Datasheet 74HCT1G32GW, 74HC1G32GW Datasheet (Philips)

Page 1
INTEGRATED CIRCUITS
74HC1G32 74HCT1G32
2-input OR gate
Product specification File under Integrated Circuits, IC06
1997 Dec 16
Page 2
2-input OR gate
FEATURES
Wide operating voltage :
2.0 to 6.0 V
Symmetrical output impedance
High noise immunity
Low power dissipation
Balanced propagation delays
Very small 5 pins package
Output capability : standard
DESCRIPTION
The 74HC1G/HCT1G32 is a highspeed Si-gate CMOS device.
The 74HC1G/HCT1G32 provides the 2-input OR function. The standard output currents are1⁄2 compared to the 74HC/HCT32.
FUNCTION TABLE
INPUTS OUTPUT
inA inB outY
L L L
L H H H L H H H H
H = HIGH voltage level L = LOW voltage level
74HC1G32
74HCT1G32
QUICK REFERENCE DATA
GND = 0 V; T
SYMBOL PARAMETER CONDITIONS
t
/ t
PHL
PLH
C
I
C
PD
Notes
1. CPDis used to determine the dynamic power dissipation (PDin µW). PD= CPD× V fi= input frequency in MHz; fo= output frequency in MHz; CL= output load capacitance in pF; VCC= supply voltage in V; (CV
2. For HC1G the condition is VI= GND to V For HCT1G the condition is VI= GND to VCC 1.5 V.
PIN DESCRIPTION
PIN NO. SYMBOL NAME AND FUNCTION
1, 2 inB, inA data inputs 3 GND ground (0 V) 4 outY data output 5 V
= 25 °C; tr= tf≤ 6.0 ns
amb
propagation delay
inA, inB to outY input
capacitance power
dissipation capacitance
2
× fi+ (CL× V
CC
2
× fo) = sum of outputs.
CC
CL= 15 pF VCC = 5 V
notes 1 and 2
2
× fo) where:
CC
CC
TYPICAL
HC1G HCT1G
8 10 ns
1.5 1.5 pF
19 20 pF
CC.
positive supply voltage
UNIT
1997 Dec 16 2
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Philips Semiconductors Product specification
Fig.1 Pin configuration.
1 2 3
inA
inB
GND
V
CC
outY
5
4
32
Fig.2 Logic symbol.
inA
inB
outY
1
2
4
Fig.3 IEC logic symbol.
1
2
4
>
1
Fig.4 Logic diagram.
inA
inB
outY
2-input OR gate
74HC1G32
74HCT1G32
ORDERING AND PACKAGE INFORMATION
OUTSIDE
NORTH
AMERICA
74HC1G32GW 74HCT1G32GW 5 SC88A plastic SOT353 TG
NORTH
AMERICA
TEMPERATURE
RANGE
40 °C to +125 °C
PINS PACKAGE MATERIAL CODE MARKING
5 SC88A plastic SOT353 HG
PACKAGES
1997 Dec 16 3
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Philips Semiconductors Product specification
2-input OR gate
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER
V
CC
V
I
V
O
T
amb
DC supply voltage 2.0 5.0 6.0 4.5 5.0 5.5 V input voltage 0 V output voltage 0 V operating ambient
temperature range 40 25 +125 40 25 +125 °C
input rise and fall times
tr,t
f
except for Schmitt-trigger inputs
ABSOLUTE MAXIMUM RATINGS
Limiting values is accordance with the Absolute Maximum Rating System (IEC 134). Voltages are referenced to GND (ground = 0 V)
74HC1G 74HCT1G
MIN. TYP. MAX. MIN. TYP. MAX.
