Low drift 2.5 V reference: 2 ppm/°C typical
Tiny package: 3 mm × 3 mm, 16-lead LFCSP
Total unadjusted error (TUE): ±0.1% of FSR maximum
Offset error: ±1.5 mV maximum
Gain error: ±0.1% of FSR maximum
High drive capability: 20 mA, 0.5 V from supply rails
User selectable gain of 1 or 2 (GAIN pin)
Reset to zero scale or midscale (RSTSEL pin)
1.8 V logic compatibility
50 MHz SPI with readback or daisy chain
Low glitch: 0.5 nV-sec
Robust 4 kV HBM and 1.5 kV FICDM ESD rating
Low power: 3.3 mW at 3 V
2.7 V to 5.5 V power supply
−40°C to +105°C temperature range
APPLICATIONS
Digital gain and offset adjustment
Programmable attenuators
Industrial automation
Data acquisition systems
LOGIC
SCLK
SYNC
SDIN
SDO
Quad, 10-Bit nanoDAC
FUNCTIONAL BLOCK DIAGRAM
REF
STRING
DAC A
STRING
DAC B
STRING
DAC C
STRING
DAC D
GAIN
×1/×2
REFERENCE
AD5317R
INTERFACE LOGIC
LDAC RESET
DD
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
POWER-ON
RESET
RSTSELGAIN
Figure 1.
2.5V
BUFFER
BUFFER
BUFFER
BUFFER
POWER-
DOWN
LOGIC
®
V
A
OUT
V
B
OUT
V
C
OUT
V
D
OUT
GENERAL DESCRIPTION
The AD5317R, a member of the nanoDAC® family, is a low
power, quad, 10-bit buffered voltage output DAC. The device
includes a 2.5 V, 2 ppm/°C internal reference (enabled by
default) and a gain select pin giving a full-scale output of 2.5 V
(gain = 1) or 5 V (gain = 2). The device operates from a single
2.7 V to 5.5 V supply, is guaranteed monotonic by design, and
exhibits less than 0.1% FSR gain error and 1.5 mV offset error
performance. The device is available in a 3 mm × 3 mm LFCSP
and a TSSOP package.
The AD5317R also incorporates a power-on reset circuit and a
RSTSEL pin that ensures that the DAC outputs power up to
zero scale or midscale and remain at that level until a valid write
takes place. Each part contains a per-channel power-down
feature that reduces the current consumption of the device to
4 µA at 3 V while in power-down mode.
The AD5317R employs a versatile SPI interface that operates at
clock rates up to 50 MHz and contains a V
The AD5317and AD5317Rare not pin-to-pin or software compatible.
PRODUCT HIGHLIGHTS
1. Precision DC Performance.
Total unadjusted error: ±0.1% of FSR maximum
Offset error: ±1.5 mV maximum
Gain error: ±0.1% of FSR maximum
2. Low Drift 2.5 V On-Chip Reference.
2 ppm/°C typical temperature coefficient
5 ppm/°C maximum temperature coefficient
3. Two Package Options.
3 mm × 3 mm, 16-lead LFCSP
16-lead TSSOP
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without n otice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Page 2
AD5317R Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Gain Error ±0.02 ±0.1 % of FSR
Total Unadjusted Error ±0.01 ±0.1 % of FSR External reference; gain = 2; TSSOP
±0.2 % of FSR Internal reference; gain = 1; TSSOP
Offset Error Drift
Gain Temperature Coefficient2 ±1 ppm Of FSR/°C
DC Power Supply Rejection Ratio2 0.15 mV/V DAC code = mi dscale; VDD = 5 V ± 10%
DC Crosstalk2 ±2 µV Due to single channel, full-scale output change
±3 µV/mA Due to load current change
±2 µV Due to power-down (per channel)
OUTPUT CHARACTERISTICS2
Output Voltage Range 0 V
0 2 × V
Capacitive Load Stability 2 nF RL = ∞
= 2.5 V; 1.8 V ≤ V
REF
2
≤ 5.5 V; all specifications T
LOGIC
MIN
to T
±1 µV/°C
V Gain = 1
V Gain = 2, see Figure 29
, unless otherwise noted. RL = 2 kΩ; CL = 200 pF.
MAX
Resistive Load3 1 kΩ
Load Regulation 80 µV/mA 5 V ± 10%, DAC code = midscale; −30 mA ≤ I
+30 mA
80 µV/mA 3 V ± 10%, DAC code = midscale; −20 mA ≤ I
+20 mA
Short-Circuit Current4 40 mA
Load Impedance at Rails5 25 Ω See Figure 29
Power-Up Time 2.5 µs Coming out of power-down mode; VDD = 5 V
REFERENCE OUTPUT
Output Voltage6 2.4975 2.5025 V At ambient
Reference TC
2 5 ppm/°C See the Terminology section
Output Impedance2 0.04 Ω
Output Voltage Noise2 12 µV p-p 0.1 Hz to 10 Hz
Load Regulation, Sourcing2 20 µV/mA At ambient
Load Regulation, Sinking2 40 µV/mA At ambient
Output Current Load Capability2
±5
mA VDD ≥ 3 V
Line Regulation2 100 µV/V At ambient
Long-Term Stability/Drift2 12 ppm After 1000 hours at 125°C
Thermal Hysteresis2 125 ppm First cycle
25 ppm Additional cycles
OUT
OUT
≤
≤
Rev. 0 | Page 3 of 28
Page 4
AD5317R Data Sheet
INL
LOGIC
INH
LOGIC
Pin Capacitance
2
pF
SINK
LOGIC
SOURCE
LOGIC
LOGI C
REF
Parameter Min Typ Max Unit Test Conditions/Comments
LOGIC INPUTS2
Input Current ±2 µA Per pin
Input Low Voltage, V
Input High Voltage, V
LOGIC OUTPUTS (SDO)2
Output Low Voltage, VOL 0.4 V I
Output High Voltage, VOH V
Floating State Output
Capacitance
POWER REQUIREMENTS
V
I
VDD 2.7 5.5 V Gain = 1
V
IDD VIH = VDD, VIL = G ND, VDD = 2.7 V to 5.5 V
Normal Mode9 0.59 0.7 mA Internal reference off
1.1 1.3 mA Internal reference on, at full scale
All Power-Down Modes10 1 4 µA −40°C to +85°C
6 µA −40°C to +105°C
1
DC specifications tested with the outputs unloaded, unless otherwise noted. Upper dead band = 10 mV and exists only when V
with gain = 2. Linearity calculated using a reduced code range of 4 to 1020.
V
DD
2
Guaranteed by design and characterization; not production tested.
3
Channel A and Channel B can have a combined output current of up to 30 mA. Similarly, Channel C and Channel D can have a combined output current of up to
30 mA up to a junction temperature of 110°C.
4
VDD = 5 V. The device includes current limiting that is intended to protect the device during temporary overload conditions. Junction temperature can be exceeded
during current limit. Operation above the specified maximum operation junction temperature may impair device reliability.
5
When drawing a load current at either rail, the output voltage headroom with respect to that rail is limited by the 25 Ω typical channel resistance of the output
devices. For example, when sinking 1 mA, the minimum output voltage = 25 Ω × 1 mA = 25 mV (see Figure 29).
