The A42U0616 is a new generation randomly accessed
memory for graphics, organized in a 1,048,576 -word by
16-bit configuration. This product can execute Write and
Read operation via
CAS
pin.
The A42U0616 offers an accelerated Fast Page Mode
cycle with a feature called Extended Data Out (EDO).
Pin Configuration
- 13/15/20 ns CAS access time
- 20/25/35 ns EDO Page Mode Cycle Time
n Separate
CAS
(
UCAS,LCAS
) for byte selection
n Fast Page Mode with Extended Data Out
n Read-modify-write, RAS -only, CAS -before- RAS ,
Hidden refresh capability
n TTL-compatible, three-state I/O
n JEDEC standard packages
- 400mil, 42-pin SOJ
- 400mil, 50/44 TSOP type II package
This allow random access of up to 1024(1K Ref.) words
within a row at a 50/40/28 MHz EDO cycle, making the
A42U0616 ideally suited for graphics, digital signal
processing and high performance computing systems.
Row Address Strobe
Column Address Strobe for Lower Byte
(I/O0 – I/O7)
Column Address Strobe for Upper Byte
UCAS
(I/O8– I/O15)
WE
OE
Write Enable
Output Enable
VCC 2.5V Power Supply
VSS Ground
NC No Connection
PRELIMINARY (June, 2001, Version 0.0) 1 AMIC Technology, Inc.
Page 3
A42U0616 Series
Selection Guide
Symbol Description -50 -60 -80 Unit
tRAC
tAAMaximum Column Address Access Time 25 30 40 ns
tCAC
tOEA
tRCMinimum Read or Write Cycle Time 84 104 134 ns
tPCMinimum EDO Cycle Time 20 25 35 ns
Maximum RAS Access Time
Maximum CAS Access Time
Maximum Output Enable (OE) Access Time
50 60 80 ns
13 15 20 ns
13 15 20 ns
Functional Description
The A42U0616 reads and writes data by multiplexing an
20-bit address into a 10-bit row and 10-bit column
address.
address and the column address, respectively.
The A42U0616 has two
I/O7, and
function in an identical manner to
generate an internal
timing are determined by the first
) to transition low and by the last to transition high.
LCAS
Byte Read and Byte Write are controlled by using
and
UCAS
A Read cycle is performed by holding the WE signal high
during RAS/
holding the WE signal low during RAS/
the input data is latched by the falling edge of WE or
, whichever occurs later. The data inputs and outputs
CAS
are routed through 16 common I/O pins, with RAS,
WE and OE controlling the in direction.
EDO Page Mode operation all 1024(1K) columns within a
selected row to be randomly accessed at a high data rate.
A EDO Page Mode cycle is initiated with a row address
latched by RAS followed by a column address latched by
. While holding RAS low,
CAS
strobe changing column addresses, thus achieving
shorter cycle times.
The A42U0616 offers an accelerated Fast Page Mode
cycle through a feature called Extended Data Out, which
keeps the output drivers on during the
time (tcp). Since data can be output after
and
RAS
controls I/O8 - I/O15,
UCAS
separately.
operation. A Write cycle is executed by
CAS
are used to strobe the row
CAS
CAS
signal. The
CAS
inputs:
CAS
CAS
controls I/O0-
LCAS
and
UCAS
in that either will
function and
CAS
(
CAS
CAS
can be toggled to
CAS
CAS
LCAS
UCAS
or
LCAS
operation;
CAS
precharge
goes high,
the user is not required to wait for valid data to appear
before starting the next access cycle. Data-out will remain
valid as long as RAS and OE are low, and WE is high;
this is the only characteristic which differentiates Extended
Data Out operation from a standard Read or Fast Page
Read.
A memory cycle is terminated by returning both RAS and
high. Memory cell data will retain its correct state by
CAS
maintaining power and accessing all 1024(1K)
combinations of the 10-bit row addresses, regardless of
sequence, at least once every 16ms through any RAS
cycle (Read, Write) or RAS Refresh cycle (RAS -only,
CBR, or Hidden). The CBR Refresh cycle automatically
controls the row addresses by invoking the refresh
counter and controller.
