74LVT32244 • 74LVTH32244
Low Voltage 32-Bit Buffer/Line Driver
with 3-STATE Outputs (Preliminary)
Preliminary
74LVT32244 • 74LVTH32244 Low Voltage 32-Bit Buffer/Line Driver with 3-STATE Outputs (Preliminary)
January 2001
Revised August 2001
General Description
The LVT32244 and LVTH32244 contain thirty-two noninverting buffers with 3-STATE outputs designed to be
employed as a memor y an d ad dr ess d rive r, clock driver, or
bus oriented transm itter /re cei ve r. The device is n ibbl e co ntrolled. Individual 3-STATE control inputs can be shorted
together for 8-bit, 16-bit, or 32-bit operation.
The LVTH32244 data inputs includ e bushold, eliminating
the need for external pull-up resistors to hold unused
inputs.
These buffers and line drivers are designed for low-voltage
(3.3V) V
TTL interface to a 5V environment. The LVT32244 and
LVTH32244 are fabricated with an advanced BiCMOS
technology to achieve high speed ope ration similar to 5V
ABT while maintaining a low power dissipation
applications, but with the capability to provide a
CC
Features
■ Input and output interface capability to systems at
5V V
CC
■ Bushold data inputs eliminate the need for external
pull-up resistors to hold unused inputs (74LVTH32244),
also available without bushold feature (74LVT32244).
■ Live insertion/extraction per mi tt ed
■ Power Up/Down high impedance provides glitch-free
bus loading
■ Outputs source/sink
■ ESD performance:
Human-body model
Machine model
Charged-device model
■ Packaged in plastic Fine-Pitch Ball Grid Array (FBGA)
(Preliminary)
−32 mA/+64 mA
> 2000V
> 200V
Ordering Code:
Order NumberPackage NumberPackage Description
74LVT32244GX
(Note 1)
74LVTH32244GX
(Note 1)
Note 1: BGA package available in Tape and Reel only.
AO
BO3O2GND GNDI
CO5O4V
DO7O6GND GNDI
EO9O8GND GNDI
FO11O10V
GO13O12GND GNDI
HO14O15OE4OE3I
JO17O16OE5OE6I
KO19O18GND GNDI
LO
MO
NO25O24GND GNDI
PO27O26V
RO29O28GND GNDI
TO
O0OE1OE2I
1
CC1VCC1I4
CC1VCC1I10I11
21O20VCC2VCC2I20I21
23O22
30O31
GND GNDI
CC2VCC2I26I27
OE8OE7I
0
2
6
8
12I13
15I14
16I17
18I19
22I23
24I25
28I29
31I30
Truth Tables
InputsOutputs
OE
1
LLL
LHH
HXZ
InputsOutputs
OE
2
LLL
LHH
HXZ
InputsOutputs
OE
3
LLL
LHH
HXZ
InputsOutputs
OE
4
LLL
LHH
HXZ
InputsOutputs
OE
5
LLL
LHH
HXZ
I
1
I
3
I
5
I
7
I
9
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial (HIGH or LOW, inputs may not float)
Z = High Impedance
InputsOutputs
OE
6
LLL
LHH
HXZ
InputsOutputs
OE
7
LLL
LHH
HXZ
InputsOutputs
OE
8
LLL
LHH
HXZ
I0-I
I4-I
I8-I
I12-I
I16-I
I20-I
I24-I
I28-I
3
7
11
15
19
23
27
31
O0-O
O4-O
O8–O
O12-O
O16-O
O20-O
O24-O
O28-O
3
7
11
15
19
23
27
31
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Page 3
Functional Description
The 74LVT32244 and 74LVTH32244 contain thirty-two
non-inverting bu ffers with 3-STATE outputs. The device is
nibble (4 bits) controlled with each nibble functioning identically, but independent of the other. The contro l pins can be
shorted together to obtain full 32-bit operation. The
Logic Diagrams
Byte 1Byte 2
Byte 3Byte 4
Preliminary
3-STATE outputs are controlled by an Output Enable (OE
input. When OE
mode. When OE
high impedance mode but this does not interfere with
entering new data into the inputs.
is LOW, the outputs are in the 2-state
n
is HIGH, the standard o utputs a re in the
n
)
n
74LVT32244 • 74LVTH32244
V
is associated with Bytes 1 and 2.
CC1
is associated with Bytes 3 and 4.
V
CC2
Note: Please note that these diagrams are provided only for the unders t anding of logic operatio ns and should not be used to estimate propagation delays.
3www.fairchildsemi.com
Page 4
Preliminary
Absolute Maximum Ratings(Note 2)
SymbolParameterValueConditionsUnits
V
CC
V
I
V
O
Supply Voltage−0.5 to +4.6V
DC Input Voltage−0.5 to +7.0V
Output Voltage−0.5 to +7.0Output in 3-STATE
−0.5 to +7.0Output in High or Low State (Note 3)
I
IK
I
OK
I
O
I
CC
I
GND
74LVT32244 • 74LVTH32244
T
STG
DC Input Diode Current−50VI < GNDmA
DC Output Diode Current−50VO < GNDmA
DC Output Current64VO > VCCOutput at HIGH State
128V
> VCCOutput at LOW State
O
DC Supply Current per Supply Pin±64mA
DC Ground Current per Ground Pin±128mA
Storage Temperature−65 to +150°C
Recommended Operating Conditions
SymbolParameterMinMaxUnits
V
CC
V
I
I
OH
I
OL
T
A
∆t/∆VInput Edge Rate, V
Note 2: Absolute Maximum continuous ratings are those values beyond which damage to the device may occur. Exposure to these conditions or conditions
beyond those indic ated may adversely affec t device reliability. Functional operation under absolu t e m ax imum rated conditions is not implied.
