Datasheet 74F138SJX, 74F138SJ, 74F138SCX, 74F138SC, 74F138PC Datasheet (Fairchild Semiconductor)

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© 1999 Fairchild Semiconductor Corporation DS009478 www.fairchildsemi.com
April 1988 Revised July 1999
74F138 1-of-8 Decoder/Demultiplexer
74F138 1-of-8 Decoder/Demultiplex er
General Description
The F138 is a high-speed 1-of-8 decoder/demultiplexer. This device is ideally suited for high-speed bipolar memory chip select address decoding. The multiple input ena bles allow parallel expans ion to a 1-of-24 dec oder using just three F138 devices or a 1-of-32 dec oder using fo ur F138 devices and one inverter.
Features
Demultiplexing capability
Multiple input enable for easy expansion
Active LOW mutually exclusive outputs
Ordering Code:
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Order Number Package Number Package Description
74F138SC M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow 74F138SJ M16D 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F138PC N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
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74F138
Unit Loading/Fan Out
Tr uth Table
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial
Functional Description
The F138 high-speed 1-of-8 decoder/demultiplexer accepts three binary weighted inputs (A
0, A1, A2
) and,
when enabled, provides eight mutually exclusive active LOW outputs (O
0–O7
). The F138 features three Enable
inputs, two active LOW (E
1, E2
) and one active HIGH (E3).
All outputs will be HIGH unless E
1
and E2 are LOW and E
3
is HIGH. This multiple enable functi on allows easy parallel
expansion of the de vice to a 1-of-32 (5 lines to 32 lines) decoder with just f our F138 dev ices and one i nverte r (S ee Figure 1). The F138 can be used as an 8-outpu t demulti­plexer by using one of the active LOW Enable inputs as the data input and the other Enable inputs as strobes. The Enable inputs which are not used must be permanently tied to their appropriate active HIGH or active LOW state.
FIGURE 1. Expans ion to 1-of-32 Decoding
Pin Names Description
U.L. Input I
IH/IIL
HIGH/LOW Output IOH/I
OL
A0–A
2
Address Inputs 1.0/1.0 20 µA/−0.6 mA
E
1
, E
2
Enable Inputs (Active LOW) 1.0/1.0 20 µA/−0.6 mA
E
3
Enable Input (Active HIGH) 1.0/1.0 20 µA/−0.6 mA
O
0–O7
Outputs (Active LOW) 50/33.3 1 mA/20 mA
Inputs Outputs
E
1
E2E3A0A1A2O0O1O2 O3O4O5O6O
7
HXXXXXHHH HHHHH XHXXXXHHHHHHHH XXLXXXHH HHHHHH
LLHLLLLHHHHHHH LLHHLLHL HHHHHH LLHLHLHH L HHHHH LLHHHLHH HLHHHH LLHLLHHH H HLHHH LLHHLHHH HHHLHH LLHLHHHH HHHHLH LLHHHHHH H HHHHL
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74F138
Logic Diagram
Please note that this diagram is provided only for the understanding of logic oper ations and sh ould not be used to estimate propagation delays.
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74F138
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation under these conditions is not implied.
Note 2: Either voltage lim it or current limit i s sufficient to protect inputs.
DC Electrical Characteristics
AC Electrical Characteristics
Storage Temperature 65°C to +150°C Ambient Temperature under Bias 55°C to +125°C Junction Temperature under Bias 55°C to +150°C V
CC
Pin Potential to Ground Pin 0.5V to +7.0V Input Voltage (Note 2) 0.5V to +7.0V Input Current (Note 2) 30 mA to +5.0 mA Voltage Applied to Output
in HIGH State (with V
CC
= 0V)
Standard Output 0.5V to V
CC
3-STATE Output 0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the rated I
OL
(mA)
ESD Last Passing Voltage (Min) 4000V
Free Air Ambient Temperature 0°C to +70°C Supply Voltage +4.5V to +5.5V
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage −1.2 V Min IIN = 18 mA
V
OH
Output HIGH 10% V
CC
2.5 VMin
IOH = 1 mA
Voltage 5% V
CC
2.7 IOH = 1 mA
V
OL
Output LOW 10% V
CC
0.5 V
Min IOL = 20 mA
Voltage
I
IH
Input HIGH
5.0 µAMaxVIN = 2.7V
Current
I
BVI
Input HIGH Current
7.0 µAMaxVIN = 7.0V
Breakdown Test
I
CEX
Output HIGH
50 µAMaxV
OUT
= V
CC
Leakage Current
V
ID
Input Leakage
4.75 V 0.0
IID = 1.9 µA
Test All Other Pins Grounded
I
OD
Output Leakage
3.75 µA0.0
V
IOD
= 150 mV
Circuit Current All Other Pins Grounded
I
IL
Input LOW Current 0.6 mA Max VIN = 0.5V
I
OS
Output Short-Circuit Current −60 −150 mA Max V
OUT
= 0V
I
CCH
Power Supply Current 13 20 mA Max VO = HIGH
I
CCL
Power Supply Current 13 20 mA Max VO = LOW
Symbol Parameter
TA = +25°CT
A
= 0°C to +70°C
Units
VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF
Min Typ Max Min Max
t
PLH
Propagation Delay 3.5 5.6 7.5 3.5 8.5
ns
t
PHL
An to O
n
4.0 6.1 8.0 4.0 9.0
t
PLH
Propagation Delay 3.5 5.4 7.0 3.5 8.0
ns
t
PHL
E1 or E2 to O
n
3.0 5.3 7.0 3.0 7.5
t
PLH
Propagation Delay 4.0 6.2 8.0 4.0 9.0
ns
t
PHL
E3 to O
n
3.5 5.6 7.5 3.5 8.5
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74F138
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
Package Number M16A
16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M16D
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74F138 1-of-8 Decoder/Demultiplexer
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N16E
Fairchild does no t assume any responsibility for use of an y circuitry d escribed, no c ircuit patent l icenses are impl ied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a sig nificant injury to the user.
2. A critical com ponen t in any com pone nt of a life s upport device or system w hose fa ilure to perform can be r ea­sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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