FEATURES
250 MHz Operation
Driver/Comparator Included
52-Lead LQFP Package with Built-in Heat Sink
APPLICATIONS
Automatic Test Equipment
Semiconductor Test Systems
Board Test Systems
Instrumentation and Characterization Equipment
PRODUCT DESCRIPTION
The AD53033 is a single chip that performs the pin electronics
functions of driver and comparator (D-C) in ATE VLSI and
memory testers.
The driver is a proprietary design that features three active
states: Data High Mode, Data Low Mode and Term Mode as
well as an Inhibit State. This facilitates the implementation of
high speed active termination. The output voltage range is –3 V
to +8 V to accommodate a wide variety of test devices. The
output leakage is typically less than 250 nA over the entire signal range.
The dual comparator, with an input range equal to the driver
output range, features built-in latches and ECL-compatible
outputs. The outputs are capable of driving 50 Ω signal lines
terminated to –2 V. Signal tracking capability is upwards of
5 V/ns.
Also included on the chip is an onboard temperature sensor
whose purpose is to give an indication of the surface tempera-
ture of the D-C. This information can be used to measure θ
and θ
or flag an alarm if proper cooling is lost. Output from the
JA
JC
on a Single Chip
AD53033
FUNCTIONAL BLOCK DIAGRAM
VCCVCCV
515239404132
47
VH
45
VTERM
37
DATA
38
DATAB
IOD
43
42
IODB
49
RLD
50
RLDB
31
V
L
HCOMP
LEH
LEHB
QH
QHB
QL
QLB
LEL
LELB
LCOMP
PWRGNDECLGNDHQGND2
NC = NO CONNECT
sensor is a current sink that is proportional to absolute tempera-
ture. The gain is trimmed to a nominal value of 1.0 µA/K. As
an example, the output current can be sensed by using a 10 kΩ
resistor connected from +10 V to the THERM (IOUT) pin. A
voltage drop across the resistor will be developed that equals:
10K × 1 µA/K = 10 mV/K = 2.98 V at room temperature.
VEEVEEVEEV
CC
DRIVER
COMPARATOR
2, 5, 89, 33, 44, 46, 48
AD53033
50V
1.0mA/K
EE
VHDCPL
V
OUT
VLDCPL
NC
THERM
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
(All specifications are at TJ = +85ⴗC ⴞ 5ⴗC, +VS = +12 V ⴞ 3%, –VS = –7 V = ⴞ3% unless otherwise noted. All temperature coefficients are
measured at TJ = +75ⴗC to +95ⴗC). CHDCPL = CLDCPL = 39 nF.
ParameterMinTypMaxUnitsTest Conditions
DIFFERENTIAL INPUT CHARACTERISTICS
(DATA to DATA, IOD to IOD, RLD to RLD)
Input Voltage–20V
Differential Input RangeECL
Bias Current–250+250µAV
REFERENCE INPUTS
Bias Currents–50+50µAV
OUTPUT CHARACTERISTICS
Logic High Range–28VDATA = H, VH = –2 V to +8 V
Logic Low Range–35VDATA = L, VL = –3 V to +5 V, VH = +6 V
Amplitude (VH and VL)0.19VVL = 0.0 V, VH = +0.1 V, VT = 0 V
Absolute AccuracyVL = –2 V, VH = +7 V, VT = 0 V
VH Offset–50+50mVDATA = H, VH = 0 V, VL = –3 V, VT = +3 V
