Datasheet 74F401 Datasheet (Fairchild)

Page 1
74F401 CRC Generator/Checker
74F401 CRC Generator/Checker
April 1988 Revised August 1999
General Description
The 74F401 Cycle Red undancy Check (CRC) Generato r/ Checker provides an advance d tool for implementing the most widely used er ror detection scheme in serial digital data handling systems. A 3-bit contr ol inpu t sele cts on e-o f­eight generator polynomials. The list of polynomials includes CRC-16 and CRC-CCITT as well as their recipro­cals (reverse polynomials). Automatic right justification is incorporated for polynom ial s o f deg ree l ess th an 1 6. Sep a­rate clear and preset inpu ts are provided for floppy disk and other applicat ions. Th e Error ou tput ind icates wheth er or not a transmission error has occurred. An other control input inhibits feedback during check word transmission. The 74F401 is fully compatible with all TTL families.
Features
■ Eight selectable polynomials
■ Error indicator
■ Separate preset and clear controls
■ Automatic right justification
■ Fully compatible with all TTL logic families
■ 14-pin package
■ 9401 equivalent
■ Typical applications:
Floppy and other disk storage systems Digital cassette and cartridge systems Data communication systems
Ordering Code:
Order Number Package Number Package Description
74F401SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 74F401PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering cod e.
Logic Symbol Connection Diagram
© 1999 Fairchild Semiconductor Corporation DS009534 www.fairchildsemi.com
Page 2
Unit Loading/Fan Out
74F401
Pin Names Description
S0–S
2
Polynomial Select Inputs 1.0/1.0 20 µA/−0.6 mA D Data Input 1.0/1.0 20 µA/−0.6 mA CP
Clock Input (Operates on HIGH-to-LOW Transition) 1.0/1.0 20 µA/−0.6 mA CWE Check Word Enable Input 1.0/1.0 20 µA/−0.6 mA P
Preset (Active LOW) Input 1.0/1.0 20 µA/−0.6 mA MR Master Reset (Active HIGH) Input 1.0/1.0 20 µA/−0.6 mA Q Data Output 50/33.3 −1 mA/20 mA
ER Error Output 50/33.3 −1 mA/20 mA
Functional Description
The 74F401 is a 16-bit progr ammable device w hich oper­ates on serial data streams and provides a means of detecting transmission er rors. Cyclic encod ing and decod­ing schemes for err or detection are based on poly nomial manipulation in m odulo arithmetic . For encoding , the data stream (message polynomial) is divided by a selected poly­nomial. This division results in a remainder which is appended to the messa ge as check bits. For err or check­ing, the bit stream conta ining both data and check bits is divided by the same select ed polynomial. If there are no detectable errors, this di vision results in a ze ro remainder. Although it is possible to choose many generating polyno­mials of a given degree, standards exist that specify a small number of useful polynomials. The 74F401 imple­ments the polynomials listed in Table 1 by applying the appropriate logic levels to the select pins S
The 74F401 consists of a 16-bit register, a Read Only Memory (ROM) and associated control circuitry as show n in the block diagram. The polynomial control code pre­sented at inputs S
, S1 and S2 is decoded by the ROM,
0
selecting the desired polynomial by establishing shift mode operation on the register with Exclusive OR gates at appro­priate inputs. To generate the check bits, the data stream is entered via the Da ta inputs (D), using the HIGH- to-LOW
0, S1
and S2.
U.L.
HIGH/LOW
transition of the Clock inpu t (CP
Input I
IH/IIL
Output I
OH/IOL
). This data is gate d with the most significant output (Q ) of the register, and controls the Exclusive OR gates Figu re 1. Th e Ch eck Word Enabl e (CWE) must be held HIGH wh i le th e da ta i s b ei ng en ter ed. After the last data bit is entered, the CWE is brou ght LOW and the check bits are shifted out of the register and appended to the data bits using external gating Figure 2.
To check an incoming messa ge for errors, both the data and check bits are e ntered through the D input w ith the CWE input held HIGH. The 74F4 01 is not in the data path, but only monitors the message. The Error Output becomes valid after the last check bit has been entered into the 74F401 by a HIGH-to-LOW tra nsition of CP
. If no detect­able errors have occurred during the data transmission, the resultant internal reg ister bits are all LOW and the Error Output (ER) is LOW. If a detectable error has occurred, ER is HIGH.
A HIGH on the Master Reset input (MR) asynchronously clears the register. A LOW on the Preset input (P
) asyn­chronously sets the entire register if the control code inputs specify a 16-bit polynomial; in the case of 12- or 8-bit check polynomials only th e most significa nt 12 or 8 regist er bits are set and the remaining bits are cleared.
TABLE 1.
Select Code
S
2
S
S
1
0
Polynomial Remarks
LLLX16 + X15 + X2 + 1 CRC-16
16
LLHX LHLX LHHX HLLX HLHX HHLX HHHX
+ X14 + X + 1 CRC-16 REVERSE
16
+ X15 + X13 + X7 + X4 + X2 + X1 + 1
12
+ X11 + X3 + X2 + X + 1 CRC-12
8
+ X7 + X5 + X4 + X + 1
8
+ 1 LRC-8
16
+ X12 + X5 + 1 CRC-CCITT
16
+ X11 + X4 + 1 CRC-CCITT REVERSE
www.fairchildsemi.com 2
Page 3
Block Diagram
74F401
FIGURE 1. Equivalent Circuit for X16 + X15 + X2 + 1
Note 1: Check word En able is HIGH while data is being clocked, LOW while transmission of ch ec k bit s . Note 2: 74F401 must be reset or preset before each computation. Note 3: CRC check bits are generated and appended to data bits.
FIGURE 2. Check Word Generation
3 www.fairchildsemi.com
Page 4
Absolute Maximum Ratings(Note 4) Recommended Operating
Storage Temperature −65°C to +150°C
74F401
Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C
Pin Potential to Ground Pin −0.5V to +7.0V
V
CC
Input Voltage (Note 5) −0.5V to +7.0V Input Current (Note 5) −30 mA to +5.0 mA Voltage Applied to Output
in HIGH State (with V
CC
= 0V) Standard Output −0.5V to V 3-STATE Output −0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the rated I
OL
Conditions
Free Air Ambient Temperature 0°C to +70°C Supply Voltage +4.5V to +5.5V
Note 4: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation
CC
under these conditi ons is not implied. Note 5: Either voltage limit or curren t limit is sufficient to protect in put s .
(mA)
DC Electrical Characteristics
Symbol Parameter Min Typ Max Units
V V V V
V
I I
I
V
I
I I I
IH IL CD OH
OL
IH BVI
CEX
ID
OD
IL OS CCH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal Input LOW Voltage 0.8 V Recognized as a LOW Signal Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA Output HIGH 10% V Voltage 5% V Output LOW Voltage Input HIGH Current 5.0 µAMaxVIN = 2.7V Input HIGH Current Breakdown Test Output HIGH Leakage Current Input Leakage Test All Other Pins Grounded Output Leakage Circuit Current All Other Pins Grounded Input LOW Current −0.6 mA Max VIN = 0.5V Output Short-Circuit Current −60 −150 mA Max V Power Supply Current 70 105 mA Max VO = HIGH
10% V
2.5
CC
2.7 IOH = −1 mA
CC
CC
4.75 V 0.0
0.5 V Min IOL = 20 mA
7.0 µAMaxVIN = 7.0V
50 µAMaxV
3.75 µA0.0
V
CC
VMin
IOH = −1 mA
OUT
IID = 1.9 µA
V
IOD
OUT
Conditions
= V
CC
= 150 mV
= 0V
www.fairchildsemi.com 4
Page 5
AC Electrical Characteristics
Symbol Parameter
f t t
t
t
t
t
t t
MAX PLH PHL PHL
PLH
PHL
PLH
PLH PHL
Maximum Clock Frequency 100 85 MHz Propagation Delay 4.5 11.5 4.5 13.5
CP to Q Propagation Delay MR to Q Propagation Delay P to Q Propagation Delay MR to ER Propagation Delay
P to ER Propagation Delay 5.0 13.0 5.0 14.5
CP to ER
TA = +25°CT
VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF
Min Typ Max Min Max
4.0 10.0 4.0 11.0
3.0 7.5 3.0 8.0 ns
3.0 8.5 3.0 9.5 ns
3.5 11.0 3.5 12.0 ns
3.0 8.5 3.0 10.0 ns
4.5 11.5 4.5 12.5
= 0°C to +70°C
A
Units
AC Operating Requirements
TA = +25°CT
Symbol Parameter
MinMaxMinMax
tS(H) Set-up Time, HIGH or LOW 5.0 5.5 tS(L)
tS(H) Set-up Time, HIGH or LOW 4.0 4.5 tS(L)
tH(H) Hold Time, HIGH or LOW 2.0 2.0 tH(L)
tW(L) P Pulse Width, LOW 7.0 8.0 ns tW(H) Clock Pulse Width, 5.0 6.0 tW(L) HIGH or LOW 5.0 6.0 tW(H) MR Pulse Width, HIGH 5.0 5.5 ns t
REC
t
REC
D to CP
CWE to CP
D and CWE to CP
Recovery Time MR to CP Recovery Time P to CP
5.0 5.5
4.0 4.5
2.0 2.0
4.0 4.5 ns
2.0 2.0 ns
= 0°C to +70°C
A
UnitsVCC = +5.0V VCC = +5.0V
74F401
ns
ns
ns
ns
5 www.fairchildsemi.com
Page 6
Physical Dimensions inches (millimeters) unless otherwise noted
74F401
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
Package Number M14A
www.fairchildsemi.com 6
Page 7
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
74F401 CRC Generator/Checker
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent license s are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provide d in the labe l ing, can be re a­sonably expected to result in a significant injury to the user.
Package Number N14A
2. A critical componen t in any com ponen t of a life s upport device or system whose failu re to perform can b e rea­sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
www.fairchildsemi.com
7 www.fairchildsemi.com
Loading...