High relative accuracy (INL): ±2 LSB maximum @ 16 bits
Low drift 2.5 V reference: 2 ppm/°C typical
Tiny package: 3 mm × 3 mm, 16-lead LFCSP
Total unadjusted error (TUE): ±0.1% of FSR maximum
Offset error: ±1.5 mV maximum
Gain error: ±0.1% of FSR maximum
High drive capability: 20 mA, 0.5 V from supply rails
User selectable gain of 1 or 2 (GAIN pin)
Reset to zero scale or midscale (RSTSEL pin)
1.8 V logic compatibility
Low glitch: 0.5 nV-sec
400 kHz I
Robust 3.5 kV HBM and 1.5 kV FICDM ESD rating
Low power: 3.3 mW at 3 V
2.7 V to 5.5 V power supply
−40°C to +105°C temperature range
APPLICATIONS
Optical transceivers
Base-station power amplifiers
Process control (PLC I/O cards)
Industrial automation
Data acquisition systems
2
C-compatible serial interface
Quad 16-/14-/12-Bit nanoDAC+
FUNCTIONAL BLOCK DIAGRAM
Figure 1.
GENERAL DESCRIPTION
The AD5696R/AD5695R/AD5694R family, are low power,
quad, 16-/14-/12-bit buffered voltage output DACs. The devices
include a 2.5 V, 2 ppm/°C internal reference (enabled by
default) and a gain select pin giving a full-scale output of 2.5 V
(gain = 1) or 5 V (gain = 2). All devices operate from a single
2.7 V to 5.5 V supply, are guaranteed monotonic by design, and
exhibit less than 0.1% FSR gain error and 1.5 mV offset error
performance. The devices are available in a 3 mm × 3 mm
LFCSP and a TSSOP package.
The AD5696R/AD5695R/AD5694R also incorporate a poweron reset circuit and a RSTSEL pin that ensures that the DAC
outputs power up to zero scale or midscale and remain there
pin intended for 1.8 V/3 V/5 V logic.
LOGIC
until a valid write takes place. Each part contains a per-channel
power-down feature that reduces the current consumption of
the device to 4 µA at 3 V while in power-down mode.
The AD5696R/AD5695R/AD5694R use a versatile 2-wire serial
interface that operates at clock rates up to 400 kHz, and
includes a V
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without n otice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Output Voltage Range 0 V
0 2 × V
Capacitive Load Stability 2 2 nF RL = ∞
10 10 nF RL = 1 kΩ
Resistive Load4 1 1 kΩ
Load Regulation 80 80 µV/mA
80 80 µV/mA
Short-Circuit Current5 40 40 mA
0 V
REF
0 2 × V
REF
Rev. 0 | Page 3 of 32
V Gain = 1
REF
V Gain = 2, see Figure 31
REF
5 V ± 10%, DAC code = midscale;
−30 mA ≤ I
3 V ± 10%, DAC code = midscale;
−20 mA ≤ I
VDD = 5 V
≤ 30 mA
OUT
≤ 20 mA
OUT
Page 4
AD5696R/AD5695R/AD5694R Data Sheet
8, 9
20
20
µ
At ambient
125
125 ppm
First cycle
Pin Capacitance
2 2 pF
1
A Grade1
B Grade
Parameter Min Typ Max Min Typ Max Unit Test Conditions/Comments
REFERENCE OUTPUT
Output Voltage7 2.4975 2.5025 2.4975 2.5025 V At ambient
Reference TC
Output Impedance3
Output Voltage Noise3
Output Voltage Noise
Density
Load Regulation Sourcing3
Load Regulation Sinking3
Output Current Load
Capability
Line Regulation3
Long-Term Stability/Drift3
5 20 2 5 ppm/°C See the Terminology section
0.04 0.04 Ω 12 12
3
3
240 240 nV/√Hz
40
±5
40
mA VDD ≥ 3 V
±5
µV p-p
V/mA
µV/mA
0.1 Hz to 10 Hz
At ambient; f = 10 kHz, C
At ambient
100 100 µV/V At ambient
12 12 ppm After 1000 hours at 125°C
= 10 nF
L
Thermal Hysteresis3
25 25 ppm Additional cycles
LOGIC INPUTS3
Input Current ±2 ±2 µA Per pin
V
, Input Low Voltage 0.3 × V
INL
V
, Input High Voltage 0.7 × V
INH
LOGIC OUTPUTS (SDA)3
0.7 × V
LOGIC
Output Low Voltage, VOL 0.4 0.4 V I
Floating State Output
4 4 pF
0.3 × V
LOGIC
V
LOGIC
V
LOGIC
SINK
= 3 mA
Capacitance
POWER REQUIREMENTS
V
I
LOGIC
LOGIC
1.8 5.5 1.8 5.5 V 3 3
µA
VDD 2.7 5.5 2.7 5.5 V Gain = 1
VDD V
+ 1.5 5.5 V
REF
+ 1.5 5.5 V Gain = 2
REF
IDD VIH = VDD, VIL = GND, VDD = 2.7 V to 5.5 V
Normal Mode10 0.59 0.7 0.59 0.7 mA Internal reference off
1.1 1.3 1.1 1.3 mA Internal reference on, at full scale
All Power-Down
11
Modes
1 4 1 4 µA −40°C to +85°C
6 6 µA −40°C to +105°C
1
Temperature range: A and B grade: −40°C to +105°C.
2
DC specifications tested with the outputs unloaded, unless otherwise noted. Upper dead band = 10 mV and exists only when V
with gain = 2. Linearity calculated using a reduced code range of 256 to 65,280 (AD5696R), 64 to 16,320 (AD5695R), and 12 to 4080 (AD5694R).
V
DD
3
Guaranteed by design and characterization; not production tested.
4
Channel A and Channel B can have a combined output current of up to 30 mA. Similarly, Channel C and Channel D can have a combined output current of up to
30 mA up to a junction temperature of 110°C.
5
VDD = 5 V. The device includes current limiting that is intended to protect the device during temporary overload conditions. Junction temperature can be exceeded
during current limit. Operation above the specified maximum operation junction temperature may impair device reliability.
6
When drawing a load current at either rail, the output voltage headroom with respect to that rail is limited by the 25 Ω typical channel resistance of the output
devices. For example, when sinking 1 mA, the minimum output voltage = 25 Ω × 1 mA = 25 mV (see Figure 31).
7
Initial accuracy presolder reflow is ±750 µV; output voltage includes the effects of preconditioning drift. See the Internal Reference Setup section.
8
Reference is trimmed and tested at two temperatures and is characterized from −40°C to +105°C.
9
Reference temperature coefficient calculated as per the box method. See the Terminology section for further information.
10
Interface inactive. All DACs active. DAC outputs unloaded.
11
All DACs powered down.
= VDD with gain = 1 or when V
REF
/2 =
REF
Rev. 0 | Page 4 of 32
Page 5
Data Sheet AD5696R/AD5695R/AD5694R
Total Harmonic Distortion4
−80 dB
At ambient, BW = 20 kHz, VDD = 5 V, f
= 1 kHz
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; 1.8 V ≤ V
1
noted.
