400 MSPS sample rate
SNR of 63 dBFS @128 MHz
SFDR of 70 dBFS @128 MHz
VSWR of 1:1.5
Wideband ac-coupled input signal conditioning
Enhanced spurious-free dynamic range
Single-ended or differential encode signal
LVDS output levels
Twos complement output data
APPLICATIONS
Communications test equipment
Radar and satellite subsystems
Phased array antennas—digital beam forming
Multichannel, multimode receivers
Secure communications
Wireless and wired broadband communications
Wideband carrier frequency systems
GENERAL DESCRIPTION
The AD12400 is a 12-bit analog-to-digital converter with a
transformer-coupled analog input and digital post processing
for enhanced SFDR. The product operates at a 400 MSPS
conversion rate with outstanding dynamic performance in
wideband carrier systems.
A/D Converter
AD12400
FUNCTIONAL BLOCK DIAGRAM
DATA
AD12400
ADC
A
POST-
A
IN
CLK DISTRIBUTION
ADC
B
CLOCK DISTRIBUTION
DIVIDE BY 2
ENCENC
Figure 1.
PROCESSING
PRODUCT HIGHLIGHTS
1. Guaranteed sample rate of 400 MSPS.
2. Input signal conditioning with optimized dynamic
The AD12400 requires 3.8 V analog, 3.3 V digital, and 1.5 V
digital supplies and provides a flexible encode signal that can be
differential or single-ended. No external reference is required.
The AD12400 package style is an enclosed 2.9" × 2.6" × 0.6"
module. Performance is rated over a 0°C to 60°C case
temperature range.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
4. Proprietary Advanced Filter Bank™ digital post processing
AD12400JWS AD12400KWS
Parameter Case Temp Test Level Min Typ Max Min Typ Max Unit
RESOLUTION 12 12 Bits
ACCURACY
No Missing Codes Full IV Guaranteed Guaranteed
Offset Error Full I −12 +12 −12 +12 LSB
Gain Error @ 10 MHz Full I −10 +10 −10 +10 %FS
Differential Nonlinearity
(DNL)
Integral Nonlinearity (INL) 60°C V 0.5 0.5 LSB
TEMPERATURE DRIFT
Gain Error 60°C V 0.02 0.02 %/°C
ANALOG INPUT (AIN)
Full-Scale Input Voltage
Range
Frequency Range Full IV 10 180 10 180 MHz
Flatness (10 MHz-180 MHz) Full IV 0.5 1 0.5 1 dB
Input VSWR (50 Ω )
(10 MHz–180 MHz)
Analog Input Bandwidth 60°C V 450 450 MHz
POWER SUPPLY1
Supply Voltage
VA Full IV 3.6 3.8 3.6 3.8 V
VC Full IV 3.2 3.4 3.2 3.4 V
VD Full IV 1.475 1.575 1.475 1.575 V
Supply Current
IVA (VA = 3.8 V) Full I 0.95 1.11 0.95 1.11 A
IVC (VC = 3.3 V) Full I 400 500 400 500 mA
IVD (VD = 1.5 V) Full I 1.4 1.8 1.4 1.8 A
Total Power Dissipation Full I 7.0 8.5 7.0 8.5 W
ENCODE INPUTS2
Differential Inputs (ENC,
ENC
)
Input Voltage Range Full IV 0.4 0.4 V
Input Resistance 60°C V 100 100 Ω
Input Capacitance 60°C V 4 4 pF
Common-Mode Voltage 60°C V ±3 ±3 V
Single-Ended Inputs (ENC)
Input Voltage Full IV 0.4 2 2.5 0.4 2 2.5 V p-p
Input Resistance 60°C V 50 50 Ω
LOGIC INPUTS (
Logic 1 Voltage Full IV 2.0 2.0 V
Logic 0 Voltage Full IV 0.8 0.8 V
Source IIH 60°C V 10 10 µA
Source IIL 60°C V 1 1 mA
LOGIC OUTPUTS
(DRA, DRB, Output Bits)4
Differential Output Voltage Full IV 247 454 247 454 mV
RESET
)3
60°C V 0.3 0.3 LSB
60°C V 3.2 3.2 V p-p
60°C V 1.5 1.5
≤ 60°C, unless otherwise noted.
CASE
Rev. 0 | Page 3 of 28
Page 4
AD12400
AD12400JWS AD12400KWS
LOGIC OUTPUTS
Output Drive Current Full IV −4 +4 −4 +4 mA
Output Common-Mode
Voltage
Start-Up Time Full IV 600 600 ms
1
Tested using input frequency of 70 MHz. See Figure 17 for I(VD) variation vs. input frequency.
2
All ac specifications tested by driving ENC single-ended.
3
Refer to Table 5 for logic convention on all logic inputs.
