1M X 36 Bit Synchronous High Speed SRAM with
Preliminary Burst Counter and Pipelined Data Output
Document Title
1M X 36 Bit Synchronous High Speed SRAM with Burst Counter and Pipelined Data
Output
Revision History
Rev. No.
0.0 Initial issue July 25, 2005 Preliminary
History Issue Date Remark
PRELIMINARY (July, 2005, Version 0.0) AMIC Technology, Corp.
Page 2
A63L0636
1M X 36 Bit Synchronous High Speed SRAM with
Preliminary Burst Counter and Pipelined Data Output
Features
Fast access times: 2.6/2.8/3.2/3.5/3.8/4.2 ns
(250/227/200/166/150/133 MH
Single +3.3V+10% or +3.3V-5% power supply
Synchronous burst function
Individual Byte Write control and Global Write
Registered output for pipelined applications
Z)
General Description
The A63L0636E is a high-speed SRAM containing 36M
bits of bit synchronous memory, organized as 1024K
words by 36 bits.
The A63L0636E combines advanced synchronous
peripheral circuitry, 2-bit burst control, input registers,
output registers and a 1MX36 SRAM core to provide a
wide range of data RAM applications.
The positive edge triggered single clock input (CLK)
controls all synchronous inputs passing through the
registers. Synchronous inputs include all addresses (A0 A19), all data inputs (I/O
CE ), two additional chip enables (CE2, CE2 ), burst
(
control inputs (
BWE , BW1 , BW2 , BW3 , BW4 ) and Global Write
(
GW ). Asynchronous inputs include output enable ( OE ),
(
clock (CLK), BURST mode (MODE) and SLEEP mode
(ZZ).
ADSC , ADSP , ADV ), byte write enables
1 - I/O36), active LOW chip enable
Three separate chip enables allow wide range of
options for CE control, address pipelining
Selectable BURST mode
SLEEP mode (ZZ pin) provided
Available in 100-pin LQFP package
Burst operations can be initiated with either the address
status processor (
ADSC ) input pin. Subsequent burst sequence burst
(
addresses can be internally generated by the A63L0636E
and controlled by the burst advance (
cycles are internally self-timed and synchronous with the
rising edge of the clock (CLK).
This feature simplifies the write interface. Individual Byte
PRELIMINARY (July, 2005, Version 0.0) 5 AMIC Technology, Corp.
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A63L0636
Notes: 1. X = "Disregard", H = Logic High, L = Logic Low.
2.
1) Any
2)
3. All inputs except
4. For write cycles that follow read cycles,
HIGH throughout the input data hold time.
5.
more byte write enable signals and
the Write timing diagram for clarification.
WRITE = L means:
BWx (BW1,BW2 ,BW3, or BW4 ) and BWE are low or
GW is low.
OE must be synchronized with setup and hold times around the rising edge (L-H) of CLK.
OE must be HIGH before the input data request setup time and held
ADSP LOW always initiates an internal Read at the L-H edge of CLK. A Write is performed by setting one or
BWE LOW or GW LOW for the subsequent L-H edge of CLK. Refer to
Write Truth Table
Operation
READ H H X X X X
READ H L H H H H
WRITE Byte 1 H L L H H H
WRITE all bytes H L L L L L
WRITE all bytes L X X X X X
GW BWE BW1 BW2 BW3 BW4
PRELIMINARY (July, 2005, Version 0.0) 6 AMIC Technology, Corp.
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A63L0636
Linear Burst Address Table (MODE = LOW)
First Address (External) Second Address (Internal)Third Address (Internal) Fourth Address (Internal)
X . . . X00 X . . . X01 X . . . X10 X . . . X11
X . . . X01 X . . . X10 X . . . X11 X . . . X00
X . . . X10 X . . . X11 X . . . X00 X . . . X01
X . . . X11 X . . . X00 X . . . X01 X . . . X10
Interleaved Burst Address Table (MODE = HIGH or NC)
First Address (External) Second Address (Internal)Third Address (Internal) Fourth Address (Internal)
X . . . X00 X . . . X01 X . . . X10 X . . . X11
X . . . X01 X . . . X00 X . . . X11 X . . . X10
X . . . X10 X . . . X11 X . . . X00 X . . . X01
X . . . X11 X . . . X10 X . . . X01 X . . . X00
Absolute Maximum Ratings*
Power Supply Voltage (VCC) . . . . . . . . . . -0.5V to +4.6V
Voltage Relative to GND for any Pin Except VCC (Vin,
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to this device.
