A40MX02 = 3,000 System Gates
A40MX04 = 6,000 System Gates
A42MX09 = 14,000 System Gates
A42MX16 = 24,000 System Gates
A42MX24 = 36,000 System Gates
A42MX36 = 54,000 S
Blank = Standard Speed
–1 = Approximately 15% Faster than Standard
–2 = Approximately 25% Faster than Standard
–3 = Approximately 35% Faster than Standard
–F = Approximately 40% Slower than Standard
stem Gates
ES
Application (Temperature Range)
Blank = Commercial (0 to +70˚C)
I = Industrial (–40 to +85˚C)
M = Military (–55 to +125˚C)
B = MIL-STD-883
A = Automotive (–40 to +125˚C)
Actel's 40MX and 42MX families offer a cost-effective
design solution at 5V. The MX devices are single-chip
solutions and provide high performance while
shortening the system design and development cycle.
MX devices can integrate and consolidate logic
implemented in multiple PALs, CPLDs, and FPGAs.
Example applications include high-speed controllers and
address decoding, peripheral bus interfaces, DSP, and coprocessor functions.
The MX device architecture is based on Actel’s patented
antifuse technology implemented in a 0.45µm triplemetal CMOS process. With capacities ranging from 3,000
to 54,000 system gates, the MX devices provide
performance up to 250 MHz, are live on power-up and
have one-fifth the standby power consumption of
comparable FPGAs. Actel’s MX FPGAs provide up to 202
user I/Os and are available in a wide variety of packages
and speed grades.
Actel’s A42MX24 and A42MX36 devices also feature
MultiPlex I/Os, which support mixed-voltage systems,
enable programmable PCI, deliver high-performance
operation at both 5.0V and 3.3V, and provide a lowpower mode. The devices are fully compliant with the
PCI Local Bus Specification (version 2.1). They deliver
200 MHz on-chip operation and 6.1 ns clock-to-output
performance.
The 42MX24 and 42MX36 devices include system-level
features such as IEEE Standard 1149.1 (JTAG) Boundary
Scan Testing and fast wide-decode modules. In addition,
the A42MX36 device offers dual-port SRAM for
implementing fast FIFOs, LIFOs, and temporary data
storage. The storage elements can efficiently address
applications requiring wide datapath manipulation and
can perform transformation functions such as those
required for telecommunications, networking, and DSP.
All MX devices are fully tested over automotive and
military temperature ranges. In addition, the largest
member of the family, the A42MX36, is available in both
CQ208 and CQ256 ceramic packages screened to MILSTD-883 levels. For easy prototyping and conversion from
plastic to ceramic, the CQ208 and PQ208 devices are pincompatible.
MX Architectural Overview
The MX devices are composed of fine-grained building
blocks that enable fast, efficient logic designs. All devices
within these families are composed of logic modules, I/O
modules, routing resources and clock networks, which
are the building blocks for fast logic designs. In addition,
the A42MX36 device contains embedded dual-port
SRAM modules, which are optimized for high-speed
datapath functions such as FIFOs, LIFOs and scratchpad
memory. A42MX24 and A42MX36 also contain widedecode modules.
Logic Modules
The 40MX logic module is an eight-input, one-output
logic circuit designed to implement a wide range of logic
functions with efficient use of interconnect routing
resources (Figure 1-1).
The logic module can implement the four basic logic
functions (NAND, AND, OR and NOR) in gates of two,
three, or four inputs. The logic module can also
implement a variety of D-latches, exclusivity functions,
AND-ORs and OR-ANDs. No dedicated hard-wired latches
or flip-flops are required in the array; latches and flipflops can be constructed from logic modules whenever
required in the application.
Figure 1-1 • 40MX Logic Module
v6.01-1
Page 8
40MX and 42MX FPGA Families
A
T
The 42MX devices contain three types of logic modules:
combinatorial (C-modules), sequential (S-modules) and
decode (D-modules). Figure 1-2 illustrates the
combinatorial logic module. The S-module, shown in
Figure 1-3, implements the same combinatorial logic
function as the C-module while adding a sequential
element. The sequential element can be configured as
either a D-flip-flop or a transparent latch. The S-module
register can be bypassed so that it implements purely
combinatorial logic.
0
B0
A1
B1
S0
D00
D01
D10
D11
S1
Figure 1-2 • 42MX C-Module Implementation
Y
D00
D01
D10
D11
S1
Up to 7-Input Function Plus D-Type Flip-Flop with Clear
D0
D1
S
Up to 4-Input Function Plus Latch with Clear
D
Y
S0
D
Y
GATE
Figure 1-3 • 42MX S-Module Implementation
CLR
CLR
QOUT
Q
OUT
D00
D01
D10
D11
Up to 7-Input Function Plus Latch
Up to 8-Input Function (Same as C-Module)
S0
S1
D00
D01
D10
D11
S1
D
GATE
Y
Q
OUT
Y
S0
OU
1-2v6.0
Page 9
40MX and 42MX FPGA Families
A42MX24 and A42MX36 devices contain D-modules,
which are arranged around the periphery of the device.
D-modules contain wide-decode circuitry, providing a
fast, wide-input AND function similar to that found in
CPLD architectures (Figure 1-4). The D-module allows
A42MX24 and A42MX36 devices to perform widedecode functions at speeds comparable to CPLDs and
PALs. The output of the D-module has a programmable
inverter for active HIGH or LOW assertion. The D-module
output is hardwired to an output pin, and can also be
fed back into the array to be incorporated into other
logic.
Dual-Port SRAM Modules
The A42MX36 device contains dual-port SRAM modules
that have been optimized for synchronous or
asynchronous applications. The SRAM modules are
arranged in 256-bit blocks that can be configured as 32x8
or 64x4. SRAM modules can be cascaded together to
form memory spaces of user-definable width and depth.
A block diagram of the A42MX36 dual-port SRAM block
is shown in Figure 1-5.
The A42MX36 SRAM modules are true dual-port
structures containing independent read and write ports.
Each SRAM module contains six bits of read and write
addressing (RDAD[5:0] and WRAD[5:0], respectively) for
64x4-bit blocks. When configured in byte mode, the
highest order address bits (RDAD5 and WRAD5) are not
used. The read and write ports of the SRAM block
contain independent clocks (RCLK and WCLK) with
programmable polarities offering active HIGH or LOW
implementation. The SRAM block contains eight data
inputs (WD[7:0]), and eight outputs (RD[7:0]), which are
connected to segmented vertical routing tracks.
The A42MX36 dual-port SRAM blocks provide an optimal
solution for high-speed buffered applications requiring
FIFO and LIFO queues. The ACTgen Macro Builder within
Actel's Designer software provides capability to quickly
design memory functions with the SRAM blocks. Unused
SRAM blocks can be used to implement registers for
other user logic within the design.
7 Inputs
Hard-Wire to I/O
Programmable
Inverter
Feedback to Array
Figure 1-4 • A42MX24 and A42MX36 D-Module
Implementation
WD[7:0]
WRAD[5:0]
MOD E
BLKEN
WEN
WCLK
Latches
Write
Logic
[5:0]
Figure 1-5 • A42MX36 Dual-Port SRAM Block
Write
Port
Logic
Latches
[7:0]
SRAM Module
32 x 8 or 64 x 4
(256 Bits)
RD[7:0]
Routing Tracks
Read
Port
Logic
[5:0]
Latches
Read
Logic
RDAD[5:0]
REN
RCLK
v6.01-3
Page 10
40MX and 42MX FPGA Families
Routing Structure
The MX architecture uses vertical and horizontal routing
tracks to interconnect the various logic and I/O modules.
These routing tracks are metal interconnects that may be
continuous or split into segments. Varying segment
lengths allow the interconnect of over 90% of design
tracks to occur with only two antifuse connections.
Segments can be joined together at the ends using
antifuses to increase their lengths up to the full length of
the track. All interconnects can be accomplished with a
maximum of four antifuses.
Horizontal Routing
Horizontal routing tracks span the whole row length or
are divided into multiple segments and are located in
between the rows of modules. Any segment that spans
more than one-third of the row length is considered a
long horizontal segment. A typical channel is shown in
Figure 1-6. Within horizontal routing, dedicated routing
tracks are used for global clock networks and for power
and ground tie-off tracks. Non-dedicated tracks are used
for signal nets.
Vertical Routing
Another set of routing tracks run vertically through the
module. There are three types of vertical tracks: input,
output, and long. Long tracks span the column length of
the module, and can be divided into multiple segments.
Each segment in an input track is dedicated to the input
of a particular module; each segment in an output track
is dedicated to the output of a particular module. Long
segments are uncommitted and can be assigned during
routing. Each output segment spans four channels (two
above and two below), except near the top and bottom
of the array, where edge effects occur. Long vertical
tracks contain either one or two segments. An example
of vertical routing tracks and segments is shown in
Figure 1-6.
Antifuse Structures
An antifuse is a "normally open" structure. The use of
antifuses to implement a programmable logic device
results in highly testable structures as well as efficient
programming algorithms. There are no pre-existing
connections; temporary connections can be made using
pass transistors. These temporary connections can isolate
individual antifuses to be programmed and individual
circuit structures to be tested, which can be done before
and after programming. For instance, all metal tracks can
be tested for continuity and shorts between adjacent
tracks, and the functionality of all logic modules can be
verified.
Segmented
Horizontal
Routing
Vertical Routing Tracks
Figure 1-6 • MX Routing Structure
Logic
Modules
Antifuses
Clock Networks
The 40MX devices have one global clock distribution
network (CLK). A signal can be put on the CLK network
by being routed through the CLKBUF buffer.
In 42MX devices, there are two low-skew, high-fanout
clock distribution networks, referred to as CLKA and
CLKB. Each network has a clock module (CLKMOD) that
can select the source of the clock signal from any of the
following (Figure 1-7 on page 1-5):
• Externally from the CLKA pad, using CLKBUF
buffer
• Externally from the CLKB pad, using CLKBUF
buffer
• Internally from the CLKINTA input, using CLKINT
buffer
• Internally from the CLKINTB input, using CLKINT
buffer
The clock modules are located in the top row of I/O
modules. Clock drivers and a dedicated horizontal clock
track are located in each horizontal routing channel.
Clock input pads in both 40MX and 42MX devices can
also be used as normal I/Os, bypassing the clock
networks.
The A42MX36 device has four additional register control
resources, called quadrant clock networks (Figure 1-8 on
page 1-5). Each quadrant clock provides a local, high-
fanout resource to the contiguous logic modules within
its quadrant of the device. Quadrant clock signals can
originate from specific I/O pins or from the internal array
and can be used as a secondary register clock, register
clear, or output enable.
1-4v6.0
Page 11
40MX and 42MX FPGA Families
From
Pads
Figure 1-7 • Clock Networks of 42MX Devices
QCLKA
Quad
QCLKB
*QCLK1IN
Clock
Modul
CLKB
CLKA
Clock
Drivers
QCLK1
CLKMOD
CLKINB
CLKINA
S0
S1
Clock Tracks
QCLK3
Internal
Signal
CLKO(17)
CLKO(16)
CLKO(15)
CLKO(2)
CLKO(1)
Quad
Modul
Clock
QCLKC
QCLKD
*QCLK3IN
S0 S1
Quad
Clock
Modul
*QCLK2IN
S0 S1
QCLK2
QCLK4
Note: *QCLK1IN, QCLK2IN, QCLK3IN, and QCLK4IN are internally-generated signals.
Figure 1-8 • Quadrant Clock Network of A42MX36 Devices
S0S1
Quad
Clock
Modul
*QCLK4IN
S0S1
v6.01-5
Page 12
40MX and 42MX FPGA Families
MultiPlex I/O Modules
42MX devices feature Multiplex I/Os and support 5.0V,
3.3V, and mixed 3.3V/5.0V operations.
The MultiPlex I/O modules provide the interface between
the device pins and the logic array. Figure 1-9 is a block
diagram of the 42MX I/O module. A variety of user
functions, determined by a library macro selection, can
be implemented in the module. (Refer to the Antifuse
Macro Library Guide for more information.) All 42MX I/O
modules contain tristate buffers, with input and output
latches that can be configured for input, output, or
bidirectional operation.
All 42MX devices contain flexible I/O structures, where
each output pin has a dedicated output-enable control
(Figure 1-9). The I/O module can be used to latch input or
output data, or both, providing fast set-up time. In
addition, the Actel Designer software tools can build a Dtype flip-flop using a C-module combined with an I/O
module to register input and output signals. Refer to the
Antifuse Macro Library Guide for more details.
A42MX24 and A42MX36 devices also offer selectable PCI
output drives, enabling 100% compliance with version
2.1 of the PCI specification. For low-power systems, all
inputs and outputs are turned off to reduce current
consumption to below 500µA.
To achieve 5.0V or 3.3V PCI-compliant output drives on
A42MX24 and A42MX36 devices, a chip-wide PCI fuse is
programmed via the Device Selection Wizard in the
Designer software (Figure 1-10). When the PCI fuse is not
programmed, the output drive is standard.
Actel's Designer software development tools provide a
design library of I/O macro functions that can implement
all I/O configurations supported by the MX FPGAs.
EN
Q
D
From Array
G/CLK*
To Array
Note: *Can be configured as a Latch or D Flip-Flop (Using
C-Module)
Figure 1-9 • 42MX I/O Module
Q
G/CLK*
D
PAD
STD
Signal
PCI
Drive
PCI Enable
Fuse
Figure 1-10 • PCI Output Structure of A42MX24 and
A42MX36 Devices
Output
Other Architectural Features
Performance
MX devices can operate with internal clock frequencies
of 250 MHz, enabling fast execution of complex logic
functions. MX devices are live on power-up and do not
require auxiliary configuration devices and thus are an
optimal platform to integrate the functionality
contained in multiple programmable logic devices. In
addition, designs that previously would have required a
gate array to meet performance can be integrated into
an MX device with improvements in cost and time-tomarket. Using timing-driven place-and-route (TDPR)
tools, designers can achieve highly deterministic device
performance.
User Security
The Actel FuseLock provides robust security against
design theft. Special security fuses are hidden in the
fabric of the device and prevent unauthorized users from
accessing the programming and/or probe interfaces. It is
virtually impossible to identify or bypass these fuses
without damaging the device, making Actel antifuse
FPGAs immune to both invasive and noninvasive attacks.
Special security fuses in 40MX devices include the Probe
Fuse and Program Fuse. The former disables the probing
circuitry while the latter prohibits further programming
of all fuses, including the Probe Fuse. In 42MX devices,
there is the Security Fuse which, when programmed,
both disables the probing circuitry and prohibits further
programming of the device.
Look for this symbol to ensure your valuable IP is secure.
For more information, refer to Actel's Implementation of
Security in Actel Antifuse FPGAs application note.
1-6v6.0
Page 13
™
u
e
Figure 1-11 • Fuselock
Programming
Device programming is supported through the Silicon
Sculptor series of programmers. Silicon Sculptor II is a
compact, robust, single-site and multi-site device
programmer for the PC. With standalone software,
Silicon Sculptor II is designed to allow concurrent
programming of multiple units from the same PC.
Silicon Sculptor II programs devices independently to
achieve the fastest programming times possible. After
being programmed, each fuse is verified to insure that it
has been programmed correctly. Furthermore, at the end
of programming, there are integrity tests that are run to
ensure no extra fuses have been programmed. Not only
does it test fuses (both programmed and
40MX and 42MX FPGA Families
nonprogrammed), Silicon Sculptor II also allows self-test
to verify its own hardware extensively.
The procedure for programming an MX device using
Silicon Sculptor II is as follows:
1. Load the .AFM file
2. Select the device to be programmed
3. Begin programming
When the design is ready to go to production, Actel
offers device volume-programming services either
through distribution partners or via In-House
Programming from the factory.
For more details on programming MX devices, please
refer to the Programming Antifuse Devices and the
Silicon Sculptor II user's guides.
Power Supply
MX devices are designed to operate in both 5.0V and
3.3V environments. In particular, 42MX devices can
operate in mixed 5.0V/3.3V systems. Tab le 1 describes the
voltage support of MX devices.
Tabl e 1 •Voltage Support of MX Devices
DeviceV
40MX5.0V––5.5V5.0V
42MX–5.0V5.0V5.5V5.0V
CC
3.3V––3.6V3.3V
–3.3V3.3V3.6V3.3V
–5.0V3.3V5.5V3.3V
Power-Up/Down in Mixed-Voltage Mode
When powering up 42MX in mixed voltage mode
(V
=5.0V and V
CCA
or equal to V
V
exceeds V
CCI
protection junction on the I/Os will be forward-biased or
the I/Os will be at logical HIGH, and I
levels. For power-down, any sequence with V
can be implemented.
