Datasheet 74F378SJX, 74F378SJ, 74F378SCX, 74F378SC, 74F378PC Datasheet (Fairchild Semiconductor)

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© 1999 Fairchild Semiconductor Corporation DS009526 www.fairchildsemi.com
April 1988 Revised August 1999
74F378 Parallel D-Type Register with Enable
74F378 Parallel D-Type Register with Enable
General Description
The 74F378 is a 6-bit register with a buffered common Enable. This device is si mila r to the 74F174, but wi th com ­mon Enable rather than common Master Reset.
Features
■ 6-bit high-speed parallel register
■ Positive edge-triggered D-type inputs
■ Fully buffered common clock and enable inputs
■ Input clamp diodes limit high-s peed termination effects
■ Full TTL and CMOS compatible
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Order Number Package Number Package Description
74F378SC M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow 74F378SJ M16D 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F378PC N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
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74F378
Unit Loading/Fan Out
Functional Description
The 74F378 consists of six edge-triggere d D- typ e f lip -flo ps with individual D inputs and Q inputs. The Clock (CP ) and Enable (E
) inputs are common to all flip-flops.
When the E
input is LOW, new data is entered into the reg­ister on the LOW-to-HIGH tra nsitio n o f th e CP in put. When the E
input is HIGH the register will r etain the prese nt da ta
independent of the CP input.
Tr uth Table
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial
= LOW-to-HIGH Clock Transition
Logic Diagram
Please note that this diagram is provided o nly f or t he understanding of lo gic operations and should not be used to estimate propagation delays.
Pin Names Description
U.L.
Input I
IH/IIL
HIGH/LOW
Output I
OH/IOL
E Enable Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA D
0–D5
Data Inputs 1.0/1.0 20 µA/−0.6 mA CP Clock Pulse Input (Active Rising Edge) 1.0/1.0 20 µA/−0.6 mA Q
0–Q5
Outputs 50/33.3 −1 mA/20 mA
Inputs Output
E
CP D
n
Q
n
H
X No Change
L
HH
L
LL
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74F378
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyon d which the device
may be damaged or have its useful life impaired . Functional operation under these condit ions is not implied.
Note 2: Either voltage limit or curren t limit is sufficient to protect in puts.
DC Electrical Characteristics
Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C V
CC
Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output
in HIGH State (with V
CC
= 0V)
Standard Output −0.5V to V
CC
3-STATE Output −0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the rated I
OL
(mA)
Free Air Ambi ent Temperature 0°C to +70°C Supply Voltage +4.5V to +5.5V
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA
V
OH
Output HIGH 10% V
CC
2.5 VMin
IOH = −1 mA
Voltage 5% V
CC
2.7 IOH = −1 mA
V
OL
Output LOW 10% V
CC
0.5 V Min IOL = 20 mA
Voltage
I
IH
Input HIGH
5.0 µAMaxVIN = 2.7V
Current
I
BVI
Input HIGH Current
7.0 µAMaxVIN = 7.0V
Breakdown Test
I
CEX
Output HIGH
50 µAMaxV
OUT
= V
CC
Leakage Current
V
ID
Input Leakage
4.75 V 0.0
IID = 1.9 µA
Test All Other Pins Grounded
I
OD
Output Leakage
3.75 µA0.0
V
IOD
= 150 mV
Circuit Current All Other Pins Grounded
I
IL
Input LOW Current −0.6 mA Max VIN = 0.5V
I
OS
Output Short-Circuit Current −60 −150 mA Max V
OUT
= 0V
I
CCL
Power Supply Current 30 45 mA Max VO = LOW
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74F378
AC Electrical Characteristics
AC Operating Requirements
Symbol Parameter
TA = +25°CT
A
= −55°C to +125°CTA = 0°C to +70°C
Units
VCC = +5.0V VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF CL = 50 pF
Min Typ Max Min Max Min Max
f
MAX
Maximum Input Frequency 80 100 70 80 MHz
t
PLH
Propagation Delay 3.0 5.5 7.5 3.0 10.0 3.0 8.5
ns
t
PHL
CP to Q
n
3.5 6.0 8.5 3.5 10.5 3.5 9.5
Symbol Parameter
TA = +25°CTA = −55°C to +125°CTA = 0°C to +70°C
UnitsVCC = +5.0V VCC = +5.0V VCC = +5.0V
Min Max Min Max Min Max
tS(H) Setup Time, HIGH or LOW 4.0 5.0 4.0
ns
tS(L) Dn to CP 4.0 5.0 4.0 tH(H) Hold Time, HIGH or LOW 0 2.0 0 tH(L) Dn to CP 0 2.0 0 tS(H) Setup Time, HIGH or LOW 6.0 4.5 6.0
ns
tS(L)
E to CP
10.0 13.0 10.0 tH(H) Hold Time, HIGH or LOW 0 0 0 tH(L)
E to CP
000
tW(H) CP Pu l se Width 4.0 5.0 4.0
ns
tW(L) HIGH or LOW 6.0 7.5 6.0
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74F378
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
Package Number M16A
16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M16D
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74F378 Parallel D-Type Register with Enable
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N16E
Fairchild does not assume any responsibility for use of any circuitry described, no circuit pate nt licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant inju ry to the user.
2. A critical component i n any compon ent of a lif e support device or system whose failu re to perform can be rea­sonably expected to ca use the fa i lure of the life su pp ort device or system, or to affect its safety or effectiveness.
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