Low Power Quad 16 Bit DAC
14-Lead TSSOP Package
On-chip 1.25/2.5V, 10ppm/°C Reference
Power-Down to 200 nA @ 5V, 50 nA @ 3V
3V/5V Power Supply
Guaranteed Monotonic by Design
Power-On-Reset to Zero or Midscale
Three Power-Down Functions
Hardware /LDAC and /CLR functions
SDO Daisy-Chaining Option
Rail-to-Rail Operation
Temperature Range -40°C to +125°C
APPLICATIONS
ProcessControl
GENERAL DESCRIPTION
The AD5666 DAC is a low power, quad, 16-bit buffered
voltage-out DAC. The part operates from a single +2.7V to
+5.5V, and is guaranteed monotonic by design.
The AD5666 has an on-chip reference with an internal gain of
two. The AD5666-1 has a 1.25V 10ppm/°C max reference and
the AD5666-2 has a 2.5V 10ppm/°C max reference. The onboard reference is off at power-up allowing the use of an
external reference. The internal reference is turned on by
writing to the DAC. The part incorporates a power-on-reset
circuit that ensures that the DAC output powers up to zero
volts (POR pin low) or midscale (POR pin high) and remains
there until a valid write takes place. The part contains a
power-down feature that reduces the current consumption of
the device to 200nA at 5V and provides software selectable
output loads while in power-down mode for any or all DACs
channels.
Chip Reference in 14-Lead TSSOP
AD5666
Data Acquisition Systems
Portable Battery Powered Instruments
Digital Gain and Offset Adjustment
Programmable Voltage and Current Sources
Programmable Attenuators
V
DD
SCLK
SYNC
DIN
SDO
LDAC
INTERFACE
LOGIC
LDAC CLR
I
NPUT
REGISTER
I
NPUT
REGISTER
I
NPUT
REGISTER
I
NPUT
REGISTER
POWER-
RESET
POR
REGISTER
REGISTER
REGISTER
ON
Figure 1. Functional Block Diagram
The outputs of all DACs may be updated simultaneously using
the /LDAC function, with the added functionality of selecting
through software any number of DAC channels to synchronize.
There is also an asynchronous active low /CLR that clears all
DACs to a software selectable code - 0 V, midscale or fullscale .
The AD5666 utilizes a versatile three-wire serial interface that
operates at clock rates up to 50 MHz and is compatible with
standard SPI™, QSPI™, MICROWIRE™ and DSP interface
standards. Its on-chip precision output amplifier allows rail-torail output swing to be achieved.
PRODUCT HIGHLIGHTS
1. Quad 16-Bit DAC
2. On-chip 1.25/2.5V, 10ppm/°C max Reference.
3. Available in 14-lead TSSOP package.
4. Selectable Power-On-Reset to Zero volts or Midscale.
5. Power-down capability. When powered down, the
DAC typically consumes 50nA at 3V and 200nA at 5V.
DAC
DAC
DAC
D
AC
REGISTER
V
STRING
DAC A
STRING
DAC B
STRING
DAC C
STRING
DAC D
REF
1.25/2.5V
Ref
BUFFER
BUFFER
BUFFER
BUFFER
),#$$$
POWER-DOWN
LOGIC
GND
V
A
OUT
V
B
OUT
V
C
OUT
V
D
OUT
Rev. PrB
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
8.
Zero Code Error Drift3 ±20 µV/°C
Full-Scale Error -0.15 -1.25 % of FSR All Ones Loaded to DAC Register. See Figure 8.
Gain Error ±0.7 % of FSR
Gain Temperature Coefficient ±5 ppm of FSR/°C
Offset Error ±1 ±9 mV
Offset Temperature Coefficient 1.7 µV/°C
DC Power Supply Rejection
6
Ratio
DC Crosstalk6
–80
28
3.5
-7.3
dBVDD ±10%
µV
µV/mA
µV
RL = 2 k. to GND or VDD
Due to Load current change
Due to Powering Down (per channel)
OUTPUT CHARACTERISTICS6
Output Voltage Range 0 VDD V
Capacitive Load Stability 470 pF RL=∞
1000 pF RL=2 kΩ
DC Output Impedance 1 Ω
Short Circuit Current 50 mA VDD=+5V
Power-Up Time 10
µs
Mode. VDD=+5V
REFERENCE INPUTS3
Reference Input voltage Vdd V ±1% for specified performance
Reference Current 20 30 µ A V
= VDD = +5.5V
REF
Reference Input Range 0 VDD
Reference Input Impedance 14.6
kΩ
Per Dac Channel
REFERENCE OUTPUT
Output Voltage 2.495 2.5 2.505 V
Reference TC ±10 ppm/°C
Reference Output Impedance 2
kΩ
MIN
to T
unless otherwise
MAX
Iout=0mA to 15mA
1
Temperature ranges are as follows: B Version: -40°C to +125°C, typical at 25°C.
