Datasheet 74F352SJ, 74F352PC Datasheet (Fairchild Semiconductor)

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74F352 Dual 4-Input Multiplexer
74F352 Dual 4-Input Multiplexer
May 1988 Revised August 1999
General Description
The 74F352 is a very h igh-speed dual 4-i nput multiplexer with common Select inputs and individual Enable inputs for each section. It can select two bits of data from four sources. The two buffered outputs present data in the inverted (compleme ntary) form. The 74F352 is the func­tional equivalent of the 74F153 exce pt with inverted out­puts.
Features
Inverted version of 74F153
Separate enables for each multiple xer
Input clamp diode limits high speed termination effects
Ordering Code:
Order Number Package Number Package Description
74F352SJ M16D 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F352PC N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering cod e.
Logic Symbols
IEEE/IEC
Connection Diagram
Truth T able
Select Inputs
S
0S1
XXHXXXX H
LLLLXXX H LLLHXXX L
HLLXLXX H
Inputs (a or b) Output
E I0I1I2I3Z
HLLXHXX L
LHLXXLX H LHLXXHX L
HHLXXXL H
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial
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HHLXXXH L
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Unit Loading/Fan Out
74F352
Pin Names Description
I0a–I I
0b–I3b
S
0–S1
E
a
E
b
, Z
Z
a
3a
Side A Data Inputs 1.0/1.0 20 µA/−0.6 mA Side B Data Inputs 1.0/1.0 20 µA/−0.6 mA Common Select Inputs 1.0/1.0 20 µA/−0.6 mA Side A Enabl e Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA Side B Enabl e Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA Multiplexer Outputs (Inverted) 50/33.3 1 mA/20 mA
b
Functional Description
The 74F352 is a dual 4-input multiplexer. It selects two bits of data from up to f our sources under the control of the common Select inputs (S
circuits have indivi du al a cti ve LOW E nab les ( E can be used to strobe the outputs independently. When the
Enables (E Z
b
, Eb) are HIGH, the cor resp on di ng ou tpu ts (Za,
a
) are forced HIGH. Th e logic equations for the outpu ts
are shown below:
= Ea • (I0a • S1 • S0 + I1a • S1• S0 +
Z
a
I
= Eb • (I0b • S1 • S0 + I1b • S1• S0 +
Z
b
I
, S1). The two 4-input multiplexer
0
• S1 • S0 + I3a • S1 • S0)
2a
• S1 • S0 + I3b • S1 • S0)
2b
, Eb) which
a
U.L.
HIGH/LOW
Input I
Output I
IH/IIL OH/IOL
The 74F352 can be used to move data from a group of reg­isters to a common output bu s. Th e pa rtic u lar r egister from which the data came would be det ermined by the state of the Select inputs. A less obvious app lication is as a func­tion generator. The 74F352 can ge nerate two functions of three variables. This is useful for implementing highly irreg­ular random logic.
Logic Diagram
Please note that this diagram is provided o nly f or t he understanding of lo gic operations and shou ld not be used to estimate propagation delays.
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Absolute Maximum Ratings(Note 1) Recommended Operating
Storage Temperature 65°C to +150°C Ambient Temperature under Bias 55°C to +125°C Junction Temperature under Bias 55°C to +150°C
Pin Potential to Ground Pin 0.5V to +7.0V
V
CC
Input Voltage (Note 2) 0.5V to +7.0V Input Current (Note 2) 30 mA to +5.0 mA Voltage Applied to Output
in HIGH State (with V
CC
= 0V) Standard Output 0.5V to V 3-STATE Output 0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the rated I
OL
Conditions
Free Air Ambient Temperature 0°C to +70°C Supply Voltage +4.5V to +5.5V
Note 1: Absolute maximum ratings are values beyon d which the device may be damaged or have its useful life impaired . Functional operation
CC
under these condit ions is not implied. Note 2: Either voltage limit or curren t limit is sufficient to protect in puts.
(mA)
DC Electrical Characteristics
74F352
Symbol Parameter Min Typ Max Units
V
IH
V
IL
V
CD
V
OH
V
OL
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal Input LOW Voltage 0.8 V Recognized as a LOW Signal Input Clamp Diode Voltage −1.2 V Min IIN = 18 mA Output HIGH 10% V Voltage 5% V Output LOW 10% V
2.5
CC
2.7 IOH = 1 mA
CC CC
0.5 V Min IOL = 20 mA
Voltage
I
IH
I
BVI
I
CEX
V
I
OD
I
IL
I
OS
I
CCH
I
CCL
ID
Input HIGH Current Input HIGH Current Breakdown Test Output HIGH Leakage Current Input Leakage Test All Other Pins Grounded
4.75 V 0.0
Output Leakage Circuit Current All Other Pins Grounded
5.0 µAMaxVIN = 2.7V
7.0 µAMaxVIN = 7.0V
50 µAMaxV
3.75 µA0.0
Input LOW Current −0.6 mA Max VIN = 0.5V Output Short-Circuit Current 60 150 mA Max V Power Supply Current 9.3 14 mA Max VO = HIGH Power Supply Current 13.3 20 mA Max VO = LOW
AC Electrical Characteristics
TA = +25°CT
Symbol Parameter
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
Propagation Delay 4.0 8.0 11.0 3.5 12.5 Sn to Z
n
Propagation Delay 3.0 4.5 6.0 2.5 7.0 En to Z
n
Propagation Delay 2.0 5.2 7.0 2.0 8.0 In to Z
n
VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF
Min T yp Max Min Max
3.56.58.53.09.5
3.05.07.02.58.0
1.32.54.01.04.5
V
CC
VMin
IOH = 1 mA
IID = 1.9 µA
V
= 0°C to +70°C
A
= V
OUT
= 150 mV
IOD
= 0V
OUT
Conditions
CC
Units
ns
ns
ns
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Physical Dimensions inches (millimeters) unless otherwise noted
74F352
16-Lead Small Outline Package ( SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M16D
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
74F352 Dual 4-Input Multiplexer
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent license s are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provide d in the labe l ing, can be re a­sonably expected to result in a significant injury to the user.
Package Number N16E
2. A critical component in any componen t of a life s uppor t device or system whose failu re to perform can b e rea­sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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