TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74HC375AP,TC74HC375AF,TC74HC375AFN
4-Bit D Type Latch
The TC74HC375A is a high speed CMOS D-TYPE LATCH
fabricated with silicon gate C
It achieves the high speed operation similar to equivalent
LSTTL while maintaining the CMOS low power dissipation.
It contains two groups of 2-bit latches controlled by an enable
input (G1·2 or G3·4) and each group can be used in different
circuits.
Data applied to the data inputs are transferred to the Q and
Q outputs whin the enable inputs is high. When the enable
input is low, the outputs are not affected.
All inputs are equipped with protection circuits against static
discharge or transient excess voltage.
2
MOS technology.
Features
Note: xxxFN (JEDEC SOP) is not available in
Japan.
TC74HC375AP
TC74HC375AF
• High speed: tpd = 14 ns (typ.) at VCC = 5 V
• Low power dissipation: I
• High noise immunity: V
• Output drive capability: 10 LSTTL loads
• Symmetrical output impedance: |I
• Balanced propagation delays: t
• Wide operating voltage range: VCC (opr) = 2 to 6 V
• Pin and function compatible with 74LS375
= 4 μA (max) at Ta = 25°C
CC
NIH
= V
= 28% VCC (min)
NIL
| = IOL = 4 mA (min)
OH
∼
t
−
pLH
pHL
Pin Assignment
TC74HC375AFN
Weight
DIP16-P-300-2.54A : 1.00 g (typ.)
SOP16-P-300-1.27A : 0.18 g (typ.)
SOL16-P-150-1.27 : 0.13 g (typ.)
1
2007-10-01
Page 2
IEC Logic Symbol
Truth Table
TC74HC375AP/AF/AFN
Inputs Outputs
D G Q Q
L H L H ⎯
H H H L ⎯
X L Qn nQ Latch
X: Don’t care
System Diagram
Function
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2007-10-01
Page 3
TC74HC375AP/AF/AFN
Absolute Maximum Ratings (Note 1)
Characteristics Symbol Rating Unit
Supply voltage range VCC −0.5 to 7 V
DC input voltage VIN −0.5 to VCC + 0.5 V
DC output voltage V
Input diode current IIK ±20 mA
Output diode current IOK ±20 mA
DC output current I
DC VCC/ground current ICC ±50 mA
Power dissipation PD 500 (DIP) (Note 2)/180 (SOP) mW
Storage temperature T
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
−0.5 to VCC + 0.5 V
OUT
±25 mA
OUT
−65 to 150 °C
stg
Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be
applied until 300 mW.
Operating Ranges (Note)
Characteristics Symbol Rating Unit
Supply voltage VCC 2 to 6 V
Input voltage VIN 0 to VCC V
Output voltage V
Operating temperature T
Input rise and fall time tr, tf
Note: The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
0 to VCC V
OUT
−40 to 85 °C
opr
0 to 1000 (V
0 to 500 (V
0 to 400 (V
= 2.0 V)
CC
= 4.5 V)
CC
= 6.0 V)
CC
ns
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2007-10-01
Page 4
Electrical Characteristics
DC Characteristics
TC74HC375AP/AF/AFN
Characteristics Symbol
High-level input
voltage
Low-level input
voltage
High-level output
voltage
Low-level output
voltage
Input leakage
current
Quiescent supply
current
⎯
V
IH
⎯
V
IL
V
OH
V
OL
VIN = VCC or GND 6.0 ⎯ ⎯ ±0.1 ⎯ ±1.0μA
I
IN
VIN = VCC or GND 6.0 ⎯ ⎯ 4.0 ⎯ 40.0μA
I
CC
V
= V
V
= V
IN
IH
IN
IH
Test Condition Ta = 25°C
V
IOH =−20 μA
or V
IL
IOH =−4 mA
=−5.2 mA
I
OH
IOL = 20 μA
or V
IL
IOL = 4 mA
= 5.2 mA
I
OL
Timing Requirements
Characteristics Symbol
Minimum pulse width
(G)
Minimum set-up time ts ⎯
Minimum hold time th ⎯
(input: tr = tf = 6 ns)
⎯
t
W (H)
−40 to 85°C
(V)Min Typ.Max Min Max
CC
2.0
4.5
6.0
2.0
4.5
6.0
2.0
4.5
6.0
4.5
6.0
2.0
4.5
6.0
4.5
6.0
Test Condition Ta = 25°C
V
1.50
3.15
4.20
⎯
⎯
⎯
1.9
4.4
5.9
4.18
5.68
⎯
⎯
⎯
⎯ ⎯ 0.17
CC
2.0
4.5
6.0
2.0
4.5
6.0
2.0
4.5
6.0
⎯
⎯
⎯
⎯
⎯
⎯
2.0
4.5
6.0
4.31
5.80⎯ ⎯
0.0
0.0
0.0
0.18
(V)Typ. Limit Limit
⎯
1.50
⎯
3.15
⎯
4.20
0.50
1.35
1.80
⎯
⎯
⎯
0.1
0.1
0.1
0.26
0.26 ⎯ ⎯
⎯
⎯
⎯
⎯
⎯
⎯
⎯
⎯
⎯
⎯
⎯
⎯
1.9
4.4
5.9
4.13
5.63 ⎯ ⎯
⎯
⎯
⎯
75
15
13
75
15
13
0
0
0
Ta =
⎯
⎯
⎯
0.50
1.35
1.80
⎯
⎯
⎯
0.1
0.1
0.1
0.33
0.33
Ta =
−40 to
85°C
95
19
16
95
19
16
0
0
0
Unit
V
V
V
V
Unit
ns
ns
ns
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2007-10-01
Page 5
TC74HC375AP/AF/AFN
AC Characteristics
Characteristics Symbol Test Condition Min Typ. MaxUnit
Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation:
I
(opr) = CPD・VCC・fIN + ICC/4 (per latch)
CC
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2007-10-01
Page 6
Package Dimensions
TC74HC375AP/AF/AFN
Weight: 1.00 g (typ.)
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2007-10-01
Page 7
Package Dimensions
TC74HC375AP/AF/AFN
Weight: 0.18 g (typ.)
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2007-10-01
Page 8
Package Dimensions (Note)
TC74HC375AP/AF/AFN
Note: This package is not available in Japan.
Weight: 0.13 g (typ.)
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2007-10-01
Page 9
TC74HC375AP/AF/AFN
RESTRICTIONS ON PRODUCT USE
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
20070701-EN GENERAL
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
9
2007-10-01
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