Datasheet AD5307 Datasheet (Analog Devices)

Page 1
2.5 V to 5.5 V, 400 A, Quad Voltage Output 8-/10-/12-Bit DACs in 16-Lead TSSOP
FEATURES AD5307: 4 Buffered 8-Bit DACs in 16-Lead TSSOP
A Version: 1 LSB INL, B Version: 0.625 LSB INL
AD5317: 4 Buffered 10-Bit DACs in 16-Lead TSSOP
A Version: 4 LSB INL, B Version: 2.5 LSB INL
AD5327: 4 Buffered 12-Bit DACs in 16-Lead TSSOP
A Version: 16 LSB INL, B Version: 10 LSB INL
Low Power Operation: 400 A @ 3 V, 500 A @ 5 V
2.5 V to 5.5 V Power Supply Guaranteed Monotonic by Design over All Codes Power-Down to 90 nA @ 3 V, 300 nA @ 5 V (PD Pin) Double-Buffered Input Logic Buffered/Unbuffered Reference Input Options Output Range: 0 V to V
or 0 V to 2 V
REF
REF
Power-On Reset to 0 V Simultaneous Update of Outputs (LDAC Pin) Asynchronous Clear Facility (CLR Pin) Low Power, SPI
®
, QSPI™, MICROWIRE™, and DSP
Compatible 3-Wire Serial Interface SDO Daisy-Chaining Option On-Chip Rail-to-Rail Output Buffer Amplifiers Temperature Range –40C to +105ⴗC
APPLICATIONS Portable Battery-Powered Instruments Digital Gain and Offset Adjustment Programmable Voltage and Current Sources
AD5307/AD5317/AD5327
Programmable Attenuators Industrial Process Control

GENERAL DESCRIPTION

The AD5307/AD5317/AD5327 are quad 8-, 10-, and 12-bit buffered voltage-output DACs in a 16-lead TSSOP package that operate from a single 2.5 V to 5.5 V supply, consuming 400 mA at 3 V. Their on-chip output amplifiers allow the outputs to swing rail-to-rail with a slew rate of 0.7 V/ms. The AD5307/ AD5317/AD5327 utilize a versatile 3-wire serial interface that operates at clock rates up to 30 MHz and is compatible with standard SPI, QSPI, MICROWIRE, and DSP interface standards.
The references for the four DACs are derived from two refer­ence pins (one per DAC pair). These reference inputs can be configured as buffered or unbuffered inputs. The parts incorpo­rate a power-on reset circuit, which ensures that the DAC outputs power up to 0 V and remain there until a valid write to the device takes place. There is also an asynchronous active low CLR pin that clears all DACs to 0 V. The outputs of all DACs may be updated simultaneously using the asynchronous LDAC input. The parts contain a power-down feature that reduces the cur­rent consumption of the devices to 300 nA @ 5 V (90 nA @ 3 V). The parts may also be used in daisy-chaining applications using the SDO pin.
All three parts are offered in the same pinout, which allows users to select the amount of resolution appropriate for their applica­tion without redesigning their circuit board.

FUNCTIONAL BLOCK DIAGRAM

AD5307/AD5317/AD5327
LDAC
INPUT
REGISTER
SCLK
SYNC
DIN
SDO
*Protected by U.S. Patent No. 5,969,657; other patents pending.
INTERFACE
LOGIC
DCEN
LDAC PD
CLR
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
POWER-ON
RESET
REV. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective companies.
V
V
DD
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © 2003 Analog Devices, Inc. All rights reserved.
REF
STRING
DAC A
STRING
DAC B
STRING
DAC C
STRING
DAC D
V
REF
AB
CD
GAIN-SELECT
BUFFER
BUFFER
BUFFER
BUFFER
POWER-DOWN
LOGIC
LOGIC
GND
V
A
OUT
V
B
OUT
V
C
OUT
V
D
OUT
Page 2
AD5307/AD5317/AD5327–SPECIFICATIONS
= 200 pF to GND; all specifications T
GND; C
L
Parameter
DC PERFORMANCE
1
3, 4
A Version Min Typ Max Min Typ Max Unit Conditions/Comments
MIN
to T
, unless otherwise noted.)
MAX
2
B Version
2
(VDD = 2.5 V to 5.5 V; V
= 2 V; RL = 2 k to
REF
AD5307
Resolution 8 8 Bits Relative Accuracy ± 0.15 ± 1 ± 0.15 ± 0.625 LSB Differential Nonlinearity ± 0.02 ± 0.25 ± 0.02 ± 0.25 LSB Guaranteed Monotonic by Design
over All Codes
AD5317
Resolution 10 10 Bits Relative Accuracy ± 0.5 ± 4 ± 0.5 ± 2.5 LSB Differential Nonlinearity ± 0.05 ± 0.5 ± 0.05 ± 0.5 LSB Guaranteed Monotonic by Design
over All Codes
AD5327
Resolution 12 12 Bits Relative Accuracy ± 2 ± 16 ± 2 ± 10 LSB Differential Nonlinearity ± 0.2 ± 1 ± 0.2 ± 1 LSB Guaranteed Monotonic by Design
over All Codes
Offset Error ± 5 ± 60 ± 5 ± 60 mV V
= 4.5 V, Gain = 2;
DD
See Figures 4 and 5
Gain Error ± 0.3 ± 1.25 ± 0.3 ± 1.25 % of FSR V
Lower Deadband
Upper Deadband
Offset Error Drift
Gain Error Drift
6
5
5
6
10 60 10 60 mV See Figure 4. Lower deadband exists
10 60 10 60 mV See Figure 5. Upper deadband exists
–12 –12 ppm of
FSR/∞C
–5 –5 ppm of
= 4.5 V, Gain = 2;
DD
See Figures 4 and 5.
only if offset error is negative.
only if V
= VDD and offset plus
REF
gain error is positive.
FSR/∞C
DC Power Supply Rejection
6
Ratio
DC Crosstalk
DAC REFERENCE INPUTS
V
Input Range 1 V
REF
6
6
0.25 V
Input Impedance (R
V
REF
) >10 >10 MW Buffered Reference Mode and
DAC
–60 –60 dB ⌬VDD = ± 10% 200 200 mVR
1V
DD
0.25 V
DD
V Buffered Reference Mode
DD
V Unbuffered Reference Mode
DD
= 2 kW to GND or V
L
DD
Power-Down Mode
74 90 74 90 kW Unbuffered Reference Mode.
0 V to V
Output Range
REF
37 45 37 45 kW Unbuffered Reference Mode.
0 V to 2 V
Output Range
REF
Reference Feedthrough –90 –90 dB Frequency = 10 kHz Channel-to-Channel Isolation –75 –75 dB Frequency = 10 kHz
OUTPUT CHARACTERISTICS
Minimum Output Voltage Maximum Output Voltage
6
7
7
0.001 0.001 V This is a measure of the minimum VDD – 0.001 VDD – 0.001 V and maximum drive capability of the
output amplifier.
DC Output Impedance 0.5 0.5 W Short Circuit Current 25 25 mA V
16 16 mA V
DD
DD
= 5 V = 3 V
Power-Up Time 2.5 2.5 ms Coming out of Power-Down Mode.
= 5 V
V
DD
55ms Coming out of Power-Down Mode.
VDD = 3 V
REV. A–2–
Page 3
AD5307/AD5317/AD5327
Parameter
1
LOGIC INPUTS
A Version
2
B Version
Min Typ Max Min Typ Max Unit Conditions/Comments
6
2
Input Current ± 1 ± 1 mA
, Input Low Voltage 0.8 0.8 V VDD = 5 V ± 10%
V
IL
, Input High Voltage
V
IH
(Excluding DCEN) 1.7 1.7 V V
0.6 0.6 V V
0.5 0.5 V V
= 3 V ± 10%
DD
= 2.5 V
DD
= 2.5 V to 5.5 V; TTL and 1.8 V
DD
CMOS Compatible
, Input High Voltage
V
IH
(DCEN) 2.4 2.4 V V
2.1 2.1 V V
2.0 2.0 V V
= 5 V ± 10%
DD
= 3 V ± 10%
DD
= 2.5 V
DD
Pin Capacitance 3 3 pF
LOGIC OUTPUT (SDO)
6
VDD = 4.5 V to 5.5 V
Output Low Voltage, V Output High Voltage, V
V
= 2.5 V to 3.6 V
DD
Output Low Voltage, V Output High Voltage, V
OL
OL
OH
OH
0.4 0.4 V I
VDD – 1 VDD – 1 V I
0.4 0.4 V I
VDD – 0.5 VDD – 0.5 V I
= 2 mA
SINK
SOURCE
= 2 mA
SINK
SOURCE
= 2 mA
= 2 mA
Floating State Leakage Current ± 1 ± 1 mA DCEN = GND Floating State Output
Capacitance 3 3 pF DCEN = GND
POWER REQUIREMENTS
V
DD
(Normal Mode)
I
DD
V
= 4.5 V to 5.5 V 500 900 500 900 mA All DACs in Unbuffered Mode.
DD
8
2.5 5.5 2.5 5.5 V VIH = VDD and VIL = GND
In Buffered Mode, extra current is typically x mA per DAC
= 2.5 V to 3.6 V 400 750 400 750 mA where x = 5 mA + V
V
DD
(Power-Down Mode) VIH = VDD and VIL = GND
I
DD
= 4.5 V to 5.5 V 0.3 1 0.3 1 mA
V
DD
VDD = 2.5 V to 3.6 V 0.09 1 0.09 1 mA
NOTES
1
See the Terminology section.
2
Temperature range (A, B Versions): –40C to +105C; typical at +25C.
3
DC specifications tested with the outputs unloaded, unless stated otherwise.
4
Linearity is tested using a reduced code range: AD5307 (Code 8 to 255); AD5317 (Code 28 to 1023); AD5327 (Code 115 to 4095).
5
This corresponds to x codes. x = Deadband Voltage/LSB size.
6
Guaranteed by design and characterization; not production tested.
7
For the amplifier output to reach its minimum voltage, offset error must be negative; for the amplifier output to reach its maximum voltage, V plus gain error must be positive.
8
Interface inactive. All DACs active. DAC outputs unloa-ded.
Specifications subject to change without notice.
REF/RDAC
REF
.
= VDD and offset
REV. A
–3–
Page 4
AD5307/AD5317/AD5327
(VDD = 2.5 V to 5.5 V; RL = 2 k to GND; CL = 200 pF to GND; all specifications T

