Datasheet 74F169SJX, 74F169SJ, 74F169SCX, 74F169SC, 74F169PC Datasheet (Fairchild Semiconductor)

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© 1999 Fairchild Semiconductor Corporation DS009488 www.fairchildsemi.com
April 1988 Revised July 1999
74F169 4-Stage Synchronous Bidirectional Counter
74F169 4-Stage Synchronous Bidirectional Counter
General Description
The 74F169 is a fully synchronous 4-stage up/down counter. The 74F169 is a modulo- 16 binary counter. Fea­tures a preset capability for programmable operation, carry lookahead for easy cascad ing and a U/D
input to control the direction of counting. All state changes, whether in counting or parallel load ing, are initiated by the LOW-to­HIGH transition of the clock.
Features
■ Asynchro nous counting and loading
■ Built-in lookahead carry capability
■ Presettable for programmable operation
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Order Number Package Number Package Description
74F169SC M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow 74F169SJ M16D 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F169PC N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
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74F169
Unit Loading/Fan Out
Functional Description
The 74F169 uses edge-triggered J-K type flip-flops and has no constraints on changing the control or data input signals in either stat e of the c lock. The only req uireme nt is that the various inpu ts attain the desired state at least a setup time before the rising edge of the clock and rema in valid for the recom mend ed hold time therea fter. The paral­lel load operation t akes prece dence o ver ot her op eration s, as indicated in the Mode Select Table. When PE
is LOW,
the data on the P
0–P3
inputs enters the flip-flops on the
next rising edge of the clock. In order for counting to occur, both CEP
and CET must be LOW an d PE must be HI GH;
the U/D
input then determines the direction of counting.
The Terminal C o unt ( TC
) output is normally HIGH and goes
LOW, provided that CET
is LOW, when a counter reach es zero in the Count Down mode or reaches 15 for the 74F169 in the Count Up mode. The TC
output state is not a
function of the Count Enable Parallel (CEP
) input level.
Since the TC
signal is derived by decoding the flip-flop states, there exists the p ossibility of decoding spikes on TC
. For this reason the use of T C as a clock signal is not
recommended (see logic equations below).
1. Count Enable = CEP
• CET • PE
2. Up: (74F169): TC = Q0 • Q1 • Q2 • Q3 • (Up) • CET
3. Down: TC = Q0 • Q1 • Q2 • Q3 • (Down) • CET
Mode Select Table
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial
State Diagram
Pin Names Description
U.L.
Input I
IH/IIL
HIGH/LOW
Output I
OH/IOL
CEP
Count Enable Parallel Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA
CET
Count Enable Trickle Input (Active LOW) 1.0/2.0 20 µA/−1.2 mA CP Clock Pulse Input (Active Rising Edge) 1.0/1.0 20 µA/−0.6 mA P
0–P3
Parallel Data Inputs 1.0/1.0 20 µA/−0.6 mA PE
Parallel Enable Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA U/D
Up-Down Count Control Input 1.0/1.0 20 µA/−0.6 mA Q
0–Q3
Flip-Flop Outputs 50/33.3 −1 mA/20 mA TC
Terminal Count Output (Active LOW) 50/33.3 −1 mA/20 mA
PE CEP CET U/D
Action on Rising
Clock Edge
L X X X Load (P
n
→ Qn) H L L H Count Up (Increment) H L L L Count Down (Decrement) H H X X No Change (Hold) H X H X No Change (Hold)
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74F169
Logic Diagram
Please note that thes e diagrams are provide d only for the understan ding of logic operations a nd should not be used to es t im ate propagation delays.
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74F169
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation under these conditi ons is not implied.
Note 2: Either voltage limit or curren t limit is sufficient to protect in put s .
