High relative accuracy (INL): ±2 LSB maximum at 16 bits
Tiny package: 3 mm × 3 mm, 16-lead LFCSP
Total unadjusted error (TUE): ±0.1% of FSR maximum
Offset error: ±1.5 mV maximum
Gain error: ±0.1% of FSR maximum
High drive capability: 20 mA, 0.5 V from supply rails
User-selectable gain of 1 or 2 (GAIN pin)
Reset to zero scale or midscale (RSTSEL pin)
1.8 V logic compatibility
400 kHz I
4 I
Low glitch: 0.5 nV-sec
Robust 3.5 kV HBM and 1.5 kV FICDM ESD rating
Low power: 1.8 mW at 3 V
2.7 V to 5.5 V power supply
−40°C to +105°C temperature range
APPLICATIONS
Digital gain and offset adjustment
Programmable attenuators
Process control (PLC I/O cards)
Industrial automation
Data acquisition systems
2
2
C-compatible serial interface
C addresses available
LOGIC
SCL
SDA
A1
A0
with I2C Interface
AD5696/AD5694
FUNCTIONAL BLOCK DIAGRAM
DD
AD5696/AD5694
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INTERFACE L OGIC
INPUT
REGISTER
GND
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
POWER-ON
RESET
RSTSELGAINLDAC RESET
Figure 1.
REF
STRING
DAC A
STRING
DAC B
STRING
DAC C
STRING
DAC D
GAIN =
×1/×2
BUFFER
BUFFER
BUFFER
BUFFER
POWER-
DOWN
LOGIC
V
A
OUT
V
B
OUT
V
C
OUT
V
D
OUT
10799-001
GENERAL DESCRIPTION
The AD5696 and AD5694, members of the nanoDAC+™ family,
are low power, quad, 16-/12-bit buffered voltage output DACs.
The devices include a gain select pin giving a full-scale output
of 2.5 V (gain = 1) or 5 V (gain = 2). The devices operate from
a single 2.7 V to 5.5 V supply, are guaranteed monotonic by
design, and exhibit less than 0.1% FSR gain error and 1.5 mV
offset error performance. The devices are available in a 3 mm ×
3 mm LFCSP package and in a TSSOP package.
The AD5696/AD5694 incorporate a power-on reset circuit and a
RSTSEL pin; the RSTSEL pin ensures that the DAC outputs power
up to zero scale or midscale and remain at that level until a valid
write takes place. The parts contain a per-channel power-down
feature that reduces the current consumption of the device in
power-down mode to 4 μA at 3 V.
The AD5696/AD5694 use a versatile 2-wire serial interface that
operates at clock rates up to 400 kHz and include a V
intended for 1.8 V/3 V/5 V logic.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Zero-Code Error 0.4 4 0.4 1.5 mV All 0s loaded to DAC register
Offset Error +0.1 ±4 +0.1 ±1.5 mV
Full-Scale Error +0.01 ±0.2 +0.01 ±0.1 % of FSR All 1s loaded to DAC register
Gain Error ±0.02 ±0.2 ±0.02 ±0.1 % of FSR
= 2.5 V; 1.8 V ≤ V
REF
≤ 5.5 V; RL = 2 kΩ; CL = 200 pF; all specifications T
LOGIC
MIN
to T
, unless otherwise noted.
MAX
design
design
±0.25 ±0.2 % of FSR Gain = 1
Offset Error Drift3
Gain Temperature
Coefficient
DC Power Supply Rejection
Ratio
3
3
DC Crosstalk3
±1 ±1 µV/°C ±1 ±1 ppm Of FSR/°C
0.15 0.15 mV/V DAC code = midscale; V
DD
5 V ± 10%
±2 ±2 µV Due to single channel, full-
=
scale output change
±3 ±3 µV/mA Due to load current change
±2 ±2 µV Due to power-down (per
channel)
Output Voltage Range 0 V
0 2 × V
0 V
REF
0 2 × V
V Gain = 1
REF
V Gain = 2 (see Figure 20)
Capacitive Load Stability 2 2 nF RL = ∞
Resistive Load4 1 1 kΩ
Load Regulation DAC code = midscale
80 80 µV/mA 5 V ± 10%; −30 mA ≤ I
OUT
≤
+30 mA
80 80 µV/mA 3 V ± 10%; −20 mA ≤ I
OUT
≤
+20 mA
Short-Circuit Current5 40 40 mA
Load Impedance at Rails6 25 25 Ω See Figure 20
Power-Up Time 2.5 2.5 µs Coming out of power-down
DD
= 5 V
mode; V
REFERENCE INPUT
Reference Current 90 90 µA V
180 180 µA V
= VDD = 5.5 V, gain = 1
= VDD = 5.5 V, gain = 2
Reference Input Range 1 VDD 1 VDD V Gain = 1
1 VDD/2 1 VDD/2 V Gain = 2
Reference Input Impedance 16 16 kΩ Gain = 2
32 32 kΩ Gain = 1
Rev. 0 | Page 3 of 24
Page 4
AD5696/AD5694 Data Sheet
INH
LOGIC
LOGIC
SINK
LOGIC
LOGIC
SOUR CE
LOGIC
I
LOGIC
3 3 µA
A Grade B Grade
Parameter Min Typ Max Min Typ Max Unit Test Conditions/Comments1
LOGIC INPUTS3
Input Current ±2 ±2 µA Per pin
Input Low Voltage, V
0.3 × V
INL
Input High Voltage, V
Pin Capacitance 2 2 pF
LOGIC OUTPUTS (SDA)3
Output Low Voltage, VOL 0.4 0.4 V I
Output High Voltage, VOH V
Floating State Output
Capacitance
POWER REQUIREMENTS
V
1.8 5.5 1.8 5.5 V
VDD 2.7 5.5 2.7 5.5 V Gain = 1
V
IDD VIH = VDD, VIL = GND, VDD =
Normal Mode7 0.59 0.7 0.59 0.7 mA
All Power-Down Modes8 1 4 1 4 µA −40°C to +85°C
6 6 µA −40°C to +105°C
1
Temperature range is −40°C to +105°C.
2
DC specifications are tested with the outputs unloaded, unless otherwise noted. Upper dead band (10 mV) exists only when V
with gain = 2. Linearity calculated using a reduced code range of 256 to 65,280 (AD5696) or 12 to 4080 (AD5694).
3
Guaranteed by design and characterization; not production tested.
4
Channel A and Channel B can have a combined output current of up to 30 mA. Similarly, Channel C and Channel D can have a combined output current of up to 30 mA
up to a junction temperature of 110°C.