These are stress ratings only. Functional operation of
this device at these or any other conditions above those
indicated in the operational sections of this specification
is not implied or intended. Exposure to the absolute
maximum rating conditions for extended periods may
affect device reliability.
Recommended DC Operating Conditions
(0
°C ≤ TA ≤ 70°C, VCC, VCCQ = 3.3V+10% or 3.3V-5%, unless otherwise noted)
Symbol Parameter Min. Typ. Max. Unit Note
VCC Supply Voltage (Operating Voltage Range) 3.1 3.3 3.6 V
VCCQ Isolated Input Buffer Supply 3.1 3.3 VCC V
GND Supply Voltage to GND 0.0 - 0.0 V
VIHInput High Voltage 2.0 - VCC+0.3 V 1, 2
VIHQInput High Voltage (I/O Pins) 2.0 - VCC+0.3 V
VILInput Low Voltage -0.3 - 0.8 V 1, 2
PRELIMINARY (July, 2005, Version 0.0) 7 AMIC Technology, Corp.
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A63L0636
DC Electrical Characteristics
°C ≤ TA ≤ 70°C, VCC, VCCQ = 3.3V+10% or 3.3V-5%, unless otherwise noted)
(0
Symbol Parameter Min. Max. Unit Test Conditions Note
⏐ILI⏐ Input Leakage Current - ±2.0 µA All inputs VIN = GND to VCC
⏐ILO⏐ Output Leakage Current - ±2.0 µA
CC1
I
Supply Current
-
400
mA
OE = VIH, Vout = GND to VCC
Device selected; VCC = max.
Iout = 0mA, all inputs = VIH or VIL
Cycle time = t
KC min.
Device deselected; VCC = max.
3, 11
All inputs are fixed.
SB1
I
Standby Current
-
180
mA
All inputs ≥ VCC - 0.2V
≤ GND + 0.2V
or
Cycle time = t
KC min.
11
ISB2- 150 mA ZZ ≥ VCC - 0.2V
VOLOutput Low Voltage - 0.4 V IOL = 8 mA
VOHOutput High Voltage 2.4 - V IOH = -4 mA
Capacitance
Symbol Parameter Typ. Max. Unit Conditions
CIN Input Capacitance 3 4 pF
CI/O Input/Output Capacitance 4 5 pF
T
A = 25 C; f = 1MHz
VCC = 3.3V
* These parameters are sampled and not 100% tested.
PRELIMINARY (July, 2005, Version 0.0) 8 AMIC Technology, Corp.
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A63L0636
AC Characteristics (0°C ≤ TA ≤ 70°C, VCC = 3.3V+10% or 3.3V-5%)
Symbo
Parameter -2.6 -2.8 -3.2 -3.5 -3.8 -4.2 UnitNote
l
tKC
tKH
tKL
tKQ
tKQX
tKQLZ
tKQHZ
tOEQ
tOELZ
tOEHZ
Clock Cycle Time
Clock High Time
Clock Low Time
Clock to Output Valid
Clock to Output Invalid
Clock to Output in Low-Z
Clock to Output in High-Z
OE to Output Valid
OE to Output in Low-Z
OE to Output in High-Z
CC is given with no output current. ICC increases with greater output loading and faster cycle times.
3. I
IH ≤ +4.6V for t ≤ tKC/2.
IH ≥ -0.7V for t ≤ tKC/2.
IH ≤ +3.6 and VCC ≤ 3.1V
≤ 200ms
4. Test conditions assume the output loading shown in Figure 1, unless otherwise specified.
5. For output loading, C
6. At any given temperature and voltage condition, t
7. A WRITE cycle is defined by at least one Byte Write enable LOW and
times. A READ cycle is defined by all byte write enables HIGH and (
L = 5pF, as shown in Figure 2. Transition is measured ±150mV from steady state voltage.
KQHZ is less than tKQLZ and tOEHZ is less than tQELZ.
ADSP HIGH for the required setup and hold
ADSC or ADV LOW) or ADSP LOW for the
required setup and hold times.
