Datasheet A29L400A Datasheet (AMIC)

Page 1
A29L400A Series
512K X 8 Bit / 256K X 16 Bit CMOS 3.0 Volt-only,
Preliminary Boot Sector Flash Memory
Document Title 512K X 8 Bit / 256K X 16 Bit CMOS 3.0 Volt-only, Boot Sector Flash Memory
Revision History
Rev. No.
History Issue Date Remark
0.0 Initial issue July 24, 2005 Preliminary
PRELIMINARY (July, 2005, Version 0.0)
AMIC Technology, Corp.
Page 2
A29L400A Series
512K X 8 Bit / 256K X 16 Bit CMOS 3.0 Volt-only,
Preliminary Boot Sector Flash Memory
Features
Single power supply operation
- Full voltage range: 2.7 to 3.6 volt read and write operations for battery-powered applications
- Regulated voltage range: 3.0 to 3.6 volt read and write operations for compatibility with high performance 3.3 volt microprocessors
Access times:
- 70/90 (max.)
Current:
- 4 mA typical active read current
- 20 mA typical program/erase current
- 200 nA typical CMOS standby
- 200 nA Automatic Sleep Mode current
Flexible sector architecture
- 16 Kbyte/ 8 KbyteX2/ 32 Kbyte/ 64 KbyteX7 sectors
- 8 Kword/ 4 KwordX2/ 16 Kword/ 32 KwordX7 sectors
- Any combination of sectors can be erased
- Supports full chip erase
- Sector protection:
A hardware method of protecting sectors to prevent any inadvertent program or erase operations within that sector. Temporary Sector Unprotect feature allows code changes in previously locked sectors
Extended operating temperature range: -40°C ~ +85°C
for –U series
Unlock Bypass Program Command
- Reduces overall programming time when issuing multiple program command sequence
Top or bottom boot block configurations available
Embedded Algorithms
- Embedded Erase algorithm will automatically erase the entire chip or any combination of designated sectors and verify the erased sectors
- Embedded Program algorithm automatically writes and verifies data at specified addresses
Typical 100,000 program/erase cycles per sector 20-year data retention at 125°C
- Reliable operation for the life of the system
Compatible with JEDEC-standards
- Pinout and software compatible with single-power­supply Flash memory standard
- Superior inadvertent write protection
Ready /
- Provides a hard ware method of detecting completion of
Erase Suspend/Erase Resume
Hardware reset pin (
Package options
Polling and toggle bits
Data
- Provides a software method of detecting completion of program or erase operations
pin (RY / BY)
BUSY
program or erase operations
- Suspends a sector erase operation to read data from,
or program data to, a non-erasing sector, then resumes the erase operation
RESET
- Hard ware method to reset the device to reading array data
- 44-pin SOP or 48-pin TSOP (I) or 48-ball TFBGA
)
PRELIMINARY (July, 2005, Version 0.0) 1
AMIC Technology, Corp.
Page 3
A29L400A Series
General Description
The A29L400A is an 4Mbit, 3.0 volt-only Flash memory organized as 524,288 bytes of 8 bits or 262,144 words of 16 bits each. The 8 bits of data appear on I/O0 - I/O7; the 16 bits of data appear on I/O
0~I/O15. The A29L400A is offered in 48-
ball TFBGA, 44-pin SOP and 48-Pin TSOP packages. This device is designed to be programmed in-system with the standard system 3.0 volt VCC supply. Additional 12.0 volt VPP is not required for in-system write or erase operations. However, the A29L400A can also be programmed in standard EPROM programmers. The A29L400A has the first toggle bit, I/O
6, which indicates
whether an Embedded Program or Erase is in progress, or it is in the Erase Suspend. Besides the I/O6 toggle bit, the A29L400A has a second toggle bit, I/O
2, to indicate whether
the addressed sector is being selected for erase. The A29L400A also offers the ability to program in the Erase Suspend mode. The standard A29L400A offers access times of 70 and 90ns, allowing high-speed microprocessors to operate without wait states. To eliminate bus contention the
device has separate chip enable ( and output enable (
) controls.
OE
), write enable (WE)
CE
The device requires only a single 3.0 volt power supply for both read and write functions. Internally generated and regulated voltages are provided for the program and erase operations. The A29L400A is entirely software command set compatibl e with the JEDEC single-power-supply Flash standard. Commands are written to the command register using standard microprocessor write timings. Register contents serve as input to an internal state-machine that controls the erase and programming circuitry. Write cycles also internally latch addresses and data needed for the programming and erase operations. Reading data out of the device is simila r to reading from other Flash or EPROM devices.
Device programming occurs by writing the proper program command sequence. This initiates the Embedded Program algorithm - an internal algorithm that automatically times the program pulse widths and verifies proper program margin.
Device erasure occurs by executing the proper erase command sequence. This initiates the Embedded Erase algorithm - an internal algorithm that automatically preprograms the array (if it is not already programmed) before executing the erase operation. During erase, the device automatically times the erase pulse widths and verifies proper erase margin. The Unlock Bypass mode facilitates faster programming times by requiring only two write cycles to program data instead of four.
The host system can detect whether a program or erase operation is complete by observing the RY / reading the I/O7 (
Polling) and I/O6 (toggle) status bits.
Data
pin, or by
BY
After a program or erase cycle has been completed, the device is ready to read array data or accept another command. The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The A29L400A is fully erased when shipp ed from the factory. The hardware sector protection feature disables operations for both program and erase in any combination of the sectors of memory. This can be achieved via programming equipment.
The Erase Suspend/Erase Resume feature enables the user to put erase on hold for any period of time to read data from, or program data to, any other sector that is not selected for erasure. True background erase can thus be achieved.
The hardware
RESET
pin terminates any operation in progress and resets the internal state machine to reading array data. The
RESET
pin may be tied to the system reset circuitry. A system reset would thus also reset the device, enabling the system microprocessor to read the boot-up
firmware from the Flash memory. The device offers two power-saving features. When addresses have been stable for a specified amount of time, the device enters the automatic sleep mode. T he system can also place the device into the standby mode. Power consumption is greatly reduced in both these modes.
PRELIMINARY (July, 2005, Version 0.0) 2
AMIC Technology, Corp.
Page 4
A29L400A Series
Pin Configurations
SOP TSOP (I)
NC
RY/BY
A17
VSS
I/O
I/O I/O9 I/O2
I/O10
I/O3
I/O11
A7 A6 A5 A4 A3 A2 A1 A0 CE
OE
0
1
1 2
3 4 5 6 7 8 9 10 11 12
A29L400A
13 14 15 16 29 17 18 19 20 21
22
RESET
44 43
WE A8
42
A9
41
A10
40
A11
39
A12
38
A13
37
A14
36
A15
35 34
A16
33
BYTE
32
VSS
31
I/O15 (A-1)
30
I/O7 I/O14I/O8
28
I/O6 I/O13
27 26
I/O5 I/O12
25 24
I/O4
VCC
23
1
A14
2
A13
3
A12
4
A11
5
A10
6
A9
7
A8
8 9
NC
NC
10 11
WE
RESET
RY/BY
12
NC
13
NC
14 15
NC
16
A17
17
A7
18
A6
19
A5
20
A4
21
A3
22
A2
23
A1
24 25
TFBGA
TFBGA
Top View, Balls Facing Down
A29L400AV
48
A16A15
47
BYTE
46
VSS
45
I/O15(A-1)
44
I/O7
43
I/O14
42
I/O6
41
I/O13
40
I/O5
39
I/O12
38
I/O
37
VCC
36
I/O11
35
I/O3
34
I/O10
33 I/O
32 I/O9 31
I/O1
30
I/O8
29
I/O0
28
OE
27
VSS
26
CE A0
4
2
A6 B6 C6 D6 E6 F6
G6
H6
A13 A12 A14 A15 A16 BYTE I/O15(A-1) VSS
A5 B5 C5 D5 E5 F5
A9 A8 A10 A11 I/O
7 I/O14 I/O13 I/O6
A4 B4 C4 D4 E4 F4
G5
G4
H5
H4
WE RESET NC NC I/O5 I/O12 VCC I/O4
A3 B3 C3 D3 E3 F3
G3
H3
RY/BY NC NC NC I/O2 I/O10 I/O11 I/O3
A2 B2 C2 D2 E2 F2
G2
H2
A7 A17 A6 A5 I/O0 I/O8 I/O9 I/O1
A1 B1 C1 D1 E1 F1
G1
H1
A3 A4 A2 A1 A0 CE OE VSS
PRELIMINARY (July, 2005, Version 0.0) 3 AMIC Technology, Corp.
Page 5
A29L400A Series
Block Diagram
VCC
VSS
RESET
BYTE
A0-A17
WE
CE OE
RY/BY
State
Control
Command
Register
VCC Detector
PGM Voltage
Generator
Timer
Sector Switches
Erase Voltage
Generator
STB
Chip Enable
Output Enable
Logic
Y-Decoder
X-decoder
Address Latch
STB
0
- I/O
I/O
Input/Output
15
Buffers
Data Latch
Y-Gating
Cell Matrix
(A-1)
Pin Descriptions
A0 - A17 Address Inputs
I/O0 - I/O14 Data Inputs/Outputs
I/O15 (A-1)
RESET
Pin No. Description
I/O15
Data Input/Output, Word Mode
A-1 LSB Address Input, Byte Mode
CE
WE
OE
BYTE
RY/BY
Chip Enable Write Enable Output Enable Hardware Reset Selects Byte Mode or Word Mode
Ready/
BUSY
- Output
VSS Ground VCC Power Supply
NC Pin not connected internally
PRELIMINARY (July, 2005, Version 0.0) 4 AMIC Technology, Corp.