6
Initial accuracy presolder reflow is ±750 µV; output voltage includes the effects of preconditioning drift. See the Terminology section.
7
Reference is trimmed and tested at two temperatures and is characterized from −40°C to +105°C.
8
Reference temperature coefficient calculated as per the box method. See the Terminology section for more information.
9
Interface inactive. All DACs active. DAC outputs unloaded.
10
All DACs powered down.
0.3 × V
0.7 × V
V
− 0.4 V I
4 pF
1.8 5.5 V 3 µA
+ 1.5 5.5 V Gain = 2
V
= 200 μA
= 200 μA
= VDD with gain = 1 or when V
REF
/2 =
REF
Rev. 0 | Page 4 of 28
Page 5
Data Sheet AD5317R
OUT
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V; V
otherwise noted.
1
Table 3.
Parameter2 Min Typ Max Unit Test Conditions/Comments3
Output Voltage Settling Time 5 7 µs ¼ to ¾ scale settling to ±1 LSB
Slew Rate 0.8 V/µs
Digital-to-Analog Glitch Impulse 0.5 nV-sec 1 LSB change around major carry
Digital Feedthrough 0.13 nV-sec
Digital Crosstalk 0.1 nV-sec
Analog Crosstalk 0.2 nV-sec
DAC-to-DAC Crosstalk 0.3 nV-sec
Total Harmonic Distortion4 −80 dB At ambient, BW = 20 kHz, VDD = 5 V, f
Output Noise Spectral Density 300 nV/√Hz DAC code = midscale, 10 kHz, gain = 2
Output Noise 6 µV p-p 0.1 Hz to 10 Hz
1
Guaranteed by design and characterization, not production tested.
2
See the Terminology section.
3
Temperature range is −40°C to +105°C, typical @ 25°C.
4
Digitally generated sine wave @ 1 kHz.
= 2.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; 1.8 V ≤ V
REF
≤ 5.5 V; all specifications T
LOGIC
to T
MIN
= 1 kHz
MAX
, unless
Rev. 0 | Page 5 of 28
Page 6
AD5317R Data Sheet
LOGIC
LOGIC
Data Setup Time
t5 8 5
ns
t
4
t
3
SCLK
SYNC
SDIN
t
1
t
2
t
5
t
6
t
7
t
8
DB23
t
9
t
10
t
11
LDAC
1
LDAC
2
t
12
1
ASYNCHRONOUS LDAC UPDATE MODE .
2
SYNCHRONOUS LDAC UPDATE MODE .
RESET
t
13
t
14
V
OUT
DB0
10800-002
TIMING CHARACTERISTICS
All input signals are specified with tR = tF = 1 ns/V (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2. See Figure 2.
V
= 2.7 V to 5.5 V, 1.8 V ≤ V
DD
Table 4.
1.8 V ≤ V
Parameter1 Symbol Min Max Min Max Unit
SCLK Cycle Time t1 33 20 ns
SCLK High Time t2 16 10 ns
SCLK Low Time t3 16 10 ns
to SCLK Falling Edge Setup Time t4 15 10 ns
SYNC
Data Hold Time t6 8 5 ns
SCLK Falling Edge to
Minimum
Falling Edge to SCLK Fall Ignore t9 16 10 ns
SYNC
Pulse Width Low t10 25 15 ns
LDAC
High Time t8 20 20 ns
SYNC
SCLK Falling Edge to
SCLK Falling Edge to
Minimum Pulse Width Low t13 30 30 ns
RESET
Pulse Activation Time t14 30 30 ns
RESET
Rising Edge t7 15 10 ns
SYNC
Rising Edge t11 30 20 ns
LDAC
Falling Edge t12 20 20 ns
LDAC
Power-Up Time2 4.5 4.5 µs
1
Maximum SCLK frequency is 50 MHz at VDD = 2.7 V to 5.5 V, 1.8 V ≤ V
2
Time to exit power-down to normal mode of AD5317R operation, 32nd clock edge to 90% of DAC midscale value, with output unloaded.
LOGIC
≤ 5.5 V; V
= 2.5 V. All specifications T
REF
≤ VDD. Guaranteed by design and characterization; not production tested.
LOGIC
MIN
to T
, unless otherwise noted.
MAX
< 2.7 V 2.7 V ≤ V
≤ 5.5 V
Figure 2. Serial Write Operation
Rev. 0 | Page 6 of 28
Page 7
Data Sheet AD5317R
LOGIC
LOGIC
200µAI
OL
200µAI
OH
VOH (MIN)
TO OUTPUT
PIN
C
L
20pF
10800-003
t
4
t
5
t
6
t
8
SDO
SDIN
SYNC
SCLK
4824
DB23DB0DB23DB0
DB23
INPUT WORD FOR DAC NUNDEFINED
INPUT WORD FOR DAC N + 1INPUT WORD FOR DAC N
DB0
t
11
t
12
t
10
10800-004
DAISY-CHAIN AND READBACK TIMING CHARACTERISTICS
All input signals are specified with tR = tF = 1 ns/V (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2. See Figure 4
and Figure 5. V
Table 5.
1.8 V ≤ V
Parameter1 Symbol Min Max Min Max Unit
SCLK Cycle Time t1 66 40 ns
SCLK High Time t2 33 20 ns
SCLK Low Time t3 33 20 ns
to SCLK Falling Edge t4 33 20 ns
SYNC
Data Setup Time t5 5 5 ns
Data Hold Time t6 5 5 ns
SCLK Falling Edge to
Minimum
Minimum
SDO Data Valid from SCLK Rising Edge t10 36 25 ns
SCLK Falling Edge to
Rising Edge to SCLK Rising Edge t12 15 10 ns
SYNC
1
Maximum SCLK frequency is 25 MHz or 15 MHz at VDD = 2.7 V to 5.5 V, 1.8 V ≤ V
Circuit and Timing Diagrams
= 2.7 V to 5.5 V, 1.8 V ≤ V
DD
Rising Edge t7 15 10 ns
SYNC
High Time t8 60 30 ns
SYNC
High Time t9 60 30 ns
SYNC
Rising Edge t11 15 10 ns
SYNC
LOG IC
≤ 5.5 V; V
= 2.5 V. All specifications T
REF
< 2.7 V 2.7 V ≤ V
≤ VDD. Guaranteed by design and characterization; not production tested.
LOGIC
MIN
to T
, unless otherwise noted.
MAX
≤ 5.5 V
Figure 3. Load Circuit for Digital Output (SDO) Timing Specifications
Figure 4. Daisy-Chain Timing Diagram
Rev. 0 | Page 7 of 28
Page 8
AD5317R Data Sheet
SYNC
t
8
t
6
SCLK
24
1
24
1
t
9
t
4
t
2
t
7
t
3
t
1
DB23DB0DB23DB0
SDIN
NOP CONDITIONINPUT WORD SPECIFIES
REGIST E R TO BE READ
t
5
DB23DB0DB23DB0
SDO
SELECTED REGISTER DATA
CLOCKED OUT
UNDEFINED
t
10
10800-005
Figure 5. Readback Timing Diagram
Rev. 0 | Page 8 of 28
Page 9
Data Sheet AD5317R
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 6.