AC CHARACTERISTICS

Parameter
2
1
otherwise noted.)
A, B Versions
3
Min Typ Max Unit Conditions/Comments
Output Voltage Settling Time V
= VDD = 5 V
REF
MIN
to T
, unless
MAX
AD5307 6 8 ms 1/4 Scale to 3/4 Scale Change (0x40 to 0xC0) AD5317 7 9 ms 1/4 Scale to 3/4 Scale Change (0x100 to 0x300) AD5327 8 10 ms 1/4 Scale to 3/4 Scale Change (0x400 to 0xC00)
Slew Rate 0.7 V/ms Major-Code Change Glitch Energy 12 nV-s 1 LSB Change around Major Carry Digital Feedthrough 0.5 nV-s SDO Feedthrough 4 nV-s Daisy-Chain Mode; SDO Load is 10 pF Digital Crosstalk 0.5 nV-s Analog Crosstalk 1 nV-s DAC-to-DAC Crosstalk 3 nV-s Multiplying Bandwidth 200 kHz V Total Harmonic Distortion –70 dB V
NOTES
1
Guaranteed by design and characterization; not production tested.
2
See the Terminology section.
3
Temperature range (A, B Versions): –40C to +105C; typical at +25C.
Specifications subject to change without notice.
1, 2, 3

TIMING CHARACTERISTICS

(VDD = 2.5 V to 5.5 V; all specifications T
= 2 V ± 0.1 V p-p. Unbuffered Mode
REF
= 2.5 V ± 0.1 V p-p. Frequency = 10 kHz
REF
to T
MIN
, unless otherwise noted.)
MAX
A, B Versions
Parameter Limit at T
t
1
t
2
t
3
t
4
t
5
t
6
t
7
t
8
t
9
t
10
t
11
t
12
4, 5
t
13
5
t
14
5
t
15
5
t
16
NOTES
1
Guaranteed by design and characterization; not production tested.
2
All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2.
3
See Figures 2 and 3.
4
This is measured with the load circuit of Figure 1. t13 determines maximum SCLK frequency in Daisy-Chain mode.
5
Daisy-chain mode only.
Specifications subject to change without notice.
33 ns min SCLK Cycle Time 13 ns min SCLK High Time 13 ns min SCLK Low Time 13 ns min SYNC to SCLK Falling Edge Setup Time 5 ns min Data Setup Time
4.5 ns min Data Hold Time 0 ns min SCLK Falling Edge to SYNC Rising Edge 50 ns min Minimum SYNC High Time 20 ns min LDAC Pulsewidth 20 ns min SCLK Falling Edge to LDAC Rising Edge 20 ns min CLR Pulsewidth 0 ns min SCLK Falling Edge to LDAC Falling Edge 20 ns max SCLK Rising Edge to SDO Valid (VDD = 3.6 V to 5.5 V) 25 ns max SCLK Rising Edge to SDO Valid (V 5 ns min SCLK Falling Edge to SYNC Rising Edge 8 ns min SYNC Rising Edge to SCLK Rising Edge 0 ns min SYNC Rising Edge to LDAC Falling Edge
MIN
, T
MAX
Unit Conditions/Comments
= 2.5 V to 3.5 V)
DD
REV. A–4–
Page 5
2mA
AD5307/AD5317/AD5327
I
OL
Figure 1. Load Circuit for Digital Output (SDO) Timing Specifications
SCLK
t
t
8
SYNC
DIN
1
LDAC
2
LDAC
CLR
NOTES
ASYNCHRONOUS LDAC UPDATE MODE.
1
SYNCHRONOUS LDAC UPDATE MODE.
2
DB15
TO OUTPUT
PIN
C
L
50pF
I
2mA
OH
t
1
t
2
DB0
t
7
t
9
t
12
t
4
t
5
3
t
6
Figure 2. Serial Interface Timing Diagram
V
OH (MIN)
t
10
t
11
REV. A
SCLK
SYNC
LDAC
DIN
SDO
t
1
t
t
t
t
4
8
t
5
DB15
INPUT WORD FOR DAC N INPUT WORD FOR DAC (N+1)
3
t
6
UNDEFINED INPUT WORD FOR DAC N
2
DB0 DB15' DB0'
t
13
DB15
t
14
DB0
t
15
t
16
t
9
Figure 3. Daisy-Chaining Timing Diagram
–5–
Page 6
AD5307/AD5317/AD5327

ABSOLUTE MAXIMUM RATINGS

(TA = 25C, unless otherwise noted.)
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
Digital Input Voltage to GND . . . . . . . –0.3 V to V
Digital Output Voltage to GND . . . . . –0.3 V to V
Reference Input Voltage to GND . . . . –0.3 V to V
V
OUT
A–V
D to GND . . . . . . . . . . . –0.3 V to VDD + 0.3 V
OUT
Operating Temperature Range
Industrial (A, B Versions) . . . . . . . . . . . . –40C to +105∞C
Storage Temperature Range . . . . . . . . . . . . –65C to +150∞C
Junction Temperature (T
max) . . . . . . . . . . . . . . . . . . . 150C
J
1, 2
+ 0.3 V
DD
+ 0.3 V
DD
+ 0.3 V
DD
16-Lead TSSOP
Power Dissipation . . . . . . . . . . . . . . . . . . (T
max – TA)/
J
␪JA Thermal Impedance . . . . . . . . . . . . . . . . . . . 150.4C/W
Reflow Soldering
Peak Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . 220∞C
Time at Peak Temperature . . . . . . . . . . . . . 10 sec to 40 sec
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.