Page 6
A29L400A Series
Absolute Maximum Ratings*
Storage Temperature Plastic Packages. . . .-65°C to + 150°C
Ambient Temperature with Power Applied.. -55°C to + 125°C Voltage with Respect to Ground
VCC (Note 1) . . . . . . . . . . . . . . . . . . . . . ……. -0.5V to +4.0V
A9,
OE
&
RESET
(Note 2) . . . . . . . . . . . ….. -0.5 to +12.5V
All other pins (Note 1) . . . . . . . . . . . . …-0.5V to VCC + 0.5V
Output Short Circuit Current (Note 3) . . …. . . . . . . 200mA
Notes:
1. Minimum DC voltage on input or I/O pins is -0.5V. During
voltage transitions, input or I/O pins may undershoot VSS to -2.0V for periods of up to 20ns. Maximum DC voltage on input and I/O pins is VCC +0.5V. During voltage transitions, input or I/O pins may overshoot to VCC +2.0V for periods up to 20ns.
2. Minimum DC input voltage on A9,
0.5V. During voltage transitions, A9,
OE
and
OE
RESET
and
is -
RESET
may overshoot VSS to -2.0V for periods of up to 20ns. Maximum DC input voltage on A9 is +12.5V which may overshoot to 14.0V for periods up to 20ns.
3. No more than one output is shorted at a time. Duration of
the short circuit should not be greater than one second.
Device Bus Operations
This section describes the requirements and use of the device bus operations, which are initiated through the internal command register. The command register itself does not occupy any addressable memory location. The register is composed of latches that store the commands, along with the address and data information needed to execute the
*Comments
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to this device. These are stress ratings only. Functional operation of this device at these or any other conditions above those indicated in the operational sections of these specification is not implied or intended. Exposure to the absolute maximum rating conditions for extended periods may affect device reliability.
Operating Ranges
Commercial (C) Devices
Ambient Temperature (T
A) . . . . . . . . . . . . . . . . 0°C to +70°C
Extended Range Devices
Ambient Temperature (T
A) . . . . . . . . . . . . . . . -40°C to +85°C
VCC Supply Voltages
VCC for all devices . . . . . . . . . . . . . . .. . . . . . +2.7V to +3.6V
Operating ranges define those limits between which the functionally of the device is guaranteed.
command. The contents of the register serve as inputs to the internal state machine. The state machine outputs dictate the function of the device. The appropriate device bus operations table lists the inputs and control levels required, and the resulting output. The following subsections describe each of these operations in further detail.
Table 1. A29L400A Device Bus Operations
CE
OE
WE
RESET
A0 – A17
(Note 1)
I/O0 - I/O7
BYTE
Read L L H H AIN DOUT DOUT I/O8~I/O4=High-Z
Write L H L H AIN DIN DIN High-Z CMOS Standby
VCC ± 0.3 V
X X
VCC ± 0.3 V
X High-Z High-Z High-Z Output Disable L H H H X High-Z High-Z High-Z Hardware Reset X X X L X High-Z High-Z High-Z Sector Protect
(See Note 2) Sector Unprotect
(See Note 2) Temporary Sector
L H L V
L H L V
X X X V
ID
ID
ID AIN DIN DIN X
Sector Address,
A6=L, A1=H, A0=L
Sector Address,
A6=H, A1=H, A0=L
D
IN X X
D
IN X X
Unprotect
Legend: L = Logic Low = V
IL, H = Logic High = VIH, VID = 12.0 ± 0.5V, X = Don't Care, DIN = Data In, D OUT = Data Out, AIN = Address In
Notes:
1. Addresses are A17:A0 in word mode (
BYTE
=VIH), A17: A
in byte mode (
-1
BYTE
=VIL).
2. See the “Sector Protection/Unprotection” section and Temporary Sector Unprotect for more information.
I/O8 - I/O15 Operation
=VIH
BYTE
I/O
15=A-1
=VIL
PRELIMINARY (July, 2005, Version 0.0) 5 AMIC Technology, Corp.
Page 7
A29L400A Series
Word/Byte Configuration
I
CC2 in the DC Characteristics table represents the active
current specification for the write mode. The "AC
The operate in the byte or word configuration. If the
set at logic ”1”, the device is in word configuration, I/O are active and controlled by
pin determines whether the I/O pins I/O15-I/O0
BYTE
and OE.
CE
BYTE
pin is
15-I/O0
Characteristics" section contains timing specification tables and timing diagrams for write operations.
Program and Erase Operation Status
During an erase or program operation, the system may If the configuration, and only I/O
and OE. I/O8-I/O14 are tri-stated, and I/O15 pin is used
CE
pin is set at logic “0”, the device is in byte
BYTE
0-I/O7 are active and controlled by
as an input for the LSB(A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the system must drive the selects the device.
data to the output pins. during read operation. The
and OE pins to VIL. CE is the power control and
CE
is the output control and gates array
OE
should remain at VIH all the time
WE
pin determines whether
BYTE
the device outputs array data in words and bytes. The internal state machine is set for reading array data upon device power-up, or after a hardware reset. This ensures that no spurious alteration of the memory content occurs during the power transition. No command is necessary in this mode to obtain array data. Standard microprocessor read cycles that assert valid addresses on the device address inputs produce valid data on the device data outputs. The device remains enabled for read access until the command register contents are altered. See "Reading Array Data" for more information. Refer to the AC Read Operations table for timing specifications and to the Read Operations Timings diagram for the timing waveforms,
CC1 in the DC Characteristics table represents the active
l current specification for reading array data.
Writing Commands/Command Sequences
To write a command or command sequence (which include s programming data to the device and erasing sectors of
memory), the system must drive
to VIH. For program operations, the
OE
determines whether the device accepts program data in bytes or words, Refer to “Word/Byte Configuration” for more information. The device features an Unlock Bypass mode to facilitate faster programming. Once the device enters the Unlock Bypass mode, only two write cycles are required to program a word or byte, instead of four. The “ Word / Byte Program Command Sequence” section has details on programming data to the device using both standard and Unlock Bypass command sequence. An erase operation can erase one sector, multiple sectors, or the entire device. The Sector Address Tables indicate the address range that each sector occupies. A "sector address" consists of the address inputs required to uniquely select a sector. See the "Command Definitions" section for details on erasing a sector or the entire chip, or suspending/resuming the erase operation. After the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the internal register (which is separate from the memory array) on I/O read cycle timings apply in this mode. Refer to the "Autoselect Mode" and "Autoselect Command Sequence" sections for more information.
and CE to VIL, and
WE
BYTE
7 - I/O0. Standard
pin
check the status of the operation by reading the status bits
on I/O7 - I/O0. Standard read cycle timings and ICC read
specifications apply. Refer to "Write Operation Status" for
more information, and to each AC Characteristics section for
timing diagrams.
Standby Mode
When the system is not reading or writing to the device, it
can place the device in the standby mode. In this mode,
current consumption is greatly reduced, and the outputs are
placed in the high impedance state, independent of the
OE
input.
The device enters the CMOS standby mode when the CE &
RESET
more restricted voltage range than V
are held at V
pins are both held at VCC ± 0.3V. (Note that this is a
IH.) If
IH, but not within VCC ± 0.3V, the device will be
CE
and
RESET
in the standby mode, but the standby current will be greater.
The device requires the standard access time (tCE) before it
is ready to read data.
If the device is deselected during erasure or programming,
the device draws active current until the operation is
completed.
I
CC3 and ICC4 in the DC Characteristics tables represent the
standby current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device energy consumption. The device automatically enables this mode when addresses remain stable for tACC +30ns. T he automatic
sleep mode is independent of the
,WEand OE control
CE
signals. Standard address access timings provide new data when addresses are changed. While in sleep mode, output data is latched and always available to the system. ICC4 in the DC Characteristics table represents the automatic sleep mode current specification.
Output Disable Mode
When the OE input is at VIH, output from the device is
disabled. The output pins are placed in the high im pedance
state.
RESET
The
the device to reading array data. When the system drives the
RESET
immediately terminates any operation in progress, tristates
all data output pins, and ignores all read/write attempts for
the duration of the
internal state machine to reading array data. The operation
that was interrupted should be reinitiated once the device is
ready to accept another command sequence, to ensure data
integrity.
Current is reduced for the duration of the
When
: Hardware Reset Pin
RESET
pin provides a hardware method of resetting
pin low for at least a period of tRP, the device
pulse. The device also resets the
RESET
pulse.
RESET
RESET
is held at VSS ± 0.3V, the device draws
PRELIMINARY (July, 2005, Version 0.0) 6 AMIC Technology, Corp.
Page 8
A29L400A Series
CMOS standby current (ICC4 ). If within VSS ± 0.3V, the standby current will be greater. The
RESET
system reset would thus also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory.
If
RESET
the RY/ operation is complete, which requires a time t Embedded Algorithms). The system can thus monitor
pin may be tied to the system reset circuitry. A
is asserted during a program or erase operation,
pin remains a “0” (busy) until the internal reset
BY
RESET
is held at VIL but not
READY (during
RY/
complete. If
operation is not executing (RY/BY pin is “1”), the reset
operation is completed within a time of t
Embedded Algorithms). The system can read data t
the
Refer to the AC Characteristics tables for
parameters and diagram.
to determine whether the reset operation is
BY
is asserted when a program or erase
READY (not during
RESET
RESET
pin return to VIH.