Power-On
The initial application of the VCC supply requires a 200 µs
wait followed by a minimum of any eight initialization
,
cycles containing a RAS clock. During Power-On, the
VCC current is dependent on the input levels of RAS and
. It is recommended that RAS and
CAS
VCC or be held at a valid VIH during Power-On to avoid
current surges.
CAS
track with
PRELIMINARY (June, 2001, Version 0.0) 2 AMIC Technology, Inc.
Page 4
A42U0616 Series
Block Diagram
RAS
UCAS
LCAS
WE
Control
Clocks
Refresh Timer
Refresh control
VBB Generator
Row Decoder
Vcc
Vss
Lower
Data in
Buffer
Lower
Data out
Buffer
I/O0
to
I/O7
Memory Array
1,048,576 x 16
Cells
Column Decoder
Upper
Data in
Buffer
Sense Amps & I/O
Upper
Data out
Buffer
A0~A9
A0~A9
Refresh Counter
Row Address Buffer
Col. Address Buffer
Recommended Operating Conditions (Ta = 0°C to +70°C)
Symbol Description Min. Typ. Max. Unit
OE
I/O8
to
I/O15
VCC Power Supply 2.25 2.5 2.75 V
VSS Input High Voltage 0 0 0 V
VIH Input High Voltage 1.8 - VCC + 0.2 V
VIL Input Low Voltage -1.0 - 0.8 V
PRELIMINARY (June, 2001, Version 0.0) 3 AMIC Technology, Inc.
Page 5
A42U0616 Series
Truth Table
signal (
RAS
L
L
L
L
L
L
L H H X X Row High-Z
UCAS
H→L
H→L
H→L
H→L
H→L
H→L
LCAS
UCAS
UCAS
or
UCAS
LCAS
Function
Standby H X X X X X High-Z
Read: Word L L L H L Row/Col. Data Out
Read: Lower Byte L H L H L Row/Col. I/O0-7 = Data Out
Read: Upper Byte L L H H L Row/Col. I/O0-7 = High-Z
Write: Word L L L L H Row/Col. Data In
Write: Lower Byte L H L L H Row/Col. I/O0-7 = Data In
Write: Upper Byte L L H L H Row/Col. I/O0-7 = X
Read-Write L L L H→L L→H Row/Col. Data Out → Data In 1,2
EDO-Page-Mode Read: Hi-Z
-First cycle
-Subsequent Cycles
EDO-Page-Mode Write
-First cycle
-Subsequent Cycles
EDO-Page-Mode Read-Write
-First cycle
-Subsequent Cycles
Hidden Refresh Read L→H→L L L H L Row/Col. Data Out 2
Hidden Refresh Write L→H→L L L L X Row/Col. Data In → High-Z 1
RAS-Only Refresh
CBR Refresh H→L L L X X X High-Z 3
Self Refresh H→L L L H X X High-Z
Note: 1. Byte Write may be executed with either
2. Byte Read may be executed with either
3. Only one
CAS
WE OE
H→L
H→L
H→L
H→L
H→L
H→L
) must be active.
or
or
H
H
L
L
H→L
H→L
LCAS
LCAS
H→L
H→L
H
H
L→H
L→H
active.
active.
Address I/Os Notes
I/O8-15 = High-Z
I/O8-15 = Data Out
I/O8-15 = X
I/O8-15 = Data In
Row/Col.
Col.
Row/Col.
Col.
Row/Col.
Col.
Data Out → Data In
Data Out → Data In
Data Out
Data Out
Data In
Data In
2
2
1
1
1, 2
1, 2
PRELIMINARY (June, 2001, Version 0.0) 4 AMIC Technology, Inc.
Short Circuit Output Current (Iout) . . . . . . . . . . . . . . 50mA
*Comments
Stresses above thos e listed under "Absolute Maximum
Ratings" may cause permanent damage to this device.
