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© 1999 Fairchild Semiconductor Corporation DS009552 www.fairchildsemi.com
April 1988
Revised August 1999
74F539 Dual 1-of-4 Decoder with 3-STATE Outputs
74F539
Dual 1-of-4 Decoder with 3-STATE Outputs
General Description
The 74F539 contains two independent decoders. Each
accepts two Address (A
0
, A1) input signals and d ecodes
them to select one of four mutually exclu sive outputs. A
polarity control in put (P) determines whether the o utputs
are active HIGH (P = L) or active LOW (P = H). An active
LOW input Enable (E
) is available for data demultiplexing;
data is routed to the selected output in non-inverted form in
the active LOW mode or in inverted form in the active HIGH
mode. A HIGH signal on the acti ve LOW Output Enable
(OE
) input forces the 3-STATE outputs to the high imped-
ance state.
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Order Number Package Number Package Description
74F539SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
74F539PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
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74F539
Unit Loading/Fan Out
Truth Table
(each half)
H = HIGH Voltage Level X = Immaterial
L = LOW Voltage Level Z = High Impedance
Logic Diagram (one half shown)
Please note that this diagram is provided o nly f or t he understanding of lo gic operations and should not be used to estimate propagation delays.
Pin Names Description
U.L.
Input I
IH/IIL
HIGH/LOW
Output I
OH/IOL
A0a–A
1a
Side A Address Inputs 1.0/1.0 20 µA/−0.6 mA
A
0b–A1b
Side B Address Inputs 1.0/1.0 20 µA/−0.6 mA
E
a
, E
b
Enable Inputs (Active LOW) 1.0/1.0 20 µA/−0.6 mA
OE
a
, OE
b
Output Enable Inputs (Active LOW) 1.0/1.0 20 µA/−0.6 mA
P
a
, P
b
Polarity Control Inputs 1.0/1.0 20 µA/−0.6 mA
O
0a–O3a
Side A 3-STATE Outputs 150/40 (33.3) −3 mA/24 mA (20 mA)
O
0b–O3b
Side B 3-STATE Outputs 150/40 (33.3) −3 mA/24 mA (20 mA)
Function
Inputs Outputs
OE
E
A
1
A
0
O
0
O
1
O
2
O
3
High Impedance H X X X Z Z Z Z
Disable L H X X O
n
= P
Active HIGH L L L L H L L L
Output L L L H L H L L
(P = L) LLHLLLHL
LLHH L L LH
Active LOW L L L L L H H H
Output L L L H H L H H
(P = H) L L H L H H L H
LLHHHHHL
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74F539
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyon d which the device
may be damaged or have its useful life impaired . Functional operation
under these condit ions is not implied.
Note 2: Either voltage limit or curren t limit is sufficient to protect in puts.
DC Electrical Characteristics
Storage Temperature −65°C to +150°C
Ambient Temperature under Bias −55°C to +125°C
Junction Temperature under Bias −55°C to +150°C
V
CC
Pin Potential to Ground Pin −0.5V to +7.0V
Input Voltage (Note 2) −0.5V to +7.0V
Input Current (Note 2) −30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with V
CC
= 0V)
Standard Output −0.5V to V
CC
3-STATE Output −0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the rated I
OL
(mA)
Free Air Ambi ent Temperature 0°C to +70°C
Supply Voltage +4.5V to +5.5V
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA
V
OH
Output HIGH 10% V
CC
2.5
VMin
IOH = −1 mA
Voltage 10% V
CC
2.4 IOH = −3 mA
5% V
CC
2.7 IOH = −1 mA
5% V
CC
2.7 IOH = −3 mA
V
OL
Output LOW
10% V
CC
0.5 V Min IOL = 24 mA
Voltage
I
IH
Input HIGH
5.0 µAMaxVIN = 2.7V
Current
I
BVI
Input HIGH Current
7.0 µAMaxVIN = 7.0V
Breakdown Test
I
CEX
Output HIGH
50 µAMaxV
OUT
= V
CC
Leakage Current
V
ID
Input Leakage
4.75 V 0.0
IID = 1.9 µA
Test All Other Pins Grounded
I
OD
Output Leakage
3.75 µA0.0
V
IOD
= 150 mV
Circuit Current All Other Pins Grounded
I
IL
Input LOW Current −0.6 mA Max VIN = 0.5V
I
OZH
Output Leakage Current 50 µAMaxV
OUT
= 2.7V
I
OZL
Output Leakage Current −50 µAMaxV
OUT
= 0.5V
I
OS
Output Short-Circuit Current −60 −150 mA Max V
OUT
= 0V
I
ZZ
Bus Drainage Test 500 µA0.0VV
OUT
= 5.25V
I
CCH
Power Supply Current 28 45 mA Max VO = HIGH
I
CCL
Power Supply Current 40 60 mA Max VO = LOW
I
CCZ
Power Supply Current 40 60 mA Max VO = HIGH Z
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74F539
AC Electrical Characteristics
Symbol Parameter
TA = +25°CT
A
= 0°C to +70°C
Units
VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF
Min Typ Max Min Max
t
PLH
Propagation Delay 4.0 14.5 18.5 3.5 19.5
ns
t
PHL
An to O
n
4.0 9.5 12.0 4.0 13.0
t
PLH
Propagation Delay 5.0 12.0 16.0 5.5 17.0
ns
t
PHL
E to O
n
4.0 7.5 9.5 4.0 10.5
t
PLH
Propagation Delay 7.5 14.5 21.5 4.5 22.5
ns
t
PHL
P to O
n
5.0 11.0 16.5 4.5 17.5
t
PZH
Output Enable Time 4.5 8.0 10.5 4.0 11.5
ns
t
PZL
OE to O
n
5.5 10.0 13.0 5.0 14.0
t
PHZ
Output Disable Time 2.0 4.5 6.5 2.0 7.0
t
PLZ
OE to O
n
3.0 6.5 8.5 3.0 9.5
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74F539
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M20B
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74F539 Dual 1-of-4 Decoder with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit pate nt licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant inju ry to the
user.
2. A critical component i n any compon ent of a lif e support
device or system whose failu re to perform can be reasonably expected to ca use the fa i lure of the life su pp ort
device or system, or to affect its safety or effectiveness.
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