Table 2. A29L400A Top Boot Block Sector Address Table
Sector Size
(Kbytes/Kwords)
SA0 0 0 0 X X X 64/32 00000h - 0FFFFh 00000h - 07FFFh SA1 0 0 1 X X X 64/32 10000h - 1FFFFh 08000h - 0FFFFh SA2 0 1 0 X X X 64/32 20000h - 2FFFFh 10000h - 17FFFh SA3 0 1 1 X X X 64/32 30000h - 3FFFFh 18000h - 1FFFFh SA4 1 0 0 X X X 64/32 40000h - 4FFFFh 20000h - 27FFFh SA5 1 0 1 X X X 64/32 50000h - 5FFFFh 28000h - 2FFFFh SA6 1 1 0 X X X 64/32 60000h - 6FFFFh 30000h - 37FFFh SA7 1 1 1 0 X X 32/16 70000h - 77FFFh 38000h - 3BFFFh SA8 1 1 1 1 0 0 8/4 78000h - 79FFFh 3C000h - 3CFFFh SA9 1 1 1 1 0 1 8/4 7A000h - 7BFFFh 3D000h - 3DFFFh
SA10 1 1 1 1 1 X 16/8 7C000h - 7FFFFh 3E000h - 3FFFFh
Address Range (in hexadecimal) Sector A17 A16 A15 A14 A13 A12
(x8)
Address Range
(x16)
Address Range
RH after
RESET
Table 3. A29L400A Bottom Boot Block Sector Address Table
Sector Size
(Kbytes/Kwords)
Address Range
SA0 0 0 0 0 0 X 16/8 00000h - 03FFFh 00000h - 01FFFh SA1 0 0 0 0 1 0 8/4 04000h - 05FFFh 02000h - 02FFFh SA2 0 0 0 0 1 1 8/4 06000h - 07FFFh 03000h - 03FFFh SA3 0 0 0 1 X X 32/16 08000h - 0FFFFh 04000h - 07FFFh SA4 0 0 1 X X X 64/32 10000h - 1FFFFh 08000h - 0FFFFh SA5 0 1 0 X X X 64/32 20000h - 2FFFFh 10000h - 17FFFh SA6 0 1 1 X X X 64/32 30000h - 3FFFFh 18000h - 1FFFFh SA7 1 0 0 X X X 64/32 40000h - 4FFFFh 20000h - 27FFFh SA8 1 0 1 X X X 64/32 50000h - 5FFFFh 28000h - 2FFFFh SA9 1 1 0 X X X 64/32 60000h - 6FFFFh 30000h - 37FFFh
SA10 1 1 1 X X X 64/32 70000h - 7FFFFh 38000h - 3FFFFh
(x8)
Address Range Sector A17 A16 A15 A14 A13 A12
(x16)
Address Range
PRELIMINARY (July, 2005, Version 0.0) 7 AMIC Technology, Corp.
Page 9
A29L400A Series
Autoselect Mode
The autoselect mode provides manufacturer and device identification, and sector protection verification, through identifier codes output on I/O7 - I/O0. This mode is primarily intended for programming equipment to automatically match a device to be programmed with its corresponding programming algorithm. However, the autoselect codes can also be accessed in-system through the command register. When using programming equipment, the autoselect mode requires V
ID (11.5V to 12.5 V) on address pin A9. Address
pins A6, A1, and A0 must be as shown in Autoselect Co de s ( Hig h V ol ta ge M et ho d) ta ble . I n addition, when
verifying sector protection, the sector address must appear on the appropriate highest order address bits. Refer to the corresponding Sector Address Tables. The Command Definitions table shows the remaining address bits that are don't care. When all necessary bits have been set as required, the programming equipment may then read the corresponding identifier code on I/O
7 - I/O0.To access the
autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in the Command Definitions table. This method does not require VID. See "Command Definitions" for details on using the autoselect mode.
Table 4. A29L400A Autoselect Codes (High Voltage Method)
Description Mode
CE
OE
I/O
8
to
15
A17
A11
WE
to
A12
A9 A8
to
A10
to
A7
A6 A5
to
A2
A1 A0 I/O
I/O
to
I/O
7
0
Manufacturer ID: AMIC L L H X X VID X L X L L X 37h
Word B3h 34h Device ID: A29L400A (Top Boot Block)
Byte
L L H X X V
ID XLXL H
X 34h
Word B3h B5h Device ID: A29L400A (Bottom Boot
Byte
L L H X X V
ID XLXL H
X B5h
Block) Continuation ID L L H X X VID XLXHH X 7Fh
01h
(protected)
00h
(unprotected)
Sector Protection Verification
X
L L H SA X VID XLXHL
X
L=Logic Low= VIL, H=Logic High=VIH, SA=Sector Address, X=Don’t Care. Note: The autoselect codes may also be accessed in-system via command sequences.
PRELIMINARY (July, 2005, Version 0.0) 8 AMIC Technology, Corp.
Page 10
A29L400A Series
Sector Protection/Unprotection
The hardware sector protection feature disables both program and erase operations in any sector. The hardware sector unprotection feature re-enables both program and erase operations in previously protected sectors. It is possible to determine whether a sector is protected or unprotected. See “Autoselect Mode” for details. Sector protection / unprotection can be implemented via two methods. The primary method requires VID on the
RESET
pin only, and can be implemented either in-system or via programming equipment. Figure 2 shows the algorithm and the Sector Protect / Unprotect Timing Diagram illustrates the timing waveforms for this feature. This method uses standard microprocessor bus cycle timing. For sector unprotect, all unprotected sectors must first be protected prior to the first sector unprotect write cycle. The alternate method must be implemented using programming equipment. The procedure requires a high voltage (V
ID) on
address pin A9 and the control pins. The device is shipped with all sectors unprotected. It is possible to determine whether a sector is protected or unprotected. See "Autoselect Mode" for details.
Hardware Data Protection
The requirement of command unlocking sequence for programming or erasing provides data protection against inadvertent writes (refer to the Command Definitions table). In addition, the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by spurious system level signals during VCC power-up transitions, or from system noise. The device is powered up to read array data to avoid accidentally writing data to the array.
Temporary Sector Unprotect
This feature allows temporary unprotection of previous protected sectors to change data in-system. The Sector
Unprotect mode is activated by setting the
RESET
During this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses.
Once V
ID is removed from the
RESET
pin, all the previously protected sectors are protected again. Figure 1 shows the algorithm, and the Temporary Sector Unprotect diagram
shows the timing waveforms, for this feature.
START
RESET = VID
(Note 1)
Perform Erase or
Program Operations
RESET = VIH
pin to VID.
Write Pulse "Glitch" Protection
Noise pulses of less than 5ns (typical) on OE, CE or WE do not initiate a write cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of OE=VIL,
= VIH or WE = VIH. To initiate a write cycle, CE and
CE
must be a logical zero while OE is a logical one.
WE
Power-Up Write Inhibit
If
= CE = VIL and OE = VIH during power up, the
WE
device does not accept commands on the rising edge of
. The internal state machine is automatically reset to
WE
reading array data on the initial power-up.
Temporary Sector
Unprotect
Completed (N ote 2)
Notes:
1. All protected sectors unprotected.
2. All previously protected sectors are protected once again.
Figure 1. Temporary Sector Unprotect Operation
PRELIMINARY (July, 2005, Version 0.0) 9 AMIC Technology, Corp.
Page 11
A29L400A Series
Temporary Sector
Unprotect Mode
Increment
PLSCNT
START
PLSCNT=1
RESET=VID
Wait 1 us
No
First Write
Cycle=60h?
Set up sector
address
Sector Protect
Write 60h to sector
address with A6=0,
A1=1, A0=0
Wait 150 us
Verify Sector
Protect: Wr ite 40h
to sector address with A6=0, A1=1,
A0=0
Read from
sector address
with A6=0,
A1=1, A0=0
Yes
Reset
PLSCNT=1
Protect all sectors:
The indicated portion of
the sector protect
algorithm must be
performed for all
unprotected sectors prior
to issuing the first sector
unprotect address
Increment
PLSCNT
START
PLSCNT=1
RESET=VID
Wait 1 us
No
First Write
Cycle=60h?
All sectors protected?
Set up first sector
address
Sector Unprotect: Write 60h to sector address with A6=1,
A1=1, A0=0
Wait 500 ms
Verify Sector
Unprotect : Write
40h to sector
address with A6=1,
A1=1, A0=0
Yes
Yes
No
Temporary Sector
Unprotect Mode
No
PLSCNT
=25?
Yes
Device failed
Sector Protect
Algorithm
No
Data=01h?
No
Yes
Protect another
sector?
No
Remove VID
from RESET
Write reset
command
Sector Protect
complete
Yes
PLSCNT=
1000?
Yes
Device failed
Sector Unprotect
Algorithm
Figure 2. In-System Sector Protect/Unprotect Algorithms
Read from sector address with A6=1,
A1=1, A0=0
No
Data=00h?
Last sector
verified?
Remove VID from RESET
Write reset Command
Sector Unprotect
complete
Set up
next sector
address
Yes
No
Yes
PRELIMINARY (July, 2005, Version 0.0) 10 AMIC Technology, Corp.
Page 12
A29L400A Series
Command Definitions
Writing specific address and data commands or sequences into the command register initiates device operations. The Command Definitions table defines the valid register command sequences. Writing incorrect address and data values or writing them in the improper sequence resets the device to reading array data.
All addresses are latched on the falling edge of whichever happens later. All data is latched on the rising
edge of appropriate timing diagrams in the "AC Characteristics" section.
or CE, whichever happens first. Refer to the
WE
WE
or CE,
Reading Array Data
The device is automatically set to reading array data after device power-up. No commands are required to retrieve data. The device is also ready to read array data after completing an Embedded Program or Embedded Erase algorithm. After the device accepts an Erase Suspend command, the device enters the Erase Suspend mode. The system can read array data using the standard read timings, except that if it reads at an address within erase-suspended sectors, the device outputs status data. After completing a programming operation in the Erase Suspend mode, the system may once again read array data with the same exception. See "Erase Suspend/Erase Resume Commands" for more information on this mode. The system must issue the reset command to re-enable the device for reading array data if I/O5 goes high, or while in the autoselect mode. See the "Reset Command" section, next. See also "Requirements for Reading Array Data" in the "Device Bus Operations" section for more information. The Read Operations table provides the read parameters, and Read Operation Timings diagram shows the timing diagram.
