A hardware method of protecting sectors to prevent
any inadvertent program or erase operations within that
sector
Extended operating temperature range: -40°C~+85°C
for –U series
Embedded Erase Algorithms
- Embedded Erase algorithm will automatically erase the
entire chip or any combination of designated sectors
and verify the erased sectors
General Description
The A29040B is a 5.0 volt-only Flash memory organized as
524,288 bytes of 8 bits each. The 512 Kbytes of data are
further divided into eight sectors of 64 Kbytes each for flexible
sector erase capability. The 8 bits of data appear on I/O
I/O
7 while the addresses are input on A0 to A18. The
A29040B is offered in 32-pin PLCC, TSOP, and PDIP
packages. This device is designed to be programmed insystem with the standard system 5.0volt VCC supply.
Additional 12.0 volt VPP is not required for in-system write or
erase operations. However, the A29040B can also be
programmed in standard EPROM programmers.
The A29040B has a second toggle bit, I/O
2, to indicate
whether the addressed sector is being selected for erase, and
also offers the ability to program in the Erase Suspend mode.
The standard A29040B offers access times of 55, 70 and 90
ns, allowing high-speed microprocessors to operate without
wait states. To eliminate bus contention the device has
separate chip enable (
enable (
) controls.
OE
), write enable (WE) and output
CE
The device requires only a single 5.0 volt power supply for
both read and write functions. Internally generated and
regulated voltages are provided for the program and erase
operations.
The A29040B is entirely software command set compatible
with the JEDEC single-power-supply Flash standard.
Commands are written to the command register using
standard microprocessor write timings. Register contents
serve as input to an internal state-machine that controls the
erase and programming circuitry.
Write cycles also internally latch addresses and data
needed for the programming and erase operations.
0 -
- Embedded Program algorithm automatically writes and
verifies bytes at specified addresses
Typical 100,000 program/erase cycles per sector
20-year data retention at 125°C
- Reliable operat ion for the life of the system
Compatible with JEDEC-standards
- Pinout and software compatible with single-powersupply Flash memory standard
- Superior inadvertent write protection
Polling and toggle bits
Data
- Provides a software method of detecting completion of
program or erase operations
Erase Suspend/Erase Resume
- Suspends a sector erase operation to read data from,
or program data to, a non-erasing sector, then
resumes the erase operation
Package options
- 32-pin P-DIP, PLCC, or TSOP (For ward type)
Reading data out of the device is similar to reading from
other Flash or EPROM devices.
Device programming occurs by writing the proper program
command sequence. This initiates the Embedded Program
algorithm - an internal algorithm that automatically times the
program pulse widths and verifies proper program margin.
Device erasure occurs by executing the proper erase
command sequence. This initiates the Embedded Erase
algorithm - an internal algorithm that automatically
preprograms the array (if it is not already programmed)
before executing the erase operation. During erase, the
device automatically times the erase pulse widths and
verifies proper erase margin.
The host system can detect whether a program or erase
operation is complete by reading the I/O
I/O
6 (toggle) status bits. After a program or erase cycle has
7 (
Polling) and
Data
been completed, the device is ready to read array data or
accept another command.
The sector erase architecture allows memory sectors to be
erased and reprogrammed without affecting the data
contents of other sectors. The A29040B is fully erased when
shipped from the factory.
The hardware sector protection feature disables operations
for both program and erase in any combination of the sector s
of memory. This can be achieved via programming
equipment.
The Erase Suspend feature enables the user to put erase on
hold for any period of time to read data from, or program
data to, any other sector that is not selected for erasure.
True background erase can thus be achieved.
Power consumption is greatly reduced when the device is
placed in the standby mode.
PRELIMINARY (December, 2004, Version 0.2) 1 AMIC Technology, Corp.
Page 3
A29040B Series
Pin Configurations
DIP PLCC
A18
A16
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O
I/O1
I/O2
1
2
3
4
5
6
7
8
9
10
11
12
0
13
14
15
1617
32
31
30
29
28
27
26
25
24
23
A29040B
22
21
20
19
18
TSOP (Forward type)
VCC
WE
A17
A14
A13
A8
A9
A11
OE
A10
CE
I/O7
I/O6
I/O5
I/O
I/O3VSS
A12
A16
A18
VCC
WE
32
I/O4
31
I/O5
A17
30
20
I/O6
29
28
27
26
25
24
23
22
21
A14
A13
A8
A9
A11
OE
A10
CE
I/O
7
A15
4
3
2
1
5
A7
6
A6
7
A5
8
A4
9
A3
10
A2
11
A1
12
A0
13
0
I/O
4
A29040BL
14
1516171819
3
I/O1
I/O
I/O2
VSS
32
OEA11
31
A10
30
CE
29
I/O7
28
I/O6
27
I/O5
26
I/O4
25
I/O
24
VSS
23
I/O2
22
I/O1
21
I/O
20
A0
19
A1
18
A2
17A3
3
0
A9
A8
A13
A14
A17
WE
VCC
A18
A16
A15
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A29040BV
PRELIMINARY (December, 2004, Version 0.2) 2
AMIC Technology, Corp.
Page 4
A29040B Series
Block Diagram
0
- I/O
I/O
7
VCC
VSS
A0-A18
WE
CE
OE
State
Control
Command
Register
VCC Detector
PGM Voltage
Generator
Timer
Erase Voltage
Generator
STB
Chip Enable
Output Enable
Logic
Y-Decoder
X-decoder
Address Latch
STB
Input/Output
Buffers
Data Latch
Y-Gating
Cell Matrix
Pin Descriptions
Pin No. Description
A0 - A18 Address Inputs
I/O0 - I/O7 Data Inputs/Outputs
CE
WE
OE
Chip Enable
Write Enable
Output Enable
VSS Ground
VCC Power Supply
PRELIMINARY (December, 2004, Version 0.2) 3 AMIC Technology, Corp.
