16-bit resolution AD5545
14-bit resolution AD5555
±1 LSB DNL monotonic
±2 LSB INL AD5545
2 mA full-scale current ±20%, with V
= 10 V
REF
0.5 µs settling time
2Q multiplying reference-input 4 MHz BW
Zero or midscale power-up preset
Zero or midscale dynamic reset
3-wire interface
Compact TSSOP-16 package
APPLICATIONS
V
DD
SDI
CS
CL
16 OR 14
D0..DX
EN
DAC A
B
ADDR
DECODE
DGNDMSB
INPUT
REGISTER
INPUT
REGISTER
POWER-
ON
RESET
RSLDAC
R
R
Figure 1.
Automatic test equipment
Instrumentation
Digitally controlled calibration
Industrial control PLCs
Programmable attentuator
PRODUCT OVERVIEW
DAC A
REGISTER
DAC B
REGISTER
BV
A
V
REF
REF
RFBA
I
DAC A
R
DAC B
R
AD5545/
AD5555
02918-0-001
OUT
A
RFBB
I
OUT
A
A
A
GND
B
B
GND
The AD5545/AD5555 are 16-bit/14-bit, current-output, digitalto-analog converters designed to operate from a single 5 V
supply with bipolar output up to ±15 V capability.
An external reference is needed to establish the full-scale output-current. An internal feedback resistor (R
) enhances the
FB
resistance and temperature tracking when combined with an
external op amp to complete the I-to-V conversion.
A serial data interface offers high speed, 3-wire microcontroller
compatible inputs using serial data in (SDI), clock (CLK), and
chip select (
). Additional
CS
function allows simultane-
LDAC
ous update operation. The internal reset logic allows power-on
preset and dynamic reset at either zero or midscale, depending
on the state of the MSB pin.
The AD5545/AD5555 are packaged in the compact TSSOP-16
package and can be operated from –40°C to +85°C.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective companies.
Table 1. VDD = 5 V ± 10%, I
unless otherwise noted.
Parameter Symbol Conditions 5 V ± 10% Units
STATIC PERFORMANCE1
Resolution N AD5545, 1 LSB = V
Resolution N AD5555, 1 LSB = V
Relative Accuracy INL AD5545 ±2 LSB max
Relative Accuracy INL AD5555 ±1 LSB max
Differential Nonlinearity DNL Monotonic ±1 LSB max
Output Leakage Current I
Output Leakage Current I
Full-Scale Gain Error G
Full-Scale Temperature Coefficient2 TCVFS 1 ppm/°C typ
REFERENCE INPUT
V
Range V
REF
Input Resistance R
Input Capacitance2 C
ANALOG OUTPUT
Output Current I
Output Capacitance2 C
LOGIC INPUTS AND OUTPUT
Logic Input Low Voltage VIL 0.8 V max
Logic Input High Voltage VIH 2.4 V min
Input Leakage Current IIL 10 µA max
Input Capacitance2 C
INTERFACE TIMING
2, 4
Clock Input Frequency f
Clock Width High tCH 10 ns min
Clock Width Low tCL 10 ns min
CS to Clock Setup
Clock to CS Hold
Data Setup tDS 5 ns min
Data Hold tDH 10 ns min
LDAC Setup
Hold
LDAC Width
SUPPLY CHARACTERISTICS
Power Supply Range V
Positive Supply Current IDD Logic Inputs = 0 V 10 µA max
Power Dissipation P
Power Supply Sensitivity PSS ∆VDD = ±5% 0.006 %/% max
= Virtual GND, GND = 0 V, V
OUT
Data = 0x0000, TA = 25°C 10 nA max
OUT
Data = 0x0000, TA = TA Max 20 nA max
OUT
Data = Full Scale ±1/±4 mV typ/max
FSE
–12/+12 V min/V max
REF
5 kΩ typ3
REF
5 pF typ
REF
Data = Full Scale 2 mA typ
OUT
Code Dependent 200 pF typ
OUT
10 pF max
IL
50 MHz
CLK
0 ns min
t
CSS
10 ns min
t
CSH
5 ns min
t
LDS
10 ns min
t
LDH
10 ns min
t
LDAC
Range 4.5/5.5 V min/V max
DD
Logic Inputs = 0 V 0.055 mW max
DISS
= 10 V, TA = Full Operating Tempearture Range,
REF
/216 = 153 µV when V
REF
/214 = 610 µV when V
REF
= 10 V 16 Bits
REF
= 10 V 14 Bits
REF
1
All static performance tests (except I
is tied to the amplifier output. Typical values represent average readings measured at 25°C.
