Datasheet AD5325, AD5315, AD5305 Datasheet (Analog Devices)

Page 1
2.5 V to 5.5 V, 500 ␮A, 2-Wire Interface
a
Quad Voltage Output, 8-/10-/12-Bit DACs
FEATURES AD5305
Four Buffered 8-Bit DACs in 10-Lead microSOIC
AD5315
Four Buffered 10-Bit DACs in 10-Lead microSOIC
AD5325
Four Buffered 12-Bit DACs in 10-Lead microSOIC Low Power Operation: 500 A @ 3 V, 600 A @ 5 V 2-Wire (I
2C®
-Compatible) Serial Interface
2.5 V to 5.5 V Power Supply Guaranteed Monotonic By Design Over All Codes Power-Down to 80 nA @ 3 V, 200 nA @ 5 V Double-Buffered Input Logic Output Range: 0–V
REF
Power-On-Reset to Zero Volts Simultaneous Update of Outputs (LDAC Function) Software Clear Facility Data Readback Facility On-Chip Rail-to-Rail Output Buffer Amplifiers
Temperature Range –40
C to +105ⴗC
APPLICATIONS Portable Battery-Powered Instruments Digital Gain and Offset Adjustment Programmable Voltage and Current Sources Programmable Attenuators Industrial Process Control
AD5305/AD5315/AD5325*
GENERAL DESCRIPTION
The AD5305/AD5315/AD5325 are quad 8-, 10- and 12-bit buffered voltage output DACs in a 10-lead microSOIC package that operate from a single 2.5 V to 5.5 V supply consuming 500 µA at 3 V. Their on-chip output amplifiers allow rail-to-rail output swing with a slew rate of 0.7 V/µs. A 2-wire serial inter­face is used which operates at clock rates up to 400 kHz. This interface is SMBus-compatible at V can be placed on the same bus.
The references for the four DACs are derived from one reference pin. The outputs of all DACs may be updated simultaneously using the software LDAC function. The parts incorporate a power-on-reset circuit that ensures that the DAC outputs power up to zero volts and remain there until a valid write takes place to the device. There is also a software clear function which resets all input and DAC registers to 0 V. The parts contain a power­down feature that reduces the current consumption of the devices to 200 nA @ 5 V (80 nA @ 3 V).
The low power consumption of these parts in normal operation makes them ideally suited to portable battery-operated equip­ment. The power consumption is 3 mW at 5 V, 1.5 mW at 3 V, reducing to 1 µW in power-down mode.
FUNCTIONAL BLOCK DIAGRAM
V
DD
REF IN
< 3.6 V. Multiple devices
DD
LDAC
INPUT
REGISTER
SCL
SDA
A0
*Protected by U.S. Patent No. 5,969,657; other patents pending. I2C is a registered trademark of Philips Corporation.
INTERFACE
LOGIC
POWER-ON
RESET
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
REV. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
AD5305/AD5315/AD5325
GND
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2000
STRING
DAC A
STRING
DAC B
STRING
DAC C
STRING
DAC D
BUFFER
POWER-DOWN
LOGIC
A
V
OUT
BBUFFER
V
OUT
V
CBUFFER
OUT
V
DBUFFER
OUT
Page 2
AD5305/AD5315/AD5325–SPECIFICATIONS
GND; CL = 200 pF to GND; All specifications T
Parameter
1
DC PERFORMANCE
3, 4
B Version Min Typ Max Unit Conditions/Comments
MIN
to T
unless otherwise noted.)
MAX
2
(VDD = 2.5 V to 5.5 V; V
= 2 V; RL = 2 k to
REF
AD5305
Resolution 8 Bits Relative Accuracy ± 0.15 ± 1 LSB Differential Nonlinearity ± 0.02 ± 0.25 LSB Guaranteed Monotonic by Design Over All Codes
AD5315
Resolution 10 Bits Relative Accuracy ± 0.5 ± 4 LSB Differential Nonlinearity ± 0.05 ± 0.5 LSB Guaranteed Monotonic by Design Over All Codes
AD5325
Resolution 12 Bits Relative Accuracy ± 2 ± 16 LSB
Differential Nonlinearity ± 0.2 ± 1 LSB Guaranteed Monotonic by Design Over All Codes Offset Error ± 0.4 ± 3 % of FSR Gain Error ± 0.15 ± 1 % of FSR Lower Deadband 20 60 mV Lower Deadband Exists Only If Offset Error Is Negative Offset Error Drift Gain Error Drift Power Supply Rejection Ratio DC Crosstalk
DAC REFERENCE INPUTS
V
Input Range 0.25 V
REF
V
Input Impedance 37 45 k Normal Operation
REF
5
5
5
5
5
–12 ppm of FSR/°C –5 ppm of FSR/°C –60 dB ∆VDD = ±10% 200 µVR
DD
V
= 2 k to GND or V
L
DD
>10 M Power-Down Mode
Reference Feedthrough –90 dB Frequency = 10 kHz
OUTPUT CHARACTERISTICS
Minimum Output Voltage Maximum Output Voltage
5
6
6
0.001 V This is a measure of the minimum and maximum drive
VDD – 0.001 V capability of the output amplifier. DC Output Impedance 0.5 Short Circuit Current 25 mA VDD = 5 V
16 mA VDD = 3 V Power-Up Time 2.5 µs Coming Out of Power-Down Mode. VDD = 5 V
5 µs Coming Out of Power-Down Mode. VDD = 3 V
LOGIC INPUTS (A0)
5
Input Current ± 1 µA VIL, Input Low Voltage 0.8 V VDD = 5 V ± 10%
0.6 V VDD = 3 V ± 10%
0.5 V VDD = 2.5 V
VIH, Input High Voltage 2.4 V VDD = 5 V ± 10%
2.1 V VDD = 3 V ± 10%
2.0 V VDD = 2.5 V
Pin Capacitance 3 pF
LOGIC INPUTS (SCL, SDA)
VIH, Input High Voltage 0.7 V VIL, Input Low Voltage –0.3 0.3 V
5
DD
VDD+ 0.3 V SMBus-Compatible at VDD < 3.6 V
V SMBus-Compatible at VDD < 3.6 V
DD
IIN, Input Leakage Current ± 1 µA V
, Input Hysteresis 0.05 V
HYST
DD
V CIN, Input Capacitance 8 pF Glitch Rejection 50 ns Input filtering suppresses noise spikes of less than 50 ns.