Parameter Rating
VDD to GND −0.3 V to +7 V
V
to GND −0.3 V to +7 V
LOGI C
V
to GND −0.3 V to VDD + 0.3 V
OUT
V
to GND −0.3 V to VDD + 0.3 V
REF
Digital Input Voltage to GND −0.3 V to V
Operating Temperature Range −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature 125°C
16-Lead TSSOP, θJA Thermal
Impedance, 0 Airflow (4-Layer Board)
16-Lead LFCSP, θJA Thermal
Impedance, 0 Airflow (4-Layer Board)
Reflow Soldering Peak
Temperature, Pb Free (J-STD-020)
ESD
HBM1 4 kV
FICDM 1.5 kV
1
Human body model (HBM) classification.
112.6°C/W
70°C/W
260°C
LOGI C
+ 0.3 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. 0 | Page 9 of 28
Page 10
AD5317R Data Sheet
OUT
3 5 VDD
Power Supply Input. This part can be operated from 2.7 V to 5.5 V, and the supply should be
OUT
OUT
for readback. The serial data is transferred on the rising edge of SCLK and is valid on the falling
LOGIC
Power-On Reset Pin. Tying this pin to GND powers up all four DACs to zero scale. Tying this pin to
VDD powers up all four DACs to midscale.
OUT
17
N/A
EPAD
Exposed Pad. The exposed pad must be tied to GND.
12
11
10
1
3
4
SDIN
SYNC
SCLK
9
V
LOGIC
V
OUT
A
V
DD
2
GND
V
OUT
C
6
SDO
5
V
OUT
D
7
LDAC
8
GAIN
16
V
OUT
B
15
V
REF
14
RSTSEL
13
RESET
AD5317R
NOTES
1. THE EXPOSED PAD MUST BE TIED TO GND.
TOP VIEW
(Not to S cale)
10800-006
1
2
3
4
5
6
7
8
V
OUT
B
V
OUT
A
GND
V
OUT
D
V
OUT
C
V
DD
V
REF
SDO
16
15
14
13
12
11
10
9
RESET
SDIN
SYNC
GAIN
LDAC
V
LOGIC
SCLK
RSTSEL
TOP VIEW
(Not to S cale)
AD5317R
10800-007
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
Figure 6. 16-Lead LFCSP Pin Configuration
Table 7. Pin Function Descriptions
Pin No.
LFCSP TSSOP
1 3 V
Mnemonic Description
A Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
2 4 GND Ground Reference Point for All Circuitry on the Part.
decoupled with a 10 µF capacitor in parallel with a 0.1 µF capacitor to GND.
4 6 V
5 7 V
C Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
D Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
6 8 SDO Serial Data Output. Can be used to daisy-chain a number of AD5317R devices together or can be
used
edge of the clock.
7 9
LDAC
can be operated in two modes, asynchronously and synchronously. Pulsing this pin low allows
LDAC
any or all DAC registers to be updated if the input registers have new data. This allows all DAC outputs
to be simultaneously updated. This pin can also be tied permanently low.
8 10 GAIN Span Set Pin. When this pin is tied to GND, all four DAC outputs have a span of 0 V to V
9 11 V
pin is tied to V
Digital Power Supply. Voltage ranges from 1.8 V to 5.5 V.
, all four DAC outputs have a span of 0 V to 2 × V
DD
10 12 SCLK Serial Clock Input. Data is clocked into the input shift register on the falling edge of the serial clock
input. Data can be transferred at rates of up to 50 MHz.
11 13
Active Low Control Input. This is the frame synchronization signal for the input data. When
SYNC
goes low, data is transferred in on the falling edges of the next 24 clocks.
12 14 SDIN Serial Data Input. This device has a 24-bit input shift register. Data is clocked into the register on the
falling edge of the serial clock input.
13 15
Asynchronous Reset Input. The
RESET
pulses are ignored. When
input is falling edge sensitive. When
RESET
is activated, the input register and the DAC register are updated with
RESET
zero scale or midscale, depending on the state of the RSTSEL pin.
14 16 RSTSEL
15 1 V
16 2 V
Reference Voltage. The AD5317R has a common reference pin. When using the internal reference,
REF
this is the reference output pin. When using an external reference, this is the reference input pin.
The default for this pin is as a reference output.
B Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
Rev. 0 | Page 10 of 28
Figure 7. 16-Lead TSSOP Pin Configuration
.
REF
is low, all
RESET
. When this
REF
SYNC
LDAC
Page 11
Data Sheet AD5317R
–40–20020406080100120
V
REF
(V)
TEMPERATURE (°C)
DEVICE 1
DEVICE 2
DEVICE 3
DEVICE 4
DEVICE 5
2.4980
2.4985
2.4990
2.4995
2.5000
2.5005
2.5010
2.5015
2.5020
VDD = 5V
10800-212
90
0
10
20
30
40
50
60
70
80
00.5 1.0 1.5 2.02.5 3.03.5 4.04.5 5.0
NUMBER OF UNI TS
TEMPERAT URE DRIFT (p pm/°C)
VDD = 5V
10800-250
60
0
10
20
30
40
50
2.4982.4992.5002.5012.502
HITS
V
REF
(V)
0 HOUR
168 HOURS
500 HOURS
1000 HOURS
VDD = 5.5V
10800-251
1600
0
200
400
600
800
1000
1200
1400
101001k10k100k1M
NSD (nV/ Hz)
FREQUENCY ( Hz )
VDD = 5V
T
A
= 25°C
10800-111
CH1 2µVM1.0s
1
V
DD
= 5V
T
A
= 25°C
10800-112
2.5000
2.4999
2.4998
2.4997
2.4996
2.4995
2.4994
2.4993
–0.005–0.003–0.0010.0010.0030.005
V
REF
(V)
I
LOAD
(A)
VDD = 5V
T
A
= 25°C
10800-113
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 8. Internal Reference Voltage vs. Temperature (Grade B)
Figure 9. Reference Output Temperature Drift Histogram
Figure 11. Internal Reference Noise Spectral Density vs. Frequency
Figure 12. Internal Reference Noise, 0.1 Hz to 10 Hz
Figure 10. Reference Long-Term Stability/Drift
Figure 13. Internal Reference Voltage vs. Load Current
Rev. 0 | Page 11 of 28
Page 12
AD5317R Data Sheet
2.5002
2.5000
2.4998
2.4996
2.4994
2.4992
2.4990
2.53.03.54.04.55.05.5
V
REF
(V)
V
DD
(V)
D1
D3
D2
T
A
= 25°C
10800-117
0.5
–0.5
–0.3
–0.1
0.1
0.3
0156312468625781938
INL (LSB)
CODE
10800-118
DNL (LSB)
CODE
10800-119
0.5
–0.5
–0.3
–0.1
0.1
0.3
CODE
0156312468625781938
10
–10
–8
–6
–4
–2
0
2
4
6
8
–401106010
ERROR (LSB)
TEMPERATURE (°C)
INL
DNL
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-124
10
–10
–8
–6
–4
–2
0
2
4
6
8
05.04.54.03.53.02.52.01.51.00.5
ERROR (LSB)
V
REF
(V)
INL
DNL
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-125
