Preliminary 1M X 16 Bit X 4 Banks Low Power Synchronous DRAM
Document Title
1M X 16 Bit X 4 Banks Low Power Synchronous DRAM
Revision History
Rev. No.
History Issue Date Remark
0.0 Initial issue September 13, 2004 Preliminary
1.0 Modify to 133MHz & 105MHz June 10, 2005 Modify all DC specification for new product
1.1 Modify t
SS from 3ns to 2ns July 11, 2005
PRELIMINARY (July, 2005, Version 1.1) AMIC Technology, Corp.
Page 2
A43P26161
(
A
A8 A7A6A0A1A
A4A3A
Preliminary 1M X 16 Bit X 4 Banks Low Power Synchronous DRAM
Features
Low power supply
- VDD: 2.5V VDDQ : 2.5V
LVCMOS compatible with multiplexed address
Four banks / Pulse
MRS cycle with address key programs
- CAS Latency (2 & 3)
- Burst Length (1,2, 4,8 & full page)
- Burst Type (Sequential & Interleave)
All inputs are sampled at the positive going edge of the
system clock
Deep Power Down Mode
DQM for masking
Auto & self refresh
Clock Frequency (max) : 105MHz @ CL=3 (-95)
133MHz @ CL=3 (-75)
RAS
General Description
The A43P26161 is 67,108,864 bits Low Power
synchronous high data rate Dynamic RAM organized as 4
X 1,048,576 words by 16 bits, fabricated with AMIC’s high
performance CMOS technology. Synchronous design
allows precise cycle control with the use of system clock.
64ms refresh period (4K cycle)
Self refresh with programmable refresh period through
EMRS cycle
Programmable Power Reduction Feature by partial
array activation during Self-refresh through EMRS
cycle
Industrial operating temperature range: -40ºC to +85ºC
for -U series.
Available in 54 Balls CSP (8mm X 8mm) and 54-pin
TSOP(II) packages.
Package is available to lead free (-F series)
I/O transactions are possible on every clock cycle. Range
of operating frequencies, programmable latencies allows
the same device to be useful for a variety of high
bandwidth, high performance memory system
applications.
Pin Configuration
54 Balls CSP (8 mm x 8 mm)
Top View
1 2 3 7 8 9
VSS DQ15VSSQVDDQDQ0VDD
B DQ14 DQ13VDDQVSSQDQ2DQ1
C DQ12 DQ11VSSQVDDQDQ4DQ3
D DQ10 DQ9VDDQVSSQDQ6DQ5
E DQ8 NCVSSVDDLDQMDQ7
F UDQM CLK CKE
G NC A11 A9 BA0 BA1
H
J VSS A5
54 Ball
6X9) CSP
CAS
RAS
WE
CS
10
2VDD
PRELIMINARY (July, 2005, Version 1.1) 1 AMIC Technology, Corp.
PRELIMINARY (July, 2005, Version 1.1) 2 AMIC Technology, Corp.
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A43P26161
Pin Descriptions
Symbol Name Description
CLK System Clock Active on the positive going edge to sample all inputs.
CS
CKE Clock Enable
A0~A11 Address
BS0, BS1 Bank Select Address
RAS
CAS
WE
L(U)DQM
Chip Select
Row Address Strobe
Column Address
Strobe
Write Enable Enables write operation and Row precharge.
Data Input/Output
Mask
Disables or Enables device operation by masking or enabling all inputs except
CLK, CKE and L(U)DQM
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one clock + tss prior to new command.
Disable input buffers for power down in standby.
Row / Column addresses are multiplexed on the same pins.
Row address : RA0~RA11, Column address: CA0~CA7
Selects bank to be activated during row address latch time.
Selects band for read/write during column address latch time.
Latches row addresses on the positive going edge of the CLK with
Enables row access & precharge.
Latches column addresses on the positive going edge of the CLK with
Enables column access.
Makes data output Hi-Z, t SHZ after the clock and masks the output.
Blocks data input when L(U)DQM active.
RAS low.
CAS low.
DQ0-15Data Input/Output Data inputs/outputs are multiplexed on the same pins.
VDD/VSS
VDDQ/VSSQ
NC/RFU No Connection
Power
Supply/Ground
Data Output
Power/Ground
Power Supply: +2.3V ~ 2.7V/Ground
Provide isolated Power/Ground to DQs for improved noise immunity.
PRELIMINARY (July, 2005, Version 1.1) 3 AMIC Technology, Corp.
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A43P26161
Absolute Maximum Ratings*
Voltage on any pin relative to VSS (Vin, Vout ) . . . . . . . . .
Permanent device damage may occur if “Absolute
Maximum Ratings” are exceeded.
Functional operation should be restricted to recommended
operating condition.
Exposure to higher than recommended voltage for
extended periods of time could affect device reliability.
CI2
Data Input/Output Capacitance CI/O DQ0 to DQ15 3.5 6.0 pF
CLK, CKE,
CS, RAS,CAS
WE
, DQM
2.0 4.0 pF
DC Electrical Characteristics
Recommend operating conditions
(Voltage referenced to VSS=0V, T
A = 0ºC to +70ºC for commercial or TA =-40ºC to +85ºC for extended)
Parameter Symbol Min Typ Max Unit Note
Supply Voltage VDD 2.3 2.5 2.7 V
DQ Supply Voltage VDDQ 2.3 2.5 2.7 V
Input High Voltage VIH 0.8*VDDQ - VDDQ+0.3 V
Input Low Voltage VIL -0.3 - 0.3 V Note 1
Output High Voltage VOHVDDQ - 0.2- - V IOH = -0.1mA
Output Low Voltage VOL - - 0.2 V IOL = 0.1mA
Input Leakage Current IIL -1 - 1
Output Leakage Current IOL -1.5 - 1.5
Output Loading Condition See Fig. 1 (Page 6)
Note: 1. VIL (min) = -1.5V AC (pulse width ≤ 5ns).
2. Any input 0V
3. Dout is disabled, 0V
≤ VIN ≤ VDD + 0.3V, all other pins are not under test = 0V
≤ Vout ≤ VDD
µA
µA
Note 2
Note 3
PRELIMINARY (July, 2005, Version 1.1) 4 AMIC Technology, Corp.
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A43P26161
Decoupling Capacitance Guide Line
Recommended decoupling capacitance added to power line at board.
Parameter Symbol Value Unit
Decoupling Capacitance between VDD and VSS CDC10.1 + 0.01
Decoupling Capacitance between VDDQ and VSSQ CDC20.1 + 0.01
µF
µF
Note: 1. VDD and VDDQ pins are separated each other.
All VDD pins are connected in chip. All VDDQ pins are connected in chip.
2. VSS and VSSQ pins are separated each other
All VSS pins are connected in chip. All VSSQ pins are connected in chip.