Reset Command
Writing the reset command to the device resets the device to reading array data. Address bits are don't care for this command. The reset command may be written between the sequence cycles in an erase command sequence before erasing begins. This resets the device to reading array data. Once erasure begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in a program command sequence before programming begins. This resets the device to reading array data (also applies to programming in Erase Suspend mode). Once programming begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in an autoselect command sequence. Once in the autoselect mode, the reset command must be written to return to reading array data (also applies to autoselect during Erase Suspend). If I/O5 goes high during a program or erase operation, writing the reset command returns the device to reading array data (also applies during Erase Suspend).
Autoselect Command Sequence
The autoselect command sequence allows the host system to access the manufacturer and devices codes, and determine whether or not a sector is protected. The Command Definitions table shows the address and data requirements. This method is an alternative to that shown in the Autoselect Codes (High Voltage Method) table, which is intended for PROM programmers and requires VID on address bit A9. The autoselect command sequence is initiated by writing two unlock cycles, followed by the autoselect command. The device then enters the autoselect mode, and the system may read at any address any number of times, without initiating another command sequence. A read cycle at address XX00h retrieves the manufacturer code and another read cycle at XX03h retrieves the continuation code. A read cycle at address XX01h returns the device code. A read cycle containing a sector address (SA) and the address 02h in returns 01h if that sector is protected, or 00h if it is unprotected. Refer to the Sector Address tables for valid sector addresses. The system must write the reset command to exit the autoselect mode and return to reading array data.
Word/Byte Program Command Sequence
The system may program the device by word or byte, depending on the state of the
four-bus-cycle operation. The program command sequence is initiated by writing two unlock write cycles, followed by the program set-up command. The program address and data are written next, which in turn initiate the Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically provides internally generated program pulses and verify the programmed cell margin. Table 5 shows the address and data requirements for the byte program command sequence. When the Embedded Program algorithm is complete, the device then returns to reading array data and addresses are longer latched. The system can determine the status of the
program operation by using I/O Operation Status” for information on these status bits. Any commands written to the device during the Embedded Program Algorithm are ignored. Note that a hardware reset immediately terminates the programming operation. T he Byte Program command sequence should be reinitiated once the device has reset to reading array data, to ensure data integrity. Programming is allowed in any sequence and across sector boundaries. A bit cannot be programmed from a “0” back to a “1”. Attempting to do so may halt the operation and set I/O5
to “1”, or cause the operation was successful. However, a succeeding read will show that the data is still “0”. Only erase operations can
convert a “0” to a “1”.
Polling algorithm to indicate the
Data
pin. Programming is a
BYTE
7, I/O6, or RY/
BY
. See “Write
PRELIMINARY (July, 2005, Version 0.0) 11 AMIC Technology, Corp.
Page 13
A29L400A Series
START
Write Program
Command
Sequence
Embedded
Program
algorithm in
progress
Data Poll
from System
Verify Data ?
No
Yes
Increment Address
Last Address ?
Yes
Programming
Completed
Note : See the appropriate Command Definitions table for program command sequence.
Figure 3. Program Operation
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to program bytes or words to the device faster than using the standard program command sequence. The unlock bypass command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle containing the unlock bypass command, 20h. The device then enters the unlock bypass mode. A two-cycle unlock bypass program command sequence is all that is required to program in this mode. The first cycle in this sequence contains the unlock bypass program command, A0h; the second cycle contains the program address and data. Additional data is programmed in the same manner. This mode dispenses with the initial two unlock cycles required in the standard program command sequence, resulting in faster total programming time. Table 5 shows the requirements for the command sequence. During the unlock bypass mode, only the Unlock Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system must issue the two­cycle unlock bypass reset command sequence. The first
cycle must contain the data 90h; the second cycle the data 00h. Addresses are don’t care for both cycle. The device returns to reading array data. Figure 3 illustrates the algorithm for the program operation. See the Erase/Program Operations in “AC Characteristics” for parameters, and to Program Operation Timings for timing diagrams.
Chip Erase Command Sequence
Chip erase is a six-bus-cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the chip erase command, which in turn invokes the Embedded Erase algorithm. The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. The Command Definitions table shows the address and data requirements for the chip erase command sequence. Any commands written to the chip during the Embedded Erase algorithm are ignored. The system can determine the status of the erase operation by using I/O7, I/O6, or I/O2. See "Write Operation Status" for information on these status bits. When the Embedded Erase algorithm is complete, the devic e returns to reading array data and addresses are no longer latched. Figure 4 illustrates the algorithm for the erase operation. See the Erase/Program Operations tables in "AC Characteristics" for parameters, and to the Chip/Sector Erase Operation Timings for timing waveforms.
Sector Erase Command Sequence
Sector erase is a six-bus-cycle operation. The sector erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the address of the sector to be erased, and the sector erase command. The Command Definitions table shows the address and data requirements for the sector erase command sequence. The device does not require the system to preprogram the memory prior to erase. The Embedded Erase algorithm automatically programs and verifies the sector for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. After the command sequence is written, a sector erase time­out of 50µs begins. During the time-out period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any sequence, and the number of sectors may be from one sector to all sectors. The time between these additional cycles must be less than 50µs, otherwise the last address and command might not be accepted, and erasure may begin. It is recommended that processor interrupts be disabled during this time to ensure all commands are accepted. The interrupts can be re-enabled after the last Sector Erase command is written. If the time between additional sector erase commands can be assumed to be less than 50µs, the system need not monitor I/O Sector Erase or Erase Suspend during the time-out period resets the device to reading array data. The system must
3. Any command other than
PRELIMINARY (July, 2005, Version 0.0) 12 AMIC Technology, Corp.
Page 14
A29L400A Series
rewrite the command sequence and any additional sector addresses and commands. The system can monitor I/O3 to determine if the sector erase timer has timed out. (See the " I/O
3: Sector Erase Timer"
section.) The time-out begins from the rising edge of the final
pulse in the command sequence.
WE
Once the sector erase operation has begun, only the Eras e Suspend command is valid. All other commands are ignored. When the Embedded Erase algorithm is complete, the device returns to reading array data and addresses are no longer latched. The system can determine the status of the erase operation by using I/O7, I/O6, or I/O2. Refer to "Write Operation Status" for information on these status bits. 4 illustrates the algorithm for the erase operation. Refer to the Erase/Program Operations tables in the "AC Characteristics" section for parameters, and to the Sector Erase Operations Timing diagram for timing waveforms.
Erase Suspend/Erase Resume Commands
The Erase Suspend command allows the system to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. This command is valid only during the sector erase operation, including the 50µs time-out period during the sector erase command sequence. The Erase Suspend command is ignored if written during the chip erase operation or Embedded Program algorithm. Writing the Erase Suspend command during the Sector Erase time-out immediately terminates the time-out period and suspends the erase operation. Addresses are "don't cares" when writing the Erase Suspend command. When the Erase Suspend command is written during a sector erase operation, the device requires a maximum of 20µs to suspend the erase operation. However, when the Erase Suspend command is written during the sector erase time-out, the device immediately terminates the time-out period and suspends the erase operation. After the erase operation has been suspended, the system can read array data from or program data to any sector not selected for erasure. (The device "erase suspends" all sectors selected for erasure.) Normal read and write timings and command definitions apply. Reading at any address within erase-suspended sectors produces status data on I/O
- I/O0. The system can use I/O7, or I/O6 and I/O2 together, to determine if a sector is actively erasing or is erase­suspended. See "Write Operation Status" for information on these status bits.
7
After an erase-suspended program operation is complete, the system can once again read array data within non­suspended sectors. The system can determine the status of the program operation using the I/O
7 or I/O6 status bits, just
as in the standard program operation. See "Write Operation Status" for more information. The system may also write the autoselect command sequence when the device is in the Erase Suspend mode. The device allows reading autoselect codes even at addresses within erasing sectors, since the codes are not stored in the memory array. When the device exits the autoselect mode, the device reverts to the Erase Suspend mode, and is ready for another valid operation. See "Autoselect Command Sequence" for more information. The system must write the Erase Resume command (address bits are "don't care") to exit the erase suspend mode and continue the sector erase operation. Further writes of the Resume command are ignored. Another Erase Suspend command can be written after the device has resumed erasing.
START
Write Erase
Command Sequence
Data Poll
from System
Embedded Erase algorithm in progress
No
Data = FFh ?
Yes
Erasure Completed
Note :
1. See the appropriate Command Definitions table for erase command sequences.
2. See "I/O
3
: Sector Erase Timer" for more information.
Figure 4. Erase Operation
PRELIMINARY (July, 2005, Version 0.0) 13 AMIC Technology, Corp.
Page 15
A29L400A Series
Table 5. A29L400A Command Definitions
Command Sequence
(Note 1)
Read (Note 6) 1 RA RD Reset (Note 7) 1 XXX F0
Manufacturer ID
Device ID, Top Boot Block
Device ID, Bottom Boot Block
Continuation ID
Autoselect (Note 8)
Sector Protect Verify
(Note 9)
Program
Unlock Bypass Unlock Bypass Program (Note 10) 2 XXX A0 PA PD
Unlock Bypass Reset (Note 11) 2 XXX 90 XXX 00 Chip Erase
Sector Erase Erase Suspend (Note 12) 1 XXX B0
Erase Resume (Note 13) 1 XXX 30
Legend: X = Don't care RA = Address of the memory location to be read. RD = Data read from location RA during read operation.
PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the WE or CE pulse,
whichever happens later.
PD = Data to be programmed at location PA. Data la tches on th e rising edge o f SA = Address of the sector to be verified (in autoselect mode) or erased. Address bits A17 - A12 select a unique sector. Note:
1. See Table 1 for description of bus operations.
2. All values are in hexadecimal.
3. Except when reading array or autoselect data, all bus cycles are write operation.
4. Data bits I/O15~I/O8 are don’t care for unlock and comma nd cycles.
5. Address bits A17 - A11 are don't cares for unlock and command cycles, unless SA or PA required.
6. No unlock or command cycles required when reading array data.
7. The Reset command is required to return to reading arra y data when device is in the autoselect mode, or if I/O (while the device is providing status data).
8. The fourth cycle of the autoselect command sequence is a read cycle.
9. The data is 00h for an unprotected sector and 01h for a protected sector. See “Autoselect Command Sequence” for more information.
10. The Unlock Bypass command is required pri or to the Unlock Bypass Program command.
11. The Unlock Bypass Reset command is required to return to reading array data when the device is in the unlock bypass mode.
12. The system may read and program in non-erasing secto rs, o r ente r the au to select mode , w hen in the Era se Suspend mode.
13. The Erase Resume command is valid only during the Erase Suspend mode.
Word 555 2AA 555
Byte
Word
Byte
Word
Byte
Word Byte
Word
Byte
Word
Byte
Word 555 2AA 555
Byte
Word
Byte
Word
Byte
First Second Third Fourth Fifth Sixth
Cycles
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
4
4
4
4
4
4
3
6
6
AA
AAA 555
AA
AAA 555 2AA 555 X01 AAA
555 AAA 555
AA
AAA
555 AAA
AAA
555 2AA AAA 555 2AA AAA
AA
AA
AA
AA
AA
AA
555 2AA
555
555 2AA 555 2AA
555
2AA 555
555
555
555
Bus Cycles (Notes 2 - 5)
55
55
55
55
55
55
55
55
55
AAA
AAA
AAA
AAA
AAA
AAA
AAA
AAA
AAA
90 X00 37
555
90
90
555
90
555
90
555
A0 PA PD
20
555
80
555
80
or CE pulse, whichever happens first.
WE
B334
X01
X02
X02
X03 X06
(SA) X02
(SA)
X04
555 AAA 555 AAA
34
B3B5
B5
7F
XX00 XX01
00 01
2AA
AA
AA
555 2AA 555
55
55 SA 30
555
10
AAA
5 goes high
PRELIMINARY (July, 2005, Version 0.0) 14 AMIC Technology, Corp.
Page 16
A29L400A Series
Write Operation Status
Several bits, I/O2, I/O3, I/O5, I/O6, I/O7, RY/
are provided in
BY
the A29L400A to determine the status of a write operation. Table 6 and the following subsections describe the functions
of these status bits. I/O
7, I/O6 and RY/BY each offer a
method for determining whether a program or erase operation is complete or in progress. These three bits are discussed first.
I/O7:
The
Polling
Data
Polling bit, I/O7, indicates to the host system
Data
whether an Embedded Algorithm is in progress or completed, or whether the device is in Erase Suspend.
Data
Polling is
valid after the rising edge of the final WE pulse in the program or erase command sequence. During the Embedded Program algorithm, the device outputs
7 the complement of the datum programmed to I/O7.
on I/O This I/O
7 status also applies to programming during Erase
Suspend. When the Embedded Program algorithm is complete, the device outputs the datum programmed to I/O7. The system must provide the program address to read valid status information on I/O7. If a program address falls within a
protected sector,
Polling on I/O7 is active for
Data
approximately 2µs, then the device returns to reading array data.
During the Embedded Erase algorithm,
Data
Polling
produces a "0" on I/O7. When the Embedded Erase algorithm is complete, or if the device enters the Erase Suspend mode,
Polling produces a "1" on I/O7.This is analogous to the
Data
complement/true datum output described for the Embedded Program algorithm: the erase function changes all the bits in a sector to "1"; prior to this, the device outputs the "complement," or "0." The system must provide an address within any of the sectors selected for erasure to read valid status information on I/O
7.
After an erase command sequence is written, if all sectors selected for erasing are protected,
Polling on I/O7 is
Data
active for approximately 100µs, then the device returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. When the system detects I/O complement to true data, it can read valid data at I/O on the following read cycles. This is because I/O change asynchronously with I/O
) is asserted low. The
(
OE
7 has changed from the
7 - I/O0
7 may
0 - I/O6 while Output Enable
Polling Timings (During
Data
Embedded Algorithms) in the "AC Characteristics" section illustrates this. Table 6 shows the outputs for
on I/O
7. Figure 5 shows the
Polling algorithm.
Data
Data
Polling
START
Read I/O7-I/O
Address = VA
I/O7 = Data ?
No
Note :
1. VA = Valid address for programming. During a sector erase operation, a valid address is an address within any sector selected for erasure. During chip erase, a valid address is any non-protected sector address.
2. I/O
7
should be rechecked even if I/O5 = "1" because
I/O
7
may change simultaneously with I/O5.
I/O5 = 1?
Read I/O7 - I/O
Address = VA
I/O7 = Data ?
FAIL
0
Yes
No
Yes
0
Yes
No
PASS
Figure 5. Data Polling Algorithm
PRELIMINARY (July, 2005, Version 0.0) 15 AMIC Technology, Corp.
Page 17
A29L400A Series
RY/
The RY/
BY
: Read/
is a dedicated, open-drain output pin that
BY
Busy
indicates whether an Embedded algorithm is in progress or complete. The RY/ the final RY/
WE
is an open-drain output, several RY/BY pins can be
BY
status is valid after the rising edge of
BY
pulse in the command sequence. Since
tied together in parallel with a pull-up resistor to VCC. (The RY/
pin is not available on the 44-pin SOP package)
BY
If the output is low (Busy), the device is actively erasing or programming. (This includes programming in the Erase Suspend mode.) If the output is high (Ready), the device is ready to read array data (including during the Erase Suspend mode), or is in the standby mode.
Table 6 shows the outputs for RY/
. Refer to “
BY
RESET
Timings”, “Timing Waveforms for Program Operation” and “Timing Waveforms for Chip/Sector Erase Operation” for more information.
I/O6: Toggle Bit I
Toggle Bit I on I/O6 indicates whether an Embedded Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address, and is valid after the rising edge
of the final WE pulse in the command sequence (prior to the program or erase operation), and during the sector erase time-out. During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause I/O6 to toggle.
(The system may use either OE or CE to control the read cycles.) When the operation is complete, I/O6 stops toggling. After an erase command sequence is written, if all sectors
selected for erasing are protected, I/O6 toggles for approximately 100µs, then returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. The system can use I/O whether a sector is actively erasing or is erase-suspended. When the device is actively erasing (that is, the Embedded Erase algorithm is in progress), I/O device enters the Erase Suspend mode, I/O However, the system must also use I/O sectors are erasing or erase-suspended. Alternatively, the
system can use I/O Polling"). If a program address falls within a protected sector, I/O toggles for approximately 2µs after the program command sequence is written, then returns to reading array data. I/O
6 also toggles during the erase-suspend-program mode,
and stops toggling once the Embedded Program algorithm is complete. The Write Operation Status table shows the outputs for Toggle Bit I on I/O6. Refer to Figure 6 for the toggle bit algorithm, and to the Toggle Bit Timings figure in the "AC Characteristics" section for the timing diagram. The I/O
6 figure shows the differences between I/O2 and I/O6 in
I/O graphical form. See also the subsection on " I/O II".
6 and I/O2 together to determine
6 toggles. When the
6 stops toggling.
2 to determine which
7 (see the subsection on " I/O7 :
2: Toggle Bit
Data
2 vs.
6
I/O2: Toggle Bit II
The "Toggle Bit II" on I/O2, when used with I/O6, indicates whether a particular sector is actively erasing (that is, the Embedded Erase algorithm is in progress), or whether that sector is erase-suspended. Toggle Bit II is valid after the
rising edge of the final
pulse in the command
WE
sequence.
2 toggles when the system reads at addresses within
I/O those sectors that have been selected for erasure. (The
system may use either cycles.) But I/O
2 cannot distinguish whether the sector is
actively erasing or is erase-suspended. I/O
OE
or
to control the read
CE
6, by comparison,
indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sector and mode information. Refer to Table 6 to compare outputs for I/O
2 and I/O6.
Figure 6 shows the toggle bit algorithm in flowchart form, and the section " I/O2: Toggle Bit II" explains the algorithm. See also the " I/O
6: Toggle Bit I" subsection. Refer to the
Toggle Bit Timings figure for the toggle bit timing diagram. The I/O2 vs. I/O6 figure shows the differences between I/O2 and I/O
6 in graphical form.
Reading Toggle Bits I/O6, I/O2
Refer to Figure 6 for the following discussion. Whenever the system initially begins reading toggle bit status, it must read I/O7 - I/O0 at least twice in a row to determine whether a toggle bit is toggling. Typically, a system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on I/O7 - I/O0 on the following read cycle. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of I/O5 is high (see the section on I/O again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as I/O5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that the system initially determines that the toggle bit is toggling and I/O gone high. The system may continue to monitor the toggle bit and I/O5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of Figure 6).
5). If it is, the system should then determine
5 has not
PRELIMINARY (July, 2005, Version 0.0) 16 AMIC Technology, Corp.