LOGIC OUTPUT (SDA)
VOL, Output Low Voltage 0.4 V I
5
= 3 mA
0.6 V I
SINK
SINK
= 6 mA Three-State Leakage Current ± 1 µA Three-State Output Capacitance 8 pF
POWER REQUIREMENTS
V
DD
IDD (Normal Mode)
7
2.5 5.5 V VIH = VDD and VIL = GND
VDD = 4.5 V to 5.5 V 600 900 µA VDD = 2.5 V to 3.6 V 500 700 µA
IDD (Power-Down Mode) VIH = VDD and VIL = GND,
VDD = 4.5 V to 5.5 V 0.2 1 µAI VDD = 2.5 V to 3.6 V 0.08 1 µAI
= 4 µA (Max) During “0” Readback on SDA
DD
= 1.5 µA (Max) During “0” Readback on SDA
DD
–2–
REV. B
Page 3
AD5305/AD5315/AD5325
NOTES
1
See Terminology.
2
Temperature range: B Version: –40°C to +105°C; typical at 25°C.
3
DC specifications tested with the outputs unloaded.
4
Linearity is tested using a reduced code range: AD5305 (Code 8 to 248); AD5315 (Code 28 to 995); AD5325 (Code 115 to 3981).
5
Guaranteed by design and characterization, not production tested.
6
For the amplifier output to reach its minimum voltage, Offset Error must be negative; to reach its maximum voltage, V
7
IDD specification is valid for all DAC codes. Interface inactive. All DACs active and excluding load currents.
Specifications subject to change without notice.
= VDD and “Offset plus Gain” Error must be positive.
REF
(VDD = 2.5 V to 5.5 V; RL = 2 k to GND; CL = 200 pF to GND; all specifications T
AC CHARACTERISTICS
Parameter
Output Voltage Settling Time V
2
1
otherwise noted.)
B Version Min Typ Max Unit Conditions/Comments
3
= VDD = 5 V
REF
AD5305 6 8 µs 1/4 Scale to 3/4 Scale AD5315 7 9 µs 1/4 Scale to 3/4 Scale AD5325 8 10 µs 1/4 Scale to 3/4 Scale
Change Change Change
to T
MIN
(40 Hex to C0 Hex) (100 Hex to 300 Hex)
(400 Hex to C00 Hex) Slew Rate 0.7 V/µs Major-Code Transition Glitch Energy 12 nV-s 1 LSB Change Around Major Carry Digital Feedthrough 1 nV-s Digital Crosstalk 1 nV-s DAC-to-DAC Crosstalk 3 nV-s Multiplying Bandwidth 200 kHz V Total Harmonic Distortion –70 dB V
NOTES
1
Guaranteed by design and characterization, not production tested.
2
See Terminology.
3
Temperature range: B Version: –40°C to +105°C
Specifications subject to change without notice.
TIMING CHARACTERISTICS
Limit at T
MIN
, T
MAX
; typical at 25°C.
1, 2
(VDD = 2.5 V to 5.5 V. All specifications T
= 2 V ± 0.1 V p-p
REF
= 2.5 V ± 0.1 V p-p. Frequency = 10 kHz
REF
to T
MIN
unless otherwise noted)
MAX
Parameter (B Version) Unit Conditions/Comments
F
SCL
t
1
t
2
t
3
t
4
t
5
3
t
6
t
7
t
8
t
9
t
10
t
11
C
B
NOTES
1
See Figure 1.
2
Guaranteed by design and characterization, not production tested.
3
CB is the total capacitance of one bus line in pF. tR and tF measured between 0.3 VDD and 0.7 VDD.
Specifications subject to change without notice.
400 kHz max SCL Clock Frequency
2.5 µs min SCL Cycle Time
0.6 µs min t
1.3 µs min t
0.6 µs min t 100 ns min t
0.9 µs max t 0 µs min t
0.6 µs min t
0.6 µs min t
1.3 µs min t
, SCL High Time
HIGH
, SCL Low Time
LOW
, Start/Repeated Start Condition Hold Time
HD,STA
, Data Setup Time
SU,DAT
, Data Hold Time
HD,DAT
, Data Hold Time
HD,DAT
, Setup Time for Repeated Start
SU,STA
, Stop Condition Setup Time
SU,STO
, Bus Free Time Between a STOP and a START Condition
BUF
300 ns max tR, Rise Time of SCL and SDA when Receiving 0 ns min t
, Rise Time of SCL and SDA when Receiving (CMOS-Compatible)
R
250 ns max tF, Fall Time of SDA when Transmitting 0 ns min t 300 ns max t 20 + 0.1C
3
B
ns min tF, Fall Time of SCL and SDA when Transmitting
, Fall Time of SDA when Receiving (CMOS-Compatible)
F
, Fall Time of SCL and SDA when Receiving
F
400 pF max Capacitive Load for Each Bus Line
MAX
unless
REV. B
–3–
Page 4
AD5305/AD5315/AD5325
WARNING!
ESD SENSITIVE DEVICE
SDA
SCL
t
9
START
CONDITION
t
3
t
4
t
10
t
6
t
2
Figure 1. Two-Wire Serial Interface Timing Diagram
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise noted)
1, 2
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
SCL, SDA to GND . . . . . . . . . . . . . . . .–0.3 V to V
A0 to GND . . . . . . . . . . . . . . . . . . . . . .–0.3 V to V
Reference Input Voltage to GND . . . . –0.3 V to V
A–D to GND . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V
V
OUT
+ 0.3 V
DD
+ 0.3 V
DD
+ 0.3 V
DD
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . –40°C to +105°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature (T
max) . . . . . . . . . . . . . . . . . . . 150°C
J
t
11
t
5
t
7
REPEATED
START
CONDITION
t
4
t
1
t
8
STOP
CONDITION
microSOIC Package
Power Dissipation . . . . . . . . . . . . . . . . . . (T
max – TA)/θ
J
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 206°C/W
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 44°C/W
θ
JC
Reflow Soldering
Peak Temperature . . . . . . . . . . . . . . . . . . . . . . 220 +5/–0°C
Time at Peak Temperature . . . . . . . . . . . . 10 sec to 40 sec
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; and functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.