2
These parameters are guaranteed by design and not subject to production testing.
3
All ac characteristic tests are performed in a closed-loop system using an O42 I-to-V converter amplifier.
4
All input control signals are specified with tR = tF = 2.5 ns (10% to 90% of 3 V) and timed from a voltage level of 1.5 V.
) are performed in a closed-loop system using an external precision OP1177 I-to-V converter amplifier. The AD5545 RFB terminal
OUT
Rev. 0 | Page 3 of 16
Page 4
AD5545/AD5555
Parameter Symbol Conditions 5 V ± 10% Units
AC CHARACTERISTICS
Output Voltage Setting Time
t
S
Reference Multiplying BW BW V
DAC Glitch Impulse
Feedthrough Error
Digital Feedthrough
Q
V
OUT/VREF
Q
Total Harmonic Distortion THD V
Analog Crosstalk
C
TA
Output Spot Noise Voltage eN f = 1 kHz, BW = 1 Hz 12 nV/√Hz
To ±0.1% Full Scale, Data = Zero Scale to
Full Scale to Zero Scale
= 5 V p-p, Data = Full Scale 4 MHz typ
REF
= 0 V, Data = Zero Scale to Midscale to Zero
V
REF
Scale
Data = Zero Scale, V
f = 1 kHz, Same Channel
CS
= Logic High and f
= 5 V p-p, Data = Full Scale, f = 1 kHz to 10 kHz –85 dB typ
REF
V
= 0 V, Measure V
REFB
= 100 mV rms,
REF
= 1 MHz
CLK
with V
OUTB
Wave, Data = Full Scale, f = 1 kHz to 10 kHz
= 5 V p-p Sine
REFA
0.5 µs typ
7 nV-s typ
–65 dB
7 nV-s typ
–95 dB typ
Rev. 0 | Page 4 of 16
Page 5
AD5545/AD5555
ABSOLUTE MAXIMUM RATINGS
Table 2. AD5545/AD5555 Absolute Maximum Ratings
Parameter Rating
VDD to GND –0.3 V, +8 V
V
to GND –18 V, +18 V
REF
Logic Inputs to GND –0.3 V, +8 V
V(I
) to GND –0.3 V, VDD + 0.3 V
OUT
Input Current to Any Pin except Supplies ±50 mA
Package Power Dissipation
Thermal Resistance θJA
16-Lead TSSOP 150°C/W
Maximum Junction Temperature (TJ max) 150°C
Operating Temperature Range –40°C to +85°C
Storage Temperature Range –65°C to +150°C
Lead Temperature
RU-16 (Vapor Phase, 60 sec) 215°C
RU-16 (Infrared, 15 sec) 220°C
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is
not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
max – TA)/ θJA
(T
J
Rev. 0 | Page 5 of 16
Page 6
AD5545/AD5555
A
A
PIN CONFIGURATION AND FUNCTIONAL DESCRIPTIONS
CLK
16
LDAC
15
MSB
14
V
13
DD
DGND
12
CS
11
RS
10
SDI
9
V
V
R
I
OUT
GND
GND
I
OUT
R
REF
REF
A
1
FB
A
2
A
3
4
5
6
7
8
AD5545/
AD5555
TOP VIEW
(Not to Scale)
02918-0-002
A
B
B
B
B
FB
Figure 2. 16-Lead TSSOP
Table 3. Pin Function Descriptions—16-Lead TSSOP
Pin No. Mnemonic Function
1 RFBA Establish voltage output for DAC A by connecting to external amplifier output.
2 V
3 I
4 A
5 A
6 I
7 V
REF
A
DAC A Reference Voltage Input Terminal. Establishes DAC A full-scale output voltage.