Page 5
A29040B Series
Absolute Maximum Ratings*
Ambient Operating Temperature …. . . . . -55°C to + 125°C
Storage Temperature . . . . . . . . . . …. . . . -65°C to + 125°C
All other pins (Note 1) . . . . . . . . . . . . . . . . . …-2.0V to 7.0V
Output Short Circuit Current (Note 3) . . . . . . . …. . . 200mA
Notes:
1. Minimum DC voltage on input or I/O pins is -0.5V. During
voltage transitions, inputs may undershoot VSS to -2.0V
for periods of up to 20ns. Maximum DC voltage on output
and I/O pins is VCC +0.5V. During voltage transitions,
outputs may overshoot to VCC +2.0V for periods up to
20ns.
2. Minimum DC input voltage on A9 pins is -0.5V. During
voltage transitions, A9 and
2.0V for periods of up to 20ns. Maximum DC input
voltage on A9 and
is +12.5V which may overshoot to
OE
13.5V for periods up to 20ns.
3. No more than one output is shorted at a time. Duration of
the short circuit should not be greater than one second.
may overshoot VSS to -
OE
*Comments
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to this device.
These are stress ratings only. Functional operation of
this device at these or any other conditions above
those indicated in the operational sections of these
specification is not implied or intended. Exposure to
the absolute maximum rating conditions for extended periods
may affect device reliability.
Operating Ranges
Commercial (C) Devices
Ambient Temperature (T
Extended Range Devices
Ambient Temperature (T
VCC Supply Voltages
VCC for ± 10% devices ….. ….. . . . . . . . . . . +4.5V to +5.5V
Operating ranges define those limits between which the
functionally of the device is guaranteed.
A) . . . . . . . . . ……. . . . 0°C to +70°C
A) . . . . . . . . . …….. -40°C to +85°C
Device Bus Operations
This section describes the requirements and use of the
device bus operations, which are initiated through the
internal command register. The command register itself does
not occupy any addressable memory location. The register is
composed of latches that store the commands, along with
the address and data information needed to execute the
IL, H = Logic High = VIH, VID = 12.0 ± 0 .5V, X = Don 't Care, DIN = Data In, DOUT = Data Out , AIN = Address In
Note: See the "Sector Protection/Unprotection" section, for more information.
command. The contents of the register serve as inputs to the
internal state machine. The state machine outputs dictate the
function of the device. The appropriate device bus
operations table lists the inputs and control levels required,
and the resulting output. The following subsections describe
each of these operations in further detail.
OE
L
H
X
X
H
0 - I/O7
WE
H
L
X
X
H
A0 – A18
IN
A
IN
A
X
X
X
I/O
D
D
High-Z
High-Z
High-Z
OUT
IN
PRELIMINARY (December, 2004, Version 0.2) 4 AMIC Technology, Corp.
Page 6
A29040B Series
Requirements for Reading Array Data
To read array data from the outputs, the system must drive
the
selects the device.
data to the output pins.
and OE pins to VIL. CE is the power control and
CE
is the output control and gates array
OE
should remain at VIH all the time
WE
during read operation. The internal state machine is set for
reading array data upon device power-up, or after a
hardware reset. This ensures that no spurious alteration of
the memory content occurs during the power transition. No
command is necessary in this mode to obtain array data.
Standard microprocessor read cycles that assert valid
addresses on the device address inputs produce valid data
on the device data outputs. The device remains enabled for
read access until the command register contents are altered.
See "Reading Array Data" for more information. Refer to the
AC Read Operations table for timing specifications and to the
Read Operations Timings diagram for the timing waveforms,
CC1 in the DC Characteristics table represents the active
l
current specification for reading array data.
Writing Commands/Command Sequences
To write a command or command sequence (which includ es
programming data to the device and erasing sectors of
memory), the system must drive
to VIH. An erase operation can erase one sector,
OE
and CE to VIL, and
WE
multiple sectors, or the entire device. The Sector Address
Tables indicate the address range that each sector occupies.
A "sector address" consists of the address inputs required to
uniquely select a sector. See the "Command Definitions"
section for details on erasing a sector or the entire chip, or
suspending/resuming the erase operation.
After the system writes the autoselect command sequence,
the device enters the autoselect mode. The system can then
read autoselect codes from the internal register (which is
separate from the memory array) on I/O
7 - I/O0. Standard
read cycle timings apply in this mode. Refer to the
"Autoselect Mode" and "Autoselect Command Sequence"
sections for more information.
ICC2 in the Characteristics table represents the active current
specification for the write mode. The "AC Characteristics"
section contains timing specification tables and timing
diagrams for write operations.
Program and Erase Operation Status
During an erase or program operation, the system may
check the status of the operation by reading the status bits
7 - I/O0. Standard read cycle timings and ICC read
on I/O
specifications apply. Refer to "Write Operation Status" for
more information, and to each AC Characteristics section for
timing diagrams.
Standby Mode
When the system is not reading or writing to the device, it
can place the device in the standby mode. In this mode,
current consumption is greatly reduced, and the outputs are
placed in the high impedance state, independent of the
input.
The device enters the CMOS standby mode when the CE
pin is held at V
voltage range than V
mode when
standard access time (t
CC ± 0.5V. (Note that this is a more restrict ed
IH.) The device enters the TTL standby
is held at VIH. The device requires the
CE
CE) before it is ready to read data.
If the device is deselected during erasure or programming,
the device draws active current until the operation is
completed.
CC3 in the DC Characteristics tables represents the standby
I
current specification.
Output Disable Mode
When the OE input is at VIH, output from the device is
disabled. The output pins are placed in the high impedance
state.
PRELIMINARY (December, 2004, Version 0.2) 5 AMIC Technology, Corp.
Page 7
A29040B Series
Autoselect Mode
The autoselect mode provides manufacturer and device
identification, and sector protection verification, through
identifier codes output on I/O
7 - I/O0. This mode is primarily
intended for programming equipment to automatically match
a device to be programmed with its corresponding
programming algorithm. However, the autoselect codes can
also be accessed in-system through the command register.
