Datasheet 74F157ASJX, 74F157ASJ, 74F157ASCX, 74F157ASC, 74F157APC Datasheet (Fairchild Semiconductor)

Page 1
© 1999 Fairchild Semiconductor Corporation DS009483 www.fairchildsemi.com
April 1988 Revised July 1999
74F157A Quad 2-Input Multiplexer
74F157A Quad 2-Input Multiplexer
General Description
The F157A is a high- speed quad 2- input multipl exer. Four bits of data from two sources can be selected using the common Select and Enable inputs. The four outputs present the selected data in the true (non-inverted) form. The F157A can also be used to generate any four of the 16 different functions to two variables.
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Order Number Package Number Package Description
74F157ASC M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow 74F157ASJ M16D 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F157APC N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Page 2
www.fairchildsemi.com 2
74F157A
Unit Loading/Fan Out
Truth Table
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial
Functional Description
The F157A is a quad 2-input multiplexer. It selects four bits of data from two sources under the contr ol of a common Select input (S). The Enable input (E
) is active LOW. When
E
is HIGH, all of the outputs (Z) are forced LOW regardless of all other inputs. The F157A is the logic implementation of a 4-pole, 2-position swit ch where th e positi on of th e switch is determined by the logic levels supplied to the Select input. The logic equations for the outputs are shown below:
Z
n
= E • (I1nS + I0n S)
A common use of the F157A is the moving of data from two groups of registers to four common output busses. The particular register from which the data comes is determined by the state of t he S elect in put . A less ob vious us e is as a function generator. The F1 57A can generate any four of the 16 different functions of two variables with one variable common. This is useful fo r implementing highly irregular logic.
Logic Diagram
Please note that this diagram is provided o nly f or t he understanding of lo gic operations and should not be used to estimate propagation delays.
Pin Names Description
U.L.
Input I
IH/IIL
HIGH/LOW
Output I
OH/IOL
I0a–I
0d
Source 0 Data Inputs 1.0/1.0 20 µA/−0.6 mA
I
1a–I1d
Source 1 Data Inputs 1.0/1.0 20 µA/−0.6 mA
E
Enable Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA S Select Input 1.0/1.0 20 µA/−0.6 mA Z
a–Zd
Outputs 50/33.3 1 mA/20 mA
Inputs Output
E
SI0I
1
Z
HXXX L LHXL L LHXH H LLLX L LLHX H
Page 3
3 www.fairchildsemi.com
74F157A
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyon d which the device
may be damaged or have its useful life impaired . Functional operation under these condit ions is not implied.
Note 2: Either voltage limit or curren t limit is sufficient to protect in puts.
DC Electrical Characteristics
AC Electrical Characteristics
Storage Temperature 65°C to +150°C Ambient Temperature under Bias 55°C to +125°C Junction Temperature under Bias 55°C to +150°C V
CC
Pin Potential to Ground Pin 0.5V to +7.0V Input Voltage (Note 2) 0.5V to +7.0V Input Current (Note 2) 30 mA to +5.0 mA Voltage Applied to Output
in HIGH State (with V
CC
= 0V)
Standard Output 0.5V to V
CC
3-STATE Output 0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the rated I
OL
(mA)
ESD Last Passing Voltage (Min) 4000V
Free Air Ambi ent Temperature 0°C to +70°C Supply Voltage +4.5V to +5.5V
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage −1.2 V Min IIN = 18 mA
V
OH
Output HIGH 10% V
CC
2.5 VMin
IOH = 1 mA
Voltage 5% V
CC
2.7 IOH = 1 mA
V
OL
Output LOW
0.5 V Min IOL = 20 mA
Voltage 10% V
CC
I
IH
Input HIGH
5.0 µAMaxVIN = 2.7V
Current
I
BVI
Input HIGH Current
7.0 µAMaxVIN = 7.0V
Breakdown Test
I
CEX
Output HIGH
50 µAMaxV
OUT
= V
CC
Leakage Current
V
ID
Input Leakage
4.75 V 0.0
IID = 1.9 µA
Test All Other Pins Grounded
I
OD
Output Leakage
3.75 µA0.0
V
IOD
= 150 mV
Circuit Current All Other Pins Grounded
I
IL
Input LOW Current −0.6 mA Max VIN = 0.5V
I
OS
Output Short-Circuit Current 60 150 mA Max V
OUT
= 0V
I
CCH
Power Supply Current 15 23 mA Max VO = HIGH
I
CCL
Power Supply Current 15 23 mA Max VO = LOW
Symbol Para meter
TA = +25°CT
A
= 55°C to +125°CTA = 0°C to +70°C
Units
VCC = +5.0V VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF CL = 50 pF
Min Typ Max Min Max Min Max
t
PLH
Propagation Delay 4.0 7.0 10.0 4.0 12.0 4.0 11.0
ns
t
PHL
S to Z
n
3.0 5.0 7.0 3.0 9.0 3.0 8.0
t
PLH
Propagation Delay 5.0 7.0 9.5 5.0 13.0 5.0 11.0
ns
t
PHL
E to Z
n
2.5 4.5 6.5 2.5 7.5 2.5 7.0
t
PLH
Propagation Delay 2.5 4.5 6.0 2.5 7.5 2.5 6.5
ns
t
PHL
In to Z
n
2.5 4.0 5.5 1.5 7.5 2.0 7.0
Page 4
www.fairchildsemi.com 4
74F157A
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
Package Number M16A
16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M16D
Page 5
5 www.fairchildsemi.com
74F157A Quad 2-Input Multiplexer
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N16E
Fairchild does not assume any responsibility for use of any circu itry described, no circuit patent license s are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices o r syst ems are dev ic es or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided i n the labe li ng, can be re a­sonably expected to result in a significant injury to the user.
2. A critical com ponen t in any compo nent o f a li fe supp ort device or system whose failu re to perform can b e rea­sonably expected to c ause th e fa i lure of the li fe s upp or t device or system, or to affect its safety or effectiveness.
www.fairchildsemi.com
Loading...