AD12400JWS AD12400KWS
Parameter Case Temp Test Level Min Typ Max Min Typ Max Unit
DYNAMIC PERFORMANCE2
SNR
Analog Input 10 MHz Full I 62 64.4 62 64.4 dBFS
@ −1.0 dBFS 70 MHz Full I 61.5 64 61.5 64 dBFS
128 MHz Full I 60 63.5 60 63.5 dBFS
180 MHz Full I 60 62.5 60 62.5 dBFS
SINAD3
Analog Input 10 MHz Full I 61 64 61 64 dBFS
@ −1.0 dBFS 70 MHz Full I 60.5 64 60.5 64 dBFS
128 MHz Full I 59 62.5 59 62.5 dBFS
180 MHz Full I 57 61 57 61 dBFS
Spurious-Free Dynamic Range3
Analog Input 10 MHz Full I 69 80 69 80 dBFS
@ −1.0 dBFS 70 MHz Full I 69 84 69 84 dBFS
128 MHz Full I 67 76 67 76 dBFS
180 MHz Full I 62 71 62 71 dBFS
Image Spur4
Analog Input 10 MHz Full I 60 75 62 75 dBFS
@ −1.0 dBFS 70 MHz Full I 60 72 62 72 dBFS
128 MHz Full I 56 70 62 70 dBFS
180 MHz Full I 54 70 62 70 dBFS
Offset Spur4 60°C V 65 65 dBFS
Analog Input @ −1.0 dBFS
Two-Tone IMD5
F1, F2 @ −6 dBFS 60°C V −75 −75 dBc
SWITCHING SPECIFICATIONS
Conversion Rate6 Full IV 396 400 404 396 400 404 MSPS
Encode Pulsewidth High (tEH)1 60°C V 1.25 1.25 ns
Encode Pulsewidth Low (tEL)1 60°C V 1.25 1.25 ns
DIGITAL OUTPUT PARAMETERS
Valid Time (tV) Full IV 1.9 2.4 3.1 1.9 2.4 3.1 ns
Propagation Delay (tPD) 60°C V 1.20 1.20 ns
Rise Time (tR) (20% to 80%) 60°C V 1 1 ns
Fall Time (tF) (20% to 80%) 60°C V 1 1 ns
Full IV 1.125 1.375 1.125 1.375 V
= 8 pF. 3.3 V LVDS R1 = 100 Ω.
LOAD
1
≤ 60°C, unless otherwise noted.
CASE
Rev. 0 | Page 4 of 28
Page 5
AD12400
AD12400JWS AD12400KWS
Parameter Case Temp Test Level Min Typ Max Min Typ Max Unit
DR Propagation Delay (t
Data to DR Skew (t
Pipeline Latency7 Full IV 40 40 Cycles
Aperture Delay (tA) 60°C V 1.6 1.6 ns
Aperture Uncertainty (Jitter, tJ) 60°C V 0.4 0.4 ps rms
1
All ac specifications tested with a single-ended 2.0 V p-p ENCODE.
2
Dynamic performance guaranteed for analog input frequencies of 10 MHz to 180 MHz.
3
Not including image spur.
4
Image spur will be at fs/2–A
5
F1 = 70 MHz, F2 = 73 MHz.
6
Parts are tested with 400 MSPS encode. Device can be clocked at lower encode rates, but specifications are not guaranteed. Specifications will be guaranteed by
design for encode 400 MSPS ± 1%.
7
Pipeline latency will be exactly 40 cycles.
EXPLANATION OF TEST LEVELS
I 100% production tested.
II 100% production tested at 25°C and sample tested at specified temperatures.
III Sample tested only.
IV Parameter is guaranteed by design and characterization testing.
V Parameter is a typical value only.
VI
100% production tested at 25°C; guaranteed by design and characterization testing for industrial temperature range; 100%
production tested at temperature extremes for military devices.
) 60°C V 3.88 3.88 ns
EDR
− tPD) 60°C V 2.68 2.68 ns
EDR
and the offset spur will be at fs/2.
IN
Rev. 0 | Page 5 of 28
Page 6
AD12400
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Value
VA to AGND 5 V
VC to DGND 4 V
VD to DGND 1.65 V
Analog Input Voltage 6 V (DC)
Analog Input Power 18 dBm (AC)
Encode Input Voltage 6 V (DC)
Encode Input Power 12 dBm (AC)
Logic Inputs and Outputs to DGND 5 V
Storage Temperature Range, Ambient −65°C to +150°C
Operating Temperature 0°C to 60°C
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may
affect device reliability.
Table 5. Option Pin List With Necessary Associated Circuitry
Active
High or
Pin Name
RESET
Low
Low LVTTL High 3.74 kΩ Pull-Up
LEAD/LAG Low LVTTL Low
Logic
Level
Typ e
Default
Level
Associated
Circuitry
Within Part
10 kΩ − 60 kΩ
Pull-Down
3.3V
100Ω
100Ω
100Ω
100Ω
PECL
DRIVER
03735-0-003
ENCODE
ENCODE
3.3V
Figure 2. Encode Equivalent Circuit
ENCODE
400MHZ
DATA OUT A
DATA OUT
LEAD LAG
DATA OUT
N– 1
N + 1
N + 2
N + 3
t
EL
t
EH
DRA
DRA
DRB
DRB
*DATA LOST DUE TO ASSERTION OF LEAD/LAG. LATENCY OF 40 ENCODE CLOCK CYCLES BEFORE DATA VALID.
NOTES:
1 IF A SINGLE-ENDED SINEWAVE IS USED FOR ENCODE, USE THE "ZERO CROSSING" POINT (AC-COUPLED) AS THE 50%
POINT AND APPLY THE SAME TIMING INFORMATION.