ORDERING GUIDE

Model Temperature Range Package Description Package Option
AD5307ARU –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5307ARU-REEL 7 –40C to +105∞CThin Shrink Small Outline Package (TSSOP) RU-16 AD5307BRU –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5307BRU-REEL –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5307BRU-REEL7 –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5317ARU –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5317ARU-REEL7 –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5317BRU –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5317BRU-REEL –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5317BRU-REEL7 –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5327ARU –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5327ARU-REEL7 –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5327BRU –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5327BRU-REEL –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16 AD5327BRU-REEL7 –40C to +105CThin Shrink Small Outline Package (TSSOP) RU-16
JA
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD5307/AD5317/AD5327 feature proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
REV. A–6–
Page 7

PIN CONFIGURATION

AD5307/AD5317/AD5327
V
V
LDAC
V
OUT
V
OUT
V
OUT
REF
REF
CLR
V
AB
CD
DD
1
2
3
4
A
5
B
(Not to Scale)
6
C
7
8
AD5307/ AD5317/
AD5327
TOP VIEW
16
SDO
15
SYNC
14
SCLK
13
DIN
12
GND
11
V
D
OUT
10
PD
DCEN
9

PIN FUNCTION DESCRIPTIONS

Pin No. Mnemonic Function
1 CLR Active Low Control Input that Loads All Zeros to All Input and DAC Registers. Therefore, the outputs
also go to 0 V.
2 LDAC Active Low Control Input that Transfers the Contents of the Input Registers to their Respective DAC
Registers. Pulsing this pin low allows any or all DAC registers to be updated if the input registers have new data. This allows simultaneous update of all DAC outputs. Alternatively, this pin can be tied permanently low.
3V
DD
Power Supply Input. These parts can be operated from 2.5 V to 5.5 V, and the supply should be decoupled with a 10 mF capacitor in parallel with a 0.1 mF capacitor to GND.
4V
5V
6V
7V
ABuffered Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
BBuffered Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
CBuffered Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
OUT
AB Reference Input Pin for DACs A and B. It may be configured as a buffered or an unbuffered input to each or
REF
both of the DACs, depending on the state of the BUF bits in the serial input words to DACs A and B. It
in unbuffered mode and from 1 V to VDD in buffered mode.
DD
8V
CD Reference Input Pin for DACs C and D. It may be configured as a buffered or an unbuffered input to each or
REF
has an input range from 0.25 V to V
both of the DACs, depending on the state of the BUF bits in the serial input words to DACs C and D. It has an input range from 0.25 V to V
in unbuffered mode and from 1 V to VDD in buffered mode.
DD
9 DCEN This pin is used to enable the daisy-chaining option. This should be tied high if the part is being used in a
daisy chain. The pin should be tied low if it is being used in standalone mode.
10 PD Active low control input that acts as a hardware power-down option. All DACs go into power-down
mode when this pin is tied low. The DAC outputs go into a high impedance state and the current con­sumption of the part drops to 300 nA @ 5 V (90 nA @ 3 V).
11 V
DBuffered Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
OUT
12 GND Ground Reference Point for All Circuitry on the Part.
13 DIN Serial Data Input. This device has a 16-bit shift register. Data is clocked into the register on the falling
edge of the serial clock input. The DIN input buffer is powered down after each write cycle.
14 SCLK Serial Clock Input. Data is clocked into the input shift register on the falling edge of the serial clock
input. Data can be transferred at rates up to 30 MHz. The SCLK input buffer is powered down after each write cycle.
15 SYNC Active Low Control Input. This is the frame synchronization signal for the input data. When SYNC goes
low, it powers on the SCLK and DIN buffers and enables the input shift register. Data is transferred in on the falling edges of the following 16 clocks. If SYNC is taken high before the 16th falling edge, the rising edge of SYNC acts as an interrupt and the write sequence is ignored by the device.
16 SDO Serial Data Output. Can be used for daisy-chaining a number of these devices together or for reading
back the data in the shift register for diagnostic purposes. The serial data is transferred on the rising edge of SCLK and is valid on the falling edge of the clock.
REV. A
–7–
Page 8
AD5307/AD5317/AD5327
TERMINOLOGY Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is a measure of the maximum deviation, in LSB, from a straight line passing through the endpoints of the DAC transfer function. Typical INL versus code plots can be seen in TPCs 1, 2, and 3.

Differential Nonlinearity

Differential nonlinearity (DNL) is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ± 1 LSB maximum ensures monotonicity. This DAC is guaranteed monotonic by design. Typical DNL versus code plots can be seen in TPCs 4, 5, and 6.

Offset Error

This is a measure of the offset error of the DAC and the output amplifier. (See Figures 4 and 5.) It can be negative or positive. It is expressed in mV.

Gain Error

This is a measure of the span error of the DAC. It is the devia­tion in slope of the actual DAC transfer characteristic from the ideal expressed as a percentage of the full-scale range.

Offset Error Drift

This is a measure of the change in offset error with changes in temperature. It is expressed in (ppm of full-scale range)/∞C.

Gain Error Drift

This is a measure of the change in gain error with changes in temperature. It is expressed in (ppm of full-scale range)/∞C.

DC Power Supply Rejection Ratio (PSRR)

This indicates how the output of the DAC is affected by changes in the supply voltage. PSRR is the ratio of the change in V
OUT
to a change in VDD for full-scale output of the DAC. It is mea­sured in dB. V

DC Crosstalk

is held at 2 V and VDD is varied ± 10%.
REF
This is the dc change in the output level of one DAC in response to a change in the output of another DAC. It is measured with a full-scale output change on one DAC while monitoring another DAC. It is expressed in mV.

Reference Feedthrough

This is the ratio of the amplitude of the signal at the DAC output to the reference input when the DAC output is not being updated (i.e., LDAC is high). It is expressed in dB.

Channel-to-Channel Isolation

This is the ratio of the amplitude of the signal at the output of one DAC to a sine wave on the reference input of another DAC. It is measured in dB.

Major-Code Transition Glitch Energy

Major-code transition glitch energy is the energy of the impulse injected into the analog output when the code in the DAC register changes state. It is normally specified as the area of the glitch in nV-s and is measured when the digital code is changed by 1 LSB at the major carry transition (011 . . . 11 to 100 . . . 00 or 100 . . . 00 to 011 . . . 11).

Digital Feedthrough

Digital feedthrough is a measure of the impulse injected into the analog output of a DAC from the digital input pins of the device, but is measured when the DAC is not being written to the (SYNC held high). It is specified in nV-s and is measured with a full­scale change on the digital input pins, i.e., from all 0s to all 1s or vice versa.

Digital Crosstalk

This is the glitch impulse transferred to the output of one DAC at midscale in response to a full-scale code change (all 0s to all 1s and vice versa) in the input register of another DAC. It is measured in standalone mode and is expressed in nV-s.

Analog Crosstalk

This is the glitch impulse transferred to the output of one DAC due to a change in the output of another DAC. It is measured by loading one of the input registers with a full-scale code change (all 0s to all 1s and vice versa) while keeping LDAC high. Then pulse LDAC low and monitor the output of the DAC whose digital code was not changed. The area of the glitch is expressed in nV-s.