JA
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD5305/AD5315/AD5325 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
ORDERING GUIDE
Temperature Package Package Branding
Model Range Description Option Information
AD5305BRM –40°C to +105°C 10-Lead microSOIC RM-10 DEB AD5315BRM –40°C to +105°C 10-Lead microSOIC RM-10 DFB AD5325BRM –40°C to +105°C 10-Lead microSOIC RM-10 DGB
–4–
REV. B
Page 5
AD5305/AD5315/AD5325
PIN CONFIGURATION
V
1
DD
A
2
B
3
C
4
5
AD5305/ AD5315/ AD5325
TOP VIEW
(Not to Scale)
V
OUT
V
OUT
V
OUT
REFIN
PIN FUNCTION DESCRIPTIONS
Pin No. Mnemonic Function
1V
DD
Power Supply Input. These parts can be operated from 2.5 V to 5.5 V and the supply should be
decoupled to GND. 2V 3V 4V
A Buffered Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
B Buffered Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
C Buffered Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
OUT
5 REFIN Reference Input Pin for All Four DACs. It has an input range from 0.25 V to V 6V
D Buffered analog output voltage from DAC D. The output amplifier has rail-to-rail operation.
OUT
7 GND Ground Reference Point for All Circuitry on the Part. 8 SDA Serial Data Line. This is used in conjunction with the SCL line to clock data into or out of the 16-bit
input shift register. It is a bidirectional open-drain data line that should be pulled to the supply with
an external pull-up resistor. 9 SCL Serial Clock Line. This is used in conjunction with the SDA line to clock data into or out of the 16-bit
input shift register. Clock rates of up to 400 kbit/s can be accommodated in the 2-wire interface. 10 A0 Address Input. Sets the least significant bit of the 7-bit slave address.
A0
10
SCL
9
SDA
8
GND
7
6
V
D
OUT
.
DD
TERMINOLOGY RELATIVE ACCURACY
For the DAC, relative accuracy or integral nonlinearity (INL) is a measure of the maximum deviation, in LSBs, from a straight line passing through the endpoints of the DAC transfer function. Typical INL versus Code plots can be seen in Figures 4, 5, and 6.
DIFFERENTIAL NONLINEARITY
Differential Nonlinearity (DNL) is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB maximum ensures monotonicity. This DAC is guaranteed mono­tonic by design. Typical DNL versus Code plots can be seen in Figures 7, 8, and 9.
OFFSET ERROR
This is a measure of the offset error of the DAC and the output amplifier. It is expressed as a percentage of the full-scale range.
GAIN ERROR
This is a measure of the span error of the DAC. It is the devia­tion in slope of the actual DAC transfer characteristic from the ideal expressed as a percentage of the full-scale range.
OFFSET ERROR DRIFT
This is a measure of the change in offset error with changes in temperature. It is expressed in (ppm of full-scale range)/°C.
GAIN ERROR DRIFT
This is a measure of the change in gain error with changes in temperature. It is expressed in (ppm of full-scale range)/°C.
POWER-SUPPLY REJECTION RATIO (PSRR)
This indicates how the output of the DAC is affected by changes in the supply voltage. PSRR is the ratio of the change in V
to a change in VDD for full-scale output of the DAC. It is
OUT
measured in dBs. V
is held at 2 V and VDD is varied ± 10%.
REF
DC CROSSTALK
This is the dc change in the output level of one DAC at mid­scale in response to a full-scale code change (all 0s to all 1s and vice versa) and output change of another DAC. It is expressed in µV.
REFERENCE FEEDTHROUGH
This is the ratio of the amplitude of the signal at the DAC output to the reference input when the DAC output is not being updated. It is expressed in dBs.
REV. B
–5–
Page 6
AD5305/AD5315/AD5325
MAJOR-CODE TRANSITION GLITCH ENERGY
Major-code transition glitch energy is the energy of the impulse injected into the analog output when the code in the DAC register changes state. It is normally specified as the area of the glitch in nV-secs and is measured when the digital code is changed by 1 LSB at the major carry transition (011 . . . 11 to 100 . . . 00 or 100 . . . 00 to 011 . . . 11).
DIGITAL FEEDTHROUGH
Digital feedthrough is a measure of the impulse injected into the analog output of the DAC from the digital input pins of the device when the DAC output is not being updated. It is specified in nV-secs and is measured with a worst-case change on the digital input pins, e.g., from all 0s to all 1s or vice versa.
DIGITAL CROSSTALK
This is the glitch impulse transferred to the output of one DAC at midscale in response to a full-scale code change (all 0s to all 1s and vice versa) in the input register of another DAC. It is expressed in nV-secs.
DAC-TO-DAC CROSSTALK
This is the glitch impulse transferred to the output of one DAC due to a digital code change and subsequent output change of another DAC. This includes both digital and analog crosstalk. It is measured by loading one of the DACs with a full-scale code change (all 0s to all 1s and vice versa) with the LDAC bit set low and monitoring the output of another DAC. The energy of the glitch is expressed in nV-secs.
GAIN ERROR
PLUS
OFFSET ERROR
OUTPUT
VOLTAGE
NEGATIVE
OFFSET
ERROR
AMPLIFIER
FOOTROOM
(1mV)
NEGATIVE
OFFSET
ERROR
IDEAL
ACTUAL
DAC CODE
DEADBAND CODES
Figure 2. Transfer Function with Negative Offset
MULTIPLYING BANDWIDTH
The amplifiers within the DAC have a finite bandwidth. The multiplying bandwidth is a measure of this. A sine wave on the reference (with full-scale code loaded to the DAC) appears on the output. The multiplying bandwidth is the frequency at which the output amplitude falls to 3 dB below the input.
TOTAL HARMONIC DISTORTION
This is the difference between an ideal sine wave and its attenuated version using the DAC. The sine wave is used as the reference for the DAC and the THD is a measure of the harmonics present on the DAC output. It is measured in dBs.