V
CCI
CCI
throughout the power-up sequence. If
CCI
during power up, either the I/Os' input
CCA
V
CCA
= 3.3V), V
V
CCI
must be greater than
CCA
rises to high
CC
CCA
Maximum Input ToleranceNominal Output Voltage
Low Power Mode
42MX devices have been designed with a Low Power
Mode. This feature, activated with setting the special LP
pin to HIGH for a period longer than 800 ns, is
particularly useful for battery-operated systems where
battery life is a primary concern. In this mode, the core of
the device is turned off and the device consumes minimal
and
power with low standby current. In addition, all input
buffers are turned off, and all outputs and bidirectional
buffers are tristated. Since the core of the device is
turned off, the states of the registers are lost. The device
must be re-initialized when exiting Low Power Mode. I/
Os can be driven during LP mode, and clock pins should
be driven HIGH or LOW and should not float to avoid
drawing current. To exit LP mode, the LP pin must be
pulled LOW for over 200 µs to allow for charge pumps to
power up, and device initialization will begin.
v6.01-7
Page 14
40MX and 42MX FPGA Families
Power Dissipation
The general power consumption of MX devices is made
up of static and dynamic power and can be expressed
with the following equation:
General Power Equation
P = [ICCstandby + ICCactive] * V
+ I
OH
* (V
– VOH) * M
CCI
where:
I
standby is the current flowing when no inputs or
CC
outputs are changing.
active is the current flowing due to CMOS
I
CC
switching.
, IOH are TTL sink/source currents.
I
OL
, VOH are TTL level output voltages.
V
OL
N equals the number of outputs driving TTL loads to
V
.
OL
M equals the number of outputs driving TTL loads to
V
.
OH
Accurate values for N and M are difficult to determine
because they depend on the family type, on design
details, and on the system I/O. The power can be divided
into two components: static and active.
Static Power Component
The static power due to standby current is typically a
small component of the overall power consumption.
Standby power is calculated for commercial, worst-case
conditions. The static power dissipation by TTL loads
depends on the number of outputs driving, and on the
DC load current. For instance, a 32-bit bus sinking 4mA at
0.33V will generate 42mW with all outputs driving LOW,
and 140mW with all outputs driving HIGH. The actual
dissipation will average somewhere in between, as I/Os
switch states with time.
Active Power Component
Power dissipation in CMOS devices is usually dominated
by the dynamic power dissipation. Dynamic power
consumption is frequency-dependent and is a function of
the logic and the external I/O. Active power dissipation
results from charging internal chip capacitances of the
interconnect, unprogrammed antifuses, module inputs,
and module outputs, plus external capacitances due to
PC board traces and load device inputs. An additional
component of the active power dissipation is the totem
pole current in the CMOS transistor pairs. The net effect
can be associated with an equivalent capacitance that
can be combined with frequency and voltage to
represent active power dissipation.
+ IOL* VOL* N
CCI
The power dissipated by a CMOS circuit can be expressed
by the equation:
Power (µW) = CEQ * V
CCA
2
* F(1)
where:
C
=Equivalent capacitance expressed in picofarads (pF)
EQ
V
=Power supply in volts (V)
CCA
F =Switching frequency in megahertz (MHz)
Equivalent Capacitance
Equivalent capacitance is calculated by measuring
active at a specified frequency and voltage for each
I
CC
circuit component of interest. Measurements have been
made over a range of frequencies at a fixed value of
V
CC
Equivalent capacitance is frequency-independent, so the
results can be used over a wide range of operating
conditions. Equivalent capacitance values are shown
below.
CEQ Values for Actel MX FPGAs
Modules (C
Input Buffers (C
Output Buffers (C
Routed Array Clock Buffer Loads (C
To calculate the active power dissipated from the
complete design, the switching frequency of each part of
the logic must be known. The equation below shows a
piece-wise linear summation over all components.
MX devices contain probing circuitry that provides builtin access to every node in a design, via the use of Silicon
Explorer II. Silicon Explorer II is an integrated hardware
and software solution that, in conjunction with the
Designer software, allow users to examine any of the
internal nets of the device while it is operating in a
prototyping or a production system. The user can probe
into an MX device without changing the placement and
routing of the design and without using any additional
resources. Silicon Explorer II's noninvasive method does
not alter timing or loading effects, thus shortening the
debug cycle and providing a true representation of the
device under actual functional situations.
Silicon Explorer II samples data at 100 MHz
(asynchronous) or 66 MHz (synchronous). Silicon Explorer
II attaches to a PC's standard COM port, turning the PC
into a fully functional 18-channel logic analyzer. Silicon
Explorer II allows designers to complete the design
verification process at their desks and reduces
verification time from several hours per cycle to a few
seconds.
Silicon Explorer II is used to control the MODE, DCLK, SDI
and SDO pins in MX devices to select the desired nets for
debugging. The user simply assigns the selected internal
nets in the Silicon Explorer II software to the PRA/PRB
output pins for observation. Probing functionality is
activated when the MODE pin is held HIGH.
Figure 1-12 illustrates the interconnection between
Silicon Explorer II and 40MX devices, while Figure 1-13
on page 1-10 illustrates the interconnection between
Silicon Explorer II and 42MX devices
To allow for probing capabilities, the security fuses must
not be programmed. (Refer to <zBlue>“User Security”
section on page 6 for the security fuses of 40MX and
42MX devices). Table 2 on page 1-10 summarizes the
possible device configurations for probing.
PRA and PRB pins are dual-purpose pins. When the
"Reserve Probe Pin" is checked in the
Designer software, PRA and PRB pins are reserved as
dedicated outputs for probing. If PRA and PRB pins are
required as user I/Os to achieve successful layout and
"Reserve Probe Pin" is checked, the layout tool will
override the option and place user I/Os on PRA and PRB
pins.
16 Logic Analyzer Channels
Serial Connection
to Windows PC
Figure 1-12 • Silicon Explorer II Setup with 40MX
Silicon
Explorer II
40MX
MODE
SDI
DCLK
SDO
PRA
PRB
v6.01-9
Page 16
40MX and 42MX FPGA Families
16 Logic Analyzer Channels
Serial Connection
to Windows PC
Figure 1-13 • Silicon Explorer II Setup with 42MX
Tabl e 2 •Device Configuration Options for Probe Capability
Security Fuse(s)
ProgrammedMODEPRA, PRB
NoLOWUser I/Os
NoHIGHProbe Circuit OutputsProbe Circuit Inputs
Yes–Probe Circuit SecuredProbe Circuit Secured
Notes:
1. Avoid using SDI, SDO, DCLK, PRA and PRB pins as input or bidirectional ports. Since these pins are active during probing, input
signals will not pass through these pins and may cause contention.
2. If no user signal is assigned to these pins, they will behave as unused I/Os in this mode. See the <zBlue>“Pin Descriptions” section
on page 77 for information on unused I/O pins.
Silicon
Explorer II
Design Consideration
It is recommended to use a series 70Ω termination
resistor on every probe connector (SDI, SDO, MODE,
DCLK, PRA and PRB). The 70Ω series termination is used
to prevent data transmission corruption during probing
and reading back the checksum.
MODE
SDI
DCLK
SDO
PRA
PRB
Each test section is accessed through the TAP, which has
four associated pins: TCK (test clock input), TDI and TDO
(test data input and output), and TMS (test mode
selector).
The TAP controller is a four-bit state machine. The '1's
and '0's represent the values that must be present at TMS
at a rising edge of TCK for the given state transition to
42MX
1
2
SDI, SDO, DCLK
User I/Os
1
2
occur. IR and DR indicate that the instruction register or
IEEE Standard 1149.1 Boundary Scan Test
(BST) Circuitry
42MX24 and 42MX36 devices are compatible with IEEE
Standard 1149.1 (informally known as Joint Testing
Action Group Standard or JTAG), which defines a set of
hardware architecture and mechanisms for cost-effective
board-level testing. The basic MX boundary-scan logic
circuit is composed of the TAP (test access port), TAP
controller, test data registers and instruction register
(Figure 1-14 on page 1-11). This circuit supports all
mandatory IEEE 1149.1 instructions (EXTEST, SAMPLE/
PRELOAD and BYPASS) and some optional instructions.
Table 3 on page 1-11 describes the ports that control
JTAG testing, while Table 4 on page 1-11 describes the
test instructions supported by these MX devices.
the data register is operating in that state.
The TAP controller receives two control inputs (TMS and
TCK) and generates control and clock signals for the rest
of the test logic architecture. On power-up, the TAP
controller enters the Test-Logic-Reset state. To guarantee
a reset of the controller from any of the possible states,
TMS must remain high for five TCK cycles.
42MX24 and 42MX36 devices support three types of test
data registers: bypass, device identification, and
boundary scan. The bypass register is selected when no
other register needs to be accessed in a device. This
speeds up test data transfer to other devices in a test
data path. The 32-bit device identification register is a
shift register with four fields (lowest significant byte
(LSB), ID number, part number and version). The
boundary-scan register observes and controls the state of
each I/O pin.
1-10v6.0
Page 17
40MX and 42MX FPGA Families
Each I/O cell has three boundary-scan register cells, each
with a serial-in, serial-out, parallel-in, and parallel-out
pin. The serial pins are used to serially connect all the
boundary-scan register cells in a device into a boundary-
at the TDO pin. The parallel ports are connected to the
internal core logic tile and the input, output and control
ports of an I/O buffer to capture and load data into the
register to control or observe the logic state of each I/O.
scan register chain, which starts at the TDI pin and ends
TCK (Test Clock Input) Dedicated test logic clock used serially to shift test instruction, test data, and control inputs on the rising edge
TDI (Test Data Input)Serial input for instruction and test data. Data is captured on the rising edge of the test logic clock.
TDO (Test Data
Output)
Serial input for the test logic control bits. Data is captured on the rising edge of the test logic clock (TCK).
of the clock, and serially to shift the output data on the falling edge of the clock. The maximum clock frequency
for TCK is 20 MHz.
Serial output for test instruction and data from the test logic. TDO is set to an Inactive Drive state (high
impedance) when data scanning is not in progress.
EXTEST000MandatoryAllows the external circuitry and board-level interconnections to
be tested by forcing a test pattern at the output pins and
capturing test results at the input pins.
SAMPLE/PRELOAD001MandatoryAllows a snapshot of the signals at the device pins to be
captured and examined during operation
HIGH Z101OptionalTristates all I/Os to allow external signals to drive pins. Please
refer to the IEEE Standard 1149.1 specification.
CLAMP110OptionalAllows state of signals driven from component pins to be
determined from the Boundary-Scan Register. Please refer to
the IEEE Standard 1149.1 specification for details.
BYPASS111MandatoryEnables the bypass register between the TDI and TDO pins. The
test data passes through the selected device to adjacent devices
in the test chain.
v6.01-11
Page 18
40MX and 42MX FPGA Families
JTAG Mode Activation
The JTAG test logic circuit is activated in the Designer
software by selecting Tools -> Device Selection. This
brings up the Device Selection dialog box as shown in
Figure 1-15. The JTAG test logic circuit can be enabled by
clicking the "Reserve JTAG Pins" check box. Table 5
explains the pins' behavior in either mode.
Figure 1-15 • Device Selection Wizard
Tabl e 5 •Boundary Scan Pin Configuration and Functionality
Reserve JTAGCheckedUnchecked
TCKBST input; must be terminated to logical HIGH or LOW to avoid floatingUser I/O
TDI, TMSBST input; may float or be tied to HIGHUser I/O
TDOBST output; may float or be connected to TDI of another deviceUser I/O
TRST Pin and TAP Controller Reset
An active reset (TRST) pin is not supported; however, MX
devices contain power-on circuitry that resets the
boundary scan circuitry upon power-up. Also, the TMS
pin is equipped with an internal pull-up resistor. This
allows the TAP controller to remain in or return to the
Test-Logic-Reset state when there is no input or when a
logical 1 is on the TMS pin. To reset the controller, TMS
must be HIGH for at least five TCK cycles.
Boundary Scan Description Language
(BSDL) File
Conforming to the IEEE Standard 1149.1 requires that
the operation of the various JTAG components be
documented. The BSDL file provides the standard format
to describe the JTAG components that can be used by
automatic test equipment software. The file includes the
instructions that are supported, instruction bit pattern,
and the boundary-scan chain order. For an in-depth
discussion on BSDL files, please refer to Actel BSDL Files
Format Description application note.
Actel BSDL files are grouped into two categories generic and device-specific. The generic files assign all
user I/Os as inouts. Device-specific files assign user I/Os as
inputs, outputs or inouts.
Generic files for MX devices are available on Actel's website
at http://www.actel.com/techdocs/models/bsdl.html.
1-12v6.0
Page 19
40MX and 42MX FPGA Families
Development Tool Support
The MX family of FPGAs is fully supported by both Actel's
Libero™ Integrated Design Environment and Designer
FPGA Development software. Actel Libero IDE is a design
management environment that streamlines the design
flow. Libero IDE provides an integrated design manager
that seamlessly integrates design tools while guiding the
user through the design flow, managing all design and
log files, and passing necessary design data among tools.
Additionally, Libero IDE allows users to integrate both
schematic and HDL synthesis into a single flow and verify
the entire design in a single environment. Libero IDE
includes Synplify® for Actel from Synplicity®, ViewDraw
for Actel from Mentor Graphics, ModelSim™ HDL
Simulator from Mentor Graphics®, WaveFormer Lite™
from SynaptiCAD™, and Designer software from Actel.
Refer to the Libero IDEflow (located on Actel’s website)
diagram for more information.
Actel's Designer software is a place-and-route tool and
provides a comprehensive suite of backend support tools
for FPGA development. The Designer software includes
timing-driven place-and-route, and a world-class
integrated static timing analyzer and constraints editor.
With the Designer software, a user can lock his/her
design pins before layout while minimally impacting the
results of place-and-route. Additionally, the backannotation flow is compatible with all the major
simulators and the simulation results can be cross-probed
with Silicon Explorer II, Actel’s integrated verification
and logic analysis tool. Another tool included in the
Designer software is the ACTgen macro builder, which
easily creates popular and commonly used logic
functions for implementation into your schematic or HDL
design. Actel's Designer software is compatible with the
most popular FPGA design entry and verification tools
from companies such as Mentor Graphics, Synplicity,
Synopsys, and Cadence Design Systems. The Designer
software is available for both the Windows and UNIX
operating systems.
Actel's Designer software is compatible with the most
popular FPGA design entry and verification tools from
companies such as Mentor Graphics, Synplicity, Synopsys,
and Cadence Design Systems. The Designer software is
available for both the Windows and UNIX operating
systems.
Tabl e 6 •Absolute Maximum Ratings for 40MX Devices*
SymbolParameterLimitsUnits
V
V
V
t
CC
I
O
STG
DC Supply Voltage–0.5 to +7.0V
Input Voltage–0.5 to VCC+0.5V
Output Voltage–0.5 to VCC+0.5V
Storage Temperature–65 to +150°C
Note: *Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Exposure to
absolute maximum rated conditions for extended periods may affect device reliability. Devices should not be operated outside the
Recommended Operating Conditions.
Tabl e 7 •Absolute Maximum Ratings for 42MX Devices*
SymbolParameterLimitsUnits
V
V
V
V
t
CCI
CCA
I
O
STG
DC Supply Voltage for I/Os–0.5 to +7.0V
DC Supply Voltage for Array–0.5 to +7.0V
Input Voltage–0.5 to V
Output Voltage–0.5 to V
+0.5V
CCI
+0.5V
CCI
Storage Temperature–65 to +150°C
Note: *Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Exposure to
absolute maximum rated conditions for extended periods may affect device reliability. Devices should not be operated outside the
Recommended Operating Conditions.
Tabl e 8 •Recommended Operating Conditions
ParameterCommercialIndustrialMilitaryUnits
Temperature Range*0 to +70-40 to +85–55 to +125°C
(40MX)4.75 to 5.254.5 to 5.54.5 to 5.5V
V
CC
(42MX)4.75 to 5.254.5 to 5.54.5 to 5.5V
V
CCA
V
(42MX)4.75 to 5.254.5 to 5.54.5 to 5.5V
CCI
Note: *Ambient temperature (T
) is used for commercial and industrial grades; case temperature (TC) is used for military grades.
A
1-14v6.0
Page 21
5V TTL Electrical Specifications
Tabl e 9 •5V TTL Electrical Specifications
CommercialCommercial -FIndustrialMilitary
40MX and 42MX FPGA Families
SymbolParameter
1
V
OH
1
V
OL
V
IL
(40MX)2.0VCC+0.32.0VCC+0.32.0VCC+0.32.0VCC+0.3V
V
IH
(42MX)2.0V
V
IH
I
IL
I
IH
Input Transition
Time, T
C
Standby Current,
I
CC
and T
R
F
I/O Capacitance10101010pF
IO
2
IOH = -10mA2.42.4V
I
= -4mA3.73.7V
OH
IOL = 10mA0.50.5V
= 6mA0.40.4V
I
OL
-0.30.8-0.30.8-0.30.8-0.30.8V
+0.32.0V
CCI
+0.32.0V
CCI
+0.32.0V
CCI
CCI
VIN = 0.5V-10-10-10-10µA
VIN = 2.7V-10-10-10-10µA
500500500500ns
A40MX02,
3 251025mA
A40MX04
UnitsMin.Max.Min.Max.Min.Max.Min.Max.