DAC-to-DAC Crosstalk

This is the glitch impulse transferred to the output of one DAC due to a digital code change and subsequent output change of another DAC. This includes both digital and analog crosstalk. It is measured by loading one of the DACs with a full-scale code change (all 0s to all 1s and vice versa) with LDAC low and monitoring the output of another DAC. The energy of the glitch is expressed in nV-s.

Multiplying Bandwidth

The amplifiers within the DAC have a finite bandwidth. The multiplying bandwidth is a measure of this. A sine wave on the reference (with full-scale code loaded to the DAC) appears on the output. The multiplying bandwidth is the frequency at which the output amplitude falls to 3 dB below the input.

Total Harmonic Distortion

This is the difference between an ideal sine wave and its attenuated version using the DAC. The sine wave is used as the reference for the DAC, and the THD is a measure of the harmonics present on the DAC output. It is measured in dB.
REV. A–8–
Page 9
OUTPUT
VOLTAGE
NEGATIVE
OFFSET
ERROR
AMPLIFIER
FOOTROOM
NEGATIVE
OFFSET
ERROR
LOWER
DEADBAND
CODES
DAC CODE
GAIN ERROR
OFFSET ERROR
ACTUAL
IDEAL
AD5307/AD5317/AD5327
GAIN ERROR
+
+
OUTPUT
VOLTAGE
POSITIVE
OFFSET
ERROR
DAC CODE
Figure 5. Transfer Function with Positive Offset (V
= VDD)
REF
OFFSET ERROR
UPPER DEADBAND CODES
ACTUAL
IDEAL
FULL SCALE
Figure 4. Transfer Function with Negative Offset
REV. A
–9–
Page 10
AD5307/AD5317/AD5327–Typical Performance Characteristics
GAIN ERROR
TEMPERATURE (ⴰC)
ERROR (% FSR)
1.0
0.5
–1.0
40 0 40
0
–0.5
VDD = 5V V
REF
= 2V
OFFSET ERROR
80 120
1.0
TA = 25ⴗC V
= 5V
DD
0.5
0
INL ERROR (LSB)
–0.5
–1.0
050 250100 150 200
CODE
TPC 1. AD5307 Typical INL Plot
0.3 TA = 25ⴗC
= 5V
V
DD
0.2
0.1
0
–0.1
DNL ERROR (LSB)
–0.2
3
TA = 25ⴗC V
= 5V
DD
2
1
0
–1
INL ERROR (LSB)
–2
–3
0 200 1000
400 600 800
CODE
TPC 2. AD5317 Typical INL Plot
0.6 TA = 25ⴗC
= 5V
V
DD
0.4
0.2
0
–0.2
DNL ERROR (LSB)
–0.4
12
TA = 25ⴗC
= 5V
V
DD
8
4
0
–4
INL ERROR (LSB)
–8
–12
0 40001000 2000 3000
CODE
TPC 3. AD5327 Typical INL Plot
1.0 TA = 25ⴗC
= 5V
V
DD
0.5
0
DNL ERROR (LSB)
–0.5
–0.3
050 250100 150 200
CODE
TPC 4. AD5307 Typical DNL Plot
0.50
VDD = 5V
= 25ⴗC
T
A
0.25
0
ERROR (LSB)
–0.25
–0.50
01 5234
MAX INL
MIN DNL
MIN INL
V
REF
(V)
TPC 7. AD5307 INL and DNL Error vs. V
REF
MAX DNL
–0.6
2000
CODE
600400
800 1000
TPC 5. AD5317 Typical DNL Plot
0.5
VDD = 5V
0.4
0.3
0.2
0.1
–0.1
ERROR (LSB)
–0.2
–0.3
–0.4
–0.5
= 3V
V
REF
0
40 0 40
MAX INL
MAX DNL
TEMPERATURE (ⴰC)
MIN DNL
MIN INL
80 120
TPC 8. AD5307 INL Error and DNL Error vs. Temperature
–1.0
10000
2000
CODE
3000 4000
TPC 6. AD5327 Typical DNL Plot
TPC 9. AD5307 Offset Error and Gain Error vs. Temperature
REV. A–10–
Page 11
AD5307/AD5317/AD5327
0.2 TA = 25C
0.1
–0.1
–0.2
–0.3
ERROR (% FSR)
–0.4
–0.5
–0.6
= 2V
V
REF
0
01 3
GAIN ERROR
OFFSET ERROR
25
VDD (V)
46
TPC 10. Offset Error and Gain Error vs. V
600
500
400
300
(A)
DD
I
200
DD
–40C
+25C
+105C
5
5V SOURCE
3V SOURCE
3
(V)
OUT
V
2
1
0
01 3446
SINK/SOURCE CURRENT (mA)
TPC 11. V
5V SINK
25
Source and Sink
OUT
3V SINK
Current Capability
0.5
0.4
0.3
(A)
DD
I
0.2
–40ⴗC
+25ⴗC
600
500
400
300
(A)
DD
I
200
100
0
ZERO SCALE
CODE
TPC 12. Supply Current vs. DAC Code
800
DECREASING
700
INCREASING
600
(A)
DD
I
500
VDD = 5V
TA = 25C
= 5V
V
DD
= 2V
V
REF
FULL SCALE
TA = 25ⴗC
100
0
3.0 3.5 4.0 4.5 5.0 5.5
2.5 VDD (V)
TPC 13. Supply Current vs. Supply Voltage
T
= 25ⴗC
A
5µs
= 5V
V
DD
= 5V
V
REF
CH1
V
A
OUT
SCLK
CH2
CH1 1V, CH2 5V, TIME BASE= 1␮s/DIV
TPC 16. Half-Scale Settling (1/4 to 3/4 Scale Code Change)
0.1
0
2.5 3.0
4.0
VDD (V)
+105ⴗC
4.5 5.53.5 5.0
TPC 14. Power-Down Current vs. Supply Voltage
TA = 25ⴗC
= 5V
V
DD
= 2V
V
REF
CH1
V
DD
V
CH2
CH1 2.00V, CH2 200mV, TIME BASE = 200s/DIV
OUT
A
TPC 17. Power-On Reset to 0 V
400
300
01
INCREASING
DECREASING
VDD = 3V
23 4 V
(V)
LOGIC
TPC 15. Supply Current vs. Logic Input Voltage for SCLK and DIN Increasing and Decreasing
TA = 25ⴗC
= 5V
V
DD
= 2V
V
REF
CH1
V
A
OUT
CH2
PD
CH1 500mV, CH2 5.00V, TIME BASE = 1␮s/DIV
TPC 18. Exiting Power-Down to Midscale
5
REV. A
–11–
Page 12
AD5307/AD5317/AD5327
V
= 3V
DD
V
FREQUENCY
350 400 500 550450 600
IDD (A)
TPC 19. IDD Histogram with V
= 3 V and VDD = 5 V
DD
0.02
VDD = 5V
= 25C
T
A
0.01
0
DD
= 5V
2.50
2.49
(V)
OUT
V
2.48
2.47 1s/DIV
TPC 20. AD5327 Major-Code Transition Glitch Energy
1mV/DIV
10
0
–10
–20
dB
–30
–40
–50
–60
10
100 1k 10k 100k 1M 10M
FREQUENCY (Hz)
TPC 21. Multiplying Bandwidth (Small-Signal Frequency Response)
–0.01
FULL-SCALE ERROR (V)
–0.02
01 3
25
V
46
(V)
REF
TPC 22. Full-Scale Error vs. V
REF
150ns/DIV
TPC 23. DAC-to-DAC Crosstalk
REV. A–12–
Page 13
AD5307/AD5317/AD5327
TO OUTPUT AMPLIFIER
R
R
R
R
R

FUNCTIONAL DESCRIPTION

The AD5307/AD5317/AD5327 are quad resistor-string DACs fabricated on a CMOS process with resolutions of 8, 10, and 12 bits respectively. Each contains four output buffer amplifiers and is written to via a 3-wire serial interface. They operate from
impedance it presents to the voltage source driving it. How­ever, if the unbuffered mode is used, the user can have a reference voltage as low as 0.25 V and as high as V
DD
since there is no restriction due to headroom and footroom of the reference amplifier.
single supplies of 2.5 V to 5.5 V, and the output buffer amplifiers provide rail-to-rail output swing with a slew rate of 0.7 V/ms. DACs A and B share a common reference input, V DACs C and D share a common reference input, V
REF
REF
AB.
CD. Each reference input may be buffered to draw virtually no current from the reference source, or unbuffered to give a reference input range from 0.25 V to V
. The devices have a
DD
power-down mode in which all DACs may be turned off completely with a high impedance output.