Pin can be tied to V
A DAC A Current Output.
OUT
A DAC A Analog Ground.
GND
B DAC B Analog Ground.
GND
B DAC B Current Output.
OUT
REF
B
DAC B Reference Voltage Input Terminal. Establishes DAC B full-scale output voltage.
DD
pin.
Pin can be tied to VDD pin.
8 RFBB Establish voltage output for DAC B by connecting to external amplifier output.
9 SDI Serial Data Input. Input data loads directly into the shift register.
10
RESET Pin, Active Low Input. Input registers and DAC registers are set to all 0s or
RS
midscale. Register Data = 0x0000 when MSB = 0. Register Data = 0x8000 for AD5545 and
0x2000 for AD5555 when MSB = 1.
11
Chip Select, Active Low Input. Disables shift register loading when high. Transfers serial
CS
register data to the input register when CS/LDAC returns high. This does not affect
operation.
12 DGND Digital Ground Pin.
13 VDD Positive Power Supply Input. Specified range of operation 5 V ± 10% or 3 V ± 10%.
14 MSB
MSB bit sets output to either 0 or midscale during a RESET pulse (RS
) or at system power-
on. Output equals zero scale when MSB = 0 and midscale when MSB = 1. MSB pin can
.
DD
15
LDAC
also be tied permanently to ground or V
Load DAC Register Strobe, Level Sensitive Active Low. Transfers all input register data to
DAC registers. Asynchronous active low input. See Table 4 and Table 5 for operation.