+0.3V
A42MX095252525mA
A42MX166252525mA
A42MX24,
20252525mA
A42MX36
Low-Power Mode
Standby Current
I
I/O source sink
IO,
42MX devices
0.5ICC - 5.0ICC - 5.0ICC - 5.0mA
only
Can be derived from the IBIS model(http://www.actel.com/techdocs/models/ibis.html)
current
Notes:
1. Only one output tested at a time. V
2. All outputs unloaded. All inputs = V
CC/VCCI
CC/VCCI
= min.
or GND.
v6.01-15
Page 22
40MX and 42MX FPGA Families
3.3V Operating Conditions
Table 10 •Absolute Maximum Ratings for 40MX Devices*
SymbolParameterLimitsUnits
V
V
V
t
CC
I
O
STG
DC Supply Voltage–0.5 to +7.0V
Input Voltage–0.5 to VCC+0.5V
Output Voltage–0.5 to VCC+0.5V
Storage Temperature–65 to +150°C
Note: *Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Exposure to
absolute maximum rated conditions for extended periods may affect device reliability. Devices should not be operated outside the
Recommended Operating Conditions.
Table 11 •Absolute Maximum Ratings for 42MX Devices*
SymbolParameterLimitsUnits
V
V
V
V
t
CCI
CCA
I
O
STG
DC Supply Voltage for I/Os–0.5 to +7.0V
DC Supply Voltage for Array–0.5 to +7.0V
Input Voltage–0.5 to V
Output Voltage–0.5 to V
+0.5V
CCI
+0.5V
CCI
Storage Temperature–65 to +150°C
Note: *Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Exposure to
absolute maximum rated conditions for extended periods may affect device reliability. Devices should not be operated outside the
Recommended Operating Conditions.
Table 12 •Recommended Operating Conditions
ParameterCommercialIndustrialMilitaryUnits
Temperature Range*0 to +70–40 to +85–55 to +125°C
(40MX)3.0 to 3.63.0 to 3.63.0 to 3.6V
V
CC
(42MX)3.0 to 3.63.0 to 3.63.0 to 3.6V
V
CCA
V
(42MX)3.0 to 3.63.0 to 3.63.0 to 3.6V
CCI
Note: *Ambient temperature (T
) is used for commercial and industrial grades; case temperature (TC) is used for military grades.
A
1-16v6.0
Page 23
3.3V LVTTL Electrical Specifications
Table 13 •3.3V LVTTL Electrical Specifications
CommercialCommercial -FIndustrialMilitary
40MX and 42MX FPGA Families
SymbolParameter
1
V
OH
1
V
OL
V
IL
(40MX)2.0VCC+0.32.0VCC+0.32.0VCC+0.32.0VCC+0.3V
V
IH
V
(42MX)2.0V
IH
I
IL
I
IH
Input Transition Time,
T
and T
R
F
I/O Capacitance10101010pF
C
IO
Standby Current, I
CC
I
= –4mA2.152.152.42.4V
OH
IOL = 6mA0.40.40.480.48V
–0.30.8–0.30.8–0.30.8–0.30.8V
+0.32.0V
CCI
+0.32.0V
CCI
+0.32.0V
CCI
CCI
–10–10–10–10µA
–10–10–10–10µA
500500500500ns
2
A40MX02,
3251025mA
+0.3V
A40MX04
A42MX095252525mA
A42MX166252525mA
A42MX24,
15252525mA
A42MX36
Low-Power Mode
Standby Current
I/O source sink
I
IO,
42MX
0.5ICC - 5.0ICC - 5.0ICC - 5.0mA
devices only
Can be derived from the IBIS model (http://www.actel.com/techdocs/models/ibis.html)
Note: *Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Exposure to
absolute maximum rated conditions for extended periods may affect device reliability. Devices should not be operated outside the
Recommended Operating Conditions.
Table 15 •Recommended Operating Conditions
ParameterCommercialIndustrialMilitaryUnits
Temperature Range*0 to +70-40 to +85–55 to +125°C
V
4.75 to 5.254.5 to 5.54.5 to 5.5V
CCA
V
3.14 to 3.473.0 to 3.63.0 to 3.6V
CCI
Note: *Ambient temperature (T
DC Supply Voltage for I/Os–0.5 to +7.0V
DC Supply Voltage for Array–0.5 to +7.0V
Input Voltage–0.5 to V
Output Voltage–0.5 to V
+0.5V
CCI
+0.5V
CCI
Storage Temperature–65 to +150°C
) is used for commercial and industrial grades; case temperature (TC) is used for military grades.
I/O source sink currentCan be derived from the IBIS model (http://www.actel.com/techdocs/models/ibis.html)
IO
Notes:
1. Only one output tested at a time. V
2. All outputs unloaded. All inputs = V
= min.
CCI
or GND.
CCI
UnitsMin.Max.Min.Max.Min.Max.Min.Max.
+0.3V
1-18v6.0
Page 25
40MX and 42MX FPGA Families
Output Drive Characteristics for 5.0V PCI Signaling
MX PCI device I/O drivers were designed specifically for high-performance PCI systems. Figure 1-16 on page 1-21 shows
the typical output drive characteristics of the MX devices. MX output drivers are compliant with the PCI Local Bus
Specification.
OUT
I
OUT
OUT
1
= –2 mA
= –6 mA
= 3 mA,
6 mA
PCIMX
2.4
0.55—0.33V
3.84
2
+ 0.3V
CCI
3
V
V
nH
Table 17 •DC Specification (5.0V PCI Signaling)
SymbolParameterConditionMin.Max.Min.Max.Units
V
CCI
V
IH
V
IL
I
IH
I
IL
V
OH
V
OL
C
IN
C
CLK
L
PIN
Supply Voltage for I/Os4.755.254.755.25
Input High Voltage2.0VCC + 0.52.0V
Input Low Voltage–0.50.8–0.30.8V
Input High Leakage CurrentVIN = 2.7V70—10µA
Input Low Leakage CurrentVIN=0.5V–70—–10µA
Output High VoltageI
Output Low VoltageI
Input Pin Capacitance10—10pF
CLK Pin Capacitance512—10pF
Pin Inductance20—< 8 nH
Notes:
1. PCI Local Bus Specification, Version 2.1, Section 4.2.1.1.
2. Maximum rating for V
–0.5V to 7.0V.
CCI
3. Dependent upon the chosen package. PCI recommends QFP and BGA packaging to reduce pin inductance and capacitance.
Table 18 •AC Specifications (5.0V PCI Signaling)*
PCIMX
SymbolParameterConditionMin.Max.Min.Max.Units
I
CL
Low Clamp Current–5 < VIN ≤ –1–25 + (VIN +1)
–60–10mA
/0.015
Slew (r)Output Rise Slew Rate0.4V to 2.4V load151.82.8V/ns
Slew (f)Output Fall Slew Rate2.4V to 0.4V load152.84.3V/ns
Note: *PCI Local Bus Specification, Version 2.1, Section 4.2.1.2.
v6.01-19
Page 26
40MX and 42MX FPGA Families
Output Drive Characteristics for 3.3V PCI Signaling
Table 19 •DC Specification (3.3V PCI Signaling)
SymbolParameterConditionMin.Max.Min.Max.Units
V
CCI
V
IH
V
IL
I
IH
I
IL
V
OH
V
OL
C
IN
C
CLK
L
PIN
Supply Voltage for I/Os3.03.63.03.6V
Input High Voltage0.5VCC + 0.50.5V
Input Low Voltage–0.50.8–0.30.8V
Input High Leakage CurrentVIN = 2.7V7010µA
Input Leakage Current–70–10µA
Output High VoltageI
Output Low VoltageI
Input Pin Capacitance1010pF
CLK Pin Capacitance51210pF
Pin Inductance20< 8 nH
Notes:
1. PCI Local Bus Specification, Version 2.1, Section 4.2.2.1.
2. Maximum rating for V
–0.5V to 7.0V.
CCI
3. Dependent upon the chosen package. PCI recommends QFP and BGA packaging to reduce pin inductance and capacitance.
1
PCIMX
+ 0.3V
CCI
= –2 mA0.93.3V
OUT
= 3 mA,
OUT
0.10.1 V
CCI
6 mA
3
V
nH
Table 20 •AC Specifications for (3.3V PCI Signaling)*
PCIMX
SymbolParameterConditionMin.Max.Min.Max.Units
I
CL
Low Clamp Current–5 < VIN ≤ –1–25 + (VIN +1)
–60–10mA
/0.015
Slew (r)Output Rise Slew Rate0.2V to 0.6V load141.82.8V/ns
Slew (f)Output Fall Slew Rate0.6V to 0.2V load142.84.0V/ns
Note: *PCI Local Bus Specification, Version 2.1, Section 4.2.2.2.
The temperature variable in the Designer software refers
to the junction temperature, not the ambient
temperature. This is an important distinction because the
P = Power
θ
= Junction to ambient of package. θja numbers are
ja
located in the Package Thermal Characteristics table
below.
heat generated from dynamic power consumption is
usually hotter than the ambient temperature. EQ 1-1,
shown below, can be used to calculate junction
temperature.
EQ 1-1
Junction Temperature = ∆T + T
a
(1)
Where:
T
= Ambient Temperature
a
∆T = Temperature gradient between junction (silicon)
and ambient
θ
∆T =
* P(2)
ja
Maximum Power Allowed
Max. junction temp. (° C) Max. ambient temp. (°C)–
The maximum power dissipation for military-grade devices is a function of
Package Thermal Characteristics
The device junction-to-case thermal characteristic is θjc,
and the junction-to-ambient air characteristic is θ
thermal characteristics for θ
different air flow rates.
The maximum junction temperature is 150°C.
Maximum power dissipation for commercial- and
industrial-grade devices is a function of
A sample calculation of the absolute maximum power
dissipation allowed for a TQFP 176-pin package at
commercial temperature and still air is as follow:
150° C70°C–
(° C/W)
ja
---------------------------------- 28° C/W
θ
. A sample calculation of the absolute
jc
are shown with two
ja
θ
ja
2.86W===
.
maximum power dissipation allowed for CQFP 208-pin package at military temperature and still air is as follows:
Propagation delay between logic modules depends on
the resistive and capacitive loading of the routing tracks,
the interconnect elements, and the module inputs being
driven. Propagation delay increases as the length of
routing tracks, the number of interconnect elements, or
the number of inputs increases.
From a design perspective, the propagation delay can be
statistically correlated or modeled by the fanout
(number of loads) driven by a module. Higher fanout
usually requires some paths to have longer routing
tracks.
The MX FPGAs deliver a tight fanout delay distribution,
which is achieved in two ways: by decreasing the delay of
the interconnect elements and by decreasing the number
of interconnect elements per path.
Actel’s patented antifuse offers a very low resistive/
capacitive interconnect. The antifuses, fabricated in
0.45 µm lithography, offer nominal levels of 100Ω
resistance and 7.0fF capacitance per antifuse.
MX fanout distribution is also tight due to the low
number of antifuses required for each interconnect path.
The proprietary architecture limits the number of
antifuses per path to a maximum of four, with
90 percent of interconnects using only two antifuses.
Timing Characteristics
Device timing characteristics fall into three categories:
family-dependent, device-dependent, and designdependent. The input and output buffer characteristics
are common to all MX devices. Internal routing delays
are device-dependent; actual delays are not determined
until after place-and-route of the user's design is
complete. Delay values may then be determined by using
the Designer software utility or by performing
simulation with post-layout delays.
Critical Nets and Typical Nets
Propagation delays are expressed only for typical nets,
which are used for initial design performance evaluation.
Critical net delays can then be applied to the most timing
critical paths. Critical nets are determined by net
property assignment in Actel's Designer software prior to
placement and routing. Up to 6% of the nets in a design
may be designated as critical.
Long Tracks
Some nets in the design use long tracks, which are
special routing resources that span multiple rows,
columns, or modules. Long tracks employ three and
sometimes four antifuse connections, which increase
capacitance and resistance, resulting in longer net delays
for macros connected to long tracks. Typically, up to
6 percent of nets in a fully utilized device require long
tracks. Long tracks add approximately a 3 ns to a 6 ns
delay, which is represented statistically in higher fanout
(FO=8) routing delays in the data sheet specifications
section, shown in Table 28 on page 1-36.
Timing Derating
MX devices are manufactured with a CMOS process.
Therefore, device performance varies according to
temperature, voltage, and process changes. Minimum
timing parameters reflect maximum operating voltage,
minimum operating temperature and best-case
processing. Maximum timing parameters reflect
minimum operating voltage, maximum operating
temperature and worst-case processing.
1-30v6.0
Page 37
40MX and 42MX FPGA Families
Temperature and Voltage Derating Factors
Table 22 •42MX Temperature and Voltage Derating Factors
(Normalized to T
42MX Voltage
= 25°C, V
J
–55°C–40°C0°C25°C70°C85°C125°C
4.500.930.951.051.091.251.291.41
4.750.880.901.001.031.181.221.34
5.000.850.870.961.001.151.181.29
5.250.840.860.950.971.121.141.28
5.500.830.850.940.961.101.131.26
1.50
1.40
CCA
= 5.0V)
Temperature
1.30
1.20
1.10
1.00
0.90
Derating Factor
0.80
0.70
0.60
4.504.755.005.255.50
Voltage (V)
Note: This derating factor applies to all routing and propagation delays.
Figure 1-34 • 42MX Junction Temperature and Voltage Derating Curves
(Normalized to T
= 25°C, V
J
CCA
= 5.0V)
–55˚C
–40˚C
0˚C
25˚C
70˚C
85˚C
125˚C
v6.01-31
Page 38
40MX and 42MX FPGA Families
Table 23 •40MX Temperature and Voltage Derating Factors
(Normalized to TJ = 25°C, VCC = 5.0V)
Temperature
40MX Voltage
–55°C–40°C0°C25°C70°C85°C125°C
4.500.890.931.021.091.251.311.45
4.750.840.880.971.031.181.241.37
5.000.820.850.941.001.151.201.33
5.250.800.820.910.971.121.161.29
5.500.790.820.900.961.101.151.28
1.50
1.40
1.30
1.20
Factor
1.10
1.00
0.90
Derating
0.80
0.70
0.60
4.504.755.005.255.50
–55˚C
–40˚C
0˚C
25˚C
70˚C
85˚C
125˚C
Voltage (V)
Note: This derating factor applies to all routing and propagation delays.
Figure 1-35 • 40MX Junction Temperature and Voltage Derating Curves
(Normalized to T
= 25°C, VCC = 5.0V)
J
1-32v6.0
Page 39
40MX and 42MX FPGA Families
Table 24 •42MX Temperature and Voltage Derating Factors
(Normalized to TJ = 25°C, V
CCA
= 3.3V)
Temperature
42MX Voltage
–55°C–40°C0°C25°C70°C85°C125°C
3.000.971.001.101.151.321.361.45
3.300.840.870.961.001.151.181.26
3.600.810.840.920.961.101.131.21
1.60
1.50
1.40
55˚C
40˚C
0˚C
25˚C
70˚C
85˚C
125˚C
Derating Factor
1.30
1.20
1.10
1.00
0.90
0.80
0.70
0.60
0.50
0.40
3.003.303.60
Voltage (V)
(V)
Note: This derating factor applies to all routing and propagation delays.
Figure 1-36 • 42MX Junction Temperature and Voltage Derating Curves
(Normalized to T
= 25°C, V
J
CCA
= 3.3V)
v6.01-33
Page 40
40MX and 42MX FPGA Families
Table 25 •40MX Temperature and Voltage Derating Factors
(Normalized to TJ = 25°C, VCC = 3.3V)
Temperature
40MX Voltage
3.001.081.121.211.261.501.642.00
3.300.860.890.961.001.191.301.59
3.600.830.850.920.961.141.251.53
2.20
2.00
–55°C–40°C0°C25°C70°C85°C125°C
55˚C
1.80
1.60
1.40
40˚C
0˚C
25˚C
70˚C
1.20
Derating Factor
1.00
85˚C
125˚C
0.80
0.60
3.003.303.60
Voltage (V)
Note: This derating factor applies to all routing and propagation delays.
Figure 1-37 • 40MX Junction Temperature and Voltage Derating Curves
(Normalized to TJ = 25°C, VCC = 3.3V)
1-34v6.0
Page 41
40MX and 42MX FPGA Families
PCI System Timing Specification
Table 26 and Table 27 list the critical PCI timing
parameters and the corresponding timing parameters
for the MX PCI-compliant devices.
