Preliminary 64K X 16 CMOS DYNAMIC RAM WITH FAST PAGE MODE
Document Title
64K X 16 CMOS DYNAMIC RAM WITH FAST PAGE MODE
Revision History
Rev. No. History Issue Date Remark
0.0 Initial issue November 15, 2000 Preliminary
PRELIMINARY (November, 2000, Version 0.0) AMIC Technology, Inc.
Page 2
A416316B Series
Preliminary 64K X 16 CMOS DYNAMIC RAM WITH FAST PAGE MODE
Features
n Organization: 65,536 words X 16 bits
n Part Identification:
- A416316B
- A416316B-L (with self-refresh mode)
n High speed
- 30/35/40 ns RAS access time
- 16/18/20 ns column address access time
- 10/11/12 ns CAS access time
n Low power consumption
- Operating: 75mA (-30 max)
- Standby: 3 mA (TTL)
Pin Configuration Pin Descriptions
nn SOJ nnTSOP
VCC
I/O0
I/O1
I/O2
I/O3
VCC
I/O4
I/O5
I/O6
I/O7
NC
NC
WE
RAS
NC
VCC
40
1
2
3
4
5
6
7
A416316BS
8
9
10
11
12
13
14
15
A0
16
A1
17
A2
18
19
A3
20
I/O15
39
I/O14
38
37
I/O13
36
I/O12
35
VSS
34
I/O11
33
I/O10
32
I/O9
31
I/O8
30
NC
LCAS
29
UCAS
28
OE
27
NC
26
25
A7
A6
24
23
A5
A4
22
21
VSS
VCC
I/O0
I/O1
I/O2
I/O3
VCC
I/O4
I/O5
I/O6
I/O7
NC
NC
WE
RAS
NC
VCC
1
2
3
4
5
6
7
A416316BV
8
9
10
13
14
15
16
17
A0
18
A1
19
A2
20
21
A3
22
VSS
44
I/O15
43
I/O14
42
41
I/O13
40
I/O12
39
VSS
38
I/O11
37
I/O10
36
I/O9
35
I/O8
32
NC
31
LCAS
30
UCAS
OE
29
28
NC
27
A7
A6
26
25
A5
A4
24
VSS
23
VSS
n Separate CAS (
UCAS
,
LCAS
) for byte selection
n Self refresh mode
n 256 refresh cycles, 4 ms refresh interval
n Read-modify-write, RAS -only, CAS -before-RAS ,
Hidden refresh capability
n TTL-compatible, three-state I/O
n JEDEC standard packages
- 400mil, 40-pin SOJ
- 400mil, 40/44 TSOP type II package
n Single 5V power supply/built-in VBB generator
Symbol Description
A0 – A7 Address Inputs
I/O0 - I/O15 Data Input/Output
RAS
UCAS
LCAS
WE
OE
VCC +5V Power Supply
VSS Ground
NC No Connection
Row Address Strobe
Column Address Strobe/Upper Byte Control
Column Address Strobe/Lower Byte Control
Write Enable
Output Enable
PRELIMINARY (November, 2000, Version 0.0) 1 AMIC Technology, Inc.
Page 3
A416316B Series
Selection Guide
Symbol Description -30 -35 -40 Unit
tRAC
tAAMaximum Column Address Access Time 16 18 20 ns
tCAC
tOEA
tRCMinimum Read or Write Cycle Time 65 70 75 ns
tPCMinimum Fast Page Mode Cycle Time 19 21 23 ns
ICC1Maximum Operating Current 95 85 75 mA
ICC6Maximum CMOS Standby Current 2 2 2 mA
Maximum RAS Access Time
Maximum CAS Access Time
Maximum Output Enable (OE ) Access Time
30 35 40 ns
10 11 12 ns
10 11 12 ns
Functional Description
The A416316B is a high performance CMOS Dynamic
Random Access Memory organized as 65,536 words X
16 bits. The A416316B is fabricated with advanced
CMOS technology and designed with innovative design
techniques resulting in high speed, extremely low power
and wide operating margins at component and system
levels.