10
–10
–8
–6
–4
–2
0
2
4
6
8
2.75.24.74.23.73.2
ERROR (LSB)
SUPPLY VOLTAGE (V)
INL
DNL
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-126
Figure 14. Internal Reference Voltage vs. Supply Voltage
Figure 15. INL
Figure 17. INL Error and DNL Error vs. Temperature
Figure 18. INL Error and DNL Error vs. V
REF
Figure 16. DNL
Figure 19. INL Error and DNL Error vs. Supply Voltage
Rev. 0 | Page 12 of 28
Page 13
Data Sheet AD5317R
0.10
–0.10
–0.08
–0.06
–0.04
–0.02
0
0.02
0.04
0.06
0.08
–40–20020406080100120
ERROR (% of FSR)
TEMPERATURE (°C)
GAIN ERROR
FULL-S CALE ERROR
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-127
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
–40–20020406080100120
ERROR (mV)
TEMPERATURE (°C)
OFFSET ERROR
ZERO-CO DE E RROR
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-128
0.10
–0.10
–0.08
–0.06
–0.04
–0.02
0
0.02
0.04
0.06
0.08
2.75.24.74.23.73.2
ERROR (% of FSR)
SUPPLY VOLTAGE (V)
GAIN ERROR
FULL-S CALE ERROR
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-129
1.5
–1.5
–1.0
–0.5
0
0.5
1.0
2.75.24.74.23.73.2
ERROR (mV)
SUPPLY VOLTAGE (V)
ZERO-CO DE E RROR
OFFSET ERROR
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-130
0.10
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
–40–20020406080100120
TOTAL UNADJUS TED ERROR (% o f FSR)
TEMPERATURE (°C)
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-131
0.10
0.08
0.06
0.04
0.02
0
–0.02
–0.04
–0.06
–0.08
–0.10
2.75.24.74.23.73.2
TOTAL UNADJUS TED ERROR (% o f FSR)
SUPPLY VOLTAGE (V)
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-132
Figure 20. Gain Error and Full-Scale Error vs. Temperature
Figure 21. Zero-Code Error and Offset Error vs. Temperature
Figure 23. Zero-Code Error and Offset Error vs. Supply Voltage
Figure 24. TUE vs. Temperature
Figure 22. Gain Error and Full-Scale Error vs. Supply Voltage
Figure 25. TUE vs. Supply Voltage, Gain = 1
Rev. 0 | Page 13 of 28
Page 14
AD5317R Data Sheet
0
–0.01
–0.02
–0.03
–0.04
–0.05
–0.06
–0.07
–0.08
–0.09
–0.10
0156312468624780936 1023
TOTAL UNADJUS TED ERROR (% of FSR)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10800-133
25
20
15
10
5
0
540560580600620640
HITS
IDD (mA)
V
DD
= 5V
T
A
= 25°C
EXTERNAL
REFERENCE = 2. 5V
10800-135
30
25
20
15
10
5
0
10001020104010601080110011201140
HITS
I
DD
FULL SCALE (mA)
V
DD
= 5V
T
A
= 25°C
INTERNAL
REFERENCE = 2. 5V
10800-136
1.0
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.6
0.8
051015202530
ΔV
OUT
(V)
LOAD CURRENT ( mA)
SOURCING 2.7V
SOURCING 5V
SINKING 2.7V
SINKING 5V
10800-200
7
–2
–1
0
1
2
3
4
5
6
–0.06–0.04–0.0200.020.040.06
V
OUT
(V)
LOAD CURRENT ( A)
0xFFFF
0x4000
0x8000
0xC000
0x0000
VDD = 5V
T
A
= 25°C
GAIN = 2
INTERNAL
REFERENCE = 2.5V
10800-138
5
–2
–1
0
1
2
3
4
–0.06–0.04–0.0200.020.040.06
V
OUT
(V)
LOAD CURRENT ( A)
0xFFFF
0x4000
0x8000
0xC000
0x0000
VDD = 3V
T
A
= 25°C
EXTERNAL RE FERENCE = 2.5V
GAIN = 1
10800-139
Figure 26. TUE vs. Code
Figure 27. IDD Histogram with External Reference, 5 V
Figure 29. Headroom/Footroom vs. Load Current
Figure 30. Source and Sink Capability at 5 V
Figure 28. IDD Histogram with Internal Reference, V
= 2.5 V, Gain = 2
REF
Figure 31. Source and Sink Capability at 3 V
Rev. 0 | Page 14 of 28
Page 15
Data Sheet AD5317R
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
–401106010
CURRENT (mA)
TEMPERATURE (°C)
FULL-SCALE
ZERO CODE
EXTERNAL RE FERENCE, F ULL-SCALE
10800-140
0
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
10320160408020
V
OUT
(V)
TIME (µs)
DAC A
DAC B
DAC C
DAC D
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
1/4 TO 3/ 4 S CALE
10800-141
–0.01
0
0.06
0.01
0.02
0.03
0.04
0.05
–1
0
6
1
2
3
4
5
–10151005–5
V
OUT
(V)
V
DD
(V)
TIME (µs)
CH D
V
DD
CH A
CH B
CH C
TA = 25°C
INTERNAL RE FERENCE = 2.5V
10800-142
0
1
3
2
–51005
V
OUT
(V)
TIME (µs)
CH D
SYNC
CH A
CH B
CH C
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
GAIN = 1
GAIN = 2
10800-143
2.4988
2.5008
2.5003
2.4998
2.4993
012810462
V
OUT
(V)
TIME (µs)
CHANNEL B
T
A
= 25°C
V
DD
= 5.25V
INTERNAL RE FERENCE = 2.5V
CODE = 7FF F TO 8000
ENERGY = 0. 227206nV-sec
Figure 39. 0.1 Hz to 10 Hz Output Noise Plot, 2.5 V Internal Reference
OUT
Figure 41. Total Harmonic Distortion @ 1 kHz
3.9
3.8
3.7
3.6
3.5
3.4
3.3
3.2
3.1
3.0
1.5901.6301.6201.6001.6101.6251.6051.6151.595
0nF
0.1nF
10nF
0.22nF
4.7nF
VDD = 5V
= 25°C
T
A
INTERNAL RE FERENCE = 2.5V
TIME (ms)
Figure 42. Settling Time vs. Capacitive Load
10800-150
Figure 40. Noise Spectral Density
Rev. 0 | Page 16 of 28
Page 17
Data Sheet AD5317R
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy or integral nonlinearity is a
measurement of the maximum deviation, in LSBs, from a
straight line passing through the endpoints of the DAC transfer
function. A typical INL vs. code plot is shown in Figure 15.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot can be seen in Figure 16.
Zero-Code Error
Zero-code error is a measurement of the output error when
zero code (0x0000) is loaded to the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive in
the AD5317R because the output of the DAC cannot go below
0 V due to a combination of the offset errors in the DAC and
the output amplifier. Zero-code error is expressed in mV. A plot
of zero-code error vs. temperature can be seen in Figure 21.
Full-Scale Error
Full-scale error is a measurement of the output error when fullscale code (0xFFFF) is loaded to the DAC register. Ideally, the
output should be V
− 1 LSB. Full-scale error is expressed in
DD
percent of full-scale range (% of FSR). A plot of full-scale error
vs. temperature can be seen in Figure 20.