DC Electrical Characteristics
(Recommended operating condition unless otherwise noted, TA = 0ºC to +70ºC for commercial or TA = -40ºC to +85ºC for extended)
Symbol Parameter Test Conditions
Icc1
Icc2 P
Icc2 PS
ICC2N
ICC2NS
Operating Current
(One Bank Active)
Precharge Standby Current
in power-down mode
Precharge Standby Current
in non power-down mode
Burst Length = 1
t
RC ≥ tRC(min), tCC ≥ tCC(min), IOL = 0mA
CKE
≤ VIL(max), tCC = 15ns
CKE
≤ VIL(max), tCC = ∞
≥ VIH(min), CS ≥ VIH(min), tCC = 15ns
CKE
Input signals are changed one time during 30ns
CKE
≥ VIH(min), CLK ≤ VIL(max), tCC = ∞
Input signals are stable.
Speed
-75 -95
40
0.3
0.5
5.5
2
UnitsNote
mA1
mA
mA
ICC3P
Active Standby current in
CKE
≤ VIL(max), tCC = 15ns
non power-down mode
≥ VIH(min), CS ≥ VIH(min), tCC = 15ns
ICC3N
ICC4
(One Bank Active)
Operating Current
(Burst Mode)
ICC5 Refresh Current
ICC6Self Refresh Current
ICC7Deep Power Down Current
CKE
Input signals are changed one time during 30ns
I
OL = 0mA, Page Burst
All bank Activated, t
t
RC ≥ tRC (min)
CKE
≤ 0.2V
CKE
≤ 0.2V
CCD = tCCD (min)
TCSR Range
4 Banks 400 450 500
2 Banks 250 260 300
1 Banks 150 180 180
1/2 Bank 100 120 120
1/4 Bank 80 90 100
Note: 1. Measured with outputs open. Addresses are changed only one time during tCC(min).
2. Refresh period is 64ms. Addresses are changed only one time during t
CC(min).
1.5
12
50
90
<45°C <70°C <85°C
10
mA
mA1
mA2
uA
uA
PRELIMINARY (July, 2005, Version 1.1) 5 AMIC Technology, Corp.
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A43P26161
AC Operating Test Conditions
(VDD = 2.3V~2.7V, T
Parameter Value Unit
AC input levels 0.9 x VDDQ/0.2 V
Input timing measurement reference level 0.5 x VDDQ V
Input rise and all time (See note3) tr/tf = 1/1 ns
Output timing measurement reference level 0.5 x VDDQ V
Output load condition See Fig.2
Output
A = 0ºC to +70ºC for commercial or TA =-40ºC to +85ºC for extended)
tCDL(min)Last data in new col. Address delay 7.5 9.5 ns 2
tRDL(min)Last data in row precharge 2 2 CLK 1, 2
tBDL(min)Last data in to burst stop 7.5 9.5 ns 2
tCCD(min)Col. Address to col. Address delay 7.5 9.5 ns
Note: 1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and
2. Minimum delay is required to complete write.
RAS to
Row active time
then rounding off to the next higher integer.
CAS
delay
19 24 ns 1
100 100
µs
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A43P26161
Simplified Truth Table
Command CKEn-1 CKEn
Register
Extended Mode Register Set H X L L L L L OP CODE 1,2
Refresh
Bank Active & Row Addr. H X L L H H X V Row Addr. 4
Column Addr.
Column Addr.
Burst Stop H X L H H L X X
Precharge
Clock Suspend or
Active Power Down
Precharge Power Down Mode
DQM H X V X 6
No Operation Command H X
Deep Power Down Entry H L L H H L X X
Deep Power Down Exit L H X X X X X X 7
Note : 1. OP Code: Operand Code
2. MRS can be issued only when all banks are at precharge state.
3. Auto refresh functions is same as CBR refresh of DRAM.
4. BS0, BS1 : Bank select address.
5. During burst read or write with auto precharge, new read/write command cannot be issued.
6. DQM sampled at positive going edge of a CLK masks the data-in at the very CLK (Write DQM latency is 0)
but masks the data-out Hi-Z state after 2 CLK cycles. (Read DQM latency is 2)
7. After Deep Power Down mode exit, a full new initialization of the memory device is mandatory.
Mode Register Set
Auto Refresh H
Self
Refresh
Auto Precharge Disable L 4 Read &
Auto Precharge Enable
Auto Precharge Disable L 4 Write &
Auto Precharge Enable
Bank Selection V L
Both Banks
(V = Valid, X = Don’t Care, H = Logic High, L = Logic Low)
A0~A11, BS0, BS1: Program keys. (@MRS, EMRS)
A new command can be issued after 2 clock cycle of MRS, EMRS.
The automatical precharge without Row precharge command is meant by “Auto”.
Auto/Self refresh can be issued only when all banks are at precharge state.
If both BS1 and BS0 are “Low” at read, write, row active and precharge, bank A is selected.
If both BS1 is “Low” and BS0 is “High” at read, write, row active and precharge, bank B is selected.
If both BS1 is “High” and BS0 is “Low” at read, write, row active and precharge, bank C is selected.
If both BS1 and BS0 are “High” at read, write, row active and precharge, bank D is selected.
If A10/AP is “High” at row precharge, BS1 and BS0 is ignored and all banks are selected.
Another bank read/write command can be issued at every burst length.
Entry
Exit L H
Entry
Exit L H X X X X X
Entry H L
Exit L H
H X L L L L X OP CODE
H
H X L H L H X V
H X L H L L X V
H X L L H L X
H L
CSRAS
L L L H X X
L
L H H H 3
H X X X
L H H H
H X X X
L H H H
H X X X
L V V V
H X X X
L H H H
H X X X
CAS
WE
DQM BS0
X X
X
X
X
X X
A10
BS1
/AP
H
H
X H
A9~A0,
A11
Column
Addr.
Column
Addr.
X
X
X
Notes
1,2
3
3
3
4,5
4,5
PRELIMINARY (July, 2005, Version 1.1) 8 AMIC Technology, Corp.
Note: BS1 and BS0 must be 1, 0 to select the Extended Mode Register (vs. the Mode Register)
0 0
70
45
15
85
°C
°C
°C
°C
A2 A1A0 Banks to be Self-Refreshed
0 0 0 All banks
0 0 1 Bank A, Bank B
0 1 0 Bank A
0 1 1 Reserved
1 0 0 Reserved
1 0 1 1/2 of Bank A
1 1 0 1/4 of Bank A
1 1 1 Reserved
Partial-Array Self Refresh:
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A43P26161
Power Up Sequence
1. Apply power and start clock, Attempt to maintain CKE = “H”, DQM = “H” and the other pins are NOP condition at inputs.
2. Maintain stable power, stable clock and NOP input condition for a minimum of 200
3. Issue precharge commands for all banks of the devices.
4. Issue 2 or more auto-refresh commands.
5. Issue a mode register set command to initialize the mode register. The device is now ready for normal operation.
6. Issue a extended mode register set command to define DS or PASR operating type of the device after normal MRS.
cf.) Sequence of 4 & 5 may be changed.
EMRS cycle is not mandatory and the EMRS command needs to be issued only when DS or PASR is used.
The default state without EMRS command issued is the half driver strength and full array refreshed.
The device is now ready for the operation selected by EMRS.
For operating with DS or PASR, set DS or PASR mode in EMRS setting stage.
In order to adjust another mode in the state of DS or PASR mode, additional EMRS set is required but power up sequence is not
needed again at this time. In that case, all banks have to be in idle state prior to adjusting EMRS set.