The A416316B features a high speed page mode
operation in which high speed read, write and read-write
are performed on any of the bits defined by the column
address. The asynchronous column address uses an
extremely short row address capture time to ease the
system level timing constraints associated with
multiplexed addressing. Output is tri-stated by a column
address strobe (
output enable independent of RAS. Very fast
to output access time eases system design.
LCAS
All inputs are TTL compatible. Fast Page Mode
operation allows random access up to 256 X 16 bits
within a page, with cycle time as short as 19/21/23 ns.
The A416316B is best suited for graphics, digital signal
processing and high performance peripherals.
The A416316B is available in JEDEC standard 40-pin
plastic SOJ package and 40/44 TSOP type II package.
UCAS
and
) which acts as an
LCAS
UCAS
and
PRELIMINARY (November, 2000, Version 0.0) 2 AMIC Technology, Inc.
Page 4
A416316B Series
Block Diagram
I/O15
I/O14
I/O13
I/O12
I/O11
I/O10
I/O9
I/O8
VCC
VSS
REFRESH
CONTROLLER
Y0 - Y7
COLUMN
DECODER
SENSE AMP
UPPER
BYTE
DATA
I/O
BUFFER
RAS
UCAS
LCAS
WE
OE
RAS CLOCK
GENERATOR
UCAS CLOCK
GENERATOR
LCAS CLOCK
GENERATOR
WE CLOCK
GENERATOR
OE CLOCK
GENERATOR
256 X 16
LOWER
A0
A1
A2
A3
A4
A5
A6
A7
ADDRESS BUFFERS
X0 - X7
ROW DECODER
256
256 X 256 X 16
ARRAY
SUBSTRATE
BIAS
GENERATOR
BYTE
DATA
I/O
BUFFER
I/O7
I/O6
I/O5
I/O4
I/O3
I/O2
I/O1
I/O0
Recommended Operating Conditions (Ta = 0°C to +70°C)
Symbol Description Min. Typ. Max. Unit
VCC
Supply Voltage
VSS 0.0 0.0 0.0 V
VIH
Input Voltage
VIL-1.0 - 0.8 V
PRELIMINARY (November, 2000, Version 0.0) 3 AMIC Technology, Inc.
4.5 5.0 5.5 V
2.4 - VCC + 1 V
Page 5
A416316B Series
Truth Table
Function
Standby H H H L L L L
Read: Word L L L H L Row/Col. Data Out
Read: Lower Byte L H L H L Row/Col. I/O0-7 = Data Out
RAS
UCAS
LCAS
WE OE
Address I/Os Notes
I/O8-15 = High-Z
Read: Upper Byte L L H H L Row/Col. I/O0-7 = High-Z
I/O8-15 = Data Out
Write: Word(Early) L L L L X Row/Col. Data In
Write: Lower Byte(Early) L H L L X Row/Col. I/O0-7 = Data In
I/O8-15 = X
Write: Upper Byte(Early) L L H L X Row/Col. I/O0-7 = X
Short Circuit Output Current (Iout) . . . . . . . . . . . . . 50mA
*Comments
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to this device.
These are stress ratings only. Functional operation of
this device at these or any other conditions above
those indicated in the operational sections of these
specification is not implied or intended. Exposure to
the absolute maximum rating conditions for extended
periods may affect device reliability.