When using programming equipment, the autoselect mode
requires V
ID (11.5V to 12.5 V) on address pinA9. Address
pins A6, A1, and AO must be as shown in Autoselect Codes
(High Voltage Method) table. In addition, when verifying
sector protection, the sector address must appear on the
appropriate highest order address bits. Refer to the
corresponding Sector Address Tables. The Command
Definitions table shows the remaining address bits that are
don't care. When all necessary bits have been set as
required, the programming equipment may then read the
corresponding identifier code on I/O
7 - I/O0.To access the
autoselect codes in-system, the host system can issue the
autoselect command via the command register, as shown in
the Command Definitions table. This method does not
require V
ID. See "Command Definitions" for details on using
the autoselect mode.
Table 3. A29040B Autoselect Codes (High Voltage Method)
Description A18 - A16
Manufacturer ID: AMIC X
A15 - A10
X
A9 A8 - A7
ID
V
X
A6
V
IL
A5 - A2
X VIL
A1
AO
VIL
Identifier Code on
7 - I/O0
I/O
37h
Device ID: A29040B X
Sector Protection
Verification
Sector
Address
X
X
ID
V
V
X
ID
X
ILX VIL
V
V
IL
X VIH
VIH
VIL
86h
01h (protected)
00h (unprotected)
Continuation ID X X VIDX VILX VIHVIH 7Fh
Sector Protection/Unprotection
The hardware sector protection feature disables both
program and erase operations in any sector. The hard ware
sector unprotection feature re-enables both program and
erase operations in previously protected sectors.
Sector protection/unprotection must be implemented using
programming equipment. The procedure requires a high
voltage (V
ID) on address pin A9 and the control pins.
The device is shipped with all sectors unprotected.
It is possible to determine whether a sector is protected or
unprotected. See "Autoselect Mode" for details.
Hardware Data Protection
The requirement of command unlocking sequence for
programming or erasing provides data protection against
inadvertent writes (refer to the Command Definitions table).
In addition, the following hardware data protection measures
prevent accidental erasure or programming, which might
otherwise be caused by spurious system level signals during
V
CC power-up transitions, or from system noise. The device
is powered up to read array data to avoid accidentally writing
data to the array.
Write Pulse "Glitch" Protection
Noise pulses of less than 5ns (typical) on OE,CE or WE
do not initiate a write cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of OE=VIL,
= VIH or WE = VIH. To initiate a write cycle, CE and
CE
must be a logical zero while OE is a logical one.
WE
Power-Up Write Inhibit
If
= CE = VIL and OE = VIH during power up, the
WE
device does not accept commands on the rising edge of
. The internal state machine is automatically reset to
WE
reading array data on the initial power-up.
Command Definitions
Writing specific address and data commands or sequences
into the command register initiates device operations. The
Command Definitions table defines the valid register
command sequences. Writing incorrect address and data
values or writing them in the improper sequence resets the
device to reading array data.
All addresses are latched on the falling edge of
WE
or CE,
whichever happens later. All data is latched on the rising
edge of
or CE, whichever happens first. Refer to the
WE
appropriate timing diagrams in the "AC Characteristics"
section.
Reading Array Data
The device is automatically set to reading array data
after device power-up. No commands are required to
retrieve data. The device is also ready to read array
data after completing an Embedded Program or
Embedded Erase algorithm. After the device accepts
an Erase Suspend command, the device enters the
Erase Suspend mode. The system can read array
data using the standard read t imings, except that if it
reads at an address within erase-suspended sectors,
the device outputs status data. After completing a
programming operation in the Erase Suspend mode, the
PRELIMINARY (December, 2004, Version 0.2) 6 AMIC Technology, Corp.
Page 8
A29040B Series
system may once again read array data with the same
exception. See "Erase Suspend/Erase Resume Commands"
for more information on this mode.
The system must issue the reset command to re-enable the
device for reading array data if I/O
5 goes high, or while in the
autoselect mode. See the "Reset Command" section, next.
See also "Requirements for Reading Array Data" in the
"Device Bus Operations" section for more information. The
Read Operations table provides the read parameters, and
Read Operation Timings diagram shows the timing diagram.
Reset Command
Writing the reset command to the device resets the device to
reading array data. Address bits are don't care for this
command. The reset command may be written between the
sequence cycles in an erase command sequence before
erasing begins. This resets the device to reading array data.
Once erasure begins, however, the device ignores reset
commands until the operation is complete.
The reset command may be written between the sequence
cycles in a program command sequence before
programming begins. This resets the device to reading array
data (also applies to programming in Erase Suspend mode).
Once programming begins, however, the device ignores
reset commands until the operation is complete.
The reset command may be written between the sequence
cycles in an autoselect command sequence. Once in the
autoselect mode, the reset command must be written to
return to reading array data (also applies to autoselect
during Erase Suspend).
5 goes high during a program or erase operation, writing
If I/O
the reset command returns the device to reading array data
(also applies during Erase Suspend).
Autoselect Command Sequence
The autoselect command sequence allows the host system
to access the manufacturer and devices codes, and
determine whether or not a sector is protected. The
Command Definitions table shows the address and data
requirements. This method is an alternative to that shown in
the Autoselect Codes (High Voltage Method) table, which is
intended for PROM programmers and requires V
ID on
address bit A9.
The autoselect command sequence is initiated by writing two
unlock cycles, followed by the autoselect command. The
device then enters the autoselect mode, and the system
may read at any address any number of times, without
initiating another command sequence.
A read cycle at address XX00h retrieves the manufacturer
code and another read cycle at XX03h retrieves the
continuation code. A read cycle at address XX01h returns
the device code. A read cycle containing a sector address
(SA) and the address 02h in returns 01h if that sector is
protected, or 00h if it is unprotected. Refer to the Sector
Address tables for valid sector addresses.
The system must write the reset command to exit the
autoselect mode and return to reading array data.
Byte Program Command Sequence
Programming is a four-bus-cycle operation. The program
command sequence is initiated by writing two unlock write
cycles, followed by the program set-up command. The
program address and data are written next, which in turn
initiate the Embedded Program algorithm. The system is not
required to provide further controls or timings. The device
automatically provides internally generated program pulses
and verify the programmed cell margin. The Command
Definitions table shows the address and data requirements
for the byte program command sequence.