2 THE LEAD/LAG PIN IS USED TO SYNCHRONIZE THE COLLECTION OF DATA INTO EXTERNAL BUFFER MEMORIES. THE
LEAD/LAG PIN CAN BE APPLIED SYNCHRONOUSLY OR ASYNCHRONOUSLY TO THE AD12400. IF APPLIED
ASYNCHRONOUSLY, LEAD/LAG MUST BE HELD HIGH FOR A MINIMUM OF 5ns TO ENSURE CORRECT OPERATION. THE
FUNCTION WILL SHUT OFF DRA AND DRB UNTIL THE LEAD/LAG PIN IS RELEASED. DRA AND DRB WILL RESUME ON THE
NEXT VALID DRA AFTER LEAD/LAG IS RELEASED.
1/f
S
40 CLOCK CYCLES
N – 40
N – 39
NNN + 2
N + 1
*
N + 4N + 6N + 8
*
N + 3N + 5N + 7
Figure 3. Timing Diagram
t
ENC
ENC
DR
DR
PD
t
V
Figure 4. Highlighted Timing Diagram
03735-0-002
03735-0-004
Rev. 0 | Page 7 of 28
Page 8
AD12400
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
AIN
ENC
ENC
TOP VIEW
JOHNSON SMA-50 OHM CONNECT NO. 142-0711-821
2-56 STUDS 4×
END VIEW
SAMTEC CONNECTOR
QTE-060-01-L-D-A-K-TR
ENC
ENC
AIN
BOTTOM VIEW
NOTES
FOR MATING HALF, USE SAMTEC, INC.
PART NO. QSE-60-01-L-D-A-K.
*INTEGRAL GROUND PLANE CONNECTIONS.
SECTION A = DGND, PINS 121–124.
SECTION B = DGND, PINS 125–128.
SECTION C = AGND, PINS 129–132.
PIN 1
BOARD
LEFT SIDE VIEW
Figure 5. Pin Configuration
PIN 119
PIN 79
PIN 39
PIN 1
VA
VA
VA
VA
AGND
AGND
DNC
DNC
DNC
DNC
DNC
DNC
AGND
AGND
AGND
AGND
AGND
AGND
AGND
AGND
6−9, 11, 13−16, DNC Do Not Connect.
49, 51−52, 79,
96−108
10
12 DRB Channel B Data Ready. True output.
17 DB11− Channel B Data Bit 11. Complement output bit.
18 DB10− Channel B Data Bit 10. Complement output bit.
19 DB11+ Channel B Data Bit 11. True output bit.
20 DB10+ Channel B Data Bit 10. True output bit.
21 DB9− Channel B Data Bit 9. Complement output bit.
22 DB8− Channel B Data Bit 8. Complement output bit.
23 DB9+ Channel B Data Bit 9. True output bit.
24 DB8+ Channel B Data Bit 8. True output bit.
25 DB7− Channel B Data Bit 7. Complement output bit.
26 DB6− Channel B Data Bit 6. Complement output bit.
27 DB7+ Channel B Data Bit 7. True output bit.
28 DB6+ Channel B Data Bit 6. True output bit.
29 DB5− Channel B Data Bit 5. Complement output bit.
30 DB4− Channel B Data Bit 4. Complement output bit.
31 DB5+ Channel B Data Bit 5. True output bit.
32 DB4+ Channel B Data Bit 4. True output bit.
33 DB3− Channel B Data Bit 3. Complement output bit.
34 DB2− Channel B Data Bit 2. Complement output bit.
35 DB3+ Channel B Data Bit 3. True output bit.
36 DB2+ Channel B Data Bit 2. True output bit.
37 DB1− Channel B Data Bit 1. Complement output bit.
38 DB0− Channel B Data Bit 0. Complement output bit. DB0 is LSB.
39 DB1+ Channel B Data Bit 1. True output bit.
40 DB0+ Channel B Data Bit 0. True output bit. DB0 is LSB.
41−48 VD Digital Supply, +1.5 V.
50 PASS LVTTL. Factory use only. (DNC)
53 DA11− Channel A Data Bit 11. Complement output bit.
54 DA10− Channel A Data Bit 10. Complement output bit.
55 DA11+ Channel A Data Bit 11. True output bit.
56 DA10+ Channel A Data Bit 10. True output bit.
57 DA9− Channel A Data Bit 9. Complement output bit.
58 DA8− Channel A Data Bit 8. Complement output bit.
59 DA9+ Channel A Data Bit 9. True output bit.
60 DA8+ Channel A Data Bit 8. True output bit.
61 DA7− Channel A Data Bit 7. Complement output bit.
62 DA6− Channel A Data Bit 6. Complement output bit.
63 DA7+ Channel A Data Bit 7. True output bit.
64 DA6+ Channel A Data Bit 6. True output bit.
65 DA5− Channel A Data Bit 5. Complement output bit.
66 DA4− Channel A Data Bit 4. Complement output bit.
67 DA5+ Channel A Data Bit 5. True output bit.
RESET
DRB
LVTTL. 0 = Device Reset. Minimum Width = 200 ns. Device resumes operation after 600 ms maximum.
Channel B Data Ready. Complement output.