These are stress ratings only. Functional operation of
this device at these or any other conditions above
those indicated in the operational sections of these
specification is not implied or intended. Exposure to
the absolute maximum rating conditions for extended
periods may affect device reliability.
CAS Setup Time (CAS -before-RAS)
CAS Hold Time (CAS -before-RAS)
RAS to CAS Precharge Time
(CAS -before-RAS)
Parameter
-50 -60 -80
Min. Max. Min. Max. Min. Max.
7 - 10 - 20 - ns
2 - 2 - 5 - ns
- 28 - 33 - 45 ns 12
7 - 10 - 10 - ns
34 - 38 - 42 - ns
50 100K 60 100K 80 100
K
5 - 5 - 5 - ns 3
10 - 10 - 15 - ns 3
5 - 5 - 5 - ns
Unit Notes
ns
51 tROH
52 tOEA
53 tOED
54 tOEZ
55 tRASS
56 tRPS
57 tCHS
PRELIMINARY (June, 2001, Version 0.0) 8 AMIC Technology, Inc.
RAS Hold Time Reference to OE
OE Access Time
OE to Data Delay
Output Buffer Turn-off Delay from OE
RAS pulse width (C-B-Rself-refresh)
RAS precharge time
(C-B-Rself-refresh)
CAS hold time (C-B-Rself-refresh)
5 - 5 - 5 - ns
- 13 - 15 - 20 ns
13 - 15 - 20 - ns
0 13 0 15 0 20 ns 8
100 - 100 - 100 - µs
84 - 104 - 134 - ns
- 50 - 50 - 50 ns
Page 10
A42U0616 Series
Notes:
1. ICC1, ICC3, ICC4, and ICC5 depend on cycle rate.
2. ICC1 and ICC4 depend on output loading. Specified values are obtained with the outputs open.
3. An initial pause of 200µs is required after power-up followed by any 8 RAS cycles before proper device operation is
achieved. In the case of an internal refresh counter, a minimum of 8 CAS -before-RAS initialization cycles instead of
8RAS cycles are required. 8 initialization cycles are required after extended periods of bias without clocks.
4. AC Characteristics assume tT = 2ns. All AC parameters are measured with a load equivalent to one TTL load and
100pF, V IL (min.) ≥ GND and VIH (max.) ≤ VCC.
5. VIH (min.) and VIL (max.) are reference levels for measuring timing of input signals. Transition times are measured
between V IH and VIL.
6. Operation within the tRCD (max.) limit insures that tRAC (max.) can be met. tRCD (max.) is specified as a reference
point only. If tRCD is greater than the specified tRCD (max.) limit, then access time is controlled exclusively by tCAC.
7. Operation within the tRAD (max.) limit insures that tRAC (max.) can be met. tRAD (max.) is specified as a reference
point only. If tRAD is greater than the specified tRAD (max.) limit, then access time is controlled exclusively by tAA.
8. Assumes three state test load (5pF and a 500Ω Thevenin equivalent).
9. Either tRCH or tRRH must be satisfied for a read cycle.
10. tOFF (max.) defines the time at which the output achieves the open circuit condition; it is not referenced to output
voltage levels.
11. tWCS, tWCH, tRWD, tCWD and tAWD are not restrictive operating parameters. They are included in the data sheet
as electrical characteristics only. If tWCS ≥ tWCS (min.) and tWCH ≥ tWCH (min.), the cycle is an early write cycle and data-out pins will remain open circuit, high impedance, throughout the entire cycle. If tRWD ≥ tRWD (min.) , tCWD ≥tCWD (min.) and tAWD ≥ tAWD (min.), the cycle is a read-modify-write cycle and the data out will contain data read from the selected cell. If neither of the above conditions is satisfied, the condition of the data out at access time is
indeterminate.
12. Access time is determined by the longer of tAA or tCAC or tCPA.
13. tASC≥ tCP to achieve tPC (min.) and tCPA (max.) values.
PRELIMINARY (June, 2001, Version 0.0) 9 AMIC Technology, Inc.