PRELIMINARY (July, 2005, Version 1.1) 10 AMIC Technology, Corp.
Page 12
,
CAS
and
CS
RAS
CAS
are high, the SDRAM
WE
high.
RAS
,
high disables the
CS
and
CAS
WE
and
,
WE
, and all
CAS
, BS0
The clock signal must also be asserted at the same time.
2. After VDD reaches the desired voltage, a minimum pause
of 200 microseconds is required with inputs in NOP
condition.
3. All banks must be precharged now.
4. Perform a minimum of 2 Auto refresh cycles to stabilize
the internal circuitry.
5. Perform a MODE REGISTER SET cycle to program the
CAS latency, burst length and burst type as the default
value of mode register is undefined.
At the end of one clock cycle from the mode register set
cycle, the device is ready for operation.
When the above sequence is used for Power-up, all the
out-puts will be in high impedance state. The high
impedance of outputs is not guaranteed in any other
power-up sequence.
cf.) Sequence of 4 & 5 may be changed.
Mode Register Set (MRS)
The mode register stores the data for controlling the various
operation modes of SDRAM. It programs the CAS latency,
addressing mode, burst length, test mode and various
vendor specific options to make SDRAM useful for variety of
different applications. The default value of the mode register
is not defined, therefore the mode register must be written
after power up to operate the SDRAM. The mode register is
written by asserting low on
SDRAM should be in active mode with CKE already high
prior to writing the mode register). The state of address pins
A0~A11, BS0 and BS1 in the same cycle as
,
CS
RAS
mode register. One clock cycle is required to complete the
write in the mode register. The mode register contents can
be changed using the same command and clock cycle
requirements during operation as long as all banks are in the
idle state. The mode register is divided into various fields
depending on functionality. The burst length field uses
A0~A2, burst type uses A3, addressing mode uses A4~A6,
A7~A8, A9, BS0 and BS1 are used for vendor specific
options or test mode. And the write burst length is
programmed using A9. A7~A8, A10~A11, BS0 and BS1
must be set to low for normal SDRAM operation.
Refer to table for specific codes for various burst length,
addressing modes and CAS latencies. BS0 and BS1 have to
be set to “0” to enter the Mode Register.
Extended Mode Register (EMRS)
The Extended Mode Register controls functions beyond
those controlled by the Mode Register. These additional
functions are unique to AMIC’s Low Power SDRAM and
includes a Refresh Period field (TCSR) for temperature
compensated self-refresh and a Partial-Array Self Refresh
field (PASR). The PASR field is used to specify whether only
bank A and bank B,or bank A,or 1/2 of bank A,or 1/4 of bank
A be refreshed. Disable banks will not be refreshed in SelfRefresh mode and written data will be lost. When only bank
A is selected it is possible to partial select only half or one
quarter of bank A. The TCR field has four entries to set
Refresh Period during self-refresh depending on the case
temperature of the Low Power devices.
The Extended Mode Register is programmed via the Mode
Register Set command (with BS0=0 and BS1=1) and retains
,
CAS
,
going low is the data written in the
WE
CS
,
RAS
,
CAS
,
WE
(The
A43P26161
Device Operations
Clock (CLK)
The clock input is used as the reference for all SDRAM
operations. All operations are synchronized to the positive
going edge of the clock. The clock transitions must be
monotonic between VIL and VIH. During operation with CKE
high all inputs are assumed to be in valid state (low or high)
for the duration of set up and hold time around positive edge
of the clock for proper functionality and ICC specifications.
Clock Enable (CKE)
The clock enable (CKE) gates the clock onto SDRAM. If
CKE goes low synchronously with clock (set-up and hold
time same as other inputs), the internal clock is suspended
from the next clock cycle and the state of output and burst
address is frozen as long as the CKE remains low. All other
inputs are ignored from the next clock cycle after CKE goes
low. When all banks are in the idle state and CKE goes low
synchronously with clock, the SDRAM enters the power
down mode from the next clock cycle. The SDRAM remains
in the power down mode ignoring the other inputs as long as
CKE remains low. The power down exit is synchronous as
the internal clock is suspended. When CKE goes high at
SS + 1 CLOCK” before the high going edge of the
least “t
clock, then the SDRAM becomes active from the same clock
edge accepting all the input commands.
Bank Select (BS0, BS1)
This SDRAM is organized as 4 independent banks of
1,048,576 words X 16 bits memory arrays. The BS0, BS1
inputs is latched at the time of assertion of
to select the bank to be used for the operation. The bank
select BS0, BS1 is latched at bank activate, read, write
mode register set and precharge operations.
Address Input (A0 ~ A11)
The 20 address bits required to decode the 1,048,576 word
locations are multiplexed into 12 address input pins
(A0~A11). The 12 bit row address is latched along with
, BS0 and BS1 during bank activate command. The 8
RAS
bit column address is latched along with
and BS1during read or write command.
NOP and Device Deselect
When
performs no operation (NOP). NOP does not initiate any new
operation, but is needed to complete operations which
require more than single clock like bank activate, burst read,
auto refresh, etc. The device deselect is also a NOP and is
entered by asserting
command decoder so that
the address inputs are ignored.
Power-Up
The following sequence is recommended for POWER UP
1. Power must be applied to either CKE and DQM inputs to
RAS
pull them high and other pins are NOP condition at the
inputs before or along with VDD (and VDDQ) supply.
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A43P26161
S
the stored information until it is programmed again or the
device loses power. The Extended Mode Register must be
loaded when all banks are idle, and the controller must wait
the specified time before initiating any subsequent operation.
Violating either these requirements result in unspecified
operation. Unused bit A7 to A11 have to be set to “0”.
Bank Activate
The bank activate command is used to select a random row
in an idle bank. By asserting low on
RAS
and
CS
with
desired row and bank addresses, a row access is initiated.
The read or write operation can occur after a time delay of
t
RCD(min) from the time of bank activation. tRCD(min) is an
internal timing parameter of SDRAM, therefore it is
dependent on operating clock frequency. The minimum
number of clock cycles required between bank activate and
read or write command should be calculated by dividing
t
RCD(min) with cycle time of the clock and then rounding off
the result to the next higher integer. The SDRAM has 4
internal banks on the same chip and shares part of the
internal circuitry to reduce chip area, therefore it restricts the
activation of all banks simultaneously. Also the noise
generated during sensing of each bank of SDRAM is high
requiring some time for power supplies to recover before the
other bank can be sensed reliably. t
RRD(min) specifies the
minimum time required between activating different banks.
The number of clock cycles required between different bank
activation must be calculated similar to t
RCD specification.
The minimum time required for the bank to be active to
initiate sensing and restoring the complete row of dynamic
cells is determined by t
RAS(min) specification before a
precharge command to that active bank can be asserted.
The maximum time any bank can be in the active state is
determined by t
t
RAS(min) and tRAS(max) can be calculated similar to tRCD
RAS(max). The number of cycles for both
specification.