16 CLK Clock Input. Positive edge clocks data into shift register.
LDAC
Rev. 0 | Page 6 of 16
Page 7
AD5545/AD5555
A1SDI
A0
D1D0D15D14D13D12D11D10
CLK
CS
LDAC
CLK
CS
INPUT REG LD
t
DS
t
CSS
t
DH
t
CH
t
CL
t
CSH
t
02918-0-003
LDH
t
LDS
t
LDAC
Figure 3. AD5545 18-Bit Data Word Timing Diagram
A1SDI
A0
t
DS
t
CSS
t
DH
t
CH
t
CL
D1D0D13D12D11D10D09D08
INPUT REG LD
t
CSH
LDAC
t
LDS
t
LDAC
02918-0-004
t
LDH
Figure 4. AD5555 16-Bit Data Word Timing Diagram
Table 4. AD5545 Control Logic Truth Table
CLK
CS
LDAC
MSB Serial Shift Register Function Input Register Function DAC Register
RS
H X H H X No Effect Latched Latched
L L H H X No Effect Latched Latched
L
↑+
H H X
Shift Register Data
Latched Latched
Advanced One Bit
L H H H X No Effect Latched Latched
L H H X No Effect
↑+
Selected DAC Updated
Latched
with Current SR Current
H X L H X No Effect Latched Transparent
H X H H X No Effect Latched Latched
H X
↑+
H X No Effect Latched Latched
H X H L 0 No Effect Latched Data = 0x0000 Latched Data = 0x0000
H X H L H No Effect Latched Data = 0x8000 Latched Data = 0x8000
NOTES
1. SR = Shift Register, ↑+ = Positive Logic Transition, and X = Don’t Care.
2. At power-on, both the input register and the DAC register are loaded with all 0s.
Rev. 0 | Page 7 of 16
Page 8
AD5545/AD5555
Table 5. AD5555 Control Logic Truth Table
CLK
CS
H X H H X No Effect Latched Latched
L L H H X No Effect Latched Latched
L
↑+
L H H H X No Effect Latched Latched
L H H X No Effect
↑+
H X L H X No Effect Latched Transparent
H X H H X No Effect Latched Latched
H X
H X H L 0 No Effect Latched Data = 0x0000 Latched Data = 0x0000
H X H L H No Effect Latched Data = 0x2000 Latched Data = 0x2000
LDAC
H H X
↑+
NOTES
1. SR = Shift Register, ↑+ = Positive Logic Transition, and X = Don’t Care.
2. At power-on, both the input register and the DAC register are loaded with all 0s.
Table 6. AD5545 Serial Input Register Data Format, Data Is Loaded in the MSB-First Format
Bit Position B17 B16 B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
Data Word A1 A0 D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
MSB
Note that only the last 18 bits of data clocked into the serial register (Address + Data) are inspected when the CS line’s positive edge
returns to logic high. At this point, an internally generated load strobe transfers the serial register data contents (Bits D15–D0) to the
decoded DAC input register address determined by Bits A1 and A0. Any extra bits clocked into the AD5545 shift register are ignored; only
the last 18 bits clocked in are used. If double-buffered data is not needed, the
MSB Serial Shift Register Function Input Register Function DAC Register
RS
Shift Register Data
Advanced One Bit
H X No Effect Latched Latched
Latched Latched
Selected DAC Updated
with Current SR Current
LDAC
pin can be tied logic low to disable the DAC registers.
Latched
LSB
Table 7. AD5555 Serial Input Register Data Format, Data Is Loaded in the MSB-First Format
Bit Position B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
Data Word A1 A0 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
MSB
LSB
Note that only the last 16 bits of data clocked into the serial register (Address + Data) are inspected when the CS line’s positive edge
returns to logic high. At this point, an internally generated load strobe transfers the serial register data contents (Bits D13–D0) to the
decoded DAC input register address determined by Bits A1 and A0. Any extra bits clocked into the AD5555 shift register are ignored; only
the last 16 bits clocked in are used. If double-buffered data is not needed, the
LDAC
pin can be tied logic low to disable the DAC registers.
Table 8. Address Decode
A1 A0 DAC Decoded
0 0 None
0 1 DAC A
1 0 DAC B
1 1 DAC A and DAC B
Rev. 0 | Page 8 of 16
Page 9
AD5545/AD5555
TYPICAL PERFORMANCE CHARACTERISTICS
1.0
0.8
0.6
0.4
0.2
0
INL (LSB)
–0.2
–0.4
–0.6
–0.8
–1.0
08192 16384 24576 32768 40960 49152 57344 65536
CODE (Decimal)
Figure 5. AD5545 Integral Nonlinearity Error
02918-0-009
1.0
0.8
0.6
0.4
0.2
0
DNL (LSB)
–0.2
–0.4
–0.6
–0.8
–1.0
00248 4096 6144 8192 10240 12288 14336 16384
CODE (Decimal)
Figure 8. AD5555 Differential Nonlinearity Error
02918-0-012
1.0
0.8
0.6
0.4
0.2
0
DNL (LSB)
–0.2
–0.4
–0.6
–0.8
–1.0
08192 16384 24576 32768 40960 49152 57344 65536
CODE (Decimal)
Figure 6. AD5545 Differential Nonlinearity Error
1.0
0.8
0.6
0.4
0.2
0
INL (LSB)
–0.2
–0.4
–0.6
–0.8
–1.0
02048 4096 6144 8192 10240 12288 14336 16384
CODE (Decimal)
Figure 7. AD5555 Integral Nonlinearity Error
02918-0-010
02918-0-011
1.5
1.0
0.5
–0.5
LINEARITY ERROR (LSB)
–1.0
–1.5
(LSB)
DD
SUPPLY CURRENT I
=2.5V
V
REF
TA=25°C
INL
0
24
SUPPLY VOLTAGE VDD (V)
Figure 9. Linearity Errors vs. V
5
VDD=5V
=25°C
T
A
4
3
2
1
0
00.5 1.0 1.5 2.03.0 3.52.54.0 4.5 5.0
LOGIC INPUT VOLTAGE VIH (V)
DNL
GE
68
02918-0-013
DD
02918-0-014
10
Figure 10. Supply Current vs. Logic Input Voltage
Rev. 0 | Page 9 of 16
Page 10
AD5545/AD5555
3.0
2.5
2.0
1.5
1.0
SUPPLY CURRENT (mA)
0.5
0
10k100k1M10M100M
CLOCK FREQUENCY (Hz)
0x5555
0x8000
0xFFFF
0x0000
02918-0-015
Figure 11. Supply Current vs. Clock Frequency
90
80
70
60
50
40
PSSR (-dB)
30
20
10
0
101001k10k100k1M
FREQUENCY (Hz)
VDD= 5 V ± 10%
V
=10V
REF
Figure 12. Power Supply Rejection Ration vs. Frequency
02918-0-016
CS
V
OUT
02918-0-018
00.51.01.52.0 2.5 3.0 3.54.0 4.5 5.0
Figure 14. Settling Time
VDD=5V
=10V
V
REF
CODES 0x8000 ↔ 0x7FFF
TIME (µs)
02918-0-019
CS (5V/DIV)
(50mV/DI V)
V
OUT
Figure 15. Midscale Transition and Digital Feedthrough
The AD5545/AD5555 contain a 16-/14-bit, current-output,
digital-to-analog converter, a serial-input register, and a DAC
register. Both parts require a minimum of a 3-wire serial data
interface with additional
LDAC
for dual channel simultaneous
update.
