- 4.5V to 5.5V Operation, Control; 0V to 10V Switch
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
≤ 1µA at VOL, V
l
OH
Description
The ’HC4351, CD74HCT4351, and CD74HC4352 are
digitally controlled analog switches which utilize silicon-gate
CMOS technology to achieve operating speeds similar to
Pinouts
CD54HC4351
(CERDIP)
CD74HC4351, CD74HCT4351
(PDIP, SOIC)
TOP VIEW
A4
A6
NC
A COMMON
A7
A5
E1
E2
V
EE
GND
1
2
3
4
5
6
7
8
9
10
V
20
CC
A2
19
A1
18
A0
17
A3
16
S0
15
NC
14
S1
13
12
S2
11
LE
LSTTL with the low power consumption of standard CMOS
integrated circuits.
These analog multiplexers/demultiplexers are, in essence,
the HC/HCT4015 and HC4052 preceded by address latches
that are controlled by an active low Latch Enable input (
Two Enable inputs, one active low (
E1), and the other active
LE).
high (E2) are provided allowing enabling with either input
voltage level.
Ordering Information
TEMP. RANGE
PART NUMBER
CD54HC4351F3A-55 to 12520 Ld CERDIP
CD74HC4351E-55 to 12520 Ld PDIP
CD74HC4351M-55 to 12520 Ld SOIC
CD74HCT4351E-55 to 12520 Ld PDIP
CD74HC4352E-55 to 12520 Ld PDIP
NOTES:
1. When ordering, use the entire part number.Add the suffix 96 to
obtain the variant in the tape and reel.
2. Wafer and die for this part number is available which meets all
electrical specifications. Please contact your local TI sales office
or customer service for ordering information.
1
B0
B2
2
NC
3
B COMMON
B3
B1
E1
E2
V
EE
GND
4
5
6
7
8
9
10
(oC)PACKAGE
CD74HC4352
(PDIP)
TOP VIEW
V
20
CC
A2
19
A1
18
A COMMON
17
A0
16
A3
15
NC
14
S0
13
12
S1
11
LE
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
LHLLL A
LHLLHA
LHLHLA
LHLHH A
LHHLLA
LHHLH A
LHHHLA
LHHHHA
HLXXXNone
NOTE:
3. When LE is low S0-S2 data are latched and switches cannot
change state.
H = High Voltage Level, L = Low Voltage Level, X = Don’t Care
An
IN/OUT
FROM
SELECT
LOGIC
0
1
2
3
4
5
6
7
P
V
CC
N
N
V
EE
P
V
CC
A COMMON
IN/OUT
N
N
FIGURE 1. DETAIL OF ONE HC/HCT4351 SWITCH
2
Page 3
Functional Diagram
13
S0
LATCHES
12
S1
11LE
CD54/74HC4351, CD74HCT4351, CD74HC4352
CD74HC4352
A CHANNELS IN/OUT
S0
S0
S1
S1
CONVERSION
LOGIC
LEVEL
V
CC
20
BINARY
TO
1 OF 4
DECODER
WITH
ENABLE
A3A2A1A
0
16181915
TG
TG
TG
TG
TG
TG
17
4
A COMMON
OUT/IN
B COMMON
OUT/IN
7E1
8E2
109
GNDV
EE
TRUTH TABLE
CD74HC4352
INPUT STATES(NOTE 4)
“ON”
SWITCHES
LE = HE1E2S1S0
LHLLA
LHLHA
LHHLA
LHHHA
, B
0
0
, B
1
1
, B
2
2
, B
3
3
HLXXNone
NOTE:
4. When Latch Enable is “Low” channel-select data is latched and
switches cannot change state.
H = High Voltage Level, L = Low Voltage Level, X = Don’t Care
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
5. In certain applications, the external load-resistor current may include both VCCandsignal-linecomponents.ToavoiddrawingVCCcurrent
when switch current flows into the transmission gate inputs, the voltage drop across the bidirectional switch must not exceed 0.6V (calculated from RONvalues shown in the DC Electrical Specifications table). No VCCcurrent will flow through RLif the switch current flows
into terminal 3 on the ’HC4351 and CD74HCT4351; terminals 3 and 13 on the CD74HC4352.
6. θJA is measured with the component mounted on an evaluation PC board in free air.