Digital-to-Analog Section

The architecture of one DAC channel consists of a resistor-string DAC followed by an output buffer amplifier. The voltage at the
pin provides the reference voltage for the corresponding
V
REF
DAC. Figure 6 shows a block diagram of the DAC architecture. Since the input coding to the DAC is straight binary, the ideal output voltage is given by
VD
¥
V
OUT
REF
=
N
2
where:
D = decimal equivalent of the binary code that is loaded to the DAC register:
0–255 for AD5307 (8 bits) 0–1023 for AD5317 (10 bits) 0–4095 for AD5327 (12 bits)
N = DAC resolution
V
AB
REF
REFERENCE
BUF
BUFFER
GAIN MODE
(GAIN = 1 OR 2)
If there is a buffered reference in the circuit (e.g., REF192), there is no need to use the on-chip buffers of the AD5307/AD5317/ AD5327. In unbuffered mode, the input impedance is still large at typically 90 kW per reference input for 0 V to V 45 kW for 0 V to 2 V
The buffered/unbuffered option is controlled by the BUF bit in the data-word. The BUF bit setting applies to whichever DAC is selected.
Output Amplifier
The output buffer amplifier is capable of generating output voltages to within 1 mV of either rail. Its actual range depends on the value of V
If a gain of 1 is selected (GAIN = 0), the output range is 0.001 V to V
.
REF
If a gain of 2 is selected (GAIN = 1), the output range is 0.001 V to 2 V
. Because of clamping, however, the maximum output
REF
is limited to V
The output amplifier is capable of driving a load of 2 kW to GND or V
DD
Figure 7. Resistor String
mode and
mode.
REF
, GAIN, offset error, and gain error.
REF
– 0.001 V.
DD
REF
, in parallel with 500 pF to GND or VDD. The
source and sink capabilities of the output amplifier can be seen
INPUT
REGISTER
DAC
REGISTER
RESISTOR
STRING
OUTPUT
BUFFER AMPLIFIER
V
OUT
Figure 6. Single DAC Channel Architecture

Resistor String

The resistor string section is shown in Figure 7. It is simply a string of resistors, each of value R. The digital code loaded to the DAC register determines at which node on the string the voltage is tapped off to be fed into the output amplifier. The voltage is tapped off by closing one of the switches connecting the string to the amplifier. Because it is a string of resistors, it is guaranteed monotonic.

DAC Reference Inputs

There is a reference pin for each pair of DACs. The reference inputs are buffered but can also be individually configured as unbuffered. The advantage with the buffered input is the high
in the plot in TPC 11.
A
The slew rate is 0.7 V/ms with a half-scale settling time to ±0.5 LSB (at eight bits) of 6 ms.

POWER-ON RESET

The AD5307/AD5317/AD5327 are provided with a power-on reset function so that they power up in a defined state. The power-on state is
Normal operationReference inputs unbuffered0 V to V
output range
REF
Output voltage set to 0 V
Both input and DAC registers are filled with zeros and remain so until a valid write sequence is made to the device. This is particularly useful in applications where it is important to know the state of the DAC outputs while the device is powering up.
REV. A
–13–
Page 14
AD5307/AD5317/AD5327

SERIAL INTERFACE

The AD5307/AD5317/AD5327 are controlled over a versatile 3-wire serial interface that operates at clock rates up to 30 MHz and is compatible with SPI, QSPI, MICROWIRE, and DSP interface standards.

Input Shift Register

The input shift register is 16 bits wide. Data is loaded into the device as a 16-bit word under the control of a serial clock input, SCLK. The timing diagram for this operation is shown in Figure 2. The 16-bit word consists of four control bits followed by 8, 10, or 12 bits of DAC data, depending on the device type. Data is loaded MSB first (Bit 15), and the first two bits determine whether the data is for DAC A, DAC B, DAC C, or DAC D. Bits 13 and 12 control the operating mode of the DAC. Bit 13 is GAIN, which determines the output range of the part. Bit 12 is BUF, which controls whether the reference inputs are buffered or unbuffered.
Table I. Address Bits for the AD53x7
A1 (Bit 15) A0 (Bit 14) DAC Addressed
00 DAC A 01 DAC B 10 DAC C 11 DAC D

Control Bits

GAIN Controls the output range of the addressed DAC.
0: Output range of 0 V to V 1: Output range of 0 V to 2 V
REF
.
REF
.
BUF Controls whether reference of the addressed DAC
is buffered or unbuffered. 0: Unbuffered reference. 1: Buffered reference.
The AD5327 uses all 12 bits of DAC data; the AD5317 uses 10 bits and ignores the 2 LSB. The AD5307 uses eight bits and ignores the last four bits. The data format is straight binary, with all 0s corresponding to 0 V output and all 1s corresponding to full-scale output (V
– 1 LSB).
REF
The SYNC input is a level-triggered input that acts as a frame synchronization signal and chip enable. Data can be transferred into the device only while SYNC is low. To start the serial data transfer, SYNC should be taken low, observing the minimum SYNC to SCLK falling edge setup time, t
. After SYNC goes low,
4
serial data will be shifted into the device’s input shift register on the falling edges of SCLK for 16 clock pulses. In standalone mode (DCEN = 0), any data and clock pulses after the 16th falling edge of SCLK will be ignored and no further serial data transfer will occur until SYNC is taken high and low again.
SYNC may be taken high after the falling edge of the 16th SCLK pulse, observing the minimum SCLK falling edge to SYNC rising edge time, t
.
7
After the end of serial data transfer, data will automatically be transferred from the input shift register to the input register of the selected DAC. If SYNC is taken high before the 16th falling edge of SCLK, the data transfer will be aborted and the DAC input registers will not be updated.
BIT 15 (MSB)
A1 BUF
GAINA0
D7 D6 D5 D4 D3 D2 D1 D0 XXXX
DATA BITS
Figure 8. AD5307 Input Shift Register Contents
BIT 15 (MSB)
A1 BUF
GAINA0
D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
DATA BITS
Figure 9. AD5317 Input Shift Register Contents
BIT 15 (MSB)
A1 BUF
GAINA0 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0D10D11
DATA BITS
Figure 10. AD5327 Input Shift Register Contents
BIT 0 (LSB)
BIT 0 (LSB)
XX
BIT 0 (LSB)
REV. A–14–
Page 15
AD5307/AD5317/AD5327
When data has been transferred into the input register of a DAC, the corresponding DAC register and DAC output can be updated by taking LDAC low. CLR is an active low, asynchro­nous clear that clears the input registers and DAC registers to all 0s.

Low Power Serial Interface

To minimize the power consumption of the device, the interface powers up fully only when the device is being written to, i.e., on the falling edge of SYNC. The SCLK and DIN input buffers are powered down on the rising edge of SYNC.