Table 3.
Parameter2 Min Typ Max Unit Test Conditions/Comments3
Output Voltage Settling Time
AD5696R5 8 µs ¼ to ¾ scale settling to ±2 LSB
AD5695R5 8 µs ¼ to ¾ scale settling to ±2 LSB
AD5694R5 7 µs ¼ to ¾ scale settling to ±2 LSB
Slew Rate 0.8 V/µs
Digital-to-Analog Glitch Impulse 0.5 nV-sec 1 LSB change around major carry
Digital Feedthrough 0.13 nV-sec
Digital Crosstalk 0.1 nV-sec
Analog Crosstalk 0.2 nV-sec
DAC-to-DAC Crosstalk 0.3 nV-sec
Output Noise Spectral Density 300 nV/√Hz DAC code = midscale, 10 kHz; gain = 2
Output Noise 6 µV p-p 0.1 Hz to 10 Hz
SNR 90 dB At ambient, BW = 20 kHz, VDD = 5 V, f
SFDR 83 dB At ambient, BW = 20 kHz, VDD = 5 V, f
SINAD 80 dB At ambient, BW = 20 kHz, VDD = 5 V, f
1
Guaranteed by design and characterization; not production tested.
2
See the Terminology section.
3
Temperature range is −40°C to +105°C, typical @ 25°C.
4
Digitally generated sine wave @ 1 kHz.
≤ 5.5 V; all specifications T
LOGIC
MIN
to T
, unless otherwise
MAX
OUT
= 1 kHz
OUT
= 1 kHz
OUT
= 1 kHz
OUT
Rev. 0 | Page 5 of 32
Page 6
AD5696R/AD5695R/AD5694R Data Sheet
SCL
SDA
t
1
t
3
LDAC
1
LDAC
2
START
CONDITION
REPEATED START
CONDITION
STOP
CONDITION
NOTES
1
ASYNCHRONOUS LDAC UPDATE MO DE .
2
SYNCHRONOUS LDAC UPDATE MO DE .
t
4
t
6
t
5
t
7
t
8
t
2
t
13
t
4
t
11
t
10
t
12
t
12
t
9
10486-002
TIMING CHARACTERISTICS
VDD = 2.5 V to 5.5 V; 1.8 V ≤ V
Table 4.
Parameter2
Min Max
t1 2.5 µs SCL cycle time
t2 0.6 µs t
t3 1.3 µs t
t4 0.6 µs t
t5 100 ns t
3
t
0 0.9 µs t
6
t7 0.6 µs t
t8 0.6 µs t
t9 1.3 µs t
t10 0 300 ns tR, rise time of SCL and SDA when receiving
t11 20 + 0.1C
t12 20 ns
t13 400 ns SCL rising edge to
4
C
400 pF Capacitive load for each bus line
B
1
See Figure 2.
2
Guaranteed by design and characterization; not production tested.
3
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to the VIH min of the SCL signal) to bridge the undefined region of SCL’s
falling edge.
4
CB is the total capacitance of one bus line in pF. tR and tF measured between 0.3 VDD and 0.7 VDD.
≤ 5.5 V; all specifications T
LOGIC
MIN
to T
, unless otherwise noted. 1
MAX
Unit Conditions/Comments
, SCL high time
HIGH
, SCL low time
LOW
, start/repeated start condition hold time
HD, STA
, data setup time
SU ,DAT
, data hold time
HD ,DAT
, setup time for repeated start
SU, STA
, stop condition setup time
SU,ST O
, bus free time between a stop and a start condition
BUF
4
300 ns tF, fall time of SDA and SCL when transmitting/ receiving
B
pulse width
LDAC
rising edge
LDAC
Figure 2. 2-Wire Serial Interface Timing Diagram
Rev. 0 | Page 6 of 32
Page 7
Data Sheet AD5696R/AD5695R/AD5694R
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 5.
Parameter Rating
VDD to GND −0.3 V to +7 V
V
to GND −0.3 V to +7 V
LOGI C
V
to GND −0.3 V to VDD + 0.3 V
OUT
V
to GND −0.3 V to VDD + 0.3 V
REF
Digital Input Voltage to GND1 −0.3 V to V
LOGI C
+ 0.3 V
SDA and SCL to GND −0.3 V to +7 V
Operating Temperature Range −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature 125°C
16-Lead TSSOP, θJA Thermal
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. 0 | Page 7 of 32
Page 8
AD5696R/AD5695R/AD5694R Data Sheet
Pin No.
Power-On Reset Pin. Tying this pin to GND powers up all four DACs to zero scale. Tying this pin to
VDD powers up all four DACs to midscale.
12
11
10
1
3
4
A1
SCL
A0
9
V
LOGIC
V
OUT
A
V
DD
2
GND
V
OUT
C
6
SDA
5
V
OUT
D
7
LDAC
8
GAIN
16
V
OUT
B
15
V
REF
14
RSTSEL
13
RESET
AD5696R/AD5695R/AD5694R
NOTES
1. THE EXPOSED PAD MUST BE TIED TO GND.
TOP VIEW
(Not to S cale)
10486-006
1
2
3
4
5
6
7
8
V
OUT
B
V
OUT
A
GND
V
OUT
D
V
OUT
C
V
DD
V
REF
SDA
16
15
14
13
12
11
10
9
RESET
A1
SCL
GAIN
LDAC
V
LOGIC
A0
RSTSEL
TOP VIEW
(Not to S cale)
AD5696R/
AD5695R/
AD5694R
10486-007
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Figure 3. 16-Lead LFCSP Pin Configuration
Figure 4. 16-Lead TSSOP Pin Configuration
Table 6. Pin Function Descriptions
Mnemonic Description LFCSP TSSOP
1 3 V
A Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
2 4 GND Ground Reference Point for All Circuitry on the Part.
3 5 VDD Power Supply Input. These parts can be operated from 2.7 V to 5.5 V, and the supply should be
decoupled with a 10 µF capacitor in parallel with a 0.1 µF capacitor to GND.
4 6 V
5 7 V
C Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
OUT
D Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
OUT
6 8 SDA Serial Data Input. This pin is used in conjunction with the SCL line to clock data into or out of the
24-bit input shift register. SDA is a bidirectional, open-drain data line that should be pulled to the
supply with an external pull-up resistor.
7 9
LDAC
can be operated in two modes, asynchronously and synchronously. Pulsing this pin low allows
LDAC
any or all DAC registers to be updated if the input registers have new data. This allows all DAC outputs
to simultaneously update. This pin can also be tied permanently low.
8 10 GAIN Span Set Pin. When this pin is tied to GND, all four DAC outputs have a span from 0 V to V
9 11 V
pin is tied to V
Digital Power Supply. Voltage ranges from 1.8 V to 5.5 V.
LOGIC
, all four DACs output a span of 0 V to 2 × V
DD
REF
.