Burst Read
The burst read command is used to access burst of data on
consecutive clock cycles from an active row in an active
bank. The burst read command is issued by asserting low on
and
C
the clock. The bank must be active for at least t
CAS
with
being high on the positive edge of
WE
RCD(min)
before the burst read command is issued. The first output
appears CAS latency number of clock cycles after the issue
of burst read command. The burst length, burst sequence
and latency from the burst read command is determined by
the mode register which is already programmed. The burst
read can be initiated on any column address of the active
row. The address wraps around if the initial address does not
start from a boundary such that number of outputs from each
I/O are equal to the burst length programmed in the mode
register. The output goes into high-impedance at the end of
the burst, unless a new burst read was initiated to keep the
data output gapless. The burst read can be terminated by
issuing another burst read or burst write in the same bank or
the other active bank or a precharge command to the same
bank. The burst stop command is valid at every page burst
length.
Burst Write
The burst write command is similar to burst read command,
and is used to write data into the SDRAM consecutive clock
cycles in adjacent addresses depending on burst length and
,
burst sequence. By asserting low on
CS
CAS
and
WE
with valid column address, a write burst is initiated. The data
inputs are provided for the initial address in the same clock
cycle as the burst write command. The input buffer is
deselected at the end of the burst length, even though t he
internal writing may not have been completed yet. The burst
write can be terminated by issuing a burst read and DQM for
blocking data inputs or burst write in the same or the other
active bank. The burst stop command is valid only at full
page burst length where the writing continues at the end of
burst and the burst is wrap around. The write burst can also
be terminated by using DQM for blocking data and
precharging the bank “t
RDL” after the last data input to be
written into the active row. See DQM OPERATION also.
DQM Operation
The DQM is used to mask input and output operation. It
works similar to
during read operation and inhibits
OE
writing during write operation. The read latency is two cycles
from DQM and zero cycle for write, which means DQM
masking occurs two cycles later in the read cycle and occurs
in the same cycle during write cycle. DQM operation is
synchronous with the clock, therefore the masking occurs for
a complete cycle. The DQM signal is important during burst
interrupts of write with read or precharge in the SDRAM. Due
to asynchronous nature of the internal write, the DQM
operation is critical to avoid unwanted or incomplete writes
when the complete burst write is not required.
Precharge
The precharge operation is performed on an active bank by
,
,
asserting low on
CS
RAS
and A10/AP with valid BA
WE
of the bank to be precharged. The precharge command can
be asserted anytime after t
activate command in the desired bank. “t
RAS(min) is satisfied from the bank
RP” is defined as the
minimum time required to precharge a bank.
The minimum number of clock cycles required to complete
row precharge is calculated by dividing “t
RP” with clock cycle
time and rounding up to the next higher integer. Care should
be taken to make sure that burst write is completed or DQM
is used to inhibit writing before precharge command is
asserted. The maximum time any bank can be active is
specified by t
precharged within t
RAS(max). Therefore, each bank has to be
RAS(max) from the bank activate
command. At the end of precharge, the bank enters the idle
state and is ready to be activated again.
Entry to Power Down, Auto refresh, Self refresh and Mode
register Set etc, is possible only when all banks are in idle
state.
Auto Precharge
The precharge operation can also be performed by using
auto precharge. The SDRAM internally generates the timing
to satisfy t
and CAS latency. The auto precharge command is issued at
the same time as burst read or burst write by asserting high
on A10/AP. If burst read or burst write command is issued
with low on A10/AP, the bank is left active until a new
command is asserted. Once auto precharge command is
given, no new commands are possible to that particular bank
until the bank achieves idle state.
RAS(min) and “tRP” for the programmed burst length
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A43P26161
All Banks Precharge
All banks can be precharged at the same time by using
Precharge all command. Asserting low on
with high on A10/AP after both banks have satisfied
WE
t
RAS(min) requirement, performs precharge on all banks. At
the end of tRP after performing precharge all, all banks are
in idle state.
Auto Refresh
The storage cells of SDRAM need to be refreshed every
64ms to maintain data. An auto refresh cycle accomplishes
refresh of a single row of storage cells. The internal counter
increments automatically on every auto refresh cycle to
refresh all the rows. An auto refresh command is issued by
asserting low on
and
. The auto refresh command can only be asserted
WE
CS
,
RAS
and
with high on CKE
CAS
with all banks being in idle state and the device is not in
power down mode (CKE is high in the previous cycle). The
time required to complete the auto refresh operation is
specified by “t
required can be calculated by dividing “t
RC(min)”. The minimum number of clock cycles
RC” with clock cycle
time and then rounding up to the next higher integer. The
auto refresh command must be followed by NOP’s until the
auto refresh operation is completed. All banks will be in the
idle state at the end of auto refresh operation. The auto
refresh is the preferred refresh mode when the SDRAM is
being used for normal data transactions. The auto refresh
cycle can be performed once in 15.6us or a burst of 4096
auto refresh cycles once in 64ms.
CS
,
RAS
and
Self Refresh
The self refresh is another refresh mode available in the
SDRAM. The self refresh is the preferred refresh mode for
data retention and low power operation of SDRAM. In self
refresh mode, the SDRAM disables the internal clock and all
the input buffers except CKE. The refresh addressing and
timing is internally generated to reduce power consumption.
The self refresh mode is entered from all banks idle state by
asserting low on
. Once the self refresh mode is entered, only CKE state
WE
CS
,
RAS
,
and CKE with high on
CAS
being low matters, all the other inputs including clock are
ignored to remain in the self refresh.
The self refresh is exited by restarting the external clock and
then asserting high on CKE. This must be followed by NOP’s
for a minimum time of “t
RC” before the SDRAM reaches idle
state to begin normal operation. If the system uses burst
auto refresh during normal operation, it is recommended to
used burst 4096 auto refresh cycles immediately after exiting
self refresh.
Deep Power Down Mode
The Deep Power Down Mode is an unique function on Low
Power SDRAMs with very low standby currents. All internal
voltage generators inside the Low Power SDRAMs are
stopped and all memory data will be lost in this mode. To
enter the Deep Power Down Mode all banks must be
precharged and the necessary Precharged Delay t
RP must
occur.
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Basic feature And Function Descriptions
1. CLOCK Suspend
1) Click Suspended During Write (BL=4)
CLK
CMD
CKE
Internal
CLK
DQ(CL2)
DQ(CL3)
Note: CLK to CLK disable/enable=1 clock
WR
D0D1D2D3
D0D1D2D3
2. DQM Operation
1) Write Mask (BL=4)
CLK
CMD
DQM
DQ(CL2)
DQ(CL3)
WR
D0D1D3
D0D1D3
DQM to Data-in Mask = 0CLK
Masked by CKE
Not Written
Masked by CKE
2) Clock Suspended During Read (BL=4)
RD
2) Read Mask (BL=4)
RD
Masked by CKE
Q0Q1Q3
Q0Q2Q3
Masked by CKE
Hi-Z
Q0Q2Q3
Hi-Z
Q1Q2Q3
DQM to Data-out Mask = 2
Q2
Q1
Suspended Dout
2) Read Mask (BL=4)
CLK
RD
CMD
CKE
DQM
DQ(CL2)
DQ(CL3)
* Note :
Q0Q2Q4
Hi-Z
Hi-Z
Q1Q3
1. DQM makes data out Hi-Z after 2 clocks which should masked by CKE “L”.
Hi-Z
Hi-ZHi-Z
2. DQM masks both data-in and data-out.
PRELIMINARY (July, 2005, Version 1.1) 14
Hi-Z
Q6Q7Q8
Q5Q6Q7
AMIC Technology, Corp.
