Datasheet A43L0616AV-7, A43L0616AV-5.5 Datasheet (AMIC)

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A43L0616A
512K X 16 Bit X 2 Banks Synchronous DRAM
Document Title 512K X 16 Bit X 2 Banks Synchronous DRAM
Rev. No. History Issue Date Remark
0.0 Initial issue December 4, 2000 Preliminary
0.1 Add input/output capacitance specification February 13, 2001 Add Cl2 spec for (-5, -5.5, -6) Modify MRS Set Cycle Waveform error
0.2 Add -U for industrial operating temperature range April 11, 2001
1.0 Final spec. release May 29, 2001 Final Some AC parameter unit update
(May, 2001, Version 1.0) AMIC Technology, Inc.
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A43L0616A
512K X 16 Bit X 2 Banks Synchronous DRAM
Features
n JEDEC standard 3.3V power supply n LVTTL compatible with multiplexed address
n Dual banks / Pulse RAS n MRS cycle with address key programs
- CAS Latency (2,3)
- Burst Length (1,2,4,8 & full page)
- Burst Type (Sequential & Interleave)
n All inputs are sampled at the positive going edge of the
system clock
General Description
The A43L0616A is 16,777,216 bits synchronous high data rate Dynamic RAM organized as 2 X 524,288 words by 16 bits, fabricated with AMIC’s high performance CMOS technology. Synchronous design allows precise cycle control with the use of system clock. I/O transactions are
n Industrial operating temperature range: -40ºC to +85ºC
for -U
n Burst Read Single-bit Write operation n DQM for masking n Auto & self refresh n 32ms refresh period (2K cycle) n 50 Pin TSOP (II)
possible on every clock cycle. Range of operating frequencies, programmable latencies allows the same device to be useful for a variety of high bandwidth, high performance memory system applications.
Pin Configuration
nn TSOP (II)
DQ15
DQ14
VSS
50 49 48 47 46 45 44 43 42 41 3940 38 37 36 35 34 33 32 31 30 29 28 27 26
VSSQ
VDDQ
DQ13
DQ12
VSSQ
DQ9
DQ8
NC/RFU
UDQM
CLK
DQ11
DQ10
VDDQ
CKENCA9A8A7A6A5A4VSS
A43L0616AV
1 2 3 4 5 6 7 8 9 10 1211 13 14 15 16 17 18 19 20 21 22 23 24 25
VDD
DQ0
DQ1
DQ2
DQ3
DQ4
VSSQ
VDDQ
DQ5
VSSQ
DQ7
DQ6
VDDQ
LDQM
WE
CAS
RAS
CS
A10/AP
A0A1A2
BA
A3
VDD
(May, 2001, Version 1.0) 1 AMIC Technology, Inc.
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A43L0616A
Block Diagram
CLK
ADD
Address Register
LRAS
Bank Select
Refresh Counter
Row Buffer
LCBR
LRAS
Row Decoder Column Buffer
Data Input Register
512K X 16
512K X 16
Column Decoder
Latency & Burst Length
Sense AMP
I/O Control Output Buffer
LWE
LDQM
DQi
Programming Register
LDQM
LWCBR
L(U)DQM
LRAS LCBR LWE
CLK CKE
LCAS
Timing Register
CS RAS CAS WE
(May, 2001, Version 1.0) 2 AMIC Technology, Inc.
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A43L0616A
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Pin Descriptions
Symbol Name Description
CLK System Clock Active on the positive going edge to sample all inputs.
CS
CKE Clock Enable
A0~A10/AP Address
BA Bank Select Address
RAS
CAS
L(U)DQM
Chip Select
Row Address Strobe
Column Address Strobe
Write Enable Enables write operation and Row precharge.
Data Input/Output Mask
Disables or Enables device operation by masking or enabling all inputs except CLK, CKE and L(U)DQM
Masks system clock to freeze operation from the next clock cycle. CKE should be enabled at least one clock + tss prior to new command. Disable input buffers for power down in standby. Row / Column addresses are multiplexed on the same pins. Row address : RA0~RA10, Column address: CA0~CA7 Selects bank to be activated during row address latch time. Selects band for read/write during column address latch time.
Latches row addresses on the positive going edge of the CLK with RAS low. Enables row access & precharge.
Latches column addresses on the positive going edge of the CLK with Enables column access.
Makes data output Hi-Z, t SHZ after the clock and masks the output. Blocks data input when L(U)DQM active.
CAS
low.
DQ0-15 Data Input/Output Data inputs/outputs are multiplexed on the same pins.
VDD/VSS
VDDQ/VSSQ
NC/RFU No Connection
(May, 2001, Version 1.0) 3 AMIC Technology, Inc.
Power Supply/Ground
Data Output Power/Ground
Power Supply: +3.3V±0.3V/Ground
Provide isolated Power/Ground to DQs for improved noise immunity.
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A43L0616A
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Absolute Maximum Ratings*
Voltage on any pin relative to VSS (Vin, Vout ) . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -1.0V to +4.6V
Voltage on VDD supply relative to VSS (VDD, VDDQ )
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-1.0V to +4.6V
Storage Temperature (TSTG) . . . . . . . . . . -55°C to +150°C
Soldering Temperature X Time (TSLODER) . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C X 10sec
Power Dissipation (PD) . . . . . . . . . . . . . . . . . . . . . . . . .1W
Short Circuit Current (Ios) . . . . . . . . . . . . . . . . . . . . 50mA
*Comments
Permanent device damage may occur if “Absolute Maximum Ratings” are exceeded. Functional operation should be restricted to recommended operating condition. Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
Capacitance (TA=25°°C, f=1MHz)
Parameter Symbol Condition Min Typ Max Unit
Input Capacitance CI1 A0 to A10, BA 2 4 pF CI2
Data Input/Output Capacitance CI/O DQ0 to DQ15 2 6 pF
CLK, CKE, CS, UDQM, LDQM
RAS,CAS
,
2 4 pF
,
DC Electrical Characteristics
Recommend operating conditions (Voltage referenced to VSS = 0V, TA = 0ºC to +70ºC or -40ºC to +85ºC)
Parameter Symbol Min Typ Max Unit Note
Supply Voltage VDD,VDDQ 3.0 3.3 3.6 V Input High Voltage VIH 2.0 3.0 VDD+0.3 V Input Low Voltage VIL -0.3 0 0.8 V Note 1 Output High Voltage VOH 2.4 - - V IOH = -2mA Output Low Voltage VOL - - 0.4 V IOL = 2mA Input Leakage Current IIL -5 - 5 Output Leakage Current IOL -5 - 5 Output Loading Condition See Figure 1
Note: 1. VIL (min) = -1.5V AC (pulse width 5ns).
2. Any input 0V VIN VDD + 0.3V, all other pins are not under test = 0V
3. Dout is disabled, 0V Vout VDD
µA µA
Note 2 Note 3
(May, 2001, Version 1.0) 4 AMIC Technology, Inc.
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A43L0616A
Decoupling Capacitance Guide Line
Recommended decoupling capacitance added to power line at board.
Parameter Symbol Value Unit
Decoupling Capacitance between VDD and VSS CDC1 0.1 + 0.01
Decoupling Capacitance between VDDQ and VSSQ CDC2 0.1 + 0.01
Note: 1. VDD and VDDQ pins are separated each other.
All VDD pins are connected in chip. All VDDQ pins are connected in chip.
2. VSS and VSSQ pins are separated each other All VSS pins are connected in chip. All VSSQ pins are connected in chip.
DC Electrical Characteristics
(Recommended operating condition unless otherwise noted, TA = 0 to 70°C or -40ºC to +85ºC)
Symbol Parameter Test Conditions
Icc1
Icc2 P
Operating Current (One Bank Active)
Precharge Standby
Burst Length = 1 tRC tRC(min), tCC tCC(min), IOL = 0mA
CKE VIL(max), tCC = 15ns
Current in power-
Icc2 PS
ICC2N
ICC2NS
ICC3 P
down mode
Precharge Standby Current in non power-down mode
Active Standby
CKL VIL(max), tCC = CKE VIH(min), CS VIH(min), tCC = 15ns
Input signals are changed one time during 30ns CKE VIH(min), CLK VIL(max), tCC =
Input signals are stable. CKE VIL(max), tCC = 15ns
Current in power-
ICC3 PS
down mode CKE VIL(max) tCC =
CAS
Latency
Speed
-5.5
-5
230 210 190 160
-6 -7
1 1
15
4
2 1
µF
µF
Unit Notes
mA 1
mA
mA
mA
ICC3N
Active Standby current in non power-down mode
ICC3NS
ICC4
(One Bank Active)
Operating Current (Burst Mode)
ICC5 Refresh Current ICC6
Self Refresh Current
CKE VIH(min), CS VIH(min), tCC = 15ns Input signals are changed one time during 30ns CKE VIH(min), CLK VIL(max), tCC = Input signals are stable.
IOL = 0mA, Page Burst All bank Activated, tCCD = tCCD (min)
3 250 230 210 180
2 - - - 180
tRC tRC (min) CKE 0.2V
25
15
250 230 210 180
1 mA
mA
mA 1
mA 2
Note: 1. Measured with outputs open. Addresses are changed only one time during tCC(min).
2. Refresh period is 32ms. Addresses are changed only one time during tCC(min).
(May, 2001, Version 1.0) 5 AMIC Technology, Inc.
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A43L0616A
AC Operating Test Conditions
(VDD = 3.3V ±0.3V, TA = 0°C to +70°C or -40ºC to +85ºC)
Parameter Value
AC input levels VIH/VIL = 2.4V/0.4V Input timing measurement reference level 1.4V Input rise and all time (See note3) tr/tf = 1ns/1ns Output timing measurement reference level 1.4V Output load condition See Fig.2
3.3V
Output
870
VOH(DC) = 2.4V, IOH = -2mA
1200
VOL(DC) = 0.4V, IOL = 2mA
ZO=50
OUTPUT
30pF
VTT =1.4V
50
30pF
(Fig. 1) DC Output Load Circuit
(Fig. 2) AC Output Load Circuit
AC Characteristics
(AC operating conditions unless otherwise noted)
Symbol Parameter CAS
Latency
3 5 5.5 6 7
tCC CLK cycle time
2 7
CLK to valid
3 - 4.5 - 5 - 5.5 - 6
tSAC
Output delay
2 - 5 - 5.5 - 6 - 7
tOH Output data hold time 2 2 2.5 2.5 ns 2
3 2 2 2.5 2.5
tCH CLK high pulse width
2 2
-5 -5.5 -6 -7
Min Max Min Max Min Max Min Max
1000
-
7
2
1000
-
8
2.5
1000
-
1000 ns 1
8
- ns 3
3
Unit Note
ns 1,2
(May, 2001, Version 1.0) 6 AMIC Technology, Inc.
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A43L0616A
AC Characteristics (continued)
(AC operating conditions unless otherwise noted)
Symbol Parameter CAS
Latency
3 2 2 2.5 2.5
tCL CLK low pulse width
2 2
3 2 2 2 2
tSS Input setup time
2 2
3
tSH Input hold time
2
3
tSLZ CLK to output in Low-Z
2
tSHZ
CLK to output
In Hi-Z
3 - 5.5 - 5.5 - 5.5 - 6
2 - 5.5 - 5.5 - 6 - 7
-5 -5.5 -6 -7
Min Max Min Max Min Max Min Max
­2
­2
1 - 1 - 1 - 1 - ns 3
1 - 1 - 1 - 1 - ns 2
-
2.5
-
2.5
*All AC parameters are measured from half to half.
­3
-
2.5
Unit Note
- ns 3
- ns 3
ns
Note : 1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf) = 1ns. If tr & tf is longer than 1ns, transient time compensation should be considered, i.e., [(tr + tf)/2-1]ns should be added to the parameter.
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A43L0616A
Operating AC Parameter
(AC operating conditions unless otherwise noted)
CAS
Symbol Parameter
tRRD(min) Row active to row active delay 10 11 12 14 ns 1 tRCD(min)
tRP(min) Row precharge time 15 17 18 20 ns 1
tRAS(min) 40 42 42 42 ns 1
tRAS(max)
tRC(min) Row cycle time 55 60.5 60 63 ns 1
tCDL(min) Last data in new col. Address delay 1 CLK 2 tRDL(min) Last data in row precharge 2 2 2 2 CLK 2 tBDL(min) Last data in to burst stop 1 CLK 2 tCCD(min) Col. Address to col. Address delay 1 CLK
Number of valid output data
RAS to
Row active time
CAS
delay
Latency
-5 -5.5 -6 -7
15 17 18 20 ns 1
3 2 CLK 4 2 1 CLK
Version
100
Unit Note
µs
Note: 1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time
and then rounding off to the next higher integer.
2. Minimum delay is required to complete write.
3. All parts allow every cycle column address change.
4. In case of row precharge interrupt, auto precharge and read burst stop.
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A43L0616A
RAS
WE
Simplified Truth Table
Command CKEn-1 CKEn
Register
Refresh
Bank Active & Row Addr. H X L L H H X V Row Addr. 4
Column Addr.
Column Addr. Burst Stop H X L H H L X X 6
Precharge
Clock Suspend or Active Power Down
Precharge Power Down Mode
DQM H X V X 7 No Operation Command H X
Mode Register Set Auto Refresh H
Self Refresh
Auto Precharge Disable L 4 Read & Auto Precharge Enable Auto Precharge Disable L 4 Write & Auto Precharge Enable
Bank Selection V L Both Banks
Entry
Exit L H
Entry
Exit L H X X X X X
Entry H L
Exit L H
H X L L L L X OP CODE
H
H X L H L H X V
H X L H L L X V
H X L L H L X
H L
L
CS
L L L H X X L H H H 3
H X X X
L H H H
H X X X
L H H H
H X X X
L V V V
H X X X
L H H H
H X X X
CAS
DQM BA A10
/AP
X X
H
H
X H
X
X
X
X X
A9~A0 Notes
Column
Addr.
Column
Addr.
X
X
X
1,2
3 3
3
4,5
4,5
(V = Valid, X = Don’t Care, H = Logic High, L = Logic Low)
Note : 1. OP Code : Operand Code
A0~A10/AP,BA : Program keys. (@MRS)
2. MRS can be issued only at both banks precharge state. A new command can be issued after 2 clock cycle of MRS.
3. Auto refresh functions as same as CBR refresh of DRAM. The automatical precharge without Row precharge command is meant by “Auto”. Auto/Self refresh can be issued only at both precharge state.
4. BA : Bank select address.
If “Low” at read, write, Row active and precharge, bank A is selected. If “High” at read, write, Row active and precharge, bank B is selected. If A10/AP is “High” at Row precharge, BA is ignored and both banks are selected.
5. During burst read or write with auto precharge, new read write command cannot be issued.
Another bank read write command can be issued at every burst length.
6. Burst stop command is valid at every burst length.
7. DQM sampled at positive going edge of a CLK masks the data-in at the very CLK (Write DQM latency is 0),
but makes the data-out Hi-Z state after 2 CLK cycles. (Read DQM latency is 2)
(May, 2001, Version 1.0) 9 AMIC Technology, Inc.
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A43L0616A
Mode Register Filed Table to Program Modes
Register Programmed with MRS
Address BA A10/AP A9 A8 A7 A6 A5 A4 A3 A2 A1 A0
Function RFU RFU W.B.L TM CAS Latency BT Burst Length
(Note 1) (Note 2)
Test Mode CAS Latency Burst Type Burst Length
A8 A7 Type A6 A5 A4 Latency A3 Type A2 A1 A0 BT=0 BT=1
0 0 Mode Register Set 0 0 0 Reserved 0 Sequential 0 0 0 1 Reserved 0 1 0 0 1 - 1 Interleave 0 0 1 2 Reserved 1 0 0 1 0 2 0 1 0 4 4 1 1
Write Burst Length
A9 Length
0 Burst 1 1 0 Reserved 1 1 0 Reserved Reserved 1 Single Bit 1 1 1 Reserved
Vendor
Use
Only
0 1 1 3 0 1 1 8 8 1 0 0 Reserved 1 0 0 Reserved Reserved 1 0 1 Reserved 1 0 1 Reserved Reserved
1 1 1 256(Full) Reserved
(Note 3)
Power Up Sequence
1. Apply power and start clock, Attempt to maintain CKE = “H”, DQM = “H” and the other pins are NOP condition at inputs.
2. Maintain stable power, stable clock and NOP input condition for a minimum of 200µs.
3. Issue precharge commands for all banks of the devices.
4. Issue 2 or more auto-refresh commands.
5. Issue a mode register set command to initialize the mode register. cf.) Sequence of 4 & 5 may be changed.
The device is now ready for normal operation. Note : 1. RFU(Reserved for Future Use) should stay “0” during MRS cycle.