D/A CONVERTER SECTION
The DAC architecture uses a current-steering R-2R ladder
design. Figure 16 shows the typical equivalent DAC. The DAC
contains a matching feedback resistor for use with an external
I-to-V converter amplifier. The R
output of the external amplifier. The I
to the inverting input of the external amplifier. These DACs are
designed to operate with both negative or positive reference
voltages. The V
power pin is used only by the logic to drive
DD
the DAC switches ON and OFF. Note that a matching switch is
used in series with the internal 5 kΩ feedback resistor. If users
attempt to measure the R
value, power must be applied to VDD
FB
to achieve continuity. The V
(D) loaded into the corresponding DAC register, according to
Equation 1 and Equation 2, determine the DAC output voltage.
OUT
OUT
REF
384,16/–DVV
×= (2)
REF
536,65/–DVV
×=(1)
Note that the output full-scale polarity is the opposite of the
V
polarity for dc reference voltages.
REF
V
REF
DIGITAL INTERFACE CONNECTIONS OMITTED FOR CLARITY:
SWITCHES S1 AND S2 ARE CLOSED, V
R
2R2R2RR5kΩ
Figure 16. Equivalent R-2R DAC Circuit
These DACs are also designed to accommodate ac reference
input signals. The AD5545/AD5555 will accommodate input
reference voltages in the range of –12 V to +12 V. The reference
voltage inputs exhibit a constant nominal input-resistance value
of 5 kΩ, ±30%. The DAC output (I
producing various output resistances and capacitances. When
choosing an external amplifier, the user should take into
account the variation in impedance generated by the
AD5545/AD5555 on the amplifiers inverting input node. The
feedback resistance in parallel with the DAC ladder resistance
dominates output voltage noise.
pin is connected to the
FB
terminal is connected
OUT
input voltage and the digital data
REF
V
RR
MUST BE POWERED
DD
) is code dependent,
OUT
S2S1
02918-0-005
R
I
GND
DD
FB
OUT
V
IN
2.500V
V
A
REF
R
2R2R2RR5kΩ
AD5545/AD5555
DIGITAL INTERFACE CONNECTIONS OMITTED FOR CLARITY:
SWITCHES S1 AND S2 ARE CLOSED, V
V
OUT
ADR03
GND
RR
MUST BE POWERED
DD
S2S1
Figure 17. Recommended System Connections
SERIAL DATA INTERFACE
The AD5545/AD5555 use a minimum 3-wire (CS, SDI, CLK)
serial data interface for single channel update operation. With
Table 4 as an example (AD5545), users can tie
high, then pull CS low for an 18-bit duration. New serial data
RS
is then clocked into the serial-input register in an 18-bit data-
word format with the MSB bit loaded first. Table 5 defines the
truth table for the AD5555. Data is placed on the SDI pin and
clocked into the register on the positive clock edge of CLK. For
the AD5545, only the last 18-bits clocked into the serial register
will be interrogated when the
ring the serial register data to the DAC register and updating
the output. If the applied microcontroller outputs serial data in
different lengths than the AD5545, such as 8-bit bytes, three
right justified data bytes can be written to the AD5545. The
AD5545 will ignore the six MSB and recognize the 18 LSB as
valid data. After loading the serial register, the rising edge of
transfers the serial register data to the DAC register and
CS
updates the output; during the
be toggled.