Input Clamp Diode Voltage2.7−1.2VII =−18 mA
Input HIGH Voltage2.7–3.62.0VVO ≤ 0.1V or
Input LOW Voltage2.7–3.60.8VVO ≥ VCC − 0.1V
Output HIGH Voltage2.7–3.6VCC − 0.2
Output LOW Voltage2.70.2
Bushold Input Minimum Drive3.075
Bushold Input Over-Drive3.0500
Input Current3.610
Control Pins3.6±1V
Data Pins3.6
Power Off Leakage Current0±100µA0V ≤ VI or VO ≤ 5.5V
Power Up/Down
3-STATE CurrentVI = GND or V
3-STATE Output Leakage Current3.6−5µAVO = 0.5V
3-STATE Output Leakage Current3.65µAVO = 3.0V
+3-STATE Output Leakage Current3.610µAVCC < VO ≤ 5.5V
CC
(V)MinMax
2.72.4I
3.02.0IOH =−32 mA
2.70.5I
3.00.4IOL = 16 mA
3.00.5IOL = 32 mA
3.00.55IOL = 64 mA
0 – 1.5V±100µA
TA = −40°C to +85°C
−5V
1V
UnitsConditions
IOH =−100 µA
V
V
µA
µA
µA
=−8 mA
OH
IOL = 100 µA
= 24 mA
OL
VI = 0.8V
(Note 5)
VI = 5.5V
= 0V or V
I
= 0V
I
= V
I
CC
VO = 0.5V to 3.0V
CC
CC
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Page 5
DC Electrical Characteristics (Continued)
Preliminary
74LVT32244 • 74LVTH32244
V
SymbolParameter
I
CCH
I
CCL
I
CCZ
I
CCZ
∆I
Note 4: Applies t o bushold versions only (LVTH32244).
Note 5: An external driver must source at least the specified current to switch from LOW-to-HIGH.
Note 6: An external driver must sink at least the specified current to switch from HIGH-to-LOW.
Note 7: This is the increase in supply c urrent for each input that is at the specified volt age level rather than V
Power Supply CurrentV
Power Supply CurrentV
Power Supply CurrentV
+Power Supply CurrentV
Increase in Power Supply Current3.60.2mAOne Input at VCC − 0.6V
CC
(Note 7)V
CC1
CC1
CC1
CC1
CC1
or V
or V
or V
or V
or V
CC2
CC2
CC2
CC2
CC2
CC
(V)MinMax
3.60.19mAOutputs High
3.65.0mAOutputs Low
3.60.19mAOutputs Disabled
3.60.19mAVCC ≤ VO ≤ 5.5V,
TA =−40°C to +85°C
Dynamic Switching Characteristics (Note 8)
V
SymbolParameter
V
OLP
V
OLV
Note 8: Characterized in SSOP package. Guaranteed parameter, but not tested.
Note 9: Max number of outputs defined as (n). n−1 data inputs are driven 0V to 3V. Output under test held LOW.
Quiet Output Maximum Dynamic V
Quiet Output Minimum Dynamic V
OL
CC
(V)MinTypMax
3.30.8V(Note 9)
OL
3.3−0.8V(Note 9)
TA = 25°C
AC Electrical Characteristics
TA =−40°C to +85°C
SymbolParameter
t
t
t
t
t
t
PLH
PHL
PZH
PZL
PHZ
PLZ
Propagation Delay Data to Output1.23.51.23.9
Output Enable Time1.24.01.25.0
Output Disable Time2.04.72.05.2
CL = 50 pF, RL = 500Ω
VCC = 3.3V ± 0.3VVCC = 2.7V
MinMaxMinMax
1.23.51.23.9
1.25.01.26.5
1.54.21.54.4
UnitsConditions
Outputs Disabled
Other Inputs at VCC or GND
or GND.
CC
Units
CL = 50 pF, RL = 500Ω
Conditions
Units
ns
ns
ns
Capacitance
(Note 10)
SymbolParameterConditionsTypicalUnits
C
IN
C
OUT
Note 10: Capacita nc e is m easured at frequency f = 1 MHz, per MIL-STD -883, Method 3012.
Input CapacitanceVCC = 0V, VI = 0V or V
Output CapacitanceVCC = 3.0V, VO = 0V or V
Fairchild does not assume any responsibility for use of any circuitr y described, no circuit patent licenses are implied a nd
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are device s or syste ms
74LVT32244 • 74LVTH32244 Low Voltage 32-Bit Buffer/Line Driver with 3-STATE Outputs (Preliminary)
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant inju ry to the
user.
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Package Number BGA96A
Preliminary
2. A critical component in any compon ent of a l ife supp ort
device or system whose failu re to perform can be reasonably expected to cause the failure of the li fe su pp ort
device or system, or to affect its safety or effectiveness.
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