Rev. 0 | Page 9 of 28
Page 10
AD12400
Pin Number Mnemonic Function
68 DA4+ Channel A Data Bit 4. True output bit.
69 DA3− Channel A Data Bit 3. Complement output bit.
70 DA2− Channel A Data Bit 2. Complement output bit.
71 DA3+ Channel A Data Bit 3. True output bit.
72 DA2+ Channel A Data Bit 2. True output bit.
73 DA1− Channel A Data Bit 1. Complement output bit.
74 DA0− Channel A Data Bit 0. Complement output bit. DA0 is LSB.
75 DA1+ Channel A Data Bit 1. True output bit.
76 DA0+ Channel A Data Bit 0. True output bit. DA0 is LSB.
77 LEAD/LAG Typically DNC. See LEAD/LAG note on Page 17.
78
80 DRA Channel A Data Ready. True output.
81−95, 109−112,
129−132* AGND Analog Ground.
113−120 VA Analog Supply, 3.8 V
121−128* DGND Digital Ground.
*Internal Ground Plane Connections: Section A = DGND, Pins 121−124, Section B = DGND, Pins 125−128, Section C = AGND, Pins 129−132.
DRA
Channel A Data Ready. Complement output.
Rev. 0 | Page 10 of 28
Page 11
AD12400
DEFINITIONS OF SPECIFICATIONS
Analog Bandwidth
The analog input frequency at which the spectral power of the
fundamental frequency (as determined by the FFT analysis) is
reduced by 3 dB.
Aperture Delay
The delay between the 50% point on the rising edge of the
ENCODE command and the instant at which the analog input
is sampled.
Aperture Uncertainty (Jitter)
The sample-to-sample variation in aperture delay.
Full-Scale Input Voltage Range
This is the maximum peak-to-peak input signal magnitude that
will result in a full-scale response, 0 dBFS on a single-tone input
signal case. Any magnitude increase from this value will result
in an over-range condition.
Analog Input VSWR (50 Ω)
The Voltage Standing Wave Ratio is a ratio of the transmitted
and reflected signals. The VSWR can be related to input
impedance using the following equations:
−
Z
Z
L
=Γ
VSWR
Z
L
Z
S
S
+
Z
Z
L
S
1
Γ−
=
1
Γ+
=
=
Impedance LoadActual
Impedance Reference
Differential Nonlinearity
The deviation of any code width from an ideal 1 LSB step.
Effective Number of Bits (ENOB)
Calculated from the measured SNR based on the equation
−
ENOB
=
MEASURED
76.1dBSNR
02.6
Encode Pulsewidth/Duty Cycle
Pulsewidth high is the minimum amount of time the ENCODE
pulse should be left in Logic 1 state to achieve rated perform-
ance; pulsewidth low is the minimum time the ENCODE pulse
should be left in low state. See timing implications of changing
in the Application Notes, Encode Input section. At a
t
ENCH
specified clock rate of 400 MSPS, these specifications define an
acceptable ENCODE duty cycle.
Full-Scale Input Power
Expressed in dBm. Computed using the following equation:
2
POWER
⎛
V
−
⎜
=
−
SCALEFULL
log10
⎜
Z
INPUT
⎝
⎞
SCALErmsFULL
⎟
⎟
()
001.0
⎠
Gain Error
The difference between the measured and ideal full-scale input
voltage range of the ADC.
Harmonic Distortion, Second
The ratio of the RMS signal amplitude to the RMS value of the
second harmonic component, reported in dBFS.
Harmonic Distortion, Third
The ratio of the RMS signal amplitude to the RMS value of the
third harmonic component, reported in dBFS.
Distortion, Image Spur
The ratio of the RMS signal amplitude to the RMS signal
amplitude of the image spur, reported in dBFS. The image spur,
a result of gain and phase errors between two time-interleaved
conversion channels, is located at fs/2 – f
AIN
.
Distortion, Offset Spur
The ratio of the RMS signal amplitude to the RMS signal
amplitude of the offset spur, reported in dBFS. The offset spur, a
result of offset errors between two time-interleaved conversion
channels, is located at fs/2.
Integral Nonlinearity
The deviation of the transfer function from a reference line
measured in fractions of 1 LSB using a “best straight line”
determined by a least square curve fit.
Minimum Conversion Rate
The minimum ENCODE rate at which the image spur
calibration will degrade no more than 1 dB (when image
spur is 70 dB).
Maximum Conversion Rate
The maximum ENCODE rate at which the image spur
calibration will degrade no more than 1 dB (when image
spur is 70 dB).
Output Propagation Delay
The delay between a differential crossing of ENCODE and
ENCODE
(or zero crossing of a single-ended ENCODE).
Total Noise
Calculated as follows:
−−
SIGNALSNRFS
10
⎞
dBFSdBcdBm
⎟
⎠
NOISE
⎛
⎜
⎝
××=
ZV
10001.0
where Z is the input impedance, FS is the full scale of the device
for the frequency in question, SNR is the value of the particular
input level, and SIGNAL is the signal level within the ADC
reported in dB below full scale. This value includes both
thermal and quantization noise.
Rev. 0 | Page 11 of 28
Page 12
AD12400
Offset Error
The DC offset imposed on the input signal by the ADC,
reported in LSB (codes).
Pipeline Latency
The number of clock cycles that the output data will lag the
corresponding clock cycle.
Power Supply Rejection Ratio
The ratio of power supply voltage change to the resulting ADC
output voltage change.