If users want to program each channel separately but update
them simultaneously, they need to program
initially, then pull
low for an 18-bit duration and program
CS
DAC A with the proper address and data bits.
high to latch data to the DAC A register. At this time, the output is
not updated. To load DAC B data, pull
tion and program DAC B with the proper address and data, then
high to latch data to the DAC B register. Finally, pull
pull
CS
LDAC
low and then high to update both the DAC A and DAC B
outputs simultaneously.
pin is strobed high, transfer-
CS
strobe, the CLK should not
CS
5V
V
DD
R
A
FB
I
A
OUT
AD8628
A
A
GND
LDAC
low and
LDAC
and RS high
is then pulled
CS
low for an 18-bit dura-
CS
+3V
V
CC
V
EE
–3V
02918-0-006
V
LOAD
OUT
Rev. 0 | Page 11 of 16
Page 12
AD5545/AD5555
Table 8 shows that each DAC A and DAC B can be individually
loaded with a new data value. In addition, a common new data
value can be loaded into both DACs simultaneously by setting Bit
A1 = A0 = high. This command enables the parallel combination
of both DACs, with I
OUT
A and I
DAC with significant improved noise performance.
ESD Protection Circuits
All logic input pins contain back-biased ESD protection Zeners
connected to digital ground (DGND) and VDD as shown in
Figure 18.
V
DD
DIGITAL
INPUTS
Figure 18. Equivalent ESD Protection Circuits
POWER-UP SEQUENCE
It is recommended to power-up VDD and ground prior to any
reference voltages. The ideal power-up sequence is A
, V
DGND, V
up sequence can elevate reference current, but the device will
resume normal operation once V
X, and digital inputs. A noncompliance power-
DD
REF
B tied together, to act as one
OUT
5kΩ
DGND
02918-0-007
is powered.
DD
GND
X,
LAYOUT AND POWER SUPPLY BYPASSING
It is a good practice to employ compact, minimum lead length
layout design. The input leads should be as direct as possible
with a minimum conductor length. Ground paths should have
low resistance and low inductance.
Similarly, it is also good practice to bypass the power supplies
with quality capacitors for optimum stability. Supply leads to the
device should be bypassed with 0.01 µF to 0.1 µF disc or chip
ceramic capacitors. Low ESR 1 µF to 10 µF tantalum or electrolytic capacitors should also be applied at V
transient disturbance and to filter any low frequency ripple
(see Figure 19). Users should not apply switching regulators for
due to the power supply rejection ratio degradation over
V
DD
frequency.
V
DD
+
C1
C2
10µF 0.1µF
Figure 19. Power Supply Bypassing and Grounding Connection
to minimize any
DD
AD5545/
AD5555
V
DD
A
X
GND
DGND
02918-0-008
GROUNDING
The DGND and A
digital and analog ground references. To minimize the digital
ground bounce, the DGND terminal should be joined remotely
X pins of the AD5545/AD5555 refer to the
GND
at a single point to the analog ground plane (see Figure 19).
Rev. 0 | Page 12 of 16
Page 13
AD5545/AD5555
V
(
=
(
=
(
+
(
′
APPLICATIONS
STABILITY
V
DD
U1
VDDR
FB
REF
V
REF
GND
AD5545/AD5555
Figure 20. Operational Compensation Capacitor for Gain Peaking Prevention
In the I-to-V configuration, the I
ing node of the op amp must be connected as close as possible,
and proper PCB layout techniques must be employed. Since
every code change corresponds to a step function, gain peaking
may occur if the op amp has limited GBP, and if there is excessive parasitic capacitance at the inverting node.
An optional compensation capacitor, C1, can be added for stability as shown in Figure 20. C1 should be found empirically, but
20 pF is generally more than adequate for the compensation.