2
Linearity calculated using a reduced code range of 485 to 64714. Output unloaded.
3
DC specifications tested with the outputs unloaded unless stated otherwise.
4
Linearity is tested using a reduced code range: AD5628 (Code 48 to Code 4047), AD5648 (Code / to Code /), and AD5668 (Code 485 to 64714).
6
Guaranteed by design and characterization; not production tested.
8
Interface inactive. All DACs active. DAC outputs unloaded.
9
All eight DACs powered down.
Specifications subject to change without notice.
Rev. PrB| Page 3 of 23
Page 4
AD5666
A Grade
Parameter Min Typ Max Unit
LOGIC INPUTS3
Input Current ±1 µA
V
, Input Low Voltage 0.8 V VDD=+5 V
INL
V
, Input High Voltage 2 V VDD=+5 V
INH
Pin Capacitance 3 pF
LOGIC OUTPUTS (SDO)3
Output Low Voltage, VOL
Output High Voltage, VOH
High Impedance Leakage
VDD – 1
0.4 V I
ISOURCE = 2 mA
±1
µA
Preliminary Technical Data
B Version
Conditions/Comments
SINK = 2 mA
1,2
Current
High Impedance Leakage
5
pF
Current
POWER REQUIREMENTS
VDD 4.5 5.5 V All Digital Inputs at 0 or VDD
DAC Active and Excluding Load Current
IDD (Normal Mode)8 0.5 4 mA VIH=VDD and VIL=GND
IDD (All Power-Down Modes)9 0.2 1 µA VIH=VDD and VIL=GND
POWER EFFICIENCY
I
89 % I
OUT/IDD
=2 mA, VDD=+5 V
LOAD
Rev.PrB | Page 4 of 23
Page 5
Preliminary Technical Data
1
AC CHARACTERISTICS
specifications T
MIN
to T
unless otherwise noted)
MAX
(VDD = +4.5 V to +5.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; External VREF = Vdd; all
AD5666
Parameter2 Min Typ Max Unit
Output Voltage Settling Time
AD5666 8 10 µs ¼ to ¾ scale settling to ±2LSB
Settling Time for 1LSB Step
Slew Rate 1 V/µs
Digital-to-Analog Glitch Impulse 10 nV-s 1 LSB Change Around Major Carry. See Figure 21.
Reference Feedthrough 100 dB
SDO Feedthrough 4 nV-s Daisy Chain Mode; SDO Load is 10pF
Digital Feedthrough 0.5 nV-s
Digital Crosstalk 0.5 nV-s
Analog Crosstalk 1 nV-s
DAC-to-DAC Crosstalk 3 nV-s
Multiplying Bandwidth 200 kHz VREF = 2V ± 0.1 V p-p.
Total Harmonic Distortion -80 dB VREF = 2V ± 0.1 V p-p. Frequency = 10kHz
Output Noise Spectral Density 120 nV/√Hz DAC code=8400H, 1kHz
100 nV/√Hz DAC code=8400H, 10kHz
Output Noise 15
1
µVp-p
B Version
Conditions/Comments
0.1Hz to 10Hz;
NOTES
1Guaranteed by design and characterization; not production tested.
2See the Terminology section.
3Temperature range (Y Version): –40°C to +125°C; typical at +25°C.
Specifications subject to change without notice.
Rev. PrB| Page 5 of 23
Page 6
AD5666
Preliminary Technical Data
AD5666–SPECIFICATIONS
(VDD = +2.7 V to +3.6 V; RL = 2 kΩ to GND; CL = 200 pF to GND; External VREF = Vdd; all specifications T
noted)
Zero Code Error Drift1 ±20 µV/°C
Full-Scale Error -0.15 -1.25 % of FSR All Ones Loaded to DAC Register. See Figure 8.
Gain Error ±0.7 % of FSR
Gain Temperature Coefficient ±5 ppm of FSR/°C
Offset Error ±1 ±9 mV
Offset Temperature Coefficient 1.7 µV/°C
DC Power Supply Rejection
6
Ratio
DC Crosstalk6
OUTPUT CHARACTERISTICS6
Output Voltage Range 0 VDD V
Capacitive Load Stability 470 pF RL=∞
1000 pF RL=2 kΩ
DC Output Impedance 1 Ω
Short Circuit Current 20 mA VDD=+3V Coming Out of Power-Down
Power-Up Time 10 ms Mode. VDD=+3V
REFERENCE INPUTS3
Reference Input voltage Vdd V ±1% for specified performance
Reference Current 35 45 µ A V
Reference Input Range 0 VDD
Reference Input Impedance 14.6
REFERENCE OUTPUT
Output Voltage 1.248 1.25 1.252 V
Reference TC ±10 ppm/°C
Reference Output Impedance 2
LOGIC INPUTS3
Input Current ±1 µA
V
, Input Low Voltage 0.8 V VDD=+3 V
INL
V
, Input High Voltage 2 V VDD=+3 V
INH
Pin Capacitance 3 pF
LOGIC OUTPUTS (SDO)3
3,4
–80
28
3.5
-7.3
dBVDD ±10%
µV
µV/mA
µV
kΩ
kΩ
Conditions/Comments
Guaranteed Monotonic by Design. See Figure
5.