5
VDD = 5 V. The device includes current limiting that is intended to protect the device during temporary overload conditions. Junction temperature can be exceeded
during current limit. Operation above the specified maximum junction temperature may impair device reliability.
6
When drawing a load current at either rail, the output voltage headroom with respect to that rail is limited by the 25 Ω typical channel resistance of the output devices.
For example, when sinking 1 mA, the minimum output voltage = 25 Ω × 1 mA = 25 mV (see Figure 20).
7
Interface inactive. All DACs active. DAC outputs unloaded.
8
All DACs powered down.
0.3 × V
0.7 × V
LOGIC
0.7 × V
− 0.4 V
V
− 0.4 V I
LOGIC
4 4 pF
+ 1.5 5.5 V
REF
+ 1.5 5.5 V Gain = 2
REF
V
2.7 V to 5.5 V
= VDD with gain = 1 or when V
REF
= 3 mA
= 3 mA
/2 = VDD
REF
Rev. 0 | Page 4 of 24
Page 5
Data Sheet AD5696/AD5694
1, 2
OUT
OUT
OUT
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V; V
Table 3.
Parameter
Min Typ Max Unit Test Conditions/Comments3
Output Voltage Settling Time ¼ to ¾ scale settling to ±2 LSB
AD56965 8 µs
AD56945 7 µs
Slew Rate 0.8 V/µs
Digital-to-Analog Glitch Impulse 0.5 nV-sec 1 LSB change around major carry transition
Digital Feedthrough 0.13 nV-sec
Multiplying Bandwidth 500 kHz
Digital Crosstalk 0.1 nV-sec
Analog Crosstalk 0.2 nV-sec
DAC-to-DAC Crosstalk 0.3 nV-sec
Total Harmonic Distortion4 −80 dB At TA, BW = 20 kHz, VDD = 5 V, f
Output Noise Spectral Density 100 nV/√Hz DAC code = midscale, 10 kHz, gain = 2
Output Noise 6 µV p-p 0.1 Hz to 10 Hz
Signal-to-Noise Ratio (SNR) 90 dB At TA, BW = 20 kHz, VDD = 5 V, f
Spurious-Free Dynamic Range (SFDR) 83 dB At TA, BW = 20 kHz, VDD = 5 V, f
Signal-to-Noise-and-Distortion Ratio
(SINAD)
1
Guaranteed by design and characterization; not production tested.
2
See the Terminology section.
3
Temperature range is −40°C to +105°C; typical at 25°C.
4
Digitally generated sine wave at 1 kHz.
= 2.5 V; 1.8 V ≤ V
REF
≤ 5.5 V; RL = 2 kΩ; CL = 200 pF; all specifications T
LOGIC
MIN
to T
, unless otherwise noted.
MAX
80 dB At TA, BW = 20 kHz, VDD = 5 V, f
= 1 kHz
= 1 kHz
= 1 kHz
= 1 kHz
OUT
Rev. 0 | Page 5 of 24
Page 6
AD5696/AD5694 Data Sheet
1, 2
HIGH
LOW
HD, STA
SU ,DAT
6
3
HD ,DAT
SU, STA
SU,ST O
BUF
10
11
SP
6
B
SCL
SDA
t
1
t
3
LDAC
1
LDAC
2
START
CONDITION
REPEATED START
CONDITION
STOP
CONDITION
NOTES
1
ASYNCHRONOUS LDAC UPDATE MO DE .
2
SYNCHRONOUS LDAC UPDATE MO DE .
t
4
t
6
t
5
t
7
t
8
t
2
t
13
t
4
t
11
t
10
t
12
t
12
t
9
10799-002
TIMING CHARACTERISTICS
VDD = 2.7 V to 5.5 V; 1.8 V ≤ V
Table 4.
Parameter
Min Max Unit Description
t1 2.5 µs SCL cycle time
t2 0.6 µs t
t3 1.3 µs t
t4 0.6 µs t
t5 100 ns t
t
0 0.9 µs t
t7 0.6 µs t
t8 0.6 µs t
t9 1.3 µs t
4
t
0 300 ns tR, rise time of SCL and SDA when receiving
4, 5
t
20 + 0.1CB 300 ns tF, fall time of SCL and SDA when transmitting/receiving
t12 20 ns
t13 400 ns SCL rising edge to
t
0 50 ns Pulse width of suppressed spike
5
C
400 pF Capacitive load for each bus line
1
See Figure 2.
2
Guaranteed by design and characterization; not production tested.
3
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to the VIH min of the SCL signal) to bridge the undefined region of the SCL
falling edge.
4
tR and tF are measured from 0.3 × VDD to 0.7 × VDD.
5
CB is the total capacitance of one bus line in pF.
6
Input filtering on the SCL and SDA inputs suppresses noise spikes that are less than 50 ns.
Timing Diagram
≤ 5.5 V; all specifications T
LOGIC
MIN
to T
, unless otherwise noted.
MAX
, SCL high time
, SCL low time
, start/repeated start hold time
, data setup time
, data hold time
, repeated start setup time
, stop condition setup time
, bus free time between a stop condition and a start condition
pulse width
LDAC
rising edge
LDAC
Figure 2. 2-Wire Serial Interface Timing Diagram
Rev. 0 | Page 6 of 24
Page 7
Data Sheet AD5696/AD5694
LOGIC
OUT
REF
LOGIC
Operating Temperature Range
−40°C to +105°C
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 5.
Parameter Rating
VDD to GND −0.3 V to +7 V
V
to GND −0.3 V to +7 V
V
to GND −0.3 V to VDD + 0.3 V
V
to GND −0.3 V to VDD + 0.3 V
Digital Input Voltage to GND1 −0.3 V to V
SDA and SCL to GND −0.3 V to +7 V
Storage Temperature Range −65°C to +150°C
Junction Temperature 125°C
Reflow Soldering Peak Temperature,
Pb Free (J-STD-020)
ESD
Human Body Model (HBM) 3.5 kV
Field-Induced Charged Device
Model (FICDM)
1
Excluding SDA and SCL.
260°C
1.5 kV
+ 0.3 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages. This
value was measured using a JEDEC standard 4-layer board with
zero airflow. For the LFCSP package, the exposed pad must be
tied to GND.