OE has no effect when a Byte Write enable is sampled LOW.
8.
9. This is a synchronous device. All addresses must meet the specified setup and hold times for all rising edges of CLK
when either
ADSP or ADSC is LOW and the chip is enabled. All other synchronous inputs must meet the setup and
hold times with stable logic levels for all rising edges of clock (CLK) when the chip is enabled. Chip enable must be
valid at each rising edge of CLK when either
10. The load used for V
OH, VOL testing is shown in Figure 2. AC load current is higher than the given DC values.
ADSP or ADSC is LOW to remain enabled.
AC I/O curves are available upon request.
11. "Device Deselected" means device is in POWER-DOWN mode, as defined in the truth table. "Device Selected" means
device is active (not in POWER-DOWN mode).
12. MODE pin has an internal pulled-up, and ZZ pin has an internal pulled-down. All of then exhibit an input leakage
current of 10
µA.
13. Snooze (ZZ) input is recommended that users plan for four clock cycles to go into SLEEP mode and four clocks to
emerge from SLEEP mode to ensure no data is lost.
PRELIMINARY (July, 2005, Version 0.0) 10 AMIC Technology, Corp.
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A63L0636
Timing Waveforms
ADDRESS
GW,BWE
BW1-BW4
(NOTE *2)
CLK
ADSP
ADSC
ADV
DOUT
t
ADSS
t
AS
t
CE
OE
CES
t
KC
t
t
KH
A1A2A3
KL
t
ADSH
t
t
ADSS
t
AH
t
t
WS
t
CEH
(NOTE *3)
t
High-Z
WH
KQLZ
t
KQ
Single READBURST READ
ADSH
t
t
ADVS
t
OEHZ
Q(A1)Q(A2)Q(A2+1)Q(A2+2)Q(A2+3)Q(A2)
ADVH
t
OELZ
(NOTE *1)
ADV suspends
burst
t
OEQ
t
KQ
t
KQX
Burst continued with
new base address
Q(A2+1)
Burst wraps around
to its initial state
Delselected
cycle
(NOTE *4)
t
Q(A3)
KQHZ
Read Timing
Notes:
*1. Q(A2) refers to output from address A2. Q(A2+1) refers to output from the internal burst address immediately
following A2.
*2. Timing for
LOW and CE2 is HIGH. When
*3. Timing shown assumes that the device was not enabled before entering this sequence.
be driven until after the rising edge of the following clock.
CE2 and CE2 is identical to that for CE . As shown in this diagram, when CE is LOW, CE2 is
CE is HIGH, CE2 is HIGH and CE2 is LOW.
OE does not cause Q to
PRELIMINARY (July, 2005, Version 0.0) 11 AMIC Technology, Corp.
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A63L0636
Timing Waveforms (continued)
ADDRESS
BWE,BW 1-BW4
(NOTE *5)
(NOTE *2)
CLK
ADSP
ADSC
GW
ADV
DIN
DOUT
t
ADSS
t
AS
t
CE
OE
CES
BURST READSingle W RITEExtended BURST WRITE
t
KC
t
t
KH
A1A2A3
(NOTE *3)
t
KL
t
ADSH
t
t
ADSS
BYTE WRITE signals are ignored
for first cycle when ADSP initiates burst
t
CEH
OEHZ
ADSH
t
AH
(NOTE *4)
t
DH
t
DS
D(A1)D(A2+1)
D(A2)D(A2+1)D(A2+2)D(A2+3)D(A3)D(A3+1)High-Z
t
WS
(NOTE *1)
ADSC extends burst
t
WH
ADV suspends burst
t
t
ADSS
ADSH
t
ADVS
t
t
WH
WS
t
ADVH
D(A3+2)
Write Timing
Notes: *1. D(A2) refers to output from address A2. D(A2+ 1) refers to output from the internal burst address immediately
following A2.
*2. Timing for
is LOW and CE2 is HIGH. When
*3.
OE must be HIGH before the input data setup, and held HIGH throughout the data hold period. This prevents
input/output data contention for the period prior to the time Byte Write enable inputs are sampled.
*4.
ADV must be HIGH to permit a Writ e to the loaded address.
*5. Byte Write enables are decided by means of a Write trut h table.