VDD=Vref=3V, Midscale
sourcing/sinking
All Zeroes Loaded to DAC Register. See Figure
8.
RL = 2 k. to GND or VDD
Due to Load current change
Due to Powering Down (per channel)
REF
Per Dac Channel
1,1
= VDD = +3.6V
to T
MIN
unless otherwise
MAX
Iout=0mA to 7.5mA
Rev.PrB | Page 6 of 23
Page 7
Preliminary Technical Data
AD5666
Output Low Voltage, V
Output High Voltage, VOH
High Impedance Leakage
OL
VDD – 0.5
0.4 V I
SINK = 2 mA
ISOURCE = 2 mA
±1
µA
Current
High Impedance Leakage
5
pF
Current
POWER REQUIREMENTS
VDD 2.7 3.6 V All Digital Inputs at 0 or VDD
DAC Active and Excluding Load Current
IDD (Normal Mode)8 0.5 3 mA VIH=VDD and VIL=GND
IDD (All Power-Down Modes)9 0.2 1 µA VIH=VDD and VIL=GND
VDD=2.7 V to +3.6 V
POWER EFFICIENCY
I
89 % I
OUT/IDD
=2 mA, VDD=+5 V
LOAD
AC CHARACTERISTICS1
(VDD = +2.7 V to +3.6 V; RL = 2 kΩ to GND; CL = 200 pF to GND; External VREF = Vdd; all specifications T
noted)
B Version
Parameter2 Min Typ Max Unit
Conditions/Comments
1
Output Voltage Settling Time
AD5666 8 10 µs ¼ to ¾ scale settling to ±2LSB
Settling Time for 1LSB Step
Slew Rate 1 V/µs
Digital-to-Analog Glitch Impulse 10 nV-s 1 LSB Change Around Major Carry. See Figure 21.
Reference Feedthrough 100 dB
Digital Feedthrough 0.5 nV-s
SDO Feedthrough 4 nV-s Daisy Chain Mode; SDO Load is 10pF
Digital Crosstalk 0.5 nV-s
Analog Crosstalk 1 nV-s
DAC-to-DAC Crosstalk 3 nV-s
Multiplying Bandwidth 200 kHz VREF = 2V ± 0.1 V p-p.
Total Harmonic Distortion -80 dB VREF = 2V ± 0.1 V p-p. Frequency = 10kHz
Output Noise Spectral Density 120 nV/√Hz DAC code=8400H, 1kHz
100 nV/√Hz DAC code=8400H, 10kHz
Output Noise 15
NOTES
1Guaranteed by design and characterization; not production tested.
2See the Terminology section.
3Temperature range (Y Version): –40°C to +125°C; typical at +25°C.
Specifications subject to change without notice.
µVp-p
0.1Hz to 10Hz;
MIN
to T
unless otherwise
MAX
Rev. PrB| Page 7 of 23
Page 8
AD5666
TIMING CHARACTERISTICS
(All specifications T
MIN
to T
unless otherwise noted)
MAX
1,2,3
Preliminary Technical Data
Limit at T
Parameter V
= 2.7 V to 3.6 V VDD= 3.6 V to 5.5 V Unit Conditions/Comments
DD
MIN
, T
MAX
t1 1 20 20 ns min SCLK Cycle Time
t2 11 9 ns min SCLK High Time
t3 9 9 ns min SCLK Low Time
t4 13 13 ns min
SYNC
to SCLK Falling Edge Setup Time
t5 4 4 ns min Data Setup Time
t6 4 4 ns min Data Hold Time
t7 0 0 ns min
t8 25 20 ns min
t9 13 13 ns min
t10 0 0 ns min
t11 20 20 ns min
t12 20 20 ns min
SCLK Falling Edge to
SYNC
Minimum
SYNC
Rising Edge to SCLK Fall Ignore
High Time
SCLK Falling Edge to
LDAC Pulsewidth Low
SCLK Falling Edge to LDAC Rising Edge
t13 20 20 ns min /CLR Pulse Width Low
t14 0 0 ns min
4,5
t15
5
t
5 5 ns min
16
5
t
8 8 ns min
17
5
t
0 0 ns min
18
20 20
ns maxSCLK Rising Edge to SDO Valid
SCLK Falling Edge to LDAC Falling Edge
SCLK Falling Edge to SYNC Rising Edge
SYNC Rising Edge to SCLK Rising Edge
SYNC Rising Edge to LDAC Falling Edge
SYNC
Rising Edge
SYNC
Fall Ignore
1
3Maximum SCLK frequency is 50 MHz at VDD = +3.6 V to +5.5 V and 20 MHz at VDD = +2.7 V to +3.6 V.