GAIN ERROR
PLUS
OFFSET ERROR
OUTPUT
VOLTAGE
POSITIVE
OFFSET
ACTUAL
IDEAL
DAC CODE
Figure 3. Transfer Function with Positive Offset
–6–
REV. B
Page 7
AD5305/AD5315/AD5325
1.0
TA = 25ⴗC V
= 5V
DD
0.5
0
INL ERROR – LSBs
–0.5
–1.0
50 250100 150 200
0
CODE
Figure 4. AD5305 Typical INL Plot
0.3 TA = 25ⴗC
V
= 5V
DD
0.2
0.1
0
–0.1
DNL ERROR – LSBs
–0.2
3
TA = 25ⴗC
= 5V
V
DD
2
1
0
–1
INL ERROR – LSBs
2
3
0
200 1000
400 600 800
CODE
Figure 5. AD5315 Typical INL Plot
0.6 TA = 25ⴗC
= 5V
V
DD
0.4
0.2
0
–0.2
DNL ERROR – LSBs
–0.4
12
TA = 25ⴗC
= 5V
V
8
DD
4
0
–4
INL ERROR – LSBs
8
12
0 4000
1000 2000 3000
CODE
Figure 6. AD5325 Typical INL Plot
1
TA = 25ⴗC
= 5V
V
DD
0.5
0
DNL ERROR – LSBs
0.5
0.3
0 50 250100 150 200
CODE
Figure 7. AD5305 Typical DNL Plot
0.5
VDD = 5V
= 25ⴗC
T
A
0.25
MAX INL MAX DNL
0
ERROR – LSBs
0.25
0.5
01 5234
MIN DNL
MIN INL
V
REF
– V
Figure 10. AD5305 INL and DNL Error vs. V
REF
–0.6
2000
CODE
600400
800 1000
Figure 8. AD5315 Typical DNL Plot
0.5
VDD = 5V
0.4
0.3
0.2
0.1
–0.1
ERROR – LSBs
0.2
0.3
0.4
0.5
= 3V
V
REF
0
40 0 40
MAX INL
MAX DNL
TEMPERATURE – ⴰC
MIN DNL
MIN INL
80 120
Figure 11. AD5305 INL Error and DNL Error vs. Temperature
–1
10000
2000
CODE
3000 4000
Figure 9. AD5325 Typical DNL Plot
1
VDD = 5V
= 2V
V
REF
0.5
0
ERROR – %
0.5
1
40 0 40
OFFSET ERROR
GAIN ERROR
80 120
TEMPERATURE – ⴰC
Figure 12. AD5305 Offset Error and Gain Error vs. Temperature
REV. B
–7–
Page 8
AD5305/AD5315/AD5325
0.2
TA = 25ⴰC
ERROR – %
0.1
0.1
0.2
0.3
0.4
0.5
0.6
= 2V
V
REF
0
OFFSET ERROR
01 3
25
VDD – Volts
GAIN ERROR
46
Figure 13. Offset Error and Gain Error vs. V
600
500
400
300
A
DD
I
200
100
0
2.5
DD
40ⴰC
+105ⴰC
3.0 4.0 4.5 VDD – Volts
+25ⴰC
5
5V SOURCE
3
– Volts
OUT
2
V
1
0
01 3446
Figure 14. V
3V SOURCE
5V SINK
25
SINK/SOURCE CURRENT – mA
Source and Sink
OUT
3V SINK
Current Capability
0.5
0.4
0.3
A
DD
I
0.2
0.1
0
5.53.5 5.0
3.0 4.0
2.5
25ⴰC
VDD – Volts
40ⴰC
105ⴰC
4.5 5.53.5
5.0
600
TA = 25ⴰC
= 5V
V
DD
500
400
300
A
DD
I
200
100
ZERO – SCALE FULL – SCALE
=2V
V
REF
0
CODE
Figure 15. Supply Current vs. DAC Code
750
TA = 25ⴗC
VDD = 5V
650
A
DD
I
550
450
DECREASING
VDD = 3V
0
1.0 2.0 3.0 4.0 5.0 V
LOGIC
INCREASING
– Volts
Figure 16. Supply Current vs. Supply Voltage
TA = 25ⴗC
5µs
= 5V
V
DD
= 5V
V
REF
CH1
V
A
OUT
CH2
SCL
CH1 1V, CH2 5V, TIME BASE = 1␮s/DIV
Figure 19. Half-Scale Settling (1/4 to 3/4 Scale Code Change)
Figure 17. Power-Down Current vs. Supply Voltage
TA = 25ⴗC
5µs
= 5V
V
DD
= 2V
V
REF
CH1
V
DD
V
A
CH2
CH1 2V, CH2 200mV, TIME BASE = 200␮s/DIV
OUT
Figure 20. Power-On Reset to 0 V
Figure 18. Supply Current vs. Logic Input Voltage for SDA and SCL Volt­age Increasing and Decreasing
TA = 25ⴗC
= 5V
V
DD
= 2V
V
REF
CH1
V
A
OUT
SCL
CH2
CH1 500mV, CH2 5V, TIME BASE = 1␮s/DIV
Figure 21. Exiting Power-Down to Midscale
–8–
REV. B
Page 9
AD5305/AD5315/AD5325
VDD = 5VVDD = 3V
FREQUENCY
300 350 600400 450 500 550
IDD – A
Figure 22. IDD Histogram with
= 3 V and VDD = 5 V
V
DD
0.02
VDD = 5V
= 25ⴗC
T
A
0.01
0
2.50
2.49
– Volts
OUT
V
2.48
2.47 1s/DIV
Figure 23. AD5325 Major-Code Transition Glitch Energy
1mV/DIV
10
0
10
20
dB
30
40
50
60
0.01
0.1 1 10 100 1k 10k FREQUENCY – kHz
Figure 24. Multiplying Bandwidth (Small-Signal Frequency Response)
–0.01
FULL-SCALE ERROR – Volts
–0.02
01 3
25
V
REF
46
– Volts
Figure 25. Full-Scale Error vs. V
REF
50ns/DIV
Figure 26. DAC–DAC Crosstalk
REV. B
–9–
Page 10
AD5305/AD5315/AD5325
FUNCTIONAL DESCRIPTION
The AD5305/AD5315/AD5325 are quad resistor-string DACs fabricated on a CMOS process with resolutions of 8, 10, and 12 bits respectively. Each contains four output buffer amplifiers and is written to via a 2-wire serial interface. They operate from single supplies of 2.5 V to 5.5 V, and the output buffer amplifiers provide rail-to-rail output swing with a slew rate of 0.7 V/µs. The four DACs share a single reference input pin. The devices have three programmable power-down modes, in which all DACs may be turned off completely with a high-impedance output, or the outputs may be pulled low by on-chip resistors.
Digital-to-Analog Section
The architecture of one DAC channel consists of a resistor-string DAC followed by an output buffer amplifier. The voltage at the REFIN pin provides the reference voltage for the DAC. Figure 27 shows a block diagram of the DAC architecture. Since the input coding to the DAC is straight binary, the ideal output volt­age is given by:
VD
×
V
OUT
REF
=
N
2
where
D = decimal equivalent of the binary code, which is loaded to the DAC register;
0–255 for AD5305 (8 Bits) 0–1023 for AD5315 (10 Bits) 0–4095 for AD5325 (12 Bits)
N = DAC resolution
REFIN
DAC Reference Inputs
There is a single reference input pin for the four DACs. The reference input is unbuffered. The user can have a reference voltage as low as 0.25 V and as high as V
since there is no
DD
restriction due to headroom and footroom of any reference amplifier.