Page 16
A43P26161
3. CAS Interrupt (I)
CLK
CMD
ADD
DQ(CL2)
DQ(CL3)
CLK
CMD
ADD
DQ
1) Read interrupted by Read (BL=4)
RDRD
AB
QA0 QB0QB1 QB2QB3
QA0 QB0 QB1QB2 QB3
t
CCD
Note2
2) Write interrupted by Write (BL =2)
WRWR
t
CCD
Note2
AB
DA0 DB0DB1
t
CDL
Note3
Note 1
3) Write interrupted by Read (BL =2)
WRRD
t
CCD
AB
DQ(CL2)
DQ(CL3)
DA0QB0QB1
DA0
t
CDL
Note3
Note2
QB0 QB1
Note : 1. By “Interrupt”, It is possible to stop burst read/write by external command before the end of burst.
By “
CCD :
2. t
3. t
CDL : Last data in to new column address delay. (= 1CLK).
Interrupt”, to stop burst read/write by
CAS
CAS
to
delay. (=1CLK)
CAS
access; read, write and block write.
CAS
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4. CAS Interrupt (II) : Read Interrupted Write & DQM
(1) CL=2, BL=4
CLK
i) CMD
DQM
DQ
ii) CMD
DQM
DQ
iii) CMD
DQM
DQ
iv) CMD
DQM
DQ
(2) CL=3, BL=4
CLK
i) CMD
DQM
DQ
ii) CMD
RDWR
D0D1D2D3
RD
RDWR
RDWR
RD
WR
Hi-Z
D0D1D2D3
WRRD
Hi-Z
D0D1D2D3
Hi-Z
Note 1
D0D1D2D3
WR
D0D1D2D3Q0
DQM
iii) CMD
iv) CMD
v) CMD
DQ
DQM
DQ
RDWR
DQM
DQ
RD
DQM
DQ
D0D1D2D3
WRRD
D0D1D2D3
WR
Hi-Z
D0D1D2D3
WR
Hi-Z
Note 2
D0D1D2Q0
D3
* Note : 1. To prevent bus contention, there should be at least one gap between data in and data out.
2. To prevent bus contention, DQM should be issued which makes a least one gap between data in and data out.
PRELIMINARY (July, 2005, Version 1.1) 16 AMIC Technology, Corp.
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5. Write Interrupted by Precharge & DQM
CLK
CMD
DQM
DQ
WRPRE
D0D1D2D3
Masked by DQM
Note 2
Note 1
Note : 1. To inhibit invalid write, DQM should be issued.
2. This precharge command and burst write command should be of the same bank, otherwise it is not precharge
interrupt but only another bank precharge of dual banks operation.
6. Precharge
1) Normal Write (BL=4)
CLK
CMD
DQ
2) Read (BL=4)
CLK
CMD
DQ(CL2)
WRPRE
D0D1D2D3
t
RDL
RDPRE
Q0Q1Q2Q3
Q0Q1Q2Q3DQ(CL3)
7. Auto Precharge
1) Normal Write (BL=4)
CLK
CMD
DQ
2) Read (BL=4)
CLK
CMD
DQ(CL2)
* Note : 1. The row active command of the precharge bank can be issued after tRP from this point.
The new read/write command of other active bank can be issued from this point.
At burst read/write with auto precharge,
WR
D0D1D2D3
RD
Q0Q1Q2Q3
Q0Q1Q2Q3DQ(CL3)
Auto Precharge Starts
Auto Precharge Starts
CAS
Note 1
Note 1
interrupt of the same/another bank is illegal.
PRELIMINARY (July, 2005, Version 1.1) 17
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8. Burst Stop & Interrupted by Precharge
1) Normal Write (BL=4)
CLK
CMD
WR
DQM
DQ
D0D1D2D3
1) Read Interrupted by Precharge (BL=4)
CLK
CMD
RD
DQ(CL2)
DQ(CL3)
9. MRS
t
RDL
PRE
Q0Q1
PRE
Note 1
Note 3
1
Q0Q1
2) Write Burst Stop (BL=8)
CLK
CMD
WR
STOP
DQM
DQ
D0D1D2D3
t
BDL
Note 2
D4D5
4) Read Burst Stop (BL=4)
CLK
CMD
DQ(CL2)
2
DQ(CL3)
RD
STOP
Q0Q1
1
Q0Q1
2
Mode Register Set
CLK
Note 1
Note : 1. t
2. t
CMD
RDL: 1CLK
BDL: 1CLK; Last data in to burst stop delay.
PREMRS
t
RP
ACT
2CLK
Read or write burst stop command is valid at every burst length.
3. Number of valid output data after row precharge or burst stop: 1,2 for CAS latency = 2, 3 respectively.
4. PRE: All banks precharge if necessary.
MRS can be issued only when all banks are in precharged state.
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10. Clock Suspend Exit & Power Down Exit
1) Clock Suspend (=Active Power Down) Exit
CLK
CKE
Internal
CLK
Note 1
CMD
11. Auto Refresh & Self Refresh
1) Auto Refresh
CLK
CKE
Internal
CLK
CMD
2) Self Refresh
Note 3
Note 4
PREARCMD
Note 6
2) Power Down (=Precharge Power Down) Exit
CLK
~
~
CKE
Internal
CLK
CMD
Note 2
Note 5
NOP
t
SS
ACT
~
~
~
~
~
t
SS
RD
~
t
RP
t
RC
CLK
Note 4
CMD
CKE
PRE
t
RP
SR
* Note : 1. Active power down : one or more bank active state.
2. Precharge power down : both bank precharge state.
3. The auto refresh is the same as CBR refresh of conventional DRAM.
No precharge commands are required after Auto Refresh command.
During t
4. Before executing auto/self refresh command, both banks must be idle state.
5. MRS, Bank Active, Auto/Self Refresh, Power Down Mode Entry.
6. During self refresh mode, refresh interval and refresh operation are performed internally.
After self refresh entry, self refresh mode is kept while CKE is LOW.
During self refresh mode, all inputs expect CKE will be don’t cared, and outputs will be in Hi-Z state.
During t
Before/After self refresh mode, burst auto refresh cycle (4K cycles ) is recommended.
RC from auto refresh command, other command can not be accepted.
RC from self refresh exit command, any other command can not be accepted.
~
~
~
~
~
~
CMD
~
~
~
~
t
RC
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12. About Burst Type Control
Basic
MODE
Random
MODE
Sequential counting
Interleave counting
Random column Access
t
CCD = 1 CLK
13. About Burst Length Control
MODE
Special
MODE
Interrupt
MODE
Basic
(Interrupted by Precharge)
1
2
4 At MRS A2,1,0 = “010”
8 At MRS A2,1,0 = “011”.
BRSW
Interrupt
RAS
Interrupt
CAS
At MRS A3=”0”. See the BURST SEQUENCE TABE.(BL=4,8)
BL=1,2,4,8 and full page wrap around.