Page 18
A29L400A Series
I/O5: Exceeded Timing Limits
I/O5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. Under these conditions I/O5 produces a "1." This is a failure condition that indicates the program or erase cycle was not successfully completed. The I/O
5 failure condition may appear if the system tries to
program a "1 "to a location that is previously programmed to "0." Only an erase operation can change a "0" back to a "1." Under this condition, the device halts the operation, and when the operation has exceeded the timing limits, I/O5 produces a "1." Under both these conditions, the system must issue the reset command to return the device to reading array data.
I/O3: Sector Erase Timer
After writing a sector erase command sequence, the system may read I/O operation has begun. (The sector erase timer does not apply to the chip erase command.) If additional sectors are selected for erasure, the entire time-out also applies after each additional sector erase command. When the time-out is complete, I/O ignore I/O between additional sector erase commands will always be less than 50µs. See also the "Sector Erase Command Sequence" section. After the sector erase command sequence is written, the
system should read the status on I/O7 ( (Toggle Bit I) to ensure the device has accepted the
command sequence, and then read I/O internally controlled erase cycle has begun; all further commands (other than Erase Suspend) are ignored until the erase operation is complete. If I/O accept additional sector erase commands. To ensure the command has been accepted, the system software should check the status of I/O subsequent sector erase command. If I/O second status check, the last command might not have been accepted. Table 6 shows the outputs for I/O
3 to determine whether or not an erase
3 switches from "0" to "1." The system may
3 if the system can guarantee that the time
Polling) or I/O6
Data
3. If I/O3 is "1", the
3 is "0", the device will
3 prior to and following each
3 is high on the
3.
No
START
Read I/O7-I/O
Read I/O7-I/O
Toggle Bit
= Toggle ?
I/O5 = 1?
Read I/O7 - I/O
Twice
Toggle Bit
= Toggle ?
Program/Erase
Operation Not
Commplete, Write
Reset Command
0
0
Yes
Yes
Yes
(Note 1)
0
(Notes 1,2)
No
Operation Complete
No
Program/Erase
Notes :
1. Read toggle bit twice to determine whether or not it is toggling. See text.
2. Recheck toggle bit because it may stop toggling as I/O changes to "1". See text.
Figure 6. Toggle Bit Algorithm
PRELIMINARY (July, 2005, Version 0.0) 17 AMIC Technology, Corp.
5
Page 19
A29L400A Series
Table 6. Write Operation Status
Operation
I/O7 I/O6 I/O5 I/O3 I/O2
(Note 1) (Note 2) (Note 1)
Standard Mode
Erase Suspend Mode
Embedded Program Algorithm
7I/O
Toggle 0 N/A No toggle 0
Embedded Erase Algorithm 0 Toggle 0 1 Toggle 0 Reading within Erase
Suspended Sector Reading within Non-Erase
Suspended Sector Erase-Suspend-Program
1 No toggle 0 N/A Toggle 1
Data Data Data Data Data 1
7I/O
Toggle 0 N/A N/A 0
Notes:
1. I/O
7 and I/O2 require a valid address when reading status information. Refer to the appropriate subsection for further details.
2. I/O
5 switches to “1” when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits.
See “I/O5: Exceeded Timing Limits” for more information.
Maximum Negative Input Overshoot
20ns 20ns
+0.8V
-0.5V
RY/BY
-2.0V
Maximum Positive Input Overshoot
VCC+2.0V
VCC+0.5V
2.0V
20ns
20ns
20ns20ns
PRELIMINARY (July, 2005, Version 0.0) 18 AMIC Technology, Corp.
Page 20
A29L400A Series
DC Characteristics
CMOS Compatible (TA=0°C to 70°C or -40°C to +85°C)
Parameter
Parameter Description Test Description Min. Typ. Max. Unit
Symbol
ILI Input Load Current VIN = VSS to VCC. VCC = VCC Max
±1.0 µA ILIT A9 Input Load Current VCC = VCC Max, A9 =12.5V 35 ILO Output Leakage Current VOUT = VSS to VCC. VCC = VCC Max
ICC1 VCC Active Read Current
(Notes 1, 2)
ICC2 VCC Active Write (Program/Erase)
= VIL, OE = VIH
CE
Byte Mode
= VIL, OE = VIH
CE
Word Mode
= VIL, OE =VIH
CE
5 MHz 4 10 1 MHz 2 4
5 MHz 4 10 1 MHz 2 4
20 30 mA
±1.0 µA
Current (Notes 2, 3, 4)
ICC3 VCC Standby Current (Note 2) ICC4
VCC Standby Current During Reset (Note 2)
ICC5
Automatic Sleep Mode
= VIH,
CE
RESET
V
IH = VCC ± 0.3V; VIL = VSS ± 0.3V
RESET
= VSS ± 0.3V
= VCC ± 0.3V
0.2 5
0.2 5
0.2 5
(Note 2, 4, 5) VIL Input Low Level -0.5 0.8 V VIH Input High Level 0.7 x VCC VCC + 0.3 V VID Voltage for Autoselect and
VCC = 3.3 V 11.5 12.5 V
Temporary Unprotect Sector
VOL Output Low Voltage IOL = 4.0mA, VCC = VCC Min 0.45 V VOH1 IOH = -2.0 mA, VCC = VCC Min 0.85 x VCC V VOH2
Output High Voltage
I
OH = -100 µA, VCC = VCC Min
VCC - 0.4 V
µA
mA
µA µA
µA
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, withOEat VIH. Typical VCC is 3.0V.
2. Maximum I
3. I
CC active while Embedded Algorithm (program or erase) is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for t
CC specifications are tested with VCC = VCC max.
ACC + 30ns. Typical sleep mode current
is 200nA.
5. Not 100% tested.
PRELIMINARY (July, 2005, Version 0.0) 19 AMIC Technology, Corp.
Page 21
A29L400A Series
DC Characteristics (continued)
Zero Power Flash
25
20
15
10
Supply Current in mA
5
0
0 500 1000 1500 2000 2500 3000 3500 4000
Time in ns
Note: Addresses are switching at 1MHz
10
8
6
4
Supply Current in mA
2
0
12345
I
CC1
Current vs. Time (Showing Active and Automatic Sleep Currents)
3.6V
2.7V
Frequency in MHz
C25T :Note °=
Typical I
PRELIMINARY (July, 2005, Version 0.0) 20 AMIC Technology, Corp.
CC1
vs. Frequency
Page 22
A29L400A Series
AC Characteristics
Read Only Operations (TA=0°C to 70°C or -40°C to +85°C)
Parameter Symbols Speed
JEDEC
tAVAV tRC tAVQV
tELQV tGLQV tOE
Std
ACC
t
CE
t
Read Cycle Time (Note 1)
Address to Output Delay
Chip Enable to Output Delay Output Enable to Output Delay
Output Enable Hold
Time (Note 1)
Chip Enable to Output High Z
DF
tEHQZ
tOEH
t
(Notes 1)
tGHQZ
t
Output Enable to Output High Z
DF
(Notes 1) Output Hold Time from Addresses,
tAXQX tOH
or OE, Whichever Occurs First
CE
Description Test Setup
-70
Read
Toggle and
Polling
Data
CE
OE OE
= VIL = VIL
= VIL
Min.
Max.
Max. Max.
Min.
70 70
70 30
0
Min. 10 10
Max. 25 30
25 30
Min. 0 0 ns
(Note 1)
Notes:
1. Not 100% tested.
2. See Test Conditions and Test Setup for test specifications.
-90
90 90
90 35
0
Unit
ns ns
ns ns ns
ns
ns
ns
Timing Waveforms for Read Only Operation
t
RC
Addresses Addresses Stable
t
ACC
CE
t
OE
t
CE
OE
WE
Output
RESET
RY/BY
0V
t
OEH
High-Z
Output Valid
t
DF
OH
t
High-Z
PRELIMINARY (July, 2005, Version 0.0) 21 AMIC Technology, Corp.
Page 23
A29L400A Series
AC Characteristics Hardware Reset (
Parameter
JEDEC Std
Note: Not 100% tested.
RESET
t
t
Timings
RY/BY
CE, OE
READY
READY
tRPD
RESET
RESET
Algorithms) to Read or Write (See Note)
RESET
Algorithms) to Read or Write (See Note)
tRP tRH tRB
RESET RESET
RY/BY Recovery Time
RESET
) (TA=0°C to 70°C or -40°C to +85°C)
Description Test Setup All Speed Options Unit
Pin Low (During Embedded
Pin Low (Not During Embedded
Pulse Width High Time Before Read (See Note)
Low to Standby Mode
Max 20
Max 500 ns
Min 500 ns Min 50 ns Min 0 ns Min 20
µs
µs
RESET
RY/BY
CE, OE
RESET
t
RH
t
RP
t
Ready
Reset Timings NOT during Embedded Algorithms
Reset Timings during Embedded Algorithms
t
Ready
~
~
~
~
~
~
t
RP
t
RB
PRELIMINARY (July, 2005, Version 0.0) 22 AMIC Technology, Corp.
Page 24
A29L400A Series
Temporary Sector Unprotect (TA=0°C to 70°C or –40°C to +85°C)
Parameter
JEDEC Std
Note: Not 100% tested.
Temporary Sector Unprotect Timing Diagram
RESET
VIDR VID Rise and Fall Time (See Note) Min 500 ns
t
Setup Time for Temporary Sector
VIDR
CE
WE
RSP
t
12V
0 or 3V
RESET
Unprotect
t
Description All Speed Options Unit
Program or Erase Command Sequence
t
RSP
~
~ ~
~
~ ~
Min 4
0 or 3V
t
VIDR
µs
~
RY/BY
~
PRELIMINARY (July, 2005, Version 0.0) 23 AMIC Technology, Corp.