Table 6. Thermal Resistance
Package Type θJA Unit
16-Lead LFCSP 70 °C/W
16-Lead TSSOP 112.6 °C/W
ESD CAUTION
Rev. 0 | Page 7 of 24
Page 8
AD5696/AD5694 Data Sheet
OUT
OUT
OUT
DD
REF
LOGIC
, the input register and the DAC register are updated with zero scale or midscale, depending
DD
REF
OUT
12
11
10
1
3
4
A1
SCL
A0
9
V
LOGIC
V
OUT
A
V
DD
2
GND
V
OUT
C
6
SDA
5
V
OUT
D
7
LDAC
8
GAIN
16
V
OUT
B
15
V
REF
14
RSTSEL
13
RESET
AD5696/AD5694
NOTES
1. THE EXPOSED PAD MUST BE TIED TO GND.
TOP VIEW
(Not to S cale)
10799-006
1
2
3
4
5
6
7
8
V
OUT
B
V
OUT
A
GND
V
OUT
D
V
OUT
C
V
DD
V
REF
SDA
16
15
14
13
12
11
10
9
RESET
A1
SCL
GAIN
LDAC
V
LOGIC
A0
RSTSEL
TOP VIEW
(Not to S cale)
AD5696/
AD5694
10799-007
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
Figure 3. Pin Configuration, 16-Lead LFCSP
Table 7. Pin Function Descriptions
Pin No.
LFCSP TSSOP
1 3 V
Mnemonic Description
A Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
2 4 GND Ground Reference Point for All Circuitry on the Part.
3 5 VDD Power Supply Input. The parts can be operated from 2.7 V to 5.5 V. The supply should be decoupled
with a 10 µF capacitor in parallel with a 0.1 µF capacitor to GND.
4 6 V
5 7 V
C Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
D Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
6 8 SDA Serial Data Input. This pin is used in conjunction with the SCL line to clock data into or out of the
24-bit input shift register. SDA is a bidirectional, open-drain data line that should be pulled to the
supply with an external pull-up resistor.
7 9
LDAC
can be operated in two modes, asynchronous update mode and synchronous update mode.
LDAC
Pulsing this pin low allows any or all DAC registers to be updated if the input registers have new
data; all DAC outputs are simultaneously updated. This pin can also be tied permanently low.
8 10 GAIN Gain Select Pin. When this pin is tied to GND, all four DAC outputs have a span of 0 V to V
9 11 V
When this pin is tied to V
Digital Power Supply. Voltage ranges from 1.8 V to 5.5 V.
, all four DAC outputs have a span of 0 V to 2 × V
10 12 A0 Address Input. Sets the first LSB of the 7-bit slave address.
11 13 SCL Serial Clock Line. This pin is used in conjunction with the SDA line to clock data into or out of the
24-bit input shift register.
12 14 A1 Address Input. Sets the second LSB of the 7-bit slave address.
13 15
Asynchronous Reset Input. The
RESET
RESET
(low)
on the state of the RSTSEL pin. When
14 16 RSTSEL Power-On Reset Pin. When this pin is tied to GND, all four DACs are powered up to zero scale.
15 1 V
16 2 V
When this pin is tied to V
Reference Input Voltage.
B Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
, all four DACs are powered up to midscale.
17 N/A EPAD Exposed Pad. The exposed pad must be tied to GND.
Rev. 0 | Page 8 of 24
Figure 4. Pin Configuration, 16-Lead TSSOP
input is falling edge sensitive. When
RESET
is low, all
pulses are ignored.
LDAC
.
RESET
.
REF
is activated
Page 9
Data Sheet AD5696/AD5694
10
–10
–8
–6
–4
–2
0
2
4
8
6
0100002000030000400005000060000
INL (LSB)
CODE
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-118
10
–10
–8
–6
–4
–2
0
2
4
8
6
062512501875250031253750 4096
INL (LSB)
CODE
VDD = 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-120
1.0
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.8
0.6
0100002000030000400005000060000
DNL (LSB)
CODE
VDD = 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-121
1.0
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.8
0.6
062512501875250031253750 4096
DNL (LSB)
CODE
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-123
10
–10
–8
–6
–4
–2
0
2
4
6
8
–401106010
ERROR (LSB)
TEMPERATURE (°C)
INL
DNL
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-124
10
–10
–8
–6
–4
–2
0
2
4
6
8
05.04.54.03.53.02.52.01.51.00.5
ERROR (LSB)
V
REF
(V)
INL
DNL
VDD = 5V
T
A
= 25°C
10799-125
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 5. AD5696 INL
Figure 6. AD5694 INL
Figure 8. AD5694 DNL
Figure 9. INL Error and DNL Error vs. Temperature
Figure 7. AD5696 DNL
Figure 10. INL Error and DNL Error vs. V
REF
Rev. 0 | Page 9 of 24
Page 10
AD5696/AD5694 Data Sheet
10
–10
–8
–6
–4
–2
0
2
4
6
8
2.75.24.74.23.73.2
ERROR (LSB)
SUPPLY VOLTAGE (V)
INL
DNL
VDD = 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-126
0.10
–0.10
–0.08
–0.06
–0.04
–0.02
0
0.02
0.04
0.06
0.08
–40–20020406080100120
ERROR (% of FSR)
TEMPERATURE (°C)
GAIN ERROR
FULL-S CALE ERROR
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-127
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
–40–20020406080100120
ERROR (mV)
TEMPERATURE (°C)
OFFSET ERROR
ZERO-CO DE E RROR
VDD = 5V
T
A
= 25°C
REFERENCE = 2. 5V
10799-128
0.10
–0.10
–0.08
–0.06
–0.04
–0.02
0
0.02
0.04
0.06
0.08
2.75.24.74.23.73.2
ERROR (% of FSR)
SUPPLY VOLTAGE (V)
GAIN ERROR
FULL-S CALE ERROR
VDD = 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-129
1.5
–1.5
–1.0
–0.5
0
0.5
1.0
2.75.24.74.23.73.2
ERROR (mV)
SUPPLY VOLTAGE (V)
ZERO-CO DE E RROR
OFFSET ERROR
VDD = 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-130
0.10
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
–40–200
20406080100120
TOTAL UNADJUS TED ERROR (% of FSR)
TEMPERATURE (°C)
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2. 5V
10799-131
Figure 11. INL Error and DNL Error vs. Supply Voltage
Figure 12. Gain Error and Full-Scale Error vs. Temperature
Figure 14. Gain Error and Full-Scale Error vs. Supply Voltage