2. If A9 is high during MRS cycle, “Burst Read Single Bit Write” function will be enabled.
3. The full column burst (256bit) is available only at Sequential mode of burst type.
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A43L0616A
Burst Sequence (Burst Length = 4)
Initial address A1 A0
0 0 0 1 2 3 0 1 2 3 0 1 1 2 3 0 1 0 3 2 1 0 2 3 0 1 2 3 0 1 1 1 3 0 1 2 3 2 1 0
Sequential Interleave
Burst Sequence (Burst Length = 8)
Initial address
Sequential Interleave
A2 A1 A0
0 0 0 0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7 0 0 1 1 2 3 4 5 6 7 0 1 0 3 2 5 4 7 6 0 1 0 2 3 4 5 6 7 0 1 2 3 0 1 6 7 4 5 0 1 1 3 4 5 6 7 0 1 2 3 2 1 0 7 6 5 4 1 0 0 4 5 6 7 0 1 2 3 4 5 6 7 0 1 2 3 1 0 1 5 6 7 0 1 2 3 4 5 4 7 6 1 0 3 2 1 1 0 6 7 0 1 2 3 4 5 6 7 4 5 2 3 0 1 1 1 1 7 0 1 2 3 4 5 6 7 6 5 4 3 2 1 0
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Device Operations
Clock (CLK)
The clock input is used as the reference for all SDRAM operations. All operations are synchronized to the positive going edge of the clock. The clock transitions must be monotonic between VIL and VIH. During operation with CKE high all inputs are assumed to be in valid state (low or high) for the duration of set up and hold time around positive edge of the clock for proper functionality and ICC specifications.
Clock Enable (CLK)
The clock enable (CKE) gates the clock onto SDRAM. If CKE goes low synchronously with clock (set-up and hold time same as other inputs), the internal clock is suspended form the next clock cycle and the state of output and burst address is frozen as long as the CKE remains low. All other inputs are ignored from the next clock cycle after CKE goes low. When both banks are in the idle state and CKE goes low synchronously with clock, the SDRAM enters the power down mode form the next clock cycle. The SDRAM remains in the power down mode ignoring the other inputs as long as CKE remains low. The power down exit is synchronous as the internal clock is suspended. When CKE goes high at least “tSS + 1 CLOCK” before the high going edge of the clock, then the SDRAM becomes active from the same clock edge accepting all the input commands.
Bank Select (BA)
This SDRAM is organized as two independent banks of 524,288 words X 16 bits memory arrays. The BA inputs is
latched at the time of assertion of the bank to be used for the operation. When BA is asserted low, bank A is selected. When BA is asserted high, bank B is selected. The bank select BA is latched at bank activate, read, write mode register set and precharge operations.
Address Input (A0 ~ A10/AP)
The 19 address bits required to decode the 524,288 word locations are multiplexed into 11 address input pins (A0~A10/AP). The 11 bit row address is latched along with
and BA during bank activate command. The 8 bit
RAS
column address is latched along with during read or write command.
NOP and Device Deselect
When performs no operation (NOP). NOP does not initiate any new operation, but is needed to complete operations which require more than single clock like bank activate, burst read, auto refresh, etc. The device deselect is also a NOP
RAS
,
CAS
and
and
RAS
CAS
are high, the SDRAM
to select
CAS
, WE and BA
and is entered by asserting the command decoder so that
all the address inputs are ignored.
Power-Up
The following sequence is recommended for POWER UP
1. Power must be applied to either CKE and DQM inputs to pull them high and other pins are NOP condition at the inputs before or along with VDD (and VDDQ) supply. The clock signal must also be asserted at the same time.
2. After VDD reaches the desired voltage, a minimum pause of 200 microseconds is required with inputs in NOP condition.
3. Both banks must be precharged now.
4. Perform a minimum of 2 Auto refresh cycles to stabilize the internal circuitry.
5. Perform a MODE REGISTER SET cycle to program the CAS latency, burst length and burst type as the default value of mode register is undefined.
At the end of one clock cycle from the mode register set cycle, the device is ready for operation. When the above sequence is used for Power-up, all the out-puts will be in high impedance state. The high impedance of outputs is not guaranteed in any other power-up sequence. cf.) Sequence of 4 & 5 may be changed.
Mode Register Set (MRS)
The mode register stores the data for controlling the various operation modes of SDRAM. It programs the CAS latency, addressing mode, burst length, test mode and various vendor specific options to make SDRAM useful for variety of different applications. The default value of the mode register is not defined, therefore the mode register must be written after power up to operate the SDRAM. The
mode register is written by asserting low on
,
CAS
CKE already high prior to writing the mode register). The state of address pins A0~A10/AP and BA in the same cycle
as
CS the mode register. One clock cycle is required to complete the write in the mode register. The mode register contents can be changed using the same command and clock cycle requirements during operation as long as both banks are in the idle state. The mode register is divided into various fields depending on functionality. The burst length field uses A0~A2, burst type uses A3, addressing mode uses A4~A6, A7~A8, A10/AP and BA are used for vendor specific options or test mode. And the write burst length is programmed using A9. A7~A8, A10/AP and BA must be set to low for normal SDRAM operation. Refer to table for specific codes for various burst length, addressing modes and CAS latencies.
(The SDRAM should be in active mode with
,
,
,WE going low is the data written in
CAS
RAS
CS
RAS
high.
,
high disables
CS
and WE, and
CAS
CS
,
RAS
,
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Device Operations (continued)
Bank Activate
The bank activate command is used to select a random row in an idle bank. By asserting low on
desired row and bank addresses, a row access is initiated. The read or write operation can occur after a time delay of tRCD(min) from the time of bank activation. tRCD(min) is an internal timing parameter of SDRAM, therefore it is dependent on operating clock frequency. The minimum number of clock cycles required between bank activate and read or write command should be calculated by dividing tRCD(min) with cycle time of the clock and then rounding off the result to the next higher integer. The SDRAM has two internal banks on the same chip and shares part of the internal circuitry to reduce chip area, therefore it restricts the activation of both banks immediately. Also the noise generated during sensing of each bank of SDRAM is high requiring some time for power supplies recover before the other bank can be sensed reliably. tRRD(min) specifies the minimum time required between activating different banks. The number of clock cycles required between different bank activation must be calculated similar to tRCD specification. The minimum time required for the bank to be active to initiate sensing and restoring the complete row of dynamic cells is determined by tRAS(min) specification before a precharge command to that active bank can be asserted. The maximum time any bank can be in the active state is determined by tRAS(max). The number of cycles for both tRAS(min) and tRAS(max) can be calculated similar to tRCD specification.
Burst Read
The burst read command is used to access burst of data on consecutive clock cycles from an active row in an active bank. The burst read command is issued by asserting low
on CS and of the clock. The bank must be active for at least tRCD(min) before the burst read command is issued. The first output appears CAS latency number of clock cycles after the issue of burst read command. The burst length, burst sequence and latency from the burst read command is determined by the mode register which is already programmed. The burst read can be initiated on any column address of the active row. The address wraps around if the initial address does not start from a boundary such that number of outputs from each I/O are equal to the burst length programmed in the mode register. The output goes into high-impedance at the end of the burst, unless a new burst read was initiated to keep the data output gapless. The burst read can be terminated by issuing another burst read or burst write in the same bank or the other active bank or a precharge command to the same bank. The burst stop command is valid at every page burst length.
with WE being high on the positive edge
CAS
RAS
and
CS
with
Burst Write
The burst write command is similar to burst read command, and is used to write data into the SDRAM consecutive clock cycles in adjacent addresses depending on burst length and
burst sequence. By asserting low on CS, with valid column address, a write burst is initiated. The data inputs are provided for the initial address in the same clock cycle as the burst write command. The input buffer is deselected at the end of the burst length, even though the internal writing may not have been completed yet. The writing can not complete to burst length. The burst write can be terminated by issuing a burst read and DQM for blocking data inputs or burst write in the same or the other active bank. The burst stop command is valid only at full page burst length where the writing continues at the end of burst and the burst is wrap around. The write burst can also be terminated by using DQM for blocking data and precharging the bank “tRDL” after the last data input to be written into the active row. See DQM OPERATION also.