Signal-to-Noise-and-Distortion (SINAD)
The ratio of the RMS signal amplitude (set 1 dB below full
scale) to the RMS value of the sum of all other spectral
components, including harmonics but excluding DC and image
spur.
Signal-to-Noise Ratio (SNR)
The ratio of the RMS signal amplitude (set at 1 dB below full
scale) to the RMS value of the sum of all other spectral
components, excluding the first five harmonics and DC.
Spurious-Free Dynamic Range (SFDR)
The ratio of the RMS signal amplitude to the RMS value of the
peak spurious spectral component, except the image spur. The
peak spurious component may or may not be a harmonic. May
be reported in dBc (i.e., degrades as signal level is lowered) or
dBFS (always related back to converter full-scale).
Two-Tone Intermodulation Distortion Rejection
The ratio of the RMS value of either input tone to the RMS
value of the worst third-order intermodulation product;
reported in dBc.
Two-Tone SFDR
The ratio of the RMS value of either input tone to the RMS
value of the peak spurious component. The peak spurious
component may or may not be an IMD product. May be
reported in dBc (i.e., degrades as signal level is lowered) or in
dBFS (always related back to converter full-scale).
Figure 14. 2nd/3rd Harmonics and Image Spur vs. Analog Input Level—
= 400 MSPS, A
f
S
IN
= 70 MHz
2F1 + F2
2F2 + F1
IMAGE SPUR
2F1 – F2
2F2 – F1
03735-0-036
03735-0-012
03735-0-013
95
90
85
80
75
HARMONICS (dBc)
70
65
60
020406080100 120 140 160 180
IMAGE SPUR
THIRD HARMONIC
ANALOG INPUT FREQUENCY (MHz)
SECOND HARMONIC
03735-0-014
Figure 15. Harmonics vs. Analog Input Frequency
64.6
64.4
64.2
64.0
63.8
63.6
SNR (dBFS)
63.4
63.2
63.0
62.8
020406080100 120 140 160 180
ANALOG INPUT FREQUENCY (MHz)
Figure 16. SNR vs. Analog Input Frequency
03735-0-015
2.2
2.1
2.0
1.9
1.8
1.7
1.6
1.5
1.4
VD SUPPLY CURRENT (A)
1.3
1.2
1.1
1.0
020406080 100 120 140 160 180 200
INPUT FREQUENCY (MHz)
Figure 17. +VD Current vs. A
Freque ncy
IN
03735-0-016
Rev. 0 | Page 14 of 28
Page 15
AD12400
THEORY OF OPERATION
The AD12400 uses two high-speed, 12-bit analog-to-digital
converters (ADCs) in a time-interleaved configuration to
double the sample rate, while maintaining a high level of
dynamic range performance. The digital output of each ADC
channel is calibrated using a proprietary digital post processing
technique, Advanced Filter Bank (AFB
Technologies. AFB is implemented using a state-of-the-art Field
Programmable Gate Array (FPGA) and provides a wide
bandwidth, wide temperature match for any gain, phase, and
clock timing errors between each ADC channel.
TIME-INTERLEAVING ADCS
When two ADCs are time-interleaved, gain and/or phase
mismatches between each channel will produce an
at fs/2 – f
mismatches can be the result of any combination of device
tolerance, temperature, and frequency deviations.
.
Figure 18. Image Spur Due to Mismatches between Two Interleaved ADCs
and an Offset Spur as shown in Figure 18. These
AIN
0
–10
–20
–30
–40
–50
–60
dB
–70
–80
–90
–100
–110
–120
020406080 100 120 140 160 180 200
IMAGE SPUR
X
2
5
FREQUENCY (MHz)
(No AFB Digital Post Processing)
TM
), from VCorp
OFFSET SPUR
3
4
Image Spur
1
N
6
03735-0-017
0
–10
–20
–30
–40
–50
–60
dB
–70
–80
–90
–100
–110
–120
020406080 100 120 140 160 180 200
X
IMAGE SPUR
2
5
FREQUENCY (MHz)
OFFSET SPUR
3
1
N
6
4
03735-0-018
Figure 19. AD12400 with AFB Digital Post Processing
The relationship between image spur and channel mismatches
is captured in Table 7 for specific conditions.
Table 7. Image Spur vs. Channel Mismatch
Gain Error
(%)
Aperture Delay Error
(ps)
Image Spur
(dBc)
1 15 –40
0.25 2.7 –54
0.2 1.1 –62
0.025 0.5 –70
For a more detailed description of time-interleaving in ADCs
and a design example using the AD12400, refer to “Advanced
Digital Post-Processing Techniques Enhance Performance in
Time Interleaved ADC Systems,” published in the August, 2003
edition of Analog Dialogue. This article can be found at
http://www.analog.com/analogDialogue.
Figure 19 displays the performance of a similar converter with
on-board, AFB post processing implemented. The –44 dBFS
image spur has been reduced to –77 dBFS and as a result, the
dynamic range of this time-interleaved ADC is no longer
limited by the channel matching.
Rev. 0 | Page 15 of 28
Page 16
AD12400
ANALOG INPUT
The AD12400 analog input is ac-coupled using a proprietary,
transformer front end circuit that provides 1 dB of gain flatness
over the first Nyquist zone and a –3 dB bandwidth of 450 MHz.
This front end circuit provides a VSWR of 1.5 (50 Ω) over the
first Nyquist zone, and the typical full-scale input is 3.2 V p-p
The MiniCircuits HELA-10 amplifier module can be used to
drive the input at these power levels.