1Guaranteed by design and characterization; not production tested.
2All input signals are specified with tr = tf = 1 ns/V (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2.
3See Figures 2 and 3.
4This is measured with the load circuit of Figure 1. t15 determines maximum SCLK frequency in Daisy-Chain mode.
5Daisy-chain mode only.
Specifications subject to change without notice.
2mA
I
OL
TO OUTPUT
PIN
C
L
50pF
I
2mA
OH
Figure 1. Load Circuit for Digital Output (SDO) T iming Specifications
V
OH (MIN)
Rev.PrB | Page 8 of 23
Page 9
Preliminary Technical Data
t
10
SCLK
t
8
SYNC
DIN
LDAC1
LDAC2
CLR
NOTES
1. ASYNCHRONOUS LDAC UPDATE MODE.
2. SYNCHRONOUS LDAC UPDATE MODE.
DB31
AD5666
t
1
t
t
t
4
t
5
3
t
6
2
Figure 2. Serial Write Operation
DB0
t
t14
t
9
7
t11
t12
t13
t1
t1
SCLK
SYNC
32
t7
t3
t2
t4
64
t17
t16
t8 t9
DIN
DB31
Input Word for DAC N
DB0
DB31
Input Word for DAC N+1
DB0'
t15
SDO
UNDEFINED
DB31
Input Word for DAC N
DB0
t18
t11
LDAC
Figure 3. Daisy Chain Timing Diagram
Rev. PrB| Page 9 of 23
Page 10
AD5666
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Preliminary Technical Data
1
LDAC
2
DD
A
C
AD5666
3
TOP VIEW
(Not to Scale)
4
5
6
7
SYNC
V
V
OUT
V
OUT
V
REF
POR
Figure 3. 14-Lead TSSOP (RU-14)
14
SCLK
13
DIN
12
GND
V
B
11
OUT
V
D
10
OUT
9
CLR
8
SDO
Table 2. Pin Function Descriptions
Pin No. Mnemonic Function
1 /LDAC Pulsing this pin low allows any or all DAC registers to be updated if the input registers have new data.
This allows simultaneous update of all DAC outputs. Alternatively, this pin can be tied permanently
low.
2 /SYNC
Active Low-Control Input. This is the frame synchronization signal for the input data. When SYNC
goes low, it powers on the SCLK and DIN buffers and enables the input shift register. Data is
transferred in on the falling edges of the following 32 clocks. If SYNC is taken high before the 32nd
falling edge, the rising edge of SYNC acts as an interrupt and the write sequence is ignored by the
device.
3 VDD Power Supply Input. These parts can be operated from 2.5 V to 5.5 V, and the supply should be
decoupled with a 10 µF capacitor in parallel with a 0.1 µF capacitor to GND.
4 VOUTA Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
5 VOUTC Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
6 VREF Reference Input/Output Pin
7 POR Power-On–Reset pin. Tying this pin to GND powers on part to 0V. Tying to VDD powers on part to
midscale.
8 SDO Serial Data Output. Can be used for daisy-chaining a number of these devices together or for reading
back the data in the shift register for diagnostic purposes. The serial data is transferred on the rising
edge of SCLK and is valid on the falling edge of the clock.
9 /CLR
Active Low Control Input that Loads Software selectable code – Zero, midscale, fullscale - to All Input and
DAC Registers. Therefore, the outputs also go to selected code. Default clears the output to 0V.
10 VOUTD Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
11 VOUTB Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
12 GND Ground Reference Point for All Circuitry on the Part.
13 DIN Serial Data Input. This device has a 32-bit shift register. Data is clocked into the register on the falling
edge of the serial clock input.
14 SCLK Serial Clock Input. Data is clocked into the input shift register on the falling edge of the serial clock
input. Data can be transferred at rates up to 50 MHz.
Rev.PrB | Page 10 of 23
Page 11
Preliminary Technical Data
ABSOLUTE MAXIMUM RATINGS
V
to GND -0.3 V to VDD + 0.3 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
= +25°C unless otherwise noted)
(T
A
Parameter Rating
VDD to GND -0.3 V to +7 V
Digital Input Voltage to GND -0.3 V to VDD + 0.3 V
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or Integral Nonlinearity (INL) is a
measure of the maximum deviation, in LSBs, from a straight line
passing through the endpoints of the DAC transfer function. A
typical INL vs. code plot can be seen in Figure 2.
Differential Nonlinearity
Differential Nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. A typical DNL vs. code plot can be seen in
Figure 3.
