•Bus-hold data inputs eliminate the need for external pull-up
resistors to hold unused inputs
•Live insertion/extraction permitted
•Power-up 3-State
•No bus current loading when output is tied to 5V bus
•Latch-up protection exceeds 500mA per JEDEC Std 17
•ESD protection exceeds 2000V per MIL STD 883 Method 3015
and 400V per Machine Model
QUICK REFERENCE DATA
t
PLH
t
PHL
C
C
I
CCZ
IN
I/O
Propagation delay
nAx to nBx or nBx to nAx
Input capacitance DIR, OEVI = 0V or V
I/O pin capacitanceV
Total supply currentOutputs disabled4070µA
CL = 50pF
= 0V or V
I/O
DESCRIPTION
The 74ALVT16245 is a high-performance BiCMOS product
designed for V
to 5V .
This device is a 16-bit transceiver featuring non-inverting 3-State
bus compatible outputs in both send and receive directions. The
control function implementation minimizes external timing
requirements. The device features an Output Enable (OE
easy cascading and a Direction (DIR) input for direction control.
CONDITIONS
T
amb
CC
CC
operation at 2.5V or 3.3V with I/O compatibility up
CC
TYPICAL
= 25°C
2.5V3.3V
1.7
1.9
1.5
1.5
33pF
99pF
) input for
ns
ORDERING INFORMATION
PACKAGESTEMPERATURE RANGE OUTSIDE NORTH AMERICANORTH AMERICADWG NUMBER
48-Pin Plastic SSOP Type III–40°C to +85°C74ALVT16245 DLAV16245 DLSOT370-1
48-Pin Plastic TSSOP Type II–40°C to +85°C74ALVT16245 DGGAV16245 DGGSOT362-1
DC supply voltage–0.5 to +4.6V
DC input diode currentVI < 0–50mA
DC input voltage
DC output diode currentVO < 0–50mA
DC output voltage
p
Storage temperature range–65 to +150°C
PARAMETERCONDITIONSRATINGUNIT
3
3
1, 2
–0.5 to +7.0V
Output in Off or High state–0.5 to +7.0V
Output in Low state128
Output in High state–64
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
1998 Feb 13
3
Page 4
Philips SemiconductorsProduct specification
SYMBOL
PARAMETER
UNIT
I
mA
VOHHigh-level out ut voltage
V
VOLLow–level out ut voltage
V
4
V
6V; V
V
Data ins
4
0.5
10
Bus Hold current
A or B ports
6
74ALVT162452.5V/3.3V 16-bit transceiver (3-State)
RECOMMENDED OPERATING CONDITIONS
2.5V RANGE LIMITS3.3V RANGE LIMITS
MINMAXMINMAX
V
CC
V
V
V
I
OH
OL
∆t/∆vInput transition rise or fall rate; Outputs enabled1010ns/V
T
amb
DC ELECTRICAL CHARACTERISTICS (3.3V 0.3V RANGE)
SYMBOLPARAMETERTEST CONDITIONSTemp = -40°C to +85°CUNIT
V
IK
I
I
I
OFF
I
HOLD
I
EX
I
PU/PD
I
CCH
I
CCL
I
CCZ
∆I
CC
NOTES:
1. All typical values are at V
2. This is the increase in supply current for each input at the specified voltage level other than V
3. This parameter is valid for any V
transition time of 100µsec is permitted. This parameter is valid for T
4. Unused pins at V
5. I
CCZ
6. This is the bus hold overdrive current required to force the input to the opposite logic state.
DC supply voltage2.32.73.03.6V
Input voltage05.505.5V
I
High-level input voltage1.72.0V
IH
Input voltage0.70.8V
IL
High-level output current–8–32mA
Low-level output current832
Low-level output current; current duty cycle ≤ 50%; f ≥ 1kHz2464
Operating free-air temperature range–40+85–40+85°C
VCC = 0 or 2.7V; VI = 5.5V0.110
VCC = 2.7V; VI = 5.5V
VCC = 2.7V; VI = V
CC
Data pins
0.120
0.110
µA
VCC = 2.7V; VI = 00.1-5
VCC = 2.3V; VI = 1.7V–10
VO = 5.5V; VCC = 2.3V50125µA
VCC ≤ 1.2V; VO = 0.5V to VCC; VI = GND or VCC;
OE/OE
= Don’t care
VCC = 2.7V; Outputs High, VI = GND or V
VCC = 2.7V; Outputs Disabled; VI = GND or V
CC,
CC,
I
O
I
O
CC,
VCC = 2.3V to 2.7V; One input at VCC–0.6V,
Other inputs at VCC or GND
=00.040.1
=02.345mA
5
I
=0
O
40100µA
0.040.1
0.10.4mA
= 25°C.
or GND
= 25°C only.
amb
CC
= 1.2V to VCC = 2.5V ± 0.3V a
CC
V
1998 Feb 13
5
Page 6
Philips SemiconductorsProduct specification
74ALVT162452.5V/3.3V 16-bit transceiver (3-State)
DYNAMIC SWITCHING THRESHOLD
Dynamic switching threshold is the change in VIH and VIL when the device is operated in various switching and output loading conditions. The
cause of this variation is due to extra load placed on internal circuit structures. V
V
is the input high switching level when the device is heavily loaded. V
IHD
V
ILD/VIHD
3.0
2.5
2.0
1.5
1.0
0.5
Input Dynamic Threshold Voltage (V)
0.0
2.3
vs V
CC
Vild/Vihd vs V
2.52.73.03.33.6
VCC (V)
CC
Vild
- - - - Vihd
SA00455
ILD
GROUND/VCC BOUNCE
V
vs Temperature
OLP
2.0
1.8
1.6
1.4
1.2
(V)
1.0
OLP
V
0.8
0.6
0.4
0.2
0.0
–55–402585125
Temperature (°C)
SA00457
IHD
and V
are measures of the dynamic switching threshold.
ILD
is the input low switching level when the device is heavily loaded.
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
[1]
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print codeDate of release: 05-96
Document order number:9397-750-03647
yyyy mmm dd
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