Figure 15. Zero-Code Error and Offset Error vs. Supply Voltage
Figure 13. Zero-Code Error and Offset Error vs. Temperature
Figure 16. TUE vs. Temperature
Rev. 0 | Page 10 of 24
Page 11
Data Sheet AD5696/AD5694
0.10
0.08
0.06
0.04
0.02
0
–0.02
–0.04
–0.06
–0.08
–0.10
2.75.24.74.23.73.2
TOTAL UNADJUS TED ERROR (% of FSR)
SUPPLY VOLTAGE (V)
VDD = 5V
T
A
= 25°C
REFERENCE = 2. 5V
10799-132
0
–0.01
–0.02
–0.03
–0.04
–0.05
–0.06
–0.07
–0.08
–0.09
–0.10
01000020000300004000050000 60000 65535
TOTAL UNADJUS TED ERROR (% of FSR)
CODE
VDD = 5V
T
A
= 25°C
REFERENCE = 2. 5V
10799-133
25
20
15
10
5
0
540560580600620640
HITS
IDD (mA)
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2. 5V
10799-135
1.0
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.6
0.8
051015202530
ΔV
OUT
(V)
LOAD CURRENT ( mA)
SOURCING, 2.7V
SOURCING, 5V
SINKING, 2.7V
SINKING, 5V
10799-200
7
–2
–1
0
1
2
3
4
5
6
–0.06–0.04–0.0200.020.040.06
V
OUT
(V)
LOAD CURRENT ( A)
0xFFFF
0x4000
0x8000
0xC000
0x0000
VDD = 5V
T
A
= 25°C
REFERENCE = 2. 5V
GAIN = 2
10799-138
5
–2
–1
0
1
2
3
4
–0.06–0.04–0.0200.020.040.06
V
OUT
(V)
LOAD CURRENT ( A)
0xFFFF
0x4000
0x8000
0xC000
0x0000
VDD = 3V
T
A
= 25°C
REFERENCE = 2. 5V
GAIN = 1
10799-139
Figure 17. TUE vs. Supply Voltage, Gain = 1
Figure 18. TUE vs. Code, AD5696
Figure 20. Headroom/Footroom vs. Load Current
Figure 21. Source and Sink Capability at 5 V
Figure 19. I
Histogram at 5 V
DD
Figure 22. Source and Sink Capability at 3 V
Rev. 0 | Page 11 of 24
Page 12
AD5696/AD5694 Data Sheet
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
–401106010
CURRENT (mA)
TEMPERATURE (°C)
FULL-SCALE
10799-140
0
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
10320160408020
V
OUT
(V)
TIME (µs)
V
OUT
A
V
OUT
B
V
OUT
C
V
OUT
D
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2. 5V
¼ TO ¾ SCALE
10799-141
–0.01
0
0.06
0.01
0.02
0.03
0.04
0.05
–1
0
6
1
2
3
4
5
–10151005–5
V
OUT
(V)
V
DD
(V)
TIME (µs)
V
OUT
D
V
DD
V
OUT
A
V
OUT
B
V
OUT
C
TA = 25°C
REFERENCE = 2. 5V
10799-142
0
1
3
2
–51005
V
OUT
(V)
TIME (µs)
V
OUT
D
V
OUT
A
V
OUT
B
V
OUT
C
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2. 5V
GAIN = 1
GAIN = 2
10799-143
2.4988
2.5008
2.5003
2.4998
2.4993
012810462
V
OUT
(V)
TIME (µs)
CHANNEL B
T
A
= 25°C
V
DD
= 5.25V
REFERENCE = 2.5V
CODE = 0x7FF F TO 0x8000
ENERGY = 0. 227206nV-sec
10799-144
–0.002
–0.001
0
0.001
0.002
0.003
0252010155
V
OUT
AC-COUPLED ( V )
TIME (µs)
V
OUT
B
V
OUT
C
V
OUT
D
10799-145
Figure 23. Supply Current vs. Temperature
Figure 26. Exiting Power-Down to Midscale
Figure 24. Settling Time
Figure 25. Power-On Reset to 0 V
Figure 27. Digital-to-Analog Glitch Impulse
Rev. 0 | Page 12 of 24
Figure 28. Analog Crosstalk, V
OUT
A
Page 13
Data Sheet AD5696/AD5694
CH1 10µVM1.0sA CH1 802mV
1
T
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-146
–180
–160
–140
–120
–100
–80
–60
–40
–20
0
20
02000016000800012000400020001800010000140006000
THD (dBV)
FREQUENCY ( Hz )
VDD = 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-149
3.0
3.1
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
4.0
1.5901.6301.6201.6001.6101.6251.6051.6151.595
V
OUT
(V)
TIME (ms)
0nF
0.1nF
10nF
0.22nF
4.7nF
V
DD
= 5V
T
A
= 25°C
REFERENCE = 2.5V
10799-150
–60
–50
–40
–30
–20
–10
0
10k10M1M100k
BANDWIDTH (dB)
FREQUENCY ( Hz )
VDD = 5V
T
A
= 25°C
REFERENCE = 2.5V, ±0.1V p-p
10799-151
Figure 29. 0.1 Hz to 10 Hz Output Noise Plot
Figure 31. Settling Time vs. Capacitive Load
Figure 30. Total Harmonic Distortion at 1 kHz
Figure 32. Multiplying Bandwidth
Rev. 0 | Page 13 of 24
Page 14
AD5696/AD5694 Data Sheet
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
Relative accuracy or integral nonlinearity is a measurement of
the maximum deviation, in LSBs, from a straight line passing
through the endpoints of the DAC transfer function. Figure 5
and Figure 6 show typical INL vs. code plots.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent codes.
A specified differential nonlinearity of ±1 LSB maximum ensures
monotonicity. The AD5696/AD5694 are guaranteed monotonic
by design. Figure 7 and Figure 8 show typical DNL vs. code plots.
Zero-Code Error
Zero-code error is a measurement of the output error when
zero code (0x0000) is loaded to the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive in
the AD5696/AD5694 because the output of the DAC cannot go
below 0 V due to a combination of the offset errors in the DAC
and the output amplifier. Zero-code error is expressed in mV.
Figure 13 shows a plot of zero-code error vs. temperature.
Full-Scale Error
Full-scale error is a measurement of the output error when fullscale code (0xFFFF) is loaded to the DAC register. Ideally, the
output should be V
− 1 LSB. Full-scale error is expressed as a
DD
percentage of the full-scale range (% of FSR). Figure 12 shows a
plot of full-scale error vs. temperature.
Gain Error
Gain error is a measurement of the span error of the DAC. It is
the deviation in slope of the DAC transfer characteristic from
the ideal expressed in % of FSR.
Gain Temperature Coefficient
Gain temperature coefficient is a measurement of the change in
gain error with changes in temperature. It is expressed in ppm
of FSR/°C.
Offset Error
Offset error is a measurement of the difference between V
(actual) and V
(ideal) expressed in mV in the linear region
OUT
OUT
of the transfer function. It can be negative or positive.
Offset Error Drift
Offset error drift is a measurement of the change in offset error
with changes in temperature. It is expressed in µV/°C.