Daisy-Chaining

For systems that contain several DACs, or where the user wishes to read back the DAC contents for diagnostic purposes, the SDO pin may be used to daisy-chain several devices together and provide serial readback.
By connecting the DCEN (daisy-chain enable) pin high, the daisy-chain mode is enabled. It is tied low in the case of stand­alone mode. In daisy-chain mode, the internal gating on SCLK is disabled. The SCLK is continuously applied to the input shift register when SYNC is low. If more than 16 clock pulses are applied, the data ripples out of the shift register and appears on the SDO line. This data is clocked out on the rising edge of SCLK and is valid on the falling edge. By connecting this line to the DIN input on the next DAC in the chain, a multi-DAC interface is constructed. Sixteen clock pulses are required for each DAC in the system. Therefore, the total number of clock cycles must equal 16N, where N is the total number of devices in the chain. When the serial transfer to all devices is complete, SYNC should be taken high. This prevents any further data from being clocked into the input shift register.
A continuous SCLK source may be used if it can be arranged that SYNC is held low for the correct number of clock cycles. Alternatively, a burst clock containing the exact number of clock cycles may be used and SYNC may be taken high some time later.
When the transfer to all input registers is complete, a common LDAC signal updates all DAC registers and all analog outputs are updated simultaneously.

Double-Buffered Interface

The AD5307/AD5317/AD5327 DACs have double-buffered interfaces consisting of two banks of registers: input registers and DAC registers. The input registers are connected directly to the input shift register and the digital code is transferred to the relevant input register on completion of a valid write sequence. The DAC registers contain the digital code used by the resistor strings.
Access to the DAC registers is controlled by the LDAC pin. When the LDAC pin is high, the DAC registers are latched and the input registers may change state without affecting the contents of the DAC registers. When LDAC is brought low, however, the DAC registers become transparent and the contents of the input registers are transferred to them.
The double-buffered interface is useful if the user requires simulta­neous updating of all DAC outputs. The user may write to three of the input registers individually and then, by bringing LDAC low when writing to the remaining DAC input register, all outputs will update simultaneously.
These parts contain an extra feature whereby a DAC register is not updated unless its input register has been updated since the last time LDAC was brought low. Normally, when LDAC is brought low, the DAC registers are filled with the contents of the input registers. In the case of the AD5307/AD5317/AD5327, the part will update the DAC register only if the input register has been changed since the last time the DAC register was updated, thereby removing unnecessary digital crosstalk.

Load DAC Input (LDAC)

LDAC transfers data from the input registers to the DAC registers (and, therefore, updates the outputs). Use of the LDAC function enables double-buffering of the DAC data, GAIN, and BUF. There are two LDAC modes:
Synchronous Mode: In this mode, the DAC registers are updated after new data is read in on the falling edge of the 16th SCLK pulse. LDAC can be tied permanently low or pulsed as in Figure 2.
Asynchronous Mode: In this mode, the outputs are not updated at the same time that the input registers are written to. When LDAC goes low, the DAC registers are updated with the con­tents of the input register.

POWER-DOWN MODE

The AD5307/AD5317/AD5327 have low power consumption, typically dissipating 1.2 mW with a 3 V supply and 2.5 mW with a 5 V supply. Power consumption can be further reduced when the DACs are not in use by putting them into power­down mode, which is selected by taking the PD pin low.
When the PD pin is high, all DACs work normally with a typical power consumption of 500 mA at 5 V (400 mA at 3 V). However, in power-down mode, the supply current falls to 300 nA at 5 V (90 nA at 3 V) when all DACs are powered down. Not only does the supply current drop, but the output stage is also inter­nally switched from the output of the amplifier, making it an open circuit. This has the advantage that the output is three­state while the part is in power-down mode and provides a defined input condition for whatever is connected to the output of the DAC amplifier. The output stage is illustrated in Figure 11.
The bias generator, the output amplifiers, the resistor string, and all other associated linear circuitry are shut down when the power-down mode is activated. However, the contents of the registers are unaffected when in power-down. In fact, it is pos­sible to load new data to the input registers and DAC registers during power-down. The DAC outputs will update as soon as PD goes high. The time to exit power-down is typically 2.5 ms
= 5 V and 5 ms when VDD = 3 V. This is the time from
for V
DD
the rising edge of PD to when the output voltage deviates from its power-down voltage. See TPC 18 for a plot.
AMPLIFIER
RESISTOR
STRING DAC
POWER-DOWN
CIRCUITRY
Figure 11. Output Stage during Power-Down
V
OUT
REV. A
–15–
Page 16
AD5307/AD5317/AD5327
MICROPROCESSOR INTERFACING ADSP-2101/ADSP-2103 to AD5307/AD5317/AD5327 Interface
Figure 12 shows a serial interface between the AD5307/AD5317/ AD5327 and the ADSP-2101/ADSP-2103. The ADSP-2101/ ADSP-2103 should be set up to operate in the SPORT transmit alternate framing mode. The ADSP-2101/ADSP-2103 sport is programmed through the SPORT control register and should be configured as follows: internal clock operation, active low framing, 16-bit word length. Transmission is initiated by writing a word to the Tx register after the SPORT has been enabled. The data is clocked out on each rising edge of the DSP’s serial clock and clocked into the AD5307/AD5317/AD5327 on the falling edge of the DAC’s SCLK.
ADSP-2101/
ADSP-2103*
TFS
DT
SCLK
*ADDITIONAL PINS OMITTED FOR CLARITY
AD5307/ AD5317/
AD5327*
SYNC
DIN
SCLK
Figure 12. ADSP-2101/ADSP-2103 to AD5307/ AD5317/AD5327 Interface

68HC11/68L11 to AD5307/AD5317/AD5327 Interface

Figure 13 shows a serial interface between the AD5307/AD5317/ AD5327 and the 68HC11/68L11 microcontroller. SCK of the 68HC11/68L11 drives the SCLK of the AD5307/AD5317/ AD5327, while the MOSI output drives the serial data line (DIN) of the DAC. The SYNC signal is derived from a port line (PC7). The setup conditions for correct operation of this interface are as follows: the 68HC11/68L11 should be config­ured so that its CPOL bit is a 0 and its CPHA bit is a 1. When data is being transmitted to the DAC, the SYNC line is taken low (PC7). When the 68HC11/68L11 is configured as above, data appearing on the MOSI output is valid on the falling edge of SCK. Serial data from the 68HC11/68L11 is transmitted in 8-bit bytes with only eight falling clock edges occurring in the transmit cycle. Data is transmitted MSB first. To load data to the AD5307/AD5317/AD5327, PC7 is left low after the first eight bits are transferred, and a second serial write operation is performed to the DAC; PC7 is taken high at the end of this procedure.