CLOCK INPUT
The AD12400 requires a 400 MSPS encode that is divided by 2
and distributed to each ADC channel, 180° out of phase from
each other. Internal ac-coupling and bias networks provide the
framework for flexible clock input requirements that include
single-ended sine-wave, single-ended PECL, and differential
PECL. While the AD12400 is tested and calibrated using a
single-ended sine-wave, properly designed PECL circuits that
provide fast slew rates (>1V/ns) and minimize ringing will
result in comparable dynamic range performance.
There are two major factors to consider when designing the
input clock circuit for the AD12400: aperture jitter and
harmonic content. The relationship between aperture jitter and
SNR can be characterized using the following equation. The
equation assumes a single-tone full-scale input signal.
f
A
t
JRMS
=
N
=ε
V
NOISE
⎡
⎢
⎢
(
02log20
⎢
⎢
⎣
frequency Input
=
=
(LSB) DNL ADC
=
tfSNR
jitter Aperture
(bits) resolution ADC
1
2
)
JRMSA
)(LSB noise input ADC
rms
2
⎛
⎞
⎛
1
⎜
×+××π−=
⎜
N
5.1
2
⎝
22
×
ε+
⎟
⎟
⎠
V
⎜
+
NOISErms
⎜
N
⎜
2
⎝
Figure 20 displays the application of this relationship to fullscale, single-tone input signal on the AD12400, where the DNL
was assumed to be 0.4 LSB, and the input noise was assumed to
be 0.8 LSBrms. The vertical marker at 0.4 ps displays the SNR at
the jitter level present in the AD12400 evaluation system,
including the jitter associated with the AD12400 itself.
⎤
2
⎞
⎥
⎟
⎥
⎟
⎥
⎟
⎠
⎥
⎦
65
64
63
62
61
SNR (dB)
60
59
58
57
00.1 0.2 0.30.4 0.5 0.6 0.70.8 0.9 1.0
APERTURE JITTER (ps rms)
= 180MHz
A
IN
AIN = 10MHz
= 65MHz
A
IN
= 128MHz
A
IN
03735-0-037
Figure 20. SNR vs. Aperture Jitter
In addition to jitter, the harmonic content of single-ended sine
wave clock sources must be controlled as well. The clock source
used in the test and calibration process has a harmonic
performance that is better than 60 dBc. Also, when using PECL
or other square-wave clock sources, unstable behavior such as
overshoot and ringing can affect phase matching and degrade
the image spur performance
DIGITAL OUTPUTS
The AD12400’s digital post processing circuit provides two
parallel, 12-bit 200 MSPS data output buses. By providing two
output busses that operate at one half the conversion rate, the
AD12400 eliminates the need for large, expensive, high power
demultiplexing circuits. The output data format is twos
complement, maintaining the standard set by other high speed
A/D converters such as the AD9430 and AD6645. Data-ready
signals are provided for facilitating proper timing in the data
capture circuit. Finally, the digital post processing circuit can be
configured to provide alternate data output formats. Contact the
factory for more details.
POWER SUPPLIES
The AD12400 requires three different supply voltages: a 1.5 V
supply for the digital post processing circuit, a 3.3 V supply to
facilitate digital I/O through the system, and a 3.8 V supply for
the analog conversion and clock distribution circuits. The
AD12400 incorporates two key features that result in solid
power supply rejection ratio (PSRR) performance. First, onboard linear regulators are used to provide an extra level of
power supply rejection for the analog circuits. The linear
regulator used to supply the A/D converters provides an
additional 60 dB of rejection at 100 kHz. Second, in order to
address higher frequency noise (where the linear regulators’
rejection degrades), the AD12400 incorporates high quality
ceramic decoupling capacitors.
Rev. 0 | Page 16 of 28
Page 17
AD12400
While this product has been designed to provide good PSRR
performance, systems designers need to be aware of the risks
associated with switching power supplies and consider using
linear regulators in their high speed ADC systems. Switching
power supplies typically produce both conducted and radiated
energy that result in common-/differential-mode EMI currents.
Any system that requires 12-bit performance has very little
room for errors associated with power supply EMI. For
example, a system goal of 74 dB dynamic range performance on
the AD12400 will require noise currents that are less than
4.5 µA and noise voltages of less than 225 µV in the analog
input path.
START-UP AND RESET
The AD12400’s FPGA configuration is stored in the on-board
EPROM and loaded into the FPGA when power is applied to
the device. The
the FPGA in case of a low digital supply voltage condition or a
power supply glitch. Pulling the
data ready and output bits high until the FPGA has been
reloaded. The
200 ns. On the rising edge of the reset pulse, the AD12400 will
start loading the configuration into the FPGA. The reload
process requires a maximum of 600 ms to complete. Valid
signals on the data ready pins indicate that the reset process is
complete. Also, system designers need be aware of the thermal
conditions of the AD12400 at start-up. If large thermal
imbalances are present, the AD12400 may require additional
time to stabilize before providing specified image spur
performance.