DC Power Supply Rejection Ratio (PSRR)
DC PSRR indicates how the output of the DAC is affected by
changes in the supply voltage. PSRR is the ratio of the change in
V
to a change in VDD for midscale output of the DAC. It is mea-
OUT
sured in mV/V. V
is held at 2.5 V, an d VDD is varied by ±10%.
REF
Rev. 0 | Page 14 of 24
Output Voltage Settling Time
The output voltage settling time is the amount of time it takes
for the output of a DAC to settle to a specified level for a ¼ to ¾
full-scale input change.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-sec
and is measured when the digital input code is changed by 1 LSB
at the major carry transition (0x7FFF to 0x8000) (see Figure 27).
Digital Feedthrough
Digital feedthrough is a measurement of the impulse injected into
the analog output of the DAC from the digital inputs of the DAC,
but is measured when the DAC output is not updated. It is
specified in nV-sec and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
Noise Spectral Density (NSD)
Noise spectral density is a measurement of the internally generated random noise. Random noise is characterized as a spectral
density (nV/√Hz) and is measured by loading the DAC to midscale and measuring noise at the output. It is measured in nV/√Hz.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC
in response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC (or soft
power-down and power-up) while monitoring another DAC
kept at midscale. It is expressed in μV.
DC crosstalk due to load current change is a measurement
of the impact that a change in load current on one DAC has
on another DAC kept at midscale. It is expressed in μV/mA.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output of
one DAC at midscale in response to a full-scale code change (all
0s to all 1s and vice versa) in the input register of another DAC.
It is expressed in nV-sec.
Analog Crosstalk
Analog crosstalk is the glitch impulse transferred to the output
of one DAC in response to a change in the output of another DAC.
To measure analog crosstalk, load one of the input registers with
a full-scale code change (all 0s to all 1s and vice versa), and then
execute a software LDAC and monitor the output of the DAC
whose digital code was not changed. The area of the glitch is
expressed in nV-sec.
Page 15
Data Sheet AD5696/AD5694
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse transferred to the
output of one DAC in response to a digital code change and
subsequent analog output change of another DAC. It is measured
by loading one channel with a full-scale code change (all 0s to
all 1s and vice versa) using the write to and update commands
while monitoring the output of another channel that is at midscale. The energy of the glitch is expressed in nV-sec.
Multiplying Bandwidth
The amplifiers within the DAC have a finite bandwidth. The
multiplying bandwidth is a measure of this. A sine wave on the
reference (with full-scale code loaded to the DAC) appears on
the output. The multiplying bandwidth is the frequency at
which the output amplitude falls to 3 dB below the input.
Total Harmonic Distortion (THD)
THD is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as the
reference for the DAC; THD is a measurement of the harmonics
present on the DAC output. It is measured in dB.
Rev. 0 | Page 15 of 24
Page 16
AD5696/AD5694 Data Sheet
×=
N
REF
OUT
D
GainVV
2
INPUT
REGISTER
DAC
REGISTER
RESISTOR
STRING
REF (+)
V
REF
GND
REF (–)
V
OUT
X
GAIN
(GAIN = 1 O R 2)
10799-052
R
R
R
R
R
TO OUTPUT
AMPLIFIER
V
REF
10799-053
THEORY OF OPERATION
DIGITAL-TO-ANALOG CONVERTER
The AD5696/AD5694 are quad, 16-/12-bit, serial input, voltage
output DACs that operate from supply voltages of 2.7 V to 5.5 V.
Data is written to the AD5696/AD5694 in a 24-bit word format
via a 2-wire serial interface. The AD5696/AD5694 incorporate a
power-on reset circuit to ensure that the DAC output powers up
to a known output state. The devices also have a software powerdown mode that reduces the current consumption to 4 µA.
TRANSFER FUNCTION
Because the input coding to the DAC is straight binary, the ideal
output voltage is given by
where:
V
is the value of the external reference.
REF
Gain is the gain of the output amplifier and is set to 1 by default.
The gain can be set to 1 or 2 using the gain select pin. When the
GAIN pin is tied to GND, all four DAC outputs have a span of
0 V to V
have a span of 0 V to 2 × V
. When this pin is tied to VDD, all four DAC outputs
REF
.
REF
D is the decimal equivalent of the binary code that is loaded to
the DAC register as follows: 0 to 4095 for the 12-bit AD5694,
and 0 to 65,535 for the 16-bit AD5696.
N is the DAC resolution (12 bits or 16 bits).
DAC ARCHITECTURE
The DAC architecture consists of a string DAC followed by an
output amplifier. Figure 33 shows a block diagram of the DAC
architecture.
Figure 33. Single DAC Channel Architecture Block Diagram
The resistor string structure is shown in Figure 34. Each resistor
in the string has a value R. The code loaded to the DAC register
determines the node on the string from which the voltage is
tapped off and fed into the output amplifier. The voltage is tapped
off by closing one of the switches that connect the string to the
amplifier. Because the AD5696/AD5694 are a string of resistors,
they are guaranteed monotonic.
Figure 34. Resistor String Structure
Output Amplifiers
The output buffer amplifier can generate rail-to-rail voltages on
its output for an output range of 0 V to V
depends on the value of V
, the GAIN pin, the offset error,
REF
. The actual range
DD
and the gain error. The GAIN pin selects the gain of the output.
•When this pin is tied to GND, all four outputs have a gain
of 1, and the output range is from 0 V to V
•When this pin is tied to V
, all four outputs have a gain
DD
of 2, and the output range is from 0 V to 2 × V
REF
.
.
REF
The output amplifiers are capable of driving a load of 1 kΩ in
parallel with 2 nF to GND. The slew rate is 0.8 V/µs with a ¼
to ¾ scale settling time of 5 µs.
C0 DAC D DAC C DAC B DAC A D11D10D9D8D7D6D5D4D3D2D1D0XXXX
COMMANDDAC ADDRESSDAC DATADAC DATA
COMMAND BYTEDATA HIGH BYTEDATA LOW BY TE
10799-300
SERIAL INTERFACE
The AD5696/AD5694 have a 2-wire, I2C-compatible serial
interface (see the I
2000, available from Philips Semiconductor). See Figure 2 for a
timing diagram of a typical write sequence. The AD5696/AD5694
can be connected to an I
of a master device. The AD5696/AD5694 support standard
(100 kHz) and fast (400 kHz) data transfer modes. Support is
not provided for 10-bit addressing or general call addressing.
Input Shift Register
The input shift register of the AD5696/AD5694 is 24 bits wide.
Data is loaded into the device, MSB first, as a 24-bit word under
the control of the serial clock input, SCL. The first eight MSBs
make up the command byte (see Figure 35 and Figure 36).
•The first four bits of the command byte are the command
bits (C3, C2, C1, and C0), which control the mode of operation of the device (see Table 8).