80C51/80L51 to AD5307/AD5317/AD5327 Interface

Figure 14 shows a serial interface between the AD5307/AD5317/ AD5327 and the 80C51/80L51 microcontroller. The setup for the interface is as follows: TxD of the 80C51/80L51 drives SCLK of the AD5307/AD5317/AD5327, while RxD drives the serial data line of the part. The SYNC signal is again derived from a bit programmable pin on the port. In this case, port line P3.3 is used. When data is to be transmitted to the AD5307/ AD5317/AD5327, P3.3 is taken low. The 80C51/80L51 trans­mits data only in 8-bit bytes; thus only eight falling clock edges occur in the transmit cycle. To load data to the DAC, P3.3 is left low after the first eight bits are transmitted, and a second write cycle is initiated to transmit the second byte of data. P3.3 is taken high following the completion of this cycle. The 80C51/ 80L51 outputs the serial data in a format that has the LSB first. The AD5307/AD5317/AD5327 requires its data with the MSB as the first bit received. The 80C51/80L51 transmit routine should take this into account.
80C51/80L51*
P3.3
TxD
RxD
*ADDITIONAL PINS OMITTED FOR CLARITY
AD5307/ AD5317/
AD5327*
SYNC
SCLK
DIN
Figure 14. 80C51/80L51 to AD5307/AD5317/AD5327 Interface

MICROWIRE to AD5307/AD5317/AD5327 Interface

Figure 15 shows an interface between the AD5307/AD5317/ AD5327 and any MICROWIRE compatible device. Serial data is shifted out on the falling edge of the serial clock, SK, and is clocked into the AD5307/AD5317/AD5327 on the rising edge of SK, which corresponds to the falling edge of the DAC’s SCLK.
MICROWIRE*
CS
SK
SO
AD5307/ AD5317/
AD5327*
SYNC
SCLK
DIN
68HC11/68L11*
PC7
SCK
MOSI
*ADDITIONAL PINS OMITTED FOR CLARITY
AD5307/ AD5317/
AD5327*
SYNC
SCLK
DIN
Figure 13. 68HC11/68L11 to AD5307/AD5317/ AD5327 Interface
*ADDITIONAL PINS OMITTED FOR CLARITY
Figure 15. MICROWIRE to AD5307/AD5317/AD5327 Interface
REV. A–16–
Page 17
AD5307/AD5317/AD5327
APPLICATIONS Typical Application Circuit
The AD5307/AD5317/AD5327 can be used with a wide range of reference voltages where the devices offer full, one-quadrant multiplying capability over a reference range of 0.25 V to V
DD
. More typically, these devices are used with a fixed, precision reference voltage. Suitable references for 5 V operation are the AD780 and REF192 (2.5 V references). For 2.5 V operation, a suitable external reference would be the AD589, a 1.23 V band gap reference. Figure 16 shows a typical setup for the AD5307/ AD5317/AD5327 when using an external reference.
= 2.5V TO 5.5V
V
DD
V
IN
V
OUT
EXT REF
AD780/REF192 WITH VDD = 5V
OR AD589 WITH
= 2.5V
V
DD
0.1␮F
1F
SERIAL
INTERFACE
10␮F
V
AB
REF
V
REF
AD5307/AD5317/
SCLK
DIN
SYNC
CD
AD5327
GND
V
V
A
OUT
B
OUT
V
C
OUT
V
D
OUT
Figure 16. AD5307/AD5317/AD5327 Using a 2.5 V External Reference

Driving VDD from the Reference Voltage

If an output range of 0 V to VDD is required when the reference inputs are configured as unbuffered, the simplest solution is to connect the reference input to V
. As this supply may be noisy
DD
and not very accurate, the AD5307/AD5317/AD5327 may be powered from the reference voltage, for example, using a 5 V reference such as the REF195. The REF195 will output a steady supply voltage for the AD5307/AD5317/AD5327. The typical current required from the REF195 is 500 mA supply current and ª 112 mA into the reference inputs (if unbuffered). This is with no load on the DAC outputs. When the DAC outputs are loaded, the REF195 also needs to supply the current to the loads. The total current required (with a 10 kW load on each output) is
612 4 5 10 2 6mAVk mA+
()
=/.W
The load regulation of the REF195 is typically 2 ppm/mA, which results in an error of 5.2 ppm (26 mV) for the 2.6 mA current drawn from it. This corresponds to a 0.0013 LSB error at eight bits and 0.021 LSB error at 12 bits.

Bipolar Operation Using the AD5307/AD5317/AD5327

The AD5307/AD5317/AD5327 have been designed for single­supply operation, but a bipolar output range is also possible using the circuit in Figure 17. This circuit will give an output voltage range of ± 5 V. Rail-to-rail operation at the amplifier output is achievable using an AD820 or an OP295 as the output amplifier.
The output voltage for any input code can be calculated as follows:
È
REFIN D R R
()
OUT
Í
=
Í
R REFIN R R
121–/
Î
V
N
¥
¥+
212
()
¥
()
˘ ˙ ˙
˚
where:
D is the decimal equivalent of the code loaded to the DAC. N is the DAC resolution. REFIN is the reference voltage input.
with REFIN = 5 V, R1 = R2 = 10 kW:
5V
V
DD
AD5327
AB
CD
SCLK
SERIAL
INTERFACE
N
R1
10k
V
OUT
V
OUT
V
OUT
V
OUT
SYNC
R2
10k
+5V
A
–5V
B
C
D
AD820/ OP295
5V
V
IN
REF195
V
GND
6V TO 16V
10␮F
OUT
VDV
10 2 5/–
()
OUT
0.1␮F
AD5307/AD5317/
V
1F
REF
V
REF
GND
DIN
Figure 17. Bipolar Operation with the AD5307/ AD5317/AD5327
REV. A
–17–
Page 18
AD5307/AD5317/AD5327

Opto-Isolated Interface for Process Control Applications

The AD5307/AD5317/AD5327 have a versatile 3-wire serial interface, making them ideal for generating accurate voltages in process control and industrial applications. Due to noise, safety requirements, or distance, it may be necessary to isolate the AD5307/AD5317/AD5327 from the controller. This can easily be achieved by using opto-isolators that will provide isolation in excess of 3 kV. The actual data rate achieved may be limited by the type of optocouplers chosen. The serial loading structure of the AD5307/AD5317/AD5327 makes them ideally suited for use in opto-isolated applications. Figure 18 shows an opto-isolated interface to the AD5307/AD5317/AD5327 where DIN, SCLK, and SYNC are driven from optocouplers. The power supply to the part also needs to be isolated. This is done by using a transformer. On the DAC side of the transformer, a 5 V regulator provides the 5 V supply required for the AD5307/AD5317/AD5327.
5V
POWER
SCLK
SYNC
DIN
10k
10k
10k
REGULATOR
V
DD
SCLK
V
DD
SYNC
V
DD
DIN
DCEN
AD5307
V
DD
GND
10␮F
0.1␮F
V
AB
REF
V
CD
REF
A
V
OUT
V
B
OUT
V
C
OUT
V
D
OUT
Figure 18. AD5307 in an Opto-Isolated Interface

Decoding Multiple AD5307/AD5317/AD5327s

The SYNC pin on the AD5307/AD5317/AD5327 can be used in applications to decode a number of DACs. In this application, all the DACs in the system receive the same serial clock and serial data, but only the SYNC to one of the devices will be active at any one time, allowing access to four channels in this 16-channel system. The 74HC139 is used as a 2-to-4 line decoder to address any of the DACs in the system. To prevent timing errors from occurring, the enable input should be brought to its inactive state while the coded address inputs are changing state. Figure 19 shows a diagram of a typical setup for decoding multiple AD5307 devices in a system.
AD5307
V
SCLK
DIN
ENABLE
CODED
ADDRESS
1G
1A
1B
V
DD
V
CC
74HC139
DGND
1Y0
1Y1
1Y2 1Y3
SYNC
DIN SCLK
SYNC
DIN SCLK
SYNC
DIN SCLK
AD5307
AD5307
A
OUT
V
B
OUT
V
C
OUT
V
D
OUT
V
A
OUT
V
B
OUT
V
C
OUT
V
D
OUT
V
A
OUT
V
B
OUT
V
C
OUT
V
D
OUT
AD5307
V
A
OUT
V
B
SYNC
DIN SCLK
OUT
V
C
OUT
V
D
OUT
Figure 19. Decoding Multiple AD5307 Devices in a System