Page 25
A29L400A Series
AC Characteristics
Word/Byte Configuration (
Parameter
JEDEC Std
ELFL/tELFH
t
FLQZ
t
HQV
t
CE
BYTE BYTE
Timings for Read Operations
BYTE
CE
OE
BYTE
BYTE
Switching
from word to
byte mode
I/O0-I/O
I/O
15
(A-1)
BYTE
14
) (TA=0°C to 70°C or -40°C to +85°C)
BYTE
Description
to
Switching Low or High
BYTE
Switching Low to Output High-Z Switching High to Output Active
t
ELFL
t
ELFH
t
FLQZ
Data Output
(I/O
0
I/O
15
Output
All Speed Options
Unit
-70 -90
Max 5 ns Max 25 30 ns
Min 70 90 ns
Data Output
-I/O14)
(I/O
0
-I/O7)
Address Input
Data Output
(I/O
0
-I/O7)
BYTE
I/O0-I/O
14
Switching
from byte to
word mode
I/O
15
(A-1)
Address Input
t
FHQV
Timings for Write Operations
BYTE
CE
WE
The falling edge of the last WE signal
BYTE
t
SET
(tAS)
Note:
Refer to the Erase/Program Operations table for tAS and tAH specifications.
t
HOLD(tAH
Data Output
(I/O
0
-I/O14)
I/O
15
Output
)
PRELIMINARY (July, 2005, Version 0.0) 24 AMIC Technology, Corp.
Page 26
A29L400A Series
AC Characteristics
Erase and Program Operations (TA=0°C to 70°C or -40°C to +85°C)
Parameter Speed
JEDEC
tAVAV tAVWL tWLAX tDVWH tWHDX
tGHWL
tELWL tCS
tWHEH tWLWH tWHWL
tWHWH1 tWHWH1
Std
t
WC AS
t
AH
t
DS
t
DH
t
OES
t
GHWL
t
CH
t
WP
t
t
WPH
Write Cycle Time (Note 1) Address Setup Time
Address Hold Time
Data Setup Time
Data Hold Time Output Enable Setup Time Read Recover Time Before Write
(
high to WE low)
OE
Setup Time
CE
Hold Time
CE
Write Pulse Width Write Pulse Width High
Byte Programming Operation
(Note 2)
Description
-70
Min.
70
Min. Min. Min.
45 35
Min. Min.
Min.
Min. Min. Min.
35
Min.
Byte Typ. 5
Word Typ. 7
0
0 0
0
0 0
30
-90
90
45 45
35
Unit
ns ns ns ns ns ns
ns
ns ns ns ns
µs
tWHWH2 tWHWH2 Sector Erase Operation (Note 2) Typ. 1.0 sec
t
t
BUSY
t
VCC Set Up Time (Note 1)
vcs RB
Recovery Time from RY/ Program/Erase Valid to RY/
BY
BY
Delay
Min.
Min Min
50
0
90
Notes:
1. Not 100% tested.
2. See the "Erase and Programming Performance" section for more information.
µs ns ns
PRELIMINARY (July, 2005, Version 0.0) 25 AMIC Technology, Corp.
Page 27
A29L400A Series
Timing Waveforms for Program Operation
Addresses
CE
OE
WE
Data
RY/BY
VCC
t
VCS
Program Command Sequence (last two cycles)
t
WC
555h
t
CS
t
CH
t
WP
t
DS
A0h PD
t
AS
t
WPH
PA
t
DH
t
AH
t
BUSY
Read Status Data (last two cycles)
~
~
PA
~
~
~
~
~
~
t
WHWH1
~
~
~
~
~
~
~
~
Status
PA
D
OUT
t
RB
Note :
1. PA = program addrss, PD = program data, Dout is the true data at the program address.
2. Illustration shows device in word mode.
PRELIMINARY (July, 2005, Version 0.0) 26 AMIC Technology, Corp.
Page 28
A29L400A Series
Timing Waveforms for Chip/Sector Erase Operation
Addresses
CE
OE
WE
Data
RY/BY
VCC
t
VCS
Erase Command Sequence (last two cycles)
t
t
WC
2AAh
t
CS
555h for chip erase
t
CH
t
WP
t
DS
55h 30h
AS
SA
t
WPH
t
DH
10h for chip erase
t
AH
~ ~
~
~
~
~
t
BUSY
~ ~
~ ~
~
~
~
t
~
~ ~
WHWH2
Read Status Data
VA
In
Progress
VA
Complete
t
RB
Note :
1. SA = Sector Address (for Sector Erase), VA = Valid Address for reading status data (see "Write Operaion Ststus").
2. Illustratin shows device in word mode.
PRELIMINARY (July, 2005, Version 0.0) 27 AMIC Technology, Corp.
Page 29
A29L400A Series
Timing Waveforms for
Addresses
CE
t
CH
OE
t
WE
I/O
7
Polling (During Embedded Algorithms)
Data
t
OEH
t
ACC
t
CE
RC
t
Complement
OE
t
DF
t
OH
~
~
~
~
~
~
~
~
~
~
~
~
VAVA VA
Complement True
Valid Data
High-Z
0
- I/O
RY/BY
6
High-Z
t
BUSY
Status Data
Status Data True
~
~
~
~
Valid Data
I/O
Note : VA = Valid Address. Illustation shows first status cycle after command sequence, last status read cycle, and array data read cycle.
High-Z
PRELIMINARY (July, 2005, Version 0.0) 28 AMIC Technology, Corp.
Page 30
A29L400A Series
Timing Waveforms for Toggle Bit (During Embedded Algorithms)
Addresses
CE
OE
WE
I/O6 , I/O2
RY/BY
tCH
tOEH
High-Z
tBUSY
tACC
tCE
tRC
VAVA VA
tOE
tDF
tOH
Valid Status
(first read) (second read) (stop togging)
Valid Status Valid Status Valid Data
~
~
VA
~
~
~
~
~
~
~
~
~
~
~
~
Note: VA = Valid Address; not required for I/O6. Illustration shows first two status cycle after command sequence, last status
read cycle, and array data read cycle.
Timing Waveforms for Sector Protect/Unprotect
VID
RESET
SA, A6,
A1, A0
Data
CE
WE
OE
Note : For sector protect, A6=0, A1=1, A0=0. For sector unprotect, A6=1, A1=1, A0=0
VIH
~
~
Valid* Valid* Valid*
~
Sector Protect/Unprotect Verify
60h 60h 40h Status
1us
Sector Protect:150us
Sector Unprotect:15ms
~
~
~
~
~
PRELIMINARY (July, 2005, Version 0.0) 29 AMIC Technology, Corp.
Page 31
A29L400A Series
Timing Waveforms for I/O2 vs. I/O6
Enter
Embedded
Erasing
WE
I/O
6
I/O
2
I/O
Note : Both I/O6 and I/O2 toggle with OE or CE. See the text on I/O6 and I/O2 in the section "Write Operation Status" for more information.
Erase
Suspend
~
~
Erase
~
~
~
~
2
and I/O6 toggle with OE and CE
~
~
Erase Suspend
Read
~
~
~
~
Enter Erase
Suspend Program
~
~
Erase Suspend Program
~
~
~
~
Resume
~
~
Erase Suspend
Read
~
~
~
~
Erase
Erase
~
~
~
~
~
~
Timing Waveforms for Alternate
555 for program
2AA for erase
Addresses
t
WC
WE
Controlled Write Operation
CE
PA for program SA for sector erase 555 for chip erase
t
AS
t
t
WH
AH
Data Polling
~
~
~
~
~
~
PA
Erase
Complete
~
OE
t
CP
t
t
CE
t
WS
Data
t
RH
RESET
RY/BY
Note :
1. PA = Program Address, PD = Program Data, SA = Sector Address, I/O
2. Figure indicates the last two bus cycles of the command sequence.
PRELIMINARY (July, 2005, Version 0.0) 30 AMIC Technology, Corp.
A0 for program 55 for erase
CPH
t
DS
t
DH
PD for program 30 for sector erase 10 for chip erase
BUSY
7
~
t
WHWH1 or 2
~
~
~
~
~
~
~
~
= Complement of Data Input, D
I/O
7
D
OUT
OUT
= Array Data.
Page 32
A29L400A Series
Erase and Programming Performance
Parameter Typ. (Note 1) Max. (Note 2) Un it Comments
Sector Erase Time 1.0 8 sec Chip Erase Time 10 sec Byte Programming Time 5 300 Word Programming Time 7 500
Chip Programming Time
(Note 3)
Byte Mode 7 18 sec
Word Mode 5 12 sec
µs µs
Excludes 00h programming prior to erasure
Excludes system-level overhead (Note 5)
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 3.0V VCC, 10, 000 cycles. Addition ally, progr amming typically assumes checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 2.7V, 100,000 cycles.
3. The typical chip programming time is considerably less than the ma ximum chip programming time listed, since most bytes program faster than the maximum byte program time listed. If the maximum byte program time given is exc eeded, only then does the device set I/O
5 = 1. See the section on I/O5 for further information.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h befor e erasure.
5. System-level overhead is the time required to execute the four-bus-cycle comman d sequence for programming. See Table 5 for further information on command definitions.
6. The device has a guaranteed minimum erase and progra m cycle endurance of 10,000 cycles.
Latch-up Characteristics
Description Min. Max.
Input Voltage with respect to VSS on all I/O pins VCC Current Input voltage with respect to VSS on all pins except I/O pins
(including A9, OEand
RESET
)
Includes all pins except VCC. Test conditions: VCC = 5.0V, one pin at time.