When the Embedded Program algorithm is complete, the
device then returns to reading array data and addresses are
no longer latched. The system can determine the status of
the program operation by using I/O
7 or I/O6. See "Write
Operation Status" for information on these status bits.
Any commands written to the device during the Embedded
Program Algorithm are ignored. Programming is allowed in
any sequence and across sector boundaries. A bit ca nnot be
programmed from a "0" back to a "1 ". Attempting to do so
may halt the operation and set I/O
Polling algorithm to indicate the operation was
Data
5 to "1", or cause the
successful. However, a succeeding read will show that the
data is still "0". Only erase operations can convert a "0" to a
"1".
START
Write Program
Command
Sequence
Embedded
Program
algorithm in
progress
Data Poll
from System
Verify Data ?
No
Yes
Increment Address
Last Address ?
Programming
Yes
Completed
Note : See the appropriate Command Definitions table for
program command sequence.
Figure 1. Program Operation
PRELIMINARY (December, 2004, Version 0.2) 7 AMIC Technology, Corp.
Page 9
A29040B Series
Chip Erase Command Sequence
Chip erase is a six-bus-cycle operation. The chip erase
command sequence is initiated by writing two unlock cycles,
followed by a set-up command. Two additional unlock write
cycles are then followed by the chip erase command, which
in turn invokes the Embedded Erase algorithm. The device
does not require the system to preprogram prior to erase.
The Embedded Erase algorithm automatically preprograms
and verifies the entire memory for an all zero data pattern
prior to electrical erase. The system is not required to
provide any controls or timings during these operations. The
Command Definitions table shows the address and data
requirements for the chip erase command sequence.
Any commands written to the chip during the Embedded
Erase algorithm are ignored. The system can determine the
status of the erase operation by using I/O
7, I/O6, or I/O2. See
"Write Operation Status" for information on these status bits.
When the Embedded Erase algorithm is complete, the
device returns to reading array data and addresses are no
longer latched.
Figure 2 illustrates the algorithm for the erase operation. See
the Erase/Program Operations tables in "AC Characteristics"
for parameters, and to the Chip/Sector Erase Operation
Timings for timing waveforms.
Sector Erase Command Sequence
Sector erase is a six-bus-cycle operation. The sector erase
command sequence is initiated by writing two unlock cycles,
followed by a set-up command. Two additional unlock write
cycles are then followed by the address of the sector to be
erased, and the sector erase command. The Command
Definitions table shows the address and data requirements
for the sector erase command sequence.
The device does not require the system to preprogram the
memory prior to erase. The Embedded Erase algorithm
automatically programs and verifies the sector for an all zero
data pattern prior to electrical erase. The system is not
required to provide any controls or timings during these
operations.
After the command sequence is written, a sector erase timeout of 50µs begins. During the time-out period, additional
sector addresses and sector erase commands may be
written. Loading the sector erase buffer may be done in any
sequence, and the number of sectors may be from one
sector to all sectors. The time between these additional
cycles must be less than 50µs, otherwise the last address
and command might not be accepted, and erasure may
begin. It is recommended that processor interrupts be
disabled during this time to ensure all commands are
accepted. The interrupts can be re-enabled after the last
Sector Erase command is written. If the time between
additional sector erase commands can be assumed to be
less than 50µs, the system need not monitor I/O
command other than Sector Erase or Erase Suspend during
the time-out period resets the device to reading array data.
The system must rewrite the command sequence and any
additional sector addresses and commands.
The system can monitor I/O
timer has timed out. (See the " I/O
3 to determine if the sector erase
3: Sector Erase Timer"
section.) The time-out begins from the rising edge of the final
pulse in the command sequence.
WE
3. Any
Once the sector erase operation has begun, only the Erase
Suspend command is valid. All other commands are
ignored.
When the Embedded Erase algorithm is complete, the
device returns to reading array data and addresses are no
longer latched. The system can determine the status of the
erase operation by using I/O
7, I/O6, or I/O2. Refer to "Write
Operation Status" for information on these status bits.
Figure 2 illustrates the algorithm for the erase operation.
Refer to the Erase/Program Operations tables in the "AC
Characteristics" section for parameters, and to the Sector
Erase Operations Timing diagram for timing waveforms.
Erase Suspend/Erase Resume Commands
The Erase Suspend command allows the system to interrupt
a sector erase operation and then read data from, or
program data to, any sector not selected for erasure. This
command is valid only during the sector erase operation,
including the 50µs time-out period during the sector erase
command sequence. The Erase Suspend command is
ignored if written during the chip erase operation or
Embedded Program algorithm. Writing the Erase Suspend
command during the Sector Erase time-out immediately
terminates the time-out period and suspends the erase
operation. Addresses are "don't cares" when writing the
Erase Suspend command.
When the Erase Suspend command is written during a
sector erase operation, the device requires a maximum of
20µs to suspend the erase operation. However, when the
Erase Suspend command is written during the sector erase
time-out, the device immediately terminates the time-out
period and suspends the erase operation.
After the erase operation has been suspended, the system
can read array data from or program data to any sector not
selected for erasure. (The device "erase suspends" all
sectors selected for erasure.) Normal read and write timings
and command definitions apply. Reading at any address
within erase-suspended sectors produces status data on
7 - I/O0. The system can use I/O7, or I/O6 and I/O2
I/O
together, to determine if a sector is actively erasing or is
erase-suspended. See "Write Operation Status" for
information on these status bits.
After an erase-suspended program operation is complete,
the system can once again read array data within nonsuspended sectors. The system can determine the status of
the program operation using the I/O
as in the standard program operation. See "Write Operation
Status" for more information.
The system may also write the autoselect command
sequence when the device is in the Erase Suspend mode.
The device allows reading autoselect codes even at
addresses within erasing sectors, since the codes are not
stored in the memory array. When the device exits the
autoselect mode, the device reverts to the Erase Suspend
mode, and is ready for another valid operation. See
"Autoselect Command Sequence" for more information.