DQM Operation
The DQM is used to mask input and output operation. It works similar to OEduring read operation and inhibits
writing during write operation. The read latency is two cycles from DQM and zero cycle for write, which means DQM masking occurs two cycles later in the read cycle and occurs in the same cycle during write cycle. DQM operation is synchronous with the clock, therefore the masking occurs for a complete cycle. The DQM signal is important during burst interrupts of write with read or precharge in the SDRAM. Due to asynchronous nature of the internal write, the DQM operation is critical to avoid unwanted or incomplete writes when the complete burst write is not required.
Precharge
The precharge operation is performed on an active bank by asserting low on CS,
BA of the bank to be precharged. The precharge command can be asserted anytime after tRAS(min) is satisfied from the bank activate command in the desired bank. “tRP” is defined as the minimum time required to precharge a bank. The minimum number of clock cycles required to complete row precharge is calculated by dividing “tRP” with clock cycle time and rounding up to the next higher integer. Care should be taken to make sure that burst write is completed or DQM is used to inhibit writing before precharge command is asserted. The maximum time any bank can be active is specified by tRAS(max). Therefore, each bank has to be precharged within tRAS(max) from the bank activate command. At the end of precharge, the bank enters the idle state and is ready to be activated again. Entry to Power Down, Auto refresh, Self refresh and Mode register Set etc, is possible only when both banks are in idle state.
RAS
,
and A10/AP with valid
CAS
and WE
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WE
Device Operations (continued)
Auto Precharge
The precharge operation can also be performed by using auto precharge. The SDRAM internally generates the timing to satisfy tRAS(min) and “tRP” for the programmed burst length and CAS latency. The auto precharge command is issued at the same time as burst read or burst write by asserting high on A10/AP. If burst read or burst write command is issued with low on A10/AP, the bank is left active until a new command is asserted. Once auto precharge command is given, no new commands are possible to that particular bank until the bank achieves idle state.
Both Banks Precharge
Both banks can be precharged at the same time by using Precharge all command. Asserting low on CS,
with high on A10/AP after both banks have satisfied tRAS(min) requirement, performs precharge on both banks. At the end of tRP after performing precharge all, both banks are in idle state.
Auto Refresh
The storage cells of SDRAM need to be refreshed every 32ms to maintain data. An auto refresh cycle accomplishes refresh of a single row of storage cells. The internal counter increments automatically on every auto refresh cycle to refresh all the rows. An auto refresh command is issued by
asserting low on CS, and
with both banks being in idle state and the device is not in power down mode (CKE is high in the previous cycle). The time required to complete the auto refresh
. The auto refresh command can only be asserted
RAS
and
with high on CKE
CAS
RAS
and
operation is specified by “tRC(min)”. The minimum number of clock cycles required can be calculated by driving “tRC” with clock cycle time and then rounding up to the next higher integer. The auto refresh command must be followed by NOP’s until the auto refresh operation is completed. Both banks will be in the idle state at the end of auto refresh operation. The auto refresh is the preferred refresh mode when the SDRAM is being used for normal data transactions. The auto refresh cycle can be performed once in 15.6us or a burst of 2048 auto refresh cycles once in 32ms.
Self Refresh
The self refresh is another refresh mode available in the SDRAM. The self refresh is the preferred refresh mode for data retention and low power operation of SDRAM. In self refresh mode, the SDRAM disables the internal clock and all the input buffers except CKE. The refresh addressing and timing is internally generated to reduce power consumption. The self refresh mode is entered from all banks idle state by
asserting low on CS,
. Once the self refresh mode is entered, only CKE state being low matters, all the other inputs including clock are ignored to remain in the self refresh. The self refresh is exited by restarting the external clock and then asserting high on CKE. This must be followed by NOP’s for a minimum time of “tRC” before the SDRAM reaches idle state to begin normal operation. If the system uses burst auto refresh during normal operation, it is recommended to used burst 2048 auto refresh cycles immediately after exiting self refresh.
RAS
,
and CKE with high on
CAS
(May, 2001, Version 1.0) 14 AMIC Technology, Inc.
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A43L0616A
Basic feature And Function Descriptions
1. CLOCK Suspend
1) Click Suspended During Write (BL=4)
CLK
CMD
CKE
Internal
CLK
DQ(CL2)
DQ(CL3)
Note: CLK to CLK disable/enable=1 clock
WR
D0 D1 D2 D3
D0 D1 D2 D3
2. DQM Operation
1) Write Mask (BL=4)
CLK
CMD
DQM
DQ(CL2)
DQ(CL3)
WR
D0 D1 D3
D0 D1 D3
DQM to Data-in Mask = 0CLK
Masked by CKE
Not Written
Masked by CKE
2) Clock Suspended During Read (BL=4)
RD
2) Read Mask (BL=4)
RD
Masked by CKE
Q0 Q1 Q3
Q0 Q2 Q3
Masked by CKE
Hi-Z
Q0 Q1 Q3
Hi-Z
Q1 Q2 Q3
DQM to Data-out Mask = 2
Q2
Q1
Suspended Dout
2) Read Mask (BL=4)
CLK
RD
CMD CKE
DQM
DQ(CL2)
DQ(CL3)
Hi-Z
Q0 Q2 Q4
Hi-Z
Q1 Q3
Hi-Z
Hi-Z Hi-Z
Hi-Z
Q6 Q7 Q8
Q5 Q6 Q7
* Note : 1. DQM makes data out Hi-Z after 2 clocks which should masked by CKE “L”.
2. DQM masks both data-in and data-out.
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A43L0616A
3. CAS Interrupt (I)
CLK CMD ADD
DQ(CL2) DQ(CL3)
CLK
CMD
ADD
DQ
1) Read interrupted by Read (BL=4)
RD RD
A B
QA0 QB0 QB1 QB2 QB3
QA0 QB0 QB1 QB2 QB3
tCCD
Note2
2) Write interrupted by Write (BL =2)
WR WR
tCCD
Note2
A B
DA0 DB0 DB1
tCDL
Note3
Note 1
3) Write interrupted by Read (BL =2)
WR RD
tCCD
A B
DQ(CL2) DQ(CL3)
DA0 QB0 QB1
DA0
tCDL
Note3
Note2
QB0 QB1
Note : 1. By “Interrupt”, It is possible to stop burst read/write by external command before the end of burst.
By “
2. tCCD :
Interrupt”, to stop burst read/write by
CAS
CAS
to
delay. (=1CLK)
CAS
access; read, write and block write.
CAS
3. tCDL : Last data in to new column address delay. (= 1CLK).
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A43L0616A
4. CAS Interrupt (II) : Read Interrupted Write & DQM
(1) CL=2, BL=4
CLK
i) CMD
DQM
DQ
ii) CMD
DQM
DQ
iii) CMD
DQM
DQ
iv) CMD
DQM
DQ
(2) CL=3, BL=4
CLK
i) CMD
DQM
DQ
ii) CMD
RD WR
D0 D1 D2 D3
RD
RD WR
RD WR
RD
WR
Hi-Z
D0 D1 D2 D3
WRRD
Hi-Z
D0 D1 D2 D3
Hi-Z
Note 1
D0 D1 D2 D3
WR
D0 D1 D2 D3Q0
DQM
D0 D1 D2 D3
WRRD
D0 D1 D2 D3
WR
Hi-Z
D0 D1 D2 D3
WR
Hi-Z
Note 2
D0 D1 D2Q0
D3
iii) CMD
iv) CMD
v) CMD
DQ
DQM
DQ
RD WR
DQM
DQ
RD
DQM
DQ
* Note : 1. To prevent bus contention, there should be at least one gap between data in and data out.
2. To prevent bus contention, DQM should be issued which makes a least one gap between data in and data out.
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A43L0616A
5. Write Interrupted by Precharge & DQM
CLK
CMD
DQM
DQ
WR PRE
D0 D1 D2 D3
Masked by DQM
Note : 1. To inhibit invalid write, DQM should be issued.
2. This precharge command and burst write command should be of the same bank, otherwise it is not precharge
interrupt but only another bank precharge of dual banks operation.
