Datasheet 74F112 Datasheet (Fairchild)

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74F112 Dual JK Negative Edge-Triggered Flip-Flop
74F112 Dual JK Negative Edge-Triggered Flip-Flop
April 1988 Revised July 1999
General Description
The 74F112 contains two indepen dent, high -spee d JK flip­flops with Direct S et and Clear inputs. Sy nchronous state changes are in iti ated by th e fa ll ing edg e o f the cloc k. Trig­gering occurs at a voltage level of the clock and is not directly related to t he transition time. The J an d K inputs can change when the clock is in either stat e without affect­ing the flip-flop, provided that the y are in the desired st ate during the recommen ded setup and ho ld times relative to the falling edge of the clock. A LOW signal on S prevents clocki ng and forces Q or Q HIGH, respectivel y.
or C
D
Simultaneous LOW signals on S
HIGH.
Q Asynchronous Inputs:
LOW input to S LOW input to C Clear and Set are independent of clock
Simultaneous LOW on C
D
and Q
sets Q to HIGH level
D
sets Q to LOW level
D
HIGH
and CD force both Q and
D
and SD makes both Q
D
Ordering Code:
Order Number Package Number Package Description
74F112SC M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow 74F112SJ M16D 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F112PC N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel . Specify by appending the suffix letter “X” to the ordering code.
Logic Symbols
Connection Diagram
IEEE/IEC
© 1999 Fairchild Semiconductor Corporation DS009472 www.fairchildsemi.com
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Unit Loading/Fan Out
74F112
Pin Names Description
U.L.
HIGH/LOW
J1, J2, K1, K2Data Inputs 1.0/1.0 20 µA/−0.6 mA CP
, CP
1
C
, C
D1
S
, S
D1
Q
, Q2, Q1, Q2Outputs 50/33.3 −1 mA/20 mA
1
Clock Pulse Inputs (Active Falling Edge) 1.0/4.0 20 µA/−2.4 mA
2
Direct Clear Inputs (Active LOW) 1.0/5.0 20 µA/−3.0 mA
D2
Direct Set Inputs (Active LOW) 1.0/5.0 20 µA/−3.0 mA
D2
Tr uth Table
Inputs Outputs
C
S
D
LHXXXHL HLXXXLH LLXXXHH HH HH HH HH
H (h) = HIGH Voltage Level L (l) = LOW Voltage Level X = Immaterial
= HIGH-to-LOW Clock Transition
Q
) = Before HIGH-to-LOW Trans ition of Clock
0(Q0
Lower case letters indicate the state of the referenced input or output one setup time prior to the HIGH-to-LOW clock transition.
CP JKQ Q
D
hhQ0Q
lhL H
hlH L
llQ0Q
0
0
Input I
Output I
IH/IIL
OH/IOL
Logic Diagram
(One Half Shown)
Please not e that this diagram is provided only for the understanding of logic operations and should not be use d to estimate propagation delays.
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Absolute Maximum Ratings(Note 1) Recommended Operating
Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C V
Pin Potential to Ground Pin −0.5V to +7.0V
CC
Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output
in HIGH State (with V
CC
= 0V) Standard Output −0.5V to V 3-STATE Output −0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the rated I
OL
Conditions
Free Air Ambient Temperature 0°C to +70°C Supply Voltage +4.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation
CC
under these conditio ns is not implied. Note 2: Either voltage limit or curr ent limit is suffic ient to prote ct input s.
(mA)
DC Electr ic al C h ar acteristi cs
74F112
Symbol Parameter Min Typ Max Units
V V V V
V
I
I
I
V
I
I
I I I
IH IL CD OH
OL
IH
BVI
CEX
ID
OD
IL
OS CCH CCL
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal Input LOW Voltage 0.8 V Recognized as a LOW Signal Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA Output HIGH 10% V Voltage 5% V Output LOW 10% V Voltage Input HIGH Current Input HIGH Current Breakdown Test Output HIGH Leakage Current Input Leakage Test All other pins grounded Output Leakage Circuit Current All other pins grounded Input LOW Current −0.6 VIN = 0.5V (Jn, Kn)
Output Short-Circuit Current −60 −150 mA Max V Power Supply Current 12 19 mA Max VO = HIGH Power Supply Current 12 19 mA Max VO = LOW
2.5 V Min IOH = −1 mA
CC
2.7 IOH = −1 mA
CC CC
4.75 V 0.0
0.5 V Min IOL = 20 mA
5.0 µAMaxVIN = 2.7V
7.0 µAMaxVIN = 7.0V
50 µAMaxV
3.75 µA0.0
−2.4 mA Max
−3.0
V
CC
IID = 1.9 µA
V
VIN = 0.5V (CPn) VIN = 0.5V (CDn, SDn)
= V
OUT
= 150 mV
IOD
= 0V
OUT
Conditions
CC
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AC Electrical Characteristics
74F112
Symbol Parameter
f t t
t t
MAX PLH PHL PLH PHL
Maximum Clock Frequency 85 105 80 MHz Propagation Delay 2.0 5.0 6.5 2.0 7.5
CPn to Qn or Q
n
Propagation Delay 2.0 4.5 6.5 2.0 7.5 CDn, SDn to Qn, Q
n
TA = +25°CT
VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF
Min Typ Max Min Max
2.0 5.0 6.5 2.0 7.5
2.0 4.5 6.5 2.0 7.5
AC Operating Requirements
TA = +25°CT
Symbol Parameter
Min Max Min Max
tS(H) Setup Time, HIGH or LOW 4.0 5.0 tS(L)
Jn or Kn to CP
n
tH(H) Hold Time, HIGH or LOW 0 0 tH(L)
tW(H)
Jn or Kn to CP CP Pulse Width
n
tW(L) HIGH or LOW 4.5 5.0 tW(L) Pulse Width, LOW
CDn or S
t
REC
Dn
Recovery Time SDn, CDn to CP
3.0 3.5
00
4.5 5.0
4.5 5.0 ns
4.0 5.0 ns
= 0°C to +70°C
A
= 0°C to +70°C
A
Units
ns
ns
UnitsVCC = +5.0V VCC = +5.0V
ns
ns
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Physical Dimensions inches (millimeters) unless otherwise noted
74F112
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M16A
Package Number M16D
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N16E
74F11 2 Dual JK Negative Edge-T riggered Flip-Flop
Fairchild does no t assume any responsibility for use of an y circuitry d escribed, no c ircuit patent l icenses are i mplied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a sig nificant injury to the user.
2. A critical com ponen t in any com pone nt of a life s uppor t device or system w hose fa ilure to perform can be r ea­sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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