. If this
REF
10 12 A0 Address Input. Sets the first LSB of the 7-bit slave address.
11 13 SCL Serial Clock Line. This is used in conjunction with the SDA line to clock data into or out of the 24-bit
input register.
12 14 A1 Address Input. Sets the second LSB of the 7-bit slave address.
13 15
Asynchronous Reset Input. The
RESET
pulses are ignored. When
input is falling edge sensitive. When
RESET
is activated, the input register and the DAC register are updated
RESET
RESET
is low, all
LDAC
with zero scale or midscale, depending on the state of the RSTSEL pin.
14 16 RSTSEL
15 1 V
16 2 V
17 N/A EPAD Exposed Pad. The exposed pad must be tied to GND.
Reference Voltage. The AD5696R/AD5695R/AD5694R have a common reference pin. When using
REF
the internal reference, this is the reference output pin. When using an external reference, this is the
reference input pin. The default for this pin is as a reference output.
B Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
Rev. 0 | Page 8 of 32
Page 9
Data Sheet AD5696R/AD5695R/AD5694R
–40–20020406080100120
V
REF
(V)
TEMPERATURE (°C)
DEVICE 1
DEVICE 2
DEVICE 3
DEVICE 4
DEVICE 5
2.4980
2.4985
2.4990
2.4995
2.5000
2.5005
2.5010
2.5015
2.5020
VDD = 5V
10486-212
–40–20020406080120100
V
REF
(V)
TEMPERATURE (°C)
DEVICE 1
DEVICE 2
DEVICE 3
DEVICE 4
DEVICE 5
2.4980
2.4985
2.4990
2.4995
2.5000
2.5005
2.5010
2.5015
2.5020
VDD = 5V
10486-109
90
0
10
20
30
40
50
60
70
80
00.51.01.52.0 2.53.03.54.04.5 5.0
NUMBER OF UNI TS
TEMPERAT URE DRIFT (p pm/°C)
VDD = 5V
10486-250
60
0
10
20
30
40
50
2.4982.4992.5002.5012.502
HITS
V
REF
(V)
0 HOUR
168 HOURS
500 HOURS
1000 HOURS
V
DD
= 5.5V
10486-251
1600
0
200
400
600
800
1000
1200
1400
101001k10k100k1M
NSD (nV/ Hz)
FREQUENCY (MHz)
VDD = 5V
T
A
= 25°C
10486-111
CH1 10µVM1.0sA CH1 160mV
1
T
VDD = 5V
T
A
= 25°C
10486-112
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 5. Internal Reference Voltage vs. Temperature (Grade B)
Figure 6. Internal Reference Voltage vs. Temperature (Grade A)
Figure 8. Reference Long-Term Stability/Drift
Figure 9. Internal Reference Noise Spectral Density vs. Frequency
Figure 7. Reference Output Temperature Drift Histogram
Figure 10. Internal Reference Noise, 0.1 Hz to 10 Hz
Rev. 0 | Page 9 of 32
Page 10
AD5696R/AD5695R/AD5694R Data Sheet
2.5000
2.4999
2.4998
2.4997
2.4996
2.4995
2.4994
2.4993
–0.005–0.003–0.0010.0010.0030.005
V
REF
(V)
I
LOAD
(A)
VDD = 5V
T
A
= 25°C
10486-113
2.5002
2.5000
2.4998
2.4996
2.4994
2.4992
2.4990
2.53.03.54.04.55.05.5
V
REF
(V)
VDD (V)
D1
D3
D2
T
A
= 25°C
10486-117
10
–10
–8
–6
–4
–2
0
2
4
8
6
0100002000030000400005000060000
INL (LSB)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-118
10
–10
–8
–6
–4
–2
0
2
4
8
6
025005000750010000125001500016348
INL (LSB)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-119
10
–10
–8
–6
–4
–2
0
2
4
8
6
062512501875250031253750 4096
INL (LSB)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-120
1.0
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.8
0.6
0100002000030000400005000060000
DNL (LSB)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-121
Figure 11. Internal Reference Voltage vs. Load Current
Figure 12. Internal Reference Voltage vs. Supply Voltage
Figure 14. AD5695R INL
Figure 15. AD5694R INL
Figure 13. AD5696R INL
Figure 16. AD5696R DNL
Rev. 0 | Page 10 of 32
Page 11
Data Sheet AD5696R/AD5695R/AD5694R
1.0
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.8
0.6
0250050007500100001250015000 16383
DNL (LSB)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-122
1.0
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.8
0.6
062512501875250031253750 4096
DNL (LSB)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-123
10
–10
–8
–6
–4
–2
0
2
4
6
8
–401106010
ERROR (LSB)
TEMPERATURE (°C)
INL
DNL
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-124
10
–10
–8
–6
–4
–2
0
2
4
6
8
05.04.54.03.53.02.52.01.51.00.5
ERROR (LSB)
V
REF
(V)
INL
DNL
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-125
10
–10
–8
–6
–4
–2
0
2
4
6
8
2.75.24.74.23.73.2
ERROR (LSB)
SUPPLY VOLTAGE (V)
INL
DNL
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-126
0.10
–0.10
–0.08
–0.06
–0.04
–0.02
0
0.02
0.04
0.06
0.08
–40–20020406080100120
ERROR (% of FSR)
TEMPERATURE (°C)
GAIN ERROR
FULL-S CALE ERROR
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-127
Figure 17. AD5695R DNL
Figure 18. AD5694R DNL
Figure 20. INL Error and DNL Error vs. V
REF
Figure 21. INL Error and DNL Error vs. Supply Voltage
Figure 19. INL Error and DNL Error vs. Temperature
Figure 22. Gain Error and Full-Scale Error vs. Temperature
Rev. 0 | Page 11 of 32
Page 12
AD5696R/AD5695R/AD5694R Data Sheet
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
–40–20020406080100120
ERROR (mV)
TEMPERATURE (°C)
OFFSET ERROR
ZERO-CO DE E RROR
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-128
0.10
–0.10
–0.08
–0.06
–0.04
–0.02
0
0.02
0.04
0.06
0.08
2.75.24.74.23.73.2
ERROR (% of FSR)
SUPPLY VOLTAGE (V)
GAIN ERROR
FULL-S CALE ERROR
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-129
1.5
–1.5
–1.0
–0.5
0
0.5
1.0
2.75.24.74.23.73.2
ERROR (mV)
SUPPLY VOLTAGE (V)
ZERO-CO DE E RROR
OFFSET ERROR
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-130
0.10
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
–40–20020406080100120
TOTAL UNADJUS TED ERROR (% o f FSR)
TEMPERATURE (°C)
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-131
0.10
0.08
0.06
0.04
0.02
0
–0.02
–0.04
–0.06
–0.08
–0.10
2.75.24.74.23.73.2
TOTAL UNADJUS TED ERROR (% o f FSR)
SUPPLY VOLTAGE (V)
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-132
0
–0.01
–0.02
–0.03
–0.04
–0.05
–0.06
–0.07
–0.08
–0.09
–0.10
01000020000300004000050000 60000 65535
TOTAL UNADJUS TED ERROR (% o f FSR)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10486-133
Figure 23. Zero-Code Error and Offset Error vs. Temperature
Figure 24. Gain Error and Full-Scale Error vs. Supply
Figure 26. TUE vs. Temperature
Figure 27. TUE vs. Supply, Gain = 1
Figure 25. Zero-Code Error and Offset Error vs. Supply
Figure 28. TUE vs. Code
Rev. 0 | Page 12 of 32
Page 13
Data Sheet AD5696R/AD5695R/AD5694R