FIGURE 7. CHANNEL ON BANDWIDTH (CD74HC4352)FIGURE 8. CHANNEL OFF FEEDTHROUGH (CD74HC4352)
11
Page 12
CD54/74HC4351, CD74HCT4351, CD74HC4352
Typical Performance Curves
130
120
110
(Ω)
100
ON
90
80
70
60
50
40
30
“ON” RESISTANCE, R
20
10
0
FIGURE 9. TYPICAL ON RESISTANCE vs INPUT SIGNAL VOLTAGE
Analog Test Circuits
V
V
CC
IS
0.1µF
V
IS
SWITCH
R
ON
RC
/2
V
CC
(Continued)
VCC - VEE = 4.5V
VCC - VEE = 6V
VCC - VEE = 9V
123 456789
0
INPUT SIGNAL VOLTAGE, V
V
OS1
fIS = 1MHz SINEWAVE
R = 50Ω
C = 10pF
VCC/2
(V)
IS
V
R
SWITCH
OFF
CC
RC
/2
V
CC
V
OS2
dB
METER
FIGURE 10. CROSSTALK BETWEEN TWO SWITCHES TEST CIRCUIT
V
CC
SINE
0.1µF
V
IS
SWITCH
ON
50Ω10pF
/2
V
CC
V
OS
dB
METER
10µF
WAVE
V
IS
fIS = 1kHz TO 10kHz
V
CC
SWITCH
ON
VI = V
10kΩ50pF
/2
V
CC
V
IH
IS
V
OS
DISTORTION
METER
FIGURE 11. FREQUENCY RESPONSE TEST CIRCUITFIGURE 12. TOTAL HARMONIC DISTORTION TEST CIRCUIT
12
Page 13
CD54/74HC4351, CD74HCT4351, CD74HC4352
Analog Test Circuits
V
CC
600Ω
/2
V
CC
SWITCH
ALTERNATING
ON AND OFF
t
, tf≤ 6ns
r
= 1MHz
f
CONT
50% DUTY
CYCLE
(Continued)
600Ω
V
/2
CC
E
V
50pF
OS
V
P-P
V
OS
SCOPE
FIGURE 13. CONTROL-TO-SWITCH FEEDTHROUGH NOISE
TEST CIRCUIT
V
CC
VC = V
0.1µF
V
IS
SWITCH
OFF
R
/2
V
CC
V
CC
fIS≥ 1MHz SINEWAVE
R = 50Ω
IL
C = 10pF
V
OS
RC
/2
dB
METER
FIGURE 14. SWITCH OFF SIGNAL FEEDTHROUGH
13
Page 14
CD54/74HC4351, CD74HCT4351, CD74HC4352
Test Circuits and Waveforms
trC
L
CLOCK
10%
90%
50%
10%
tfC
t
L
WL
tWL+ tWH=
50%
t
WH
fC
50%
1.3V
I
fC
L
3V
GND
+ tWH=
t
t
WL
WH
I
L
V
CC
GND
trCL= 6ns
CLOCK
0.3V
2.7V
1.3V
0.3V
t
t
fCL
WL
= 6ns
1.3V
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with devicetruth table. For f
, input duty cycle = 50%.
MAX
FIGURE 15. HC CLOCK PULSE RISE AND FALLTIMES AND
PULSE WIDTH
tr = 6nstf = 6ns
V
t
TLH
CC
GND
INPUT
t
90%
50%
10%
THL
90%
t
50%
10%
PLH
INVERTING
OUTPUT
t
PHL
FIGURE 17. HC TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
tfC
L
V
CC
50%
GND
t
H(L)
V
CC
50%
t
SU(L)
GND
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
90%
10%
t
H(H)
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with devicetruth table. For f
, input duty cycle = 50%.
MAX
FIGURE 16. HCT CLOCK PULSE RISE AND FALLTIMES AND
PULSE WIDTH
= 6ns
tr = 6ns
INPUT
t
2.7V
1.3V
0.3V
THL
t
f
3V
GND
t
TLH
90%
t
PLH
1.3V
10%
INVERTING
OUTPUT
t
PHL
FIGURE 18. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
2.7V
0.3V
t
H(H)
1.3V
1.3V
tfC
L
3V
1.3V
GND
t
H(L)
3V
1.3V
t
SU(L)
GND
OUTPUT
t
REM
V
CC
SET, RESET
OR PRESET
50%
90%
t
PLH
IC
t
TLH
t
THL
90%
50%
10%
t
PHL
GND
C
L
50pF
FIGURE 19. HC SETUP TIMES, HOLD TIMES, REMOVALTIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
OUTPUT
t
REM
3V
SET, RESET
1.3V
90%
1.3V
t
t
PLH
TLH
90%
1.3V
10%
t
t
PHL
THL
OR PRESET
IC
C
L
50pF
FIGURE 20. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
14
GND
Page 15
CD54/74HC4351, CD74HCT4351, CD74HC4352
Test Circuits and Waveforms
6ns6ns
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
50%
t
t
OUTPUTS
ENABLED
PLZ
PHZ
90%
10%
90%
OUTPUTS
DISABLED
(Continued)
10%
t
PZL
t
PZH
50%
50%
FIGURE 21. HC THREE-STATE PROPAGATION DELAY
WAVEFORM
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
IC WITH
THREE-
STATE
OUTPUT
V
CC
GND
OUTPUTS
ENABLED
t
r
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
t
t
OUTPUTS
ENABLED
6nst
PLZ
PHZ
10%
90%
f
2.7
1.3
OUTPUTS
DISABLED
0.3
t
t
PZH
6ns
PZL
FIGURE 22. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
OUTPUT
R
= 1kΩ
L
C
L
50pF
VCC FOR t
GND FOR t
PLZ
PHZ
AND t
AND t
PZL
PZH
3V
GND
1.3V
1.3V
OUTPUTS
ENABLED
NOTE: Open drain waveforms t
VCC, CL = 50pF.
FIGURE 23. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
PLZ
and t
are the same as those for three-state shown on the left. The test circuit is Output RL=1kΩto
PZL
15
Page 16
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
Customers are responsible for their applications using TI components.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
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