At MRS A3=” 1”. See the BURST SEQUENCE TABE.(BL=4,8)
BL=4,8 At BL=1,2 Interleave Counting = Sequential Counting
Every cycle Read/Write Command with random column address can realize
Random Column Access.
That is similar to Extended Data Out (EDO) Operation of convention DRAM.
At MRS A2,1,0 = “000”.
At auto precharge, tRAS should not be violated.
At MRS A2,1,0 = “001”.
At auto precharge, tRAS should not be violated.
At MRS A9=”1”.
Read burst = 1,2,4,8, full page/write Burst =1
At auto precharge of write, tRAS should not be violated.
Before the end of burst, Row precharge command of the same bank
Stops read/write burst with Row precharge.
t
RDL= 2 with DQM, valid DQ after burst stop is 1,2 for CL=2,3 respectively
During read/write burst with auto precharge,
Before the end of burst, new read/write stops read/write burst and starts new
read/write burst or block write.
During read/write burst with auto precharge,
interrupt cannot be issued.
RAS
interrupt can not be issued.
CAS
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Power On Sequence for Low Power SDRAM
012345678910111213141516171819
CLOCK
CKE
CS
RAS
CAS
ADDR
BS0
BS1
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
KEYKEY
Ra
A10/AP
WE
DQM
DQ
High level is necessary
High-Z
t
PR
Precharge
(All Banks)
~
~
~
~
~
~
~
~
~
~
~
~
t
RC
Auto RefreshAuto Refresh
~
~
~
~
~
~
~
~
~
~
~
~
t
RC
Normal
MRS
Extended
MRS
Ra
Row Active
(A-Bank)
: Don't care
PRELIMINARY (July, 2005, Version 1.1) 21
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Single Bit Read-Write-Read Cycles (Same Page) @CAS Latency=3, Burst Length=1
t
t
t
CC
RCD
CH
t
CL
High
t
RAS
t
RC
t
SS
t
SH
t
SS
t
SS
*Note 2,3*Note 2,3*Note 2,3 *Note 4*Note 2
t
SH
t
RP
t
CCD
t
SH
Rb
CLOCK
CKE
CS
RAS
CAS
ADDR
BS0, BS1
0 12345678910111213141516171819
*Note 1
t
SH
t
SS
t
SH
RaCaCbCc
t
SS
*Note 2
BSBSBSBSBSBS
A10/AP
WE
DQM
DQ
*Note 3*Note 3*Note 3 *Note 4
RaRb
t
SH
t
SS
t
Row Active
t
RA
C
Read
t
SS
t
SA
C
QaDbQc
t
SLZ
t
OH
t
SHZ
t
SS
Write
SH
t
SH
Read
Precharge
Row Active
: Don't care
PRELIMINARY (July, 2005, Version 1.1) 22 AMIC Technology, Corp.
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A43P26161
* Note : 1. All inputs can be don’t care when
2. Bank active & read/write are controlled by BS0, BS1.
BS1 BS0 Active & Read/Write
0 0 Bank A
0 1 Bank B
1 0 Bank C
1 1 Bank D
is high at the CLK high going edge.
CS
3. Enable and disable auto precharge function are controlled by A10/AP in read/write command.
A10/AP BS1 BS0Operation
0 0 Disable auto precharge, leave bank A active at end of burst.
0
1
0 1 Disable auto precharge, leave bank B active at end of burst.
1 0 Disable auto precharge, leave bank C active at end of burst.
1 1 Disable auto precharge, leave bank D active at end of burst.
0 0 Enable auto precharge, precharge bank A at end of burst.
0 1 Enable auto precharge, precharge bank B at end of burst.
1 0 Enable auto precharge, precharge bank C at end of burst.
1 1 Enable auto precharge, precharge bank D at end of burst.
4. A10/AP and BS0, BS1 control bank precharge when precharge command is asserted.
A10/AP BS1 BS0 Precharge
0 0 0 Bank A
0 0 1 Bank B
0 1 0 Bank C
0 1 1 Bank D
1 X X All Banks
PRELIMINARY (July, 2005, Version 1.1) 23
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A43P26161
Read & Write Cycle at Same Bank @Burst Length=4
0 12345678910111213141516171819
CLOCK
CKE
CS
RAS
CAS
ADDR
BS0
BS1
DQM
WE
High
*Note 1
t
RC
t
RCD
*Note 2
RaCa0RbCb0
RaRbA10/AP
t
OH
DQ
(CL = 2)
DQ
(CL = 3)
Row Active
(A-Bank)
t
RAC
*Note 3
*Note 3
t
t
RAC
Read
(A-Bank)
SAC
t
SAC
Qa0
Qa1Qa2Qa3Db0Db1Db2Db3
t
SHZ
*Note 4
*Note 4
t
SHZ
t
OH
Qa0
Qa1Qa2Qa3Db0Db1Db2Db3
Precharge
(A-Bank)
*Note : 1. Minimum row cycle times is required to complete internal DRAM operation.
2. Row precharge can interrupt burst on any cycle. [CAS latency-1] valid output data available after Row
enters precharge. Last valid output will be Hi-Z after t
3. Access time from Row address. t
CC*(tRCD + CAS latency-1) + tSAC
SHZ from the clock.
4. Output will be Hi-Z after the end of burst. (1,2,4 & 8)
Row Active
(A-Bank)
Write
(A-Bank)
t
t
RDL
RDL
Precharge
(A-Bank)
: Don't care
PRELIMINARY (July, 2005, Version 1.1) 24
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Page Read & Write Cycle at Same Bank @Burst Length=4
0 12345678910111213141516171819
CLOCK
CKE
CS
RAS
CAS
ADDR
BS0
BS1
DQM
WE
High
t
RCD
RaCaCbCc
RaA10/AP
*Note1*Note3
t
CDL
Cd
*Note 2
t
RDL
DQ
(CL=2)
DQ
(CL=3)
Row Active
(A-Bank)
Read
(A-Bank)
Qa0Qa1Qb0Qb1Dc0Dc1Dd0Dd1
Qa0Qa1Qb0
Read
(A-Bank)
Qb2
Qb1
Dc0Dc1Dd0Dd1
Write
(A-Bank)
*Note : 1. To write data before burst read ends, DQM should be asserted three cycle prior to write
command to avoid bus contention.
2. Row precharge will interrupt writing. Last data input, t
RDL before Row precharge, will be written.
3. DQM should mask invalid input data on precharge command cycle when asserting precharge
before end of burst. Input data after Row precharge cycle will be masked internally.
Write
(A-Bank)
Precharge
(A-Bank)
: Don't care
PRELIMINARY (July, 2005, Version 1.1) 25 AMIC Technology, Corp.
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A43P26161
Page Read Cycle at Different Bank @Burst Length = 4
* Note : 1. At full page mode, burst is wrap-around at the end of burst. So auto precharge is impossible.
2. About the valid DQ’s after burst stop, it is same as the case of
RAS
interrupt.
Both cases are illustrated above timing diagram. See the label 1,2 on them.