(Read-Modify-Write)
Column Address to WE Delay Time
(Read-Modify-Write)
RAS
CAS Precharge Time
(CAS before RAS)
Access Time from CAS Precharge
(Fast Page)
CAS Precharge Time (Fast Page)
Parameter
-30 -35 -40
Unit Notes
26 - 28 - 30 - ns 11
32 - 35 - 35 - ns 11
300 - 300 - 300 -
10 100K 10 100K 10 100K ns
- 19 - 21 - 23 ns 13
3 - 4 - 5 - ns
µs
46 tCRW
47 tRASP
48 tCSR
49 tCHR
50 tRPC
51 tROH
52 tOEA
53 tOED
54 tOEZ
Fast Page Mode CAS Pulse Width
(RMW)
RAS Pulse Width (Fast Page)
CAS Setup Time (CAS -before- RAS )
CAS Hold Time (CAS -before- RAS )
RAS to CAS
(CAS -before-RAS)
RAS Hold Time Reference to OE
OE Access Time
OE to Data Delay
Output Buffer Turn-off Delay from OE
- 44 - 46 - 48 ns
30 75K 35 75K 40 75K ns
0 - 0 - 0 - ns 3
7 - 8 - 8 - ns 3
0 - 0 - 0 - ns
6 - 7 - 8 - ns
- 10 - 11 - 12 ns
5 - 5 - 5 - ns
0 5 0 6 0 6 ns 8
PRELIMINARY (November, 2000, Version 0.0) 8 AMIC Technology, Inc.
Page 10
A416316B Series
AC Characteristics (continued)
(VCC = 5V ± 10%, VSS = 0V, Ta = 0°C to +70°C)
# Std
Symbol
Min. Max. Min. Max. Min. Max.
55 tOEH
56 tCPT
Notes:
1. ICC1, ICC3, ICC4, and ICC5 depend on cycle rate.
2. ICC1 and ICC4 depend on output loading. Specified values are obtained with the outputs open.
3. An initial pause of 200µs is required after power-up followed by any 8 RAS cycles before proper device operation is
achieved. In the case of an internal refresh counter, a minimum of 8 CAS -before-RAS initialization cycles instead of 8
RAS cycles are required. 8 initialization cycles are required after extended periods of bias without clocks (greater than
8ms).
4. AC Characteristics assume tT = 3ns. All AC parameters are measured with a load equivalent to one TTL loads and
50pF, VIL (min.) ≥ GND and VIH (max.) ≤ VCC.
5. VIH (min.) and VIL (max.) are reference levels for measuring timing of input signals. Transition times are measured
between VIH and VIL.
6. Operation within the tRCD (max.) limit insures that tRAC (max.) can be met. tRCD (max.) is specified as a reference
point only. If tRCD is greater than the specified tRCD (max.) limit, then access time is controlled exclusively by tCAC.
7. Operation within the tRAD (max.) limit insures that tRAC (max.) can be met. tRAD (max.) is specified as a reference
point only. If tRAD is greater than the specified tRAD (max.) limit, then access time is controlled exclusively by tAA.
8. Assumes three state test load (5pF and a 380Ω Thevenin equivalent).
9. Either tRCH or tRRH must be satisfied for a read cycle.
10. tOFF (max.) defines the time at which the output achieves the open circuit condition; it is not referenced to output
voltage levels.
11. tWCS, tWCH, tRWD, tCWD and tAWD are not restrictive operating parameters. They are included in the data sheet
as electrical characteristics only. If tWCS≥ tWCS (min.) and tWCH≥ tWCH (min.), the cycle is an early write cycle
and data-out pins will remain open circuit, high impedance, throughout the entire cycle. If tRWD≥ tRWD (min.) , tCWD≥
tCWD (min.) and tAWD≥ tAWD (min.), the cycle is a read-modify-write cycle and the data out will contain data read from
the selected cell. If neither of the above conditions is satisfied, the condition of the data out at access time is
indeterminate.
12. These parameters are referenced to
read-modify-write cycles.
13. Access time is determined by the longer of tAA or tCAC or tCPA.
14. tASC≥ tCP to achieve tPC (min.) and tCPA (max.) values.
15. These parameters are sampled and not 100% tested.
OE Command Hold Time
CAS Precharge Time
(CAS -before-RAS Counter Test)
Parameter
UCAS
and
-30 -35 -40
0 - 0 - 0 - ns
20 - 20 - 20 - ns
leading edge in early write cycles and to WE leading edge in
LCAS
Unit Notes
PRELIMINARY (November, 2000, Version 0.0) 9 AMIC Technology, Inc.