•The last four bits of the command byte are the address bits
(DAC D, DAC C, DAC B, and DAC A), which select the
DAC that is operated on by the command (see Tabl e 9).
The 8-bit command byte is followed by two data bytes, which
contain the data-word. For the AD5696, the data-word comprises
the 16-bit input code (see Figure 35); for the AD5694, the dataword comprises the 12-bit input code followed by four don’t care
bits (see Figure 36). The data bits are transferred to the input
shift register on the 24 falling edges of SCL.
Commands can be executed on one DAC channel, any two or
three DAC channels, or on all four DAC channels, depending
on the address bits selected (see Table 9).
2
C-Bus Specification, Version 2.1, January
2
C bus as slave devices, under the control
Table 8. Command Definitions
Command Bits
C3 C2 C1 C0 Command
0 0 0 0 No operation
0 0 0 1 Write to Input Register n (dependent
LDAC
)
on
0 0 1 0 Update DAC Register n with contents
of Input Register n
0 0 1 1 Write to and update DAC Channel n
0 1 0 0 Power down/power up DAC
0 1 0 1 Hardware
mask register
LDAC
0 1 1 0 Software reset (power-on reset)
1 X1 X1 X1 Reserved
1
X = don’t care.
Table 9. Address Bits and Selected DACs
Address Bits
Selected DAC Channels
0 0 0 1 DAC A
0 0 1 0 DAC B
0 0 1 1 DAC A and DAC B
0 1 0 1 DAC A and DAC C
0 1 1 0 DAC B and DAC C
0 1 1 1 DAC A, DAC B, and DAC C
1 0 0 0 DAC D
1 0 0 1 DAC A and DAC D
… … … … …
1 1 1 1 All DACs
1
Any combination of DAC channels can be selected using the address bits.
1
DAC D DAC C DAC B DAC A
Figure 35. Input Shift Register Contents, AD5696
Figure 36. Input Shift Register Contents, AD5694
Rev. 0 | Page 17 of 24
Page 18
AD5696/AD5694 Data Sheet
LOGIC
LOGIC
LOGIC
LOGIC
FRAME 2
COMMAND BYTE
FRAME 1
SLAVE ADDRESS
1991
SCL
START BY
MASTER
ACK BY
AD5696/AD5694
ACK BY
AD5696/AD5694
SDA
R/W
DB23A0A110001DB22 DB21 DB20 DB19 DB18 DB17 DB16
1991
ACK BY
AD5696/AD5694
ACK BY
AD5696/AD5694
FRAME 4
LEAST SIGNIFICANT
DATA BYTE
FRAME 3
MOST SIGNIFICANT
DATA BYTE
STOP BY
MASTER
SCL
(CONTINUED)
SDA
(CONTINUED)
DB15 DB14 DB13 DB12 DB11 DB10 DB9
DB8
DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
10799-303
WRITE AND UPDATE COMMANDS
For more information about the
DAC (Hardware
LDAC
Pin) section.
Write to Input Register n (Dependent on
Command 0001 allows the user to write to each DAC’s
dedicated input register individually. When
input register is transparent (if not controlled by the
mask register).
Update DAC Register n with Contents of Input Register n
Command 0010 loads the DAC registers/outputs with the
contents of the input registers selected by the address bits
(see Table 9) and updates the DAC outputs directly.
Write to and Update DAC Channel n (Independent of
Command 0011 allows the user to write to the DAC registers
and update the DAC outputs directly, independent of the state
LDAC
of the
pin.
LDAC
function, see the Load
LDAC
LDAC
)
is low, the
LDAC
LDAC
I2C SLAVE ADDRESS
The AD5696/AD5694 have a 7-bit I2C slave address. The five
MSBs are 00011, and the two LSBs (A1 and A0) are set by the
state of the A1 and A0 address pins. The ability to make hardwired changes to A1 and A0 allows the user to incorporate up
to four AD5696/AD5694 devices on one bus (see Table 10).
Table 10. Device Address Selection
A1 Pin Connection A0 Pin Connection A1 Bit A0 Bit
GND GND 0 0
GND V
V
GND 1 0
V
V
0 1
1 1
)
SERIAL OPERATION
The 2-wire I2C serial bus protocol operates as follows:
1. The master initiates a data transfer by establishing a start
condition when a high-to-low transition on the SDA line
occurs while SCL is high. The following byte is the address
byte, which consists of the 7-bit slave address.
2. The slave device with the transmitted address responds by
pulling SDA low during the 9
th
clock pulse (this is called
the acknowledge bit). At this stage, all other devices on the
bus remain idle while the selected device waits for data to
be written to, or read from, its input shift register.
3. Data is transmitted over the serial bus in sequences of nine
clock pulses (eight data bits followed by an acknowledge bit).
Transitions on the SDA line must occur during the low period
of SCL; SDA must remain stable during the high period of SCL.
4. After all data bits are read or written, a stop condition is
established. In write mode, the master pulls the SDA line high
during the 10
read mode, the master issues a no acknowledge for the 9
th
clock pulse to establish a stop condition. In
th
clock pulse (that is, the SDA line remains high). The master
then brings the SDA line low before the 10
then high again during the 10
th
clock pulse to establish a
th
clock pulse and
stop condition.
WRITE OPERATION
When writing to the AD5696/AD5694, the user must begin with
W
a start command followed by an address byte (R/
which the DAC acknowledges that it is prepared to receive data
by pulling SDA low. The AD5696/AD5694 require two bytes of
data for the DAC and a command byte that controls various DAC
functions. Three bytes of data must, therefore, be written to the
DAC with the command byte followed by the most significant
data byte and the least significant data byte, as shown in Figure 37.
All these data bytes are acknowledged by the AD5696/AD5694.
A stop condition follows.
When reading data back from the AD5696/AD5694, the user
must begin with a start command followed by an address byte
W
(R/
= 0), after which the DAC acknowledges that it is prepared
to receive data by pulling SDA low. The address byte must be
followed by the command byte, which determines both the read
command that is to follow and the pointer address to read from;
the command byte is also acknowledged by the DAC. The user
configures the channel to read back the contents of one or more
DAC registers and sets the readback command to active using
the command byte.
Following this, the master establishes a repeated start condition,
and the address is resent with R/
by the DAC, indicating that it is prepared to transmit data. Two
bytes of data are then read from the DAC, as shown in Figure 38.
A NACK condition from the master, followed by a stop condition,
completes the read sequence. If more than one DAC is selected,
Channel A is read back by default.