But at burst write, burst stop and
interrupt should be compared carefully.
RAS
Refer the timing diagram of “Full page write burst stop cycle”.
3. Burst stop is valid at every burst length.
Precharge
(A-Bank)
QAb4 QAb5
: Don't care
2
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Write Interrupted by Precharge Command & Write Burst Stop Cycle @ Burst Length = Full Page
012345678910111213141516171819
CLOCK
CKE
RAS
CAS
ADDR
BS1
BS0
A10/AP
DQM
CS
WE
DQ
RAa
RAa
High
CAa
t
BDL
DAa0DAb4 DAb5
DAa4DAa3DAa1 DAa2DAb0 DAb1 DAb2 DAb3
CAb
* Note 2
t
RDL
Row Active
(A-Bank)
Write
(A-Bank)
Burst Stop
Write
(A-Bank)
Precharge
(A-Bank)
: Don't care
* Note : 1. At full page mode, burst is wrap-around at the end of burst. So auto precharge is impossible.
2. Data-in at the cycle of interrupted by precharge cannot be written into the corresponding memory cell.
It is defined by AC parameter of t
DQM at write interrupted by precharge command is needed to prevent invalid write.
DQM should mask invalid input data on precharge command cycle when asserting precharge before end of burst.
Input data after Row precharge cycle will be masked internally.
3. Burst stop is valid at every burst length.
RDL(=2CLK).
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Active/Precharge Power Down Mode @CAS Lantency=2, Burst Length=4
CLOCK
CKE
CS
RAS
CAS
ADDR
BS1
BS0
0 12345678910111213141516171819
t
SS
* Note 1
*Note 3
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
t
SS
* Note 2
t
SS
RaCa
~
~
t
SS
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
Exit
Ra
Row
Active
Power-down
Active
Entry
SS” prior to Row active command.
A10/AP
WE
DQM
DQ
Precharge
Power-down
Entry
* Note : 1. All banks should be in idle state prior to entering precharge power down mode.
PRELIMINARY (July, 2005, Version 1.1) 33 AMIC Technology, Corp.
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Self Refresh Entry & Exit Cycle
CLOCK
CKE
CS
RAS
CAS
ADDR
BS0, BS1
A10/AP
0 12345678910111213141516171819
* Note 2
* Note 1
t
SS
* Note 7* Note 7
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
* Note 3
~
~
~
~
~
~
~
* Note 4
t
SS
* Note 5
t
RC
min.
~
~
~
~
~
~
~
~
~
~
~
~
* Note 6
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
WE
DQM
DQ
Self Refresh Entry
* Note : TO ENTER SELF REFRESH MODE
1.
2. After 1 clock cycle, all the inputs including the system clock can be don’t care except for CKE.
3. The device remains in self refresh mode as long as CKE stays “Low”.
(cf.) Once the device enters self refresh mode, minimum tRAS is required before exit from self refresh.
TO EXIT SELF REFRESH MODE
4. System clock restart and be stable before returning CKE high.
5.
6. Minimum tRC is required after CKE going high to complete self refresh exit.
7. 4K cycle of burst auto refresh is required before self refresh entry and after self refresh exit.
If the system uses burst refresh.
CS, RAS
CS
&
CAS
starts from high.
~
~
~
~
~
~
~
~
and CKE should be low at the same clock cycle.
Hi-ZHi-Z
Self Refresh ExitAuto Refresh
~
~
~
~
~
~
~
~
~
: Don't care
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Mode Register Set Cycle Auto Refresh Cycle
0 123456012345678910
CLOCK
CKE
HighHigh
~
~
~
~
*Note 2
CS
t
RC
RAS
CAS
ADDR
WE
DQM
DQ
* All banks precharge should be completed before Mode Register Set cycle and auto refresh cycle.
MODE REGISTER SET CYCLE * Note : 1.
* Note 1
* Note 3
Key
MRS
CS, RAS
mode register.
2. Minimum 2 clock cycles is required before new
Ra
New
Command
,
CAS
&
activation at the same clock cycle with address key will set internal
WE
Hi-ZHi-Z
Auto RefreshNew Command
activation.
RAS
3. Please refer to Mode Register Set table.
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
: Don't care
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Deep Power D own Mode Entry
CLK
CKE
CS
WE
CAS
RAS
ADDR
DQM
DQ
input
DQ
output
t
RP
Precharge CommandDeep Power Down Entry
Normal ModeDeep Power Down Mode
High-Z
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Deep Power Down Mode Exit
CLK
CKE
CS
RAS
CAS
WE
Deep Power
Down Exit
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
200 ust
All Banks
Precharge
RP
Auto
Refresh
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
Auto
Refresh
t
RC
Mode
Register
Set
Extended
Mode
Register Set
New
Command
Accepted
Here
The deep power down mode is exited by asserting CKE high. After the exit, the following sequence is needed to enter a new
command:
1. Maintain NOP input conditions for a minimum of 200
µs
2. Issue precharge commands for all banks of the device
3. Issue eight or more auto-refresh commands
4. Issue a mode register set command to initialize the mode register
5. Issue an extended mode register set command to initialize the extended mode register
PRELIMINARY (July, 2005, Version 1.1) 37 AMIC Technology, Corp.
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Function Truth Table (Table 1)
Current
State
IDLE
Row
Active
Read
Write
Read with
Auto
Precharge
CS RA
H X X X X X NOP
L H H H X X NOP
L H H L X X ILLEGAL 2
L H L X BS CA, A10/AP ILLEGAL 2
L L H H BS RA Row Active; Latch Row Address
L L H L BS A10/AP NOP 4
L L L H X X Auto Refresh or Self Refresh 5
L L L L OP Code Mode Register Access 5
H X X X X X NOP
L H H H X X NOP
L H H L X X ILLEGAL 2
L H L H BS CA,A10/AP Begin Read; Latch CA; Determine AP
L H L L BS CA,A10/AP Begin Write; Latch CA; Det ermine AP
L L H H BS RA ILLEGAL 2
L L H L BS PA Precharge
L L L X X X ILLEGAL
H X X X X X
L H H H X X
L H H L X X
L H L H BS CA,A10/AP Term burst; Begin Read; Latch CA; Determine AP 3
L H L L BS CA,A10/AP Term burst; Begin Writ e; Latch CA; Determine AP 3
L L H H BS RA ILLEGAL 2
L L H L BS A10/AP Term Burst; Precharge timing for Reads 3
L L L X X X ILLEGAL
H X X X X X
L H H H X X
L H H L X X
L H L H BS CA,A10/AP Term burst; Begin Read; Latch CA; Determine AP 3
L H L L BS CA,A10/AP Term burst; Begin Write; Latch CA; Determine AP 3
L L H H BS RA ILLEGAL 2
L L H L BS A10/AP Term Burst; Precharge timing for Writes 3
L L L X X X ILLEGAL
H X X X X X
L H H H X X
L H H L X X ILLEGAL
L H L H BS CA,A10/AP ILLEGAL 2
L H L L BS CA,A10/AP ILLEGAL 2
L L H X BS RA, PA ILLEGAL
L L L X X X ILLEGAL 2
CAS
BS Address Action Note
WE
NOP(Continue Burst to End
NOP(Continue Burst to End
Term burst
NOP(Continue Burst to End
NOP(Continue Burst to End
Term burst
NOP(Continue Burst to End
NOP(Continue Burst to End
→Row Active
→Row Active
→Row Active)
→Row Active)
→Row Active)
→Row Active)
→Precharge)
→Precharge)
PRELIMINARY (July, 2005, Version 1.1) 38 AMIC Technology, Corp.