Page 11
A416316B Series
Word Read Cycle
tRC(1)
RAS
UCAS
LCAS
A0 ~ A7
WE
tRAS(3)
tCSH(8)
tCRP(9)
tASR(10)
tRAH(11)
tRCD(5)tRSH(7)
tRAD(6)tRAL(20)
tASC(24)tCAH(25)
Row AddressColumn Address
tAR(16)
tRCS(17)
tRP(2)
tCRP(9)
tCAS(4)
tRCH(18)
tRRH(19)
tROH(51)
tOEA(52)
OE
tCAC(14)
I/O0 ~
I/O15
tAA(15)
tRAC(13)
High-Z
Valid Data-out
tCLZ(12)
tOFF(23)
tOEZ(54)
: High or Low
PRELIMINARY (November, 2000, Version 0.0) 10 AMIC Technology, Inc.
Page 12
A416316B Series
Word Write Cycle (Early Write)
tRC(1)
RAS
UCAS
LCAS
A0 ~ A7
WE
tRAS(3)
tCSH(8)
tCRP(9)
tASR(10)
tRAH(11)
tRCD(5)tRSH(7)
tAR(16)
tRAD(6)tRAL(20)
tASC(24)
tCAH(25)
Row AddressColumn Address
tWCR(29)
tCWL(32)
tWP(30)
tRP(2)
tCRP(9)
tCAS(4)
tRWL(31)
tWCS(27)
tWCH(28)
OE
tDHR(35)
tDS(33)tDH(34)
I/O0 ~
I/O15
Valid Data-in
: High or Low
PRELIMINARY (November, 2000, Version 0.0) 11 AMIC Technology, Inc.
Page 13
A416316B Series
Word Write Cycle (Late Write)
tRC(1)
RAS
UCAS
LCAS
A0 ~ A7
WE
tRAS(3)
tCSH(8)
tCRP(9)
tASR(10)
tRAH(11)
tRCD(5)tRSH(7)
tAR(16)
tRAD(6)tRAL(20)
tASC(24)
tCAH(25)
Row AddressColumn Address
tWCR(29)
tRP(2)
tCRP(9)
tCAS(4)
tCWL(32)
tRWL(31)
tWP(30)
tOED(54)
tOEH(55)
OE
tDHR(35)
I/O0 ~
I/O15
tDS(33)
High-Z
Vaild Data-in
tDH(34)
: High or Low
PRELIMINARY (November, 2000, Version 0.0) 12 AMIC Technology, Inc.
Page 14
A416316B Series
Word Read-Modify-Write Cycle
tRMW(36)
RAS
UCAS
LCAS
WE
tCRP(9)
tASR(10)
Row AddressColumn AddressA0 ~ A7
tCSH(8)
tRCD(5)tRSH(7)
tAR(16)
tRAD(6)
tRAH(11)tCAH(25)
tASC(24)
tRWD(37)
tOEA(52)
tRAS(3)
tAWD(39)
tCWD38)
tOED(53)
tOEZ(54)
tCAS(4)
CWL(32)
t
tRWL(31)
tWP(30))
tRP(2)
tCRP(9)
OE
tCAC(14)
I/O0 ~
I/O15
tAA(15)
tRAC(13)
High-Z
Data-outData-in
tCLZ(12)
tDS(33)tDH(34)
: High or Low
PRELIMINARY (November, 2000, Version 0.0) 13 AMIC Technology, Inc.
Page 15
A416316B Series
Fast Page Mode Word Read Cycle
tRASP(47)tRP(2)
RAS
UCAS
LCAS
WE
OE
tCRP(9)
tASR(10)
RowColumnColumnA0 ~ A7
tRAH(11)
tRCD(5)
tRAD(6)
tASC(24)
tRCS(17)
tCSH(8)
tAR(16)
tOEA(52)
tRCH(18)
tCAH(25)
tASC(24)
tPC(42)tRSH(7)
tCAH(25)tCAH(25)
tASC(24)
Column
tAA(15)tAA(15)
tRCS(17)tRCS(17)
tRCH(18)
tCPA(43)tCPA(43)
tOEA(52)tOEA(52)
tCRP(9)
tCAS(4)tCP(44)tCAS(4)tCP(44)tCAS(4)
tRAL(20)
tRRH(19)
tRCH(18)
tROH(51)
I/O0 ~
I/O15
tRAC(13)
tAA(15)
tCAC(14)
tOFF(23)tOFF(23)
tCAC(14)
tOEZ(54)
tOEZ(54)
Data-outData-outData-out
tCLZ(12)tCLZ(12)
tOFF(23)
tCAC(14)
tOEZ(54)
tCLZ(12)
: High or Low
PRELIMINARY (November, 2000, Version 0.0) 14 AMIC Technology, Inc.
