = 200 ps 00010 = 300 ps … 11110 = 3100 ps 11111 = 3200 ps
01111 = 2.087 V p-p … 00001 = 1.772 V p-p 00000 = 1.75 V p-p (default) 11111 = 1.727 V p-p … 10000 = 1.383 V p-p
Output format 00 = offset binary
01 = twos complement (default) 10 = gray code 11 = reserved
Bit 0 (LSB)
NSR enable
0 = off 1 = on
Value (Hex)
0x00
0x01
0x01
0x00
0x00
0x00
0x1C
Default Notes/ Comments
Configures the outputs and the format of the data.
Full-scale input adjustment in 0.022 V steps.
NSR controls.
NSR fre­quency tuning word.
Rev. 0 | Page 27 of 32
Page 28
AD6672

MEMORY MAP REGISTER DESCRIPTION

For more information on functions controlled in Register 0x00 to Register 0x25, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.

NSR Control (Register 0x3C)

Bits[7:4]—Reserved
Bits[3:1]—NSR Mode
Bits[3:1] determine the bandwidth mode of the NSR. When Bits[3:1] are set to 000, the NSR is configured for 22% bandwidth mode, which provides enhanced SNR performance over 22% of the sample rate. When Bits[3:1] are set to 001, the NSR is configured for 33% bandwidth mode, which provides enhanced SNR performance over 33% of the sample rate.
Bit 0—NSR Enable
The NSR is enabled when Bit 0 is high and disabled when Bit 0 is low.

NSR Tuning Word (Register 0x3E)

Bits[7:6]—Reserved
Bits[5:0]—NSR Tuning Word
The NSR tuning word sets the band edges of the NSR band. In 22% bandwidth mode, there are 57 possible tuning words; in 33% bandwidth mode, there are 34 possible tuning words. In either mode, each step represents 0.5% of the ADC sample rate. For the equations that are used to calculate the tuning word based on the bandwidth mode of operation, see the Noise Shaping Requantizer section.
Rev. 0 | Page 28 of 32
Page 29
AD6672

APPLICATIONS INFORMATION

DESIGN GUIDELINES

Before starting system level design and layout of the AD6672, it is recommended that the designer become familiar with these guidelines, which discuss the special circuit connections and layout requirements for certain pins.

Power and Ground Recommendations

When connecting power to the AD6672, it is recommended that two separate 1.8 V supplies be used: use one supply for analog (AVDD) and a separate supply for the digital outputs (DRVDD). The designer can employ several different decoupling capacitors to cover both high and low frequencies. Locate these capacitors close to the point of entry at the PC board level and close to the pins of the part with minimal trace length.
A single PCB ground plane should be sufficient when using the
AD6672. With proper decoupling and smart partitioning of the
PCB analog, digital, and clock sections, optimum performance can be easily achieved.

Exposed Paddle Thermal Heat Slug Recommendations

It is mandatory that the exposed paddle on the underside of the ADC be connected to analog ground (AGND) to achieve the best electrical and thermal performance. A continuous, exposed (no solder mask) copper plane on the PCB should mate to the
AD6672 exposed paddle, Pin 0.
The copper plane should have several vias to achieve the lowest possible resistive thermal path for heat dissipation to flow through the bottom of the PCB. These vias should be filled or plugged with nonconductive epoxy.
To maximize the coverage and adhesion between the ADC and the PCB, overlay a silkscreen to partition the continuous plane on the PCB into several uniform sections. This provides several tie points between the ADC and the PCB during the reflow process. Using one continuous plane with no partitions guarantees only one tie point between the ADC and the PCB. See the evaluation board for a PCB layout example. For detailed information about the packaging and PCB layout of chip scale packages, refer to the AN-772 Application Note, A Design and
Manufacturing Guide for the Lead Frame Chip Scale Package (LFCSP).
VCM
Decouple the VCM pin to ground with a 0.1 F capacitor, as shown in Figure 26.

SPI Port

The SPI port should not be active during periods when the full dynamic performance of the converter is required. Because the SCLK, CSB, and SDIO signals are typically asynchronous to the ADC clock, noise from these signals can degrade converter performance. If the on-board SPI bus is used for other devices, it may be necessary to provide buffers between this bus and the
AD6672 to keep these signals from transitioning at the
converter input pins during critical sampling periods.
Rev. 0 | Page 29 of 32
Page 30
AD6672

OUTLINE DIMENSIONS

PIN 1
INDICATOR
5.10
5.00 SQ
4.90
0.50 BSC
24
0.30
0.25
0.18
25
EXPOSED
PAD
P
N
I
32
1
N
I
*
3.75
3.60 SQ
3.55
1
A
O
R
T
D
C
I
0.80
0.75
0.70
SEATING
PLANE
0.50
0.40
0.30
0.05 MAX
0.02 NOM COPLANARITY
0.20 REF
*
COMPLIANT TO JEDEC STANDARDS MO-220-WHHD-5
WITH EXCEPTION TO EXPOSED PAD DIMENSION.
17
BOTTOM VIEWTOP VIEW
0.08
8
916
0.25 MIN
FOR PROPER CONNECTION OF THE EXPOSED PAD, REFER TO THE PIN CONFIGURATION AND FUNCTION DESCRIPTIONS SECTION OF THIS DATA SHEET.
08-16-2010-B
Figure 43. 32-Lead Lead Frame Chip Scale Package [LFCSP_WQ]
5 mm × 5 mm Body, Very Very Thin Quad
(CP-32-12)
Dimensions shown in millimeters

ORDERING GUIDE

Model1 Temperature Range Package Description Package Option
AD6672BCPZ-250 −40°C to +85°C 32-Lead Lead Frame Chip Scale Package [LFCSP_WQ] CP-32-12 AD6672BCPZRL7-250 −40°C to +85°C 32-Lead Lead Frame Chip Scale Package [LFCSP_WQ] CP-32-12 AD6672-250EBZ −40°C to +85°C Evaluation Board with AD6672 and Software
1
Z = RoHS Compliant Part.
Rev. 0 | Page 30 of 32
Page 31
AD6672
NOTES
Rev. 0 | Page 31 of 32
Page 32
AD6672
NOTES
©2011 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D09997-0-7/11(0)
Rev. 0 | Page 32 of 32
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