It is recommended to use a buffered reference in the external circuit (e.g., REF192). The input impedance is typically 45 kΩ.
Output Amplifier
The output buffer amplifier is capable of generating rail-to-rail voltages on its output, which gives an output range of 0 V to V
DD
when the reference is VDD. It is capable of driving a load of 2 k to GND or V
in parallel with 500 pF to GND or VDD.
DD,
The source and sink capabilities of the output amplifier can be seen in the plot in Figure 14.
The slew rate is 0.7 V/µs with a half-scale settling time to ± 0.5 LSB (at 8 bits) of 6 µs.
POWER-ON RESET
The AD5305/AD5315/AD5325 are provided with a power-on reset function, so that they power up in a defined state. The power-on state is:
– Normal operation. – Output voltage set to 0 V.
Both input and DAC registers are filled with zeros and remain so until a valid write sequence is made to the device. This is par­ticularly useful in applications where it is important to know the state of the DAC outputs while the device is powering up.
INPUT
REGISTER
DAC
REGISTER
RESISTOR
STRING
OUTPUT BUFFER
AMPLIFIER
A
V
OUT
Figure 27. DAC Channel Architecture
Resistor String
The resistor string section is shown in Figure 28. It is simply a string of resistors, each of value R. The digital code loaded to the DAC register determines at what node on the string the voltage is tapped off to be fed into the output amplifier. The voltage is tapped off by closing one of the switches connecting the string to the amplifier. Because it is a string of resistors, it is guaranteed monotonic.
R
R
R
R
R
TO OUTPUT AMPLIFIER
SERIAL INTERFACE
The AD5305/AD5315/AD5325 are controlled via an I2C­compatible serial bus. The DACs are connected to this bus as slave devices (i.e., no clock is generated by the AD5305/AD5315/ AD5325 DACs). This interface is SMBus-compatible at V
DD
< 3.6 V.
The AD5305/AD5315/AD5325 have a 7-bit slave address. The 6 MSBs are 000110 and the LSB is determined by the state of the A0 pin. The facility to make hardwired changes to A0 allows the user to use up to two of these devices on one bus.
The 2-wire serial bus protocol operates as follows:
1. The master initiates data transfer by establishing a START condition, which is when a high-to-low transition on the SDA line occurs while SCL is high. The following byte is the ad­dress byte which consists of the 7-bit slave address followed by a R/W bit (this bit determines whether data will be read from or written to the slave device).
The slave whose address corresponds to the transmitted address responds by pulling SDA low during the ninth clock pulse (this is termed the acknowledge bit). At this stage, all other devices on the bus remain idle while the selected device waits for data to be written to or read from its shift register.
2. Data is transmitted over the serial bus in sequences of nine clock pulses (8-data bits followed by an acknowledge bit). The transitions on the SDA line must occur during the low period of SCL and remain stable during the high period of SCL.
Figure 28. Resistor String
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AD5305/AD5315/AD5325
3. When all data bits have been read or written, a STOP condition is established. In write mode, the master will pull the SDA line high during the tenth clock pulse to establish a STOP condition. In read mode, the master will issue a No Acknowl­edge for the ninth clock pulse (i.e., the SDA line remains high). The master will then bring the SDA line low before the tenth clock pulse and then high during the tenth clock pulse to establish a STOP condition.
Read/Write Sequence
In the case of the AD5305/AD5315/AD5325, all write access sequences and most read sequences begin with the device address (with R/W = 0) followed by the pointer byte. This pointer byte specifies the data format and determines which DAC is being accessed in the subsequent read/write operation. (See Figure 29.) In a write operation the data follows immediately. In a read operation the address is resent with R/W = 1 and then the data is read back. However, it is also possible to perform a read opera­tion by sending only the address with R/W = 1. The previously loaded pointer settings are then used for the readback operation. See overleaf for a graphical explanation of the interface.
LSBMSB
XX
Pointer Byte Bits
RIGHT/LEFT
SINGLE/DOUBLE
Figure 29. Pointer Byte
DACD
DACC DACB DACA
The following is an explanation of the individual bits that make up the Pointer Byte.
X: Don’t Care Bits RIGHT/LEFT:
0: Data written to the device and read from the device is Left-Justified (in Double Byte mode) 1: Data written to the device and read from the device is Right-Justified (in Double Byte mode)
SINGLE/DOUBLE:
0: Data Write and Readback are done as 2-byte write/read sequences 1: Data Write and Readback are done as 1-byte (most significant 8 bits only) write/read sequences
DACD 1: The following data bytes are for DAC D
DACC 1: The following data bytes are for DAC C
DACB 1: The following data bytes are for DAC B
DACA 1: The following data bytes are for DAC A
Input Shift Register
The input shift register is 16 bits wide. Data is loaded into the device as a 16-bit word under the control of a serial clock input, SCL. The timing diagram for this operation is shown in Figure
1. The 16-bit word consists of four control bits followed by 8, 10, or 12 bits of DAC data, depending on the device type. The first two bits loaded are PD bits that control the mode of opera­tion of the device. See Power-Down Modes section for a complete description. Bit 13 is CLR, Bit 12 is LDAC and the remaining bits are left- or right-justified DAC data bits, starting with the MSB. See Figure 30 overleaf.
CLR: 0: All DAC registers and input registers are filled with
zeros on completion of the write sequence. 1: Normal operation.
LDAC: 0: All four DAC registers and hence all DAC outputs
simultaneously updated on completion of the write sequence. 1: Adqdressed input register only is updated. There is no change in the contents of the DAC registers.
Default Readback Condition
All pointer byte bits power-up to 0. Therefore, if the user initiates a readback without writing to the pointer byte first, no single DAC channel has been specified. In this case, the default readback bits are all 0, except for the CLR bit which is a 1.
Multiple-DAC Write Sequence
Because there are individual bits in the Pointer Byte for each DAC, it is possible to write the same data and control bits to 2, 3, or 4 DACs simultaneously by setting the relevant bits to 1.
Multiple-DAC Readback Sequence
If the user attempts to readback data from more than 1 DAC at a time, the part will read back the default, power-on-reset conditions for a double-byte readback, i.e., all 0s except for CLR which is 1. For a single-byte readback, the part will read back all 0s.