RESET
pin (active low) allows the user to reload
RESET
pin low will pull the
RESET
pin should remain low for a minimum of
LEAD/LAG
The LEAD/LAG pin is used to synchronize the collection of
data into external buffer memories. The LEAD/LAG pin can be
applied synchronously or asynchronously to the AD12400. If
applied asynchronously, LEAD/LAG must be held high for a
minimum of 5 ns to ensure correct operation. The function will
shut off DRA and DRB until the LEAD/LAG pin is released.
DRA and DRB will resume on the next valid DRA after
LEAD/LAG is released. If this feature is not required, tie this pin
to DGND.
THERMAL CONSIDERATIONS
The module is rated to operate over a case temperature of 0°C
to 60°C. In order to maintain the tight channel matching and
reliability of the AD12400, care must be taken to assure that
proper thermal and mechanical considerations have been made
and addressed to assure case temperature is kept within this
range. Each application will require evaluation of the thermal
management as applicable to the system design. The following
provides information that should be used in the evaluation of
AD12400 thermal management for each specific use.
In addition to the radiation of heat into its environment, the
AD12400 module enables flow of heat through the mounting
studs and standoffs as they contact the motherboard. As
described in the Package Integrity/Mounting Guidelines
section, the module should be secured to the motherboard
using 2-56 nuts (washer use is optional). The torque on the nuts
should not exceed 32 inch ounces. Use of a thermal grease at the
standoffs will result in better thermal coupling between the
board and module. Depending on the ambient conditions, air
flow may be necessary to ensure the components in the module
do not exceed their maximum operating temperature. In terms
of reliability, the most sensitive component has a maximum
junction temperature rating of 125°C.
Figures 21 and 22 provide a basic guideline for two key thermal
management decisions: the use of thermal interface material
between the module bottom cover/mother board and airflow.
Figure 21 characterizes the typical thermal profile of an
AD12400 that is not using thermal interface material. Figure 22
provides the same information for a configuration that uses
gap-filling thermal interface material (in this case Thermagon
T-Flex 600 series, 0.040” thickness was used). One can see from
these profiles that the maximum die temperature is reduced by
approximately 2°C when thermal interface material is used.
Figures 21 and 22 also provide a guideline for determining the
airflow requirements for given ambient conditions. For example,
a goal of 120°C die temperature in a 40°C ambient environment
without the use of thermal interface material would require an
air flow of 100 LFM. See the AD12400 Thermal Management
and Measurement Application Note for further details.
From a channel matching perspective, the most important
consideration will be external thermal influences. It is possible
for thermal imbalances in the end application to adversely affect
the dynamic performance. Due to the temperature dependence
of the image spur, substantial deviation from the factory
calibration conditions can have a detrimental effect.
Unbalanced thermal influences can cause gradients across the
module, and performance degradation may result. Examples of
unbalanced thermal influences may include large heat
dissipating elements near one side of the AD12400 or
obstructed air flow that does not flow uniformly across the
module. The thermal sensitivity of the module can be affected
by a change in thermal gradient across the module of 2°C.
Rev. 0 | Page 17 of 28
Page 18
AD12400
130
120
110
100
90
80
70
60
TEMPERATURE (°C)
50
40
30
20
NO AIR FLOW100 LFM300 LFM
Figure 21. Typical Temperature vs. Air Flow with No Module/Board Interface
Material (Normalized to 60°C Module Case Temperature)
130
120
110
100
90
80
70
60
TEMPERATURE (°C)
50
40
30
20
NO AIR FLOW100 LFM300 LFM
Figure 22. Typical Temperature vs. Air Flow with T-FLEX Module/Board
Interface Material (Normalized to 60°C Module Case Temperature Ambient)
TYPICAL JUNCTION
CASE
AMBIENT
03735-0-019
AIRFLOW CONDITION
TYPICAL JUNCTION
CASE
AMBIENT
03735-0-020
AIRFLOW CONDITION
PACKAGE INTEGRITY/MOUNTING GUIDELINES
The AD12400 is a printed circuit board (PCB) based module
designed to provide mechanical stability and support the
intricate channel-to-channel matching necessary to achieve
high dynamic range performance. The module should be
secured to the motherboard using 2-56 nuts (washer use is
optional). The torque on the nuts should not exceed 32 inch
ounces.
The SMA edge connectors (AIN, ENC/ENC) are surface
mounted to the board in order to achieve minimum height of
the module. When attaching and routing the cables, one must
ensure they are stress-relieved and do not apply stress to the
SMA connector/board. The presence of stress on the cables may
degrade electrical performance and mechanical integrity of the
module. In addition to the routing precautions, the smallest
torque necessary to achieve consistent performance should be
used to secure the system cable to the AD12400’s SMA
connectors. In no case should the torque exceed 5 inch pounds.
Any disturbances to the AD12400 structure, including
removing the covers or mounting screws, will invalidate the
calibration and result in degraded performance. Refer to the
Outline Dimensions section for mounting stud dimensions.
Refer also to Figure 37 for PCB interface locations. Mounting
stud length will typically accommodate a PCB thickness of
0.093". Consult the factory if board thickness requirements
exceed this dimension.
Rev. 0 | Page 18 of 28
Page 19
AD12400
AD12400 EVALUATION KIT
The AD12400/KIT offers an easy way to evaluate the AD12400.