Gain Error
Gain error is a measurement of the span error of the DAC. It is
the deviation in slope of the DAC transfer characteristic from
the ideal expressed as % of FSR.
Offset Error Drift
Offset error drift is a measurement of the change in offset error
with a change in temperature. It is expressed in µV/°C.
Gain Temperature Coefficient
Gain temperature coefficient is a measurement of the change in
gain error with changes in temperature. It is expressed in ppm
of FSR/°C.
Offset Error
Offset error is a measurement of the difference between V
(actual) and V
(ideal) expressed in mV in the linear region of
OUT
OUT
the transfer function. Offset error is measured on the AD5317R
with Code 4 loaded to the DAC register. It can be negative or
positive.
DC Power Supply Rejection Ratio (PSRR)
DC PSRR indicates how the output of the DAC is affected by
changes in the supply voltage. PSRR is the ratio of the change
in V
to a change in VDD for full-scale output of the DAC. It
OUT
is measured in mV/V. V
is held at 2.5 V, a nd VDD is varied
REF
by ±10%.
Output Voltage Settling Time
This is the amount of time it takes for the output of a DAC to
settle to a specified level for a ¼ to ¾ full-scale input change
and is measured from the rising edge of
SYNC
.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-sec
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000) (see
Figure 36).
Digital Feedthrough
Digital feedthrough is a measurement of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-sec and measured with a full-scale code
change on the data bus, that is, from all 0s to all 1s and vice
versa.
Noise Spectral Density
This is a measurement of the internally generated random
noise. Random noise is characterized as a spectral density
(nV/√Hz). It is measured by loading the DAC to midscale
and measuring noise at the output. It is measured in nV/√Hz.
A plot of noise spectral density is shown in Figure 40.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC
in response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC (or soft
power-down and power-up) while monitoring another DAC
kept at midscale. It is expressed in μV.
DC crosstalk due to load current change is a measurement of
the impact that a change in load current on one DAC has on
another DAC kept at midscale. It is expressed in μV/mA.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s and vice versa) in the input register of another
DAC. It is measured in standalone mode and is expressed in
nV-sec.
Rev. 0 | Page 17 of 28
Page 18
AD5317R Data Sheet
6
10×
×
−
=
TempRangeV
VV
TC
REFnom
REFminREFmax
Analog Crosstalk
Analog crosstalk is the glitch impulse transferred to the output
of one DAC due to a change in the output of another DAC. It is
measured by loading one of the input registers with a full-scale
code change (all 0s to all 1s and vice versa). Then execute a
software LDAC and monitor the output of the DAC whose
digital code was not changed. The area of the glitch is expressed
in nV-sec.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse transferred to
the output of one DAC in response to a digital code change
and subsequent analog output change of another DAC. It is
measured by loading one channel with a full-scale code change
(all 0s to all 1s and vice versa) using the write to and update
commands while monitoring the output of another channel that
is at midscale. The energy of the glitch is expressed in nV-sec.
Total Harmonic Distortion (THD)
THD is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as the
reference for the DAC, and the THD is a measurement of the
harmonics present on the DAC output. It is measured in dB.
Voltage Reference TC
Voltage reference TC is a measurement of the change in the
reference output voltage with a change in temperature. The
reference TC is calculated using the box method, which defines
the TC as the maximum change in the reference output over a
given temperature range expressed in ppm/°C, as follows:
where:
V
is the maximum reference output measured over the
REFmax
total temperature range.
V
is the minimum reference output measured over the total
REFmin
temperature range.
V
is the nominal reference output voltage, 2.5 V.
REFno m
TempRange is the specified temperature range of −40°C to
+105°C.
Rev. 0 | Page 18 of 28
Page 19
Data Sheet AD5317R
×=
N
REF
OUT
D
GainVV
2
V
R
R
R
R
R
TO OUTPUT
AMPLIFIER
V
REF
10800-053
THEORY OF OPERATION
DIGITAL-TO-ANALOG CONVERTER
The AD5317R is a quad, 10-bit, serial input, voltage output
DAC with an internal reference. The part operates from supply
voltages of 2.7 V to 5.5 V. Data is written to the AD5317R in a
24-bit word format via a 3-wire serial interface. The AD5317R
incorporates a power-on reset circuit to ensure that the DAC
output powers up to a known output state. The device also has
a software power-down mode that reduces the typical current
consumption to typically 4 µA.
TRANSFER FUNCTION
The internal reference is on by default. Because the input
coding to the DAC is straight binary, the ideal output voltage
when using an external reference is given by
where:
D is the decimal equivalent of the binary code that is loaded to
the DAC register as follows: 0 to 1023 for the 10-bit device.
N is the DAC resolution (10-bits).
Gain is the gain of the output amplifier and is set to 1 by default.
The gain can be set to ×1 or ×2 using the gain select pin. When
this pin is tied to GND, all four DAC outputs have a span from
0 V to V
have a span of 0 V to 2 × V
. When this pin is tied to VDD, all four DAC outputs
REF
.
REF
DAC ARCHITECTURE
The DAC architecture consists of a string DAC followed by an
output amplifier. Figure 43 shows a block diagram of the DAC
architecture.
REF
2.5V
REF
INPUT
REGISTER
Figure 43. Single DAC Channel Architecture Block Diagram
DAC
REGISTER
REF (+)
RESISTOR
STRING
REF (–)
GND
GAIN
(GAIN = 1 O R 2)
V
X
OUT
10800-052
The resistor string structure is shown in Figure 44. It is a string
of resistors, each of Value R. The code loaded to the DAC register
determines the node on the string where the voltage is to be
tapped off and fed into the output amplifier. The voltage is
tapped off by closing one of the switches connecting the
string to the amplifier. Because the DAC is a string of resistors,
it is guaranteed monotonic.
Figure 44. Resistor String Structure
Output Amplifiers
The output buffer amplifier can generate rail-to-rail voltages on
its output, which gives an output range of 0 V to V
range depends on the value of V
, the GAIN pin, offset error,
REF
. The actual
DD
and gain error. The GAIN pin selects the gain of the output.
•If this pin is tied to GND, all four outputs have a gain of 1,
and the output range is 0 V to V
•If this pin is tied to V
, all four outputs have a gain of 2,
DD
and the output range is 0 V to 2 × V
REF
.
.
REF
The output amplifiers are capable of driving a load of 1 kΩ in
parallel with 2 nF to GND. The slew rate is 0.8 V/µs with a ¼
to ¾ scale settling time of 5 µs.
Rev. 0 | Page 19 of 28
Page 20
AD5317R Data Sheet
0 0 0 0 No operation
0 0 0
1
DAC D
DAC C
DAC B
DAC A
1 0 0 0 DAC D
ADDRESS BITSCOMMAND BIT S
DACDDACCDACBDAC
A
D9 D8 D7 D6 D5 D4 D3 D2 D1 D0XXXXXX
C3 C2 C1 C0
DB23 (MSB)DB0 (LSB)
DATA BITS
10800-054
SERIAL INTERFACE
The AD5317R has a 3-wire serial interface (
SDIN) that is compatible with SPI, QSPI™, and MICROWIRE¬
interface standards as well as most DSPs. See Figure 2 for a
timing diagram of a typical write sequence. The AD5317R
contain an SDO pin to allow the user to daisy-chain multiple
devices together (see the Daisy-Chain Operation section) or for
readback.