6. Precharge
1) Normal Write (BL=4) CLK
CMD
DQ
2) Read (BL=4)
CLK
CMD
DQ(CL2)
WR PRE D0 D1 D2 D3
RD PRE
Q0 Q1 Q2 Q3
Note 2
Note 1
t
RDL
Q0 Q1 Q2 Q3DQ(CL3)
7. Auto Precharge
1) Normal Write (BL=4) CLK
CMD
DQ
2) Read (BL=4)
CLK
CMD
DQ(CL2)
* Note : 1. The row active command of the precharge bank can be issued after tRP from this point.
The new read/write command of other active bank can be issued from this point. At burst read/write with auto precharge,
WR D0 D1 D2 D3
RD
Q0 Q1 Q2 Q3
Q0 Q1 Q2 Q3DQ(CL3)
Auto Precharge Starts
Auto Precharge Starts
CAS
Note 1
Note 1
interrupt of the same/another bank is illegal.
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8. Burst Stop & Precharge Interrupt
9. MRS
1) Write Interrupted by Precharge (BL=4)
CLK
CMD
DQM
DQ
3) Read Interrupted by Precharge (BL=4)
CLK
CMD
DQ(CL2)
DQ(CL3)
WR PRE
D0 D1 D2 D3
tRDL
RD
PRE
Q0 Q1
Note 1
Note 3 1
Q0 Q1
2) Write Burst Stop (BL=8) CLK
CMD
DQ
4) Read Burst Stop (BL=4) CLK
CMD
DQ(CL2)
2
WR
D1
D0 D2
RD
STOP
Q0 Q1
STOP
tBDL (note 2)
Q0 Q1DQ(CL3)
Note 3 1
2
Mode Register Set
CLK
Note 4
CMD
PRE MRS
tRP
Note : 1. tRDL : 2CLK, Last Data in to Row Precharge.
2. tBDL : 1CLK, Last Data in to Burst Stop Delay.
3. Number of valid output data after Row precharge or burst stop : 1,2 for CAS latency=2,3 respectively.
4. PRE : Both banks precharge if necessary. MRS can be issued only at all bank precharge state.
ACT
1CLK
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10. Clock Suspend Exit & Power Down Exit
1) Clock Suspend (=Active Power Down) Exit CLK
CKE
Internal
Note 1
CLK
CMD
11. Auto Refresh & Self Refresh
1) Auto Refresh CLK
CKE
Internal
CLK
CMD
2) Self Refresh
Note 3
Note 4
PRE AR CMD
t
Note 6
2) Power Down (=Precharge Power Down) Exit CLK
tSS
CKE
Internal
tSS
Note 2
CLK
NOP
RD
~
RP
t
RC
CMD
~
~
Note 5
~
~
~
~
~
ACT
CLK
Note 4
CMD
CKE
PRE
t
RP
SR
* Note : 1. Active power down : one or more bank active state.
2. Precharge power down : both bank precharge state.
3. The auto refresh is the same as CBR refresh of conventional DRAM. No precharge commands are required after Auto Refresh command. During tRC from auto refresh command, any other command can not be accepted.
4. Before executing auto/self refresh command, both banks must be idle state.
5. MRS, Bank Active, Auto/Self Refresh, Power Down Mode Entry.
6. During self refresh mode, refresh interval and refresh operation are performed internally. After self refresh entry, self refresh mode is kept while CKE is LOW. During self refresh mode, all inputs expect CKE will be don’t cared, and outputs will be in Hi-Z state. During tRC from self refresh exit command, any other command can not be accepted. Before/After self refresh mode, burst auto refresh cycle (2K cycles ) is recommended.
~
~
~
~
~
~
CMD
~
~
~
~
t
RC
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At BL=4, same applications are possible. As above example, at Interleave Decrement Counting Mode can be realized. See the BURST SEQUENCE
Using Full Page Mode and Burst Stop Command, Binary Counting Mode can be
Every cycle Read/Write Command with random column address can realize
Before the end of burst, new read/write stops read/write burst and starts new
12. About Burst Type Control
Basic
MODE
Pseudo-
MODE
Random
MODE
Sequential counting
Interleave counting
Pseudo-
Decrement Sequential
Counting
Pseudo-Binary Counting
Random column Access
tCCD = 1 CLK
At MRS A3=”0”. See the BURST SEQUENCE TABE.(BL=4,8) BL=1,2,4,8 and full page wrap around. At MRS A3=” 1”. See the BURST SEQUENCE TABE.(BL=4,8) BL=4,8 At BL=1,2 Interleave Counting = Sequential Counting At MRS A3 = “1”. (See to Interleave Counting Mode) Starting Address LSB 3 bits A0-2 should be “000” or “111”.@BL=8.
--if LSB = “000” : Increment Counting.
--if LSB= “111” : Decrement Counting. For Example, (Assume Addresses except LSB 3 bits are all 0, BL=8)
--@ write, LSB=”000”, Accessed Column in order 0-1-2-3-4-5-6-7
--@ read, LSB=”111”, Accessed Column in order 7-6-5-4-3-2-1-0 Counting mode, by confining starting address to some values, Pseudo­TABLE carefully.
At MRS A3 = “0”. (See to Sequential Counting Mode) A0-2 = “111”. (See to Full Page Mode)
realized.
--@ Sequential Counting Accessed Column in order 3-4-5-6-7-1-2-3 (BL=8)
--@ Pseudo-Binary Counting, Accessed Column in order 3-4-5-6-7-8-9-10 (Burst Stop command) Note. The next column address of 256 is 0
Random Column Access. That is similar to Extended Data Out (EDO) Operation of convention DRAM.
13. About Burst Length Control
Basic
MODE
Special
MODE
Random
MODE
Interrupt
MODE
(Interrupted by Precharge)
1 2
4 At MRS A2,1,0 = “010” 8 At MRS A2,1,0 = “011”.
Full Page
BRSW
Burst Stop
Interrupt
RAS
Interrupt
CAS
At MRS A2,1,0 = “000”. At auto precharge, tRAS should not be violated. At MRS A2,1,0 = “001”. At auto precharge, tRAS should not be violated.
At MRS A2,1,0 = “111”. Wrap around mode (Infinite burst length) should be stopped by burst stop,
interrupt or
RAS
At MRS A9=”1”. Read burst = 1,2,4,8, full page/write Burst =1 At auto precharge of write, tRAS should not be violated. tBDL=1, Valid DQ after burst stop is 1,2 for CL=2,3 respectively Using burst stop command, it is possible only at full page burst length. Before the end of burst, Row precharge command of the same bank Stops read/write burst with Row precharge. tRDL=1 with DQM, valid DQ after burst stop is 1,2 for CL=2,3 respectively
During read/write burst with auto precharge,
read/write burst or block write. During read/write burst with auto precharge,
CAS
interrupt.
interrupt cannot be issued.
RAS
interrupt can not be issued.
CAS
(May, 2001, Version 1.0) 21 AMIC Technology, Inc.
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A43L0616A
Power On Sequence & Auto Refresh
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
WE
High level is necessary
t
RP
~
~
t
RC
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
KEY Ra
KEY
KEY
BS
Ra
~
DQM
DQ
(May, 2001, Version 1.0) 22 AMIC Technology, Inc.
High level is necessary
Precharge
(All Banks)
High-Z
Auto Refresh Auto Refresh Mode Regiser Set
~
~
~
~
~
~
~
Row Active (A-Bank)
: Don't care
Page 24
A43L0616A
Single Bit Read-Write-Read Cycles (Same Page) @CAS Latency=3, Burst Length=1
tCC
tRCD
tSS
tCH
t
CL
High
tRAS
tRC
tSH
t
SS
t
CCD
t
SH
t
RP
CLOCK
CKE
CS
RAS
CAS
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
*Note 1
t
SH
t
SS
ADDR
BA
A10/AP
WE
DQM
DQ
tSH
tSS
Ra Ca Cb Cc
tSS
*Note 2
*Note 2,3 *Note 2,3 *Note 2,3 *Note 4 *Note 2
tSH
BS BS BS BS BS BS
*Note 3 *Note 3 *Note 3 *Note 4
Ra Rb
tSH
t
SS
tSHtSS
Row Active
tRAC
Read
tSAC
tSLZ
Qa Db Qc
tOH
tSS
tSHZ
Write
t
SH
Read
Precharge
Rb
Row Active
: Don't care
(May, 2001, Version 1.0) 23 AMIC Technology, Inc.