PCI Models
Actel provides synthesizable VHDL and Verilog-HDL
models for a PCI Target interface, a PCI Target and
Target+DMA Master interface. Contact your Actel sales
representative for more details.
Table 26 •Clock Specification for 33 MHz PCI
PCIA42MX24A42MX36
SymbolParameter
t
CYC
t
HIGH
t
LOW
CLK Cycle Time30–4.0–4.0–ns
CLK High Time11–1.9–1.9–ns
CLK Low Time11–1.9–1.9– ns
UnitsMin.Max.Min.Max.Min.Max.
Table 27 •Timing Parameters for 33 MHz PCI
PCIA42MX24A42MX36
SymbolParameterMin.Max.Min.Max.Min.Max.Units
t
VAL
t
VAL(PTP)
t
ON
t
OFF
t
SU
t
SU(PTP)
t
H
CLK to Signal Valid—Bused Signals2112.09.02.09.0ns
CLK to Signal Valid—Point-to-Point2
2
122.09.02.09.0ns
Float to Active2–2.04.02.04.0ns
Active to Float–28–8.3
1
–8.31ns
Input Set-Up Time to CLK—Bused Signals7–1.5–1.5–ns
Input Set-Up Time to CLK—Point-to-Point10, 12
2
–1.5–1.5– ns
Input Hold to CLK0–0–0–ns
Notes:
1. T
is system dependent. MX PCI devices have 7.4 ns turn-off time, reflection is typically an additional 10 ns.
OFF
2. REQ# and GNT# are point-to-point signals and have different output valid delay and input setup times than do bussed signals.
GNT# has a setup of 10; REW# has a setup of 12.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
t
A
f
MAX
Flip-Flop Clock Input Period4.85.66.37.510.4ns
Flip-Flop (Latch) Clock
18116815413480MHz
Frequency (FO = 128)
Input Module Propagation Delays
t
INYH
t
INYL
Pad-to-Y HIGH0.70.80.91.11.5ns
Pad-to-Y LOW0.60.70.81.01.3ns
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer tool from the Designer software to check the hold
time for this macro.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
7.0
7.0
7.4
7.4
9.8
9.8
10.4
10.4
ns
ns
t
PWH
t
PWL
t
CKSW
t
P
f
MAX
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
FO = 16
FO = 128
FO = 16
FO = 128
Maximum SkewFO = 16
FO = 128
Minimum PeriodFO = 16
FO = 128
Maximum
Frequency
FO = 16
FO = 128
2.2
2.4
2.2
2.4
4.7
4.8
0.4
0.5
188
181
2.6
2.7
2.6
2.7
5.4
5.6
0.5
0.6
175
168
2.9
3.1
2.9
3.01
6.1
6.3
0.5
0.7
160
154
3.4
3.6
3.4
3.6
7.2
7.5
0.6
0.8
139
134
4.8
5.1
4.8
5.1
10.0
10.4
ns
ns
0.8
ns
1.2
ns
8380MHz
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer tool from the Designer software to check the hold
time for this macro.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
t
ENZL
Enable Pad Z to
4.75.46.17.210.1ns
LOW
t
ENHZ
Enable Pad HIGH to
7.99.110.412.217.1ns
Z
t
ENLZ
Enable Pad LOW to
5.96.87.79.012.6ns
Z
d
TLH
d
THL
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
Delta LOW to HIGH0.020.020.030.030.04ns/pF
Delta HIGH to LOW0.030.030.030.040.06ns/pF
4
Data-to-Pad HIGH3.94.55.16.058.5ns
Data-to-Pad LOW3.43.94.45.27.3ns
Enable Pad Z to
3.43.94.45.27.3ns
HIGH
t
ENZL
Enable Pad Z to
4.95.66.47.510.5ns
LOW
t
ENHZ
Enable Pad HIGH to
7.99.110.412.217.0ns
Z
t
ENLZ
Enable Pad LOW to
5.96.87.79.012.6ns
Z
d
TLH
d
THL
Delta LOW to HIGH0.030.040.040.050.07ns/pF
Delta HIGH to LOW0.020.020.030.030.04ns/pF
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer tool from the Designer software to check the hold
time for this macro.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
Logic Module Propagation Delays
t
PD1
t
PD2
t
CO
t
GO
t
RS
Logic Module Predicted Routing Delays
t
RD1
t
RD2
t
RD3
t
RD4
t
RD8
Logic Module Sequential Timing
t
SUD
3
t
HD
t
SUENA
t
HENA
t
WCLKA
Single Module1.72.02.32.73.7ns
Dual-Module Macros3.74.34.95.78.0ns
Sequential Clock-to-Q1.72.02.32.73.7ns
Latch G-to-Q1.72.02.32.73.7ns
Flip-Flop (Latch) Reset-to-Q1.72.02.32.73.7ns
1
FO=1 Routing Delay2.02.22.53.04.2ns
FO=2 Routing Delay2.73.13.54.15.7ns
FO=3 Routing Delay3.43.94.45.27.3ns
FO=4 Routing Delay4.24.85.46.38.9ns
FO=8 Routing Delay7.18.29.210.915.2ns
2
Flip-Flop (Latch) Data Input Set-Up4.34.95.66.69.2ns
Flip-Flop (Latch) Data Input Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Enable Set-Up4.34.95.66.69.2ns
Flip-Flop (Latch) Enable Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Clock Active
4.65.36.07.09.8ns
Pulse Width
t
WASYN
Flip-Flop (Latch)
4.65.36.07.09.8ns
Asynchronous Pulse Width
t
A
f
MAX
Flip-Flop Clock Input Period6.87.88.910.414.6ns
Flip-Flop (Latch) Clock
109101928048MHz
Frequency (FO = 128)
Input Module Propagation Delays
t
INYH
t
INYL
Pad-to-Y HIGH1.01.11.31.52.1ns
Pad-to-Y LOW0.91.01.11.31.9ns
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer tool from the Designer software to check the hold
time for this macro.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
Input Module Predicted Routing Delays
t
t
t
t
t
IRD1
IRD2
IRD3
IRD4
IRD8
FO=1 Routing Delay2.93.43.84.56.3ns
FO=2 Routing Delay3.64.24.85.67.8ns
FO=3 Routing Delay4.45.05.76.79.4ns
FO=4 Routing Delay5.15.96.77.811.0ns
FO=8 Routing Delay8.09.2610.512.617.3ns
1
Global Clock Network
t
t
CKH
CKL
Input LOW to HIGHFO = 16
FO = 128
Input HIGH to LOW FO = 16
FO = 128
6.4
6.4
6.7
6.7
7.4
7.4
7.8
7.8
8.3
8.3
8.8
8.8
9.8
9.8
10.4
10.4
13.7
13.7
14.5
14.5
ns
ns
t
PWH
t
PWL
t
CKSW
t
P
f
MAX
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
d
TLH
d
THL
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
Maximum SkewFO = 16
Minimum PeriodFO = 16
Maximum Frequency FO = 16
4
FO = 16
FO = 128
FO = 16
FO = 128
FO = 128
FO = 128
FO = 128
3.1
3.3
3.1
3.3
6.5
6.8
0.6
0.8
113
109
3.6
3.8
3.6
3.8
7.5
7.8
0.6
0.9
105
101
4.1
4.3
4.1
4.3
8.5
8.9
0.7
1.0
96
92
4.8
5.1
4.8
5.1
10.1
10.4
0.8
1.2
83
80
6.7
7.1
6.7
7.1
14.1
14.6
ns
ns
1.2
ns
1.6
ns
5048MHz
Data-to-Pad HIGH4.75.46.17.210.0ns
Data-to-Pad LOW5.66.47.38.612.0ns
Enable Pad Z to HIGH5.26.06.88.111.3ns
Enable Pad Z to LOW6.67.68.610.114.1ns
Enable Pad HIGH to Z11.112.814.517.123.9ns
Enable Pad LOW to Z8.29.510.712.617.7ns
Delta LOW to HIGH0.030.030.040.040.06ns/pF
Delta HIGH to LOW0.040.040.050.060.08ns/pF
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer tool from the Designer software to check the hold
time for this macro.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
d
TLH
d
THL
Data-to-Pad HIGH5.56.47.28.511.9ns
Data-to-Pad LOW4.85.56.27.310.2ns
Enable Pad Z to HIGH4.75.56.27.310.2ns
Enable Pad Z to LOW6.87.98.910.514.7ns
Enable Pad HIGH to Z11.112.814.517.123.9ns
Enable Pad LOW to Z8.29.510.712.617.7ns
Delta LOW to HIGH0.050.050.060.070.10ns/pF
Delta HIGH to LOW0.030.030.040.040.06ns/pF
4
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer tool from the Designer software to check the hold
time for this macro.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
Logic Module Propagation Delays
t
PD1
t
PD2
t
CO
t
GO
t
RS
Logic Module Predicted Routing Delays
t
RD1
t
RD2
t
RD3
t
RD4
t
RD8
Logic Module Sequential Timing
t
SUD
3
t
HD
t
SUENA
t
HENA
t
WCLKA
Single Module1.21.41.61.92.7ns
Dual-Module Macros2.33.13.54.15.7ns
Sequential Clock-to-Q1.21.41.61.92.7ns
Latch G-to-Q1.21.41.61.92.7ns
Flip-Flop (Latch) Reset-to-Q1.21.41.61.92.7ns
1
FO=1 Routing Delay1.21.61.82.13.0ns
FO=2 Routing Delay1.92.22.52.94.1ns
FO=3 Routing Delay2.42.83.23.75.2ns
FO=4 Routing Delay2.93.43.94.56.3ns
FO=8 Routing Delay5.05.86.67.810.9ns
2
Flip-Flop (Latch) Data Input Set-Up3.13.54.04.76.6ns
Flip-Flop (Latch) Data Input Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Enable Set-Up3.13.54.04.76.6ns
Flip-Flop (Latch) Enable Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Clock Active
3.33.84.35.07.0ns
Pulse Width
t
WASYN
Flip-Flop (Latch)
3.33.84.35.07.0ns
Asynchronous Pulse Width
t
A
f
MAX
Flip-Flop Clock Input Period4.85.66.37.510.4ns
Flip-Flop (Latch) Clock Frequency
18116715413480MHz
(FO = 128)
Input Module Propagation Delays
t
INYH
t
INYL
Pad-to-Y HIGH0.70.80.91.11.5ns
Pad-to-Y LOW0.60.70.81.01.3ns
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer utility from the Designer software to check the hold
time for this macro.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
7.0
7.0
7.4
7.4
9.8
9.8
10.4
10.4
ns
ns
t
PWH
t
PWL
t
CKSW
t
P
f
MAX
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
d
TLH
d
THL
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
Maximum SkewFO = 16
Minimum PeriodFO = 16
Maximum
Frequency
4
FO = 16
FO = 128
FO = 16
FO = 128
FO = 128
FO = 128
FO = 16
FO = 128
2.2
2.4
2.2
2.4
4.7
4.8
0.4
0.5
188
181
2.6
2.7
2.6
2.7
5.4
5.6
0.5
0.6
175
168
2.9
3.1
2.9
3.01
6.1
6.3
0.5
0.7
160
154
3.4
3.6
3.4
3.6
7.2
7.5
0.6
0.8
139
134
4.8
5.1
4.8
5.1
10.0
10.4
ns
ns
0.8
ns
1.2
ns
8380MHz
Data-to-Pad HIGH3.33.84.35.17.2ns
Data-to-Pad LOW4.04.65.26.18.6ns
Enable Pad Z to HIGH3.74.34.95.88.0ns
Enable Pad Z to LOW4.75.46.17.210.1ns
Enable Pad HIGH to Z7.99.110.412.217.1ns
Enable Pad LOW to Z5.96.87.79.012.6ns
Delta LOW to HIGH0.020.020.030.030.04ns/pF
Delta HIGH to LOW0.030.030.030.040.06ns/pF
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer utility from the Designer software to check the hold
time for this macro.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
d
TLH
d
THL
Data-to-Pad HIGH3.94.55.16.058.5ns
Data-to-Pad LOW3.43.94.45.27.3ns
Enable Pad Z to HIGH3.43.94.45.27.3ns
Enable Pad Z to LOW4.95.66.47.510.5ns
Enable Pad HIGH to Z7.99.110.412.217.0ns
Enable Pad LOW to Z5.96.87.79.012.6ns
Delta LOW to HIGH0.030.040.040.050.07ns/pF
Delta HIGH to LOW0.020.020.030.030.04ns/pF
1
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer utility from the Designer software to check the hold
time for this macro.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
Logic Module Propagation Delays
t
PD1
t
PD2
t
CO
t
GO
t
RS
Logic Module Predicted Routing Delays
t
RD1
t
RD2
t
RD3
t
RD4
t
RD8
Logic Module Sequential Timing
t
SUD
3
t
HD
t
SUENA
t
HENA
t
WCLKA
Single Module1.72.02.32.73.7ns
Dual-Module Macros3.74.34.95.78.0ns
Sequential Clock-to-Q1.72.02.32.73.7ns
Latch G-to-Q1.72.02.32.73.7ns
Flip-Flop (Latch) Reset-to-Q1.72.02.32.73.7ns
1
FO=1 Routing Delay1.92.22.53.04.2ns
FO=2 Routing Delay2.73.13.54.15.7ns
FO=3 Routing Delay3.43.94.45.27.3ns
FO=4 Routing Delay4.14.85.46.38.9ns
FO=8 Routing Delay7.18.19.210.915.2ns
2
Flip-Flop (Latch) Data Input Set-Up4.35.05.66.69.2ns
Flip-Flop (Latch) Data Input Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Enable Set-Up4.35.05.66.69.2ns
Flip-Flop (Latch) Enable Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Clock Active
4.65.35.67.09.8ns
Pulse Width
t
WASYN
Flip-Flop (Latch)
4.65.35.67.09.8ns
Asynchronous Pulse Width
t
A
f
MAX
Flip-Flop Clock Input Period6.87.88.910.414.6ns
Flip-Flop (Latch) Clock Frequency
109101928048MHz
(FO = 128)
Input Module Propagation Delays
t
INYH
t
INYL
Pad-to-Y HIGH1.01.11.31.52.1ns
Pad-to-Y LOW0.91.01.11.31.9ns
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer tool from the Designer software to check the hold
time for this macro.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
ns
ns
t
PWH
t
PWL
t
CKSW
t
P
f
MAX
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
d
TLH
d
THL
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
Maximum SkewFO = 16
Minimum PeriodFO = 16
Maximum Frequency FO = 16
4
FO = 16
FO = 128
FO = 16
FO = 128
FO = 128
FO = 128
FO = 128
3.1
3.3
3.1
3.3
6.5
6.8
0.6
0.8
113
109
3.6
3.8
3.6
3.8
7.5
7.8
0.6
0.9
105
101
4.1
4.3
4.1
4.3
8.5
8.9
0.7
1.0
96
92
4.8
5.1
4.8
5.1
10.1
10.4
0.8
1.2
83
80
6.7
7.1
6.7
7.1
14.1
14.6
ns
ns
1.2
ns
1.6
ns
5048MHz
Data-to-Pad HIGH4.75.46.17.210.0ns
Data-to-Pad LOW5.66.47.38.612.0ns
Enable Pad Z to HIGH5.26.06.98.111.3ns
Enable Pad Z to LOW6.67.68.610.114.1ns
Enable Pad HIGH to Z11.112.814.517.123.9ns
Enable Pad LOW to Z8.29.510.712.617.7ns
Delta LOW to HIGH0.030.030.040.040.06ns/pF
Delta HIGH to LOW0.040.040.050.060.08ns/pF
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer tool from the Designer software to check the hold
time for this macro.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
d
TLH
d
THL
Data-to-Pad HIGH5.56.47.28.511.9ns
Data-to-Pad LOW4.85.56.27.310.2ns
Enable Pad Z to HIGH4.75.56.27.310.2ns
Enable Pad Z to LOW6.87.98.910.514.7ns
Enable Pad HIGH to Z11.112.814.517.123.9ns
Enable Pad LOW to Z8.29.510.712.617.7ns
Delta LOW to HIGH0.050.050.060.070.10ns/pF
Delta HIGH to LOW0.030.030.040.040.06ns/pF
4
Notes:
1. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
2. Set-up times assume fanout of 3. Further testing information can be obtained from the Timer utility.
3. The hold time for the DFME1A macro may be greater than 0 ns. Use the Timer tool from the Designer software to check the hold
time for this macro.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
3.6
4.0
5.0
5.5
ns
ns
t
CKL
t
PWH
t
PWL
t
CKSW
t
SUEXT
t
HEXT
t
P
f
MAX
Input HIGH to LOW FO = 32
FO = 256
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
FO = 32
FO = 256
FO = 32
FO = 256
Maximum SkewFO = 32
FO = 256
Input Latch External
Set-Up
Input Latch External
Hold
FO = 32
FO = 256
FO = 32
FO = 256
Minimum PeriodFO = 32
FO = 256
Maximum Frequency FO = 32
FO = 256
1.2
1.3
1.2
1.3
0.0
0.0
2.3
2.2
3.4
3.7
3.5
3.9
0.3
0.3
296
268
1.4
1.5
1.4
1.5
0.0
0.0
2.6
2.4
3.7
4.1
3.9
4.3
0.3
0.3
269
244
1.5
1.7
1.5
1.7
0.0
0.0
3.0
3.3
4.0
4.5
4.4
4.9
0.4
0.4
247
224
1.8
2.0
1.8
2.0
0.0
0.0
3.5
3.9
4.7
5.2
5.2
5.7
0.5
0.5
215
195
2.5
2.7
2.5
2.7
0.0
0.0
4.9
5.5
7.8
8.6
7.3
8.0
0.6
0.6
129
117
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
MHz
MHz
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LSU
t
LH
t
LCO
Data-to-Pad HIGH2.52.73.13.65.1ns
Data-to-Pad LOW2.93.23.64.36.0ns
Enable Pad Z to HIGH2.62.93.33.95.5ns
Enable Pad Z to LOW2.93.23.74.36.1ns
Enable Pad HIGH to Z4.95.46.27.310.2ns
Enable Pad LOW to Z5.35.96.77.911.1ns
G-to-Pad HIGH2.62.93.33.85.3ns
G-to-Pad LOW2.62.93.33.85.3ns
I/O Latch Set-Up0.50.50.60.71.0ns
I/O Latch Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out (Pad-to-
5
5.25.86.67.710.8ns
Pad), 64 Clock Loading
t
ACO
Array Clock-to-Out (Pad-to-Pad),
7.48.29.310.915.3ns
64 Clock Loading
d
TLH
d
THL
Capacity Loading, LOW to HIGH0.030.030.030.040.06ns/pF
Capacity Loading, HIGH to LOW0.040.040.040.050.07ns/pF
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LSU
t
LH
t
LCO
Data-to-Pad HIGH2.42.73.13.65.1ns
Data-to-Pad LOW2.93.23.64.36.0ns
Enable Pad Z to HIGH2.72.93.33.95.5ns
Enable Pad Z to LOW2.93.23.74.36.1ns
Enable Pad HIGH to Z4.95.46.27.310.2ns
Enable Pad LOW to Z5.35.96.77.911.1ns
G-to-Pad HIGH4.24.65.26.18.6ns
G-to-Pad LOW4.24.65.26.18.6ns
I/O Latch Set-Up0.50.50.60.71.0ns
I/O Latch Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out (Pad-to-
5
5.25.86.67.710.8ns
Pad), 64 Clock Loading
t
ACO
Array Clock-to-Out (Pad-to-Pad),
7.48.29.310.915.3ns
64 Clock Loading
d
TLH
d
THL
Capacity Loading, LOW to HIGH0.030.030.030.040.06ns/pF
Capacity Loading, HIGH to LOW0.040.040.040.050.07ns/pF
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Flip-Flop (Latch) Data Input Set-Up0.50.50.60.70.9ns
Flip-Flop (Latch) Data Input Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Enable Set-Up0.60.60.70.81.2ns
Flip-Flop (Latch) Enable Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Clock Active
1
2
3, 4
4.75.36.07.09.8ns
Pulse Width
t
WASYN
Flip-Flop (Latch) Asynchronous
6.26.97.89.212.9ns
Pulse Width
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
t
A
t
INH
t
INSU
t
OUTH
t
OUTSU
f
MAX
Flip-Flop Clock Input Period5.05.66.27.19.9ns
Input Buffer Latch Hold0.00.00.00.00.0ns
Input Buffer Latch Set-Up0.30.30.30.40.6ns
Output Buffer Latch Hold0.00.00.00.00.0ns
Output Buffer Latch Set-Up0.30.30.30.40.6ns
Flip-Flop (Latch) Clock
16114613511770MHz
Frequency
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
6.0
6.7
8.4
9.3
ns
ns
t
CKL
t
PWH
t
PWL
t
CKSW
t
SUEXT
t
HEXT
t
P
f
MAX
Input HIGH to LOW FO = 32
FO = 256
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
FO = 32
FO = 256
FO = 32
FO = 256
Maximum SkewFO = 32
FO = 256
Input Latch External
Set-Up
Input Latch External
Hold
FO = 32
FO = 256
FO = 32
FO = 256
Minimum PeriodFO = 32
FO = 256
Maximum
Frequency
FO = 32
FO = 256
1.7
1.9
1.7
1.9
0.0
0.0
3.3
3.7
5.6
6.1
5.0
5.4
0.4
0.4
177
161
1.9
2.1
1.9
2.1
0.0
0.0
3.7
4.1
6.2
6.8
5.5
6.0
0.5
0.5
161
146
2.1
2.3
2.1
2.3
0.0
0.0
4.2
4.6
6.7
7.4
6.2
6.8
0.5
0.5
148
135
2.5
2.7
2.5
2.7
0.0
0.0
4.9
5.5
7.8
8.5
7.3
8.0
0.6
0.6
129
117
3.5
3.8
3.5
3.8
0.0
0.0
6.9
7.6
12.9
14.2
10.2
11.2nsns
ns
ns
ns
ns
0.9
0.9
ns
ns
ns
ns
ns
ns
ns
ns
7770MHz
MHz
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LSU
t
LH
t
LCO
Data-to-Pad HIGH3.43.85.56.49.0ns
Data-to-Pad LOW4.14.54.25.07.0ns
Enable Pad Z to HIGH3.74.14.65.57.6ns
Enable Pad Z to LOW4.14.55.16.18.5ns
Enable Pad HIGH to Z6.97.68.610.214.2ns
Enable Pad LOW to Z7.58.39.411.115.5ns
G-to-Pad HIGH5.86.57.38.612.0ns
G-to-Pad LOW5.86.57.38.612.0ns
I/O Latch Set-Up0.70.80.91.01.4ns
I/O Latch Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out (Pad-to-
5
8.79.710.912.918.0ns
Pad), 64 Clock Loading
t
ACO
Array Clock-to-Out (Pad-to-Pad),
12.213.515.418.125.3ns
64 Clock Loading
d
TLH
d
THL
Capacity Loading, LOW to HIGH0.040.040.050.060.08ns/pF
Capacity Loading, HIGH to LOW0.050.050.060.070.10ns/pF
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
Input Module Propagation Delays
t
INYH
t
INYL
t
INGH
t
INGL
Input Module Predicted Routing Delays
t
IRD1
t
IRD2
t
IRD3
t
IRD4
t
IRD8
Pad-to-Y HIGH1.11.21.31.62.2ns
Pad-to-Y LOW0.80.91.01.21.7ns
G to Y HIGH1.41.61.82.12.9ns
G to Y LOW1.41.61.82.12.9ns
2
FO=1 Routing Delay1.82.02.32.74.0ns
FO=2 Routing Delay2.12.32.63.14.3ns
FO=3 Routing Delay2.32.63.03.54.9ns
FO=4 Routing Delay2.63.03.33.95.4ns
FO=8 Routing Delay3.64.04.65.47.5ns
Global Clock Network
t
CKH
t
CKL
t
PWH
t
PWL
t
CKSW
t
SUEXT
t
HEXT
t
P
f
MAX
Input LOW to HIGHFO = 32
FO = 384
Input HIGH to LOW FO = 32
FO = 384
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
FO = 32
FO = 384
FO = 32
FO = 384
Maximum SkewFO = 32
FO = 384
Input Latch External
Set-Up
Input Latch External
Hold
FO = 32
FO = 384
FO = 32
FO = 384
Minimum PeriodFO = 32
FO = 384
Maximum
Frequency
FO = 32
FO = 384
3.2
3.7
3.2
3.7
0.0
0.0
2.8
3.2
4.2
4.6
2.6
2.9
3.8
4.5
0.3
0.3
237
215
3.5
4.1
3.5
4.1
0.0
0.0
3.1
3.5
4.67
5.1
2.9
3.2
4.2
5.0
0.4
0.4
215
195
4.0
4.6
4.0
4.6
0.0
0.0
5.5
4.0
5.1
5.6
3.3
3.6
4.8
5.6
0.4
0.4
198
179
4.7
5.4
4.7
5.4
0.0
0.0
4.1
4.7
5.8
6.4
3.9
4.3
5.6
6.6
0.5
0.5
172
156
6.6
7.6
6.6
7.6
0.0
0.0
5.7
6.6
9.7
10.7
5.4
6.0
7.8
9.2
ns
ns
ns
ns
ns
ns
ns
ns
0.7
0.7
ns
ns
ns
ns
ns
ns
ns
ns
10394MHz
MHz
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, point and position whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LCO
Data-to-Pad HIGH2.52.83.23.75.2ns
Data-to-Pad LOW3.03.33.74.46.1ns
Enable Pad Z to HIGH2.73.03.44.05.6ns
Enable Pad Z to LOW3.03.33.84.46.2ns
Enable Pad HIGH to Z5.46.06.88.011.2ns
Enable Pad LOW to Z5.05.66.37.410.4ns
G-to-Pad HIGH2.93.23.64.36.0ns
G-to-Pad LOW2.93.23.64.36.0ns
I/O Latch Clock-to-Out (Pad-to-
5
5.76.37.18.411.9ns
Pad), 64 Clock Loading
t
ACO
Array Clock-to-Out (Pad-to-Pad),
8.08.910.111.916.7ns
64 Clock Loading
d
TLH
d
THL
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LCO
Capacitive Loading, LOW to HIGH0.030.030.030.040.06ns/pF
Capacitive Loading, HIGH to LOW0.040.040.040.050.07ns/pF
5
Data-to-Pad HIGH3.23.64.04.76.6ns
Data-to-Pad LOW2.52.73.13.65.1ns
Enable Pad Z to HIGH2.73.03.44.05.6ns
Enable Pad Z to LOW3.03.33.84.46.2ns
Enable Pad HIGH to Z5.46.06.88.011.2ns
Enable Pad LOW to Z5.05.66.37.410.4ns
G-to-Pad HIGH5.15.66.47.510.5ns
G-to-Pad LOW5.15.66.47.510.5ns
I/O Latch Clock-to-Out (Pad-to-
5.76.37.18.411.9ns
Pad), 64 Clock Loading
t
ACO
Array Clock-to-Out (Pad-to-Pad),
8.08.910.111.916.7ns
64 Clock Loading
d
TLH
Capacitive Loading, LOW to HIGH0.030.030.030.040.06ns/pF
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, point and position whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
Logic Module Propagation Delays
t
t
t
t
PD1
CO
GO
RS
Single Module1.92.12.42.84.0ns
Sequential Clock-to-Q2.02.22.53.04.2ns
Latch G-to-Q1.92.12.42.84.0ns
Flip-Flop (Latch) Reset-to-Q2.22.42.83.34.6ns
Logic Module Predicted Routing Delays
t
t
t
t
t
RD1
RD2
RD3
RD4
RD8
FO=1 Routing Delay1.11.21.41.62.3ns
FO=2 Routing Delay1.51.61.82.13.0ns
FO=3 Routing Delay1.82.02.32.73.8ns
FO=4 Routing Delay2.22.42.73.24.5ns
FO=8 Routing Delay3.64.04.55.37.5ns
Logic Module Sequential Timing
t
SUD
t
HD
t
SUENA
t
HENA
t
WCLKA
Flip-Flop (Latch) Data Input Set-Up0.50.50.60.70.9ns
Flip-Flop (Latch) Data Input Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Enable Set-Up1.01.11.21.42.0ns
Flip-Flop (Latch) Enable Hold0.00.00.00.00.0ns
Flip-Flop (Latch) Clock Active
1
2
3, 4
4.85.36.07.19.9ns
Pulse Width
t
WASYN
Flip-Flop (Latch) Asynchronous
6.26.97.99.212.9ns
Pulse Width
t
A
t
INH
t
INSU
t
OUTH
t
OUTSU
f
MAX
Flip-Flop Clock Input Period9.510.612.014.119.8ns
Input Buffer Latch Hold0.00.00.00.00.0ns
Input Buffer Latch Set-Up0.70.80.91.011.4ns
Output Buffer Latch Hold0.00.00.00.00.0ns
Output Buffer Latch Set-Up0.70.80.891.011.4ns
Flip-Flop (Latch) Clock Frequency1291171089456MHz
Notes:
1. For dual-module macros use tPD1 + tRD1 + taped, to + tRD1 + taped, or tPD1 + tRD1 + tusk, whichever is appropriate.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
Input Module Propagation Delays
t
INYH
t
INYL
t
INGH
t
INGL
Input Module Predicted Routing Delays
t
IRD1
t
IRD2
t
IRD3
t
IRD4
t
IRD8
Pad-to-Y HIGH1.51.61.92.23.1ns
Pad-to-Y LOW1.11.31.41.72.4ns
G to Y HIGH2.02.22.52.94.1ns
G to Y LOW2.02.22.52.94.1ns
2
FO=1 Routing Delay2.62.93.23.85.3ns
FO=2 Routing Delay2.93.23.74.36.1ns
FO=3 Routing Delay3.33.64.14.96.8ns
FO=4 Routing Delay3.64.04.65.47.6ns
FO=8 Routing Delay5.15.66.47.510.5ns
Global Clock Network
t
CKH
t
CKL
t
PWH
t
PWL
t
CKSW
t
SUEXT
t
HEXT
t
P
f
MAX
Input LOW to HIGHFO = 32
FO = 384
Input HIGH to LOW FO = 32
FO = 384
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
FO = 32
FO = 384
FO = 32
FO = 384
Maximum SkewFO = 32
FO = 384
Input Latch External
Set-Up
Input Latch External
Hold
FO = 32
FO = 384
FO = 32
FO = 384
Minimum PeriodFO = 32
FO = 384
Maximum Frequency FO = 32
FO = 384
5.7
6.6
5.3
6.2
0.0
0.0
3.9
4.5
7.0
7.7
4.4
4.8
5.3
6.2
0.5
2.2
142
129
6.3
7.4
5.9
6.9
0.0
0.0
4.3
4.9
7.8
8.6
4.8
5.3
5.9
6.9
0.5
2.4
129
117
7.1
8.3
6.7
7.9
0.0
0.0
4.9
5.6
8.4
9.3
5.5
6.0
6.7
7.9
0.6
2.7
119
108
8.4
9.8
7.8
9.2
0.0
0.0
5.7
6.6
9.7
10.7
6.5
7.1
7.8
9.2
0.7
3.2
103
94
11.8
13.7
11.0
12.9
0.0
0.0
8.0
9.2
16.2
17.8
9.0
9.9
ns
ns
11.0
12.9nsns
ns
ns
ns
ns
1.0
4.5
ns
ns
ns
ns
ns
ns
ns
ns
6256MHz
MHz
Notes:
1. For dual-module macros use tPD1 + tRD1 + taped, to + tRD1 + taped, or tPD1 + tRD1 + tusk, whichever is appropriate.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LCO
Data-to-Pad HIGH3.53.94.45.27.3ns
Data-to-Pad LOW4.14.65.26.18.6ns
Enable Pad Z to HIGH3.84.24.85.67.8ns
Enable Pad Z to LOW4.24.65.36.28.7ns
Enable Pad HIGH to Z7.68.49.511.215.7ns
Enable Pad LOW to Z7.07.88.810.414.5ns
G-to-Pad HIGH4.85.36.07.210.0ns
G-to-Pad LOW4.85.36.07.210.0ns
I/O Latch Clock-to-Out (Pad-to-
5
8.08.910.111.916.7ns
Pad), 64 Clock Loading
t
ACO
Array Clock-to-Out (Pad-to-Pad),
11.312.514.216.723.3ns
64 Clock Loading
d
TLH
d
THL
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LCO
Capacitive Loading, LOW to HIGH0.040.040.050.060.08ns/pF
Capacitive Loading, HIGH to LOW0.050.050.060.070.10ns/pF
5
Data-to-Pad HIGH4.55.05.66.69.3ns
Data-to-Pad LOW3.43.84.35.17.1ns
Enable Pad Z to HIGH3.84.24.85.67.8ns
Enable Pad Z to LOW4.24.65.36.28.7ns
Enable Pad HIGH to Z7.68.49.511.215.7ns
Enable Pad LOW to Z7.07.88.810.414.5ns
G-to-Pad HIGH7.17.98.910.514.7ns
G-to-Pad LOW7.17.98.910.514.7ns
I/O Latch Clock-to-Out (Pad-to-
8.08.910.111.916.7ns
Pad), 64 Clock Loading
t
ACO
Array Clock-to-Out (Pad-to-Pad),
11.312.514.216.723.3ns
64 Clock Loading
d
TLH
d
THL
Capacitive Loading, LOW to HIGH0.040.040.050.060.08ns/pF
Capacitive Loading, HIGH to LOW0.050.050.060.070.10ns/pF
Notes:
1. For dual-module macros use tPD1 + tRD1 + taped, to + tRD1 + taped, or tPD1 + tRD1 + tusk, whichever is appropriate.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the input buffer latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
Input Module Predicted Routing Delays
t
t
t
t