VH Gain + Linearity Error0.3 – 5+0.3 + 5% of VH + mVDATA = H, VH = –2 V to +8 V, VL = –3 V, VT = +3 V
VL Offset–50+50mVDATA = L, VL = –3 V, VH = +6 V, VT = +7.5 V
VL Gain + Linearity Error–0.3 – 5+0.3 + 5% of VL + mVDATA = L, VL = 0 V , VH = +6 V, VT = +7.5 V
Offset TC0.5mV/°CV
Output Resistance
V
= –2 V444648ΩV
H
V
= +8 V444648ΩV
H
V
= –3 V444648ΩV
L
V
= +5 V444648ΩV
L
V
= +3 V46ΩV
H
Dynamic Current Limit100mAC
Static Current Limit–85+85mAOutput to –3 V, VH = +8 V, VL = –1 V, VT = 0 V
V
TERM
Voltage Range–38.0VTERM MODE, VT = –3 V to +8 V, VL = 0 V, VH = 3 V
V
Delay Time, Active to Inhibit1.54.0nsMeasured at 50%, VH = +2 V, VL = –2 V
Delay Time, Inhibit to Active1.53.5nsMeasured at 50%, VH = +2 V, VL = –2 V
Delay Time Matching (Z)±2.2nsZ = Delay Time Active to Inhibit Test (Above)—
I/O Spike<200mV, p-pVH = 0 V, VL = 0 V
Rise, Fall Time, Active to Inhibit3.5nsVH = +2 V, VL = –2 V (Measured 20%/80% of 1 V Output)
Rise, Fall Time, Inhibit to Active2.2nsVH = +2 V, VL = –2 V (Measured 20%/80% of 1 V Output)
DYNAMIC PERFORMANCE , V
Delay Time, VH to V
Delay Time, VL to V
Delay Time, V
TERM
to VH and V
TERM
TERM
TERM
TERM
to V
3.0nsMeasured at 50%, VL = VH = +0.4 V, V
5.0nsMeasured at 50%, VL = VH = +0.4 V, V
L
4.0nsMeasured at 50%, VL = VH = +0.4 V, V
Overshoot and Preshoot–3.0 + 75+3.0 + 75 % of Step + mVVH/VL, V
V
Mode Rise Time4.0nsVL, VH = 0 V, V
TERM
V
Mode Fall Time5.5nsVL, VH = 0 V, V
TERM
PSRR, DRIVE or TERM Mode35dBVS = V
Specifications subject to change without notice.
Delay Time Inhibit to Active Test (Above)
(Of Worst Two Edges)
TERM
TERM
= (+0.4 V, –0.4 V), (0.0 V, –2.0 V),
TERM
TERM
(0.0 V, +7.0 V)
= –2 V, 20%–80%
TERM
= –2 V, 20%–80%
TERM
± 3%
S
= –0.4 V
= –0.4 V
= –0.4 V
COMPARATOR SPECIFICATIONS
(All specifications are at TJ = +85ⴗC ⴞ 5ⴗC, +VS = +12 V ⴞ 3%, –VS = –7 V = ⴞ3% unless otherwise noted. All temperature coefficients are
measured at TJ = +75ⴗC to +95ⴗC).
ParameterMinTypMaxUnitsTest Conditions
DC INPUT CHARACTERISTICS
Offset Voltage (VOS)–2525mVCMV = 0 V
Offset Voltage (Drift)50µV/°CCMV = 0 V
HCOMP, LCOMP Bias Current–5050µAV
Voltage Range (VCM)–38.0V
Differential Voltage (V
)9.0V
DIFF
Gain and Linearity–0.050.05% FSRVIN = –3 V to +8 V
LATCH ENABLE INPUTS
Logic “1” Current (I
Logic “0” Current (I
)250µALE, LE = –0.8 V
IH
)–250µALE, LE = –1.8 V
IL
DIGITAL OUTPUTS
Logic “1” Voltage (V
Logic “0” Voltage (V
)–0.98VQ or Q, 50 Ω to –2 V
OH
)–1.5VQ or Q, 50 Ω to –2 V
OL
Slew Rate1V/ns
SWITCHING PERFORMANCE
Propagation Delay
Input to Output0.92.5nsVIN = 2 V p-p,
Latch Enable to Output2nsHCOMP = +1 V, LCOMP = +1 V
Equivalent Input Rise Time450psVIN = 0 V to 3 V, 3 V/ns
Pulsewidth Linearity<±200psV
Settling Time<25nsSettling to ±8 mV, V
Latch Timing
Input Pulsewidth<1.5ns
Setup Time<1.0ns
Hold Time<1.0ns
Specifications subject to change without notice.