Input Shift Register
The input shift register of the AD5317R is 24 bits wide. Data is
loaded MSB first (DB23) and the first four bits are the command
bits, C3 to C0 (see Table 8), followed by the 4-bit DAC address
bits, DAC A, DAC B, DAC C, DAC D (see Table 9), and finally
the data-word.
The data-word comprises the 10-bit input code, followed by six
don’t care bits (see Figure 45). These data bits are transferred to
the input register on the 24 falling edges of SCLK and are
updated on the rising edge of
SYNC
Commands can be executed on individual DAC channels,
combined DAC channels, or on all DAC channels, depending on
the address bits selected (see Table 9).
SYNC
, SCLK, and
.
Table 8. Command Bit Definitions
Command
C3 C2 C1 C0 Description
Write to Input Register n (dependent on
0 0 1 0
0 0 1 1 Write to and update DAC Channel n
0 1 0 0 Power down/power up DAC
0 1 0 1
0 1 1 0 Software reset (power-on reset)
0 1 1 1 Internal reference setup register
1 0 0 0 Set up DCEN register (daisy-chain enable)
1 0 0 1 Set up readback register (readback enable)
1 0 1 0 Reserved
… … … … Reserved
1 1 1 1 Reserved
Update DAC Register n with contents of Input
Register n
LDAC
Hardware
mask register
LDAC
Table 9. Address Bits and Selected DACs
Address Bits
Selected DAC Channel
0 0 0 1 DAC A
0 0 1 0 DAC B
0 1 0 0 DAC C
0 0 1 1 DAC A and DAC B
1 1 1 1 All DACs
1
Any combination of DAC channels can be selected using the address bits.
)
1
Figure 45. AD5317R Input Shift Register Contents
Rev. 0 | Page 20 of 28
Page 21
68HC11*
MISO
SDIN
SCLK
MOSI
SCK
PC7
PC6
SDO
SCLK
SDO
SCLK
SDO
SDIN
SDIN
SYNC
SYNC
SYNC
LDAC
LDAC
LDAC
AD5317R
AD5317R
AD5317R
*ADDITIONAL PINS OMITTED FOR CLARITY.
10800-057
Data Sheet AD5317R
STANDALONE OPERATION
The write sequence begins by bringing the
from the SDIN line is clocked into the 24-bit input shift register
on the falling edge of SCLK. After the last of the 24 data bits is
clocked in,
SYNC
should be brought high. The programmed
function is then executed, that is, an
in DAC register contents and/or a change in the mode of
SYNC
operation. If
data may be loaded to the DAC.
is taken high before the 24th clock, invalid
SYNC
for a minimum of 20 ns (single channel, see t
before the next write sequence so that a falling edge of
can initiate the next write sequence.
the rails between write sequences for even lower power opera-
SYNC
tion of the part. The
line is kept low for 24 falling edges
of SCLK, and the DAC is updated on the rising edge of
After the data is transferred into the input register of the
addressed DAC, all DAC registers and outputs can be updated
by taking
LDAC
low while the
SYNC
WRITE AND UPDATE COMMANDS
Write to Input Register n (Dependent on
Command 0001 allows the user to write to each DAC’s
dedicated input register individually. When
the input register is transparent (if not controlled by the
LDAC
mask register).
Update DAC Register n with Contents of Input Register n
Command 0010 loads the DAC registers/outputs with the
contents of the input registers selected and updates the DAC
outputs directly.
Write to and Update DAC Channel n (Independent of
)
LDAC
Command 0011 allows the user to write to the DAC registers
and update the DAC outputs directly.
DAISY-CHAIN OPERATION
For systems that contain several DACs, the SDO pin can be
used to daisy-chain several devices together. This function
is enabled through a software executable daisy-chain enable
(DCEN) command. Command 1000 is reserved for this DCEN
function (see Table 8). The daisy-chain mode is enabled by
setting Bit DB0 in the DCEN register. The default setting is
standalone mode, where DB0 = 0. Table 10 shows how the state
of the bit corresponds to the mode of operation of the device.
Table 10. Daisy-Chain Enable (DCEN) Register
DB0 Description
0 Standalone mode (default)
1 DCEN mode
SYNC
line low. Data
LDAC
-dependent change
must be brought high
in Figure 2)
8
SYNC
should be idled at
line is high.
)
LDAC
LDAC
is low,
SYNC
SYNC
.
Rev. 0 | Page 21 of 28
Figure 46. Daisy-Chaining the AD5317R
The SCLK pin is continuously applied to the input shift register
SYNC
when
is low. If more than 24 clock pulses are applied, the
data ripples out of the input shift register and appears on the
SDO line. This data is clocked out on the rising edge of SCLK
and is valid on the falling edge. By connecting the SDO line to
the SDIN input on the next DAC in the chain, a daisy-chain
interface is constructed. Each DAC in the system requires 24
clock pulses. Therefore, the total number of clock cycles must
equal 24 × N, where N is the total number of devices that are
updated. If
SYNC
is taken high at a clock that is not a multiple
of 24, invalid data may be loaded to the DAC. When the serial
transfer to all devices is complete,
SYNC
is taken high. This
latches the input data in each device in the daisy chain and
prevents any further data from being clocked into the input
shift register. The serial clock can be a continuous or a gated clock.
A continuous SCLK source can be used only if
SYNC
can be
held low for the correct number of clock cycles. In gated clock
mode, a burst clock containing the exact number of clock cycles
must be used, and
SYNC
must be taken high after the final clock
to latch the data.
Page 22
AD5317R Data Sheet
RESISTOR
NETWORK
V
OUT
X
DAC
POWER-DOWN
CIRCUITRY
AMPLIFIER
10800-058
READBACK OPERATION
Readback mode is invoked through a software executable
readback command. If the SDO output is disabled via the daisychain mode disable bit in the control register, it is automatically
enabled for the duration of the read operation, after which it is
disabled again. Command 1001 is reserved for the readback
function. This command, in association with selecting one of
the address bits, DAC A to DAC D, selects the register to read.
Note that only one DAC register can be selected during
readback. The remaining three address bits must be set to Logic
0. The remaining data bits in the write sequence are don’t care
bits. If more than one or no bits are selected, DAC Channel A is
read back by default. During the next SPI write, the data
appearing on the SDO output contains the data from the
previously addressed register.
For example, to read back the DAC register for Channel A, the
following sequence should be implemented:
1. Write 0x900000 to the AD5317R input register. This
configures the part for read mode with the DAC register of
Channel A selected. Note that all data bits, DB15 to DB0,
are don’t care bits.
2. Follow this with a second write, a NOP condition,
0x000000. During this write, the data from the register is
clocked out on the SDO line. DB23 to DB20 contain
undefined data, and the last 16 bits contain the DB19 to
DB4 DAC register contents.
