The 74LVX238 is a low voltage CMOS 3 TO 8
LINE DECODER fabricated with sub-micron
silicon gate and double-layer metal wiring C
2
MOS
technology. It is ideal for low power, battery
operated and low noise 3.3V applications.
If the device is enabled, 3 binary select (A, B, and
C) determine which one of the outputs will go high.
If enable input G1 is held low or either G2A
or G2B
TSSOPSOP
ORDER CODES
PACKAGETUBET & R
SOP74LVX238M74LVX238MTR
TSSOP74LVX238TTR
is held high, the decoding function is inhibited and
all the 8 outputs go low.
Tree enable inpu ts are provided to ease cascade
connection and application of address decoders
for memory systems.
Power down protection is provided on all inputs
and 0 to 7V can be accepted on inputs with no
regard to the supply voltage.
This device can be used to interface 5V to 3V
system. It combines high speed performance with
the true CMOS low power consumption.
All inputs and outputs are equipped with
protection circuits against stat ic discharge, giving
them 2KV ESD immunity and transient excess
voltage.
This log i c diagram has not be used to esti m at e propagation delays
2/9
Page 3
74LVX238
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
V
I
I
OK
I
I
or I
CC
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
RECOMMENDED OPERATING CONDITIONS
SymbolParameterValueUnit
V
V
V
T
dt/dv
1) Truth T abl e guarante ed: 1.2V to 3.6 V
from 0.8V to 2.0V
2) V
IN
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage-0.5 to VCC + 0.5
O
DC Input Diode Current
IK
DC Output Diode Current
DC Output Current
O
DC VCC or Ground Current
GND
Storage Temperature
stg
Lead Temperature (10 sec)
L
Supply Voltage (note 1)
CC
Input Voltage
I
Output Voltage0 to V
O
Operating Temperature
op
Input Rise and Fall Time (note 2) (V
= 3.3V)
CC
-0.5 to +7.0V
-0.5 to +7.0V
- 20mA
± 20mA
± 25mA
± 50mA
-65 to +150°C
300°C
2 to 3.6V
0 to 5.5V
CC
-55 to 125°C
0 to 100ns/V
V
V
DC SPECIFICATIONS
SymbolParameter
V
V
V
V
I
High Level Input
IH
Voltage
Low Level Input
IL
Voltage
High Level Output
OH
Voltage
Low Level Output
OL
Voltage
I
Input Leakage
I
Current
Quiescent Supply
CC
Current
Test ConditionValue
V
(V)
CC
T
A
Min.Typ. Max.Min. Max.Min.Max.
-40 to 85°C -55 to 125°C
= 25°C
2.01.51.51.5
3.62.42.42.4
2.00.50.50.5
3.60.80.80.8
=-50 µA
2.0
3.0
2.0
3.0
3.6
3.6
I
O
I
=-50 µA
O
I
=-4 mA
O
=50 µA
I
O
I
=50 µA
O
I
=4 mA
O
= 5V or GND
V
I
= VCC or GND
V
I
1.92.01.91.9
2.93.02.92.9
2.582.482.4
0.00.10.10.1
0.00.10.10.1
0.360.440.55
± 0.1± 1± 1µA
22020µA
Unit
V3.02.02.02.0
V3.00.80.80.8
V3.0
V3.0
3/9
Page 4
74LVX238
DYNAMIC SWITCHING CHARACTERISTICS
Test ConditionValue
T
SymbolParameter
V
V
V
Dynamic Low
OLP
Voltage Quiet
OLV
Output (note 1, 2)
Dynamic High
IHD
Voltage Input (note
V
CC
(V)
3.3
3.32
= 50 pF
C
L
= 25°C
A
Min.Typ. Max.Min.Max.Min. Max.
0.30.5
-0.5-0.3
1, 3)
V
Dynamic Low
ILD
Voltage Input (note
3.30.8
1, 3)
1) Worst c ase package .
2) Max number of outp ut s defined as (n). Data inputs are driven 0V to 3.3V, (n-1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.3V. Inputs under test switching: 3.3V to threshold (V
(V
), f=1MHz.
IHD
AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3ns)
Test ConditionValue
T
SymbolParameter
t
PLH tPHL
Propagation Delay
Time
A, B, C to Y
3.3
3.3
t
PLH tPHL
Propagation Delay
Time
G1 to Y
3.3
3.3
t
PLH tPHL
Propagation Delay
Time
or G2B to Y
G2A
3.3
3.3
t
OSLH
t
OSHL
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switching in the same direction, either HI GH or LOW
2) Param eter guaran teed by design
(*) Vol tage range is 3.3V ±
Output To Output
Skew Time (note1,
2)
0.3V
3.3
C
V
CC
(V)
L
(pF)
2.7157.113.81.016.51.018.5
2.7509.617.31.020.01.022.0
(*)
155.58.81.010.51.011.5
(*)
508.012.31.014.01.015.0
2.7158.716.31.019.51.0205
2.75011.219.81.023.01.025.0
(*)
156.810.61.012.51.013.5
(*)
509.314.11.016.01.017.0
2.7158.816.01.018.51.019.5
2.75011.319.51.022.01.023.0
(*)
156.910.41.011.51.013.5
(*)
509.413.91.015.01.017.0
2.7500.51.01.51.5
(*)
50
= 25°C
A
Min.Typ. Max.Min.Max.Min. Max.
0.51.01.51.5
-40 to 85°C -55 to 125°C
), 0V to threshold
ILD
-40 to 85°C -55 to 125°C
Unit
V
Unit
ns
ns
ns
ns
4/9
Page 5
74LVX238
CAPACITIVE CHARACTERISTICS
Test ConditionValue
T
SymbolParameter
C
C
Input Capacitance
IN
Power Dissipation
PD
Capacitance
V
CC
(V)
3.34101010pF
= 10MHz
3.3
f
IN
= 25°C
A
Min.Typ. Max.Min.Max.Min. Max.
34pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (R ef er to Test Circ ui t). Averag e operating current can be obtained by t he following equation. I
TEST CIRCUIT
-40 to 85°C -55 to 125°C
= CPD x VCC x f
CC(opr)
+ I
IN
CC
Unit
CL =15/50pF or equivalent (i ncludes jig and probe cap acitance)
R
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