25
20
15
10
5
0
540560580600620640
HITS
I
DD
(V)
V
DD
= 5V
T
A
= 25°C
EXTERNAL
REFERENCE = 2.5V
10486-135
30
25
20
15
10
5
0
10001020104010601080110011201140
HITS
IDD FULLSCALE (V)
V
DD
= 5V
T
A
= 25°C
INTERNAL
REFERENCE = 2.5V
10486-136
1.0
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.6
0.8
051015202530
ΔV
OUT
(V)
LOAD CURRENT ( mA)
SOURCING 2.7V
SOURCING 5V
SINKING 2.7V
SINKING 5V
10486-200
7
–2
–1
0
1
2
3
4
5
6
–0.06–0.04–0.0200.020.040.06
V
OUT
(V)
LOAD CURRENT ( A)
0xFFFF
0x4000
0x8000
0xC000
0x0000
V
DD
= 5V
T
A
= 25°C
GAIN = 2
INTERNAL
REFERENCE = 2.5V
10486-138
5
–2
–1
0
1
2
3
4
–0.06–0.04–0.0200.020.040.06
V
OUT
(V)
LOAD CURRENT ( A)
0xFFFF
0x4000
0x8000
0xC000
0x0000
VDD = 5V
T
A
= 25°C
EXTERNAL RE FERENCE = 2.5V
GAIN = 1
10486-139
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
–401106010
CURRENT (mA)
TEMPERATURE (°C)
FULL-SCALE
ZERO CODE
EXTERNAL RE FERENCE, F ULL-SCALE
10486-140
Figure 29. IDD Histogram with External Reference, 5 V
Figure 30. IDD Histogram with Internal Reference, V
= 2.5 V, Gain = 2
REFOUT
Figure 32. Source and Sink Capability at 5 V
Figure 33. Source and Sink Capability at 3 V
Figure 31. Headroom/Footroom vs. Load Current
Figure 34. Supply Current vs. Temperature
Rev. 0 | Page 13 of 32
Page 14
AD5696R/AD5695R/AD5694R Data Sheet
0
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
10320160408020
V
OUT
(V)
TIME (µs)
DAC A
DAC B
DAC C
DAC D
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
¼ TO ¾ SCALE
10486-141
–0.01
0
0.06
0.01
0.02
0.03
0.04
0.05
–1
0
6
1
2
3
4
5
–10151005–5
V
OUT
(V)
V
DD
(V)
TIME (µs)
CH D
V
DD
CH A
CH B
CH C
TA = 25°C
INTERNAL RE FERENCE = 2.5V
10486-142
0
1
3
2
–51005
V
OUT
(V)
TIME (µs)
CH D
SYNC
CH A
CH B
CH C
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
GAIN = 1
GAIN = 2
10486-143
2.4988
2.5008
2.5003
2.4998
2.4993
012810462
V
OUT
(V)
TIME (µs)
CHANNEL B
T
A
= 25°C
V
DD
= 5.25V
INTERNAL RE FERENCE
CODE = 7FF F TO 8000
ENERGY = 0. 227206nV-sec
For the DAC, relative accuracy or integral nonlinearity is a
measurement of the maximum deviation, in LSBs, from a
straight line passing through the endpoints of the DAC transfer
function. A typical INL vs. code plot is shown in Figure 13.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot can be seen in Figure 16.
Zero-Code Error
Zero-code error is a measurement of the output error when
zero code (0x0000) is loaded to the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive in
the AD5696R because the output of the DAC cannot go below
0 V due to a combination of the offset errors in the DAC and
the output amplifier. Zero-code error is expressed in mV. A plot
of zero-code error vs. temperature can be seen in Figure 23.
Full-Scale Error
Full-scale error is a measurement of the output error when fullscale code (0xFFFF) is loaded to the DAC register. Ideally, the
output should be V
− 1 LSB. Full-scale error is expressed in
DD
percent of full-scale range (% of FSR). A plot of full-scale error
vs. temperature can be seen in Figure 22.
Gain Error
This is a measure of the span error of the DAC. It is the deviation
in slope of the DAC transfer characteristic from the ideal
expressed as % of FSR.
Offset Error Drift
This is a measurement of the change in offset error with a
change in temperature. It is expressed in µV/°C.
Gain Temperature Coefficient
This is a measurement of the change in gain error with changes
in temperature. It is expressed in ppm of FSR/°C.
Offset Error
Offset error is a measure of the difference between V
and V
(ideal) expressed in mV in the linear region of the
OUT
(actual)
OUT
transfer function. Offset error is measured on the AD5696R
with Code 512 loaded in the DAC register. It can be negative
or positive.
DC Power Supply Rejection Ratio (PSRR)
This indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in V
a change in V
in mV/V. V
for full-scale output of the DAC. It is measured
DD
is held at 2 V, and VDD is varied by ±10%.
REF
OUT
to
Output Voltage Settling Time
This is the amount of time it takes for the output of a DAC to
settle to a specified level for a ¼ to ¾ full-scale input change.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-sec,
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000) (see
Figure 38).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into the
analog output of the DAC from the digital inputs of the DAC,
but is measured when the DAC output is not updated. It is
specified in nV-sec, and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
Reference Feedthrough
Reference feedthrough is the ratio of the amplitude of the signal
at the DAC output to the reference input when the DAC output
is not being updated. It is expressed in dB.
Noise Spectral Density
This is a measurement of the internally generated random
noise. Random noise is characterized as a spectral density
(nV/√Hz). It is measured by loading the DAC to midscale and
measuring noise at the output. It is measured in nV/√Hz. A plot
of noise spectral density is shown in Figure 42.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC (or soft
power-down and power-up) while monitoring another DAC kept
at midscale. It is expressed in μV.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has to
another DAC kept at midscale. It is expressed in μV/mA.
Digital Crosstalk
This is the glitch impulse transferred to the output of one DAC
at midscale in response to a full-scale code change (all 0s to all
1s and vice versa) in the input register of another DAC. It is
measured in standalone mode and is expressed in nV-sec.
Rev. 0 | Page 16 of 32
Page 17
Data Sheet AD5696R/AD5695R/AD5694R
6
10×
×
−
=
TempRangeV
VV
TC
REFnom
REFminREFmax
Analog Crosstalk
This is the glitch impulse transferred to the output of one DAC
due to a change in the output of another DAC. It is measured by
loading one of the input registers with a full-scale code change
(all 0s to all 1s and vice versa). Then execute a software LDAC
and monitor the output of the DAC whose digital code was not
changed. The area of the glitch is expressed in nV-sec.