Table 11. Modes of Operation
Operating Mode PDx1 PDx0
Normal Operation 0 0
Power-Down Modes
1 kΩ to GND 0 1
100 kΩ to GND 1 0
Three-State 1 1
Any or all DACs (DAC A to DAC D) can be powered down to
the selected mode by setting the corresponding bits. See
Table 12 for the contents of the input shift register during the
power-down/power-up operation.
When both Bit PDx1 and Bit PDx0 (where x is the channel
selected) in the input shift register are set to 0, the part works
normally with its normal power consumption of 1.1 mA at 5 V.
However, for the three power-down modes, the supply current
falls to 4 μA at 5 V. Not only does the supply current fall, but the
output stage is also internally switched from the output of the
amplifier to a resistor network of known values. This has the
advantage that the output impedance of the part is known while
the part is in power-down mode. There are three different
power-down options (see Tabl e 11). The output is connected
internally to GND through either a 1 kΩ or a 100 kΩ resistor, or
it is left open-circuited (three-state). The output stage is
illustrated in Figure 47.
POWER-DOWN OPERATION
The AD5317R provides three separate power-down modes.
Command 0100 is designated for the power-down function (see
Table 8). These power-down modes are software programmable
by setting eight bits, Bit DB7 to Bit DB0, in the input shift register.
There are two bits associated with each DAC channel. Table 11
shows how the state of the two bits corresponds to the mode of
operation of the device.
The bias generator, output amplifier, resistor string, and other
associated linear circuitry are shut down when the power-down
Figure 47. Output Stage During Power-Down
mode is activated. However, the contents of the DAC registers
are unaffected when in power-down. The DAC registers can be
updated while the device is in power-down mode. The time
required to exit power-down is typically 4.5 µs for V
Table 12. 24-Bit Input Shift Register Contents for Power-Down/Power-Up Operation
1
DD
DB15
to
DB23 DB22 DB21 DB20 DB19 to DB16
DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1
0 1 0 0 X X PDD1 PDD0 PDC1 PDC0 PDB1 PDB0 PDA1 PDA0
Command bits (C3 to C0) Address bits
(don’t care)
1
X = don’t care.
Power-Down
Select DAC D
Power-Down
Select DAC C
Power-Down
Select DAC B
Power-Down
Select DAC A
= 5 V.
DB0
(LSB)
Rev. 0 | Page 22 of 28
Page 23
Data Sheet AD5317R
LOGIC
contents
LOGIC
SYNC
SCLK
V
OUT
X
DAC
REGISTER
INTERFACE
LOGIC
OUTPUT
AMPLIFIER
LDAC
SDO
SDIN
V
REF
INPUT
REGISTER
10-BIT
DAC
10800-059
LOAD DAC (HARDWARE
The AD5317R DAC has double buffered interfaces consisting
of two banks of registers: input registers and DAC registers.
The user can write to any combination of the input registers.
Updates to the DAC register are controlled by the
LDAC
PIN)
LDAC
pin.
MASK REGISTER
LDAC
Command 0101 is reserved for the software
LDAC
function.
Address bits are ignored. Writing to the DAC using Command
LDAC
0101 loads the 4-bit
for each channel is 0; that is, the
register (DB3 to DB0). The default
LDAC
pin works normally.
Setting the bits to 1 forces this DAC channel to ignore transitions
on the
LDAC
pin, regardless of the state of the hardware
LDAC
pin. This flexibility is useful in applications where the user
LDAC
wishes to select which channels respond to the
LDAC
The
control over the hardware
the
mask register gives the user extra flexibility and
LDAC
pin (see Table 13). Setting
LDAC
bits (DB3 to DB0) to 0 for a DAC channel means that
this channel’s update is controlled by the hardware
pin.
LDAC
pin.
Figure 48. Simplified Diagram of Input Loading Circuitry for a Single DAC
Instantaneous DAC Updating (
LDAC
is held low while data is clocked into the input register
LDAC
Held Low)
using Command 0001. Both the addressed input register and
SYNC
the DAC register are updated on the rising edge of
the output begins to change (see
Deferred DAC Updating (
LDAC
is held high while data is clocked into the input register
Table 14).
LDAC
Is Pulsed Low)
and
using Command 0001. All DAC outputs are asynchronously
LDAC
updated by taking
low after
The update now occurs on the falling edge of
Table 14. Write Commands and
SYNC
has been taken high.
LDAC
LDAC
Pin Truth Table1
.
Command Description
0001 Write to Input Register n (dependent on
LDAC
0010 Update DAC Register n with contents of Input
Register n
Load
Bits
LDAC
LDAC
Overwrite Definition
Register
LDAC
Pin
LDAC
Operation
LDAC
Table 13.
LDAC
(DB3 to DB0)
0 1 or 0 Determined by the
1 X1 DAC channels are updated and
) V
1
X = don’t care.
Hardware
Pin State
LDAC
override the
channels see
Input Register
Contents DAC Register Contents
Data update No change (no update)
LDAC
LDAC
pin. DAC
as 1.
GND2 Data update Data update
V
LOGIC
No change Updated with input register
contents
GND No change Updated with input register
pin.
0011 Write to and update DAC Channel n V
1
A high to low hardware
(blocked) by the
2
When LDAC is permanently tied low, the LDAC mask bits are ignored.
LDAC
mask register.
LDAC
pin transition always updates the contents of the DAC register with the contents of the input register on channels that are not masked
Data update Data update
GND Data update Data update
Rev. 0 | Page 23 of 28
Page 24
AD5317R Data Sheet
HARDWARE RESET (
RESET
is an active low reset that allows the outputs to be
cleared to either zero scale or midscale. The clear code value is
user selectable via the
RESET
keep
operation (see Figure 2). When the
high, the output remains at the cleared value until a new value is
programmed. The outputs cannot be updated with a new value
while the
reset function that resets the DAC to the power-on reset code.
Command 0110 is designated for this software reset function
(see
reset are ignored.
low for a minimum of 30 ns to complete the
RESET
pin is low. There is also a software executable
Table 8). Any events on
RESET
RESET
)
select pin. It is necessary to
RESET
signal is returned
LDAC
or
RESET
during power-on
RESET SELECT PIN (RSTSEL)
The AD5317R contains a power-on reset circuit that controls
the output voltage during power-up. By connecting the RSTSEL
pin low, the output powers up to zero scale. Note that this is
outside the linear region of the DAC. By connecting the
RSTSEL pin high, V
remains powered up at this level until a valid write sequence is
made to the DAC.
powers up to midscale. The output
OUT
Rev. 0 | Page 24 of 28
Page 25
Data Sheet AD5317R
60
0
10
20
30
40
50
2.4982.4992.5002.5012.502
HITS
V
REF
(V)
POSTSOLDER
HEAT REFLOW
PRESOLDER
HEAT REFLOW
10800-060
60
0
10
20
30
40
50
2.4982.4992.5002.5012.502
HITS
V
REF
(V)
0 HOUR
168 HOURS
500 HOURS
1000 HOURS
10800-061
9
8
7
6
5
4
3
2
1
0
500–50–100–150–200
HITS
DISTORTION (ppm)
FIRST TEMPERATURE SWEEP
SUBSEQUENT TEMPERATURE SWEEPS
10800-062
INTERNAL REFERENCE SETUP
By default, the internal reference is on at power-up. To reduce
the supply current, the on-chip reference can be turned off.
