The 74LCX162541 is a low voltage CMOS 16 BIT
BUS BUFFER (NON-INVERTED) fabricated with
sub-micron silicon gate and double-layer metal
wiring C
2
MOS technology. It is ideal for low power
and high speed 3.3V applications; it can be
interfaced to 5V signal environment for both inputs
and outputs.
This is composed of two 8-bit sections with separate output-enable signals. For either 8-bit buffers
section, the 3 STATE control gate operates as a
two input AND such that if eith er nG1
and nG2 are
high, all outputs are in the high impedence state.
This device is designed to be used with 3 state
memory address drivers, etc.
The device circuits is including 26Ω series resistance in the outputs. These resistors permit to reduce line noise in high speed applications.
All inputs and outpu ts are equipped with protection circuits against static discharge, giving them
2KV ESD immunity and transient excess vo ltage.
1/10February 2003
Page 2
74LCX162541
INPUT AND OUTPUT EQUIVALENT CIRCUIT
PIN DESCRIPTION
PIN NoSYMBOLNAME AND FUNCTION
1, 481G1
2, 3,5,6,8,9,
11, 12
13,14, 16,17,
19, 20, 22, 23
24, 252G1
36,35, 33,32,
30, 29, 27, 26
47,46, 44,43,
41, 40, 38, 37
4, 10, 15, 21,
28, 34, 39, 45
7, 18, 31, 42V
,1G2 Output Enable Inputs
1Y1 to 1Y8 Data Outputs
2Y1 to 2Y8 Data Outputs
,2G2 Output Enable Inputs
2A1 to 2A8 Data Outputs
1A1 to 1A8 Data Outputs
GNDGround (0V)
CC
Positive Supply Voltage
TRUTH TABLE
INPUTSOUTPUT
G1
HXXZ
XHXZ
LLHH
LLLL
X : Don‘t Care
Z : High Impedance
G2AnYn
IEC LOGIC SYMBOLS
2/10
Page 3
74LCX162541
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
V
V
I
I
OK
I
I
CC
I
GND
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
1) I
absolute maximum rating must be observed
O
2) VO<GND
RECOMMENDED OPERATING CONDITIONS
SymbolParameterValueUnit
V
V
V
V
I
OH,IOL
I
OH,IOL
T
dt/dvInput Rise and Fall Time (note 2)0 to 10ns/V
1) Truth Table guaranteed: 1.5V to 3.6V
from0.8Vto 2V at VCC=3.0V
2) V
IN
Supply Voltage
CC
DC Input Voltage
I
DC Output Voltage (OFF State)
O
DC Output Voltage (High or Low State) (note 1)-0.5 to VCC+ 0.5
O
DC Input Diode Current
IK
DC Output Diode Current (note 2)
DC Output Current
O
DC Supply Current per Supply Pin
DC Ground Current per Supply Pin
Storage Temperature
stg
Lead Temperature (10 sec)
L
Supply Voltage (note 1)
CC
Input Voltage
I
Output Voltage (OFF State)
O
Output Voltage (High or Low State)0 to V
O
High or Low Level Output Current (VCC= 3.0 to 3.6V)
High or Low Level Output Current (VCC= 2.7V )
Operating Temperature
op
-0.5 to +7.0V
-0.5 to +7.0V
-0.5 to +7.0V
V
-50mA
-50mA
± 50mA
± 100mA
± 100mA
-65 to +150°C
300°C
2.0 to 3.6V
0 to 5.5V
0 to 5.5V
CC
V
± 12mA
± 8mA
-55 to 125°C
3/10
Page 4
74LCX162541
DC SPECIFICATIONS
Test ConditionValue
SymbolParameter
V
V
V
V
I
I
OZ
High Level Input
IH
Voltage
Low Level Input
IL
Voltage
High Level Output
OH
Voltage
Low Level Output
OL
Voltage
Input Leakage
I
I
Current
Power Off Leakage
off
Current
High Impedance
Output Leakage
Current
I
CC
∆I
Quiescent Supply
Current
ICCincr. per Input
CC
V
CC
(V)
2.7to3.6
2.7to3.6
2.7
3.0
2.7to3.6
2.7
3.0
2.7to3.6
0
2.7to3.6
2.7to3.6
2.7to3.6
-40to85°C-55to125°C
Min.Max.Min.Max.