DAC-to-DAC Crosstalk
This is the glitch impulse transferred to the output of one DAC
due to a digital code change and subsequent analog output
change of another DAC. It is measured by loading the attack
channel with a full-scale code change (all 0s to all 1s and vice
versa), using the write to and update commands while monitoring the output of the victim channel that is at midscale. The
energy of the glitch is expressed in nV-sec.
Multiplying Bandwidth
The amplifiers within the DAC have a finite bandwidth. The
multiplying bandwidth is a measure of this. A sine wave on the
reference (with full-scale code loaded to the DAC) appears on
the output. The multiplying bandwidth is the frequency at
which the output amplitude falls to 3 dB below the input.
Total Harmonic Distortion (THD)
This is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as the
reference for the DAC, and the THD is a measurement of the
harmonics present on the DAC output. It is measured in dB.
Voltage Reference TC
Voltage reference TC is a measure of the change in the reference
output voltage with a change in temperature. The reference TC
is calculated using the box method, which defines the TC as the
maximum change in the reference output over a given temperature range expressed in ppm/°C as follows;
where:
V
is the maximum reference output measured over the
REFmax
total temperature range.
V
is the minimum reference output measured over the total
REFmin
temperature range.
V
is the nominal reference output voltage, 2.5 V.
REFno m
TempRange is the specified temperature range of −40°C to
+105°C.
Rev. 0 | Page 17 of 32
Page 18
AD5696R/AD5695R/AD5694R Data Sheet
×=
N
REF
OUT
D
GainVV
2
V
R
R
R
R
R
TO OUTPUT
AMPLIFIER
V
REF
10486-053
THEORY OF OPERATION
DIGITAL-TO-ANALOG CONVERTER
The AD5696R/AD5695R/AD5694R are quad 16-/14-/12-bit,
serial input, voltage output DACs with an internal reference.
The parts operate from supply voltages of 2.7 V to 5.5 V. Data is
written to the AD5696R/AD5695R/AD5694R in a 24-bit word
format via a 2-wire serial interface. The AD5696R/AD5695R/
AD5694R incorporate a power-on reset circuit to ensure that the
DAC output powers up to a known output state. The devices also
have a software power-down mode that reduces the typical
current consumption to typically 4 µA.
TRANSFER FUNCTION
The internal reference is on by default. To use an external
reference, only a nonreference option is available. Because the
input coding to the DAC is straight binary, the ideal output
voltage when using an external reference is given by
where:
D is the decimal equivalent of the binary code that is loaded to
the DAC register as follows:
0 to 4,095 for the 12-bit device.
0 to 16,383 for the 14-bit device.
0 to 65,535 for the 16-bit device.
N is the DAC resolution.
Gain is the gain of the output amplifier and is set to 1 by default.
This can be set to ×1 or ×2 using the gain select pin. When this
pin is tied to GND, all four DAC outputs have a span from 0 V
to V
. If this pin is tied to VDD, all four DACs output a span of
REF
0 V to 2 × V
REF
.
DAC ARCHITECTURE
The DAC architecture consists of a string DAC followed by an
output amplifier. Figure 46 shows a block diagram of the DAC
architecture.
REF
2.5V
REF
INPUT
REGISTER
Figure 46. Single DAC Channel Architecture Block Diagram
DAC
REGISTER
REF (+)
RESISTOR
STRING
REF (–)
GND
GAIN
(GAIN = 1 O R 2)
V
X
OUT
10486-052
The resistor string structure is shown in Figure 47. It is a string
of resistors, each of Value R. The code loaded to the DAC register
determines the node on the string where the voltage is to be
tapped off and fed into the output amplifier. The voltage is
tapped off by closing one of the switches connecting the
string to the amplifier. Because it is a string of resistors, it is
guaranteed monotonic.
Figure 47. Resistor String Structure
Internal Reference
The AD5696R/AD5695R/AD5694R on-chip reference is on at
power-up but can be disabled via a write to a control register.
See the Internal Reference Setup section for details.
The AD5696R/AD5695R/AD5694R have a 2.5 V, 2 ppm/°C
reference, giving a full-scale output of 2.5 V or 5 V depending
on the state of the GAIN pin. The internal reference associated
with the device is available at the V
pin. This buffered
REF
reference is capable of driving external loads of up to 10 mA.
Output Amplifiers
The output buffer amplifier can generate rail-to-rail voltages on
its output, which gives an output range of 0 V to V
range depends on the value of V
, the GAIN pin, offset error,
REF
. The actual
DD
and gain error. The GAIN pin selects the gain of the output.
•If this pin is tied to GND, all four outputs have a gain of 1
and the output range is 0 V to V
•If this pin is tied to V
LOGIC
and the output range is 0 V to 2 × V
, all four outputs have a gain of 2
REF
.
.
REF
These amplifiers are capable of driving a load of 1 kΩ in parallel
with 2 nF to GND. The slew rate is 0.8 V/µs with a ¼ to ¾ scale
settling time of 5 µs.
C3C2C1C0 DAC D DAC C DAC B DAC A D15D14D13D12D11 D10D9D8D7D6D5D4D3D2D1D0
COMMANDDAC ADDRESSDAC DATADAC DATA
COMMAND BYTEDATA HIGH BY TEDATA LOW BY TE
10486-302
SERIAL INTERFACE
The AD5696R/AD5695R/AD5694R have 2-wire I2Ccompatible serial interfaces (refer to I
2.1, January 2000, available from Philips Semiconductor). See
Figure 2 for a timing diagram of a typical write sequence. The
AD5696R/AD5695R/AD5694R can be connected to an I
a slave device, under the control of a master device. The
AD5696R/AD5695R/AD5694R support standard (100 kHz)
and fast (400 kHz) data transfer modes. Support is not provided
for 10-bit addressing and general call addressing.
Input Shift Register
The input shift register of the AD5696R/AD5695R/AD5694R is
24 bits wide. Data is loaded into the device as a 24-bit word
under the control of a serial clock input, SCL. The first eight
MSBs make up the command byte. The first four bits are the
command bits (C3, C2, C1, C0) that control the mode of
operation of the device (see Table 7). The last 4 bits of first byte
are the address bits (DAC A, DAC B, DAC C, DAC D) (see
Table 8).
The data-word comprises 16-bit, 14-bit, or 12-bit input code,
followed by four, two, or zero don’t care bits for the AD5696R,
AD5695R, and AD5694R, respectively (see Figure 48, Figure 49,
and Figure 50). These data bits are transferred to the input
register on the 24 falling edges of SCL.
Commands can be executed on individual DAC channels,
combined DAC channels, or on all DACs, depending on the
address bits selected.