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AD5305/AD5315/AD5325
LEFT-JUSTIFIED DATA BYTES (WRITE AND READBACK)
MOST SIGNIFICANT DATA BYTE
PD0
PD1
PD1
CLR LDAC
10-BIT AD5315
PD0
CLR LDAC
PD0 D11 D10 D9 D8PD1
CLR
LDAC
MOST SIGNIFICANT DATA BYTE
PD0
CLR LDAC
D7 D6 D5
D9 D8 D7 D6PD1
RIGHT-JUSTIFIED DATA BYTES (WRITE AND READBACK)
X XXX
LSBMSB 8-BIT AD5305
D4
LSBMSB
LSBMSB 12-BIT AD5325
LSBMSB 8-BIT AD5305
LSBMSB 10-BIT AD5315
LEAST SIGNIFICANT DATA BYTE
LSBMSB 8-BIT AD5305
D0
D3 D2 D1
10-BIT AD5315
D5 D4 D3 D1 D1 D0 X X
12-BIT AD5325
D7 D6 D5 D4 D3 D2 D1 D0
LEAST SIGNIFICANT DATA BYTE
8-BIT AD5305
D7 D6
D5
10-BIT AD5315
XXXX
LSBMSB
LSBMSB
LSBMSB
D4 D3 D2 D1 D0
LSBMSB
PD0
CLR LDAC
PD0 D11 D10
CLR LDAC
MSB
D7 D6 D5 D4 D3 D2 D1 D0
MSB
D9 D8 D7 D6 D5 D4 D3 D2
8-BIT AD5305
10-BIT AD5315
X X D9 D8PD1
D9
SINGLE BYTE ONLY (WRITE AND READBACK)
Figure 30. Double- and Single-Byte Data Formats
LSBMSB 12-BIT AD5325
D8PD1
LSB
LSB
D7 D6 D5 D4 D3 D2 D1 D0
12-BIT AD5325
D7 D6 D5 D4 D3 D2 D1 D0
D11 D10 D9
D7 D6 D5 D4
D8
LSBMSB
LSBMSB 12-BIT AD5325
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AD5305/AD5315/AD5325
WRITE OPERATION
When writing to the AD5305/AD5315/AD5325 DACs, the user must begin with an address byte (R/W = 0) after which the DAC will Acknowledge that it is prepared to receive data by pulling SDA low. This address byte is followed by the pointer byte
SCL
SDA
MASTER
SCL
SDA
SCL
SDA
MASTER
00011 A0
START
COND
BY
MSB LSB MSB LSB
MOST SIGNIFICANT DATA BYTE LEAST SIGNIFICANT DATA BYTE
00011 A0
START
COND
BY
ADDRESS BYTE
ADDRESS BYTE
0
0
R/W
R/W
ACK
BY
AD53x5
ACK
BY
AD53x5
ACK
BY
AD53x5
MSB
MSB
which is also acknowledged by the DAC. Depending on the value of SINGLE/DOUBLE, one or two bytes of data are then written to the DAC as shown in Figure 31 below. A STOP condi­tion follows.
X X LSB
ACK
LSB
BY
AD53x5
ACK
BY
AD53x5
ACK
BY
AD53x5
START
COND
BY
MASTER
POINTER BYTE
X
X
X
POINTER BYTE
SCL
SDA
MSB
LSB
ACK
STOP
BY
DATA BYTE
MASTER
COND
BY
MASTER
Figure 31. Double- and Single-Byte Write Sequences
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AD5305/AD5315/AD5325
S
READ OPERATION
When reading data back from the AD5305/AD5315/AD5325 DACs, the user begins with an address byte (R/W = 0) after which the DAC will Acknowledge that it is prepared to receive data by pulling SDA low. This address byte is usually followed by the pointer byte which is also acknowledged by the DAC. Following this, there is a repeated start condition by the master and the address is resent with R/W = 1. This is acknowledged by the DAC indicating that it is prepared to transmit data. Depending
SCL
SDA
MASTER
SCL
SDA
START
COND
BY
00 0 11 A0
00 0 11
REPEATED
START
COND
BY
MASTER
ADDRESS BYTE
0
R/W
ACK
MSB
BY
AD53x5
0
R/W
A0
AD53x5
on the value of SINGLE/DOUBLE, one or two bytes of data are then read from the DAC as shown in Figure 32 below.
However, if the master sends an ACK and continues clocking SCL (no STOP is sent), the DAC will retransmit the same one or two bytes of data on SDA. This allows continuous readback of data from the selected DAC register.
Alternatively the user may send a START followed by the address with R/W = 1. In this case the previously loaded pointer settings are used and readback of data can commence immediately.
X X LSB
ACK
POINTER BYTEADDRESS BYTE
MSB LSB
ACK
BY
DATA BYTE
BY
AD53x5
ACK
BY
MASTER
SCL
SDA
MASTER
SCL
SDA
SCL
SDA
START
COND
BY
MSB
LEAST SIGNIFICANT DATA BYTE
00 0 11 A0
ADDRESS BYTE
00 0 11
REPEATED
START
COND
BY
MASTER
ADDRESS BYTE
0
Figure 32. Double- and Single-Byte Read Sequences
LSB
NO
ACK
BY
TER
MA
R/W
AD53x5
0
A0
X X LSB
ACK
MSB
BY
R/W
ACK
BY
AD53x5
STOP COND
BY
MASTER
X
ACK
POINTER BYTE
MSB LSB
DATA BYTE
BY
AD53x5
NO ACK
BY
MASTER
STOP COND
BY
MASTER
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DOUBLE-BUFFERED INTERFACE
The AD5305/AD5315/AD5325 DACs all have double-buffered interfaces consisting of two banks of registers—input registers and DAC registers. The input register is directly connected to the input shift register and the digital code is transferred to the rel­evant input register on completion of a valid write sequence. The DAC register contains the digital code used by the resis­tor string.
Access to the DAC register is controlled by the LDAC bit. When the LDAC bit is set high, the DAC register is latched and hence the input register may change state without affecting the contents of the DAC register. However, when the LDAC bit is set low, the DAC register becomes transparent and the contents of the input register are transferred to it.
This is useful if the user requires simultaneous updating of all DAC outputs. The user may write to three of the input registers individually and then, by setting the LDAC bit low when writing to the remaining DAC input register, all outputs will update simultaneously.
These parts contain an extra feature whereby the DAC register is not updated unless its input register has been updated since the last time that LDAC was brought low. Normally, when LDAC is brought low, the DAC registers are filled with the contents of the input registers. In the case of the AD5305/AD5315/AD5325, the part will only update the DAC register if the input register has been changed since the last time the DAC register was updated, thereby removing unnecessary digital crosstalk.