= 0 V
IN
= 0 V to 5 V
IN
= 0 V to 5 V
IN
= 1.0 V/ns
IN
= 0 V to 3 V, 3 V/ns, PW = 3 ns–8 ns
IN
= 1 V to 0 V
IN
–3–REV. 0
Page 4
AD53033–SPECIFICATIONS
TOTAL FUNCTION SPECIFICATIONS
(All specifications are at TJ = +85ⴗC ⴞ 5ⴗC, +VS = +12 V ⴞ 3%, –VS = –7 V = ⴞ3% unless otherwise noted. All temperature coefficients are
measured at TJ = +75ⴗC to +95ⴗC).
ParameterMinTypMaxUnitsTest Conditions
OUTPUT CHARACTERISTICS
Output Leakage Current, V
Output Leakage Current, V
Output Capacitance6pFDriver INHIBITED
POWER SUPPLIES
Total Supply Range19V
Positive Supply12V
Negative Supply–7V
Positive Supply Current178mADriver = Active
Negative Supply Current195mADriver = Active
Total Power Dissipation3.5WDriver = Active
Temperature Sensor Gain Factor0.711.4µA/KR
NOTES
Connecting or shorting the decoupling pins to ground will result in the destruction of the device.
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Absolute maximum limits apply
individually, not in combination. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Output short circuit protection to ground is guaranteed as long as proper heat
sinking is employed to ensure compliance with the operating temperature limits.
3
To ensure lead coplanarity (±0.002 inches) and solderability, handling with bare
hands should be avoided and the device should be stored in environments at 24 °C±5°C (75°F ± 10°F) with relative humidity not to exceed 65%.
3
. . . . . . . . . . +260°C
Table III. Package Thermal Characteristics
Air Flow, FMJA, ⴗC/W
2
033
20025
40022
ORDERING GUIDE
Shipment Method
PackageQuantity perPackage
ModelDescriptionShipping ContainerOption
AD53033JSTP52-Lead LQFP-EDQUAD90SQ-52
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD53033 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
–5–REV. 0
Page 6
AD53033
PIN CONFIGURATION
V
ECLGND
QLB
QL
ECLGND
QHB
QH
ECLGND
PWRGND
LELB
LEL
LEHB
LEH
CC
CC
V
V
52 51 50 49 4843 42 41 4047 46 45 44
1
CC
PIN 1
IDENTIFIER
2
3
4
5
6
7
8
9
10
11
12
13
14 15 16 17 18 19 20 21 22 23 24 25 26
PWRGND
RLDB
RLD
AD53033
HEAT SINK UP
(Not to Scale)
VH
NC
THERM
LCOMP
HCOMP
VHDCPL
HQGND2
VTERM
PWRGND
OUT
V
VLDCPL
PWRGND
NCNCNCNCNC
IOD
IODB
EE
EE
V
V
39
V
EE
38
DATAB
37
DATA
36
NC
35
NC
34
NC
PWRGND
33
32
V
EE
31
V
L
30
NC
29
NC
28
NC
27
NC
NC = NO CONNECT
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
52-Lead LQFP–EDQUAD with Integral Heat Slug
(SQ-52)
0.030 (0.75)
0.024 (0.60)
0.018 (0.45)
SEATING
PLANE
0.063 (1.60)
MAX
5240
1
0.630 (16.00) SQ
0.551 (14.00) SQ
C3517–2–2/99
39
STANDOFF
0.004 (0.10)
MAX
TOP VIEW
(PINS DOWN)
13
14
0.006 (0.15)
0.002 (0.05)
0.008 (0.20)
0.004 (0.09)
0.039 (1.00)
BSC
0.020 (0.50)
0.017 (0.42)
0.014 (0.35)
CENTER FIGURES ARE TYPICAL UNLESS OTHERWISE NOTED
–6–
27
26
0.057 (1.45)
0.055 (1.40)
0.053 (1.35)
0.270
(6.86)
DIA
78
3.58
08
PRINTED IN U.S.A.
REV. 0
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