POSITIVE VOLTAGE OUTPUT
To achieve the positive voltage output, an applied negative
reference to the input of the DAC is preferred over the output
inversion through an inverting amplifier because of the resistors’ tolerance errors. To generate a negative reference, the
reference can be level shifted by an op amp such that the V
and GND pins of the reference become the virtual ground and
–2.5 V, respectively (see Figure 21).
ADR03
V
V
OUT
U4
+5V
V+
1/2
AD8620
V–
–5V
Figure 21. Positive Voltage Output Configuration
IN
GND
U3
–2.5V
AD5545/AD5555
BIPOLAR OUTPUT
The AD5545/AD5555 is inherently a 2-quadrant multiplying
D/A converter. It can easily set up for unipolar output operation. The full-scale output polarity is the inverse of the reference
input voltage.
C1
I
OUT
AD8628
U2
of the DAC and the invert-
OUT
+5V
U1
V
DD
V
REF
GND
C1
R
FB
I
OUT
AD8628
U2
02918-0-020
1/2
0 < VO < +2.5
02918-0-021
V
O
OUT
V
O
circuit, the second amplifier, U4, provides a gain of +2, which
increases the output span magnitude to 5 V. Biasing the external
amplifier with a 2.5 V offset from the reference voltage results in a
full 4-quadrant multiplying circuit. The transfer equation of this
circuit shows that both negative and positive output voltages are
created because the input data (D) is incremented from code zero
= –2.5 V) to midscale (V
(V
OUT
= 0 V) to full scale (V
OUT
OUT
=
+2.5 V).
OUT
OUT
)(
×
REF
)(
×
REF
)
55451–768,32/ADVDV
(3)
)
55551–384,16/ADVDV
(4)
For the AD5545, the external resistance tolerance becomes the
dominant error that users should be aware of.
Figure 23 shows a versatile V-to-I conversion circuit using
improved Howland Current Pump. In addition to the precision
current conversion it provides, this circuit enables a bidirectional current flow and high voltage compliance. This circuit
can be used in a 4 mA to 20 mA current transmitter with up to
a 500 Ω of load. In Figure 23, it shows that if the resistor network is matched, the load current is
32
RR
)
1
R
=
I
L
3
R
R3, in theory, can be made small to achieve the current needed
within the U3 output current driving capability. This circuit is
versatile such that the AD8510 can deliver ±20 mA in both
directions, and the voltage compliance approaches 15 V, which
is mainly limited by the supply voltages of U3. However, users
must pay attention to the compensation. Without C1, it can be
shown that the output impedance becomes
DV
××
(5)
REF
+
2131
RRRR
In some applications, it may be necessary to generate the full
4-quadrant multiplying capability or a bipolar output swing. This
Z
= (6)
O
′
()
+
)
′′
()
321–321
RRRRRR
+
is easily accomplished by using an additional external amplifier,
U4, configured as a summing amplifier (see Figure 22). In this
Rev. 0 | Page 13 of 16
Page 14
AD5545/AD5555
−
C
V
If the resistors are perfectly matched, ZO is infinite, which is
desirable, and the resistors behave as an ideal current source.
R1'
150kΩ
R1
REF
can be either
O
R2'
15kΩ
C1
10pF
V
DD
U3
V+
AD8510
V–
V
SS
R2
15kΩ
LOAD
02918-0-023
R
D
WB
A
××
N
R
2
WA
B
R3'
50Ω
R3
50Ω
V
L
(7)
I
L
On the other hand, if they are not matched, Z
positive or negative. The latter can cause oscillation. As a result,
C1 is needed to prevent the oscillation. For critical applications,
C1 could be found empirically but typically falls in the range of
a few pF.