The system must write the Erase Resume command
(address bits are "don't care") to exit the erase suspend
mode and continue the sector erase operation. Further
writes of the Resume command are ignored. Another Erase
Suspend command can be written after the device has
resumed erasing.
7 or I/O6 status bits, just
PRELIMINARY (December, 2004, Version 0.2) 8 AMIC Technology, Corp.
Page 10
A29040B Series
START
Write Erase
Command
Sequence
No
Data Poll
from System
Data = FFh ?
Embedded
Erase
algorithm in
progress
Yes
Erasure Completed
Note :
1. See the appropriate Command Definitions table for erase
command sequences.
2. See "I/O
3
: Sector Erase Timer" for more information.
Figure 2. Erase Operation
PRELIMINARY (December, 2004, Version 0.2) 9 AMIC Technology, Corp.
Page 11
A29040B Series
Table 4. A29040B Command Definitions
Command
Sequence
(Note 1)
Read (Note 5) 1 RA RD
Reset (Note 6) 1 XXX F0
First Second Third Fourth Fifth Sixth
Cycles
Addr DataAddr DataAddr Data Addr Data Addr Data Addr Data
Legend:
X = Don't care
RA = Address of the memory location to be read.
RD = Data read from location RA during read operation.
PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the
whichever happens later.
PD = Data to be programmed at location PA. Data latches on the rising edge of
SA = Address of the sector to be verified (in autoselect mode) or erased. Address bits A18 - A16 select a unique sector.
Note:
1. See Table 1 for description of bus operations.
2. All values are in hexadecimal.
3. Except when reading array or autoselect data, all bus cycles are write operation.
4. Address bits A18 - A11 are don't cares for unlock and command cycles, unless SA or PA required.
5. No unlock or command cycles required when reading array data.
6. The Reset command is required to return to reading array data when device is in the autoselect mod e, or if I/O
(while the device is providing status data).
7. The fourth cycle of the autoselect command sequence is a read cycle.
8. T he data is 00h for an unprotected sector and 01h for a protected sector. See "Autosele ct Command Sequence" for more
information.
9. The system may read and program in non-er asing sectors, or enter the autoselect mode, when in the Erase Suspend mode.
10. The Erase Resume command is valid only during the Erase Suspend mode.
Manufacturer ID 4 555 AA2AA5555590X0037
Device ID 4 555 AA2AA5555590X0186
Continuation ID 4 555 AA2AA5555590X037F
Sector Protect Verify
(Note 8)
4 555 AA2AA5555590SA
X02
or CE pulse, whichever happens first.
WE
00
01
or CE pulse,
WE
5 goes high
PRELIMINARY (December, 2004, Version 0.2) 10 AMIC Technology, Corp.
Page 12
A29040B Series
Write Operation Status
Several bits, I/O2, I/O3, I/O5, I/O6, and I/O7, are provided in
the A29040B to determine the status of a write operation.
Table 5 and the following subsections describe the functions
of these status bits. I/O
7, I/O6 and I/O2 each offer a method
for determining whether a program or erase operation is
complete or in progress. These three bits are discussed first.
I/O7:
Data
Polling
START
Read I/O7-I/O
Address = VA
0
The
Polling bit, I/O7, indicates to the host system
Data
whether an Embedded Algorithm is in progress or
completed, or whether the device is in Erase Suspend.
Polling is valid after the rising edge of the final
WE
pulse in
Data
the program or erase command sequence.
During the Embedded Program algorithm, the device outputs
7 the complement of the datum programmed to I/O7.
on I/O
This I/O
7 status also applies to programming during Erase
Suspend. When the Embedded Program algorithm is
complete, the device outputs the datum programmed to I/O
7.
The system must provide the program address to read valid
status information on I/O
protected sector,
7. If a program address falls within a
Polling on I/O7 is active for
Data
approximately 2µs, then the device returns to reading array
data.
During the Embedded Erase algorithm,
produces a "0" on I/O
7. When the Embedded Erase algorithm
Data
Polling
is complete, or if the device enters the Erase Suspend mode,
Polling produces a "1" on I/O7.This is analogous to the
Data
complement/true datum output described for the Embedded
Program algorithm: the erase function changes all the bits in
a sector to "1"; prior to this, the device outputs the
"complement," or "0." The system must provide an address
within any of the sectors selected for erasure to read valid
status information on I/O
7.
After an erase command sequence is written, if all sectors
selected for erasing are protected,
Polling on I/O7 is
Data
active for approximately 100µs, then the device returns to
reading array data. If not all selected sectors are protected,
the Embedded Erase algorithm erases the unprotected
sectors, and ignores the selected sectors that are protected.
When the system detects I/O
complement to true data, it can read valid data at I/O
on the following read cycles. This is because I/O
change asynchronously with I/O
(
) is asserted low. The
OE
7 has changed from the
7 - I/O0
7 may
0 - I/O6 while Output Enable
Polling Timings (During
Data
Embedded Algorithms) figure in the "AC Characteristics"
section illustrates this. Table 5 shows the outputs for
Polling on I/O
7. Figure 3 shows the
Polling algorithm.
Data
Data
Yes
I/O7 = Data ?
No
No
Note :
1. VA = Valid address for programming. During a sector
erase operation, a valid address is an address within any
sector selected for erasure. During chip erase, a valid
address is any non-protected sector address.
2. I/O
7
should be rechecked even if I/O5 = "1" because
I/O
7
may change simultaneously with I/O5.
I/O5 = 1?
Yes
Read I/O7 - I/O
Address = VA
I/O7 = Data ?
No
FAIL
0
Yes
PASS
Figure 3. Data Polling Algorithm
PRELIMINARY (December, 2004, Version 0.2) 11 AMIC Technology, Corp.
Page 13
A29040B Series
vs. I/O
I/O6: Toggle Bit I
Toggle Bit I on I/O6 indicates whether an Embedded Program
or Erase algorithm is in progress or complete, or whether the
device has entered the Erase Suspend mode. Toggle Bit I
may be read at any address, and is valid after the rising edge
of the final
pulse in the command sequence (prior to
WE
the program or erase operation), and during the sector erase
time-out.