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A43L0616A
* Note : 1. All inputs can be don’t care when
2. Bank active & read/write are controlled by BA.
BA Active & Read/Write
0 Bank A 1 Bank B
3. Enable and disable auto precharge function are controlled by A10/AP in read/write command.
A10/AP BA Operation
is high at the CLK high going edge.
CS
0
1
0 Disable auto precharge, leave bank A active at end of burst. 1 Disable auto precharge, leave bank B active at end of burst. 0 Enable auto precharge, precharge bank A at end of burst. 1 Enable auto precharge, precharge bank B at end of burst.
4. A10/AP and BA control bank precharge when precharge command is asserted.
A10/AP BA Precharge
0 0 Bank A 0 1 Bank B 1 X Both Bank
(May, 2001, Version 1.0) 24 AMIC Technology, Inc.
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Read & Write Cycle at Same Bank @Burst Length=4
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
RAS
CAS
ADDR
DQM
DQ
(CL = 2)
CS
BA
WE
High
*Note 1
t
RC
t
RCD
*Note 2
Ra Ca0 Rb Cb0
Ra RbA10/AP
t
OH
Qa0
t
RAC
*Note 3
t
SAC
Qa1 Qa2 Qa3 Db0 Db1 Db2 Db3
t
SHZ
*Note 4
t
RDL
t
OH
DQ
(CL = 3)
Row Active
(A-Bank)
*Note 3
t
RAC
Read
(A-Bank)
t
SAC
Qa0
Qa1 Qa2 Qa3 Db0 Db1 Db2 Db3
*Note 4
Row Active
(A-Bank)
Write
(A-Bank)
Precharge
(A-Bank)
t
SHZ
t
RDL
Precharge
(A-Bank)
: Don't care
*Note : 1. Minimum row cycle times is required to complete internal DRAM operation.
2. Row precharge can interrupt burst on any cycle. [CAS latency-1] valid output data available after Row enters precharge. Last valid output will be Hi-Z after tSHZ from the clock.
3. Access time from Row address. tCC*(tRCD + CAS latency-1) + tSAC
4. Output will be Hi-Z after the end of burst. (1,2,4 & 8) At Full page bit burst, burst is wrap-around.
(May, 2001, Version 1.0) 25 AMIC Technology, Inc.
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A43L0616A
Page Read & Write Cycle at Same Bank @Burst Length=4
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
DQM
DQ
(CL=2)
BA
WE
High
t
RCD
Ra Ca0 Cb0 Cc0
RaA10/AP
*Note 2
*Note1 *Note3
Qa0 Qa1 Qb0 Qb1 Dc0 Dc1 Dd0 Dd1
*Note 2
Cd0
t
t
CDL
RDL
DQ
(CL=3)
Row Active
(A-Bank)
Read
(A-Bank)
Read
(A-Bank)
Qa0 Qa1 Qb0
Dc0 Dc1 Dd0 Dd1
Write
(A-Bank)
Write
(A-Bank)
Precharge
(A-Bank)
: Don't care
*Note : 1. To write data before burst read ends, DQM should be asserted three cycle prior to write
command to avoid bus contention.
2. Row precharge will interrupt writing. Last data input, tRDL before Row precharge, will be written.
3. DQM should mask invalid input data on precharge command cycle when asserting precharge before end of burst. Input data after Row precharge cycle will be masked internally.
(May, 2001, Version 1.0) 26 AMIC Technology, Inc.
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A43L0616A
RAS
WE
Page Read Cycle at Different Bank @Burst Length = 4
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
WE
DQM
DQ
(CL=2)
*Note 1
RAa CAa
RAa RBb
High
RBb CAc CBd CAe
CBb
QBb1QBb0QAa0 QAa1 QAa2 QAa3 QBb2 QBb3 QAc0 QAc1 QBd0 QBd1 QAe0 QAe1
*Note 2
DQ
(CL=3)
Row Active
(A-Bank)
Read
(A-Bank)
Row Active
(B-Bank)
Read
(B-Bank)
QBb1QBb0QAa0 QAa1 QAa2 QAa3 QBb2 QBb3 QAc0 QAc1 QBd0 QBd1 QAe0 QAe1
Read
(A-Bank)
Read
(B-Bank)
Read
(A-Bank)
Precharge
(A-Bank)
: Don't care
* Note : 1. CS can be don’t care when
,
CAS
and
are high at the clock high going edge.
2. To interrupt a burst read by row precharge, both the read ad the precharge banks must be the same.
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A43L0616A
Page Write Cycle at Different Bank @Burst Length=4
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
A10/AP
DQ
DQM
BA
WE
RAa CAa
RAa RBb
RBb CAc
High
*Note 2
CBb
DBb1DBb0DAa0 DAa1 DAa2 DAa3 DBb2 DBb3 DAc0 DAc1
t
CDL
CBd
DBd0 DBd1
*Note 1
t
RDL
Write
(B-Bank)
Write
(A-Bank)
Write
(B-Bank)
Precharge
(Both Banks)
: Don't care
Row Active with
(A-Bank)
Write
(A-Bank)
Row Active
(B-Bank)
* Note:
1. To interrupt burst write by Row precharge, DQM should be asserted to mask invalid input data.
2. To interrupt burst write by Row precharge, both the write and precharge banks must be the same.
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A43L0616A
Read & Write Cycle at Different Bank @Burst Length=4
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
A10/AP
WE
DQM
DQ
(CL=2)
BA
RAa CAa
RAa
RBb
High
CBb CAc
RAc
RAcRBb
tCDL
*Note 1
QAa3QAa2QAa0 QAa1 DBb0 DBb1 QAc0DBb2 DBb3 QAc1 QAc2
DQ
(CL=3)
Row Active
(A-Bank)
Read
(A-Bank)
Row Active
(B-Bank)
Precharge
(A-Bank)
QAa2QAa1QAa0 QAa3 DBb0
Write
(B-Bank)
DBb1 DBb2 DBb3
Row Active
(A-Bank)
QAc0 QAc1
Read
(A-Bank)
: Don't care
* Note : tCDL should be met to complete write.
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Read & Write Cycle with Auto Precharge I @Burst Length=4
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
WE
DQM
DQ
(CL=2)
RAa RBb
RAa
RBb
CAa
High
CBb
QAa3QAa2QAa0 QAa1 DBb0 DBb1 DBb2 DBb3
DQ
(CL=3)
Row Active
(A-Bank)
Auto Precharge
Row Active
(B-Bank)
Read with
(A-Bank)
Auto Precharge
Start Point
QAa2QAa1QAa0 QAa3 DBb0
(A-Bank)
DBb1 DBb2 DBb3
Write with
Auto Precharge
(B-Bank)
Auto Precharge
Start Point
(B-Bank)
: Don't care
*Note : tRCD should be controlled to meet minimum tRAS before internal precharge start.
(In the case of Burst Length=1 & 2, BRSW mode)
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Read & Write Cycle with Auto Precharge II @Burst Length=4
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
A10/AP
WE
DQM
DQ
(CL=2)
BA
Ra Rb
Ra
Rb
Ca
Cb
High
Ra Ca
Ra
Qb1Qb0Qa0 Qa1 Qb2 Qb3 Da0 Da1
DQ
(CL=3)
Row Active
(A-Bank)
Row Active
(B-Bank)
Read with
Auto Pre
Charge
(A-Bank)
Read without
Auto Precharge
(B-Bank)
Auto Precharge
Strart Point
(A-Bank) *Note 1
Qb0Qa1Qa0 Qb1 Qb2
Precharge
Qb3 Da0 Da1
Row Active
(B-Bank)
(A-Bank)
Write with
Auto Precharge
(A-Bank)
: Don't care
* Note : When Read(Write) command with auto precharge is issued at A-Bank after A and B Bank activation.
- if read(Write) command without auto precharge is issued at B-Bank before A Bank auto precharge starts, A Bank auto precharge will start at B Bank read command input point.
- Any command can not be issued at A Bank during tRP after A Bank auto precharge starts.