V
DD
U1
V
R
DD
FB
V
REF
REF
GND
AD5545/AD5555
Figure 23. Programmable Current Source with Bidirectional
Current Control and High Voltage Compliance Capabilities
I
OUT
AD8628
U2
150kΩ
DAC WITH PROGRAMMABLE INPUT
REFERENCE RANGE
Since high voltage references can be costly, users may consider
using one of the DACs, a digital potentiometer, and a low
voltage reference to form a single-channel DAC with a
programmable input reference range. This approach optimizes
the programmable range as well as facilitates future system
upgrades with just software changes. Figure 24 shows this
implementation. V
VABV––1
REFREF
where:
AB = Reference Voltage of V
V
REF
is in the feedback network, therefore,
REFAB
R
WB
V
A and V
REF
REF_AB
+×=
R
WA
and RWA are digital potentiometer 128-step programmable
R
WB
resistances and are given by
D
C
R
WB
R
WA
R
WB
R
WA
where D
(0 ≤ D
C
R
≈ (8)
AB
128
D
128
C
≈ (9)
≈
128
= Digital Potentiometer Digital Code in Decimal
C
R
AB
128
D
C
(10)
D
−
≤ 127).
By putting Equations 7 through 10 together, the following
results:
1
+
128
×=
VABV
REFREF
D
A
1
×−
N
2
Table 9 shows a few examples of V
Table 9. V
DC D
vs. DB and DC of the AD5555
REFAB
V
A
0 X V
32 0 1.33 V
32 8192 1.6 V
64 0 2 V
64 8192 4 V
96 0 4 V
96 8192 –8 V
D
C
−
D
C
(11)
D
C
128
D
−
C
AB of the 14-bit AD5555.
REF
AB
REF
REF
REF
REF
REF
REF
REF
REF
The output of DAC B is, therefore,
D
B
ABVV2−=
REF
OB
where D
is the DAC B digital code in decimal.
B
The accuracy of V
(12)
N
AB will be affected by the matching of the
REF
input and feedback resistors and, therefore, a digital potentiometer is used for U4 because of its inherent resistance
matching. The AD7376 is a 30 V or ±15 V, 128-step digital
potentiometer. If 15 V or ±7.5 V is adequate for the application,
a 256-step AD5260 digital potentiometer can be used instead.
= External Reference Voltage
V
REF
= DAC A Digital Code in Decimal
D
A
N = Number of Bits of DAC
Rev. 0 | Page 14 of 16
Page 15
AD5545/AD5555
+5V
C1
OP4177
U2A
C3
OP4177
U2B
+15V
V+
V–
+15V
–15V
2
U3
V
IN
TRIMTEMP
V
GND
4
POT
U4
AB
AD7376
OUT
W
C2
2.2p
53
6
OP4177
V
REF
U2C
ADR03
VOB
02918-0-024
V
REF_AB
RFBA
V
DD
I
A
REF
OUT
A
U1A
A
A
GND
V
AD5555
B
R
FB
I
B
REF
OUT
B
U1B
B
A
GND
V
Figure 24. DAC with Programmable Input Reference Range
Rev. 0 | Page 15 of 16
Page 16
AD5545/AD5555
OUTLINE DIMENSIONS
5.10
5.00
4.90
0.15
0.05
4.50
4.40
4.30
PIN 1
16
0.65
BSC
COPLANARITY
COMPLIANT TO JEDEC STANDARDS MO-153AB
0.10
0.30
0.19
9
81
1.20
MAX
6.40
BSC
SEATING
PLANE
0.20
0.09
0.75
8°
0°
0.60
0.45
Figure 25. 16-Lead Thin Shrink Small Outline Package [TSSOP] (RU-16)—Dimensions shown in millimeters
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
ORDERING GUIDE
AD5545/AD5555 Products
AD5545BRU* ±2 ±1 16 –40°C to +85°C TSSOP-16 RU–16 96
AD5545BRU–REEL7 ±2 ±1 16 –40°C to +85°C TSSOP-16 RU–16 1000
AD5555CRU ±1 ±1 14 –40°C to +85°C TSSOP-16 RU–16 96
AD5555CRU–REEL7 ±1 ±1 14 –40°C to +85°C TSSOP-16 RU–16 1000
*The AD5545/AD5555 contain 3131 transistors. The die size measures 71 mil. × 96 mil., 6816 sq. mil.