Page 16
A416316B Series
Fast Page Mode Early Word Write Cycle
tRASP(47)tRP(2)
RAS
UCAS
LCAS
WE
OE
tCRP(9)tCRP(9)
tASR(10)
tRAH(11)
RowColumnColumnA0 ~ A7
tCSH(8)
tRCD(5)
tRAD(6)
tASC(24)
tCWL(32)
tWCS(27)tWCS(27)
tWP(30)tWP(30)
tCAH(25)
tASC(24)
tWCH(28)
Column
tCWL(32)
tPC(42)tRSH(7)
tCAS(4)tCP(44)tCAS(4)tCP(44)tCAS(4)
tRAL(20)
tCAH(25)tCAH(25)
tASC(24)
tCWL(32)
tRWL(31)
tWCS(27)
tWCH(28)
tWP(30)
tWCH(28)
I/O0 ~
I/O15
tDH(34)
tDS(33)tDS(33)
tDS(33)
Data-inData-inData-in
tDH(34)
tDH(34)
: High or Low
PRELIMINARY (November, 2000, Version 0.0) 15 AMIC Technology, Inc.
Page 17
A416316B Series
Fast Page Mode Word Read-Modify-Write Cycle
RAS
A0 ~ A7
WE
OE
tRASP(47)
tCRP(9)
tASR(10)
tRAD(6)
tRAH(11)
tCSH(8)
tRCD(5)
tCAH(25)
tASC(24)
tPRMW(45)tRSH(7)
tCAS(4)tCP(44)tCAS(4)
tCAH(25)
tASC(24)
RowColumnColumnColumn
tCWL(32)
tRWD(37)
tRCS(17)tCWD(38)
tAWD(39)
tOEA(52)tOEA(52)
tCWD(38)
tWP(30)tWP(30)tWP(30)
tAWD(39)tAWD(39)
tCWL(32)
tRP(2)
tCRP(9)
tCAS(4)tCP(44)
tRAL(20)
tCAH(25)
tASC(24)
tCWL(32)
tRWL(31)
tCWD(38)
tROH(51)
tOEA(52)
I/O0 ~
High-Z
tRAC(13)
tAA(15)
tCAC(14)
tOEZ(54)
tOED(53)
tCPA(43)
tAA(15)
tDH(34)
tDS(33)
tOED(53)
tOEZ(54)
tCPA(43)
tAA(15)
tOEZ(54)
tDH(34)
tDS(33)
I/O15
tCLZ(12)tCLZ(12)tCLZ(12)
Data-out
Data-in
Data-out
Data-in
Data-in
Data-out
: High or Low
PRELIMINARY (November, 2000, Version 0.0) 16 AMIC Technology, Inc.
tOED(53)
tDH(34)
tDS(33)
Page 18
A416316B Series
Only Refresh Cycle
RAS
RC(1)
t
RAS
CRP(9)
t
UCAS
LCAS
ASR(10)
t
A0 ~ A7
Note: WE, OE = Don't care.
CAS Before RAS Refresh Cycle
Row
tRP(2)
RAH(11)
t
RAS(3)
t
tRAS(3)
tRC(1)
RPC(50)
t
tRP(2)
RP(2)
t
: High or Low
RAS
UCAS
LCAS
I/O0 ~
I/O15
PRELIMINARY (November, 2000, Version 0.0) 17 AMIC Technology, Inc.
tCPN(41)
tRPC(50)
tCHR(49)
tCSR(48)
tOFF(23)
High-Z
: High or LowNote: WE, OE, A0 ~ A7 = Don't care.