TSOP and SOP Pin Capacitance
Parameter Symbol
CIN Input Capacitance
COUT
CIN2
Output Capacitance Control Pin Capacitance
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0MHz
Parameter Description
Test Setup
Data Retention
Parameter
Test Conditions
IN=0
V
V
OUT=0
V
IN=0
-1.0V
-100 mA
-1.0V
Typ.
6
8.5
7.5
Min
Max.
7.5 12
9
VCC+1.0V
+100 mA
12.5V
Unit
pF pF pF
Unit
150°C
10 Years
Minimum Pattern Data Retention Time
125°C
20 Years
PRELIMINARY (July, 2005, Version 0.0) 31 AMIC Technology, Corp.
Page 33
A29L400A Series
Test Conditions
Test Specifications
Test Condition -70 -90 Unit
Output Load 1 TTL gate Output Load Capacitance, CL(including jig capacitance) 30 100 pF Input Rise and Fall Times 5 5 ns Input Pulse Levels 0.0 - 3.0 0.0 - 3.0 V Input timing measurement reference levels 1.5 1.5 V Output timing measurement reference levels 1.5 1.5 V
Test Setup
3.3 V
2.7 K
Device
Under
Test
6.2 K
C
L
Diodes = IN3064 or Equivalent
PRELIMINARY (July, 2005, Version 0.0) 32 AMIC Technology, Corp.
Page 34
A29L400A Series
Ordering Information Top Boot Sector Flash
Part No.
A29L400ATM-70 44Pin SOP A29L400ATM-70F 44Pin Pb-Free SOP A29L400ATM-70U 44Pin SOP A29L400ATM-70UF 44Pin Pb-Free SOP A29L400ATM-70I 44Pin SOP A29L400ATM-70IF 44Pin Pb-Free SOP A29L400ATV-70 48Pin TSOP A29L400ATV-70F 48Pin Pb-Free TSOP A29L400ATV-70U 48Pin TSOP A29L400ATV-70UF 48Pin Pb-Free TSOP A29L400ATV-70I 48Pin TSOP A29L400ATV-70IF 48Pin Pb-Free TSOP A29L400ATG-70 48-ball TFBGA A29L400ATG-70F 48-ball Pb-Free TFBGA A29L400ATG-70U 48-ball TFBGA A29L400ATG-70UF 48-ball Pb-Free TFBGA A29L400ATG-70I 48-ball TFBGA A29L400ATG-70IF A29L400ATM-90 44Pin SOP A29L400ATM-90F 44Pin Pb-Free SOP A29L400ATM-90U 44Pin SOP A29L400ATM-90UF 44Pin Pb-Free SOP A29L400ATM-90I 44Pin SOP A29L400ATM-90IF 44Pin Pb-Free SOP A29L400ATV-90 48Pin TSOP A29L400ATV-90F 48Pin Pb-Free TSOP A29L400ATV-90U 48Pin TSOP A29L400ATV-90UF 48Pin Pb-Free TSOP A29L400ATV-90I 48Pin TSOP A29L400ATV-90IF 48Pin Pb-Free TSOP A29L400ATG-90 48-ball TFBGA A29L400ATG-90F 48-ball Pb-Free TFBGA A29L400ATG-90U 48-ball TFBGA A29L400ATG-90UF 48-ball Pb-Free TFBGA A29L400ATG-90I 48-ball TFBGA A29L400ATG-90IF
Access Time
(ns)
70 4 20 0.2
90 4 20 0.2
Active Read
Current
Typ. (mA)
Program/Erase
Current
Typ. (mA)
Standby
Current
Typ. (µA)
Package
48-ball Pb-Free TFBGA
48-ball Pb-Free TFBGA
Note: -U is for industrial operating temperature range: -40°C to +85°C
-I is for industrial operating temperature range: -25°C to +85°C
PRELIMINARY (July, 2005, Version 0.0) 33 AMIC Technology, Corp.
Page 35
A29L400A Series
Ordering Information (continued) Bottom Boot Sector Flash
Part No.
A29L400AUM-70 44Pin SOP A29L400AUM-70F 44Pin Pb-Free SOP A29L400AUM-70U 44Pin SOP A29L400AUM-70UF 44Pin Pb-Free SOP A29L400AUM-70I 44Pin SOP A29L400AUM-70IF 44Pin Pb-Free SOP A29L400AUV-70 48Pin TSOP A29L400AUV-70F 48Pin Pb-Free TSOP A29L400AUV-70U 48Pin TSOP A29L400AUV-70UF 48Pin Pb-Free TSOP A29L400AUV-70I 48Pin TSOP A29L400AUV-70IF 48Pin Pb-Free TSOP A29L400AUG-70 48-ball TFBGA A29L400AUG-70F 48-ball Pb-Free TFBGA A29L400AUG-70U 48-ball TFBGA A29L400AUG-70UF 48-ball Pb-Free TFBGA A29L400AUG-70I 48-ball TFBGA A29L400AUG-70IF A29L400AUM-90 44Pin SOP A29L400AUM-90F 44Pin Pb-Free SOP A29L400AUM-90U 44Pin SOP A29L400AUM-90UF 44Pin Pb-Free SOP A29L400AUM-90I 44Pin SOP A29L400AUM-90IF 44Pin Pb-Free SOP A29L400AUV-90 48Pin TSOP A29L400AUV-90F 48Pin Pb-Free TSOP A29L400AUV-90U 48Pin TSOP A29L400AUV-90UF 48Pin Pb-Free TSOP A29L400AUV-90I 48Pin TSOP A29L400AUV-90IF 48Pin Pb-Free TSOP A29L400AUG-90 48-ball TFBGA A29L400AUG-90F 48-ball Pb-Free TFBGA A29L400AUG-90U 48-ball TFBGA A29L400AUG-90UF 48-ball Pb-Free TFBGA A29L400AUG-90I 48-ball TFBGA A29L400AUG-90IF
Access Time
(ns)
70 4 20 0.2
90 4 20 0.2
Active Read
Current
Typ. (mA)
Program/Erase
Current
Typ. (mA)
Standby
Current
Typ. (µA)
Package
48-ball Pb-Free TFBGA
48-ball Pb-Free TFBGA
Note: -U is for industrial operating temperature range: -40°C to +85°C
-I is for industrial operating temperature range: -25°C to +85°C
PRELIMINARY (July, 2005, Version 0.0) 34 AMIC Technology, Corp.
Page 36
A29L400A Series
Package Information SOP 44L Outline Dimensions
44
1
D
S
Seating Plane
unit: inches/mm
23
E
E
H
Gauge Plane
θ
0.010"
22
b
L
Detail F
A
A2
y
D
Symbol
e
Dimensions in inches Dimensions in mm
Min Nom Max Min Nom Max
A - - 0.118 - - 3.00 A1 0.004 - - 0.10 - ­A2 0.103 0.106 0.109 2.62 2.69 2.77
b 0.013 0.016 0.020 0.33 0.40 0.50
C 0.007 0.008 0.010 0.18 0.20 0.25
D - 1.122 1.130 - 28.50 28.70
E 0.490 0.496 0.500 12.45 12.60 12.70
e
- 0.050 - - 1.27 -
HE 0.620 0.631 0.643 15.75 16.03 16.33
L 0.024 0.032 0.040 0.61 0.80 1.02 L1 - 0.0675 - - 1.71 -
S - - 0.045 - - 1.14
y - - 0.004 - - 0.10
θ
0°
A1
See Detail F
-
8° 0°
-
8°
C
L
1
Notes:
1. The maximum value of dimension D includes end flash.
2. Dimension E d oes not include resin fins.
3. Dimension S includes end flash.
PRELIMINARY (July, 2005, Version 0.0) 35 AMIC Technology, Corp.
Page 37
A29L400A Series
Package Information TSOP 48L (Type I) Outline Dimensions
D
D
1
1
24 25
unit: inches/mm
A
A1
A2
48
y
D
b
E
e
S
c
θ
L
Detail "A"
0.25 Detail "A"
Symbol
A - - 0.047 - - 1.20 A1 0.002 - 0.006 0.05 - 0.15 A2 0.037 0.039 0.042 0.94 1.00 1.06
b 0.007 0.009 0.011 0.18 0.22 0.27 c 0.004 - 0.008 0.12 - 0.20
D 0.779 0.787 0.795 19.80 20.00 20.20
D1 0.720 0.724 0.728 18.30 18.40 18.50
E - 0.472 0.476 - 12.00 12.10
e 0.020 BASIC 0.50 BASIC L 0.016 0.020 0.024 0.40 0.50 0.60
S 0.011 Typ. 0.28 Typ.
y - - 0.004 - - 0.10 θ
Dimensions in inches Dimensions in mm
Min Nom Max Min Nom Max
0° - 8° 0° - 8°
Notes:
1. The maximum value of dimension D includes end flash.
2. Dimension E does not include resin fins.
3. Dimension S includes end flash.
PRELIMINARY (July, 2005, Version 0.0) 36 AMIC Technology, Corp.
Page 38
A29L400A Series
Package Information 48LD CSP (6 x 8 mm) Outline Dimensions
(48TFBGA)
TOP VIEW
654321
H G
F E D C B A
Ball*A1 CORNER
SIDE VIEW
C
SEATING PLANE
0.10 C
Symbol
unit: mm
BOTTOM VIEW
b
123456
H G
F E D C B A
e
D1
D
A
A1
e
E
E1
Dimensions in mm
Min.
Nom. Max.
A - - 1.20
A1 0.20 0.25 0.30
b 0.30 - 0.40
D 5.90 6.00 6.10
D1 4.00 BSC
e - 0.80 ­E 7.90 8.00 8.10
E1 5.60 BSC
PRELIMINARY (July, 2005, Version 0.0) 37 AMIC Technology, Corp.
Loading...