t
IRD1
IRD2
IRD3
IRD4
IRD8
FO=1 Routing Delay1.82.02.32.73.8ns
FO=2 Routing Delay2.12.32.63.14.3ns
FO=3 Routing Delay2.32.52.93.44.8ns
FO=4 Routing Delay2.52.83.23.75.2ns
FO=8 Routing Delay3.43.84.35.17.1ns
2
Global Clock Network
t
t
CKH
CKL
Input LOW to HIGHFO=32
FO=486
Input HIGH to LOW FO=32
FO=486
2.6
2.9
3.7
4.3
2.9
3.2
4.1
4.7
3.3
3.6
4.6
5.4
3.9
4.3
5.4
6.3
5.4
5.9
7.6
8.8
ns
ns
ns
ns
t
PWH
t
PWL
t
CKSW
t
SUEXT
t
HEXT
t
P
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
FO=32
FO=486
FO=32
FO=486
Maximum SkewFO=32
FO=486
Input Latch External
Set-Up
Input Latch External
Hold
Minimum Period
(1/f
)
MAX
FO=32
FO=486
FO=32
FO=486
FO=32
FO=486
2.2
2.4
2.2
2.4
0.0
0.0
2.8
3.3
4.7
5.1
0.5
0.5
2.4
2.6
2.4
2.6
0.0
0.0
3.1
3.7
5.2
5.7
0.6
0.6
2.7
3.0
2.7
3.0
0.0
0.0
3.5
4.2
5.7
6.2
0.7
0.7
3.2
3.5
3.2
3.5
0.0
0.0
4.1
4.9
6.5
7.1
0.8
0.8
4.5
4.9
4.5
4.9
0.0
0.0
5.7
6.9
10.9
11.9
1.1
1.1
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes:
1. For dual-module macros, use t
PD1
RD1
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
+ t
+ t
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LSU
t
LH
t
LCO
Data-to-Pad HIGH 2.42.73.13.65.1ns
Data-to-Pad LOW 2.83.23.64.25.9ns
Enable Pad Z to HIGH2.52.83.23.85.3ns
Enable Pad Z to LOW2.83.13.54.25.9ns
Enable Pad HIGH to Z5.25.76.57.610.7ns
Enable Pad LOW to Z4.85.36.07.19.9ns
G-to-Pad HIGH2.93.23.64.36.0ns
G-to-Pad LOW2.93.23.64.36.0ns
I/O Latch Output Set-Up0.50.50.60.71.0ns
I/O Latch Output Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out
5
5.66.16.98.111.4ns
(Pad-to-Pad) 32 I/O
t
ACO
Array Latch Clock-to-Out
10.611.813.415.722.0ns
(Pad-to-Pad) 32 I/O
d
TLH
d
THL
Capacitive Loading, LOW to HIGH0.040.040.040.050.07ns/pF
Capacitive Loading, HIGH to LOW0.030.030.030.040.06ns/pF
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LSU
t
LH
t
LCO
Data-to-Pad HIGH 3.13.53.94.66.4ns
Data-to-Pad LOW 2.42.63.03.54.9ns
Enable Pad Z to HIGH2.52.83.23.85.3ns
Enable Pad Z to LOW2.83.13.54.25.8ns
Enable Pad HIGH to Z5.25.76.57.610.7ns
Enable Pad LOW to Z4.85.36.07.19.9ns
G-to-Pad HIGH4.95.46.27.210.1ns
G-to-Pad LOW4.95.46.27.210.1ns
I/O Latch Set-Up0.50.50.60.71.0ns
I/O Latch Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out (Pad-to-
5
5.56.16.98.111.3ns
Pad) 32 I/O
t
ACO
Array Latch Clock-to-Out (Pad-
10.611.813.415.722.0ns
to-Pad) 32 I/O
d
TLH
d
THL
Capacitive Loading, LOW to HIGH0.040.040.040.050.07ns/pF
Capacitive Loading, HIGH to LOW0.030.030.030.040.06ns/pF
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
6.5
7.1
7.6
8.8
9.1
10.0nsns
10.6
12.4nsns
t
PWH
t
PWL
t
CKSW
t
SUEXT
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LSU
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
Maximum SkewFO=32
Input Latch External
Set-Up
5
FO=32
FO=486
FO=32
FO=486
FO=486
FO=32
FO=486
3.0
3.3
3.0
3.3
0.0
0.0
0.8
0.8
3.3
3.7
3.4
3.7
0.0
0.0
0.8
0.8
3.8
4.2
3.8
4.2
0.0
0.0
1.0
1.0
4.5
4.9
4.5
4.9
0.0
0.0
1.1
1.1
6.3
6.9
6.3
6.9
0.0
0.0
1.6
1.6
ns
ns
ns
ns
ns
ns
ns
ns
Data-to-Pad HIGH 3.43.84.35.07.1ns
Data-to-Pad LOW 4.04.45.05.98.3ns
Enable Pad Z to HIGH3.64.04.55.37.4ns
Enable Pad Z to LOW3.94.45.05.88.2ns
Enable Pad HIGH to Z7.28.09.110.714.9ns
Enable Pad LOW to Z6.77.58.59.913.9ns
G-to-Pad HIGH4.85.36.07.210.0ns
G-to-Pad LOW4.85.36.07.210.0ns
I/O Latch Output Set-Up0.70.70.81.01.4ns
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Capacitive Loading, LOW to HIGH0.050.050.060.070.10ns/pF
Capacitive Loading, HIGH to LOW0.040.040.050.060.08ns/pF
5
Data-to-Pad HIGH 4.85.35.56.49.0ns
Data-to-Pad LOW 3.53.94.14.96.8ns
Enable Pad Z to HIGH3.64.04.55.37.4ns
Enable Pad Z to LOW3.44.05.05.88.2ns
Enable Pad HIGH to Z7.28.09.010.714.9ns
Enable Pad LOW to Z6.77.58.59.913.9ns
G-to-Pad HIGH6.87.68.610.114.2ns
G-to-Pad LOW6.87.68.610.114.2ns
I/O Latch Set-Up0.70.70.81.01.4ns
I/O Latch Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out
7.78.59.611.315.9ns
(Pad-to-Pad) 32 I/O
t
ACO
Array Latch Clock-to-Out
14.816.518.722.030.8ns
(Pad-to-Pad) 32 I/O
UnitsParameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max.
d
TLH
d
THL
t
HEXT
t
P
Capacitive Loading, LOW to HIGH0.050.050.060.070.10ns/pF
Capacitive Loading, HIGH to LOW0.040.040.050.060.08ns/pF
Input Latch External
Hold
Minimum Period
)
(1/f
MAX
FO=32
FO=486
FO=32
FO=486
3.9
4.6
7.8
8.6
4.3
5.2
8.7
9.5
4.9
5.8
9.5
10.4
5.7
6.9
10.8
11.9
8.1
9.6
18.2
19.9
ns
ns
ns
ns
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
Synchronous SRAM Operations (Continued)
t
ADH
t
RENSU
t
RENH
t
WENSU
t
WENH
t
BENS
t
BENH
Address/Data Hold Time0.00.00.00.00.0ns
Read Enable Set-Up0.60.70.80.91.3ns
Read Enable Hold3.43.84.35.07.0ns
Write Enable Set-Up2.73.03.44.05.6ns
Write Enable Hold0.00.00.00.00.0ns
Block Enable Set-Up2.83.13.54.15.7ns
Block Enable Hold0.00.00.00.00.0ns
Asynchronous SRAM Operations
t
RPD
t
RDADV
t
ADSU
t
ADH
t
RENSUA
Asynchronous Access Time8.19.010.212.016.8ns
Read Address Valid8.89.811.113.018.2ns
Address/Data Set-Up Time1.61.82.02.43.4ns
Address/Data Hold Time0.00.00.00.00.0ns
Read Enable Set-Up to Address
0.60.70.80.91.3ns
Valid
t
RENHA
t
WENSU
t
WENH
t
DOH
Read Enable Hold3.43.84.35.07.0ns
Write Enable Set-Up2.73.03.44.05.6ns
Write Enable Hold0.00.00.00.00.0ns
Data Out Hold Time1.21.31.51.82.5ns
Input Module Propagation Delays
t
INPY
t
INGO
t
INH
t
INSU
t
ILA
Input Data Pad-to-Y 1.01.11.31.52.1ns
Input Latch Gate-to-Output1.41.61.82.12.9ns
Input Latch Hold0.00.00.00.00.0ns
Input Latch Set-Up0.50.50.60.71.0ns
Latch Active Pulse Width4.75.25.96.99.7ns
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
Input Module Predicted Routing Delays
t
t
t
t
t
IRD1
IRD2
IRD3
IRD4
IRD8
FO=1 Routing Delay2.02.22.52.94.1ns
FO=2 Routing Delay2.32.62.93.44.8ns
FO=3 Routing Delay2.62.93.33.95.5ns
FO=4 Routing Delay3.03.33.84.46.2ns
FO=8 Routing Delay4.34.85.56.49.0ns
2
Global Clock Network
t
CKH
t
CKL
t
PWH
t
PWL
t
CKSW
t
SUEXT
t
HEXT
t
P
f
MAX
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
Input LOW to HIGHFO=32
FO=635
Input HIGH to LOW FO=32
FO=635
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
FO=32
FO=635
FO=32
FO=635
Maximum SkewFO=32
FO=635
Input Latch External
Set-Up
Input Latch External
Hold
Minimum Period
(1/f
)
MAX
Maximum Datapath
Frequency
FO=32
FO=635
FO=32
FO=635
FO=32
FO=635
FO=32
FO=635
5
1.8
2.0
1.8
2.0
0.0
0.0
2.8
3.3
5.5
6.0
2.7
3.0
3.8
4.9
0.8
0.8
180
166
2.0
2.2
2.0
2.2
0.0
0.0
3.2
3.7
6.1
6.6
3.0
3.3
4.2
5.4
0.8
0.8
164
151
2.2
2.5
2.2
2.5
0.0
0.0
3.6
4.2
6.6
7.2
3.4
3.8
4.8
6.1
0.9
0.9
151
139
2.6
2.9
2.6
2.9
0.0
0.0
4.2
4.9
7.6
8.3
4.0
4.4
5.6
7.2
1.0
1.0
131
121
5.6
6.2
7.8
10.1nsns
3.6
4.1
3.6
4.1
1.4
1.4
0.0
0.0
5.9
6.9
12.7
13.8
7973MHz
MHz
Data-to-Pad HIGH 2.62.83.23.85.3ns
Data-to-Pad LOW 3.03.33.74.46.2ns
Enable Pad Z to HIGH2.73.03.33.95.5ns
Enable Pad Z to LOW3.03.33.74.36.1ns
Enable Pad HIGH to Z5.35.86.67.810.9ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
TTL Output Module Timing5 (Continued)
t
ENLZ
t
GLH
t
GHL
t
LSU
t
LH
t
LCO
Enable Pad LOW to Z4.95.56.27.310.2ns
G-to-Pad HIGH2.93.33.74.46.1ns
G-to-Pad LOW2.93.33.74.46.1ns
I/O Latch Output Set-Up0.50.50.60.71.0ns
I/O Latch Output Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out (Pad-to-
5.76.37.18.411.8ns
Pad) 32 I/O
t
ACO
Array Latch Clock-to-Out (Pad-
7.88.69.811.516.1ns
to-Pad) 32 I/O
d
TLH
d
THL
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LSU
t
LH
t
LCO
Capacitive Loading, LOW to HIGH0.070.080.090.100.14ns/pF
Capacitive Loading, HIGH to LOW0.070.080.090.100.14ns/pF
5
Data-to-Pad HIGH 3.53.94.55.27.3ns
Data-to-Pad LOW 2.52.73.13.65.1ns
Enable Pad Z to HIGH2.73.03.33.95.5ns
Enable Pad Z to LOW2.93.33.74.36.1ns
Enable Pad HIGH to Z5.35.86.67.810.9ns
Enable Pad LOW to Z4.95.56.27.310.2ns
G-to-Pad HIGH5.05.66.37.510.4ns
G-to-Pad LOW5.05.66.37.510.4ns
I/O Latch Set-Up0.50.50.60.71.0ns
I/O Latch Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out (Pad-to-
5.76.37.18.411.8ns
Pad) 32 I/O
t
ACO
Array Latch Clock-to-Out (Pad-
7.88.69.811.516.1ns
to-Pad) 32 I/O
d
TLH
d
THL
Capacitive Loading, LOW to HIGH0.070.080.090.100.14ns/pF
Capacitive Loading, HIGH to LOW0.070.080.090.100.14ns/pF
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
Synchronous SRAM Operations (Continued)
t
ADH
t
RENSU
t
RENH
t
WENSU
t
WENH
t
BENS
t
BENH
Address/Data Hold Time0.00.00.00.00.0ns
Read Enable Set-Up0.91.01.11.31.8ns
Read Enable Hold4.85.36.07.09.8ns
Write Enable Set-Up3.84.24.85.67.8ns
Write Enable Hold0.00.00.00.00.0ns
Block Enable Set-Up3.94.34.95.78.0ns
Block Enable Hold0.00.00.00.00.0ns
Asynchronous SRAM Operations
t
RPD
t
RDADV
t
ADSU
t
ADH
t
RENSUA
Asynchronous Access Time11.312.614.316.823.5ns
Read Address Valid12.313.715.518.225.5ns
Address/Data Set-Up Time2.32.52.83.44.8ns
Address/Data Hold Time0.00.00.00.00.0ns
Read Enable Set-Up to Address
0.91.01.11.31.8ns
Valid
t
RENHA
t
WENSU
t
WENH
t
DOH
Read Enable Hold4.85.36.07.09.8ns
Write Enable Set-Up3.84.24.85.67.8ns
Write Enable Hold0.00.00.00.00.0ns
Data Out Hold Time1.82.02.12.53.5ns
Input Module Propagation Delays
t
INPY
t
INGO
Input Data Pad-to-Y 1.41.61.82.13.0ns
Input Latch Gate-to-
2.02.22.52.94.1ns
Output
t
INH
t
INSU
t
ILA
Input Latch Hold0.00.00.00.00.0ns
Input Latch Set-Up0.70.70.81.01.4ns
Latch Active Pulse Width6.57.38.29.713.5ns
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
Input Module Predicted Routing Delays
t
t
t
t
t
IRD1
IRD2
IRD3
IRD4
IRD8
FO=1 Routing Delay2.83.13.54.15.7ns
FO=2 Routing Delay3.23.54.14.86.7ns
FO=3 Routing Delay3.74.14.75.57.7ns
FO=4 Routing Delay4.24.65.36.28.7ns
FO=8 Routing Delay6.16.87.79.012.6ns
2
Global Clock Network
t
CKH
t
CKL
t
PWH
t
PWL
t
CKSW
t
SUEXT
t
HEXT
t
P
f
MAX
TTL Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
Input LOW to HIGHFO=32
FO=635
Input HIGH to LOW FO=32
FO=635
Minimum Pulse
Width HIGH
Minimum Pulse
Width LOW
FO=32
FO=635
FO=32
FO=635
Maximum SkewFO=32
FO=635
Input Latch
External Set-Up
Input Latch
External Hold
Minimum Period
(1/f
)
MAX
Maximum Datapath
Frequency
FO=32
FO=635
FO=32
FO=635
FO=32
FO=635
FO=32
FO=635
5
2.5
2.8
2.5
2.8
0.0
0.0
4.0
4.6
9.2
9.9
4.6
5.0
5.3
6.8
1.0
1.0
108
100
2.7
3.1
2.7
3.1
0.0
0.0
4.4
5.2
10.2
11.0
5.1
5.6
5.9
7.6
1.2
1.2
98
91
3.1
3.5
3.1
3.5
0.0
0.0
5.0
5.9
11.1
12.0
5.7
6.3
6.7
8.6
1.3
1.3
90
83
3.6
4.1
3.6
4.1
0.0
0.0
5.9
6.9
12.7
13.8
6.7
7.4
7.8
10.1
1.5
1.5
79
73
9.3
10.3nsns
11.0
14.1nsns
5.1
5.7
5.1
5.7
2.2
2.2
0.0
0.0
8.2
9.6
21.2
23.0
4744MHz
MHz
Data-to-Pad HIGH 3.64.04.55.37.4ns
Data-to-Pad LOW 4.24.65.26.28.6ns
Enable Pad Z to HIGH3.74.24.75.57.7ns
Enable Pad Z to LOW4.14.65.26.18.5ns
Enable Pad HIGH to Z7.348.29.310.915.3ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
Parameter DescriptionMin. Max. Min. Max. Min. Max. Min. Max. Min. Max. Units
TTL Output Module Timing
t
ENLZ
t
GLH
t
GHL
t
LSU
t
LH
t
LCO
Enable Pad LOW to Z6.97.68.710.214.3ns
G-to-Pad HIGH4.95.56.27.310.2ns
G-to-Pad LOW4.95.56.27.310.2ns
I/O Latch Output Set-Up0.70.70.81.01.4ns
I/O Latch Output Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out (Pad-to-
5
7.98.810.011.816.5ns
Pad) 32 I/O
t
ACO
Array Latch Clock-to-Out (Pad-
10.912.113.716.122.5ns
to-Pad) 32 I/O
d
TLH
d
THL
CMOS Output Module Timing
t
DLH
t
DHL
t
ENZH
t
ENZL
t
ENHZ
t
ENLZ
t
GLH
t
GHL
t
LSU
t
LH
t
LCO
Capacitive Loading, LOW to HIGH0.100.110.120.140.20ns/pF
Capacitive Loading, HIGH to LOW0.100.110.120.140.20ns/pF
5
Data-to-Pad HIGH 4.95.56.27.310.3ns
Data-to-Pad LOW 3.43.84.35.17.1ns
Enable Pad Z to HIGH3.74.14.75.57.7ns
Enable Pad Z to LOW4.14.65.26.18.5ns
Enable Pad HIGH to Z7.48.29.310.915.3ns
Enable Pad LOW to Z6.97.68.710.214.3ns
G-to-Pad HIGH7.07.88.910.414.6ns
G-to-Pad LOW7.07.88.910.414.6ns
I/O Latch Set-Up0.70.70.81.01.4ns
I/O Latch Hold0.00.00.00.00.0ns
I/O Latch Clock-to-Out (Pad-to-
7.98.810.011.816.5ns
Pad) 32 I/O
Notes:
1. For dual-module macros, use t
PD1
+ t
RD1
+ t
PDn
, tCO + t
RD1
+ t
PDn
, or t
PD1
+ t
RD1
+ t
, whichever is appropriate.