Page 11
A42U0616 Series
Word Read Cycle
tRC(1)
tRAS(3)tRP(2)
RAS
tCSH(8)
tCRP(9)
tRCD(5)tRSH(7)
tCRP(9)
UCAS
LCAS
Address
WE
OE
tRAD(6)tRAL(20)
tASR(10)
tRAH(11)
tASC(24)tCAH(25)
Row AddressColumn Address
tAR(16)
tRCS(17)
tAA(15)
tRAC(13)
tCAS(4)
tRCH(18)
tRRH(19)
tROH(51)
tOEA(52)
tCAC(14)
tOFF(23)
tOEZ(54)
I/O0 ~
I/O15
High-Z
Valid Data-out
tCLZ(12)
: High or Low
PRELIMINARY (June, 2001, Version 0.0) 10 AMIC Technology, Inc.
Page 12
A42U0616 Series
Word Write Cycle (Early Write)
tRC(1)
tRAS(3)tRP(2)
RAS
tCSH(8)
tCRP(9)
tRCD(5)tRSH(7)
tCRP(9)
UCAS
LCAS
Address
WE
OE
tCAS(4)
tAR(16)
tRAD(6)tRAL(20)
tASR(10)
tRAH(11)
tASC(24)
tCAH(25)
Row AddressColumn Address
tWCR(29)
tCWL(32)
tRWL(31)
tWP(30)
tWCS(27)
tWCH(28)
tDHR(35)
tDS(33)tDH(34)
I/O0 ~
I/O15
Valid Data-in
: High or Low
PRELIMINARY (June, 2001, Version 0.0) 11 AMIC Technology, Inc.
Page 13
A42U0616 Series
Word Write Cycle (Late Write)
tRC(1)
RAS
UCAS
LCAS
Address
WE
tRAS(3)
tCSH(8)
tCRP(9)
tASR(10)
tRAH(11)
tRCD(5)tRSH(7)
tAR(16)
tRAD(6)tRAL(20)
tASC(24)
tCAH(25)
Row AddressColumn Address
tWCR(29)
tRP(2)
tCRP(9)
tCAS(4)
tCWL(32)
tRWL(31)
tWP(30)
tOED(53)
tOEH(40)
OE
tDHR(35)
I/O0 ~
I/O15
tDS(33)
High-Z
Vaild Data-in
tDH(34)
: High or Low
PRELIMINARY (June, 2001, Version 0.0) 12 AMIC Technology, Inc.
Page 14
A42U0616 Series
Word Read-Modify-Write Cycle
tRWC(36)
tRAS(3)tRP(2)
RAS
tCSH(8)
tCRP(9)
tRCD(5)tRSH(7)
tCRP(9)
UCAS
LCAS
WE
OE
I/O0 ~
I/O15
tASR(10)
Row AddressColumn AddressAddress
tAR(16)
tRAD(6)
tRAH(11)tCAH(25)
t
RCS(17)
tRAC(13)
tASC(24)
tRWD(37)
tOEA(52)
tCAC(14)
tAA(15)
High-Z
tCLZ(12)
tCAS(4)
tAWD(39)
tCWD38)
tOED(53)
tOEZ(54)
tDS(33)tDH(34)
Data-outData-in
tCWL(32)
tRWL(31)
tWP(30)
tOEH(40)
: High or Low
PRELIMINARY (June, 2001, Version 0.0) 13 AMIC Technology, Inc.
Page 15
A42U0616 Series
EDO Page Mode Word Read Cycle
tRASP(47)tRP(2)
RAS
UCAS
LCAS
Address
WE
OE
I/O0 ~
I/O15
tCRP(9)
tASR(10)tRAH(11)
RowColumnColumnColumn
tRCD(5)
tRAD(6)
tRCS(17)
tCSH(8)
tCSH(8)
tAR(16)
tRAC(13)
tASC(24)
tAA(15)
tCAC(14)
tPC(42)tRSH(7)
tCAH(25)
tOES(26)
tCLZ(12)
tCP(44)
tOEA(52)
tRCH(25)
tCPA(43)
tCAC(14)
tCAH(25)
tOEP(41)
tCOH(21)
tCAS(4)tCAS(4)tCAS(4)
tRAL(20)
tCAH(25)
tASC(24)
tRCS(17)tRCS(17)
tAA(15)
tOEA(52)
tCAC(14)
tOEZ(54)
Data-outData-outData-out
tCLZ(12)
tCRP(9)
tRCH(25)
tRRH(19)
tOFF(23)
tOEZ(54)
: High or Low
PRELIMINARY (June, 2001, Version 0.0) 14 AMIC Technology, Inc.