During an Embedded Program or Erase algorithm operation,
successive read cycles to any address cause I/O
(The system may use either
or CE to control the read
OE
cycles.) When the operation is complete, I/O
6 to toggle.
6 stops toggling.
After an erase command sequence is written, if all sectors
selected for erasing are protected, I/O
6 toggles for
approximately 100µs, then returns to reading array data. If
not all selected sectors are protected, the Embedded Erase
algorithm erases the unprotected sectors, and ignores the
selected sectors that are protected.
The system can use I/O
6 and I/O2 together to determine
whether a sector is actively erasing or is erase-suspended.
When the device is actively erasing (that is, the Embedded
Erase algorithm is in progress), I/O
device enters the Erase Suspend mode, I/O
However, the system must also use I/O
6 toggles. When the
6 stops toggling.
2 to determine which
sectors are erasing or erase-suspended. Alternatively, the
system can use I/O
7 (see the subsection on " I/O7 :
Data
Polling").
If a program address falls within a protected sector, I/O
6
toggles for approximately 2µs after the program command
sequence is written, then returns to reading array data.
6 also toggles during the erase-suspend-program mode,
I/O
and stops toggling once the Embedded Program algorithm is
complete.
The Write Operation Status table shows the outputs for
Toggle Bit I on I/O
6. Refer to Figure 4 for the toggle bit
algorithm, and to the Toggle Bit Timings figure in the "AC
Characteristics" section for the timing diagram. The I/O
I/O
6 figure shows the differences between I/O2 and I/O6 in
graphical form. See also the subsection on " I/O
2: Toggle Bit
2 vs.
II".
I/O2: Toggle Bit II
The "Toggle Bit II" on I/O2, when used with I/O6, indicates
whether a particular sector is actively erasing (that is, the
Embedded Erase algorithm is in progress), or whether that
sector is erase-suspended. Toggle Bit II is valid after the
rising edge of the final
sequence.
I/O
2 toggles when the system reads at addresses within
those sectors that have been selected for erasure. (The
system may use either
cycles.) But I/O
2 cannot distinguish whether the sector is
OE
actively erasing or is erase-suspended. I/O
indicates whether the device is actively erasing, or is in
Erase Suspend, but cannot distinguish which sectors are
selected for erasure. Thus, both status bits are required for
sector and mode information. Refer to Table 5 to compare
outputs for I/O
2 and I/O6.
Figure 4 shows the toggle bit algorithm in flowchart form, and
the section " I/O
also the " I/O
2: Toggle Bit II" explains the algorithm. See
6: Toggle Bit I" subsection. Refer to the Toggle
Bit Timings figure for the toggle bit timing diagram. The I/O
pulse in the command
WE
or
to control the read
CE
6, by comparison,
2
6 figure shows the differences between I/O2 and I/O6 in
graphical form.
Reading Toggle Bits I/O6, I/O2
Refer to Figure 4 for the following discussion. Whenever the
system initially begins reading toggle bit status, it must read
7 - I/O0 at least twice in a row to determine whether a
I/O
toggle bit is toggling. Typically, a system would note and
store the value of the toggle bit after the first read. After the
second read, the system would compare the new value of
the toggle bit with the first. If the toggle bit is not toggling, the
device has completed the program or erase operation. The
system can read array data on I/O
7 - I/O0 on the following
read cycle.
However, if after the initial two read cycles, the system
determines that the toggle bit is still toggling, the system also
should note whether the value of I/O
5). If it is, the system should then determine again
on I/O
5 is high (see the section
whether the toggle bit is toggling, since the toggle bit may
have stopped toggling just as I/O
5 went high. If the toggle bit
is no longer toggling, the device has successfully completed
the program or erase operation. If it is still toggling, the
device did not complete the operation successfully, and the
system must write the reset command to return to reading
array data.
The remaining scenario is that the system initially determines
that the toggle bit is toggling and I/O
system may continue to monitor the toggle bit and I/O
5 has not gone high. The
5
through successive read cycles, determining the status as
described in the previous paragraph. Alternatively, it may
choose to perform other system tasks. In this case, the
system must start at the beginning of the algorithm when it
returns to determine the status of the operation (top of Figure
4).
I/O5: Exceeded Timing Limits
I/O5 indicates whether the program or erase time has
exceeded a specified internal pulse count limit. Under thes e
conditions I/O
5 produces a "1." This is a failure condition that
indicates the program or erase cycle was not successfully
completed.
The I/O
5 failure condition may appear if the system tries to
program a "1 "to a location that is previously programmed t o
"0." Only an erase operation can change a "0" back to a "1."
Under this condition, the device halts the operation, and
when the operation has exceeded the timing limits, I/O
5
produces a "1."
Under both these conditions, the system must issue the reset
command to return the device to reading array data.
I/O3: Sector Erase Timer
After writing a sector erase command sequence, the system
may read I/O
operation has begun. (The sector erase timer does not apply
to the chip erase command.) If additional sectors are
selected for erasure, the entire time-out also applies after
each additional sector erase command. When the time-out is
complete, I/O
ignore I/O
additional sector erase commands will always be less than
50µs. See also the "Sector Erase Command Sequence"
section.
3 to determine whether or not an erase
3 switches from "0" to "1." The system may
3 if the system can guarantee that the time between
PRELIMINARY (December, 2004, Version 0.2) 12 AMIC Technology, Corp.
Page 14
A29040B Series
After the sector erase command sequence is written, the
system should read the status on I/O
7 (
Polling) or I/O6
Data
(Toggle Bit 1) to ensure the device has accepted the
command sequence, and then read I/O
3. If I/O3 is "1", the
internally controlled erase cycle has begun; all further
commands (other than Erase Suspend) are ignored until the
erase operation is complete. If I/O
3 is "0", the device will
accept additional sector erase commands. To ensure the
command has been accepted, the system software should
check the status of I/O
subsequent sector erase command. If I/O
3 prior to and following each
3 is high on the
second status check, the last command might not have been
accepted. Table 5 shows the outputs for I/O
3.
