Datasheet 74LVC10PW, 74LVC10DB, 74LVC10D Datasheet (Philips)

Page 1
74LVC10
Triple 3-input NAND gate
Product specification Replaces data sheet of 1996 Feb IC24 Data Handbook
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1997 Apr 28
Page 2
Philips Semiconductors Product specification
Triple 3-input NAND gate
FEA TURES
Wide supply voltage range of 1.2 V to 3.6 V
In accordance with JEDEC standard no. 8-1A.
Inputs accept voltages up to 5.5 V
CMOS low power consumption
Direct interface with TTL levels
Output capability: standard
I
category: SSI
CC
QUICK REFERENCE DATA
GND = 0 V; T
SYMBOL
t
NOTE:
is used to determine the dynamic power dissipation (PD in µW)
1. C
PD
= CPD × V
P
D
fi = input frequency in MHz; CL = output load capacity in pF;
= output frequency in MHz; VCC = supply voltage in V;
f
o
(C
L
= 25°C; tr = tf 2.5 ns
amb
PHL/tPLH
C
I
C
PD
2
× fi  (CL × V
CC
2
× V
× fo) = sum of the outputs.
CC
PARAMETER CONDITIONS TYPICAL UNIT
Propagation delay nA, nB, nC to nY
Input capacitance 5.0 pF Power dissipation capacitance per gate VI = GND to V
2
fo) where:
CC
74L VC10
DESCRIPTION
The 74LVC10 is a high performance, low power, low voltage, Si gate CMOS device and superior to most advanced CMOS compatible TTL families.
The 74LVC10 provides the 3-input NAND function.
CL = 50 pF;
= 3.3 V
V
CC
CC
1
3.9 ns
26 pF
ORDERING INFORMATION
PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER
14-Pin Plastic SO –40°C to +85°C 74LVC10 D 74LVC10 D SOT108-1 14-Pin Plastic SSOP Type II –40°C to +85°C 74LVC10 DB 74LVC10 DB SOT337-1 14-Pin Plastic TSSOP Type I –40°C to +85°C 74LVC10 PW 74LVC10PW DH SOT402-1
PIN CONFIGURATION
1
1A
2
1B
3
2A
4
2B
5
2C
6
2Y
7
GND
V
14
CC
1C
13
1Y
12
3C
11
3B
10
3A
9
3Y
8
SV00416
LOGIC SYMBOL
1A131 1B2 1C
3
2B4 2C2A5
3A119 3B10 3C
121Y
2Y
6
3Y
8
PIN DESCRIPTION
PIN
NUMBER
1, 3, 9 1A – 3A Data inputs 2, 4, 10 1B – 3B Data inputs 7 GND Ground (0 V) 12, 6, 8 1Y – 3Y Data outputs 13, 5, 11 1C – 3C Data inputs 14 V
SYMBOL NAME AND FUNCTION
CC
Positive supply voltage
SV00417
1997 Apr 28 853-1973 17997
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Philips Semiconductors Product specification
SYMBOL
PARAMETER
CONDITIONS
UNIT
mW
Triple 3-input NAND gate
LOGIC SYMBOL (IEEE/IEC)
1 2
13
3 4 5
9 10 11
LOGIC DIAGRAM (ONE GATE)
A B C
RECOMMENDED OPERATING CONDITIONS
V V
T
V
V
V
amb
tr, t
DC supply voltage (for max. speed performance) 2.7 3.6 V
CC
DC supply voltage (for low-voltage applications) 1.2 3.6 V
CC
DC input voltage range 0 5.5 V
I
DC input voltage range for I/Os 0 V
I/O
DC output voltage range 0 V
O
Operating free-air temperature range –40 +85 °C Input rise and fall times
f
&
&
&
12
6
8
Y
SV00418
SV00419
FUNCTION TABLE
INPUTS OUTPUTS
nA nB nC nY
L L L H L L H H L H L H L H H H
H L L H H L H H H H L H H H H L
NOTES:
H = HIGH voltage level L = LOW voltage level
LIMITS
MIN MAX
VCC = 1.2 to 2.7V
= 2.7 to 3.6V
V
CC
0 0
74LVC10
CC CC
20 10
V V
ns/V
ABSOLUTE MAXIMUM RATINGS
1
In accordance with the Absolute Maximum Rating System (IEC 134). Voltages are referenced to GND (ground = 0V).
SYMBOL
V
CC
I
IK
V
I
V
I/O
I
OK
V
OUT
I
OUT
I
, I
GND
CC
T
stg
DC supply voltage –0.5 to +6.5 V DC input diode current VI 0 –50 mA DC input voltage Note 2 –0.5 to +5.5 V DC input voltage range for I/Os –0.5 to VCC +0.5 V DC output diode current V DC output voltage Note 2 –0.5 to VCC +0.5 V DC output source or sink current VO = 0 to V DC VCC or GND current 100 mA Storage temperature range –60 to +150 °C
PARAMETER CONDITIONS RATING UNIT
VCC or VO 0 50 mA
O
CC
50 mA
Power dissipation per package
P
TOT
– plastic mini-pack (SO) above +70°C derate linearly with 8 mW/K 500 – plastic shrink mini-pack (SSOP and TSSOP) above +60°C derate linearly with 5.5 mW/K 500
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1997 Apr 28
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Philips Semiconductors Product specification
VIHHIGH level Input voltage
V
VILLOW level Input voltage
V
VOHHIGH level output voltage
V
Triple 3-input NAND gate
74LVC10
DC ELECTRICAL CHARACTERISTICS
Over recommended operating conditions. V oltages are referenced to GND (ground = 0V).
