Datasheet 74F299SJX, 74F299SJ, 74F299SCX, 74F299SC, 74F299PC Datasheet (Fairchild Semiconductor)

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© 1999 Fairchild Semiconductor Corporation DS009515 www.fairchildsemi.com
April 1988 Revised August 1999
74F299 Octal Universal Shift/Storage Register
74F299 Octal Universal Shift/Storage Register
with Common Parallel I/O Pins
General Description
0
–
Q
7
, are provided to allow easy serial cascading. A separate
active LOW Master Reset is used to reset the register.
Features
■ Common parallel I/O for reduced pin count
■ Additional serial inputs and outputs for expansion
■ Four operating modes: shift left, shift right, load and
store
■ 3-STATE outputs for bus-oriented applications
■ Guarante ed 4000V minimum ESD protection
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Order Number Package Number Package Description
74F299SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 74F299SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F299PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
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74F299
Unit Loading/Fan Out
Functional Description
The 74F299 cont ains ei ght ed ge-trig gered D-typ e flip -flops and the interstage logic necessary to perform synchronous shift left, shift right, parallel load and hold operations. The type of operati on is det ermine d by S
0
and S1, as shown in
the Mode Sele ct Table. All flip-flop outpu ts are brou ght o ut through 3-STATE buffers to separate I/O pins that also serve as data inputs in the parallel load m ode. Q
0
and Q
7
are also brough t out on other pi ns for expansion in serial shifting of longer words.
A LOW signal on MR
overrides the Sele ct and CP inputs and resets the flip-flops. All other state changes are initi­ated by the rising edge of the clock. Inputs can change when the clock is in either st ate prov ided only that th e rec­ommended setup and hold times, relative to the rising edge of CP, are observed.
A HIGH signal on either OE
1
or OE2 disables the 3-STATE
buffers and puts the I/O pins in the high impedance stat e. In this condition the sh ift, hold, load and reset operatio ns can still occur. The 3-STATE outputs are also disabled by HIGH signals on both S
0
and S1 in preparation for a para l-
lel load operation.
Mode Select Table
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial
= LOW-to-HIGH Clock Transition
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation dela ys.
Pin Names Description
U.L.
Input I
IH/IIL
HIGH/LOW
Output I
OH/IOL
CP Clock Pulse Input (Active Rising Edge) 1.0/1.0 20 µA/−0.6 mA DS
0
Serial Data Input for Right Shift 1.0/1.0 20 µA/−0.6 mA
DS
7
Serial Data Input for Left Shift 1.0/1.0 20 µA/−0.6 mA
S
0
, S
1
Mode Select Inputs 1.0/2.0 20 µA/−1.2 mA
MR
Asynchronous Master Reset Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA
OE
1
, OE
2
3-STATE Output Enable Inputs (Active LOW) 1.0/1.0 20 µA/−0.6 mA
I/O
0
–I/O
7
Parallel Data Inputs or 3.5/1.083 70 µA/−0.65 mA
3-STATE Parallel Outputs 150/40(33.3) −3 mA/24 mA (20 mA)
Q
0
, Q
7
Serial Outputs 50/33.3 −1 mA/20 mA
Inputs Response
MR
S1S0CP
L X X X Asynchronous Reset; Q
0–Q7
= LOW
HHH
Parallel Load; I/On → Q
n
HLHShift Right; DS0 → Q0, Q0 → Q1, etc. HHL
Shift Left; DS7 → Q7, Q7 → Q6, etc.
H L L X Hold
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74F299
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyon d which the device
may be damaged or have its useful life impaired . Functional operation under these condit ions is not implied.
Note 2: Either voltage limit or curren t limit is sufficient to protect in puts.