No
START
Read I/O7-I/O
Read I/O7-I/O
Toggle Bit
= Toggle ?
Yes
I/O5 = 1?
Yes
Read I/O7 - I/O
Twice
0
0
0
(Note 1)
No
(Notes 1,2)
Toggle Bit
No
= Toggle ?
Yes
Program/Erase
Operation Not
Commplete, Write
Reset Command
Program/Erase
Operation
Commplete
Notes :
1. Read toggle bit twice to determine whether or not it is
toggling. See text.
2. Recheck toggle bit because it may stop toggling as I/O
changes to "1". See text.
Figure 4. Toggle Bit Algorithm
5
PRELIMINARY (December, 2004, Version 0.2) 13 AMIC Technology, Corp.
ILOOutput Leakage Current VOUT = VSS to VCC, VCC = VCC Max
ICC1VCC Active Read Current
= VIL, OE = VIH
CE
2030 mA
±1.0 µA
(Notes 1,2)
ICC2VCC Active Program/Erase Current
= VIL, OE = VIH
CE
3040 mA
(Notes 2,3,4)
ICC3VCC Standby Current (Notes 2, 5)
= VCC ± 0.5 V
CE
1 5
VILInput Low Level -0.5 0.8 V
VIHInput High Level 0.7 x VCC VCC+0.3V
VIDVoltage for Autoselect and Sector
VCC = 5.25 V 10.5 12.5 V
Protect
VOLOutput Low Voltage IOL = 12.0 mA, VCC = VCC Min 0.45 V
VOH1 IOH = -2.5 mA, VCC = VCC Min 0.85 x VCC V
VOH2
Output High Voltage
I
OH = -100 µA. VCC = VCC Min
VCC-0.4 V
µA
µA
µA
Notes for DC characteristics (both tables):
1. The I
2. Maximum I
3. I
CC current listed includes both the DC operation current and the frequency dependent component (at 6 MHz).
The frequency component typically is less than 2 mA/MHz, with
CC specifications are tested with VCC = VCC max.
CC active while Embedded Algorithm (program or erase) is in progress.
OE
at VIH.
4. Not 100% tested.
5. For CMOS mode only, I
CC3 = 20µA max at extended temperatures (> +85°C)
PRELIMINARY (December, 2004, Version 0.2) 15 AMIC Technology, Corp.
Page 17
A29040B Series
AC Characteristics
Read Only Operations
Parameter Symbols Speed
JEDEC
tAVAV tRC
tAVQV
tELQV
tGLQV tOE
Std
ACC
t
CE
t
Read Cycle Time (Note 2)
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Output Enable Hold
Time (Note 2)
Chip Enable to Output High Z
DF
tEHQZ
tOEH
t
(Notes 1,2)
tGHQZ
t
Output Enable to Output High Z
DF
(Notes 1,2)
tAXQX
t
Output Hold Time from Addresses,
OH
or OE, Whichever Occurs First
CE
Description Test Setup
-55 -70
Read
Toggle and
Polling
Data
CE
OE
OE
= VIL
= VIL
= VIL
Min.
Max.
Max.
Max.
Min.
Min.
Max.
55
55
55
30
0
10
18 20
Max.18
Min.
0
70
70
70
30
0
10
20
0
Notes:
1. Output driver disable time.
2. Not 100% tested.
-90
90
90
90
35
0
10
20
20
0
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
Timing Waveforms for Read Only Operation
AddressesAddresses Stable
t
CE
OE
WE
Output
0V
t
OEH
High-Z
ACC
t
CE
t
RC
t
OE
Output Valid
t
DF
t
OH
High-Z
PRELIMINARY (December, 2004, Version 0.2) 16 AMIC Technology, Corp.
Page 18
A29040B Series
AC Characteristics
Erase and Program Operations
Parameter Symbols Speed
JEDEC
tAVAV
tAVWL
tWLAX
tDVWH
tWHDX
tGHWL
tELWL tCS
tWHEH
tWLWH
Std
t
WC
AS
t
AH
t
DS
t
DH
t
OES
t
GHWL
t
CH
t
WP
t
Write Cycle Time (Note 1)
Address Setup Time
Address Hold Time
Data Setup Time
Data Hold Time
Output Enable Setup Time
Read Recover Time Before Write
(
high to WE low)
OE
Setup Time
CE
Hold Time
CE
Write Pulse Width
Description
Min.
Min.
Min.
Min.
Min.
Min.
Min.
Min.
Min.
Min.
Min.
-55 -70
55
70
0
40
25
45
30
0
0
0
0
0
30
35
20
tWHWL tWPH Write Pulse Width High
tWHWH1
t
WHWH1
Byte Programming Operation
(Note 2)
Max.
Typ.
50
7
-90
90
45
45
45
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
µs
tWHWH2 tWHWH2
Sector Erase Operation
Typ.
(Note 2)
VCS
t
VCC Set Up Time (Note 1)
Min.
Notes:
1. Not 100% tested.
2. See the "Erase and Programming Performance" section for more information.
1
50
sec
µs
PRELIMINARY (December, 2004, Version 0.2) 17 AMIC Technology, Corp.
Page 19
A29040B Series
Timing Waveforms for Program Operation
Addresses
CE
OE
WE
Data
tVCS
VCC
Note : PA = program addrss, PD = program data, Dout is the true data at the program address.
Program Command Sequence (last two cycles)
tWC
555h
tGHWL
tCS
tCH
tWP
tDS
A0hPD
tAS
PA
tAH
tWPH
tDH
Read Status Data (last two cycles)
~
~
PA
~
~
~
~
~
~
tWHWH1
~
~
~
~
~
~
Status
PA
D
OUT
Timing Waveforms for Chip/Sector Erase Operation
Erase Command Sequence (la s t t w o cyc les)
tAS
SA
555h for chip erase
tWPH
tDH
10h for chip erase
Addresses
CE
OE
WE
Data
VCC
tWC
2AAh
tGHWL
tCH
tWP
tCS
tDS
55h30h
tVCS
tAH
~
~
~
~
~
~
~
~
~
~
tWHWH2
~
~
~
~
Read Status Data
VA
In
Progress
VA
Complete
Note : SA = Sector Address. VA = Valid Address for reading status data.