OUT
Operating Temperature Range
Industrial (B Version) -40°C to +105°C
Storage Temperature Range -65°C to +150°C
Junction Temperature (TJ Max) +150°C
TSSOP Package
Power Dissipation (TJ Max-TA)/θJA
θJA Thermal Impedance 150.4°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) +215°C
Infrared (15 sec) +220°C
(0000Hex) is loaded to the DAC register. Ideally the output should
be 0 V. The zero-code error is always positive in the AD5666
because the output of the DAC cannot go below 0 V. It is due to a
combination of the offset errors in the DAC and output amplifier.
Zero-code error is expressed in mV. A plot of zero-code error vs.
temperature can be seen in Figure 6.
Gain Error
This is a measure of the span error of the DAC. It is the deviation
in slope of the DAC transfer characteristic from ideal expressed as
a percent of the full-scale range.
Zero-Code Error Drift
This is a measure of the change in zero-code error with a change in
temperature. It is expressed in µV/°C.
AD5666
Offset Error
Offset error is a measure of the difference between VOUT
(actual) and VOUT (ideal) expressed in mV in the linear
region of the transfer function. Offset error is measured on
the AD5666 with Code 512 loaded into the DAC register.
This is a measure of the offset error of the DAC and the output
amplifier (see Figures 2 and 3). It can be negative or positive, and is
expressed in mV.
Zero-Code Error
Zero-code error is a measure of the output error when zero code
Rev. PrB| Page 11 of 23
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (FFFF Hex) is loaded to the DAC register. Ideally the output
should be VDD – 1 LSB. Full-scale error is expressed in percent of
full-scale range. A plot of full-scale error vs.temperature can be
seen in Figure 6.
Total Unadjusted Error
Total Unadjusted Error (TUE) is a measure of the output error
Page 12
AD5666
taking the various offset and gain errors into account. A typical
TUE vs. code plot can be seen in Figure 4.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV secs and
is measured when the digital input code is changed by 1 LSB at the
major carry transition (7FFF Hex to 8000 Hex). See Figure 19.
DC Power Supply Rejection Ratio (PSRR)
This indicates how the output of the DAC is affected by changes in
the supply voltage. PSRR is the ratio of the change in VOUT
to a change in VDD for full-scale output of the DAC. It is
measured in dB. VREF is held at 2 V and VDD is varied ±10%.
DC Crosstalk
This is the dc change in the output level of one DAC in response to
a change in the output of another DAC. It is measured with a full-
scale output change on one DAC while monitoring another DAC
kept at midscale. It is expressed in µV.
Reference Feedthrough
This is the ratio of the amplitude of the signal at the DAC output to
the reference input when the DAC output is not being updated
(i.e., LDAC is high). It is expressed in dB.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into the
analog output of a DAC from the digital input pins of the device,
but is measured when the DAC is not being written to (SYNC held
high). It is specified in nV-s and is measured with a fullscale
change on the digital input pins, i.e., from all 0s to all 1s and vice
versa.
Preliminary Technical Data
This is the glitch impulse transferred to the output of one DAC at
midscale in response to a full-scale code change (all 0s to all 1s and
vice versa) in the input register of another DAC. It is measured in
standalone mode and is expressed in nV-s.
Analog Crosstalk
This is the glitch impulse transferred to the output of one DAC due
to a change in the output of another DAC. It is measured by
loading one of the input registers with a full-scale code change (all
0s to all 1s and vice versa) while keeping LDAC high. Then pulse
LDAC low and monitor the output of the DAC whose digital code
was not changed. The area of the glitch is expressed in nV-s.
DAC-to-DAC Crosstalk
This is the glitch impulse transferred to the output of one DAC due
to a digital code change and subsequent output change of another
DAC. This includes both digital and analog crosstalk. It is
measured by loading one of the DACs with a full-scale code change
(all 0s to all 1s and vice versa) with LDAC low and monitoring the
output of another DAC. The energy of the glitch is expressed in
nV-s.
Multiplying Bandwidth
The amplifiers within the DAC have a finite bandwidth. The
multiplying bandwidth is a measure of this. A sine wave on the
reference (with full-scale code loaded to the DAC) appears on the
output. The multiplying bandwidth is the frequency at which the
output amplitude falls to 3 dB below the input.
Total Harmonic Distortion
This is the difference between an ideal sine wave and its attenuated
version using the DAC. The sine wave is used as the reference for
the DAC, and the THD is a measure of the harmonics present on
the DAC output. It is measured in dB.