W
= 1. This byte is acknowledged
MULTIPLE DAC READBACK SEQUENCE
When reading data back from multiple AD5696/AD5694 DACs,
W
the user begins with an address byte (R/
DAC acknowledges that it is prepared to receive data by pulling
SDA low. The address byte must be followed by the command
byte, which is also acknowledged by the DAC. The user selects
the first channel to read back using the command byte.
Following this, the master establishes a repeated start condition,
and the address is resent with R/
W
= 1. This byte is acknowledged
by the DAC, indicating that it is prepared to transmit data. The
first two bytes of data are then read from DAC Input Register n
(selected using the command byte), most significant byte first, as
shown in Figure 38. The next two bytes read back are the contents
of DAC Input Register n + 1, and the next bytes read back are
the contents of DAC Input Register n + 2. Data is read from the
DAC input registers in this auto-incremented fashion until a
NACK followed by a stop condition follows. If the contents of
DAC Input Register D are read out, the next two bytes of data
that are read are the contents of DAC Input Register A.
= 0), after which the
2
Figure 38. I
C Read Operation
Rev. 0 | Page 19 of 24
Page 20
AD5696/AD5694 Data Sheet
RESISTOR
NETWORK
V
OUT
X
DAC
POWER-DOWN
CIRCUITRY
AMPLIFIER
10799-058
SDA
SCL
V
OUT
X
DAC
REGISTER
INPUT SHIFT
REGISTER
OUTPUT
AMPLIFIER
LDAC
V
REF
INPUT
REGISTER
12-/16-BIT
DAC
10799-059
POWER-DOWN OPERATION
Command 0100 is designated for the power-down function. The
AD5696/AD5694 provide three separate power-down modes
(see Table 11). These power-down modes are software programmable by setting Bit DB7 to Bit DB0 in the input shift register
(see Table 12). Two bits are associated with each DAC channel.
Table 11 shows how the state of these two bits corresponds to
the mode of operation of the device.
Table 11. Modes of Operation
Operating Mode PDx1 PDx0
Normal Operation 0 0
Power-Down Modes
1 kΩ to GND 0 1
100 kΩ to GND 1 0
Three-State 1 1
Any or all DACs (DAC A to DAC D) can be powered down
to the selected mode by setting the corresponding bits in the
input shift register. See Table 12 for the contents of the input
shift register during the power-down/power-up operation.
When both Bit PDx1 and Bit PDx0 (where x is the DAC selected)
in the input shift register are set to 0, the parts work normally
with their normal power consumption of 0.59 mA at 5 V. When
Bit PDx1, Bit PDx0, or both Bit PDx1 and Bit PDx0 are set to 1,
the part is in power-down mode. In power-down mode, the
supply current falls to 4 μA a t 5 V.
In power-down mode, the output stage is internally switched
from the output of the amplifier to a resistor network of known
values. In this way, the output impedance of the part is known
when the part is in power-down mode.
Table 11 lists the three power-down options. The output is
connected internally to GND through either a 1 kΩ or a 100 kΩ
resistor, or it is left open-circuited (three-state). The output stage
is illustrated in Figure 39.
Figure 39. Output Stage During Power-Down
The bias generator, output amplifier, resistor string, and other
associated linear circuitry are shut down when power-down
mode is activated. However, the contents of the DAC registers
are unaffected in power-down mode, and the DAC registers can
be updated while the device is in power-down mode. The time
required to exit power-down is typically 2.5 µs for V
LOAD DAC (HARDWARE
LDAC
PIN)
The AD5696/AD5694 DACs have double buffered interfaces
consisting of two banks of registers: input registers and DAC
registers. The user can write to any combination of the input
registers (see Table 9). Updates to the DAC registers are controlled by the
Figure 40. Simplified Diagram of Input Loading Circuitry for a Single DAC
LDAC
pin.
= 5 V.
DD
Table 12. 24-Bit Input Shift Register Contents for Power-Down/Power-Up Operation1
DB23
(MSB) DB22 DB21 DB20 DB19 to DB16
DB15
to DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1
0 1 0 0 X X PDD1 PDD0 PDC1 PDC0 PDB1 PDB0 PDA1 PDA0
1
Command bits (C3 to C0) Address bits
(don’t care)
X = don’t care.
Don’t
care
Power-down
select, DAC D
Rev. 0 | Page 20 of 24
Power-down
select, DAC C
Power-down
select, DAC B
Power-down
select, DAC A
DB0
(LSB)
Page 21
Data Sheet AD5696/AD5694
Instantaneous DAC Updating (
For instantaneous updating of the DACs,
LDAC
Held Low)
LDAC
is held low while
data is clocked into the input register using Command 0001. Both
the addressed input register and the DAC register are updated on
th
the 24
clock, and the output begins to change (see Table 14).
Deferred DAC Updating (
For deferred updating of the DACs,
LDAC
Pulsed Low)
LDAC
is held high while data
is clocked into the input register using Command 0001. All DAC
outputs are asynchronously updated by pulling
th
24
clock. The update occurs on the falling edge of
LDAC
low after the
LDAC
.
LDAC MASK REGISTER
Command 0101 is reserved for the software
When this command is executed, the address bits are ignored.
When writing to the DAC using Command 0101, the 4-bit
mask register (DB3 to DB0) is loaded. Bit DB3 of the
register corresponds to DAC D; Bit DB2 corresponds to DAC C;
Bit DB1 corresponds to DAC B; and Bit DB0 corresponds to
DAC A.
The default value of these bits is 0; that is, the
normally. Setting any of these bits to 1 forces the selected DAC
channel to ignore transitions on the
state of the hardware
LDAC
pin. This flexibility is useful in appli-
LDAC
cations where the user wishes to select which channels respond
LDAC
to the
LDAC
The
control over the hardware
LDAC
ware
pin.
mask register allows the user extra flexibility and
LDAC
pin (see Table 13). Setting the
bit (DB3 to DB0) to 0 for a DAC channel allows the hard-
LDAC
pin to control the updating of that channel.
LDAC
function.
LDAC
LDAC
mask
LDAC
pin works
pin, regardless of the
Table 13.
LDAC
(DB3 to DB0)
0 1 or 0
1 X1
1
X = don’t care.
HARDWARE RESET PIN (RESET)
RESET
to either zero scale or midscale. The clear code value is user select-
able via the reset select pin (RSTSEL). It is necessary to keep
RESET
When the
the cleared value until a new value is programmed. The outputs
cannot be updated with a new value while the
There is also a software executable reset function that resets the
DAC to the power-on reset code. Command 0110 is designated
for this software reset function (see Table 8). Any events on
LDAC
RESET SELECT PIN (RSTSEL)
The AD5696/AD5694 contain a power-on reset circuit that
controls the output voltage during power-up. When the RSTSEL
pin is tied to GND, the outputs power up to zero scale (note
that this is outside the linear region of the DAC). When the
RSTSEL pin is tied to V
The outputs remain powered up at the level set by the RSTSEL
pin until a valid write sequence is made to the DAC.