2.02.0V
0.8
IO=-100 µAVCC-0.2VCC-0.2
=-8 mA
I
O
I
=-6 mA
O
=-12 mA
I
O
IO=100 µA
I
=8 mA
O
I
=6 mA
O
=12 mA
I
O
V
= 0 to 5.5V
I
or VO=5.5V
V
I
I=VIH
or V
V
VO= 0 to V
VI=VCCor GND
or VO= 3.6 to 5.5V
V
I
VIH=VCC-0.6V
IL
CC
2.02.0
2.42.4
2.02.0
0.20.2
0.60.6
0.550.55
0.80.8
± 5± 5µA
1010µA
± 5± 5µA
2020
± 20± 20
500500µA
0.8
Unit
V
V
V
µA
DYNAMIC SWITCHING CHARA CTERISTICS
Test ConditionValue
=25°C
SymbolParameter
V
CC
(V)
V
OLP
V
OLV
1) Number of outputsdefined as "n".Measured with "n-1"outputs switching from HIGH to LOW or LOW to HIGH.The remaining output is
measured in the LOW state.
Dynamic Low Level Quiet
Output (note 1)
3.3
=50pF
C
L
V
=0V,VIH= 3.3V
IL
4/10
T
A
Min.Typ.Max.
0.8
-0.8
Unit
V
Page 5
AC ELECTRICAL C HARACTERISTICS
74LCX162541
Test ConditionValue
SymbolParameter
V
CC
(V)
t
PLHtPHL
t
PZLtPZH
Propagation Delay
Time
Output Enable Time2.7
2.7
3.0 to 3.61.54.41.55.1
3.0 to 3.61.55.91.56.8
t
PLZtPHZ
Output Disable Time2.7
3.0 to 3.61.55.91.56.8
t
OSLH
t
OSHL
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switching in the same direction, either HIGH or LOW (t
2) Parameter guaranteed by design
Output To Output
Skew Time (note1,
2)
3.0 to 3.6505002.51.01.0ns
OSLH
C
L
(pF)
505002.5
505002.5
505002.5
=|t
PLHm-tPLHn
R
(Ω)
|, t
L
OSHL
t
s
(ns)
= t
=|t
-40 to 85 °C-55 to 125 °C
r
Min.Max.Min.Max.
1.55.61.56.5
1.56.31.57.2
1.56.31.57.2
PHLm-tPHLn
|)
Unit
ns
ns
ns
CAPACITIVE CHARACTERISTICS
Test ConditionValue
=25°C
SymbolParameter
V
CC
(V)
C
C
OUT
C
1) CPDis defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
circuit)
Input Capacitance
IN
Output Capacitance
Power Dissipation Capacitance
PD
(note 1)
3.3fIN= 10MHz
V
= 0 or V
IN
CC
T
A
Min.Typ.Max.
4pF
10pF
50
CC(opr)=CPDxVCCxfIN+ICC
Unit
pF
/16 (per
5/10
Page 6
74LCX162541
TEST CIRCUIT
TESTSWITCH
t
PLH,tPHL
t
PZL,tPLZ
t
PZH,tPHZ
CL= 50 pF or equivalent (includes jig and probe capacitance)
RL=R1=500Ω or equivalent
R
T=ZOUT
of pulse generator (typically 50Ω)
Open
6V
GND
WAVEFORM 1 : PROPAGATION DEL AYS (f=1MHz; 50% duty cycle)
6/10
Page 7
WAVEFORM 2 : OUTPUT ENABL E AND DISABLE TIME (f=1MHz; 50% duty cycle)
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consequences of use o f suc h inf ormat ion n or f or an y infr ingeme nt of paten ts or oth er ri gh ts of third part ies whic h may resul t f rom
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mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
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