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Read & Write Cycle with Auto Precharge III @Burst Length=4
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
WE
DQM
DQ
(CL=2)
Ra
Ra
Ca
High
Rb Cb
Rb
Qa3Qa2Qa0 Qa1 Qb0 Qb1 Qb2 Qb3
DQ
(CL=3)
Row Active
(A-Bank)
Read with
Auto Preharge
(A-Bank)
* Note 1
Auto Precharge
Start Point
(A-Bank)
Row Active
(B-Bank)
Qa2Qa1Qa0 Qa3 Qb0
Read with
Auto Precharge
(B-Bank)
Qb1 Db2 Db3
Auto Precharge
Start Point
(B-Bank)
: Don't care
* Note : Any command to A-bank is not allowed in this period.
tRP is determined from at auto precharge start point
(May, 2001, Version 1.0) 32 AMIC Technology, Inc.
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A43L0616A
Read Interrupted by Precharge Command & Read Burst Stop Cycle (@Burst Length = Full Page)
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
WE
DQM
DQ
(CL=2)
RAa
RAa
High
CAa
* Note 1 * Note 1
QAa0 QAb4 QAb5
CAb
1* Note 2
QAa4QAa3QAa1 QAa2 QAb0 QAb1 QAb2 QAb3
1
DQ
(CL=3)
Row Active
(A-Bank)
Read
(A-Bank)
QAa0
2
QAa3QAa2QAa1 QAa4 QAb0
Burst Stop
Read
(A-Bank)
QAb1 QAb2 QAb3
Precharge
(A-Bank)
QAb4 QAb5
: Don't care
2
* Note : 1. At full page mode, burst is wrap-around at the end of burst. So auto precharge is impossible.
2. About the valid DQ’s after burst stop, it is same as the case of
RAS
interrupt. Both cases are illustrated above timing diagram. See the label 1,2 on them. But at burst write, burst stop and
interrupt should be compared carefully.
RAS
Refer the timing diagram of “Full page write burst stop cycle”.
3. Burst stop is valid at every burst length.
(May, 2001, Version 1.0) 33 AMIC Technology, Inc.
Page 35
A43L0616A
Write Interrupted by Precharge Command & Write Burst Stop Cycle (@ Burst Length = Full Page)
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
DQM
DQ
WE
RAa
RAa
High
CAa
* Note 1 * Note 1
t
BDL
* Note 2
DAa0 DAb4 DAb5
DAa4DAa3DAa1 DAa2 DAb0 DAb1 DAb2 DAb3
CAb
* Note 3
t
RDL
Row Active
(A-Bank)
Write
(A-Bank)
Burst Stop
Write
(A-Bank)
Precharge
(A-Bank)
: Don't care
* Note : 1. At full page mode, burst is wrap-around at the end of burst. So auto precharge is impossible.
2. Data-in at the cycle of burst stop command cannot be written into corresponding memory cell. It is defined by AC parameter of tBDL(=1CLK).
3. Data-in at the cycle of interrupted by precharge cannot be written into the corresponding memory cell. It is defined by AC parameter of tRDL(=2CLK). DQM at write interrupted by precharge command is needed to ensure tRDL of 2CLK. DQM should mask invalid input data on precharge command cycle when asserting precharge before end of burst. Input data after Row precharge cycle will be masked internally.
4. Burst stop is valid only at every burst length.
(May, 2001, Version 1.0) 34 AMIC Technology, Inc.
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A43L0616A
Burst Read Single Bit Write Cycle @Burst Length=2, BRSW
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
RAS
CAS
ADDR
A10/AP
(CL=2)
(CL=3)
CS
BA
WE
DQM
DQ
DQ
RAa
RAa
High
* Note 2
CAa
RBb CAb
RBb
DAa0
DAa0 QAd1
QAb1QAb0 DBc0 QAd0
RAc
CBc CAd
RAc
QAb1QAb0 DBc0
QAd1
QAd0
Row Active
(A-Bank)
Row Active
(B-Bank)
Row Active
(A-Bank)
Read
(A-Bank)
Precharge
(A-Bank)
Write
(A-Bank)
Read with
Auto Precharge
(A-Bank)
Write with
Auto Precharge
(B-Bank)
: Don't care
* Note : 1. BRSW mode is enabled by setting A9 “High” at MRS (Mode Register Set). At the BRSW Mode, the burst length at write is fixed to “1” regardless of programed burst length.
2. When BRSW write command with auto precharge is executed, keep it in mind that tRAS should not be violated. Auto precharge is executed at the burst-end cycle, so in the case of BRSW write command,
The next cycle starts the precharge.
(May, 2001, Version 1.0) 35 AMIC Technology, Inc.
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A43L0616A
Clock Suspension & DQM Operation Cycle @CAS Latency = 2, Burst Length=4
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
WE
DQM
DQ
Ra
Ra
Row Active
Ca
Read
Cb
* Note 1
Qa1 Qb0 Qb1 Dc0
Qa0 Dc2
Clock
Suspension
Qa2
t
SHZ
Qa3
Read
t
SHZ
Read DQM
Cc
Write DQM
Write
* Note : DQM needed to prevent bus contention.
Clock
Suspension
: Don't care
(May, 2001, Version 1.0) 36 AMIC Technology, Inc.
Page 38
A43L0616A
Active/Precharge Power Down Mode @CAS Lantency=2, Burst Length=4
CLOCK
CKE
CS
RAS
CAS
ADDR
BA
A10/AP
WE
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
t
SS
* Note 1
*Note 3
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
t
SS
* Note 2
t
SS
Ra Ca
Ra
~
~
t
SS
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
DQM
DQ Qa0 Qa1
Precharge
Power-down
Entry
* Note : 1. All banks should be in idle state prior to entering precharge power down mode.
2. CKE should be set high at least “1CLK + tSS” prior to Row active command.
3. Cannot violate minimum refresh specification. (32ms)
~
~
~
~
Precharge
Power-down
Exit
Row Active
Active
Power-down
Entry
~
~
~
~
~
Power-down
Read Precharge
Active
Exit
Qa2
: Don't care
(May, 2001, Version 1.0) 37 AMIC Technology, Inc.
Page 39
A43L0616A
RAS
Self Refresh Entry & Exit Cycle
CLOCK
CKE
CS
RAS
CAS
ADDR
A10/AP
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
* Note 2
* Note 1
t
SS
* Note 7 * Note 7
BA
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
* Note 3
~
~
~
~
~
~
~
~
~
~
~
~
~
~
* Note 4
t
* Note 5
~
~
t
RC min.
SS
* Note 6
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
WE
DQM
DQ
Self Refresh Entry
* Note : TO ENTER SELF REFRESH MODE
1.
2. After 1 clock cycle, all the inputs including the system clock can be don’t care except for CKE.
3. The device remains in self refresh mode as long as CKE stays “Low”. (cf.) Once the device enters self refresh mode, minimum tRAS is required before exit from self refresh. TO EXIT SELF REFRESH MODE
4. System clock restart and be stable before returning CKE high.
5.
6. Minimum tRC is required after CKE going high to complete self refresh exit.
7. 2K cycle of burst auto refresh is required before self refresh entry and after self refresh exit.
If the system uses burst refresh.
,
CS
CS
&
CAS
starts from high.
~
~
~
~
~
~
~
~
with CKE should be low at the same clock cycle.
Hi-ZHi-Z
Self Refresh Exit Auto Refresh
~
~
~
~
~
~
~
~
~
: Don't care
(May, 2001, Version 1.0) 38 AMIC Technology, Inc.
Page 40
A43L0616A
RAS
RAS
Mode Register Set Cycle Auto Refresh Cycle
0 1 2 3 4 5 6 0 1 2 3 4 5 6 7 8 9 10
CLOCK
CKE
High High
~
~
~
~
*Note 2
CS
t
RC
RAS
CAS
ADDR
WE
DQM
DQ
* Both banks precharge should be completed before Mode Register Set cycle and auto refresh cycle.
MODE REGISTER SET CYCLE * Note : 1.
* Note 1
* Note 3
Key
MRS
,
CS
mode register.
2. Minimum 2 clock cycles should be met before new
Ra
New
Command
,
CAS
& WE activation at the same clock cycle with address key will set internal
Hi-ZHi-Z
Auto Refresh New Command
activation.
3. Please refer to Mode Register Set table.
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
: Don't care
(May, 2001, Version 1.0) 39 AMIC Technology, Inc.