LIMITS
SYMBOL PARAMETER TEST CONDITIONS Temp = -40°C to +85°C UNIT
MIN TYP1MAX
V
I
IHZ/IILZ
I I
I
LOW level output voltage
OL
I
Input leakage current VCC = 3.6V; VI = 5.5V or GND Not for I/O pins "0.1 "5 µA
I
Input current for common I/O pins VCC = 3.6V; VI = VCC or GND "0.1 "15 µA 3-State output OFF-state current VCC = 3.6V; VI = VIH or VIL; VO = VCC or GND 0.1 "10 µA
OZ
Quiescent supply current VCC = 3.6V; VI = VCC or GND; IO = 0 0.1 20 µA
CC
Additional quiescent supply current per
CC
input pin
NOTE:
1. All typical values are at V
p
p
p
= 3.3V and T
CC
amb
VCC = 1.2V V VCC = 2.7 to 3.6V 2.0 VCC = 1.2V GND VCC = 2.7 to 3.6V 0.8 VCC = 2.7V; VI = VIH or VIL; IO = –12mA VCC*0.5 VCC = 3.0V; VI = VIH or VIL; IO = –100µA VCC*0.2 V VCC = 3.0V; VI = VIH or V VCC = 3.0V; VI = VIH or V
IO = –12mA VCC*0.6
IL;
IO = –24mA VCC*1.0
IL;
VCC = 2.7V; VI = VIH or VIL; IO = 12mA 0.40 VCC = 3.0V; VI = VIH or VIL; IO = 100µA 0.20 VCC = 3.0V; VI = VIH or V
IO = 24mA 0.55
IL;
VCC = 2.7V to 3.6V; VI = VCC –0.6V; IO = 0 5 500 µA
= 25°C.
CC
CC
V
AC CHARACTERISTICS
GND = 0 V; tr = tf v 2.5 ns; CL = 50 pF
SYMBOL PARAMETER WAVEFORM
t
/
PHL
t
PLH
Propagation delay nA, nB, nC to nY
Figures 1, 2 3.9 6.4 7.5 ns
NOTE:
1. These typical values are at V
= 3.3V and T
CC
amb
= 25°C.
AC WAVEFORMS
VM = 1.5 V at VCC w 2.7 V
= 0.5 VCC at VCC < 2.7 V
V
M
and VOH are the typical output voltage drop that occur with the
V
OL
output load.
V
INPUT
V
OH
V
I
GND
OL
propagation delays.
V
M
t
PHL
V
M
t
PLH
nA, nB, nC
nY OUTPUT
Figure 1. Input (nA, nB, nC) to output (nY)
SV00420
LIMITS
VCC = 3.3V ±0.3V VCC = 2.7V VCC = 1.2V
MIN TYP
1
MAX MIN MAX TYP
TEST CIRCUIT
V
CC
V
PULSE
GENERATOR
I
R
T
V
CC
t 2.7V V
2.7V – 3.6V 2.7V
V
CC
D.U.T.
I
Figure 2. Load circuitry for switching times.
V
O
C
L
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
50pF
Test S
Open
2 < V
GND
S
500
500
1
1
CC
UNIT
2 < V
CC
Open GND
SY00003
1997 Apr 28
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Philips Semiconductors Product specification
74LVC10Triple 3-input NAND gate
SO14: plastic small outline package; 14 leads; body width 3.9 mm SOT108-1
1997 Apr 28
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Philips Semiconductors Product specification
74LVC10Triple 3-input NAND gate
SSOP14: plastic shrink small outline package; 14 leads; body width 5.3 mm SOT337-1
1997 Apr 28
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Philips Semiconductors Product specification
74LVC10Triple 3-input NAND gate
TSSOP14: plastic thin shrink small outline package; 14 leads; body width 4.4 mm SOT402-1
1997 Apr 28
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Philips Semiconductors Product specification
74LVC10Triple 3-input NAND gate
DEFINITIONS
Data Sheet Identification Product Status Definition
Objective Specification
Preliminary Specification
Product Specification
Formative or in Design
Preproduction Product
Full Production
Philips Semiconductors and Philips Electronics North America Corporation reserve the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified. Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
LIFE SUPPORT APPLICA TIONS Philips Semiconductors and Philips Electronics North America Corporation Products are not designed for use in life support appliances, devices, or systems where malfunction of a Philips Semiconductors and Philips Electronics North America Corporation Product can reasonably be expected
to result in a personal injury. Philips Semiconductors and Philips Electronics North America Corporation customers using or selling Philips Semiconductors and Philips Electronics North America Corporation Products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors and Philips Electronics North America Corporation for any damages resulting from such improper use or sale.
Philips Semiconductors 811 East Arques Avenue P.O. Box 3409 Sunnyvale, California 94088–3409 Telephone 800-234-7381
This data sheet contains the design target or goal specifications for product development. Specifications may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date. Philips Semiconductors reserves the right to make changes at any time without notice in order to improve design and supply the best possible product.
This data sheet contains Final Specifications. Philips Semiconductors reserves the right to make changes at any time without notice, in order to improve design and supply the best possible product.
Copyright Philips Electronics North America Corporation 1997
All rights reserved. Printed in U.S.A.
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