Digital Crosstalk
Rev.PrB | Page 12 of 23
Page 13
Preliminary Technical Data
AD5666–TYPICAL PERFORMANCE CHARACTERISTICS
Figure 4. Typical INL Plot
AD5666
Figure 7. INL Error and DNL Error vs. Temperature
Figure 5. Typical DNL Plot
Figure 6. Typical Total Unadjusted Error Plot
Rev. PrB| Page 13 of 23
Figure 8. Zero-Scale Error and Full-Scale Error vs. Temperature
Figure 9. I
Histogram with VDD=3V and VDD=5V
DD
Page 14
AD5666
Preliminary Technical Data
Figure 10. Source and Sink Current Capability with V
Figure 11. Source and Sink Current Capability with V
DD
DD
=3V
=5 V
Figure 13. Supply Current vs. Temperature
Figure 14. Supply Current vs. Supply Voltage
Figure 12. Supply Current vs. Code
Rev.PrB | Page 14 of 23
Figure 15. Power-Down Current vs. Supply Voltage
Page 15
Preliminary Technical Data
Figure 16. Supply Current vs. Logic Input Voltage
AD5666
Figure 19. Power-On Reset to 0V
Figure 20. Exiting Power-Down (800 Hex Loaded)
Figure 17. Full-Scale Settling Time
Figure 18. Half-Scale Settling Time
Figure 21. Digital-to-Analog Glitch Impulse
Rev. PrB| Page 15 of 23
Page 16
AD5666
GENERAL DESCRIPTION
D/A Section
The AD5666 DAC is fabricated on a CMOS process. The
architecture consists of a string DAC followed by an output
buffer amplifier. The parts include an internal 1.25/2.5V,
10ppm/°C reference with an internal gain of two. Figure 22
shows a block diagram of the DAC architecture.
V
DD
REF (+)
DAC REGISTER
Figure 22. DAC Architecture
Since the input coding to the DAC is straight binary, the ideal
output voltage is given by:
OUT
OUT
where D = decimal equivalent of the binary code that is loaded
to the DAC register;
0 - 65535 for AD5666 (16 bit)
N = the DAC resolution
RESISTOR
STRING
REF ()
GND
⎛
extVrefV
)(
×=
⎜
⎝
VrefV
(int)2
×∗=
OUTPUT
AMPLIFIER
(Gain=2)
D
⎞
⎟
^2
N
⎠
D
⎛
⎜
⎝
⎞
⎟
^2
N
⎠
V
OUT
Preliminary Technical Data
Figure 23. Resistor String
Resistor String
The resistor string section is shown in Figure 23. It is simply a
string of resistors, each of value R. The code loaded to the DAC
register determines at which node on the string the voltage is
tapped off to be fed into the output amplifier. The voltage is
tapped off by closing one of the switches connecting the string
to the amplifier. Because it is a string of resistors, it is
guaranteed monotonic.
Output Amplifier
The output buffer amplifier is capable of generating rail-to-rail
voltages on its output which gives an output range of 0 V to
. It is capable of driving a load of 2 kΩ in parallel with 1000
V
DD
pF to GND. The source and sink capabilities of the output
amplifier can be seen in Figure 10 and Figure 11. The slew rate
is 1 V/µs with a half-scale settling time of 8 µs with the output
unloaded.
SERIAL INTERFACE
The AD5666 has a three-wire serial interface (
DIN), which is compatible with SPI, QSPI and MICROWIRE
interface standards as well as most DSPs. See Figure 2 for a
timing diagram of a typical write sequence.
The write sequence begins by bringing the
from the DIN line is clocked into the 32-bit shift register on the
falling edge of SCLK. The serial clock frequency can be as high
as 50 MHz, making the AD5666 compatible with high speed
DSPs. On the 32nd falling clock edge, the last data bit is clocked
in and the programmed function is executed (i.e., a change in
DAC register contents and/or a change in the mode of
SYNC
operation). At this stage, the
brought high. In either case, it must be brought high for a
minimum of 50 ns before the next write sequence so that a
falling edge of
SYNC
the
does when V
write sequences for even lower power operation of the part. As
is mentioned above, however, it must be brought high again just
before the next write sequence.
SYNC
can initiate the next write sequence. Since
buffer draws more current when VIN = 2V than it
= 0.8 V,
IN
SYNC
line may be kept low or be
should be idled low between
SYNC
SYNC
line low. Data
, SCLK and
Rev.PrB | Page 16 of 23
Input Shift Register
The input shift register is 32 bits wide (see Figure 24). The first
five bits are “don’t cares.” The next four bits are the Command
bits C3-C0, (see Table 1) followed by the 4-bit DAC address
A3-A0, (see Table 2) and finally the 16-bit data word. The data
word comprises the 16- bit input code followed by 4 don’t care
bits for the AD5666. See figure 24. These data bits are
transferred to the DAC register on the 32nd falling edge of
Page 17
Preliminary Technical Data
SCLK.
Daisy-Chaining
For systems that contain several DACs, or where the user
wishes to read back the DAC contents for diagnostic
purposes, the SDO pin may be used to daisy-chain several
devices together and provide serial readback.