AD5307/AD5317/AD5327 as a Digitally Programmable Window Detector

A digitally programmable upper/lower limit detector using two of the DACs in the AD5307/AD5317/AD5327 is shown in Figure 20. The upper and lower limits for the test are loaded to DACs A and B, which, in turn, set the limits on the CMP04. If the signal at the V
input is not within the programmed window,
IN
an LED will indicate the fail condition. Similarly, DACs C and D can be used for window detection on a second V
V
REF
SYNC
DIN
SCLK
5V
0.1␮F 10␮F
V
AB
REF
V
CD
REF
AD5307/AD5317/
AD5327
SYNC
DIN
SCLK
GND
V
IN
V
DD
A
V
OUT
1/2
CMP04
B
V
OUT
signal.
IN
1k
FAIL
PASS/FAIL
1/6 74HC05
1k
PASS
Figure 20. Window Detection
REV. A–18–
Page 19
AD5307/AD5317/AD5327

Daisy-Chaining

For systems that contain several DACs, or where the user wishes to read back the DAC contents for diagnostic purposes, the SDO pin may be used to daisy-chain several devices together and provide serial readback. Figure 3 shows the timing diagram for daisy-chain applications. The daisy-chain mode is enabled by connecting DCEN high. See Figure 21.
68HC11*
MOSI
SCK
PC7
PC6
MISO
DIN
SCLK
SYNC
LDAC
SCLK
SYNC
LDAC
SCLK
SYNC
LDAC
AD5307*
DCEN
SDO
DIN
AD5307*
DCEN
SDO
DIN
AD5307*
DCEN
SDO

Power Supply Bypassing and Grounding

In any circuit where accuracy is important, careful consideration of the power supply and ground return layout helps to ensure the rated performance. The printed circuit board on which the AD5307/AD5317/AD5327 is mounted should be designed so that the analog and digital sections are separated and confined to certain areas of the board. If the AD5307/AD5317/AD5327 is in a system where multiple devices require an AGND-to-DGND connection, the connection should be made at one point only. The star ground point should be established as close as possible to the device. The AD5307/AD5317/AD5327 should have ample supply bypassing of 10 mF in parallel with 0.1 mF on the supply located as close to the package as possible, ideally right up against the device. The 10 mF capacitors are the tantalum bead type. The 0.1 mF capacitor should have low effective series resistance (ESR) and effective series inductance (ESI), like the common ceramic types that provide a low impedance path to ground at high frequencies to handle transient currents due to internal logic switching.
The power supply lines of the AD5307/AD5317/AD5327 should use as large a trace as possible to provide low impedance paths and reduce the effects of glitches on the power supply line. Fast switching signals such as clocks should be shielded with digital ground to avoid radiating noise to other parts of the board, and should never be run near the reference inputs. Avoid crossover of digital and analog signals. Traces on opposite sides of the board should run at right angles to each other. This reduces the effects of feedthrough through the board. A microstrip technique is by far the best, but is not always possible with a double-sided board. In this technique, the component side of the board is dedicated to ground plane while signal traces are placed on the solder side.
*ADDITIONAL PINS OMITTED FOR CLARITY
Figure 21. AD5307 in Daisy-Chain Mode
REV. A
–19–
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AD5307/AD5317/AD5327
Table II. Overview of AD53xx Serial Devices
No. of Settling
Part No. Resolution DACs DNL Interface Time (␮s) Package Pins
SINGLES
AD5300 8 1 ± 0.25 SPI 4 SOT-23, MSOP 6, 8 AD5310 10 1 ± 0.5 SPI 6 SOT-23, MSOP 6, 8 AD5320 12 1 ± 1.0 SPI 8 SOT-23, MSOP 6, 8
AD5301 8 1 ± 0.25 2-Wire 6 SOT-23, MSOP 6, 8 AD5311 10 1 ± 0.5 2-Wire 7 SOT-23, MSOP 6, 8 AD5321 12 1 ± 1.0 2-Wire 8 SOT-23, MSOP 6, 8
DUALS
AD5302 8 2 ± 0.25 SPI 6 MSOP 8 AD5312 10 2 ± 0.5 SPI 7 MSOP 8 AD5322 12 2 ± 1.0 SPI 8 MSOP 8
AD5303 8 2 ± 0.25 SPI 6 TSSOP 16 AD5313 10 2 ± 0.5 SPI 7 TSSOP 16 AD5323 12 2 ± 1.0 SPI 8 TSSOP 16
QUADS
AD5304 8 4 ± 0.25 SPI 6 MSOP 10 AD5314 10 4 ± 0.5 SPI 7 MSOP 10 AD5324 12 4 ± 1.0 SPI 8 MSOP 10
AD5305 8 4 ± 0.25 2-Wire 6 MSOP 10 AD5315 10 4 ± 0.5 2-Wire 7 MSOP 10 AD5325 12 4 ± 1.0 2-Wire 8 MSOP 10
AD5306 8 4 ± 0.25 2-Wire 6 TSSOP 16 AD5316 10 4 ± 0.5 2-Wire 7 TSSOP 16 AD5326 12 4 ± 1.0 2-Wire 8 TSSOP 16
AD5307 8 4 ± 0.25 SPI 6 TSSOP 16 AD5317 10 4 ± 0.5 SPI 7 TSSOP 16 AD5327 12 4 ± 1.0 SPI 8 TSSOP 16
OCTALS
AD5308 8 8 ± 0.25 SPI 6 TSSOP 16 AD5318 10 8 ± 0.5 SPI 7 TSSOP 16 AD5328 12 8 ± 1.0 SPI 8 TSSOP 16
Visit www.analog.com/support/standard_linear/selection_guides/AD53xx.html for more information.
Table III. Overview of AD53xx Parallel Devices
Part No. Resolution DNL V SINGLES BUF GAIN HBEN CLR
AD5330 8 ± 0.25 1 6 ✓✓ TSSOP 20 AD5331 10 ± 0.5 1 7 ✓✓TSSOP 20 AD5340 12 ± 1.0 1 8 ✓✓ TSSOP 24 AD5341 12 ± 1.0 1 8 ✓✓ ✓ ✓ TSSOP 20
DUALS
AD5332 8 ± 0.25 2 6 TSSOP 20 AD5333 10 ± 0.5 2 7 ✓✓ TSSOP 24 AD5342 12 ± 1.0 2 8 ✓✓ TSSOP 28 AD5343 12 ± 1.0 1 8 ✓✓ TSSOP 20
QUADS
AD5334 8 ± 0.25 2 6 ✓✓TSSOP 24 AD5335 10 ± 0.5 2 7 ✓✓ TSSOP 24 AD5336 10 ± 0.5 4 7 ✓✓TSSOP 28 AD5344 12 ± 1.0 4 8 TSSOP 28
Pins Settling Time (s) Additional Pin Functions Package Pins
REF
REV. A–20–
Page 21
AD5307/AD5317/AD5327

OUTLINE DIMENSIONS

16-Lead Thin Shrink Small Outline Package [TSSOP]
(RU-16)
Dimensions shown in millimeters
5.10
5.00
4.90
0.15
0.05
4.50
4.40
4.30
PIN 1
16
0.65
BSC
COPLANARITY
COMPLIANT TO JEDEC STANDARDS MO-153AB
0.10
0.30
0.19
9
81
1.20 MAX
6.40 BSC
SEATING
PLANE
0.20
0.09
0.75
8 0
0.60
0.45

Revision History

Location Page
8/03—Data Sheet changed from REV. 0 to REV. A.
Added A Version . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .Universal
Changes to FEATURES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Changes to SPECIFICATIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Changes to ABSOLUTE MAXIMUM RATINGS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Changes to ORDERING GUIDE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Changes to TPC 21 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Added OCTALS section to Table II . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Updated OUTLINE DIMENSIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
REV. A
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C02067–0–8/03(A)
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