2
C-Bus Specification, Version
2
C bus as
Table 7. Command Definitions
Command
C3 C2 C1 C0 Description
LDAC
0 0 1 0
Write to Input Register n (dependent on
Update DAC Register n with contents of Input
Register n
0 0 1 1 Write to and update DAC Channel n
0 1 0 0 Power down/power up DAC
0 1 0 1
0 0 0 1 DAC A
0 0 1 0 DAC B
0 1 0 0 DAC C
1 0 0 0 DAC D
0 0 1 1 DAC A and DAC B
1 1 1 1 All DACs
1
Any combination of DAC channels can be selected using the address bits.
1
)
1
DAC D DAC C DAC B DAC A
Figure 48. AD5696R Input Shift Register Content
Figure 49. AD5695R Input Shift Register Content
Figure 50. AD5694R Input Shift Register Content
Rev. 0 | Page 19 of 32
Page 20
AD5696R/AD5695R/AD5694R Data Sheet
WRITE AND UPDATE COMMANDS
Write to Input Register n (Dependent on
Command 0001 allows the user to write to each DAC’s
dedicated input register individually. When
the input register is transparent (if not controlled by the
mask register).
LDAC
LDAC
)
is low,
LDAC
Update DAC Register n with Contents of Input Register n
Command 0010 loads the DAC registers/outputs with the
contents of the input registers selected and updates the DAC
outputs directly.
Write to and Update DAC Channel n (Independent of
)
LDAC
Command 0011 allows the user to write to the DAC registers
and update the DAC outputs directly.
Rev. 0 | Page 20 of 32
Page 21
Data Sheet AD5696R/AD5695R/AD5694R
A0 Pin Connection
A1 Pin Connection
A0
A1
FRAME 2
COMMAND BYTE
FRAME 1
SLAVE ADDRESS
1991
SCL
START BY
MASTER
ACK. BY
AD56x6
ACK. BY
AD56x6
SDA
R/W
DB23A0A110001DB22 DB21 DB20 DB19 DB18 DB17 DB16
1991
ACK. BY
AD56x6
ACK. BY
AD56x6
FRAME 4
LEAST SIGNIFICANT
DATA BYTE
FRAME 3
MOST SIGNIFICANT
DATA BYTE
STOP BY
MASTER
SCL
(CONTINUED)
SDA
(CONTINUED)
DB15 DB14 DB13 DB12 DB11 DB10 DB9
DB8
DB7 DB6 DB5 DB4 DB3 DB2DB1 DB0
10486-303
SERIAL OPERATION
The AD5696R/AD5695R/AD5694R each have a 7-bit slave
address. The five MSBs are 00011 and the two LSBs (A1, A0)
are set by the state of the A0 and A1 address pins. The ability
to make hardwired changes to A0 and A1 allows the user to
incorporate up to four of these devices on one bus, as outlined
in Tabl e 9.
Table 9. Device Address Selection
GND GND 0 0
V
GND 1 0
LOGIC
GND V
V
V
LOGIC
The 2-wire serial bus protocol operates as follows:
1. The master initiates data transfer by establishing a start
condition when a high-to-low transition on the SDA line
occurs while SCL is high. The following byte is the address
byte, which consists of the 7-bit slave address. The slave
address corresponding to the transmitted address responds
by pulling SDA low during the 9
termed the acknowledge bit). At this stage, all other devices
on the bus remain idle while the selected device waits for
data to be written to, or read from, its shift register.
0 1
LOGIC
1 1
LOGIC
th
clock pulse (this is
2. Data is transmitted over the serial bus in sequences of nine
clock pulses (eight data bits followed by an acknowledge
bit). The transitions on the SDA line must occur during
the low period of SCL and remain stable during the high
period of SCL.
3. When all data bits have been read or written, a stop
condition is established. In write mode, the master pulls
the SDA line high during the 10
th
clock pulse to establish
a stop condition. In read mode, the master issues a no
acknowledge for the 9
th
clock pulse (that is, the SDA line
remains high). The master then brings the SDA line low
before the 10
th
clock pulse, and then high during the 10th
clock pulse to establish a stop condition.
WRITE OPERATION
When writing to the AD5696R/AD5695R/AD5694R, the user
must begin with a start command followed by an address byte
W
= 0), after which the DAC acknowledges that it is
(R/
prepared to receive data by pulling SDA low. The AD5696R/
AD5695R/AD5694R require two bytes of data for the DAC
and a command byte that controls various DAC functions.
Three bytes of data must, therefore, be written to the DAC with
the command byte followed by the most significant data byte
and the least significant data byte, as shown in Figure 51. All
these data bytes are acknowledged by the AD5696R/AD5695R/
AD5694R. A stop condition follows.
2
Figure 51. I
C Write Operation
Rev. 0 | Page 21 of 32
Page 22
AD5696R/AD5695R/AD5694R Data Sheet
1
991
(CONTINUED)
(CONTINUED)
READ OPERATION
When reading data back from the AD5696R DACs, the user
W
begins with an address byte (R/
acknowledges that it is prepared to receive data by pulling SDA
low. This address byte must be followed by the control byte that
determines both the read command that is to follow and the
pointer address to read from, which is also acknowledged by
the DAC. The user configures which channel to read back and
sets the readback command to active using the control byte.
Following this, there is a repeated start condition by the master
and the address is resent with R/
by the DAC, indicating that it is prepared to transmit data.
Two bytes of data are then read from the DAC, as shown in
Figure 52. A NACK condition from the master, followed by a
STOP condition, completes the read sequence. Default readback
is Channel A if more than one DAC is selected.
SCL
= 0), after which the DAC
W
= 1. This is acknowledged
MULTIPLE DAC READBACK SEQUENCE
The user begins with an address byte (R/W = 0), after which the
DAC acknowledges that it is prepared to receive data by pulling
SDA low. This address byte must be followed by the control
byte, which is also acknowledged by the DAC. The user
configures which channel to start the readback using the
control byte. Following this, there is a repeated start condition
by the master and the address is resent with R/
acknowledged by the DAC, indicating that it is prepared to
transmit data. The first two bytes of data are then read from the
DAC Input Register n selected using the control byte, most
significant byte first as shown in
Figure 52. The next two bytes
read back are the contents of DAC Input Register n + 1, the next
bytes read back are the contents of DAC Input Register n + 2.
Data continues to be read from the DAC input registers in this
auto-incremental fashion, until a NACK followed by a stop
condition follows. If the contents of DAC Input Register D are
read out, the next two bytes of data that are read are from the
contents of DAC Input Register A.
The AD5696R/AD5695R/AD5694R contain three separate
power-down modes. Command 0100 is designated for the powerdown function (see Table 7). These power-down modes are
software-programmable by setting eight bits, Bit DB7 to Bit DB0,
in the shift register. There are two bits associated with each DAC
channel. Tabl e 10 shows how the state of the two bits corresponds
to the mode of operation of the device.