POWER-DOWN MODES
The AD5305/AD5315/AD5325 have very low power consump­tion, dissipating typically 1.5 mW with a 3 V supply and 3 mW with a 5 V supply. Power consumption can be further reduced when the DACs are not in use by putting them into one of three power-down modes, which are selected by Bits 15 and 14 (PD1 and PD0) of the data byte. Table I shows how the state of the bits corresponds to the mode of operation of the DAC.
Table I. PD1/PD0 Operating Modes
PD1 PD0 Operating Mode
0 0 Normal Operation 0 1 Power-Down (1 k Load to GND) 1 0 Power-Down (100 k Load to GND) 1 1 Power-Down (Three-State Output)
When both bits are set to 0, the DAC works normally with its normal power consumption of 600 µA at 5 V. However, for the three power-down modes, the supply current falls to 200 nA at 5 V (80 nA at 3 V). Not only does the supply current drop, but the output stage is also internally switched from the output of the amplifier to a resistor network of known values. This has an advantage in that the output impedance of the part is known while the part is in power-down mode and provides a defined input condition for whatever is connected to the output of the DAC amplifier. There are three different options. The output is connected internally to GND through a 1 k resistor, a 100 k resistor or it is left open-circuited (Three-State). Resistor toler­ance = ± 20%. The output stage is illustrated in Figure 33.
AD5305/AD5315/AD5325
RESISTOR
STRING DAC
Figure 33. Output Stage During Power-Down
The bias generator, the output amplifiers, the resistor string, and all other associated linear circuitry are all shut down when the power-down mode is activated. However, the contents of the DAC registers are unchanged when in power-down. The time to exit power-down is typically 2.5 µs for VDD = 5 V and 5 µs when V
= 3 V. This is the time from the rising edge of the sixteenth
DD
SCL pulse to when the output voltage deviates from its power­down voltage. See Figure 21 for a plot.
APPLICATIONS Typical Application Circuit
The AD5305/AD5315/AD5325 can be used with a wide range of reference voltages where the devices offer full, one-quadrant multiplying capability over a reference range of 0 V to V More typically, these devices are used with a fixed, precision reference voltage. Suitable references for 5 V operation are the AD780 and REF192 (2.5 V references). For 2.5 V operation, a suitable external reference would be the AD589, a 1.23 V band­gap reference. Figure 34 shows a typical setup for the AD5305/ AD5315/AD5325 when using an external reference. Note that A0 can be high or low.
0.1␮F
V
IN
V
OUT
EXT REF
AD780/REF192
= 5V
WITH V
DD
OR AD589 WITH
= 2.5V
V
DD
Figure 34. AD5305/AD5315/AD5325 Using External Reference
AMPLIFIER
POWER-DOWN
CIRCUITRY
10F
1F
SERIAL
INTERFACE
RESISTOR NETWORK
VDD = 2.5V TO 5.5V
AD5305/ AD5315/ AD5325
REFIN
SCL
SDA
A0
GND
V
OUT
.
DD
V
A
OUT
V
B
OUT
V
C
OUT
D
V
OUT
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AD5305/AD5315/AD5325
If an output range of 0 V to VDD is required, the simplest solu­tion is to connect the reference input to V
. As this supply may
DD
not be very accurate and may be noisy, the AD5305/AD5315/ AD5325 may be powered from the reference voltage; for example, using a 5 V reference such as the REF195. The REF195 will output a steady supply voltage for the AD5305/AD5315/AD5325. The typical current required from the REF195 is 600 µA supply current and approximately 112 µA into the reference input. This is with no load on the DAC outputs. When the DAC outputs are loaded, the REF195 also needs to supply the current to the loads. The total current required (with a 10 k load on each output) is:
712 µA + 4(5 V/10 kΩ) = 2.70 mA
The load regulation of the REF195 is typically 2 ppm/mA, which results in an error of 5.4 ppm (27 µV) for the 2.7 mA current drawn from it. This corresponds to a 0.0014 LSB error at 8 bits and 0.022 LSB error at 12 bits.
Bipolar Operation Using the AD5305/AD5315/AD5325
The AD5305/AD5315/AD5325 have been designed for single­supply operation, but a bipolar output range is also possible using the circuit in Figure 35. This circuit will give an output voltage range of ±5 V. Rail-to-rail operation at the amplifier output is achievable using an AD820 or an OP295 as the output amplifier.
R2 = 10k
6V TO 16V
10F
REF195
V
IN
PT5125
R1 = 10k
0.1␮F +5V
V
DD
V
OUT
REFIN
1F
A0
GND
V
AD5305
V
V
V
SCL SDA
2-WIRE SERIAL
INTERFACE
OUT
OUT
OUT
OUT
+5V
AD820/ OP295
A
–5V
B
C
D
5V
Figure 35. Bipolar Operation with the AD5305
The output voltage for any input code can be calculated as follows:
V
= [(REFIN × (D/2N) × (R1+R2)/R1) – REFIN × (R2/R1)]
OUT
where:
D is the decimal equivalent of the code loaded to the DAC.
N is the DAC resolution.
REFIN is the reference voltage input.
with:
REFIN = 5 V, R1 = R2 = 10 kΩ:
V
= (10 × D/2N) – 5 V
OUT
Multiple Devices on One Bus
Figure 36 below shows two AD5305 devices on the same serial bus. Each has a different slave address since the state of the A0 pin is different. This allows each of eight DACs to be written to or read from independently.
V
DD
PULL-UP
RESISTORS
MICRO-
CONTROLLER
A0
SDA
A0
AD5305
SDA
SCL
SCL
AD5305
Figure 36. Multiple AD5305 Devices on One Bus
AD5305/AD5315/AD5325 as a Digitally Programmable Window Detector
A digitally programmable upper/lower limit detector using two of the DACs in the AD5305/AD5315/AD5325 is shown in Figure 37. The upper and lower limits for the test are loaded to DACs A and B which, in turn, set the limits on the CMP04. If the signal at the V
input is not within the programmed window,
IN
an LED will indicate the fail condition. Similarly, DACs C and D can be used for window detection on a second V
5V
0.1F10␮F
V
1/2 AD5305/ AD5315/ AD5325*
GND
DD
V
V
REF
DIN
SCL
REFIN
SDA
SCL
*ADDITIONAL PINS OMITTED FOR CLARITY
V
IN
V
A
OUT
1/2
CMP04
B
OUT
signal.