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A43P26161
Function Truth Table (Table 1, Continued)
Current
State
Write with
Auto
Precharge
Precharge
Row
Activating
Refreshing
Mode
Register
Accessing
Abbreviations
RA = Row Address BS = Bank Address AP = Auto Precharge
NOP = No Operation Command CA = Column Address PA = Precharge All
Note: 1. All entries assume that CKE was active (High) during the preceding clock cycle and the current clock cycle.
2. Illegal to bank in specified state: Function may be legal in the bank indicated by BA, depending on the state of that bank.
3. Must satisfy bus contention, bus turn around, and/or write recovery requirements.
4. NOP to bank precharging or in idle state. May precharge bank indicated by BS (and PA).
5. Illegal if any banks is not idle.
CS
RAS
H X X X X X
L H H H X X
L H H L X X ILLEGAL
L H L H BS CA,A10/APILLEGAL 2
L H L L BS CA,A10/APILLEGAL 2
L L H X BS RA, PA ILLEGAL
L L L X X X ILLEGAL 2
H X X X X X
L H H H X X
L H H L X X ILLEGAL
L H L X BS CA,A10/APILLEGAL 2
L L H H BS RA ILLEGAL 2
L L H L BS A10/AP
L L L X X X ILLEGAL 4
H X X X X X
L H H H X X
L H H L X X ILLEGAL
L H L X BS CA,A10/APILLEGAL 2
L L H H BS RA ILLEGAL 2
L L H L BS A10/AP ILLEGAL 2
L L L X X X ILLEGAL 2
H X X X X X
L H H X X X
L H L X X X ILLEGAL
L L H X X X ILLEGAL
L L L X X X ILLEGAL
H X X X X X
L H H H H X
L H H L X X ILLEGAL
L H L X X X ILLEGAL
L L X X X X ILLEGAL
CAS
BS Address Action Note
WE
NOP(Continue Burst to End
NOP(Continue Burst to End
→Idle after tRP
NOP
→Idle after tRP
NOP
→Idle after tRP
NOP
→Row Active after tRCD
NOP
→Row Active after tRCD
NOP
→Idle after tRC
NOP
→Idle after tRC
NOP
→Idle after 2 clocks
NOP
→Idle after 2 clocks
NOP
→Precharge)
→Precharge)
2
PRELIMINARY (July, 2005, Version 1.1) 39 AMIC Technology, Corp.
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Function Truth Table for CKE (Table 2)
Current
State
Self
Refresh
Both
Bank
Precharge
Power
Down
All
Banks
Idle
Any State
Other than
Listed
Above
Abbreviations : ABI = All Banks Idle
Note: 6. After CKE’s low to high transition to exit self refresh mode, a minimum of t
new command.
7. CKE low to high transition is asynchronous as if it restarts internal clock.
A minimum setup time “tSS + one clock” must be satisfied before any command can be issued other than exit.
8. Power-down and self refresh can be entered only when all the banks are in idle state.
9. Must be a legal command.
CKE
CKE
n-1
H X X X X X X INVALID
L H H X X X X
L H L H H H X
L H L H H L X ILLEGAL
L H L H L X X ILLEGAL
L H L L X X X ILLEGAL
L L X X X X X NOP(Maintain Self Refresh)
H X X X X X X INVALID
L H H X X X X
L H L H H H X
L H L H H L X ILLEGAL
L H L H L X X ILLEGAL
L H L L X X X ILLEGAL
L L X X X X X NOP(Maintain Power Down Mode)
H H X X X X X Refer to Table 1
H L H X X X X Enter Power Down 8
H L L H H H X Enter Power Down 8
H L L H H L X ILLEGAL
H L L H L X X ILLEGAL
H L L L H H RA Row (& Bank ) Active
H L L L L H X Enter Self Refresh 8
H L L L L L OPCODE MRS
L L X X X X X NOP
H H X X X X X Refer to Operations in Table 1
H L X X X X X Begin Clock Suspend next cycle 9
L H X X X X X Exit Clock Suspend next cycle 9
L L X X X X X Maintain clock Suspend
n
CS RA
CAS
AddressAction Note
WE
Exit Self Refresh
Exit Self Refresh
Exit Power Down
Exit Power Down
→ABI after tRC
→ABI after tRC
→ABI
→ABI
RC(min) has to be elapse before issuing a
6
6
7
7
PRELIMINARY (July, 2005, Version 1.1) 40 AMIC Technology, Corp.
Page 42
A43P26161
Ordering Information
Part No. Min. Cycle Time
(ns)
A43P26161G-75 7.5 133 6 ns 54B CSP
A43P26161G-75F 7.5 133 6 ns 54B Pb-Free CSP
A43P26161G-75U 7.5 133 6 ns 54B CSP
A43P26161G-75UF 7.5 133 6 ns 54B Pb-Free CSP
A43P26161V-75 7.5 133 6 ns 54 TSOP (II)
A43P26161V-75F 7.5 133 6 ns 54 Pb-Free TSOP (II)
A43P26161V-75U 7.5 133 6 ns 54 TSOP (II)
A43P26161V-75UF 7. 5 133 6 ns 54 Pb-Free TSOP (II)
A43P26161G-95 9.5 105 7 ns 54B CSP
A43P26161G-95F 9.5 105 7 ns 54B Pb-Free CSP
A43P26161G-95U 9.5 105 7 ns 54B CSP
A43P26161G-95UF 9.5 105 7 ns 54B Pb-Free CSP
Max. Clock Frequency
(MHz)
Access Time Package
A43P26161V-95 9.5 105 7 ns 54 TSOP (II)
A43P26161V-95F 9.5 105 7 ns 54 Pb-Free TSOP (II)
A43P26161V-95U 9.5 105 7 ns 54 TSOP (II)
A43P26161V-95UF 9. 5 105 7 ns 54 Pb-Free TSOP (II)
Note: -U is for industrial operating temperature range -40ºC to +85ºC.
PRELIMINARY (July, 2005, Version 1.1) 41 AMIC Technology, Corp.
Page 43
A43P26161
Package Information
54 Ball (8 x 8 mm) Outline Dimensions
Max. 0.20
unit: mm
E1
123456789
D1
A
B
C
D
E
F
G
H
J
E
E/2
Encapsulant
e
D
D/2
A
A1
z
b
Symbol
Dimensions in mm
MIN.NOM.MAX.
A - - 1.00
A1 0.200.250.30
E 7.958.008.05
E1 6.40 BSC
D 7.958.008.05
D1 6.40 BSC
e 0.80 BSC
b 0.300.350.40
z - - 0.10
PRELIMINARY (July, 2005, Version 1.1) 42 AMIC Technology, Corp.