Table 10. Modes of Operation
Operating Mode PDx1 PDx0
Normal Operation 0 0
Power-Down Modes
1 kΩ to GND 0 1
100 kΩ to GND 1 0
Three-State 1 1
Any or all DACs (DAC A to DAC D) can be powered down
to the selected mode by setting the corresponding bits. See
Table 11 for the contents of the input shift register during
the power-down/power-up operation.
When both Bit PDx1 and Bit PDx0 (where x is the channel
selected) in the input shift register are set to 0, the parts work
normally with its normal power consumption of 4 mA at 5 V.
However, for the three power-down modes, the supply current
falls to 4 μA at 5 V. Not only does the supply current fall, but the
output stage is also internally switched from the output of the
amplifier to a resistor network of known values. This has the
advantage that the output impedance of the part is known while
the part is in power-down mode. There are three different
power-down options. The output is connected internally to
GND through either a 1 kΩ or a 100 kΩ resistor, or it is left
open-circuited (three-state). The output stage is illustrated in
Figure 53.
Figure 53. Output Stage During Power-Down
The bias generator, output amplifier, resistor string, and other
associated linear circuitry are shut down when the power-down
mode is activated. However, the contents of the DAC register
are unaffected when in power-down. The DAC register can be
updated while the device is in power-down mode. The time
required to exit power-down is typically 4.5 µs for V
= 5 V.
DD
To reduce the current consumption further, the on-chip reference
can be powered off. See the Internal Reference Setup section.
Table 11. 24-Bit Input Shift Register Contents of Power-Down/Power-Up Operation
1
DB15
DB23 DB22 DB21 DB20 DB19 to DB16
to
DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1
DB0
(LSB)
0 1 0 0 X X PDD1 PDD0 PDC1 PDC0 PDB1 PDB0 PDA1 PDA0
1
X = don’t care.
Don’t care
Select DAC D
Select DAC C
Select DAC B
Select DAC A
Rev. 0 | Page 23 of 32
Page 24
AD5696R/AD5695R/AD5694R Data Sheet
LOAD DAC (HARDWARE LDAC PIN)
The AD5696R/AD5695R/AD5694R DACs have double
buffered interfaces consisting of two banks of registers:
input registers and DAC registers. The user can write to
any combination of the input registers. Updates to the DAC
register are controlled by the
REFIN
LDAC
12-/14-/16-BIT
DAC
pin.
OUTPUT
AMPLIFIER
V
OUT
LDAC MASK REGISTER
Command 0101 is reserved for this software
Address bits are ignored. Writing to the DAC, using Command
0101, loads the 4-bit
for each channel is 0; that is, the
LDAC
register (DB3 to DB0). The default
LDAC
Setting the bits to 1 forces this DAC channel to ignore transitions
LDAC
on the
pin, regardless of the state of the hardware
pin. This flexibility is useful in applications where the user
wishes to select which channels respond to the
LDAC
function.
pin works normally.
LDAC
LDAC
pin.
LDAC
SCL
SDO
Figure 54. Simplified Diagram of Input Loading Circuitry for a Single DAC
Instantaneous DAC Updating (
LDAC
is held low while data is clocked into the input register
DAC
REGISTER
INPUT
REGISTER
INPUT SHIFT
REGISTER
LDAC
Held Low)
10486-059
using Command 0001. Both the addressed input register and
the DAC register are updated on the 24
th
clock and the output
begins to change (see Table 13).
Deferred DAC Updating (
LDAC
is held high while data is clocked into the input register
LDAC
is Pulsed Low)
using Command 0001. All DAC outputs are asynchronously
updated by taking
now occurs on the falling edge of
Table 13. Write Commands and
LDAC
low after the 24th clock. The update
LDAC
.
LDAC
Pin Truth Table1
Commands Description
0001
0010
Write to Input Register n (dependent on LDAC
Update DAC Register n with contents of Input
)
Register n
0011 Write to and update DAC Channel n V
1
A high to low hardware
are not masked (blocked) by the
2
When LDAC is permanently tied low, the LDAC mask bits are ignored.
LDAC
pin transition always updates the contents of the contents of the DAC register with the contents of the input register on channels that
LDAC
mask register.
Load
Bits
LDAC
LDAC
Overwrite Definition
Register
LDAC
Pin
LDAC
Determined by the LDAC
DAC channels update and
Operation
pin.
Table 12.
LDAC
(DB3 to DB0)
0 1 or 0
1 X1
override the LDAC pin. DAC
1
X = don’t care.
LDAC
The
register gives the user extra flexibility and control
over the hardware
channels see LDAC
LDAC
pin (see Table 12). Setting the
as 1.
LDAC
bits (DB0 to DB3) to 0 for a DAC channel means that this
channel’s update is controlled by the hardware
Hardware
Pin State
V
LOGI C
LDAC
Input Register
Contents DAC Register Contents
Data update No change (no update)
LDAC
pin.
GND2 Data update Data update
V
LOGI C
No change
Updated with input register
contents
GND No change
Updated with input register
contents
LOGI C
Data update Data update
GND Data update Data update
Rev. 0 | Page 24 of 32
Page 25
Data Sheet AD5696R/AD5695R/AD5694R
HARDWARE RESET (
RESET
is an active low reset that allows the outputs to be
RESET
cleared to either zero scale or midscale. The clear code value is
user selectable via the
RESET
low for a minimum amount of time to complete the
RESET
operation (see Figure 2). When the
high, the output remains at the cleared value until a new value is
programmed. The outputs cannot be updated with a new value
while the
RESET
pin is low. There is also a software executable
reset function that resets the DAC to the power-on reset code.
Command 0110 is designated for this software reset function
(see Table 7). Any events on
reset are ignored.
)
select pin. It is necessary to keep
RESET
signal is returned
LDAC
or
RESET
during power-on
SOLDER HEAT REFLOW
As with all IC reference voltage circuits, the reference value
experiences a shift induced by the soldering process. Analog
Devices, Inc., performs a reliability test called precondition to
mimic the effect of soldering a device to a board. The output
voltage specification quoted previously includes the effect of
this reliability test.
Figure 55 shows the effect of solder heat reflow (SHR) as
measured through the reliability test (precondition).
60
50
POSTSOLDER
HEAT REFLOW
PRESOLDER
HEAT REFLOW
RESET SELECT PIN (RSTSEL)
The AD5696R/AD5695R/AD5694R contain a power-on reset
circuit that controls the output voltage during power-up. By
connecting the RSTSEL pin low, the output powers up to zero
scale. Note that this is outside the linear region of the DAC; by
connecting the RSTSEL pin high, V
powers up to midscale.
OUT
The output remains powered up at this level until a valid write
sequence is made to the DAC.
INTERNAL REFERENCE SETUP
The on-chip reference is on at power-up by default. To reduce
the supply current, this reference can be turned off by setting
software programmable bit, DB0, in the control register.
Table 14 shows how the state of the bit corresponds to the
mode of operation. Command 0111 is reserved for setting up
the internal reference (see Figure 6). Table 14 shows how the
state of the bits in the input shift register corresponds to the
mode of operation of the device during internal reference setup.