Page 16
A42U0616 Series
EDO Page Mode Early Word Write Cycle
tRASP(47)tRP(2)
RAS
UCAS
LCAS
WE
OE
t
tCRP(9)tCRP(9)
tRAD(6)
tASR(10)
tRAH(11)
RowColumnColumnAddress
tWCS(27)tWCS(27)
tRCD(5)
t
ASC(24)
CSH(8)
t
CAH(25)
tASC(24)
t
CWL(32)
tWCH(28)
tWP(30)tWP(30)
Column
t
CWL(32)
t
PC(42)
t
CAH(25)
tASC(24)
tWCS(27)
tWCH(28)
t
tWP(30)
tCAS(4)tCP(44)tCAS(4)tCP(44)tCAS(4)
tRAL(20)
CWL(32)
t
RWL(31)
t
RSH(7)
t
CAH(25)
tWCH(28)
I/O0 ~
I/O15
tDH(34)
tDS(33)tDS(33)
tDS(33)
Data-inData-inData-in
tDH(34)
tDH(34)
PRELIMINARY (June, 2001, Version 0.0) 15 AMIC Technology, Inc.
: High or Low
Page 17
A42U0616 Series
EDO Page Mode Word Read-Modify-Write Cycle
RAS
UCAS
LCAS
Address
WE
OE
tRASP(47)
tCRP(9)
tRAD(6)
tASR(10)tRAH(11)
tCSH(8)
tRCD(5)
tCAH(25)
tASC(24)
tPCM(45)tRSH(7)
tCAH(25)
tASC(24)
RowColumnColumnColumn
tCWL(32)
tRWD(37)
tRCS(17)tCWD(38)
tAWD(39)
tAA(15)
tOEA(52)tOEA(52)
tOEH(40)
tOED(53)
tCAC(14)
tCPA(43)
tCWD(38)
tWP(30)tWP(30)tWP(30)
tAWD(39)tAWD(39)
tOED(53)
tAA(15)
tCWL(32)
tCPA(43)
tAA(15)
tCAS(4)tCP(44)tCAS(4)tCP(44)tCAS(4)
tRAL(20)
tCAH(25)
tASC(24)
tCWD(38)
ROH(51)
t
tOEA(52)
tOED(53)
tRP(2)
CRP(9)
t
tCWL(32)
tRWL(31)
I/O 0 ~
High-Z
tRAC(13)
tOEZ(54)
tDH(34)
tDS(33)
tOEZ(54)
tDS(33)
tDH(34)
tOEZ(54)
tDH(34)
tDS(33)
I/O 15
tCLZ(12)tCLZ(12)tCLZ(12)
Data-out
Data-in
Data-out
Data-in
Data-in
Data-out
: High or Low
PRELIMINARY (June, 2001, Version 0.0) 16 AMIC Technology, Inc.
Page 18
A42U0616 Series
RAS Only Refresh Cycle
tRC(1)
tRAS(3)tRP(2)
RAS
tCRP(9)
UCAS
LCAS
tASR(10)tRAH(11)
Address
Row
Note: WE, OE = Don't care.
CAS Before RAS Refresh Cycle
tRP(2)
RAS
tRPC(50)
tRPC(50)
: High or Low
tRC(1)
tRAS(3)tRP(2)
tCHR(49)
tPC(42)
tCSR(48)
UCAS
LCAS
tOFF(23)
High-Z
I/O0 ~
I/O15
: High or LowNote: WE, OE, Address = Don't care.