DC Electrical Characteristics
Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C V
CC
Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output
in HIGH State (with V
CC
= 0V)
Standard Output −0.5V to V
CC
3-STATE Output −0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the r ated I
OL
(mA)
Free Air Ambient Temperature 0°C to +70°C Supply Voltage +4.5V to +5.5V
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA
V
OH
Output HIGH 10% V
CC
2.5 VMin
IOH = −1 mA
Voltage 5% V
CC
2.7 IOH = −1 mA
V
OL
Output LOW 10% V
CC
0.5 V Min IOL = 20 mA
Voltage
I
IH
Input HIGH
5.0 µAMaxVIN = 2.7V
Current
I
BVI
Input HIGH Current
7.0 µAMaxVIN = 7.0V
Breakdown Test
I
CEX
Output HIGH
50 µAMaxV
OUT
= V
CC
Leakage Current
V
ID
Input Leakage
4.75 V 0.0
IID = 1.9 µA
Test All Other Pins Grounded
I
OD
Output Leakage
3.75 µA0.0
V
IOD
= 150 mV
Circuit Current All Other Pins Grounded
I
IL
Input LOW Current −0.6
mA Max
VIN = 0.5V (except CET)
−1.2
VIN = 0.5V (CET)
I
OS
Output Short-Circuit Current −60 −150 mA Max V
OUT
= 0V
I
CCL
Power Supply Current 35 52 mA Max VO = LOW
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74F169
AC Electrical Characteristics
AC Operating Requirements
Symbol Parameter
TA = +25°CT
A
= −55°C to +125°CTA = 0°C to +70°C
Units
VCC = +5.0V VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF CL = 50 pF
Min Typ Max Min Max Min Max
f
MAX
Maximum Count Frequency 90 60 70 MHz
t
PLH
Propagation Delay 3.0 6.5 8.5 3.0 12.0 3.0 9.5
ns
t
PHL
CP to Qn (PE HIGH or LOW)
4.0 9.0 11.5 4.0 16.0 4.0 13.0
t
PLH
Propagation Delay 5.5 12.0 15.5 5.5 20.0 5.5 17.5
ns
t
PHL
CP to TC
4.0 8.5 12.5 4.0 15.0 4.0 13.0
t
PLH
Propagation Delay 2.5 4.5 6.5 2.5 9.0 2.5 7.0
ns
t
PHL
CET to TC
2.5 8.5 11.0 2.5 12.0 2.5 12.0
t
PLH
Propagation Delay 3.5 8.5 11.5 3.5 16.0 3.5 12.5
ns
t
PHL
U/D to TC
4.0 8.0 12.0 4.0 14.0 4.0 13.0
Symbol Parameter
TA = +25°CT
A
= −55°C to +125°CTA = 0°C to +70°C
UnitsVCC = +5.0V VCC = +5.0V VCC = +5.0V
Min Max Min Max Min Max
tS(H) Setup Time, HIGH or LOW 4.0 4.5 4.5
ns
tS(L) Pn to CP 4.0 4.5 4.5 tH(H) Hold Time, HIGH or LOW 3.0 3.5 3.5 tH(L) Pn to CP 3.0 3.5 3.5 tS(H) Setup Time, HIGH or LOW 7.0 8.0 8.0
ns
tS(L)
CEP or CET to CP
5.0 8.0 6.5
tH(H) Hold Time, HIGH or LOW 0 0 0 tH(L)
CEP or CET to CP
0.5 1.0 0.5
tS(H) Setup Time, HIGH or LOW 8.0 10.0 9.0
ns
tS(L)
PE to CP
8.010.09.0
tH(H) Hold Time, HIGH or LOW 1.0 1.0 1.0 tH(L)
PE to CP
000
tS(H) Setup Time, HIGH or LOW 11.0 14.0 12.5
ns
tS(L)
U/D to CP
7.012.08.5
tH(H) Hold Time, HIGH or LOW 0 0 0 tH(L)
U/D to CP
000
tW(H) CP Pulse Width 4.0 6.0 4.5
ns
tW(L) HIGH or LOW 7.0 9.0 8.0
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74F169
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
Package Number M16A
16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M16D
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74F169 4-Stage Synchronous Bidirectional Counter
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N16E
Fairchild does not assume any responsibility for use of any circu itry described, no circuit patent license s are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided i n the labe li ng, can be re a­sonably expected to result in a significant injury to the user.
2. A critical component in any componen t of a life s uppor t device or system whose failu re to perform can b e rea­sonably expected to c ause th e fa i lure of the li fe s upp or t device or system, or to affect its safety or effectiveness.
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