Page 41
A43L0616A
RAS
WE
Function Truth Table (Table 1)
Current
State
IDLE
Row
Active
Read
Write
Read with
Auto
Precharge
CS
H X X X X X NOP L H H H X X NOP L H H L X X ILLEGAL 2 L H L X BA CA, A10/AP ILLEGAL 2 L L H H BA RA Row Active; Latch Row Address L L H L BA PA NOP 4 L L L H X X Auto Refresh or Self Refresh 5 L L L L OP Code Mode Register Access 5 H X X X X X NOP L H H H X X NOP L H H L X X ILLEGAL 2 L H L H BA CA,A10/AP Begin Read; Latch CA; Determine AP L H L L BA CA,A10/AP Begin Write; Latch CA; Determine AP L L H H BA RA ILLEGAL 2 L L H L BA PA Precharge L L L X X X ILLEGAL H X X X X X L H H H X X L H H L X X L H L H BA CA,A10/AP Term burst; Begin Read; Latch CA; Determine AP 3 L H L L BA CA,AP Term burst; Begin Write; Latch CA; Determine AP 3 L L H H BA RA ILLEGAL 2 L L H L BA PA Term Burst; Precharge timing for Reads 3 L L L X X X ILLEGAL H X X X X X L H H H X X L H H L X X ILLEGAL L H L H BA CA,A10/AP Term burst; Begin Read; Latch CA; Determine AP 3 L H L L BA CA,A10/AP Term burst; Begin Read; Latch CA; Determine AP 3 L L H H BA RA ILLEGAL 2 L L H L BA A10/AP Term Burst; Precharge timing for Writes 3 L L L X X X ILLEGAL H X X X X X L H H H X X L H H L X X ILLEGAL L H L H BA CA,A10/AP ILLEGAL 2 L H L L BA CA,A10/AP ILLEGAL 2 L L H X BA RA, PA ILLEGAL L L L X X X ILLEGAL 2
CAS
BA Address Action Note
NOP(Continue Burst to End Row Active) NOP(Continue Burst to End Row Active) Term burst Row Active
NOP(Continue Burst to EndRow Active) NOP(Continue Burst to EndRow Active)
NOP(Continue Burst to End→Precharge) NOP(Continue Burst to End→Precharge)
(May, 2001, Version 1.0) 40 AMIC Technology, Inc.
Page 42
A43L0616A
RAS
WE
Function Truth Table (Table 1, Continued)
Current
State
Write with
Auto
Precharge
Precharge
Row
Activating
Refreshing
Abbreviations RA = Row Address BA = Bank Address AP = Auto Precharge NOP = No Operation Command CA = Column Address PA = Precharge All
Note: 1. All entries assume that CKE was active (High) during the preceding clock cycle and the current clock cycle.
2. Illegal to bank in specified state : Function may be legal in the bank indicated by BA, depending on the state of that bank.
3. Must satisfy bus contention, bus turn around, and/or write recovery requirements.
4. NOP to bank precharging or in idle state. May precharge bank indicated by BA (and PA).
5. Illegal if any banks is not idle.
CS
H X X X X X L H H H X X L H H L X X ILLEGAL L H L H BA CA,A10/AP ILLEGAL 2 L H L L BA CA,A10/AP ILLEGAL 2 L L H X BA RA, PA ILLEGAL L L L X X X ILLEGAL 2 H X X X X X L H H H X X L H H L X X ILLEGAL L H L X BA CA,A10/AP ILLEGAL 2 L L H H BA RA ILLEGAL 2 L L H L BA PA L L L X X X ILLEGAL 4 H X X X X X L H H H X X L H H L X X ILLEGAL L H L X BA CA,A10/AP ILLEGAL 2 L L H H BA RA ILLEGAL 2 L L H L BA PA ILLEGAL 2 L L L X X X ILLEGAL 2 H X X X X X L H H X X X L H L X X X ILLEGAL L L H X X X ILLEGAL L L L X X X ILLEGAL
CAS
BA Address Action Note
NOP(Continue Burst to End→Precharge) NOP(Continue Burst to End→Precharge)
NOPIdle after tRP NOPIdle after tRP
NOPIdle after tRP
NOPRow Active after tRCD NOPRow Active after tRCD
NOPIdle after tRC NOPIdle after tRC
2
(May, 2001, Version 1.0) 41 AMIC Technology, Inc.
Page 43
A43L0616A
RAS
WE
Function Truth Table for CKE (Table 2)
Current
State
Self
Refresh
Both
Bank
Precharge
Power
Down
All
Banks
Idle
Any State
Other than
Listed
Above
Abbreviations : ABI = All Banks Idle
Note: 6. After CKE’s low to high transition to exit self refresh mode. And a time of tRC(min) has to be elapse after CKE’s low
to high transition to issue a new command.
7. CKE low to high transition is asynchronous as if restarts internal clock.
A minimum setup time “tSS + one clock” must be satisfied before any command other than exit.
8. Power-down and self refresh can be entered only from the all banks idle state.
9. Must be a legal command.
CKE
CKE
n-1
n
H X X X X X X INVALID
L H H X X X X L H L H H H X L H L H H L X ILLEGAL L H L H L X X ILLEGAL L H L L X X X ILLEGAL L L X X X X X NOP(Maintain Self Refresh)
H X X X X X X INVALID
L H H X X X X L H L H H H X L H L H H L X ILLEGAL L H L H L X X ILLEGAL L H L L X X X ILLEGAL
L L X X X X X NOP(Maintain Power Down Mode) H H X X X X X Refer to Table 1 H L H X X X X Enter Power Down 8 H L L H H H X Enter Power Down 8 H L L H H L X ILLEGAL H L L H L X X ILLEGAL H L L L H X X ILLEGAL H L L L L H X Enter Self Refresh 8 H L L L L L X ILLEGAL
L L X X X X X NOP H H X X X X X Refer to Operations in Table 1 H L X X X X X Begin Clock Suspend next cycle 9
L H X X X X X Exit Clock Suspend next cycle 9
L L X X X X X Maintain clock Suspend
CS
CAS
Address
Action Note
Exit Self RefreshABI after tRC Exit Self RefreshABI after tRC
Exit Power Down→ABI Exit Power Down→ABI
6 6
7 7
(May, 2001, Version 1.0) 42 AMIC Technology, Inc.
Page 44
A43L0616A
Ordering Information
Part No. Cycle Time (ns) Clock Frequency (MHz) Access Time Package
200 @ CL = 3 4.5 ns @ CL = 3
A43L0616AV-5 5
143 @ CL = 2 5.0 ns @ CL = 2
183 @ CL = 3 5.0 ns @ CL = 3
A43L0616AV-5.5 5.5
143 @ CL = 2 5.5 ns @ CL = 2
166 @ CL = 3 5.5 ns @ CL = 3
A43L0616AV-6 6
125 @ CL = 2 6.0 ns @ CL = 2
143 @ CL = 3 6.0 ns @ CL = 3
A43L0616AV-7 7
125 @ CL = 2 7.0 ns @ CL = 2
143 @ CL = 3 6.0 ns @ CL = 3
A43L0616AV-7U 7
125 @ CL = 2 7.0 ns @ CL = 2
Note: -U is for industrial operating temperature range
50 TSOP (II)
50 TSOP (II)
50 TSOP (II)
50 TSOP (II)
50 TSOP (II)
(May, 2001, Version 1.0) 43 AMIC Technology, Inc.
Page 45
A43L0616A
Package Information TSOP 50L (Type II) Outline Dimensions unit: inches/mm
Detail "A"
50
1
D
26
E
E1
25
A2
A
R0.15 REF.
R0.15 REF.
0.25
θ
L
L 1
Detail "A"
c
b
Seating Plane
e
0.1
D
A1
Symbol
A - - 0.047 - - 1.20 A1 0.002 - - 0.05 - ­A2 0.037 0.040 0.041 0.95 1.016 1.05
b 0.012 - 0.018 0.30 - 0.45
c 0.005 - 0.008 0.12 - 0.21
D 0.821 0.825 0.829 20.855 20.955 21.055 E 0.455 0.463 0.471 11.56 11.76 11.96
E1 0.396 0.400 0.404 10.06 10.16 10.26
e - 0.031 - - 0.800 -
L 0.016 0.020 0.024 0.40 0.50 0.60
θ
Dimensions in inches Dimensions in mm
Min Nom Max Min Nom Max
- -
Notes:
1. The maximum value of dimension D includes end flash.
2. Dimension E does not include resin fins.
3. Dimension S includes end flash.
(May, 2001, Version 1.0) 44 AMIC Technology, Inc.
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