PRELIMINARY (June, 2001, Version 0.0) 17 AMIC Technology, Inc.
Page 19
A42U0616 Series
Hidden Refresh Cycle (Word Read)
RAS
UCAS
LCAS
Address
WE
tAR(16)
t
CRP(9)
tASR(10)
tRCD(5)
tRAD(6)
tRAH(11)
tASC(24)
RowColumn
tRC(1)
tRAS(3)tRP(2)
tRSH(7)
tRAL(20)
tCAH(25)
tRC(1)
tRAS(3)tRP(2)
tCHR(49)
tRRH(19)tRCS(17)
tCRP(9)
OE
I/O0 ~
I/O15
High-Z
tCLZ(12)
tRAC(13)
t
AA(15)
tCAC(14)
tOFF(23)
Valid Data-out
: High or Low
PRELIMINARY (June, 2001, Version 0.0) 18 AMIC Technology, Inc.
Page 20
A42U0616 Series
Hidden Refresh Cycle (Early Word Write)
RAS
UCAS
LCAS
Address
WE
tAR(16)
tCRP(9)
tASR(10)
tRCD(5)
tRAD(6)
tRAH(11)
tASC(24)
RowColumn
t
WCS(27)
tRC(1)
tRAS(3)tRP(2)
tRSH(7)
tRAL(20)
tCAH(25)
t
WCH(28)
tWP(30)
tRC(1)
tRAS(3)tRP(2)
tCHR(49)
tCRP(9)
OE
tDS(33)tDH(34)
I/O0 ~
I/O
15
PRELIMINARY (June, 2001, Version 0.0) 19 AMIC Technology, Inc.
Valid Data-in
: High or Low
Page 21
A42U0616 Series
EDO Page Mode Read-Early-Write Cycle (Pseudo Read-Modify-Write)
RAS
UCAS
LCAS
Address
WE
tCRP(9)
tASR(10)
tRASP(47)
tCSH(8)
tRCD(5)tCAS(4)tCP(44)tCAS(4)tCP(44)tCAS(4)tCPR(9)
tRAD(6)
tRAD(6)
tRAH(11)
tASC(24)
tCAH(25)
tCAH(25)tASC(24)
RowColumnColumn
tRCH(18)
tRCS(17)
tAA(15)
tAA(15)
tRAC(13)
tCAC(14)
tCAP(43)
tCAC(14)
tRP(2)
tRSH(7)tPC(42)tPC(42)
tRAL(20)
tCAH(25)tASC(24)
Column
tWCS(27)tWCH(28)
tDS(33)
tDH(34)
tOEA(52)
OE
tCOH(21)
I/O0 ~
I/O15
Data-outData-outData-in
: High or Low
PRELIMINARY (June, 2001, Version 0.0) 20 AMIC Technology, Inc.
Page 22
A42U0616 Series
Self Refresh Mode
RAS
UCAS
LCAS
A0 ~ A7
I/O0 ~
I/O15
tRPC(50)
CPN(42)
t
tOFF(23)
Note: WE, OE = Don't care.
tCSR(48)
High-Z
tRASS(55)tRP(2)
tCHS(57)
tRPS(56)
tCRP(9)
tASR(10)
ROWCOL
: High or Low
n Self Refresh Mode.
a. Entering the Self Refresh Mode:
The A42U0616 Self Refresh Mode is entered by using CAS before RAS cycle and holding RAS and CAS signal
"low" longer than 100µs.
b. Continuing the Self Refresh Mode:
The Self Refresh Mode is continued by holding RAS "low" after entering the Self Refresh Mode.
It does not depend on CAS being "high" or "low" after entering the Self Refresh Mode continue the Self Refresh Mode.
c. Exiting the Self Refresh Mode:
The A42U0616 exits the Self Refresh Mode when the RAS signal is brought "high".
PRELIMINARY (June, 2001, Version 0.0) 21 AMIC Technology, Inc.
Page 23
A42U0616 Series
Capacitance
Symbol Signals Parameter Max. Unit Test Conditions