SUD
2. Routing delays are for typical designs across worst-case operating conditions. These parameters should be used for estimating
device performance. Post-route timing analysis or simulation is required to determine actual performance.
3. Data applies to macros based on the S-module. Timing parameters for sequential macros constructed from C-modules can be
obtained from the Timer utility.
4. Set-up and hold timing parameters for the Input Buffer Latch are defined with respect to the PAD and the D input. External setup/
hold timing parameters must account for delay from an external PAD signal to the G inputs. Delay from an external PAD signal to
the G input subtracts (adds) to the internal setup (hold) time.
5. Delays based on 35 pF loading.
1-76v6.0
Page 83
Pin Descriptions
40MX and 42MX FPGA Families
CLK/A/B, I/OGlobal Clock
Clock inputs for clock distribution networks. CLK is for
40MX while CLKA and CLKB are for 42MX devices. The
clock input is buffered prior to clocking the logic
modules. This pin can also be used as an I/O.
DCLK, I/ODiagnostic Clock
Clock input for diagnostic probe and device
programming. DCLK is active when the MODE pin is
HIGH. This pin functions as an I/O when the MODE pin is
LOW.
GNDGround
Input LOW supply voltage.
I/OInput/Output
Input, output, tristate or bi-directional buffer. Input and
output levels are compatible with standard TTL and
CMOS specifications. Unused I/Os pins are configured by
the Designer software as shown in Table 40.
Table 40 •Configuration of Unused I/Os
DeviceConfiguration
A40MX02, A40MX04Pulled LOW
A42MX09, A42MX16Pulled LOW
A42MX24, A42MX36Tristated
In all cases, it is recommended to tie all unused MX I/O
pins to LOW on the board. This applies to all dualpurpose pins when configured as I/Os as well.
LPLow Power Mode
Controls the low power mode of all 42MX devices. The
device is placed in the low power mode by connecting
the LP pin to logic HIGH. In low power mode, all I/Os are
tristated, all input buffers are turned OFF, and the core
of the device is turned OFF. To exit the low power mode,
the LP pin must be set LOW. The device enters the low
power mode 800ns after the LP pin is driven to a logic
HIGH. It will resume normal operation in 200µs after the
LP pin is driven to a logic LOW.
MODEMode
Controls the use of multifunction pins (DCLK, PRA, PRB,
SDI, TDO). The MODE pin is held HIGH to provide
verification capability. The MODE pin should be
terminated to GND through a 10kΩ resistor so that the
MODE pin can be pulled HIGH when required.
NCNo Connection
This pin is not connected to circuitry within the device.
These pins can be driven to any voltage or can be left
floating with no effect on the operation of the device.
PRA, I/O
PRB, I/OProbe A/B
The Probe pin is used to output data from any userdefined design node within the device. Each diagnostic
pin can be used in conjunction with the other probe pin
to allow real-time diagnostic output of any signal path
within the device. The Probe pin can be used as a userdefined I/O when verification has been completed. The
pin's probe capabilities can be permanently disabled to
protect programmed design confidentiality. The Probe
pin is accessible when the MODE pin is HIGH. This pin
functions as an I/O when the MODE pin is LOW.
QCLKA/B/C/D, I/O Quadrant Clock
Quadrant clock inputs for A42MX36 devices. When not
used as a register control signal, these pins can function
as user I/Os.
SDI, I/OSerial Data Input
Serial data input for diagnostic probe and device
programming. SDI is active when the MODE pin is HIGH.
This pin functions as an I/O when the MODE pin is LOW.
SDO, I/OSerial Data Output
Serial data output for diagnostic probe and device
programming. SDO is active when the MODE pin is HIGH.
This pin functions as an I/O when the MODE pin is LOW.
SDO is available for 42MX devices only.
When Silicon Explorer II is being used, SDO will act as an
output while the "checksum" command is run. It will
return to user I/O when "checksum" is complete.
TCK, I/O Test Clock
Clock signal to shift the Boundary Scan Test (BST) data
into the device. This pin functions as an I/O when
"Reserve JTAG" is not checked in the Designer Software.
BST pins are only available in A42MX24 and A42MX36
devices.
TDI, I/OTest Data In
Serial data input for BST instructions and data. Data is
shifted in on the rising edge of TCK. This pin functions as
an I/O when "Reserve JTAG" is not checked in the
Designer Software. BST pins are only available in
A42MX24 and A42MX36 devices.
TDO, I/OTest Data Out
Serial data output for BST instructions and test data. This
pin functions as an I/O when "Reserve JTAG" is not
checked in the Designer Software. BST pins are only
available in A42MX24 and A42MX36 devices.
v6.01-77
Page 84
40MX and 42MX FPGA Families
TMS, I/OTest Mode Select
The TMS pin controls the use of the IEEE 1149.1
Boundary Scan pins (TCK, TDI, TDO). In flexible mode
when the TMS pin is set LOW, the TCK, TDI and TDO pins
are boundary scan pins. Once the boundary scan pins are
in test mode, they will remain in that mode until the
internal boundary scan state machine reaches the "logic
reset" state. At this point, the boundary scan pins will be
released and will function as regular I/O pins. The "logic
reset" state is reached 5 TCK cycles after the TMS pin is
set HIGH. In dedicated test mode, TMS functions as
specified in the IEEE 1149.1 specifications. IEEE JTAG
specification recommends a 10kΩ pull-up resistor on the
pin. BST pins are only available in A42MX24 and
A42MX36 devices.
V
CC
Supply Voltage
Input supply voltage for 40MX devices
V
CCA
Supply Voltage
Supply voltage for array in 42MX devices
V
CCI
Supply Voltage
Supply voltage for I/Os in 42MX devices
WD, I/OWide Decode Output
When a wide decode module is used in a 42MX device
this pin can be used as a dedicated output from the wide
decode module. This direct connection eliminates
additional interconnect delays associated with regular
logic modules. To implement the direct I/O connection,
connect an output buffer of any type to the output of
the wide decode macro and place this output on one of
the reserved WD pins.
1-78v6.0
Page 85
Package Pin Assignments
44-Pin PLCC
Figure 2-1 • 44-Pin PLCC
1
44-Pin
PLCC
40MX and 42MX FPGA Families
44
44-pin PLCC
Pin NumberA40MX02 Function A40MX04 Function
1I/O I/O
2I/O I/O
3V
CC
V
CC
4I/O I/O
5I/O I/O
6I/O I/O
7I/O I/O
8I/O I/O
9I/O I/O
10GNDGND
11I/OI/O
12I/OI/O
13I/OI/O
14V
CC
V
CC
15I/OI/O
16V
CC
V
CC
17I/OI/O
18I/OI/O
19I/OI/O
20I/OI/O
21GNDGND
22I/OI/O
44-pin PLCC
Pin NumberA40MX02 Function A40MX04 Function
23I/OI/O
24I/OI/O
25V
CC
V
CC
26I/OI/O
27I/OI/O
28I/OI/O
29I/OI/O
30I/OI/O
31I/OI/O
32GNDGND
33CLK, I/OCLK, I/O
34MODEMODE
35V
CC
V
CC
36SDI, I/OSDI, I/O
37DCLK, I/ODCLK, I/O
38PRA, I/OPRA, I/O
39PRB, I/OPRB, I/O
40I/OI/O
41I/OI/O
42I/OI/O
43GNDGND
44I/OI/O
v6.02-1
Page 86
40MX and 42MX FPGA Families
68-Pin PLCC
Figure 2-2 • 68-Pin PLCC
1 68
68-Pin
PLCC
44-pin PLCC
Pin
Number
A40MX02
Function
A40MX04
Function
1I/OI/O
2I/OI/O
3I/OI/O
4V
CC
V
CC
5I/OI/O
6I/OI/O
7I/OI/O
8I/OI/O
9I/OI/O
10I/OI/O
11I/OI/O
12I/OI/O
13I/OI/O
14GNDGND
15GNDGND
16I/OI/O
17I/OI/O
18I/OI/O
44-pin PLCC
Pin
Number
A40MX02
Function
24I/OI/O
25V
CC
26I/OI/O
27I/OI/O
28I/OI/O
29I/OI/O
30I/OI/O
31I/OI/O
32GNDGND
33I/OI/O
34I/OI/O
35I/OI/O
36I/OI/O
37I/OI/O
38V
CC
39I/OI/O
40I/OI/O
41I/OI/O
A40MX04
Function
V
CC
V
CC
44-pin PLCC
Pin
Number
A40MX02
Function
A40MX04
Function
47I/OI/O
48I/OI/O
49GNDGND
50I/OI/O
51I/OI/O
52CLK, I/OCLK, I/O
53I/OI/O
54MODEMODE
55V
CC
56SDI, I/OSDI, I/O
57DCLK, I/ODCLK, I/O
58PRA, I/OPRA, I/O
59PRB, I/OPRB, I/O
60I/OI/O
61I/OI/O
62I/OI/O
63I/OI/O
64I/OI/O
V
CC
19I/OI/O
20I/OI/O
21V
CC
V
CC
22I/OI/O
23I/OI/O
2-2v6.0
42I/OI/O
43I/OI/O
44I/OI/O
45I/OI/O
46I/OI/O
65I/OI/O
66GNDGND
67I/OI/O
68I/OI/O
Page 87
84-Pin PLCC
40MX and 42MX FPGA Families
184
84-Pin
PLCC
Figure 2-3 • 84-Pin PLCC
v6.02-3
Page 88
40MX and 42MX FPGA Families
84-Pin PLCC
Pin
Number
A40MX04
Function
A42MX09
Function
A42MX16
Function
A42MX24
Function
1I/OI/OI/OI/O
2I/OCLKB, I/OCLKB, I/OCLKB, I/O
3I/OI/OI/OI/O
4V
CC
PRB, I/OPRB, I/OPRB, I/O
5I/OI/OI/OWD, I/O
6I/OGNDGNDGND
7I/OI/OI/OI/O
8I/OI/OI/OWD, I/O
9I/OI/OI/OWD, I/O
10I/ODCLK, I/ODCLK, I/ODCLK, I/O
11I/OI/OI/OI/O
12NCMODEMODEMODE
13I/OI/OI/OI/O
14I/OI/OI/OI/O
15I/OI/OI/OI/O
16I/OI/OI/OI/O
17I/OI/OI/OI/O
84-Pin PLCC
Pin
Number
A40MX04
Function
A42MX09
Function
A42MX16
Function
A42MX24
Function
36I/OI/OI/OWD, I/O
37I/OI/OI/OI/O
38I/OI/OI/OWD, I/O
39I/OI/OI/OWD, I/O
40GNDI/OI/OI/O
41I/OI/OI/OI/O
42I/OI/OI/OI/O
43I/OV
CCA
V
CCA
44I/OI/OI/OWD, I/O
45I/OI/OI/OWD, I/O
46V
CC
I/OI/OWD, I/O
47I/OI/OI/OWD, I/O
48I/OI/OI/OI/O
49I/OGNDGNDGND
50I/OI/OI/OWD, I/O
51I/OI/OI/OWD, I/O
52I/OSDO, I/OSDO, I/OSDO, TDO, I/O
V
CCA
18GNDI/OI/OI/O
19GNDI/OI/OI/O
20I/OI/OI/OI/O
21I/OI/OI/OI/O
22I/OV
23I/OV
CCA
CCI
V
V
CCI
CCA
V
V
CCI
CCA
24I/OI/OI/OI/O
25V
26V
CC
CC
I/OI/OI/O
I/OI/OI/O
27I/OI/OI/OI/O
28I/OGNDGNDGND
29I/OI/OI/OI/O
30I/OI/OI/OI/O
31I/OI/OI/OI/O
32I/OI/OI/OI/O
33V
CC
I/OI/OI/O
34I/OI/OI/OTMS, I/O
35I/OI/OI/OTDI, I/O
53I/OI/OI/OI/O
54I/OI/OI/OI/O
55I/OI/OI/OI/O
56I/OI/OI/OI/O
57I/OI/OI/OI/O
58I/OI/OI/OI/O
59I/OI/OI/OI/O
60GNDI/OI/OI/O
61GNDI/OI/OI/O
62I/OI/OI/OTCK, I/O
63I/OLPLPLP
64CLK, I/OV
65I/OV
CCA
CCI
V
CCA
V
CCI
V
V
CCA
CCI
66MODEI/OI/OI/O
67V
68V
CC
CC
I/OI/OI/O
I/OI/OI/O
69I/OI/OI/OI/O
70I/OGNDGNDGND
2-4v6.0
Page 89
40MX and 42MX FPGA Families
84-Pin PLCC
Pin
Number
A40MX04
Function
A42MX09
Function
A42MX16