PRELIMINARY (December, 2004, Version 0.2) 18 AMIC Technology, Corp.
Page 20
A29040B Series
Timing Waveforms for
Polling (During Embedded Algorithms)
Data
tRC
Addresses
tACC
CE
tCH
OE
tOEH
WE
I/O7
I/O
0 - I/O6
Note : VA = Valid Address. Illustation shows first status cycl e af ter command sequence, last status read cycle, and array data
read cycle.
tCE
tOE
tDF
tOH
Complement
Status Data
~
~
VAVAVA
~
~
~
~
~
~
~
~
~
~
ComplementTrue
~
~
Status DataTrue
Valid Data
Valid Data
High-Z
High-Z
Timing Waveforms for Toggle Bit (During Embedded Algorithms)
tRC
Addresses
CE
OE
WE
I/O6 , I/O2
tCH
tOEH
VAVA
tACC
tCE
tOE
tDF
tOH
Valid Status
(first read)(second read)(stop togging)
VA
Valid Status
~
~
~
~
~
~
~
~
~
~
~
~
Valid Status
VA
Valid Status
Note: VA = Valid Address; not required for I/O6. Illustration shows first two status cycle after command sequence, last status
read cycle, and array data read cycle.
PRELIMINARY (December, 2004, Version 0.2) 19 AMIC Technology, Corp.
Page 21
A29040B Series
Timing Waveforms for I/O2 vs. I/O6
Enter
Embedded
Erasing
WE
I/O
6
I/O
2
I/O
Note : Both I/O6 and I/O2 toggle with OE or CE. See the text on I/O6 and I/O2 in the section "Write Operation Statue" for
more information.
AC Characteristics
Erase and Program Operations
Alternate
Controlled Writes
CE
Erase
Suspend
~
~
Erase
~
~
~
~
2
and I/O6 toggle with OE and CE
~
~
Erase Suspend
Read
~
~
~
~
Enter Erase
Suspend Program
~
~
Erase
Suspend
Program
~
~
~
~
Resume
~
~
Erase Suspend
Read
~
~
~
~
Erase
~
Erase
~
~
~
Complete
~
~
Erase
Parameter Symbols Speed
JEDEC Std
tAVAV tWC Write Cycle Time (Note 1) Min.55 70 90 ns
tAVEL tAS Address Setup Time Min.0 ns
tELAX tAH Address Hold Time Min.40 45 45 ns
tDVEH tDS Data Setup Time Min.25 30 45 ns
tEHDX tDH Data Hold Time Min.0 ns
tGHEL tGHEL Read Recover Time Before Write Min.0 ns
tWLEL tWS
Sector Erase Time 1 8 sec
Chip Erase Time 8 64 sec
Byte Programming Time 35 300
µs
Chip Programming Time (Note 3) 3.6 10.8 sec
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 5.0V VCC, 100,000 cycles. Additionally,
programming typically assumes checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 4.5V (4.75V for -55), 100,000 cycles.
3. The typical chip programming time is considerabl y less than the maximum chip programming time listed, since most bytes
program faster than the maximum byte program time listed. If the maximu m byte program time given is excee ded, only then
does the device set I/O
5 = 1. See the section on I/O5 for further information.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h befor e erasure.
5. System-level overhead is the time required to execute the four-bus-c ycle command sequence for pro gramming. See Table 4
for further information on command definitions.
6. The device has a guaranteed minimum erase and progra m cycle endurance of 100,000 cycles.
Excludes 00h programming
prior to erasure (Note 4)
Excludes system-level
overhead (Note 5)
PRELIMINARY (December, 2004, Version 0.2) 21 AMIC Technology, Corp.
Page 23
A29040B Series
Latch-up Characteristics
Description Min. Max.
Input Voltage with respect to VSS on all I/O pins
-1.0V
VCC+1.0V
VCC Current
Includes all pins except VCC. Test conditions: VCC = 5.0V, one pin at time.
TSOP Pin Capacitance
Parameter Symbol
CIN Input Capacitance
COUT
CIN2
Output Capacitance
Control Pin Capacitance
Notes:
1. Sampled, not 100% tested.
2. Test conditions T
A = 25°C, f = 1.0MHz
Parameter Description
Test Setup
PLCC and P-DIP Pin Capacitance
Parameter Symbol
CIN
COUT
CIN2
Input Capacitance
Output Capacitance
Control Pin Capacitance
Parameter Description
Test Setup
IN=0
V
V
OUT=0
V
IN=0
V
IN=0
OUT=0
V
V
PP=0
-100 mA
Typ.
6
8.5
7.5
Typ.
4
8
8
+100 mA
Max.
7.5
12
9
Unit
pF
pF
pF
Max. Unit
6
12
12
pF
pF
pF
Notes:
1. Sampled, not 100% tested.
2. Test conditions T
A = 25°C, f = 1.0MHz
Data Retention
Parameter
Minimum Pattern Data Retention Time
Test Conditions
150°C
125°C
Min
Unit
10 Years
20 Years
PRELIMINARY (December, 2004, Version 0.2) 22 AMIC Technology, Corp.
Page 24
A29040B Series
Test Conditions
Table 6. Test Specifications
Test Condition -55 All others Unit
Output Load 1 TTL gate
Output Load Capacitance, CL(including jig capacitance) 30 100 pF
Input Rise and Fall Times 5 20 ns
Input Pulse Levels 0.0 - 3.0 0.45 - 2.4 V
Input timing measurement reference levels 1.5 0.8, 2.0 V
Output timing measurement reference levels 1.5 0.8, 2.0 V
5.0 V
2.7 K
Ω
Device
Under
Test
6.2 K
C
L
Ω
Diodes = IN3064 or Equivalent
Figure 7. Test Setup
PRELIMINARY (December, 2004, Version 0.2) 23 AMIC Technology, Corp.