CC CC
0 V 0 V
CC CC
1000
500 500 VCC = 4.5 V
400 VCC = 6.0 V
74HC1G32
74HCT1G32
UNIT CONDIITIONS
V V
see DC and AC characteristics per device
VCC = 2.0 V
ns
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
CC
±I
IK
±I
OK
±I
O
±I
CC
T
stg
P
D
DC supply voltage 0.5 +7.0 V DC input diode current VI< - 0.5 or VI> VCC + 0.5 V 20 mA DCoutput diode current VO< - 0.5 or VO> VCC + 0.5 V 20 mA DC output source or sink
current standard outputs DC VCC or GND current for
types with standard outputs
0.5V < VO< VCC+ 0.5 V 12.5 mA
25 mA
storage temperature range 65 +150 °C power dissipation per package for temperature range: 40 to + 125 °C
5 pins plastic SC88A above +55 °C derate linearly with 2.5 mW/K
200 mW
Notes
1. Stresses beyond those listed may cause permanent damage to the device. These are stress rating only and functional operation of the device at these or any other conditions beyond those under ‘recommended operating conditions’ is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1997 Dec 16 4
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Philips Semiconductors Product specification
2-input OR gate
DC CHARACTERISTICS FOR THE 74HC1G
Over recommended operating conditions. Voltage are referenced to GND (ground = 0 V)
SYMBOL PARAMETER
MIN. TYP.
1.5 1.2 1.5
V
V
V
V
V
V
I
CC
HIGH level input voltage
IH
3.15 2.4 3.15 4.5
4.2 3.2 4.2 6.0
0.8 0.5 0.5
LOW level input voltage
IL
2.1 1.35 1.35 4.5
2.8 1.8 1.8 6.0
1.9 2.0 1.9
HIGH level output
OH
voltage; all outputs
4.4 4.5 4.4 4.5
5.9 6.0 5.9 6.0
HIGH level output voltage; standard
OH
outputs
4.13 4.32 3.7
5.63 5.81 5.2 6.0
0 0.1 0.1
LOW level output
OL
voltage; all outputs
0 0.1 0.1 4.5
0 0.1 0.1 6.0
LOW level output voltage; standard
OL
outputs
I
input leakage current 1.0 1.0 µA 6.0 VI = VCCor GND
I
Quiescent supply current
0.15 0.33 0.4
0.16 0.33 0.4 6.0
10 20 µA 6.0
T
(°C)
amb
40 to +85 40 to +125
(1)
MAX. MIN. MAX.
UNIT
V
V
V
V
V
V
74HC1G32
74HCT1G32
TEST CONDITIONS
VCC (V) OTHER
2.0
2.0
2.0 VI= VIHor VIL,
IO = 20 µA VI= VIHor VIL,
4.5
IO = 2.0 mA VI= VIHor VIL,
IO = 2.6 mA
2.0 VI= VIHor VIL,
IO = 20 µA VI= VIHor VIL,
4.5 IO = 2.0 mA
VI= VIHor VIL, IO = 2.6 mA
VI = VCC or GND, IO = 0
Note
1. All typical values are measured at T
= 25 °C.
amb
1997 Dec 16 5
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Philips Semiconductors Product specification
2-input OR gate
DC CHARACTERISTICS FOR THE 74HCT1G
Over recommended operating conditions. Voltage are referenced to GND (ground = 0 V.)
SYMBOL PARAMETER
V
V
V
OH
HIGH level input
IH
voltage LOW level input
IL
voltage HIGH level output
voltage; all outputs HIGH level output
V
OH
voltage; standard outputs
V
LOW level output
OL
voltage; all outputs LOW level output
V
voltage; standard
OL
outputs
I
I
I
CC
input leakage current 1.0 1.0 µA 5.5 VI = VCCor GND
I
Quiescent supply current
Additional supply
CC
current per input
40 to +85 40 to +125
MIN. TYP.
2.0 1.6 2.0 V 4.5 to 5.5
1.2 0.8 0.8 V 4.5 to 5.5
4.4 4.5 4.4 V 4.5
4.13 4.32 3.7 V 4.5
0 0.1 0.1 V 4.5
0.15 0.33 0.4 V 4.5
10.0 20 µA 5.5
500 850 µA 4.5 to 5.5
T
(°C)
amb
(1)
MAX. MIN. MAX.