Table 14. Reference Setup Register
Internal Reference
Setup Register (DB0)
0 Reference on (default)
1 Reference off
Action
40
HITS
30
20
10
0
2.4982.4992.5002.5012.502
Figure 55. SHR Reference Voltage Shift
V
(V)
REF
LONG-TERM TEMPERATURE DRIFT
Figure 56 shows the change in V
test at 150°C.
0 HOUR
60
50
40
HITS
30
20
168 HOURS
500 HOURS
1000 HOURS
value after 1000 hours in life
REF
10486-060
Rev. 0 | Page 25 of 32
10
0
2.4982.4992.5002.5012.502
Figure 56. Reference Drift Through to 1000 Hours
V
(V)
REF
10486-061
Page 26
AD5696R/AD5695R/AD5694R Data Sheet
THERMAL HYSTERESIS
Thermal hysteresis is the voltage difference induced on the
reference voltage by sweeping the temperature from ambient
to cold, to hot and then back to ambient.
Thermal hysteresis data is shown in Figure 57. It is measured by
sweeping temperature from ambient to −40°C, then to +105°C,
and returning to ambient. The V
between the two ambient measurements and shown in blue
in Figure 57. The same temperature sweep and measurements
were immediately repeated and the results are shown in red in
Figure 57.
Command bits (C3 to C0) Address bits (A2 to A0) Don’t care Reference setup register
1
X = don’t care.
500–50–100–150–200
10486-062
Rev. 0 | Page 26 of 32
Page 27
Data Sheet AD5696R/AD5695R/AD5694R
APPLICATIONS INFORMATION
MICROPROCESSOR INTERFACING
Microprocessor interfacing to the AD5696R/AD5695R/
AD5694R is via a serial bus that uses a standard protocol that
is compatible with DSP processors and microcontrollers. The
communications channel requires a 2-wire interface consisting of
a clock signal and a data signal.
AD5696R/AD5695R/AD5694R TO ADSP-BF531
INTERFACE
The I2C interface of the AD5696R/AD5695R/AD5694R is
designed to be easily connected to industry-standard DSPs and
microcontrollers. Figure 58 shows the AD5696R/AD5695R/
AD5694R connected to the Analog Devices Blackfin® DSP. The
Blackfin has an integrated I
directly to the I
2
C pins of the AD5696R/AD5695R/AD5694R.
ADSP-BF531
Figure 58. ADSP-BF531 Interface
2
C port that can be connected
AD5696R/
AD5695R/
AD5694R
SCLGPIO1
SDAGPIO2
LDACPF9
RESETPF8
10486-164
LAYOUT GUIDELINES
In any circuit where accuracy is important, careful consideration of the power supply and ground return layout helps
to ensure the rated performance. The PCB on which the
AD5696R/AD5695R/AD5694R are mounted should be
designed so that the AD5696R/AD5695R/AD5694R lie
on the analog plane.
The AD5696R/AD5695R/AD5694R should have ample supply
bypassing of 10 μF in parallel with 0.1 μF on each supply, located as
close to the package as possible, ideally right up against the
device. The 10 μF capacitors are the tantalum bead type. The
0.1 μF capacitor should have low effective series resistance
(ESR) and low effective series inductance (ESI) such as the
common ceramic types, which provide a low impedance path to
ground at high frequencies to handle transient currents due to
internal logic switching.
In systems where there are many devices on one board, it is
often useful to provide some heat sinking capability to allow
the power to dissipate easily.
The AD5696R/AD5695R/AD5694R LFCSP models have an
exposed paddle beneath the device. Connect this paddle to the
GND supply for the part. For optimum performance, use
special considerations to design the motherboard and to mount
the package. For enhanced thermal, electrical, and board level
performance, solder the exposed paddle on the bottom of the
package to the corresponding thermal land paddle on the PCB.
Design thermal vias into the PCB land paddle area to further
improve heat dissipation.
The GND plane on the device can be increased (as shown in
Figure 59) to provide a natural heat sinking effect.
AD5696R/
AD5695R/
AD5694R
GND
PLANE
BOARD
10486-166
Figure 59. Paddle Connection to Board
GALVANICALLY ISOLATED INTERFACE
In many process control applications, it is necessary to
provide an isolation barrier between the controller and
the unit being controlled to protect and isolate the controlling
circuitry from any hazardous common-mode voltages that
may occur. iCoupler® products from Analog Devices provide
voltage isolation in excess of 2.5 kV. The serial loading structure of the AD5696R/AD5695R/AD5694R makes the part ideal
for isolated interfaces because the number of interface lines is
kept to a minimum. Figure 60 shows a 4-channel isolated
interface to the AD5696R/AD5695R/AD5694R using an
ADuM1400. For further information, visit
http://www.analog.com/icouplers.
CONTROLLER
V
OUT
IA
V
IB
V
IC
V
ID
SERIAL
CLOCK IN
SERIAL
DATA OUT
RESET OUT
LOAD DAC
1
ADDITIONAL PI NS OMITTED FO R C LARITY.
ADuM1400
ENCODE
ENCODEDECODE
ENCODEDECODE
ENCODEDECODE
Figure 60. Isolated Interface
1
DECODE
V
OA
TO
SCL
V
OB
TO
SDA
V
OC
TO
RESET
V
OD
TO
LDAC
10486-167
Rev. 0 | Page 27 of 32
Page 28
AD5696R/AD5695R/AD5694R Data Sheet
3.10
3.00 SQ
2.90
0.30
0.23
0.18
1.75
1.60 SQ
1.45
08-16-2010-E
1
0.50
BSC
BOTTOM VIEWTOP VIEW
16
5
8
9
12
13
4
EXPOSED
PAD
PIN 1
INDICATOR
0.50
0.40
0.30
SEATING
PLANE
0.05 MAX
0.02 NOM
0.20 REF
0.25 MIN
COPLANARITY
0.08
PIN 1
INDICATOR
FOR PROP E R CONNECTIO N OF
THE EXPOSED PAD, REFER TO
THE PIN CO NFIGURATION AND
FUNCTIO N DE S CRIPTIO NS
SECTION OF THIS DATA SHEET.
0.80
0.75
0.70
COMPLIANT
TO
JEDEC STANDARDS MO-220-WEED- 6.
16
9
81
PIN 1
SEATING
PLANE
8°
0°
4.50
4.40
4.30
6.40
BSC
5.10
5.00
4.90
0.65
BSC
0.15
0.05
1.20
MAX
0.20
0.09
0.75
0.60
0.45
0.30
0.19
COPLANARITY
0.10
COMPLI ANT TO JEDEC S TANDARDS MO-153-AB
OUTLINE DIMENSIONS
Figure 61. 16-Lead Lead Frame Chip Scale Package [LFCSP_WQ]
3 mm × 3 mm Body, Very Very Thin Quad
(CP-16-22)
Dimensions shown in millimeters
Figure 62. 16-Lead Thin Shrink Small Outline Package [TSSOP]