Page 19
A416316B Series
CAS
RAS
Timing Waveform of
RAS
tCSR (48)
CAS
Address
I/O
WE
Read CycleWrite CycleRead-Write Cycle
OE
WE
-before-
tCHR (49)
Refresh Counter Test Cycle
tRAS (3)
tRSH (7)
tCPT (56)
tCAH (25)
Col Address
tAA (15)
tCLZ (12)
tOEA (52)
tWP(30)
tCAS (4)
tRAL (20)
tCAC (14)
Data Out
tROH (53)
tRWL(31)
tCWL(32)
tWCH(28)tWCS(27)
tRP (2)
tOFF (23)
tRRH (19)
tRCH (18)tRCS (17)
tDH (34)tDS (33)
I/O
OE
tRCS (17)
WE
OE
tAA (15)
tCLZ (12)
tCAC (14)
I/O
Data In
tAWD(39)
tCWD(38)
tOED (53)tOEA(52)
tOEZ(54)
tDS (33)
tWP (30)
tCWL(32)
tDH (34)
Data InData Out
PRELIMINARY (November, 2000, Version 0.0) 18 AMIC Technology, Inc.
Page 20
A416316B Series
Hidden Refresh Cycle (Word Read)
RAS
UCAS
LCAS
A0 ~ A7
WE
tAR(16)
tCRP(9)
tASR(10)
tRCD(5)
tRAD(6)
tRAH(11)
tASC(24)
RowColumn
tRC(1)
tRAS(3)tRP(2)
tRSH(7)
tRAL(20)
tCAH(25)
tRC(1)
tRAS(3)tRP(2)
tCHR(49)
tRRH(19)tRCS(17)
tCRP(9)
tAA(15)
OE
I/O0 ~
I/O15
tCAC(14)
tCLZ(12)
tRAC(13)
High-Z
Valid Data-out
tOFF(23)
: High or Low
PRELIMINARY (November, 2000, Version 0.0) 19 AMIC Technology, Inc.
Page 21
A416316B Series
Hidden Refresh Cycle (Early Word Write)
RAS
UCAS
LCAS
A0 ~ A7
WE
tAR(16)
tCRP(9)
tASR(10)
tRCD(5)
tRAD(6)
tRAH(11)
tASC(24)
RowColumn
tWCS(27)tWCH(28)
tRC(1)
tRAS(3)tRP(2)
tRSH(7)
tRAL(20)
tCAH(25)
tWP(30)
tRC(1)
tRAS(3)tRP(2)
tCHR(49)
tCRP(9)
OE
tDS(33)tDH(34)
I/O0 ~
I/O15
Valid Data-in
: High or Low
PRELIMINARY (November, 2000, Version 0.0) 20 AMIC Technology, Inc.
Page 22
A416316B Series
Self Refresh Mode (A416316B-L Only)
RAS
UCAS
LCAS
A0 ~ A7
I/O0 ~
I/O15
tRPC(50)
tCPN(41)
tOFF(23)
Note: WE, OE = Don't care.
tCSR(48)
High-Z
tRASS(40)tPR(2)
tCHS(21)
tRPS(26)
tCRP(9)
tASR(10)
ROWCOL
: High or Low
n Self Refresh Mode.
a. Entering the Self Refresh Mode:
The A416316B-L Self Refresh Mode is entered by using CAS before RAScycle and holding RAS and CAS signal
“low” longer than 300µs.
b. Continuing the Self Refresh Mode:
The Self Refresh Mode is continued by holding RAS “low” after entering the Self Refresh Mode.
It does not depend on CAS being “high” or “low” after entering the Self Refresh Mode continue the Self Refresh Mode.
c. Exiting the Self Refresh Mode:
The A416316B exits the Self Refresh Mode when the RAS signal is brought “high”.
PRELIMINARY (November, 2000, Version 0.0) 21 AMIC Technology, Inc.
Page 23
A416316B Series
RAS
Capacitance
Symbol Signals Parameter Max. Unit Test Conditions