The the daisy chain mode is enabled through a software
executable DCEN Setup function, Command 1000 is reserved
for this DCEN Setup function, see Table 3. The daisy chain mode is software-programmable by setting a bit (DB1) in the
DCEN Setup register. The default setting is stand-alone mode where bit DCEN =0.Table 4 shows how the state of
the bits corresponds to the mode of operation of the device.
input shift register when SYNC is low. If more than 32
clock pulses are applied, the data ripples out of the shift
register and appears on the SDO line. This data is clocked
out on the rising edge of SCLK and is valid on the falling
AD5666
edge. By connecting this line to the DIN input on the next
DAC in the chain, a multi-DAC interface is constructed.
Thirty-two clock pulses are required for each DAC in the
system. Therefore, the total number of clock cycles must
equal 32N, where N is the total number of devices
in the chain. When the serial transfer to all devices is
complete, SYNC should be taken high. This prevents any
further data from being clocked into the input shift
register.
A continuous SCLK source may be used if it can be
arranged that SYNC is held low for the correct number of
clock cycles. Alternatively, a burst clock containing the
exact number of clock cycles may be used and SYNC may
be taken high some time later.
When the transfer to all input registers is complete, a
common LDAC signal updates all DAC registers and all
is brought high before the 32nd falling edge this acts as an interrupt to the write sequence. The shift register is
line is kept low for at least 32 falling edges of SCLK and the DAC is updated on the 32nd falling
reset and the write sequence is seen as invalid. Neither an update of the DAC register contents or a change in the operating mode
occurs—see Figure 25.
SCLK
SYN C
DIN
DB31
INVALID WRITE SEQUENCE:
SYN C HIGH BEFORE 32NDFALLING EDGE
DB0
Figure 25. SYNC Interrupt Facility
DB31DB0
VALID WRITE SEQUENCE, OUTPUT UPDATES
ON THE 32NDFALLING EDGE
Reference Setup –External to Internal
The on-board reference is turned off at power-up by default, allowing the use of an external reference. The AD5666 has an on-chip
reference with an internal gain of two. The AD5666-1 has a 1.25V 10ppm/°C max reference and the AD5666-2 has a 2.5V 10ppm/°C
max reference. The on-board reference can be turned on/off through a software executable REF Setup function, Command 1000 is
reserved for this REF Setup function, see Table 3. The reference mode is software-programmable by setting a bit (DB0) in the REF
Rev.PrB | Page 18 of 23
Page 19
Preliminary Technical Data
Setup register. Table 4 shows how the state of the bits corresponds to the mode of operation of the device.
Table 4. 32-Bit Input Shift Register Contents for Daisy Chain Enable and Reference Setup Function
Power-On-Reset
The AD5666 family contains a power-on-reset circuit that controls the output voltage during power-up. By connecting the POR pin low
the DAC output powers up to zero volts and by connecting the POR pin high the DAC output powers up to midscale. The output
remains there until a valid write sequence is made to the DAC. This is useful in applications where it is important to know the state of the
output of the DAC while it is in the process of powering up.
There is also a software executable Reset function that will reset the DAC to the Power-on -Reset code. Command 111 is reserved for this
Reset function, see Table 1.
Power-Dow n Modes
The AD5666 contains four separate modes of operation. Command 100 is reserved for the Power-Down function. See Table 1. These
modes are software-programmable by setting two bits (DB19 and DB18) in the control register. Table 3 shows how the state of the bits
corresponds to the mode of operation of the device. Any or all DACs, (DacD to DacA) may be powered down to the selected mode by
setting the corresponding 4 bits (DB7,6,1,0) to a “1”. See Table 6 for contents of the Input Shift Register during power down/up
operation.
DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB2-
DB19
COMMAND BITS (C3-C0) ADDRESS BITS (A3 – A0) Don’t
Cares
DB1 DB0
DCEN/REF
Setup Register
When both bits are set to 0, the part works normally with its normal power consumption of 250 µA at 5 V. However, for the three powerdown modes, the supply current falls to 200 nA at 5 V (50 nA at 3 V). Not only does the supply current fall but the output stage is also
internally switched from the output of the amplifier to a resistor network of known values. This has the advantage that the output
Rev. PrB| Page 19 of 23
Page 20
AD5666
Preliminary Technical Data
impedance of the part is known while the part is in power-down mode. There are three different options. The output is connected
internally to GND through a 1 kΩ resistor, a 100 kΩ resistor or it is left open-circuited (Three-State). The output stage is illustrated in
figure 24.
The bias generator, the output amplifier, the resistor string and other associated linear circuitry are all shut down when the power-down
mode is activated. However, the contents of the DAC register are unaffected when in power-down. The time to exit power-down is
typically (2.5 µs for V
= 5 V and 5 µs for VDD = 3 V)???. See Figure 20 for a plot.
DD
Any combination of DACs can be powered up by setting PD1 and PD0 to “0” (normal operation). Output powers-up to value in input
register (/LDAC Low) or to value in DAC register before Power-Down (/LDAC High).