IN
1k
FAIL
PASS/FAIL
1/6 74HC05
1k
PASS
Figure 37. Window Detection
Coarse and Fine Adjustment Using the AD5305/AD5315/ AD5325
Two of the DACs in the AD5305/AD5315/AD5325 can be paired together to form a coarse and fine adjustment function, as shown in Figure 38. DAC A is used to provide the coarse adjustment while DAC B provides the fine adjustment. Varying the ratio of R1 and R2 will change the relative effect of the coarse and fine adjustments. With the resistor values and external reference shown, the output amplifier has unity gain for the DAC A output, so the output range is 0 V to 2.5 V – 1 LSB. For DAC B the amplifier has a gain of 7.6 × 10
–3
, giving DAC B a range equal to 19 mV. Similarly, DACs C and D can be paired together for coarse and fine adjustment.
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AD5305/AD5315/AD5325
The circuit is shown with a 2.5 V reference, but reference volt­ages up to V
may be used. The op amps indicated will allow a
DD
rail-to-rail output swing.
VDD = 5V
10F
0.1␮F
V
IN
EXT
V
OUT
REF
GND
AD780/REF192
= 5V
WITH V
DD
*ADDITIONAL PINS OMITTED FOR CLARITY
1F
REFIN
AD5305/ AD5315/ AD5325*
V
DD
1/2
GND
R3
51.2kR4390
A
V
OUT
R1
390
V
B
OUT
R2
51.2k
5V
AD820/ OP295
V
OUT
Figure 38. Coarse/Fine Adjustment
POWER SUPPLY DECOUPLING
In any circuit where accuracy is important, careful consideration of the power supply and ground return layout helps to ensure the rated performance. The printed circuit board on which the AD5305/AD5315/AD5325 is mounted should be designed so that the analog and digital sections are separated, and confined to certain areas of the board. If the AD5305/AD5315/AD5325 is in a system where multiple devices require an AGND-to-DGND connection, the connection should be made at one point only.
The star ground point should be established as close as possible to the device. The AD5305/AD5315/AD5325 should have ample supply bypassing of 10 µF in parallel with 0.1 µF on the supply located as close to the package as possible, ideally right up against the device. The 10 µF capacitors are the tantalum bead type. The 0.1 µF capacitor should have low Effective Series Resistance (ESR) and Effective Series Inductance (ESI), like the common ceramic types that provide a low impedance path to ground at high frequencies, to handle transient currents due to internal logic switching.
The power supply lines of the AD5305/AD5315/AD5325 should use as large a trace as possible to provide low impedance paths and reduce the effects of glitches on the power supply line. Fast switching signals such as clocks should be shielded with digital ground to avoid radiating noise to other parts of the board, and should never be run near the reference inputs. A ground line routed between the SDA and SCL lines will help reduce crosstalk between them (not required on a multilayer board as there will be a separate ground plane, but separating the lines will help).
Avoid crossover of digital and analog signals. Traces on opposite sides of the board should run at right angles to each other. This reduces the effects of feedthrough through the board. A microstrip technique is by far the best, but not always possible with a double­sided board. In this technique, the component side of the board is dedicated to ground plane while signal traces are placed on the solder side.
REV. B
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AD5305/AD5315/AD5325
Table II. Overview of All AD53xx Serial Devices
No. of Settling
Part No. Resolution DACs DNL Interface Time Package Pins
SINGLES
AD5300 8 1 ±0.25 SPI 4 µs SOT-23, microSOIC 6, 8 AD5310 10 1 ± 0.5 SPI 6 µs SOT-23, microSOIC 6, 8 AD5320 12 1 ± 1.0 SPI 8 µs SOT-23, microSOIC 6, 8
AD5301 8 1 ± 0.25 2-Wire 6 µs SOT-23, microSOIC 6, 8 AD5311 10 1 ± 0.5 2-Wire 7 µs SOT-23, microSOIC 6, 8 AD5321 12 1 ± 1.0 2-Wire 8 µs SOT-23, microSOIC 6, 8
DUALS
AD5302 8 2 ± 0.25 SPI 6 µs microSOIC 8 AD5312 10 2 ± 0.5 SPI 7 µs microSOIC 8 AD5322 12 2 ± 1.0 SPI 8 µs microSOIC 8
AD5303 8 2 ± 0.25 SPI 6 µs TSSOP 16 AD5313 10 2 ± 0.5 SPI 7 µs TSSOP 16 AD5323 12 2 ± 1.0 SPI 8 µs TSSOP 16
QUADS
AD5304 8 4 ± 0.25 SPI 6 µs microSOIC 10 AD5314 10 4 ± 0.5 SPI 7 µs microSOIC 10 AD5324 12 4 ± 1.0 SPI 8 µs microSOIC 10
AD5305 8 4 ± 0.25 2-Wire 6 µs microSOIC 10 AD5315 10 4 ± 0.5 2-Wire 7 µs microSOIC 10 AD5325 12 4 ± 1.0 2-Wire 8 µs microSOIC 10
AD5306 8 4 ± 0.25 2-Wire 6 µs TSSOP 16 AD5316 10 4 ± 0.5 2-Wire 7 µs TSSOP 16 AD5326 12 4 ± 1.0 2-Wire 8 µs TSSOP 16
AD5307 8 4 ± 0.25 SPI 6 µs TSSOP 16 AD5317 10 4 ± 0.5 SPI 7 µs TSSOP 16 AD5327 12 4 ± 1.0 SPI 8 µs TSSOP 16
Visit our web-page at http://www.analog.com/support/standard_linear/selection_guides/AD53xx.html
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OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
10-Lead microSOIC
(RM-10)
0.122 (3.10)
0.114 (2.90)
AD5305/AD5315/AD5325
0.122 (3.10)
0.114 (2.90)
0.037 (0.94)
0.031 (0.78)
0.006 (0.15)
0.002 (0.05)
10 6
PIN 1
0.0197 (0.50) BSC
0.120 (3.05)
0.112 (2.85)
51
0.012 (0.30)
0.006 (0.15)
0.199 (5.05)
0.187 (4.75)
0.043 (1.10) MAX
SEATING PLANE
0.009 (0.23)
0.005 (0.13)
0.120 (3.05)
0.112 (2.85)
6 0
C3722a–2.5–6/00 (rev. B) 00930
0.028 (0.70)
0.016 (0.40)
REV. B
PRINTED IN U.S.A.
–19–
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