The AD12400/KIT includes the AD12400KWS mounted on an
adapter card, the AD12400 evaluation board, the power supply
cables, a 225 MHz Buffer Memory FIFO board, and the Dual
Analyzer software. The user must supply a clock source, an
analog input source, a 1.5 V power supply, a 3.3 V power supply,
a 5 V power supply, and a 3.8 V power supply. The clock source
and analog input source connect directly to the AD12400KWS.
The power supply cables (included) and a parallel port cable
(not included) connect to the evaluation board.
Power Connector
Power is supplied to the board via a detachable 12-lead power
strip (three 4 pin blocks).
Table 8. Power Connector
VA 3.8 V Analog supply for the ADC (950 mA typical)
VC 3.3 V
VD 1.5 V*
VB 5.0 V
*The power supply cable has approximately 100 mV drop.
The VD supply current is dependent upon the analog input
frequency. Refer to Figure 17.
Analog Input
The analog input source connects directly to an SMA on the
AD12400KWS.
Encode
The single-ended or differential encode signal connects directly
to SMA connector(s) on the AD12400KWS. A single-ended
sine wave at 10 dBm connected to the Encode SMA is recommended. A low jitter clock source is recommended (<0.5 ps) to
properly evaluate the AD12400.
Digital supply for the ADC outputs (200 mA
typical)
Digital supply for the FPGA (2.5 A max, 1.4 A
typical)
Digital supply for the Buffer memory board
(400 mA typical)
Adapter Card
The AD12400KWS is attached to an adapter card that interfaces
to the evaluation board through a 120-pin connector, P1, which
is on the top side of the evaluation board.
Digital Post Processing Control
The AD12400 has a two-pin jumper labeled AFB that allows the
user to enable/disable the digital post processing. The digital
post processing is active when the AFB jumper is applied. When
the jumper is removed, the FPGA is set to a pass through mode,
which will demonstrate to the user the performance of the
AD12400 without the digital post processing.
RESET
The AD12400KWS’s FPGA configuration is stored in an
EEPROM and loaded into the FPGA when power is applied to
the AD12400. The
user to reload the FPGA in case of a low voltage condition or a
power supply glitch. Depressing the
data ready and output bits high. The
remain low for a minimum of 200 ns. On the rising edge of the
RESET
pulse, the AD12400 will start loading the configuration
into the on-module FPGA. The reload process requires a
maximum of 600 ms to complete. Valid signals on the dataready pins indicate that the reset process is complete.
The AD12400 is not compatible with the HSC-ADC-EVALDC/SC hardware or software.
RESET
switch, SW1 (active low), allows the
RESET
switch will pull the
RESET
switch should
Data Outputs
The AD12400KWS digital outputs are available at the 80-pin
connector, P2, on the evaluation board. The AD12400/KIT
comes with a Buffer Memory FIFO board connected to P2
that provides the interface to the parallel port of a PC. The
Dual Analyzer software is compatible with Windows® 95,
Windows® 98, Windows® 2000, and Windows NT®.
The Buffer Memory FIFO board can be removed and an
external logic analyzer, or other data acquisition module, can be
connected to this connector if required.
The AD12400 requires a different approach to traditional high
speed analog-to-digital converter system layouts. While the
AD12400’s internal PCB isolates digital and analog grounds,
these planes are tied together through the product’s aluminum
case structure. Therefore, the decision of isolating the analog
and digital grounds on the system PCB has additional factors to
consider. For example, if the AD12400 will be attached with
conductive thermal interface material to the system PCB, there
will be essentially no benefit to keeping the analog and digital
ground planes separate. If either no thermal interface material
or nonconductive interface material is used, system architects
will have to consider the ground loop that will be created if
analog and digital planes are tied together directly under the
AD12400. This EMI based decision will have to be considered
on a case-by-case basis and will be largely dependent on the
other sources of EMI in the system. One critical consideration is
that a 12-bit performance requirement (–74 dBc) will require
keeping conducted EMI currents (referenced to the input of the
AD12400) below 4.5 μA. All of the characterization and testing
of the AD12400 was performed using a system that isolated
these ground planes.
If thermal interface material is used in the final system design,
the following layout factors will need to be considered: open
solder mask on the area that contacts the interface material and
the thickness of the ground plane. While this should be
analyzed in each specific system design, the use of solder mask
may negate any advantage achieved by using the thermal
interface material, and its use should be carefully considered.
The ground plane thickness will not have a major impact on the
thermal performance, but if design margin is slight, additional
thickness can yield incremental improvements.
PCB INTERFACE
Figure 37 provides the mounting hole footprint for assembling
the AD12400 to the second-level assembly. The diagram is
referenced to the center of the mating QTE connector. Refer to
the QTE/QSE series connector documentation at
www.samtec.com for the SMT footprint of the mating
connector.
The top view of the second-level assembly footprint provides a
diagram of the second-level assembly locating tab locations for
mating the SAMTEC QTE-060-01-L-A-K-TR terminal strip on
the AD12400BWS to a QSE-060-01-L-A-K-TR socket on the
second-level assembly. The diagram is referenced to the center
of the QTE terminal strip on the AD12400BWS and the
mounting holds for the screws, which will hold the
AD12400BWS to the second-level assembly board. The
relationship of these locating tabs is based on information
provided by SAMTEC (connector supplier) and should be
verified with SAMTEC by the customer.
Mating and unmating forces—the knifing or peeling action of
applying force to one end or one side—must be avoided to
prevent damage to the connector and guidepost.