DB9 DB8 Operating Mode
0 0 Normal Operation
Power Down Modes
0 1 1 kΩ to GND
1 0 100 kΩ to GND
1 1 Three State
Table 6. 32-Bit Input Shift Register Contents of Power Up/Down Function
Clear Code Register
DacD DacC DacB DacA
Set Bit to a “1” to select
The AD5666 gives the option of clearing all DAC channels to 0, midscale or fullscale code. Command 101 is reserved for the Clear Code
function. See Table1. These clear code values are software-programmable by setting two bits (DB1 and DB0) in the control register.
Table shows how the state of the bits corresponds to the clear code values of the device. Upon execution of the hardware /CLR pin
(active LOW), the DAC output is cleared to the clear code register value (default setting is zero). See Table 7 for contents of the Input
Rev.PrB | Page 20 of 23
Page 21
Preliminary Technical Data
Shift Register during the Clear Code Register operation
Clear Code Register
CR1 CR0 Clears to code
0 0 0000h
0 1 8000h
1 0 FFFFh
1 1 No operation
Table 6. Clear Code Register
MSB LSB
AD5666
DB31 –
DB28
x 0 1 0 1 x x x x x 1/0 1/0
Don’t
Cares
Table 7. 32-Bit Input Shift Register Contents Clear Code Function
LDAC Function
The outputs of all DACs may be updated simultaneously using the hardware /LDAC pin.
Synchronous LDAC: The DAC registers are updated after new data is read in on the falling edge of the 32nd SCLK pulse. LDAC can be
permanently low or pulsed as in Figure 1.
Asynchronous LDAC: The outputs are not updated at the same time that the input registers are written to. When LDAC goes low, the
DAC registers are updated with the contents of the input register.
The outputs of all DACs may be updated simultaneously using the /LDAC function, with the added functionality of selecting through
software any number of DAC channels to synchronize.
Writing to the DAC using command 110, the hardware /LDAC pin can be overwritten by setting the bits of the 4-bit /LDAC register
(DB7,DB6, DB1,DB0) . SeeTable 5 for the /LDAC mode of operation. The default for each channel is “0” ie /LDAC pin works normally.
Setting the bits to a “1” means the DAC channel will be updated regardless of the state of the /LDAC pin. This gives the added benefit of
allowing any combination of channels to be synchronously updated. See Table 8 for contents of the Input Shift Register during the
/LDAC overwrite mode of operation.
DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB2-
DB19
COMMAND BITS (C2-C0) ADDRESS BITS (A3 – A0)
Don’t
Cares
DB1 DB0
Clear Code
Register (CR1CR0)
Load DAC OVERWRITE
/LDACBITS (DB7DB0)
0 1/0
1 x – Don’t Care
Table 5. LDAC Overwrite Definition
/LDAC PIN /LDAC Operation
Determined by
/LDAC pin
DAC channels will
update, overwriting
the /LDAC pin
Rev. PrB| Page 21 of 23
Page 22
AD5666
MSB LSB
Preliminary Technical Data
DB31
–
DB28
x 0 1 1 0 x x x x x DacD DacC DacB DacA
Don’t
Cares
DB27
COMMAND BITS (C2-C0) ADDRESS BITS (A3 – A0)
Table 8. 32-Bit Input Shift Register Contents for /LDAC Overwrite Function
Power Supply Bypassing and Grounding
When accuracy is important in a circuit it is helpful to carefully
consider the power supply and ground return layout on the
board. The printed circuit board containing the AD5666 should
have separate analog and digital sections, each having its own
area of the board. If the AD5666 is in a system where other
devices require an AGND to DGND connection, the
connection should be made at one point only. This ground
point should be as close as possible to the AD5666.
The power supply to the AD5666 should be bypassed with 10
µF and 0.1 µF capacitors. The capacitors should be physically as
close as possible to the device with the 0.1 µF capacitor ideally
right up against the device. The 10 µF capacitors are the
tantalum bead type. It is important that the 0.1 µF capacitor has
low Effective Series Resistance (ESR) and Effective Series
DB26 DB25 DB24 DB23 DB22 DB21 DB2
0
Don’t cares
DB4 –DB19 DB3 DB2 DB1 DB0
Don’t Cares
Inductance (ESI), e.g., common ceramic types of capacitors.
This 0.1 µF capacitor provides a low impedance path to ground
for high frequencies caused by transient currents due to internal
logic switching.
The power supply line itself should have as large a trace as
possible to provide a low impedance path and reduce glitch
effects on the supply line. Clocks and other fast switching
digital signals should be shielded from other parts of the board
by digital ground. Avoid crossover of digital and analog signals
if possible. When traces cross on opposite sides of the board,
ensure that they run at right angles to each other to reduce
feedthrough effects through the board. The best board layout
technique is the microstrip technique where the component
side of the board is dedicated to the ground plane only and the
signal traces are placed on the solder side. However, this is not
always possible with a two-layer board.