LDAC
Overwrite Definition
Load
LDAC
Register
Bit
LDAC
Pin
LDAC
Operation
Determined by the LDAC
DAC channels are updated. (DAC
channels see LDAC
pin as 1.)
is an active low reset that allows the outputs to be cleared
low for a minimum of 30 ns to complete the operation.
RESET
signal is returned high, the output remains at
RESET
pin is low.
RESET
or
during power-on reset are ignored.
, the outputs power up to midscale.
DD
pin.
Table 14. Write Commands and
LDAC
Pin Truth Table1
Command Description
0001
0010
Write to Input Register n (dependent on LDAC
Update DAC Register n with contents of Input
)
Register n
0011 Write to and update DAC Channel n V
1
A high to low transition on the hardware
masked (blocked) by the
2
When the
pin is permanently tied low, the
LDAC
mask register.
LDAC
pin always updates the contents of the DAC register with the contents of the input register on channels that are not
LDAC
mask bits are ignored.
LDAC
Rev. 0 | Page 21 of 24
Hardware
Pin State
V
Data update No change (no update)
LOGI C
LDAC
Input Register
Contents DAC Register Contents
GND2 Data update Data update
V
No change
LOGI C
Updated with input register
contents
GND No change
Updated with input register
contents
Data update Data update
LOGI C
GND Data update Data update
Page 22
AD5696/AD5694 Data Sheet
ADSP-BF531
SCLGPIO1
SDAGPIO2
LDACPF9
RESETPF8
AD5696/
AD5694
10799-164
AD5696/
AD5694
GND
PLANE
BOARD
10799-166
ENCODE
SERIAL
CLOCK IN
CONTROLLER
ADuM1400
SERIAL
DATA OUT
RESET OUT
LOAD DAC
OUT
DECODE
TO
SCL
TO
SDA
TO
RESET
TO
LDAC
V
IA
V
OA
ENCODE
DECODE
V
IB
V
OB
ENCODEDECODE
V
IC
V
OC
ENCODEDECODE
V
ID
V
OD
10799-167
APPLICATIONS INFORMATION
MICROPROCESSOR INTERFACING
Microprocessor interfacing to the AD5696/AD5694 is via a
serial bus that uses a standard protocol that is compatible with
DSP processors and microcontrollers. The communications
channel requires a 2-wire interface consisting of a clock signal
and a data signal.
AD5696/AD5694 TO ADSP-BF531 INTERFACE
The I2C interface of the AD5696/AD5694 is designed for easy
connection to industry-standard DSPs and microcontrollers.
Figure 41 shows the AD5696/AD5694 connected to the Analog
Devices, Inc., Blackfin® processor. The Blackfin processor has
an integrated I
pins of the AD5696/AD5694.
2
C port that can be connected directly to the I2C
For enhanced thermal, electrical, and board level performance,
solder the exposed pad on the bottom of the LFCSP package to
the corresponding thermal land paddle on the PCB. Design
thermal vias into the PCB land paddle area to further improve
heat dissipation.
The GND plane on the device can be increased (as shown in
Figure 42) to provide a natural heat sinking effect.
Figure 41. AD5696/AD5694 to ADSP-BF531Interface
LAYOUT GUIDELINES
In any circuit where accuracy is important, careful consideration
of the power supply and ground return layout helps to ensure the
rated performance. The PCB on which the AD5696/AD5694
are mounted should be designed so that the AD5696/AD5694
lie on the analog plane.
The AD5696/AD5694 should have ample supply bypassing of
10 µF in parallel with 0.1 µF on each supply, located as close to
the package as possible, ideally right up against the device. The
10 µF capacitor is the tantalum bead type. The 0.1 µF capacitor
should have low effective series resistance (ESR) and low effective
series inductance (ESI), such as the common ceramic types; these
capacitors provide a low impedance path to ground at high
frequencies to handle transient currents due to internal logic
switching.
In systems where many devices are on one board, it is often
useful to provide some heat sinking capability to allow the
power to dissipate easily.
The AD5696/AD5694 LFCSP models have an exposed pad
beneath the device. Connect this pad to the GND supply for
the part. For optimum performance, use special considerations
to design the motherboard and to mount the package.
Rev. 0 | Page 22 of 24
Figure 42. Paddle Connection to Board
GALVANICALLY ISOLATED INTERFACE
In many process control applications, it is necessary to provide
an isolation barrier between the controller and the unit being
controlled to protect and isolate the controlling circuitry from
any hazardous common-mode voltages that may occur.
The Analog Devices iCoupler® products provide voltage isolation in excess of 2.5 kV. The serial loading structure of the
AD5696/AD5694 makes the part ideal for isolated interfaces
because the number of interface lines is kept to a minimum.
Figure 43 shows a 4-channel isolated interface to the AD5696/
AD5694 using the ADuM1400. For more information, visit
http://www.analog.com/icouplers.
Figure 43. Isolated Interface
Page 23
Data Sheet AD5696/AD5694
3.10
3.00 SQ
2.90
0.30
0.23
0.18
1.75
1.60 SQ
1.45
08-16-2010-E
1
0.50
BSC
BOTTOM VIEWTOP VIEW
16
5
8
9
12
13
4
EXPOSED
PAD
PIN 1
INDICATOR
0.50
0.40
0.30
SEATING
PLANE
0.05 MAX
0.02 NOM
0.20 REF
0.25 MIN
COPLANARITY
0.08
PIN 1
INDICATOR
FOR PROP E R CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CO NFIGURATI ON AND
FUNCTIO N DE S CRIPTIONS
SECTION OF THIS DATA SHEET.
0.80
0.75
0.70
COMPLIANT
TO
JEDEC STANDARDS MO-220-WEED-6.
16
9
81
PIN 1
SEATING
PLANE
8°
0°
4.50
4.40
4.30
6.40
BSC
5.10
5.00
4.90
0.65
BSC
0.15
0.05
1.20
MAX
0.20
0.09
0.75
0.60
0.45
0.30
0.19
COPLANARITY
0.10
COMPLI ANT TO JEDEC STANDARDS MO-153-AB
OUTLINE DIMENSIONS
Figure 44. 16-Lead Lead Frame Chip Scale Package [LFCSP_WQ]
3 mm × 3 mm Body, Very Very Thin Quad
(CP-16-22)
Dimensions shown in millimeters
Figure 45. 16-Lead Thin Shrink Small Outline Package [TSSOP]