74HC1G32
74HCT1G32
TEST CONDITIONS
UNIT
VCC (V) OTHER
VI= VIHor VIL,
IO = 20 µA VI= VIHor VIL,
IO = 2.0 mA VI= VIHor VIL,
IO = 20 µA VI= VIHor VIL,
IO = 2.0 mA
VI = VCC or GND, IO = 0
VI = VCC− 2.1, IO = 0
Note
1. All typical values are measured at T
= 25 °C.
amb
1997 Dec 16 6
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Philips Semiconductors Product specification
2-input OR gate
AC CHARACTERISTICS FOR 74HC1G32
GND = 0 V; tr= tf≤ 6.0 ns; CL = 50 pF
SYMBOL PARAMETER
t
PHL/tPLH
propagation delay inA, inB to outY
Note
1. All typical values are measured at T
AC CHARACTERISTICS FOR 74HCT1G32
GND = 0 V; tr= tf≤ 6.0 ns; CL = 50 pF
SYMBOL PARAMETER
t
PHL/tPLH
propagation delay inA, inB to outY
40 to +85 40 to +125
MIN. TYP.
18 115 135
7 20 23 6.0
amb
MIN. TYP.
10 24 27 ns 4.5 see Fig.5 and Fig.6
T
(°C)
amb
(1)
MAX. MIN. MAX.
= 25 °C.
T
(°C)
amb
40 to +85 40 to +125
(1)
MAX. MIN. MAX.
UNIT
ns
UNIT
74HC1G32
74HCT1G32
TEST CONDITIONS
VCC (V) WAVEFORMS
2.0 see Fig.5 and Fig.6 8 23 27 4.5
TEST CONDITIONS
VCC(V) WAVEFORMS
Note
1. All typical values are measured at T
= 25 °C.
amb
1997 Dec 16 7
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Philips Semiconductors Product specification
Fig.5 The input (inA, inB) to output (outY)
propagation delays.
VM(1)
inA, inB INPUT
outY OUTPUT
VM(1)
t
PLH
t
PHL
Fig.6 Load circuitry for switching times.
2-input OR gate
AC WAVEFORMS
74HC1G32
74HCT1G32
1997 Dec 16 8
Page 9
Philips Semiconductors Product specification
2-input OR gate
PACKAGE OUTLINES
74HC1G32
74HCT1G32
1997 Dec 16 9
Page 10
Philips Semiconductors Product specification
2-input OR gate
74HC1G32
74HCT1G32
SOLDERING Introduction
There is no soldering method that is ideal for all IC packages. Wave soldering is often preferred when through-hole and surface mounted components are mixed on one printed-circuit board. However, wave soldering is not always suitable for surface mounted ICs, or for printed-circuits with high population densities. In these situations reflow soldering is often used.
This text gives a very brief insight to a complex technology. A more in-depth account of soldering ICs can be found in our “IC Package Databook” (order code 9398 652 90011).
Reflow soldering
Reflow soldering techniques are suitable for all SO packages. Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied to the
printed-circuit board by screen printing, stencilling or pressure-syringe dispensing before package placement. Several techniques exist for reflowing; for example, thermal conduction by heated belt. Dwell times vary between
50 and 300 seconds depending on heating method. Typical reflow temperatures range from 215 to 250 °C. Preheating is necessary to dry the paste and evaporate the binding agent. Preheating duration: 45 minutes at 45 °C.
Wave soldering
Wave soldering techniques can be used for all SO packages if the following conditions are observed:
A double-wave (a turbulent wave with high upward pressure followed by a smooth laminar wave) soldering technique should be used.
The longitudinal axis of the package footprint must be parallel to the solder flow.
The package footprint must incorporate solder thieves at the downstream end.
During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured.
Maximum permissible solder temperature is 260 °C, and maximum duration of package immersion in solder is 10 seconds, if cooled to less than 150 °C within 6 seconds. Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications.
Repairing soldered joints
Fix the component by first soldering two diagonally- opposite end leads. Use only a low voltage soldering iron (less than 24 V) applied to the flat part of the lead. Contact time must be limited to 10seconds at up to 300 °C. When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C.
1997 Dec 16 10
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Philips Semiconductors Product specification
2-input OR gate
74HC1G32
74HCT1G32
DEFINITIONS
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
1997 Dec 16 11
Page 12
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SCA55
Printed in The Netherlands budgetnum/printrun/ed/pp12 Date of release: 1997 Dec 16 Document order number: 9397 nnn nnnnn
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