The 74LCX16541 is an advanced high-speed
CMOS 16-BIT BUS BUFFER (3-STATE) fabricated with sub-micron silicon gate and double-layer
metal wiring C
2
MOS tecnology.
This is com pos ed of two 8-bit sections with
separate output-enable signals. For either 8-bit
buffers section, the 3 STATE control gate
operates as a two input AND such that if either
nG1
and nG2 are high, all out puts are in the high
impedence state. This device is designed to be
usedwith 3 state memoryaddressdriveres,etc.
It hase same speed performance at 3.3V than 5V
AC/ACT family, combined with a lower power consumption.
All inputs and outputs are equipped with protection circuits against s tatic discharge, giving them
2KV ESD immunity and transient excess vo ltage.
1/9February 2003
Page 2
74LCX16541
INPUT AND OUT PUT EQUIVALENT CIRCUIT
PIN DESCRIPTION
PIN NoSYMBOLNAME AND FUNCTION
1, 481G1
2, 3,5,6,8,9,
11, 12
13,14,16,17,
19, 20, 22, 23
24, 252G1
36,35, 33,32,
30, 29, 27, 26
47,46, 44,43,
41, 40, 38, 37
4, 10, 15, 21,
28, 34, 39, 45
7, 18, 31, 42V
,1G2 Output Enable Inputs
1Y1 to 1Y8 Data Outputs
2Y1 to 2Y8 Data Outputs
,2G2 Output Enable Inputs
2A1 to 2A8 Data Outputs
1A1 to 1A8 Data Outputs
GNDGround (0V)
CC
Positive Supply Voltage
TRUTH TABLE
INPUTSOUTPUT
G1
HXXZ
XHXZ
LLHH
LLLL
X : Don’t Care
Z : High Impedance
G2AnYn
IEC LOGIC SYMBOLS
2/9
Page 3
74LCX16541
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
V
V
I
I
OK
I
or I
I
CC
T
stg
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
1) Io absolute maximum rating must be observed
2)Vo < GND
RECOMMENDED OPERATING CONDITIONS
SymbolParameterValueUnit
V
V
V
V
T
I
OH,IOL
I
OH,IOL
dt/dv
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage
O
DC Output Voltage (High or Low State) (note 1)
O
DC Input Diode Current
IK
DC Output Diode Current (note 2)
DC Output Current
O
DC VCCor Ground Current
GND
Storage Temperature
Lead Temperature (10 sec)
L
Supply Voltage (note 1)
CC
Input Voltage
I
Output Voltage (OFF State)
O
Output Voltage (High or Low State)
O
Operating Temperature
op
High or Low Level Output Current (Vcc = 3.0 to 3.6V)
High or Low Level Output Current (Vcc = 2.7V)
Input Rise and Fall Time (note 2)0 to 10
-0.5 to +7.0V
-0.5 to +7.0V
-0.5 to +7.0V
-0.5 to Vcc+0.5V
−50mA
− 50mA
+ 50mA
± 100mA
-65 to +150°C
300°C
2 to 3.6V
0 to 5.5V
0 to 5.5V
0 to VccV
-55 to 125°C
± 24mA
± 12mA
ns/V
1) Truth Table guaranteed: 1.5V to 3.6V
from0.8V to 2V at VCC=3.0V
2) V
IN
3/9
Page 4
74LCX16541
DC SPECIFICATIONS
Test ConditionValue
SymbolParameter
V
CC
(V)
V
V
High Level Input
IH
Voltage
Low Level Input
V
IL
Voltage
High Level Output
OH
Voltage
2.7 to 3.6
2.7 to 3.6
2.7
3.0
3.0
V
Low Level Output
OL
Voltage
2.7 to 3.6
3.0
I
OZ
High Impedance
Output Leakage
2.7 to 3.6VI= 0 to 5.5V± 5± 5µA
Current
I
Input Leakage
I
I
Current
Power Off Leakage
I
off
Current
Quiescent Supply
CC
Current
2.7 to 3.6VI= 0 to 5.5V± 5± 5µA
0V
2.7 to 3.6VI=VCCor GND2020µA
AC ELECTRICAL C HARACTERISTICS (C
-40 to 85 °C-55 to 125 °C
Min.Max.Min.Max.
2.02.0V
0.80.8V
IO=-100 µAVCC-0.2VCC-0.2
=-12 mA
I
O
=-12 mA
I
O
=-24 mA
I
O
IO=100 µA
I
=12 mA
O
=24 mA
I
O
or VO=5.5V1010µA
I
=50pF,RL= 500 Ω, Input tr=tf= 2.5ns)
L
2.22.2
2.42.4
2.22.2
0.20.2
0.40.4
0.550.55
Unit
V
V2.7
SymbolParameter
t
PLHtPHL
Propagation Delay
Time
AtoY
t
PZLtPZH
t
PLZtPHZ
Output Enable Time2.71.55.81.55.8
Output Disable Time2.71.56.21.56.2
Test ConditionValue
V
CC
(V)
C
(pF)
L
-40 to 85°C-55 to 125°C
Min.Max.Min.Max.
2.71.54.71.54.7
3.0 to 3.61.54.11.54.1
3.0 to 3.61.54.61.54.6
3.0 to 3.61.55.81.55.8
Unit
ns
ns
ns
4/9
Page 5
74LCX16541
CAPACITIVE CHARACTERISTICS
Test ConditionValue
=25°C
SymbolParameter
V
CC
(V)
C
C
OUT
C
1) CPDis defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
Input Capacitance
IN
Output Capacitance
Power Dissipation Capacitance
PD
(note 1) Output enabled
Power Dissipation Capacitance
(note 1) Output disabled
3.3
3.3
VI=0VorV
VI=0VorV
2.5fIN= 10MHz
V
3.3
2.5f
3.3
=0VorV
I
= 10MHz
IN
V
=0VorV
I
CC
CC
CC
CC
TEST CIRCUIT
T
A
Min.Typ.Max.
4pF
10pF
45pF
50
3pF
4
CC(opr)=CPDxVCCxfIN+ICC
Unit
/16
TESTSWITCH
t
PLH,tPHL
t
PZL,tPLZ
t
PZH,tPHZ
CL= 50 pF or equivalent (includes jig and probe capacitance)
R
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
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mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
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