DC Electrical Characteristics
Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C V
CC
Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA ESD Last Passing Voltage (Min) 4000V Voltage Applied to Output
in HIGH State (with V
CC
= 0V)
Standard Output −0.5V to V
CC
3-STATE Output
Current Applied to Output −0.5V to +5.5V
in LOW State (Max) twice the r ated I
OL
(mA)
Free Air Ambi ent Temperature 0°C to +70°C Supply Voltage +4.5V to +5.5V
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA
V
OH
Output HIGH 10% VCC2.5 V Min IOH = −1 mA (Q0, Q7, I/On) Voltage 10% VCC2.4 IOH = −3 mA (I/On)
5% VCC2.7 IOH = −1 mA (Q0, Q7, I/On) 5% VCC2.7 IOH = −3 mA (I/On)
V
OL
Output LOW 10% V
CC
0.5 V Min IOL = 20 mA (Q0, Q7)
Voltage 10% V
CC
0.5 IOL = 24 mA (I/On)
I
IH
Input HIGH
5.0 µAMax
VIN = 2.7V (CP, DS0, DS7, S0, S1,
Current
MR, OE1, OE2)
I
BVI
Input HIGH Current
7.0 µAMax
VIN = 7.0V (CP, DS0, DS7, S0, S1,
Breakdown Test
MR, OE1, OE2)
I
BVIT
Input HIGH Current
0.5 mA Max VIN = 5.5V (I/On)
Breakdown Test (I/O)
I
CEX
Output HIGH
50 µAMaxV
OUT
= V
CC
Leakage Current
V
ID
Input Leakage
4.75 V 0.0
IID = 1.9 µA
Test All Other Pins Grounded
I
OD
Output Leakage
3.75 µA0.0
V
IOD
= 150 mV
Circuit Current All Other Pins Grounded
I
IL
Input LOW Current −0.6
mA Max
VIN = 0.5V (CP, DS0, DS7, MR, OE1, OE2)
−1.2 VIN = 0.5V (S0, S1)
IIH+ Output Leakage
70 µAMaxV
I/O
= 2.7V (I/On)
I
OZH
Current
IIL+ Output Leakage
−650 µAMaxV
I/O
= 0.5V (I/On)
I
OZL
Current
I
OS
Output Short-Circuit Current −60 −150 mA Max V
OUT
= 0V
I
ZZ
Bus Drainage Test 500 µA0.0VV
OUT
= 5.25V
I
CCH
Power Supply Current 68 95 mA Max VO = HIGH
I
CCL
Power Supply Current 68 95 mA Max VO = LOW
I
CCZ
Power Supply Current 68 95 mA Max VO = HIGH Z
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74F299
AC Electrical Characteristics
AC Operating Requirements
Symbol Parameter
TA = +25°CT
A
= −55°C to +125°CTA = 0 to +70°C
Units
VCC = 5.0V VCC = 5.0V VCC = 5.0V CL = 50 pF CL = 50 pF CL = 50 pF
Min Typ Max Min Max Min Max
f
MAX
Maximum Input Frequency 70 100 85 70 MHz
t
PLH
Propagation Delay 4.0 7.0 8.0 4.0 9.0 4.0 8.5
ns
t
PHL
CP to Q0 or Q
7
4.56.58.04.59.54.58.5
t
PLH
Propagation Delay 3.5 7.0 9.0 3.5 10.0 3.5 10.0
t
PHL
CP to I/O
n
4.0 8.5 9.0 4.0 11.0 4.0 10.0
t
PHL
Propagation Delay
5.5 7.5 9.5 5.5 12.5 5.5 10.5 ns
MR to Q0 or Q
7
t
PHL
Propagation Delay
5.5 11.0 10.0 5.5 12.0 5.5 10.5
MR to I/O
n
t
PZH
Output Enable Time 3.5 6.0 8.0 3.0 9.5 3.5 9.0
ns
t
PZL
OE to I/O
n
4.0 7.0 10.0 4.0 13.0 4.0 11.0
t
PHZ
Output Disable Time 2.0 4.5 6.0 1.5 7.0 2.0 7.0
t
PLZ
OE to I/O
n
1.04.05.51.06.51.06.5
t
PZH
Output Enable Time 3.5 9.0 3.0 10.5 3.5 10.0
ns
t
PZL
Sn to I/O
n
4.0 10.0 4.0 13.0 4.0 11.0
t
PHZ
Output Disable Time 2.5 6.0 1.5 7.0 2.5 7.0
ns
t
PLZ
Sn to I/O
n
1.5 5.5 1.0 6.5 1.5 6.5
Symbol Parameter
TA = +25°CTA = −55°C to +125°CTA = 0 to +70°C
UnitsVCC = 5.0V VCC = 5.0V VCC = 5.0V
Min Max Min Max Min Max
tS(H) Setup Time, HIGH or LOW 8.5 10.0 8.5
ns
tS(L) S0 or S1 to CP 8.5 7.5 8.5 tH(H) Hold Time, HIGH or LOW 0 0 0 tH(L) S0 or S1 to CP 0 0 0 tS(H) Setup Time, HIGH or LOW 5.0 5.0 5.0
ns
tS(L) I/On, DS0 or DS7 to CP 5.0 5.0 5.0 tH(H) Hold Time, HIGH or LOW 2.0 2.0 2.0 tH(L) I/On, DS0 or DS7 to CP 2.0 2.0 2.0 tW(H) CP Pulse Width 5.0 5.0 5.0
ns
tW(L) HIGH or LOW 5.0 5.0 5.0 tW(L)
MR Pulse Width, LOW
5.0 6.0 5.0 ns
t
REC
Recovery Time, MR to CP
7.0 12.0 7.0 ns
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74F299
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M20B
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number MD20D
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74F299 Octal Universal Shift/Storage Register
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit pate nt licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant inju ry to the user.
2. A critical component i n any compon ent of a lif e support device or system whose failu re to perform can be rea­sonably expected to ca use the fa i lure of the life su pp ort device or system, or to affect its safety or effectiveness.
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