Command 0111 is reserved for setting up the internal reference.
To turn off the internal reference, set the software programmable
bit, DB0, in the input shift register using Command 0111, as
shown in Tabl e 16. Table 15 shows how the state of the DB0 bit
corresponds to the mode of operation.
As with all IC reference voltage circuits, the reference value
experiences a shift induced by the soldering process. Analog
Devices, Inc., performs a reliability test called precondition to
mimic the effect of soldering a device to a board. The output
voltage specification in Table 2 includes the effect of this
reliability test.
Figure 49 shows the effect of solder heat reflow (SHR) as
measured through the reliability test (precondition).
LONG-TERM TEMPERATURE DRIFT
Figure 50 shows the change in the V
in life test at 150°C.
Figure 50. Reference Drift to 1000 Hours
value after 1000 hours
REF
THERMAL HYSTERESIS
Thermal hysteresis is the voltage difference induced on the
reference voltage by sweeping the temperature from ambient
to cold, to hot, and then back to ambient.
Thermal hysteresis data is shown in Figure 51. It is measured by
sweeping the temperature from ambient to −40°C, then to +105°C,
and then back to ambient. The V
the two ambient measurements (shown in blue in Figure 51). The
same temperature sweep and measurements were immediately
repeated, and the results are shown in red in Figure 51.
DB23 (MSB) DB22 DB21 DB20 DB19 to DB16 DB15 to DB1 DB0 (LSB)
0 1 1 1 X X 1 or 0
Command bits (C3 to C0) Address bits (don’t care) Don’t care Reference setup register
1
X = don’t care.
Figure 51. Thermal Hysteresis
Rev. 0 | Page 25 of 28
Page 26
AD5317R Data Sheet
ADSP-BF531
SYNCSPISELx
SCLKSCK
SDINMOSI
LDACPF9
RESET
PF8
AD5317R
10800-164
ADSP-BF527
SYNCSPORT_TFS
SCLKSPORT_TSCK
SDINSPORT_DTO
LDACGPIO0
RESETGPIO1
AD5317R
10800-165
AD5317R
GND
PLANE
BOARD
10800-166
APPLICATIONS INFORMATION
MICROPROCESSOR INTERFACING
Microprocessor interfacing to the AD5317R is via a serial bus
that uses a standard protocol that is compatible with DSP
processors and microcontrollers. The communications channel
requires a 3- or 4-wire interface consisting of a clock signal, a
data signal, and a synchronization signal. The device requires a
24-bit data-word with data valid on the rising edge of
SYNC
.
AD5317R TO ADSP-BF531 INTERFACE
The SPI interface of the AD5317R is designed to be easily
connected to industry-standard DSPs and microcontrollers.
Figure 52 shows the AD5317R connected to the Analog
Devices, Inc., Blackfin® DSP. The Blackfin has an integrated SPI
port that can be connected directly to the SPI pins of the
AD5317R.
Figure 52. ADSP-BF531 Interface
AD5317R TO SPORT INTERFACE
The Analog Devices ADSP-BF527 has one SPORT serial port.
Figure 53 shows how one SPORT interface can be used to
control the AD5317R.
LAYOUT GUIDELINES
In any circuit where accuracy is important, careful consideration of the power supply and ground return layout helps to
ensure the rated performance. The PCB on which the AD5317R is
mounted should be designed so that the AD5317R lies on the
analog plane.
The AD5317R should have ample supply bypassing of 10 µF in
parallel with 0.1 µF on each supply, located as close to the
package as possible, ideally right up against the device. The
10 µF capacitors are the tantalum bead type. The 0.1 µF
capacitor should have low effective series resistance (ESR) and
low effective series inductance (ESI), such as the common
ceramic types, which provide a low impedance path to ground
at high frequencies to handle transient currents due to internal
logic switching.
In systems where there are many devices on one board, it is
often useful to provide some heat sinking capability to allow
the power to dissipate easily.
The AD5317R LFCSP model has an exposed pad beneath the
device. Connect this pad to the GND supply for the part. For
optimum performance, use special considerations to design the
motherboard and to mount the package. For enhanced thermal,
electrical, and board level performance, solder the exposed pad
on the bottom of the package to the corresponding thermal land
pad on the PCB. Design thermal vias into the PCB land pad
area to further improve heat dissipation.
The GND plane on the device can be increased (as shown in
Figure 54) to provide a natural heat sinking effect.
Figure 53. SPORT Interface
Figure 54. Pad Connection to Board
Rev. 0 | Page 26 of 28
Page 27
Data Sheet AD5317R
ENCODE
SERIAL
CLOCK IN
CONTROLLER
ADuM1400
1
SERIAL
DATA OUT
SYNC OUT
LOAD DAC
OUT
DECODE
TO
SCLK
TO
SDIN
TO
SYNC
TO
LDAC
V
IA
V
OA
ENCODEDECODE
V
IB
V
OB
ENCODEDECODE
V
IC
V
OC
ENCODEDECODE
V
ID
V
OD
1
ADDITIONAL PINS OMITTED FOR CLARITY.
10800-167
GALVANICALLY ISOLATED INTERFACE
In many process control applications, it is necessary to
provide an isolation barrier between the controller and
the unit being controlled to protect and isolate the controlling
circuitry from any hazardous common-mode voltages that
may occur. iCoupler® products from Analog Devices provide
voltage isolation in excess of 2.5 kV. The serial loading structure of the AD5317R makes the part ideal for isolated interfaces
because the number of interface lines is kept to a minimum.
Figure 55 shows a 4-channel isolated interface to the AD5317R
using an ADuM1400. For further information, visit
http://www.analog.com/icouplers.
Figure 55. Isolated Interface
Rev. 0 | Page 27 of 28
Page 28
AD5317R Data Sheet
C
OUTLINE DIMENSIONS
PIN 1
INDI
ATOR
0.80
0.75
0.70
SEATING
PLANE
3.10
3.00 SQ
2.90
0.50
BSC
0.50
0.40
0.30
0.05 MAX
0.02 NOM
0.20 REF
COMPLIANTTOJEDEC STANDARDS MO-220-W E E D - 6.
0.30
0.23
0.18
13
12
9
BOTTOM VIEWTOP VIEW
COPLANARITY
0.08
P
N
I
16
1
EXPOSED
PAD
4
58
FOR PROP ER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPT IONS
SECTION OF THIS DATA SHEET.
Figure 56. 16-Lead Lead Frame Chip Scale Package [LFCSP_WQ]
3 mm × 3 mm Body, Very Very Thin Quad
(CP-16-22)
Dimensions shown in millimeters
5.10
5.00
4.90
N
1
I
D
C
I
A
1.75
1.60 SQ
1.45
0.25 MIN
R
O
T
08-16-2010-E
0.15
0.05
4.50
4.40
4.30
PIN 1
16
0.65
BSC
COPLANARITY
COMPLI ANT TO JEDE C S TANDARDS MO-153 - AB
0.10
0.30
0.19
9
81
1.20
MAX
6.40
BSC
SEATING
PLANE
0.20
0.09
8°
0°
0.75
0.60
0.45
Figure 57. 16-Lead Thin Shrink Small Outline Package [TSSOP]