The 74VHCT16244A is an advanced high-speed
CMOS16-BITBUSBUFFER(3-STATE)
fabricated with sub-micron silicon gate and
double-layer metal wiring C
Any nG
output con trolgoverns four BUS
BUFFERS. Output Enable inputs (nG
2
MOS tecnology.
)tied
together give full 16 bit operation.
When nG
nG
is LOW, the outputs are enabled. When
is HIGH, the output are in high impedance
state.
The device is designed to be used with 3-state
memory address drivers, et c.
Power down protection is provided on all inputs
and 0 t o 7V can be accepted on inputs with no
regard to t he supply voltage. This device can be
usedto interface 5V to 3V.
All inputs and outpu ts are equipped with protection circuits against static discharge, giving them
2KV ESD immunity and transient excess vo ltage.
1/9February 2003
Page 2
74VHCT16244A
INPUT EQUIVALENT CIRCUIT
PIN DESCRIPTION
PIN NoSYMBOLNAME AND FUNCTION
11G
2, 3, 5, 61Y1 to 1Y4 Data Outputs
8, 9, 11, 122Y1 to 2Y4 Data Outputs
13, 14, 16, 17 3Y1 to 3Y4 Data Outputs
19, 20, 22, 23 4Y1 to 4Y4 Data Outputs
244G
253G
30, 29, 27, 26 4A1 to 4A4 Data Outputs
36, 35, 33, 32 3A1 to 3A4 Data Outputs
41, 40, 38, 37 2A1 to 2A4 Data Outputs
47, 46, 44, 43 1A1 to 1A4 Data Outputs
482G
4, 10, 15, 21,
28, 34, 39, 45
7, 18, 31, 42
GNDGround (0V)
V
CC
Output Enable Input
Output Enable Input
Output Enable Input
Output Enable Input
Positive Supply Voltage
TRUTH TABLE
INPUTSOUTPUT
G
LLL
LHH
HXZ
X : Don‘tCare
Z : High Impedance
AnYn
IEC L OGIC SYMBOLS
2/9
Page 3
74VHCT16244A
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
V
I
I
OK
I
or I
I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
RECOMMENDED OPERATING CONDITIONS
SymbolParameterValueUnit
V
V
V
T
dt/dvInput Rise and Fall Time (note 1) (Vcc= 5.0±0.5V)
1) VINfrom0.8V to 2.0V
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage-0.5 to VCC+ 0.5
O
DC Input Diode Current
IK
DC Output Diode Current
DC Output Current
O
DC VCCor Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
Supply Voltage
CC
Input Voltage
I
Output Voltage0 to V
O
Operating Temperature
op
-0.5 to +7.0V
-0.5 to +7.0V
-20mA
± 20mA
± 25mA
± 75mA
-65 to +150°C
300°C
4.5 to 5.5V
0 to 5.5V
CC
-55 to 125°C
0 to 20ns/V
V
V
3/9
Page 4
74VHCT16244A
DC SPECIFICATIONS
SymbolParameter
V
V
V
I
High Level Input
IH
Voltage
V
Low Level Input
IL
Voltage
High Level Output
OH
Voltage
Low Level Output
OL
Voltage
High Impedance
I
OZ
Output Leakage
Current
Input Leakage
I
I
Current
Quiescent Supply
CC
Current
Test ConditionValue
= 25°C
T
V
CC
(V)
4.5to
5.5
A
Min.Typ. Max.Min.Max. Min. Max.
222V
4.5to
5.5
4.5
4.5
4.5
4.5
5.5
0to
5.5
5.5
IO=-50 µA
=-8 mA
I
O
IO=50 µA
=8 mA
I
O
I=VIH
or V
IL
V
VO=VCCor GND
V
= 5.5V or GND
I
V
I=VCC
or GND
4.44.54.44.4
3.943.83.7
0.00.10.10.1
±0.25± 2.5± 2.5µA
-40 to 85°C -55 to 125°C
Unit
0.80.80.8V
V
0.360.440.55
V
± 0.1± 1± 1µA
44040µA
AC ELECTRICAL CHARACTERISTICS (Input t
r=tf
=3ns)
Test ConditionValue
SymbolParameter
t
t
t
t
PHZ
t
t
PZH
(*) Voltagerangeis5.0V ± 0.5V
Propagation Delay
PLH
Time
PHL
Output Disable
PLZ
Time
Output Enable
PZL
Time
T
(*)
(V)
C
(pF)
L
V
CC
A
Min.Typ. Max.Min.Max. Min. Max.
5.0155.48.51.09.51.010.0
5.05079.51.010.51.011.0
5.015
5.0508.211.41.013.01.013.0
RL = 1KΩ
7.710.41.012.01.012.0
5.050RL = 1KΩ8.811.41.013.01.013.0ns
-40 to 85°C -55 to 125°C
Unit
ns
ns
= 25°C
CAPACITIVE CHARACTERISTICS
Test ConditionValue
= 25°C
SymbolParameter
V
CC
(V)
C
C
C
Input Capacitance
IN
Output
OUT
Capacitance
Power Dissipation
PD
Capacitance
5.0
= 10MHz
f
IN
T
A
Min.Typ. Max.Min.Max. Min. Max.
4101010pF
6pF
21pF
(note 1)
1) CPDis defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
Latch)
-40 to 85°C -55 to 125°C
CC(opr)=CPDxVCCxfIN+ICC
Unit
/16 (per
4/9
Page 5
74VHCT16244A
DYNAMIC SWITCHING CHARACTERISTICS
Test ConditionValue
= 25°C
SymbolParameter
V
V
Dynamic Low
OLP
Voltage Quiet
OLV
Output (note 1, 2)
V
(V)
5.0
CC
T
A
Min.Typ. Max.Min.Max. Min. Max.
0.60.9
-0.9-0.6
Dynamic High
V
IHD
Voltage Input
5.03.5V
C
L
=50pF
(note 1, 3)
Dynamic Low
V
ILD
Voltage Input
5.01.5V
(note 1, 3)
1) Worst case package.
2) Max number of outputs defined as (n). Data inputs are driven 0V to 5.0V, (n-1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 5.0V. Inputs under test switching: 5.0V to threshold (V
), f=1MHz.
(V
IHD
TEST CIRCUIT
-40 to 85°C -55 to 125°C
ILD
Unit
V
), 0V to threshold
TESTSWITCH
t
PLH,tPHL
t
PZL,tPLZ
t
PZH,tPHZ
CL= 15/50 pF or equivalent (includes jig and probe capacitance)
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of use o f suc h inf ormat ion n or f or an y infr ingeme nt of paten ts or oth er ri gh ts of third part ies whic h may resul t f rom
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco