The ’F379 is a 4-bit register with buffered common Enable.
This device is similar to the ’F175 but features the common
Enable rather than common Master Reset.
The ’F379 consists of four edge-triggered D-Type flip-flops
with individual D inputs and Q and Q
(CP) and Enable (E
When the E
) inputs are common to all flip-flops.
is input HIGH, the register will retain the present
data independent of the CP input. The D
change when the clock is in either state, provided that the
recommended setup and hold times are observed.
outputs. The Clock
and E inputs can
n
Truth Table
InputsOutputs
ECPD
HLXNCNC
LLHH L
LLLLH
e
H
HIGH Voltage Level
e
LOW Voltage Level
L
e
Immaterial
X
e
LOW-to-HIGH Transition
L
e
No Change
NC
n
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
Q
n
Q
TL/F/9527– 4
n
2
Page 3
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
Plastic
Pin Potential to
V
CC
Ground Pin
Input Voltage (Note 2)
Input Current (Note 2)
Voltage Applied to Output
in HIGH State (with V
Standard Output
CC
e
TRI-STATEÉOutput
0V)
b
65§Ctoa150§C
b
55§Ctoa125§C
b
55§Ctoa175§C
b
55§Ctoa150§C
b
0.5V toa7.0V
b
0.5V toa7.0V
b
30 mA toa5.0 mA
b
0.5V to V
b
0.5V toa5.5V
Current Applied to Output
in LOW State (Max)twice the rated I
(mA)
OL
ESD Last Passing Voltge (Min)4000V
Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under
these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
SymbolParameter
V
V
V
V
V
I
IH
I
BVI
I
CEX
V
I
OD
I
IL
I
OS
I
CCL
IH
IL
CD
OH
OL
ID
Input HIGH Voltage2.0VRecognized as a HIGH Signal
Input LOW Voltage0.8VRecognized as a LOW Signal
Input Clamp Diode Voltage
Output HIGH54F 10% V
Voltage74F 10% V
Output LOW54F 10% V
Voltage74F 10% V
Input HIGH54F20.0
Current74F5.0
Input HIGH Current54F100
Breakdown Test74F7.0
Output HIGH54F250
Leakage Current74F50
Input Leakage
TestAll Other Pins Grounded
Output Leakage
Circuit CurrentAll Other Pins Grounded
Input LOW Current
Output Short-Circuit Current
Power Supply Current2840mAMaxV
74F 5% V
74F4.75V0.0
74F3.75mA0.0
MinTypMax
2.5I
CC
2.5VMinI
CC
2.7I
CC
CC
CC
b
CC
60
Recommended Operating
Conditions
Free Air Ambient Temperature
Military
Commercial0
Supply Voltage
Military
Commercial
54F/74F
b
UnitsV
b
1.2VMinI
0.5
0.5I
CC
VMin
mAMax
mAMax
mAMax
b
0.6mAMaxV
150mAMaxV
I
V
V
V
I
V
IN
OH
OH
OH
OL
OL
ID
eb
IN
IN
OUT
e
IOD
IN
OUT
O
eb
eb
eb
e
e
e
e
e
1.9 mA
e
e
e
e
20 mA
20 mA
2.7V
7.0V
0.5V
LOW
Conditions
18 mA
V
150 mV
0V
b
55§Ctoa125§C
Ctoa70§C
§
a
4.5V toa5.5V
a
4.5V toa5.5V
1mA
1mA
1mA
CC
3
Page 4
AC Electrical Characteristics
74F54F74F
ea
T
25§C
SymbolParameterV
A
ea
5.0V
CC
e
50 pF
C
L
T
A,VCC
e
C
50 pFC
L
e
MilTA,V
e
CC
e
50 pF
L
MinTypMaxMinMaxMinMax
f
t
t
max
PLH
PHL
Maximum Clock Frequency10014075100MHz
Propagation Delay3.55.06.53.08.53.57.5
CP to Qn,Q
n
5.06.58.54.010.05.09.5
AC Operating Requirements
74F54F74F
ea
25§C
T
SymbolParameter
A
ea
CC
5.0V
V
MinMaxMinMaxMinMax
ts(H)Setup Time, HIGH or LOW3.04.03.0
t
(L)Dnto CP3.04.03.0
s
th(H)Hold Time, HIGH or LOW1.02.01.0
t
(L)Dnto CP1.02.01.0
h
ts(H)Setup Time, HIGH or LOW6.08.06.0
t
(L)E to CP6.08.06.0
s
th(H)Hold Time, HIGH or LOW000
t
(L)E to CP000
h
tw(H)CP Pulse Width4.05.04.0
t
(L)HIGH or LOW5.07.05.0
w
T
A,VCC
e
MilTA,V
e
ComUnits
CC
Com
Units
ns
ns
ns
ns
Ordering Information
The device number is used to form part of a simplified purchasing code where the package type and temperature range are
defined as follows:
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or 2. A critical component is any component of a life
systems which, (a) are intended for surgical implantsupport device or system whose failure to perform can
into the body, or (b) support or sustain life, and whosebe reasonably expected to cause the failure of the life
failure to perform, when properly used in accordancesupport device or system, or to affect its safety or
with instructions for use provided in the labeling, caneffectiveness.
be reasonably expected to result in a significant injury
to the user.
National SemiconductorNational SemiconductorNational SemiconductorNational Semiconductor
CorporationEuropeHong Kong Ltd.Japan Ltd.
1111 West Bardin RoadFax: (
Arlington, TX 76017Email: cnjwge@tevm2.nsc.comOcean Centre, 5 Canton Rd.Fax: 81-043-299-2408
Tel: 1(800) 272-9959Deutsch Tel: (
Fax: 1(800) 737-7018English Tel: (
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.