Function
A42MX24
Function
71I/OI/OI/OI/O
72SDI, I/OI/OI/OI/O
73DCLK, I/OI/OI/OI/O
74PRA, I/OI/OI/OI/O
75PRB, I/OI/OI/OI/O
76I/OSDI, I/OSDI, I/OSDI, I/O
77I/OI/OI/OI/O
84-Pin PLCC
Pin
Number
A40MX04
Function
A42MX09
Function
A42MX16
Function
A42MX24
Function
78I/OI/OI/OWD, I/O
79I/OI/OI/OWD, I/O
80I/OI/OI/OWD, I/O
81I/OPRA, I/OPRA, I/OPRA, I/O
82GNDI/OI/OI/O
83I/OCLKA, I/OCLKA, I/OCLKA, I/O
84I/OV
CCA
V
CCA
V
CCA
v6.02-5
Page 90
40MX and 42MX FPGA Families
100-Pin PQFP Package
100
1
Figure 2-4 • 100-Pin PQFP Package (Top View)
100-Pin
PQFP
2-6v6.0
Page 91
40MX and 42MX FPGA Families
100-Pin PQFP
Pin
Number
A40MX02
Function
A40MX04
Function
A42MX09
Function
A42MX16
Function
1NCNCI/OI/O
2NCNCDCLK, I/ODCLK, I/O
3NCNCI/OI/O
4NCNCMODEMODE
5NCNCI/OI/O
6PRB, I/OPRB, I/OI/OI/O
7I/OI/OI/OI/O
8I/OI/OI/OI/O
9I/OI/OGNDGND
10I/OI/OI/OI/O
11I/OI/OI/OI/O
12I/OI/OI/OI/O
13GNDGNDI/OI/O
14I/OI/OI/OI/O
15I/OI/OI/OI/O
16I/OI/OV
17I/OI/OV
CCA
CCI
V
V
CCA
CCA
18I/OI/OI/OI/O
19V
CC
V
CC
I/OI/O
20I/OI/OI/OI/O
100-Pin PQFP
Pin
Number
A40MX02
Function
A40MX04
Function
A42MX09
Function
A42MX16
36GNDGNDI/OI/O
37GNDGNDI/OI/O
38I/OI/OI/OI/O
39I/OI/OI/OI/O
40I/OI/OV
CCA
41I/OI/OI/OI/O
42I/OI/OI/OI/O
43V
44V
CC
CC
V
CC
V
CC
I/OI/O
I/OI/O
45I/OI/OI/OI/O
46I/OI/OGNDGND
47I/OI/OI/OI/O
48NCI/OI/OI/O
49NCI/OI/OI/O
50NCI/OI/OI/O
51NCNCI/OI/O
52NCNCSDO, I/OSDO, I/O
53NCNCI/OI/O
54NCNCI/OI/O
55NCNCI/OI/O
Function
V
CCA
21I/OI/OI/OI/O
22I/OI/OGNDGND
23I/OI/OI/OI/O
24I/OI/OI/OI/O
25I/OI/OI/OI/O
26I/OI/OI/OI/O
27NCNCI/OI/O
28NCNCI/OI/O
29NCNCI/OI/O
30NCNCI/OI/O
31NCI/OI/OI/O
32NCI/OI/OI/O
33NCI/OI/OI/O
34I/OI/OGNDGND
35I/OI/OI/OI/O
56V
CC
V
CC
I/OI/O
57I/OI/OGNDGND
58I/OI/OI/OI/O
59I/OI/OI/OI/O
60I/OI/OI/OI/O
61I/OI/OI/OI/O
62I/OI/OI/OI/O
63GNDGNDI/OI/O
64I/OI/OLPLP
65I/OI/OV
66I/OI/OV
67I/OI/OV
CCA
CCI
CCA
V
V
V
CCA
CCI
CCA
68I/OI/OI/OI/O
69V
CC
V
CC
I/OI/O
70I/OI/OI/OI/O
v6.02-7
Page 92
40MX and 42MX FPGA Families
100-Pin PQFP
Pin
Number
A40MX02
Function
A40MX04
Function
A42MX09
Function
A42MX16
71I/OI/OI/OI/O
72I/OI/OGNDGND
73I/OI/OI/OI/O
74I/OI/OI/OI/O
75I/OI/OI/OI/O
76I/OI/OI/OI/O
77NCNCI/OI/O
78NCNCI/OI/O
79NCNCSDI, I/OSDI, I/O
80NCI/OI/OI/O
81NCI/OI/OI/O
82NCI/OI/OI/O
83I/OI/OI/OI/O
84I/OI/OGNDGND
85I/OI/OI/OI/O
Function
100-Pin PQFP
Pin
Number
A40MX02
Function
A40MX04
Function
A42MX09
Function
A42MX16
Function
86GNDGNDI/OI/O
87GNDGNDPRA, I/OPRA, I/O
88I/OI/OI/OI/O
89I/OI/OCLKA, I/OCLKA, I/O
90CLK, I/OCLK, I/OV
CCA
91I/OI/OI/OI/O
92MODEMODECLKB, I/OCLKB, I/O
93V
94V
CC
CC
V
CC
V
CC
I/OI/O
PRB, I/OPRB, I/O
95NCI/OI/OI/O
96NCI/OGNDGND
97NCI/OI/OI/O
98SDI, I/OSDI, I/OI/OI/O
99DCLK, I/ODCLK, I/OI/OI/O
100PRA, I/OPRA, I/OI/OI/O
V
CCA
2-8v6.0
Page 93
160-Pin PQFP Package
160
1
40MX and 42MX FPGA Families
Figure 2-5 • 160-Pin PQFP Package (Top View)
160-Pin
PQFP
v6.02-9
Page 94
40MX and 42MX FPGA Families
160-Pin PQFP
Pin Number
A42MX09
Function
A42MX16
Function
A42MX24
Function
1I/OI/OI/O
2DCLK, I/ODCLK, I/ODCLK, I/O
3NCI/OI/O
4I/OI/OWD, I/O
5I/OI/OWD, I/O
6NCV
CCI
V
CCI
7I/OI/OI/O
8I/OI/OI/O
9I/OI/OI/O
10NCI/OI/O
11GNDGNDGND
12NCI/OI/O
13I/OI/OWD, I/O
14I/OI/OWD, I/O
15I/OI/OI/O
16PRB, I/OPRB, I/OPRB, I/O
17I/OI/OI/O
160-Pin PQFP
Pin Number
A42MX09
Function
A42MX16
Function
36I/OI/OWD, I/O
37I/OI/OWD, I/O
38SDI, I/OSDI, I/OSDI, I/O
39I/OI/OI/O
40GNDGNDGND
41I/OI/OI/O
42I/OI/OI/O
43I/OI/OI/O
44GNDGNDGND
45I/OI/OI/O
46I/OI/OI/O
47I/OI/OI/O
48I/OI/OI/O
49GNDGNDGND
50I/OI/OI/O
51I/OI/OI/O
52NCI/OI/O
A42MX24
Function
18CLKB, I/OCLKB, I/OCLKB, I/O
19I/OI/OI/O
20V
CCA
V
CCA
V
CCA
21CLKA, I/OCLKA, I/OCLKA, I/O
22I/OI/OI/O
23PRA, I/OPRA, I/OPRA, I/O
24NCI/OWD, I/O
25I/OI/OWD, I/O
26I/OI/OI/O
27I/OI/OI/O
28NCI/OI/O
29I/OI/OWD, I/O
30GNDGNDGND
31NCI/OWD, I/O
32I/OI/OI/O
33I/OI/OI/O
34I/OI/OI/O
35NCV
CCI
V
CCI
53I/OI/OI/O
54NCV
CCA
V
CCA
55I/OI/OI/O
56I/OI/OI/O
57V
58V
CCA
CCI
V
V
CCA
CCI
V
V
CCA
CCI
59GNDGNDGND
60V
CCA
V
CCA
V
CCA
61LPLPLP
62I/OI/OTCK, I/O
63I/OI/OI/O
64GNDGNDGND
65I/OI/OI/O
66I/OI/OI/O
67I/OI/OI/O
68I/OI/OI/O
69GNDGNDGND
70NCI/OI/O
2-10v6.0
Page 95
40MX and 42MX FPGA Families
160-Pin PQFP
Pin Number
A42MX09
Function
A42MX16
Function
71I/OI/OI/O
72I/OI/OI/O
73I/OI/OI/O
74I/OI/OI/O
75NCI/OI/O
76I/OI/OI/O
77NCI/OI/O
78I/OI/OI/O
79NCI/OI/O
80GNDGNDGND
81I/OI/OI/O
82SDO, I/OSDO, I/OSDO, TDO, I/O
83I/OI/OWD, I/O
84I/OI/OWD, I/O
85I/OI/OI/O
86NCV
CCI
87I/OI/OI/O
A42MX24
Function
V
CCI
160-Pin PQFP
Pin Number
A42MX09
Function
A42MX16
Function
106I/OI/OWD, I/O
107I/OI/OWD, I/O
108I/OI/OI/O
109GNDGNDGND
110NCI/OI/O
111I/OI/OWD, I/O
112I/OI/OWD, I/O
113I/OI/OI/O
114NCV
CCI
115I/OI/OWD, I/O
116NCI/OWD, I/O
117I/OI/OI/O
118I/OI/OTDI, I/O
119I/OI/OTMS, I/O
120GNDGNDGND
121I/OI/OI/O
122I/OI/OI/O
A42MX24
Function
V
CCI
88I/OI/OWD, I/O
89GNDGNDGND
90NCI/OI/O
91I/OI/OI/O
92I/OI/OI/O
93I/OI/OI/O
94I/OI/OI/O
95I/OI/OI/O
96I/OI/OWD, I/O
97I/OI/OI/O
98V
CCA
V
CCA
V
CCA
99GNDGNDGND
100NCI/OI/O
101I/OI/OI/O
102I/OI/OI/O
103NCI/OI/O
104I/OI/OI/O
105I/OI/OI/O
123I/OI/OI/O
124NCI/OI/O
125GNDGNDGND
126I/OI/OI/O
127I/OI/OI/O
128I/OI/OI/O
129NCI/OI/O
130GNDGNDGND
131I/OI/OI/O
132I/OI/OI/O
133I/OI/OI/O
134I/OI/OI/O
135NCV
CCA
V
CCA
136I/OI/OI/O
137I/OI/OI/O
138NCV
139V
CCI
V
CCA
CCI
V
V
CCA
CCI
140GNDGNDGND
v6.02-11
Page 96
40MX and 42MX FPGA Families
160-Pin PQFP
Pin Number
A42MX09
Function
A42MX16
Function
141NCI/OI/O
142I/OI/OI/O
143I/OI/OI/O
144I/OI/OI/O
145GNDGNDGND
146NCI/OI/O
147I/OI/OI/O
148I/OI/OI/O
149I/OI/OI/O
150NCV
CCA
A42MX24
Function
V
CCA
160-Pin PQFP
Pin Number
A42MX09
Function
A42MX16
Function
151NCI/OI/O
152NCI/OI/O
153NCI/OI/O
154NCI/OI/O
155GNDGNDGND
156I/OI/OI/O
157I/OI/OI/O
158I/OI/OI/O
159MODEMODEMODE
160GNDGNDGND
A42MX24
Function
2-12v6.0
Page 97
208-Pin PQFP Package
208
1
40MX and 42MX FPGA Families
Figure 2-6 • 208-Pin PQFP Package (Top View)
208-Pin PQFP
v6.02-13
Page 98
40MX and 42MX FPGA Families
208-Pin PQFP
Pin Number
A42MX16
Function
A42MX24
Function
A42MX36
Function
1GNDGNDGND
2NCV
CCA
V
CCA
3MODEMODEMODE
4I/OI/OI/O
5I/OI/OI/O
6I/OI/OI/O
7I/OI/OI/O
8I/OI/OI/O
9NCI/OI/O
10NCI/OI/O
11NCI/OI/O
12I/OI/OI/O
13I/OI/OI/O
14I/OI/OI/O
15I/OI/OI/O
16NCI/OI/O
17V
CCA
V
CCA
V
CCA
18I/OI/OI/O
19I/OI/OI/O
20I/OI/OI/O
208-Pin PQFP
Pin Number
A42MX16
Function
A42MX24
Function
36I/OI/OI/O
37I/OI/OI/O
38I/OI/OI/O
39I/OI/OI/O
40I/OI/OI/O
41NCI/OI/O
42NCI/OI/O
43NCI/OI/O
44I/OI/OI/O
45I/OI/OI/O
46I/OI/OI/O
47I/OI/OI/O
48I/OI/OI/O
49I/OI/OI/O
50NCI/OI/O
51NCI/OI/O
52GNDGNDGND
53GNDGNDGND
54 I/OTMS, I/OTMS, I/O
55 I/OTDI, I/OTDI, I/O
A42MX36
Function
21I/OI/OI/O
22GNDGNDGND
23I/OI/OI/O
24I/OI/OI/O
25I/OI/OI/O
26I/OI/OI/O
27GNDGNDGND
28V
29V
CCI
CCA
V
V
CCI
CCA
V
V
CCI
CCA
30I/OI/OI/O
31I/OI/OI/O
32V
CCA
V
CCA
V
CCA
33I/OI/OI/O
34I/OI/OI/O
35I/OI/OI/O
56I/OI/OI/O
57I/O WD, I/OWD, I/O
58I/O WD, I/OWD, I/O
59I/OI/OI/O
60V
CCI
V
CCI
V
CCI
61NCI/OI/O
62NCI/OI/O
63I/OI/OI/O
64I/OI/OI/O
65I/OI/OQCLKA, I/O
66I/O WD, I/OWD, I/O
67NCWD, I/OWD, I/O
68NCI/OI/O
69I/OI/OI/O
70I/O WD, I/OWD, I/O
2-14v6.0
Page 99
40MX and 42MX FPGA Families
208-Pin PQFP
Pin Number
A42MX16
Function
A42MX24
Function
71I/O WD, I/OWD, I/O
72I/OI/OI/O
73I/OI/OI/O
74I/OI/OI/O
75I/OI/OI/O
76I/OI/OI/O
77I/OI/OI/O
78GNDGNDGND
79V
CCA
80NCV
V
CCA
CCI
81I/OI/OI/O
82I/OI/OI/O
83I/OI/OI/O
84I/OI/OI/O
85I/O WD, I/OWD, I/O
86I/O WD, I/OWD, I/O
87I/OI/OI/O
A42MX36
Function
V
CCA
V
CCI
208-Pin PQFP
A42MX16
Pin Number
Function
106NCV
A42MX24
Function
CCA
107I/OI/OI/O
108I/OI/OI/O
109I/OI/OI/O
110I/OI/OI/O
111I/OI/OI/O
112NCI/OI/O
113NCI/OI/O
114NCI/OI/O
115NCI/OI/O
116I/OI/OI/O
117I/OI/OI/O
118I/OI/OI/O
119I/OI/OI/O
120I/OI/OI/O
121I/OI/OI/O
122I/OI/OI/O
A42MX36
Function
V
CCA
88I/OI/OI/O
89NCI/OI/O
90NCI/OI/O
91I/OI/OQCLKB, I/O
92I/OI/OI/O
93I/O WD, I/OWD, I/O
94I/O WD, I/OWD, I/O
95NCI/OI/O
96NCI/OI/O
97NCI/OI/O
98V
CCI
V
CCI
V
CCI
99I/OI/OI/O
100I/OWD, I/OWD, I/O
101I/OWD, I/OWD, I/O
102I/OI/OI/O
103SDO, I/OSDO, TDO, I/O SDO, TDO, I/O
104I/OI/OI/O
105GNDGNDGND
123I/OI/OI/O
124I/OI/OI/O
125I/OI/OI/O
126GNDGNDGND
127I/OI/OI/O
128I/OTCK, I/OTCK, I/O
129LPLPLP
130V
CCA
V
CCA
V
CCA
131GNDGNDGND
132V
133V
CCI
CCA
V
V
CCI
CCA
V
V
CCI
CCA
134I/OI/OI/O
135I/OI/OI/O
136V
CCA
V
CCA
V
CCA
137I/OI/OI/O
138I/OI/OI/O
139I/OI/OI/O
140I/OI/OI/O
v6.02-15
Page 100
40MX and 42MX FPGA Families
208-Pin PQFP
Pin Number
A42MX16
Function
A42MX24
Function
141NCI/OI/O
142I/OI/OI/O
143I/OI/OI/O
144I/OI/OI/O
145I/OI/OI/O
146NCI/OI/O
147NCI/OI/O
148NCI/OI/O
149NCI/OI/O
150GNDGNDGND
151I/OI/OI/O
152I/OI/OI/O
153I/OI/OI/O
154I/OI/OI/O
155I/OI/OI/O
156I/OI/OI/O
157GNDGNDGND
A42MX36
Function
208-Pin PQFP
Pin Number
A42MX16
Function
A42MX24
Function
175I/OI/OI/O
176I/O WD, I/OWD, I/O
177I/O WD, I/OWD, I/O
178PRA, I/OPRA, I/OPRA, I/O
179I/OI/OI/O
180CLKA, I/OCLKA, I/OCLKA, I/O
181NCI/OI/O
182NCV
183V
CCA
V
CCI
CCA
184GNDGNDGND
185I/OI/OI/O
186CLKB, I/OCLKB, I/OCLKB, I/O
187I/OI/OI/O
188PRB, I/OPRB, I/OPRB, I/O
189I/OI/OI/O
190I/O WD, I/OWD, I/O
191I/O WD, I/OWD, I/O
A42MX36
Function
V
CCI
V
CCA
158I/OI/OI/O
159SDI, I/OSDI, I/OSDI, I/O
160I/OI/OI/O
161I/O WD, I/OWD, I/O
162I/O WD, I/OWD, I/O
163I/OI/OI/O
164V
CCI
V
CCI
V
CCI
165NCI/OI/O
166NCI/OI/O
167I/OI/OI/O
168I/O WD, I/OWD, I/O
169I/O WD, I/OWD, I/O
170I/OI/OI/O
171NCI/OQCLKD, I/O
172I/OI/OI/O
173I/OI/OI/O
174I/OI/OI/O
192I/OI/OI/O
193NCI/OI/O
194NCWD, I/OWD, I/O
195NCWD, I/OWD, I/O
196I/OI/OQCLKC, I/O
197NCI/OI/O
198I/OI/OI/O
199I/OI/OI/O
200I/OI/OI/O
201NCI/OI/O
202V
CCI
V
CCI
V
CCI
203I/O WD, I/OWD, I/O
204I/O WD, I/OWD, I/O
205I/OI/OI/O
206I/OI/OI/O
207DCLK, I/ODCLK, I/ODCLK, I/O
208I/OI/OI/O
2-16v6.0
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