CE2 and CE2 is identical to that for CE . As shown in the above diagram, when CE is LOW, CE2
CE is HIGH, CE2 is HIGH and CE2 is LOW.
PRELIMINARY (July, 2005, Version 0.0) 12 AMIC Technology, Corp.
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A63L0636
Timing Waveforms (continued)
ADSP
ADSC
ADDRESS
GW,BWE,
BW1-BW4
(NOTE *3)
(NOTE *2)
CLK
t
ADSS
A1A3
t
CE
ADV
CES
t
KC
t
t
ADSH
KL
tWSt
WH
t
CEH
t
KH
tASt
AH
A2A4A5A6
DIN
OE
t
KQ
t
OEHZ
t
KQLZ
High-ZQ(A1)Q(A2)Q(A3)Q(A4)Q(A4+1)Q(A4+2)
Back-to-Back READsSingle WRITE
t
DH
t
DS
D(A3)
t
OELZ
t
KQ
Pass-through
READ
(NOTE *4)
(NOTE *1)
BURST READ
D(A5)
Q(A4+3)DOUT
D(A6)High-Z
Back-to-Back
WRITEs
Read/Write Timing
Notes:
*1. Q(A4) refers to output from address A4. Q(A4+1) ref ers t o output from the internal burst address immediately
following A4.
*2. Timing for
LOW and CE2 is HIGH. When
*3. Byte Write enables are decided by means of a Write trut h table.
*4. Pass-through occurs when data is first written, then Read in sequence.
CE2 and CE2 is identical to that for CE . As shown in this diagram, when CE is LOW, CE2 is
CE is HIGH, CE2 is HIGH and CE2 is LOW.
PRELIMINARY (July, 2005, Version 0.0) 13 AMIC Technology, Corp.
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A63L0636
AC Test Conditions
Input Pulse Levels GND to 3V
Input Rise and Fall Times 1.5ns
Input Timing Reference Levels 1.5V
Output Reference Levels 1.5V
Output Load See Figures 1 and 2
Q
RL=50
ZO=50
Ω
VT=1.5V
Ω
Figure 1. Output Load Equivalent
+3.3V
Ω
320
Q
350
Ω
5pF
Figure 2. Output Load Equivalent
PRELIMINARY (July, 2005, Version 0.0) 14 AMIC Technology, Corp.
Page 16
A63L0636
Ordering Information
Part No. Access Times (ns) Frequency (MHz) Package
A63L0636E-2.6 2.6 250 100L LQFP
A63L0636E-2.6F 2.6 250 100L Pb-Free LQFP
A63L0636E-2.8 2.8 225 100L LQFP
A63L0636E-2.8F 2.8 225 100L Pb-Free LQFP
A63L0636E-3.2 3.2 200 100L LQFP
A63L0636E-3.2F 3.2 200 100L Pb-Free LQFP
A63L0636E-3.5 3.5 166 100L LQFP
A63L0636E-3.5F 3.5 166 100L Pb-Free LQFP
A63L0636E-3.8 3.8 150 100L LQFP
A63L0636E-3.8F 3.8 150 100L Pb-Free LQFP
A63L0636E-4.2 4.2 133 100L LQFP
A63L0636E-4.2F 4.2 133 100L Pb-Free LQFP
PRELIMINARY (July, 2005, Version 0.0) 15 AMIC Technology, Corp.
b 0.0110.0130.0150.27 0.32 0.37
c 0.005- 0.0080.12 - 0.20
HE 0.8600.8660.87221.8522.0022.15
E 0.7830.7870.79119.9020.0020.10
HD 0.6240.6300.63615.8516.0016.15
D 0.5470.5510.55513.9014.0014.10
e 0.026 BSC 0.65 BSC
L 0.0180.0240.0300.45 0.60 0.75
L10.039 REF 1.00 REF
y - - 0.004- - 0.1
θ 0° 3.5° 7° 0° 3.5° 7°
Dimensions in inchesDimensions in mm
L1
L
Notes:
1. Dimensions D and E do not include mold protrusion.
2. Dimensions b does not include dambar protrusion.
Total in excess of the b dimension at maximum material condition.
Dambar cannot be located on the lower radius of the foot.
PRELIMINARY (July, 2005, Version 0.0) 16 AMIC Technology, Corp.
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