Datasheet 74F30SJX, 74F30SJ, 74F30SCX, 74F30SC, 74F30PC Datasheet (Fairchild Semiconductor)
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© 1999 Fairchild Semiconductor Corporation DS009560 www.fairchildsemi.com
April 1988
Revised August 1999
74F30 8-Input NAND Gate
74F30
8-Input NAND Gate
General Description
This device contains a single gate, which performs the
logic NAND function.
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e letter “X” to the ordering code.
Logic Symbol
IEEE/IEC
Unit Loading/Fan Out
Connection Diagram
Function Table
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Order Number Package Number Package Description
74F30SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
74F30SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74F30PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Pin Names Description
U.L.
Input I
IH/IIL
HIGH/LOW
Output I
OH/IOL
A0–A
7
Inputs 1.0/1.0 20 µA/−0.6 mA
O
Output 50/33.3 −1 mA/20 mA
Inputs Output
A
0A1A2A3A4A5A6A7
O
LXXXXXXX H
XLXXXXXX H
XXLXXXXX H
XXXLXXXX H
XXXXLXXX H
XXXXXLXX H
XXXXXXLX H
XXXXXXXL H
HHHHHHHH L
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74F30
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditi ons is not implied.
Note 2: Either voltage limit or curren t limit is sufficient to protect in put s .
DC Electrical Characteristics
AC Electrical Characteristics
Storage Temperature −65°C to +150°C
Ambient Temperature under Bias −55°C to +125°C
Junction Temperature under Bias −55°C to +150C
V
CC
Pin Potential to Ground Pin −0.5V to +7.0V
Input Voltage (Note 2) −0.5V to +7.0V
Input Current (Note 2) −30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with V
CC
= 0V)
Standard Output −0.5V to V
CC
3-STATE Output −0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the rated I
OL
(mA)
Free Air Ambient Temperature 0°C to +70°C
Supply Voltage +4.5V to +5.5V
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA
V
OH
Output HIGH 10% V
CC
2.5
VMin
IOH = −1 mA
Voltage 5% V
CC
2.7 IOH = −1 mA
V
OL
Output LOW
10% V
CC
0.5 V Min IOL = 20 mA
Voltage
I
IH
Input HIGH
5.0 µAMaxVIN = 2.7V
Current
I
BVI
Input HIGH Current
7.0 µAMaxVIN = 7.0V
Breakdown Test
I
CEX
Output HIGH
50 µAMaxV
OUT
= V
CC
Leakage Current
V
ID
Input Leakage
4.75 V 0.0
IID = 1.9 µA
Test All Other Pins Grounded
I
OD
Output Leakage
3.75 µA0.0
V
IOD
= 150 mV
Circuit Current All Other Pins Grounded
I
IL
Input LOW Current −0.6 mA Max VIN = 0.5V
I
OS
Output Short-Circuit Current −60 −150 mA Max V
OUT
= 0V
I
CCH
Power Supply Current 0.5 1.5 mA Max VO = HIGH
I
CCL
Power Supply Current 4.5 mA Max VO = LOW
Symbol Parameter
TA = +25°CT
A
= 0°C to +70°C
Units
VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF
Min Typ Max Min Max
t
PLH
Propagation Delay 1.0 3.7 5.0 1.0 5.5
ns
t
PHL
An to O
1.5 2.8 5.0 1.5 5.5
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74F30
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
Package Number M14A
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
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74F30 8-Input NAND Gate
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit pate nt licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant inju ry to the
user.
2. A critical component in any com ponen t of a life supp ort
device or system whose failu re to perform can be reasonably expected to ca use the fa i lure of the life su pp ort
device or system, or to affect its safety or effectiveness.
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